CS252860B1 - Method of tungsten carbide thin layers formation on conductive substrate - Google Patents

Method of tungsten carbide thin layers formation on conductive substrate Download PDF

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CS252860B1
CS252860B1 CS841756A CS175684A CS252860B1 CS 252860 B1 CS252860 B1 CS 252860B1 CS 841756 A CS841756 A CS 841756A CS 175684 A CS175684 A CS 175684A CS 252860 B1 CS252860 B1 CS 252860B1
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conductive substrate
tungsten carbide
tungsten
thin layers
electrically conductive
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CS841756A
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Czech (cs)
Slovak (sk)
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CS175684A1 (en
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Milan Ferdinandy
Mikulas Czajlik
Jozef Kral
Dusan Liska
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Milan Ferdinandy
Mikulas Czajlik
Jozef Kral
Dusan Liska
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Priority to CS841756A priority Critical patent/CS252860B1/en
Publication of CS175684A1 publication Critical patent/CS175684A1/en
Publication of CS252860B1 publication Critical patent/CS252860B1/en

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Abstract

Riešenie sa týká spésobu vytvárania tenkých vrstiev karbidu1 wolfrámiu na elektricky vodivom substráte, kitorý je katodou v iónovioplátovaciolm systéme ma zápomnom eleiktriekom poteneiáli oproti uzemnene] vakuovéj komory. Sposob vytvárania vrstvy sa prevádza tak, že sa na substrát posobí plazmou, která je tvořená parami sublimujúceho hexakairbonylu wolframu a etínoím alebo eténom, a to za zmizeného tlaku z intervalu ΙΟ"3 Pa až 102 Pa.The solution concerns the way of creating thin ones tungsten carbide1 electrically conductive substrate, which is the cathode v the ion-plated system has a negative elixir versus grounded vacuum chamber. Layer creation method with converts by feeding plasma onto the substrate which is formed by sublimating vapors tungsten hexacaircarbonyl and ethanoic or ethene, under pressure from the interval ΙΟ "Pa to 102 Pa.

Description

Vynález ®a týká spósobu vytvárania tenkých vrstiev karbidu wolfrámu na elektricky vodivom substráte.The invention relates to a method of forming thin layers of tungsten carbide on an electrically conductive substrate.

V súčasinosti existuje celý rad metod a technologických ipostupov pire vytváranle tenkých vrstiev karbidu wolframu. Medzi najvýznaimnejšie patří metoda priameho odpař ovania karbidu wolfrámu a! chemické metody (tzv. CVD], ďalej sú to metody naipr. založené na elefctroiskrovom mahášainí a metody plazmových nástrekov.At present, there are a number of methods and technological approaches for creating thin layers of tungsten carbide. The most notable is the method of direct evaporation of tungsten carbide and! chemical methods (CVD), methods based on electro-spark mashashi and plasma spraying methods.

Doposial' používané metody založené inia priamoím odpařovaní karbidu wolfrámu siú sprevádzainé ťažkosfami spojenými s vysokou teplotou odparoivainia, maliou rýchlosťou odparovania a nanášania vrstiev, ako aj s problémami pri dodržaní požadovaného poměru v zastúpemí wolfrámu a uihlíka vo vrstvě. Chemické spoisohy přípravy vrstiev karbidu wolfrámu sú známe, avšak značme náročné na dodržanie požadovaných ipodmlenok přípravy, vrstvy majú nízku čistotu a odpadne produkty sú korózne. Vrstvy připravené vyššie uvedenými1 metodami sú taktiež nedostatočne přilnavé.The methods used hitherto, including direct evaporation of tungsten carbide, are accompanied by difficulties associated with high evaporation temperatures, low evaporation and deposition rates, as well as difficulties in maintaining the desired ratio of tungsten to carbon in the layer. The chemical processes for the preparation of tungsten carbide layers are known, but very difficult to maintain the required preparation conditions, the layers are of low purity and the waste products are corrosive. The layers prepared by the above 1 methods are also poorly adherent.

Vyššie uvedené nedostatky odstraňuje sposoh vytvárania tenkých vrstiev karbidu wolfrámu na elektricky vodivom substráte, kterého podstatou je, že na elektricky vodivý substrát, ktorý je katodou na zápornoím elektriekom polteueiáli 0 až 10 ikV oproti uzeminenej vákuovej komoře v iónovoiplátovacom systéme sa posobí plazmou tvořenou suiblimujúclmi paraimi hexiakarboinylu wolfrámu a etínom alebo etéinom pri tlaku z iintervalu 103 Pa až 102 Pa.The above-mentioned drawbacks eliminate the process of forming thin layers of tungsten carbide on an electrically conductive substrate, which is based on the fact that on an electrically conductive substrate, which is a cathode on the negative electrode 0-10 kV polteueial tungsten or ethynyl eteint at a pressure of 10 3 Pa iintervalu to 10 2 Pa.

Výhoda sposobu vytvárania tenkých vrstiev karbidu wolfrámu na elektricky vodivom substráte ipodla vynálezu spočívá v tom, že vrstvy karbidu wolfrámu sú vysoko přilnavé, dosaihujú požadovanú čistotu, s (možnoisťou dosiahnuitia vysofcej rýchlosti rastu vrstvy počais inanášamia, iktorá závisí na rýchlosti sublimácie héxakiarbonylu wolfrámu1, ktorú možno regulovat intenzitou jeho ohřevu. Ďalšou výhodou sposobu podlá vynálezu je možnost ovplyvňovať zloženie, strukturu, a mechanické vlastnosti vrstvy, a to velkoisťou tlaku vo vákuovej komoře, rýichlosťou sulbtimácie ihexafcarboimylu wolfrámu, imnožstvom mapúšťainéhc etínu alebo eténu a elektrickými parametrami stimulácie plazmy. Ďalšia výhoda sposobu podlá vynálezu spočívá v tom, že produkty rozkladu hexafcairbonylu wolfrámu, wolfrám a oxid uholinaitý nepůsobila korózne na substrát a na vákuové zariademie.Preferred methods for forming thin films of tungsten carbide on the electrically conductive substrate IPOD invention is that a layer of tungsten carbide is highly adhesive, dosaihujú the desired purity, the (možnoisťou dosiahnuitia vysofcej growth rate of the layer conceive a inanášamia, iktor depends on the rate of sublimation héxakiarbonylu tungsten 1 by Another advantage of the method according to the invention is the possibility to influence the composition, structure, and mechanical properties of the layer, namely by the vacuum chamber pressure magnitude, ihexafcarboimyl tungsten sulphimation rate, the amount of ethine or ethene mapping, and the electrical parameters of plasma stimulation. According to the invention, the decomposition products of hexafcairbonyl of tungsten, tungsten and carbon monoxide have not been corrosive to the substrate and to the vacuum devices.

Uvedený spósoib bol overemý na matoášaní vrstiev karbidu wolfrámu na substráty z rýchlorezinej ocele a SK. Hexakarhonyl wolfrámu sublimoval do prlestoru plazmy tvorenej napúšťaným etínom, odporovým ohrevom pri tlaků vo vákuovej komoře 5. . 10-1 Pa, a rýchlosti sublimácie 1 g . min-1, zápornoím elektriekom potenciáli na substráte oproti uzemineinej vákuovej Ikoímoire —2,8 kV, pri stimulácii elektrického' výboja pomocným elektrodovým systémům. Za týchto podmleinok. iktoré trvali 20 min., na povrchu subsítrátov vznikli vrstvy karbidu wolfrámu o hrůbkách 1,8 ,um a mikrotvrdlostl 19 000 N . mm 2.Said spósoib was verified by matting tungsten carbide layers onto high-speed steel and SK substrates. Hexacarhonyl of tungsten sublimated into the plasma space formed by impregnated ethine, resistance heating at pressures in a vacuum chamber 5. 10 -1 Pa, and a sublimation rate of 1 g. min -1 , negative electrode potential on the substrate versus a grounded vacuum coil of -2.8 kV when stimulating electrical discharge to the auxiliary electrode systems. Under these conditions. which lasted 20 min., tungsten carbide layers of 1.8 µm and microhardness 19 000 N were formed on the surface of the sub-wires. mm 2 .

V ďalšom případe podobné ako v predoalioim, hexaikairibonyl wolfrámu sublimoval pomoicou odporového ohřevu do priesitoiru plazmy, která však bola vytvořená v eténe pri tlaku voi vákuovej komoře 7.102 Pa, rýchlosti sublimácie 0,7 g. min1, a zápornoím elektriekom potenciáli na substráte z rýcíhloreznej ocele —3 kV oproti uzeminenej vákuovej komoře. V tomto případe na povrchu substrátu vznikla vrstva o hrúbike 0,8 /iiD, mikrotvrdosti 18 000 N . mm2. Vrstva karbidu wolfrámu vytvořená týmto postupem malia oproti vrstvám z predošlého příkladu jeminoznnejšiu strukturu pri porovnatelné velkej mikirotvrdosti a koeficiente trenia v protikuse s ocelou.In another case similar to that of the predoalioim, hexaicairibonyl tungsten was sublimed by resistive heating into a plasma screen, which was however formed in ethene at a vacuum chamber pressure of 7.10 2 Pa, a sublimation rate of 0.7 g. min 1 , and negative electrode potential on a 3 kV bucket steel substrate versus a grounded vacuum chamber. In this case, a 0.8 µm thick layer of microhardness of 18,000 N was formed on the substrate surface. mm 2 . The tungsten carbide layer formed by this process has a finer structure compared to the layers of the previous example at a comparable high microhardness and friction coefficient in contrast to the steel.

Sposoh vytvárania vrstiev karbidu wolfrámu možno využit pri prípraive povlakov na elektricky vodivých materiáloeh, připadne na materiáloeh predupravených elektricky vodivou vrstvou, a to obzvlášť v oblasti nástrojov, súčiastolk tribologíckých uzlov a súčiastok, kitoiré sú namáhané za vysokých teiplQt.The method of forming tungsten carbide layers can be used in the preparation of coatings on electrically conductive materials, possibly on materials pretreated with an electrically conductive layer, especially in the field of tools, tribological node components and components subjected to high stresses.

Claims (1)

PREDMETSUBJECT Sposoh vytvárania tenkých vrstiev karbidu wolfrámu na elektricky vodivom substráte, ktorý je katodou1 na zápornom elekitriíckom potenciál! 0 až 10 kV oproti uzemneinej vákuovej komoře v iómavoplátovacom vynalezu systéme, vyznačený tým·, že na elektricky vodivý substrát sa pósohí plazmou tvořenou sublimujúcimi parami hexakarbonylu wolframu a etínom, alebo eténiom pri tlaku z intervalu 10 3 Pa až 102 Pa.The process of forming thin layers of tungsten carbide on an electrically conductive substrate, which is cathode 1, at a negative electric potential! 0 to 10 kV compared to a grounded vacuum chamber in the ion-plating system invention, characterized in that a plasma formed by sublimating tungsten hexacarbonyl vapors and ethine or ethene at a pressure of 10 3 Pa to 10 2 Pa is applied to the electrically conductive substrate.
CS841756A 1984-03-12 1984-03-12 Method of tungsten carbide thin layers formation on conductive substrate CS252860B1 (en)

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