CN86108029A - Four electrodes mass analyzer - Google Patents
Four electrodes mass analyzer Download PDFInfo
- Publication number
- CN86108029A CN86108029A CN86108029.7A CN86108029A CN86108029A CN 86108029 A CN86108029 A CN 86108029A CN 86108029 A CN86108029 A CN 86108029A CN 86108029 A CN86108029 A CN 86108029A
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- ion
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- utmost point
- electron
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- 230000015572 biosynthetic process Effects 0.000 claims 1
- 230000035945 sensitivity Effects 0.000 abstract description 7
- 238000001819 mass spectrum Methods 0.000 abstract description 2
- 150000002500 ions Chemical class 0.000 description 39
- 238000001514 detection method Methods 0.000 description 6
- 238000004458 analytical method Methods 0.000 description 3
- 230000007935 neutral effect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 206010038743 Restlessness Diseases 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
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- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
The present invention relates to the structure of four pole type mass-synchrometer intermediate ion test section; It is characterized in that: be provided with ion in the position of departing from four utmost point central axis---the electronic switch electrode, as the first order electrode of secondary electron double type ion detector; On this first order electrode, add constant voltage, on the second level of ion detector and later electrode, add variable voltage.As adopt the present invention, then ion convergent effect is constant, and can the mass spectrum low mass region and the peak height ratio in high-quality district not changed owing to the sensitivity that sets is different.
Description
The invention relates to the structure of the ion detection part in the four pole type mass-synchrometer.
Because in four utmost point mass-synchrometers, from the ion outlet of ion gun to four utmost point all is to adopt the orthoscopic assembling so far, light that is sent by ion source filament and the acceleration neutral atom that produced by ion that is accelerated and neutral atom exchange value electron institute etc. are straight-line pass four polar regions, inject the ion detection part; Thereby the result brings ground unrest to ion detection.For preventing that light and neutral atom from entering ion detector, the practice always all is that ion detector is placed on the position of departing from the central axis by ion gun and four utmost point centers.In this structure, need to use complicated deflector, so that ion is guided to ion detector by the ion outlet of four utmost points.On the other hand, owing to use secondary electron multiplier or tube channel etc. as ion detector, and the sensitivity of these detecting devices changes with the difference of ion incidence amount; Therefore, the variation range that is added in the voltage on the first order ion incidence face is by negative several hectovolts to 4 kilovolt.Yet, if above-mentioned variation takes place in the first order voltage of ion detector, can cause the variation that deflector scope inner potential distributes, and then the convergence efficient of assembling to ion detector by four ions after is extremely changed, and it is different and different with mass of ion to assemble the intensity of variation of efficient; In the big side of quality, efficiency change is big, thereby produces following problem: the variation of ion detector impressed voltage makes the line peak strength in the low mass region that observes and high-quality district than different.
What the present invention will solve is in the four pole type mass-synchrometer, causes the problem that ion convergent efficient changes when changing impressed voltage in order to control ion detector sensitivity.
The present invention is to often being kept constant voltage on the first order ion-electron transfer electron in secondary electron multiplier or the tube channel, by changing second level electrode and with the voltage on the rear electrode, realizing the adjusting to detector gain.
Because institute's making alive is a steady state value on the ion detector first order electrode, so ion outlet to the Potential distribution between the ion detector by four utmost point quality analyses part is certain, and irrelevant with the sensitivity of ion detector setting, thereby ion convergent efficient also remains unchanged.In this case, though the sensitivity of setting with ion detector as the ion-electron conversion surface and the potential difference (PD) between second level dynode or the tube channel inlet of ion detector first order electrode changes, but when between the two potential difference (PD) during greater than a certain numerical value, the secondary rate is saturated and be tending towards constant substantially, thereby relies on the adjusting that realizes sensitivity after the second level to the voltage between the final stage dynode.
Fig. 1 is one embodiment of the present of invention.Q is four utmost point electrode bars, and ion gun is at the left-external side of figure.A is the central axis of four utmost point quality analyses part; M is a secondary electron multiplier; Dyf is the first order dynode of multiplier tube; Dy2 is a second level dynode; Dyf is the final stage dynode; C is a collector.First order dynode is the ion-electron converter.This first order dynode is located at the position of departing from four utmost point central axis A.Between the end face of four utmost point electrode bar Q and the first order dynode deflector D is housed; By the ion of four utmost point quality analyses part, bending is incided on the first order dynode dy1 as shown in phantom in FIG..Add constant voltage Vc on the first order dynode dy1.Add variable voltage Vd on the dynode dy2 of the second level.By the later voltage to the final stage dynode in the second level, add after the Vd dividing potential drop by divider resistance R.When detection of positive ions, the making alive Vc of institute is a constant voltage on the first order dynode, is about 4 kilovolts, and the maximal value (absolute value) that goes up added negative voltage Vd than second level dynode dy2 is slightly high.
Fig. 2 is an alternative embodiment of the invention.This is the example that an ion detector uses tube channel.At this moment, the setting of four utmost point electrode bar Q, deflector D etc. is identical with example shown in Figure 1.CT is the main part of tube channel; C is a collector, and dy1 is the ion-electron converter, is the first order electrode of tube channel; On dy1, add constant voltage Vc.On the electron impact end of tube channel main part CT, add variable voltage Vd, add constant voltage Vf, thereby in the tube channel main body, form electric potential gradient at the electronics exit end.
More than two embodiment, all be the gain of ion detector to be controlled by changing Vd.
Because the present invention adopts said structure, even change the gain of ion detection device, the Potential distribution between the first order ion-electron transfer electron of the ion exit end of four utmost point electrode bar Q and ion detection device is but always certain; Therefore, ion convergent efficient remains unchanged, thereby the aspect ratio that can not produce mass spectrum low mass region and high-quality district peak value is with the different phenomenons that change of sensitivity of setting.
Fig. 1 is the wiring diagram of one embodiment of the present of invention major part.
Fig. 2 is the wiring diagram of another embodiment of the present invention major part.
Claims (1)
- The formation of this four pole type mass-synchrometer is: in the position of departing from four utmost point central axis, be provided with the ion-electron transfer electron, this transfer electron is as the first order electrode of secondary electron double type ion detector; Thereby can on first order electrode, apply constant voltage, and can on the second level and later electrode, apply variable voltage.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 86108029 CN1014850B (en) | 1986-11-26 | 1986-11-26 | Four electrodes mass analyzer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 86108029 CN1014850B (en) | 1986-11-26 | 1986-11-26 | Four electrodes mass analyzer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN86108029A true CN86108029A (en) | 1988-06-08 |
| CN1014850B CN1014850B (en) | 1991-11-20 |
Family
ID=4803773
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 86108029 Expired CN1014850B (en) | 1986-11-26 | 1986-11-26 | Four electrodes mass analyzer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1014850B (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1326191C (en) * | 2004-06-04 | 2007-07-11 | 复旦大学 | Ion trap quality analyzer constructed with printed circuit board |
| CN1838371B (en) * | 2005-03-25 | 2010-05-26 | 丁传凡 | Non-perfect four-field quality analyzer device and working method thereof |
| CN101313215B (en) * | 2005-11-22 | 2012-01-11 | 株式会社岛津制作所 | Mass spectroscope |
| CN104185892A (en) * | 2012-03-16 | 2014-12-03 | 株式会社岛津制作所 | Mass spectrograph apparatus and method of driving ion guide |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100489176C (en) * | 2003-06-27 | 2009-05-20 | 苏州合田刺绣有限公司 | Embroidering method for seaming of outer materials and use thereof |
| US7119333B2 (en) * | 2004-11-10 | 2006-10-10 | International Business Machines Corporation | Ion detector for ion beam applications |
-
1986
- 1986-11-26 CN CN 86108029 patent/CN1014850B/en not_active Expired
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1326191C (en) * | 2004-06-04 | 2007-07-11 | 复旦大学 | Ion trap quality analyzer constructed with printed circuit board |
| CN1838371B (en) * | 2005-03-25 | 2010-05-26 | 丁传凡 | Non-perfect four-field quality analyzer device and working method thereof |
| CN101313215B (en) * | 2005-11-22 | 2012-01-11 | 株式会社岛津制作所 | Mass spectroscope |
| CN104185892A (en) * | 2012-03-16 | 2014-12-03 | 株式会社岛津制作所 | Mass spectrograph apparatus and method of driving ion guide |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1014850B (en) | 1991-11-20 |
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