DD270133A1 - Anordnung zur untersuchung hochaufgeloester teilspektren eines echelle-spektrums - Google Patents
Anordnung zur untersuchung hochaufgeloester teilspektren eines echelle-spektrums Download PDFInfo
- Publication number
- DD270133A1 DD270133A1 DD88313622A DD31362288A DD270133A1 DD 270133 A1 DD270133 A1 DD 270133A1 DD 88313622 A DD88313622 A DD 88313622A DD 31362288 A DD31362288 A DD 31362288A DD 270133 A1 DD270133 A1 DD 270133A1
- Authority
- DD
- German Democratic Republic
- Prior art keywords
- lines
- echelle
- ccd sensor
- spectrum
- arrangement
- Prior art date
Links
- 238000001228 spectrum Methods 0.000 title claims abstract description 33
- 238000011835 investigation Methods 0.000 title description 2
- 239000002245 particle Substances 0.000 title 1
- 230000003595 spectral effect Effects 0.000 claims abstract description 32
- 230000004913 activation Effects 0.000 claims abstract description 23
- 238000012546 transfer Methods 0.000 claims abstract description 22
- 239000006185 dispersion Substances 0.000 claims abstract description 6
- 230000015654 memory Effects 0.000 claims description 10
- 230000004044 response Effects 0.000 claims description 2
- 230000005855 radiation Effects 0.000 abstract description 4
- 238000005259 measurement Methods 0.000 description 4
- 230000005693 optoelectronics Effects 0.000 description 4
- 230000006978 adaptation Effects 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 230000003111 delayed effect Effects 0.000 description 2
- 230000001960 triggered effect Effects 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 238000000559 atomic spectroscopy Methods 0.000 description 1
- 230000003139 buffering effect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 108091008695 photoreceptors Proteins 0.000 description 1
- 108090000623 proteins and genes Proteins 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
- 230000004304 visual acuity Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
- G01J3/1809—Echelle gratings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
- Solid State Image Pick-Up Elements (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DD88313622A DD270133A1 (de) | 1988-03-11 | 1988-03-11 | Anordnung zur untersuchung hochaufgeloester teilspektren eines echelle-spektrums |
| US07/320,674 US4940325A (en) | 1988-03-11 | 1989-03-08 | Device for the investigation of highly resolved partial spectra of an echelle spectrum |
| DE58909271T DE58909271D1 (de) | 1988-03-11 | 1989-03-10 | Echelle-Spektrometer zur Untersuchung hochaufgelöster Teilspektren eines Echelle-Spektrums. |
| EP89104303A EP0332211B1 (fr) | 1988-03-11 | 1989-03-10 | Spectromètre échelle pour l'exploration de spectres partiels à haute résolution dans un spectre d'échelle |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DD88313622A DD270133A1 (de) | 1988-03-11 | 1988-03-11 | Anordnung zur untersuchung hochaufgeloester teilspektren eines echelle-spektrums |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DD270133A1 true DD270133A1 (de) | 1989-07-19 |
Family
ID=5597592
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DD88313622A DD270133A1 (de) | 1988-03-11 | 1988-03-11 | Anordnung zur untersuchung hochaufgeloester teilspektren eines echelle-spektrums |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US4940325A (fr) |
| EP (1) | EP0332211B1 (fr) |
| DD (1) | DD270133A1 (fr) |
| DE (1) | DE58909271D1 (fr) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4143284A1 (de) * | 1991-12-30 | 1992-10-01 | Klaus Eberhard Engel | Integrierter halbleitersensor fuer spektrometer |
| DE19620807B4 (de) * | 1995-06-07 | 2006-07-27 | Varian, Inc., Palo Alto | Festkörperdetektor |
| DE102004020849B4 (de) * | 2004-04-28 | 2007-09-06 | Vistec Semiconductor Systems Jena Gmbh | Optische Messanordnung insbesondere zum Messen von Schichtdicken |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5018856A (en) * | 1989-10-30 | 1991-05-28 | The United States Of America As Represented By The Secretary Of Agriculture | Continuum source atomic absorption spectrometry |
| US5517302A (en) * | 1990-01-30 | 1996-05-14 | Stearns; Thornton | Multispectral reflectometer |
| DE4100478A1 (de) * | 1991-01-07 | 1992-07-09 | Vision 2 D Messtechnik Gmbh | System zum messen eines spektrums von sichtbarem, uv- und vuv-licht, bestehend aus einem spektrographen, einem lichtleiterbuendel und einem detektor |
| JPH0534273A (ja) * | 1991-07-29 | 1993-02-09 | Kanzaki Paper Mfg Co Ltd | レターデーシヨン測定装置 |
| US5412468A (en) * | 1993-03-09 | 1995-05-02 | The Perkin-Elmer Corporation | Grouping of spectral bands for data acquisition in a spectrophotometer |
| GB9320261D0 (en) * | 1993-10-01 | 1993-11-17 | Unicam Ltd | Spectrophotometer |
| DE4413096B4 (de) * | 1994-04-15 | 2004-09-09 | Berthold Gmbh & Co. Kg | Multielement-Atomabsorptionsspektrometer sowie Meßverfahren unter Nutzung eines solchen Atomabsorptionsspektrometers |
| US7164506B2 (en) * | 2002-06-07 | 2007-01-16 | Xerox Corporation | Multi-chip image sensor, on chip apparatus for causing each chip to selectably function in a parallel or serial readout |
| US8189179B2 (en) * | 2010-07-09 | 2012-05-29 | Raytheon Company | System and method for hyperspectral and polarimetric imaging |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4049353A (en) * | 1976-08-11 | 1977-09-20 | Spectrametrics, Incorporated | Spectrometric system and cassette |
| US4820048A (en) * | 1987-11-19 | 1989-04-11 | The Perkin-Elmer Corporation | Detector for a spectrometer |
-
1988
- 1988-03-11 DD DD88313622A patent/DD270133A1/de not_active IP Right Cessation
-
1989
- 1989-03-08 US US07/320,674 patent/US4940325A/en not_active Expired - Lifetime
- 1989-03-10 EP EP89104303A patent/EP0332211B1/fr not_active Expired - Lifetime
- 1989-03-10 DE DE58909271T patent/DE58909271D1/de not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4143284A1 (de) * | 1991-12-30 | 1992-10-01 | Klaus Eberhard Engel | Integrierter halbleitersensor fuer spektrometer |
| DE19620807B4 (de) * | 1995-06-07 | 2006-07-27 | Varian, Inc., Palo Alto | Festkörperdetektor |
| DE102004020849B4 (de) * | 2004-04-28 | 2007-09-06 | Vistec Semiconductor Systems Jena Gmbh | Optische Messanordnung insbesondere zum Messen von Schichtdicken |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0332211B1 (fr) | 1995-06-07 |
| EP0332211A3 (en) | 1990-12-27 |
| EP0332211A2 (fr) | 1989-09-13 |
| US4940325A (en) | 1990-07-10 |
| DE58909271D1 (de) | 1995-07-13 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RPI | Change in the person, name or address of the patentee (searches according to art. 11 and 12 extension act) | ||
| RPI | Change in the person, name or address of the patentee (searches according to art. 11 and 12 extension act) | ||
| ENJ | Ceased due to non-payment of renewal fee |