DD160016A1 - ARRANGEMENT FOR ERROR DETECTION IN CABLES AND WIRING - Google Patents

Abstract

The invention finds application in all fields of electrical engineering in which cables and wiring are examined for wiring faults. With the solution according to the invention it is achieved that the checking of the wiring takes place without interruption. The errors are clear and shown only once. The arrangement not only checks the connections for correctness, but also determines the separations between the connections. All possible connections are checked and compared by means of nominal and actual wiring diagrams. By arranging the target and actual wiring in the Euler-Vennschen diagram, the missing and inadmissible connections are determined. Possible fields of application include cable and wiring testing for faults in cables, control cabinet wiring and computer feedback wiring of all kinds.

Description

- · /

Volker Deckert

Leonharö ~ Frank ~ * Str ", '30 Reiner Volkmar'

Lärchenberg 12

The invention relates to an arrangement for fault detection in cables and wiring "The cables to be tested or". Order wiring from numerous wires that connect the contact points according to the construction manual « _{Is there still a} possibility _? Reverse wiring of computer systems, wiring of control cabinets and the like au check «'·

It is with this arrangement all occurring Wirwirüngs ··. error. errüitt.elto .. · ..... ...,. ... · - '. ·. ... ·· ..

Known technical solutions use for the purpose of querying κ to apply the voltage or current source to the contact terminals of the cable or the wiring and. to sampling in order to

Control of an indicator Rotary or lifting rotary selector. Furthermore, MOS devices are used to query, but with the disadvantage that a defined test current is not possible »

It is the principle of the evaluation known that during the query after each step, the cable or the wiring with a functional cable or an equivalent structure to the states "connection" or "no connection" is compared. If an error occurs, the tester will stop and the error will be displayed or printed out and must be specified and eliminated by hand. This has the disadvantage that when error stop the test arrangement is blocked during the repair of the specimen. In the case of printing all errors without error stop, it may happen that an error is printed several times, resulting in an inaccurate error indication.

The DAS 1665708 describes a suppression of multiple error expressions without, however, covering all possibilities. )

Exists in a multiple connection z. B. at the beginning of the test a non-permitted separation, all subsequent connections are also printed as not available. In subsequent test cycles, the thus faulty connection even appears as inadmissible.

Object of the invention

With the solution according to the invention, the goal is achieved that cables, back wires, etc. without. Error check can be checked * The existing errors can be logged *. "" Every error is clear. " Furthermore, it can be determined in which resistance range a resistance type "has a connection, whether loose contacts are present and whether semiconductors (diode character) occur in connections".

Darlesung_ the essence of the invention

# 7i 'ii 1 ih if ιιιτι itii! ι ΐϊΐη-Γττιιηιιιιuhii ι IMIi mmi * mtrmv \ in iiihhi, mi> fiwi "r-in-TTII-ni rr-i!

The invention describes an arrangement for complete testing

cables and wiring

~ Wiring errors (too much or too few connections) ~ High-impedance and complex errors (intentional or unwanted high-resistance connections)

- WackeIkontakte (temporary connections)

- compounds with semiconductor properties (diode character)

and to clearly list the errors and / or an actual parameter _β

Not only the connections are checked for correctness, but also the separations between the connections ".

In order to be able to make a complete statement about the correctness or the defectiveness of a cable or a wiring (test piece), all possible connections must be checked. "For this purpose, the test voltage is applied to the measuring points individually with the aid of a controlled voltage application device and either by means of the control device the measuring points individually, switched on in an indicator circuit and the result of the test reported to the control 5 or if each measuring point at least one indicator is assigned, this information of the control trains led The indicators act as a threshold «ein Is the Realisierimg exists.darin _s that about a resistor connected in the indicator circuit, the voltage drop is transmitted directly or amplified 'to a threshold switch with the aid of an opto-coupler * During the. Query of the test specimen is the actual »wiring as a · schematic · representation of the; Control in one. Memory transfer (actual wiring representation) «? Since at Kpntrolle of Heßpunktes just applied to the power, always must be the "connection" of the corresponding indicator message, this can lead to · ¹ st Se Ib testing of the test set during 'the query used. " The . Target wiring representation is obtained by interrogating a pattern or based on a wiring list

231222 6

A favorable possibility of the schematic representation of the wiring in the memory (wiring representation) for both target and actual is realized by means of an addressable memory with immediate access. For this purpose. Be determined areas within which each memory cell or memory space is assigned to a measuring point. All memory cells or "memory locations, their assigned measuring points via the cable. or the wiring are connected, receive the same information "Hach the creation of the setpoint and actual wiring diagram existing errors are determined." If there is a match there is no error.

Within the target connection blocks and target individual connections, missing connections and interruptions occur, unintentional connections and inadmissible connections are to be determined within the actual connection blocks and actual single connections.

The pictorial representation of the facts is possible with the help of the Euler-Vennschen diagram and is called diagram method.

Embodiment:

a test arrangement

an actual wiring representation of a target wiring representation of an Euler-Vennsches diagram with marked.

Setpoint and actual wiring representation

From the controller 1 (Pig. 1), 15 binary signals are sent to the decoder 4 on eight lines and decoded there. With the help of the resulting Ί of 256 codes on lines '25 one of 255 measuring points 13 is determined by the voltage on ^ e' applying means 2 or decoding of zero at all. eight lines 15 to no measuring point 13 voltage applied

Pig " 1 Pig. 2a Fig.- 2 B Pig. 3

Eaai Va? B

(spa.nnimgsanliegen.der Meßpunkt) «If not at all! Lines 15 zero ans receives a transistor 16 via a connected to its base. Line 25 from the decoder 4, a voltage 5 through it durchsteuert »The transistor 16 provides the transistor 8 via a voltage conductor _s consisting of the resistors 9 and 10, a base current which drives the transistor 8 and thus the test voltage to a measuring point 13 via the resistor Furthermore, binary signals are sent to the decoder 5 via the lines 14 and converted into a 1 of 256 code by means of the control unit 1. With the aid of this code, one measuring point is sent via the lines 26 each 13 grounded; When ITu11 is decoded on all eight lines 14, no measuring point 13 is grounded. A transistor 17, if not all of the lines 14 are zero, receives a voltage from its decoder 5 via a line 26 connected to its base, which controls it and so on the connected NEN Meßpmikt 13 in the Indikatorstrornkreis (controlling measuring point) turns "

The indicator current circuit includes one or more indicators 65 7, which are designed here as a threshold value switch and to different sputtering ~ ^; or current values are appealing In the example, two indicators 6 _? 7 is applied *, where the level of the indicator 6 is set so that only low-resistance connections are detected (low-level indicator) _β The indicator 7 has a low threshold and detects connections up to the kilo-ohm range (high-impedance indicator).

The applied in the example indicators 6 _S 7 report to the controller 1, the flow of a certain current «Dazu-wird in the circuit between the Prufsparmungsquelle 18 and the. A voltage regulator is applied to the Luminal diode 32 of an opto-coupler 33 via a bias resistor 31 at the low-impedance indicator 6. The high-impedance indicator 7 is used to reduce the voltage drop of the resistor 30 with the aid of a transistor 34 amplifies the resistance 37.dient of the base current limiting, In the Kollelctorstromkreis of the transistor 34 is a Luminiszensdioäe 32 of the optocoupler 33 in series with the resistor 36 connected The photo elements 38 of

Optocouplers 33 are connected to the threshold switches 39 which indicate to the controller 1 "connection" or "non-connection" via the signaling lines 27, 28. "The indicator circuit runs from the test voltage source via the voltage measuring point, via the test object 12 and via the measuring point under control for testing. Voltage source 18 «

The result of the "connection" or "non-connection" test is displayed by the low-impedance indicator 6 of the control 1 on the signaling lines 27 and the high-impedance indicator 7 on the signaling line 28.

In the example, the measuring points 13 are numbered decimal. The connected contact points of the test piece 12 have the same lobes. The test object can also be inspected during assembly.

Connected to the controller 1 is an addressable memory 19 with random access. The memory 19 is addressed by means of the low order address portion lines 23 and the high order address portion lines 24.

To determine the fault, the desired wiring is recorded in the memory 19. »This is done by querying a pattern z * B, a cable or a back wiring» All individual connections and multiple connections (connection blocks) are stored. The storage can also be based on a wiring list. The actual wiring is recorded in the memory 19 by querying the device under test. The query begins with the first occupied measuring point 13 in ascending order «. On. each occupied measuring point 13 is applied a single voltage (voltage applied measuring point),.

  During the interrogation ', all measuring points 13 with the same and higher lobes are switched into the indicator circuit for checking for connection (monitoring measuring point). The query is ended when voltage was applied at all measuring points 13 and the last one was checked. When interrogating, it is not necessary to check the voltage-applied measuring points, since there must always be a connection * In this case, the error-free work of the test

Checked order "During the query is made to create the wiring representation (Pig" 2a _s. 2b) * Each memory cell of a dedicated memory area is assigned to a measuring point 13, it comprises eight bits and the low order address portion is equal to the Hummer of the associated measurement point 13 "

In all memory cells, the associated measuring points 13 have the test specimen 12 connection, the same information, the number per connection occurring smallest measuring point number entered (Pig _e 2a _s 2b) _e For individual contacts, the associated memory cell receives its own low-order address as information » From the wiring diagrams it can be seen which measuring points have the same information and thus a connection exists. If smaller test objects 12 do not occupy all measuring points 13, no voltage is applied at the free measuring points 13 to shorten the test time and there is no control there. The Steuerimg 1, the unoccupied measuring points 13 communicated by in the corresponding SoIl Verlrahtungsdarstellung in the these measuring points 13 associated memory cells every eight bits carry a lull as information. If the query is finished, the nominal and actual wiring diagrams are compared. »If both are identical, the wiring is error-free. Since there is no way of knowing the interchangeability of connections within an actual multiple connection, there is a detectable error are before _s wenn.Ist individual connections not identical to target individual compounds and / or any actual'Mehrfachverbindung not-the same Meßpunktnummem as the corresponding target Mehrfachverbinäung includes "to .Ermittlung the .fehlenden .The compounds which target ·" be - · Single and multiple connections individually to the appearance of multiple .Is single-artifacts, single connections and / or. Multiple connections examined «·

Zur.Ermittlung of illegal connections, the actual line · ", and multiple connections individually ^ on the occurrence of multiple SOLX Ei.naelkontakte, Einze! Compounds and / or Mehrfachyerbindungen will be asked to _f to determine only high-impedance connections' by

U 8

high-impedance query obtained actual single and multiple connections individually examined for the occurrence of several obtained by low-impedance query actual single contacts, single connections and multiple connections. To determine the temporary connections (loose contacts), the actual single and multiple connections, which had at least once during several queries had a connection, individually to the occurrence of multiple actual single contacts, single connections and / or multiple connections that always had connection during the query , examined. For that, the examiner is shaken «

In order to determine the connections with diode character, the actual single or multiple connections are checked individually for the occurrence of several actual single contacts, single connections and / or multiple connections obtained by reversely polarized interrogation and vice versa. A pictorial representation of this fact is possible with the aid of the Euler-Vennschen diagram (Pig. 3). In this diagram, the target connection blocks and the target individual connections are continuously bordered, the actual connections are enclosed by dotted lines. The individual areas are identified by the respective lowest Meßpunktnutnmern equal to the information in the associated memory cells. All target areas are checked individually, if several actual areas occur in a target area. The considered target areas are divided into sub-areas. If several sub-areas occur, the connections to the measuring points 13 (FIG. 1) which lie in the different sub-areas are missing. Checking the actual areas determines the invalid connections. For the specification of the missing connections, in connection blocks. can be determined by comparing the faces with the desired connections according to the wiring list. which special connection is missing. It is the connection whose measuring point numbers occur in different partial areas. The determination of high-resistance connections, connections with diode character and only temporary connections are carried out analogously ».

feg, "fei 8 it" esa, * "*" w g

The errors thus determined are detected by means of an output device 20 (Fig. of a printer. Furthermore, there is the possibility of an unknown cable after interrogation by the test arrangement to print a wiring list by means of output device 20 «. The selection of the desired wiring and the starting of the test arrangement is carried out with the aid of an operating device 21.

Claims (5)

.- "Invention claim. 1. Arrangement for error detection in cables and wirings consisting of a controller, a memory, a voltage application device, a control device, an output device and one or more indicators, characterized in that a controller (1) with a voltage application device (2), a control device ( 5), a memory (19) and an output device (20) is connected in a controlled manner and the one or more selective indicators (6, 7) are connected to the control (1), 2 «arrangement for fault detection in cables and wiring according to item 1, characterized in that after provision of the desired and actual wiring in the memory (19) the 'error determined according to the diagram method and by means of output device (20) is logged * 3. Arrangement for fault detection in cables and wiring according to item 1, characterized in that the control of the voltage-applied measuring point is applicable for checking the test arrangement « 4 · Arrangement for fault detection in cables and wires according to item 1, characterized in that an indicator (6) has a series connected in the indicator circuit resistor (30), to the parallel a luminance diode (32). an opto-coupler (33) connected in series with the series resistor (37) and a photoelement (38) of the opto-coupler (33) '. is coupled to a threshold value switch (39) « 5 "arrangement-for error detection in cables and wires' according to item 1 and 4 characterized dadurchgekennzeichnet that of the resistor (30). an amplifier, consisting of transistor (34). »Resistors (36, 37) to the luminous diode (32) of the optocoupler (33) is inserted». ,