CN2938404Y - 一种测量pn结电流的测试装置 - Google Patents
一种测量pn结电流的测试装置 Download PDFInfo
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- CN2938404Y CN2938404Y CN 200620040258 CN200620040258U CN2938404Y CN 2938404 Y CN2938404 Y CN 2938404Y CN 200620040258 CN200620040258 CN 200620040258 CN 200620040258 U CN200620040258 U CN 200620040258U CN 2938404 Y CN2938404 Y CN 2938404Y
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CN 200620040258 CN2938404Y (zh) | 2006-03-16 | 2006-03-16 | 一种测量pn结电流的测试装置 |
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CN 200620040258 CN2938404Y (zh) | 2006-03-16 | 2006-03-16 | 一种测量pn结电流的测试装置 |
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CN2938404Y true CN2938404Y (zh) | 2007-08-22 |
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CN 200620040258 Expired - Lifetime CN2938404Y (zh) | 2006-03-16 | 2006-03-16 | 一种测量pn结电流的测试装置 |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102955116A (zh) * | 2011-08-21 | 2013-03-06 | 布鲁克纳米公司 | 由电致发光半导体晶片测试预测led参数的方法和设备 |
CN103094141A (zh) * | 2011-10-28 | 2013-05-08 | 上海华虹Nec电子有限公司 | 一种pn结器件铝穿通的判定方法 |
CN102054070B (zh) * | 2009-10-30 | 2014-11-26 | 新思科技(上海)有限公司 | 非线性电路直流工作点的支路电流计算方法与装置 |
CN102054079B (zh) * | 2009-10-30 | 2015-07-08 | 新思科技(上海)有限公司 | 求解具类pn结特性的静态工作点的方法与装置 |
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2006
- 2006-03-16 CN CN 200620040258 patent/CN2938404Y/zh not_active Expired - Lifetime
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102054070B (zh) * | 2009-10-30 | 2014-11-26 | 新思科技(上海)有限公司 | 非线性电路直流工作点的支路电流计算方法与装置 |
CN102054079B (zh) * | 2009-10-30 | 2015-07-08 | 新思科技(上海)有限公司 | 求解具类pn结特性的静态工作点的方法与装置 |
CN102955116A (zh) * | 2011-08-21 | 2013-03-06 | 布鲁克纳米公司 | 由电致发光半导体晶片测试预测led参数的方法和设备 |
CN103094141A (zh) * | 2011-10-28 | 2013-05-08 | 上海华虹Nec电子有限公司 | 一种pn结器件铝穿通的判定方法 |
CN103094141B (zh) * | 2011-10-28 | 2016-02-10 | 上海华虹宏力半导体制造有限公司 | 一种pn结器件铝穿通的判定方法 |
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Owner name: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING Free format text: FORMER OWNER: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION Effective date: 20130116 |
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C41 | Transfer of patent application or patent right or utility model | ||
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Free format text: CORRECT: ADDRESS; FROM: 201203 PUDONG NEW AREA, SHANGHAI TO: 100176 DAXING, BEIJING |
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Effective date of registration: 20130116 Address after: 100176 No. 18, Wenchang Avenue, Beijing economic and Technological Development Zone Patentee after: Semiconductor Manufacturing International (Beijing) Corporation Address before: 201203 Shanghai City, Pudong New Area Zhangjiang Road No. 18 Patentee before: Semiconductor Manufacturing International (Shanghai) Corporation |
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CX01 | Expiry of patent term |
Granted publication date: 20070822 |
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