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Application filed by Ivan Jirovsky, Zorjan Jojko, Ivan Kokoska, Jaroslav Prusek, Vaclav TrojanfiledCriticalIvan Jirovsky
Priority to CS690777ApriorityCriticalpatent/CS192330B1/cs
Publication of CS192330B1publicationCriticalpatent/CS192330B1/cs
CS690777A1977-02-091977-02-09Appliance for calibration of instruments for measuring the thickness of the metal coatings by the coulometric method
CS192330B1
(en)