DD137504A1 - CIRCUIT ARRANGEMENT FOR TESTING SEMICONDUCTOR MEMORY - Google Patents
CIRCUIT ARRANGEMENT FOR TESTING SEMICONDUCTOR MEMORYInfo
- Publication number
- DD137504A1 DD137504A1 DD20646178A DD20646178A DD137504A1 DD 137504 A1 DD137504 A1 DD 137504A1 DD 20646178 A DD20646178 A DD 20646178A DD 20646178 A DD20646178 A DD 20646178A DD 137504 A1 DD137504 A1 DD 137504A1
- Authority
- DD
- German Democratic Republic
- Prior art keywords
- semiconductor memory
- circuit arrangement
- testing semiconductor
- testing
- arrangement
- Prior art date
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DD20646178A DD137504A1 (en) | 1978-07-03 | 1978-07-03 | CIRCUIT ARRANGEMENT FOR TESTING SEMICONDUCTOR MEMORY |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DD20646178A DD137504A1 (en) | 1978-07-03 | 1978-07-03 | CIRCUIT ARRANGEMENT FOR TESTING SEMICONDUCTOR MEMORY |
Publications (1)
Publication Number | Publication Date |
---|---|
DD137504A1 true DD137504A1 (en) | 1979-09-05 |
Family
ID=5513420
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DD20646178A DD137504A1 (en) | 1978-07-03 | 1978-07-03 | CIRCUIT ARRANGEMENT FOR TESTING SEMICONDUCTOR MEMORY |
Country Status (1)
Country | Link |
---|---|
DD (1) | DD137504A1 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0017808A1 (en) * | 1979-04-06 | 1980-10-29 | General Instrument Corporation | Method involving testing an electrically alterable microelectronic memory circuit |
DE3207485C2 (en) | 1981-03-03 | 1986-07-03 | Tokyo Shibaura Denki K.K., Kawasaki, Kanagawa | Non-volatile semiconductor memory device |
EP0509360A1 (en) * | 1991-04-19 | 1992-10-21 | Nec Corporation | Dynamic random access memory device with multiple word line selector used in burn-in test |
-
1978
- 1978-07-03 DD DD20646178A patent/DD137504A1/en unknown
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0017808A1 (en) * | 1979-04-06 | 1980-10-29 | General Instrument Corporation | Method involving testing an electrically alterable microelectronic memory circuit |
DE3207485C2 (en) | 1981-03-03 | 1986-07-03 | Tokyo Shibaura Denki K.K., Kawasaki, Kanagawa | Non-volatile semiconductor memory device |
DE3249671C2 (en) * | 1981-03-03 | 1988-03-17 | Kabushiki Kaisha Toshiba, Kawasaki, Kanagawa, Jp | |
EP0509360A1 (en) * | 1991-04-19 | 1992-10-21 | Nec Corporation | Dynamic random access memory device with multiple word line selector used in burn-in test |
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