DD112004A5 - - Google Patents

Info

Publication number
DD112004A5
DD112004A5 DD177693A DD17769374A DD112004A5 DD 112004 A5 DD112004 A5 DD 112004A5 DD 177693 A DD177693 A DD 177693A DD 17769374 A DD17769374 A DD 17769374A DD 112004 A5 DD112004 A5 DD 112004A5
Authority
DD
German Democratic Republic
Application number
DD177693A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of DD112004A5 publication Critical patent/DD112004A5/xx

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06GANALOGUE COMPUTERS
    • G06G7/00Devices in which the computing operation is performed by varying electric or magnetic quantities
    • G06G7/12Arrangements for performing computing operations, e.g. operational amplifiers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836Fault-finding or characterising
    • G01R31/2843In-circuit-testing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Software Systems (AREA)
  • Computer Hardware Design (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
DD177693A 1973-04-07 1974-04-04 DD112004A5 (enExample)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PL1973161757A PL87700B1 (enExample) 1973-04-07 1973-04-07

Publications (1)

Publication Number Publication Date
DD112004A5 true DD112004A5 (enExample) 1975-03-12

Family

ID=19962157

Family Applications (1)

Application Number Title Priority Date Filing Date
DD177693A DD112004A5 (enExample) 1973-04-07 1974-04-04

Country Status (6)

Country Link
US (1) US3927368A (enExample)
JP (1) JPS5013080A (enExample)
DD (1) DD112004A5 (enExample)
FR (1) FR2224761B1 (enExample)
GB (1) GB1426407A (enExample)
PL (1) PL87700B1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51132977U (enExample) * 1975-04-16 1976-10-26
FR2313681A1 (fr) * 1975-06-02 1976-12-31 Penzen Politekhn I Dispositif pour mesurer les parametres d'elements de circuits electriques complexes
US4023095A (en) * 1976-03-15 1977-05-10 Arco Medical Products Company Circuit for measuring the sensitivity of a cardiac pacer
JPS5369680A (en) * 1976-12-02 1978-06-21 Sumitomo Metal Ind Insulation resistance measuring device
JPS55149886A (en) * 1979-05-11 1980-11-21 Toshiba Corp Automatic testing device
US4316187A (en) * 1981-01-09 1982-02-16 Spencer George A Current rating verification system
IT1209549B (it) * 1984-05-24 1989-08-30 Axis Spa Apparecchiatura e metodo per la misura delle resistenze di bobina e di connessione fra avvolgimento e lame di collettore, in motori elettrici.
US5440915A (en) * 1994-09-09 1995-08-15 Storar; Robert C. Method and apparatus for measuring friction torque
CN111062176B (zh) * 2019-12-09 2023-09-22 国网山西省电力公司长治供电公司 一种低压用户回路阻抗二元线性模型构建及求解方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3411081A (en) * 1966-01-24 1968-11-12 Hewlett Packard Co Ohmmeter circuit including indicationlinearizing feedback
US3702970A (en) * 1971-02-24 1972-11-14 Western Electric Co System and method for determining the maximum output voltage swing on operational amplifiers

Also Published As

Publication number Publication date
DE2415392B2 (de) 1975-07-03
US3927368A (en) 1975-12-16
JPS5013080A (enExample) 1975-02-10
PL87700B1 (enExample) 1976-07-31
FR2224761B1 (enExample) 1978-07-28
FR2224761A1 (enExample) 1974-10-31
DE2415392A1 (de) 1974-10-17
GB1426407A (en) 1976-02-25

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