DD137504A1 - CIRCUIT ARRANGEMENT FOR TESTING SEMICONDUCTOR MEMORY - Google Patents

CIRCUIT ARRANGEMENT FOR TESTING SEMICONDUCTOR MEMORY

Info

Publication number
DD137504A1
DD137504A1 DD20646178A DD20646178A DD137504A1 DD 137504 A1 DD137504 A1 DD 137504A1 DD 20646178 A DD20646178 A DD 20646178A DD 20646178 A DD20646178 A DD 20646178A DD 137504 A1 DD137504 A1 DD 137504A1
Authority
DD
German Democratic Republic
Prior art keywords
semiconductor memory
circuit arrangement
testing semiconductor
testing
arrangement
Prior art date
Application number
DD20646178A
Other languages
German (de)
Inventor
Gunther Schneegass
Original Assignee
Gunther Schneegass
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gunther Schneegass filed Critical Gunther Schneegass
Priority to DD20646178A priority Critical patent/DD137504A1/en
Publication of DD137504A1 publication Critical patent/DD137504A1/en

Links

DD20646178A 1978-07-03 1978-07-03 CIRCUIT ARRANGEMENT FOR TESTING SEMICONDUCTOR MEMORY DD137504A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DD20646178A DD137504A1 (en) 1978-07-03 1978-07-03 CIRCUIT ARRANGEMENT FOR TESTING SEMICONDUCTOR MEMORY

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DD20646178A DD137504A1 (en) 1978-07-03 1978-07-03 CIRCUIT ARRANGEMENT FOR TESTING SEMICONDUCTOR MEMORY

Publications (1)

Publication Number Publication Date
DD137504A1 true DD137504A1 (en) 1979-09-05

Family

ID=5513420

Family Applications (1)

Application Number Title Priority Date Filing Date
DD20646178A DD137504A1 (en) 1978-07-03 1978-07-03 CIRCUIT ARRANGEMENT FOR TESTING SEMICONDUCTOR MEMORY

Country Status (1)

Country Link
DD (1) DD137504A1 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0017808A1 (en) * 1979-04-06 1980-10-29 General Instrument Corporation Method involving testing an electrically alterable microelectronic memory circuit
DE3207485C2 (en) 1981-03-03 1986-07-03 Tokyo Shibaura Denki K.K., Kawasaki, Kanagawa Non-volatile semiconductor memory device
EP0509360A1 (en) * 1991-04-19 1992-10-21 Nec Corporation Dynamic random access memory device with multiple word line selector used in burn-in test

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0017808A1 (en) * 1979-04-06 1980-10-29 General Instrument Corporation Method involving testing an electrically alterable microelectronic memory circuit
DE3207485C2 (en) 1981-03-03 1986-07-03 Tokyo Shibaura Denki K.K., Kawasaki, Kanagawa Non-volatile semiconductor memory device
DE3249671C2 (en) * 1981-03-03 1988-03-17 Kabushiki Kaisha Toshiba, Kawasaki, Kanagawa, Jp
EP0509360A1 (en) * 1991-04-19 1992-10-21 Nec Corporation Dynamic random access memory device with multiple word line selector used in burn-in test

Similar Documents

Publication Publication Date Title
NL191683C (en) Semiconductor memory circuit.
DK71980A (en) BROKONVERTER CIRCUIT
PL212822A1 (en) SEMICONDUCTOR
DK518980A (en) ELECTRICAL CONNECTOR FOR INTEGRATED CIRCUITS
DE3381025D1 (en) CIRCUIT FOR MEMORY BACKUP TEST.
SE7900083L (en) SEMICONDUCTOR DEVICE
DK226879A (en) IMPEDANCE MEASUREMENT CIRCUIT
DE3177221D1 (en) SEMICONDUCTOR MEMORY CIRCUIT.
SE7908817L (en) CIRCUIT CARD CONTACT DEVICE
BE885762A (en) ELECTRONIC FLASH
SE7909670L (en) REGULATED DENIREMENT CIRCUIT
SE7901551L (en) INTEGRATED CIRCUIT
SE7813077L (en) EKODEMPANDE CIRCUIT
ATA705077A (en) CIRCUIT ARRANGEMENT FOR VOLTAGE LIMITING
FI800429A (en) Circuit arrangement
DK525979A (en) Semiconductor LADNNGSOVERFOERINGSANORDNING
PT67379B (en) CIRCUIT ARRANGEMENT FOR PREVENTING RUKKOPPLUNGEN
SE7806951L (en) MEMORY CELL CIRCUIT
SE7900273L (en) REGULATED DENIREMENT CIRCUIT
DD130698A5 (en) SEMICONDUCTOR MEMORY
NL7803607A (en) VOLTAGE REFERENCE CIRCUIT.
SE420369B (en) INTRODUCTION CIRCUIT FOR MICROVAG
MX145865A (en) IMPROVED SEMICONDUCTOR BOARD TESTER
DD137504A1 (en) CIRCUIT ARRANGEMENT FOR TESTING SEMICONDUCTOR MEMORY
FI800728A (en) Circuit arrangement