CN2935176Y - Circuit testing device - Google Patents

Abstract

The utility model discloses a power line-detecting device for detecting a module under test. The device includes a signal converting module, an electrometer, and a logic tester. The signal-converting module is electrically coupled with the module under test to convert the analog signal generated by the module under test to the dc signal. The electrometer is electrically coupled with the signal-converting module to measure the dc signal to generate a digital measurement. The logic tester is electrically connected with the electrometer to determine the test result of the module under test according to the digital measurement.

Description

Circuit test device

Technical field

The utility model relates to the test of circuit, particularly relates to a kind of circuit test device that uses logic tester to come test simulation circuit or mixed-signal circuit.

Background technology

Progress along with integrated circuit (IC) correlation technique, there is increasing IC inside to integrate logical circuit and mimic channel simultaneously, and having the processing power of logic signal and analog signal concurrently, this kind IC generally can be described as mixed-signal IC (Mixed-signal IC).No matter and be logic signal IC, analog signal IC or mixed-signal IC, quality during in order to ensure the IC shipment, after finishing manufacture process, generally all can carry out test to each IC, manufacturer can be according to the result who IC is carried out test, decide this IC whether qualified, and judge whether this IC to be supplied to the manufacturer in downstream according to this.

See also Fig. 1, Figure 1 shows that prior art is used for carrying out the test structure synoptic diagram of IC volume production test.In this test structure, use a mixed-signal test machine (Mixed-signal tester) 140 to be used as testing the instrument of an assembly to be tested (Device Under Test (DUT)) 110.Wherein, assembly 110 to be tested can be an analog signal IC or a mixed-signal IC to be tested, and for convenient test, assembly 110 to be tested is arranged on the assembly circuit plate to be tested (DUT board) 120 usually.

Say that roughly mixed-signal test machine 140 includes a Digital System Processor (DSP) 150, an analog-digital converter (ADC) 160 and an Arbitrary Waveform Generator (AWG) 170.Arbitrary Waveform Generator 170 is used for producing a test signal TS (it is an analog signal), and will test signal TS and export assembly to be tested 110 on the assembly circuit plate 120 to be tested to, assembly 110 to be tested is handled test signal TS to produce a test output signal TOS (it is an analog signal), analog-digital converter 160 is used for converting test output signal TOS to digital test output signal DTOS, 150 of Digital System Processors are handled digital test output signal DTOS by the digital operation mode, and whether the assembly of testing with judgement to be tested 110 is by test.

Yet, the analog feature test of analog signal IC and mixed-signal IC necessarily requires precisely (for example to require total harmonic distortion (THD) in 0.005%, or require output noise voltage (Output NoiseVoltage)) less than 2 μ Vrms, and mixed-signal test machine on the market generally all is the tester table (price surpasses 1,000,000 New Taiwan Dollar easily) of high unit price, well imagine, if the testing tool when using the mixed-signal test machine to be used as analog signal IC or mixed-signal IC volume production, not only can consume the huge test duration, more can significantly promote the required cost of test.

The utility model content

Therefore, one of the purpose of this utility model is to provide a kind of test structure that reduces testing cost and increase testing efficiency, to solve the problem that prior art was faced.

Embodiment of the present utility model has disclosed a kind of circuit test device, is used for testing an assembly to be tested.This device includes: a signal modular converter, be coupled to this assembly to be tested, and a simulation output signal that is used for this assembly to be tested is produced converts a direct current signal to; One ammeter is coupled to this signal modular converter, is used for measuring this dc signal to produce a digital measurement result; And a logic tester, be coupled to this ammeter, be used for deciding the test result of this assembly to be tested according to this digital measurement result.

Description of drawings

Fig. 1 is used for carrying out the test structure synoptic diagram of IC volume production test for prior art.

Fig. 2 is an embodiment synoptic diagram of circuit test device that the utility model proposes.

Fig. 3 is an embodiment synoptic diagram of the employed signal modular converter of the utility model.

Fig. 4 is an embodiment synoptic diagram of circuit test device that the utility model proposes.

Fig. 5 is an embodiment synoptic diagram of circuit test device that the utility model proposes.

The reference numeral explanation

110 assemblies to be tested

120 assembly circuit plates to be tested

140 mixed-signal test machines

150 Digital System Processors

160 analog-digital converters

170 Arbitrary Waveform Generator

200,400,500 circuit test devices

220,220_1～220_M, signal modular converter

220_1～220_N

240,240_1～240_N ammeter

260 logic testers

262 continuity built-in testing control modules

264 general purpose interface bus

280 waveform generators

310,360 amplifiers

320 trappers

330 A weighting filters

340 Hi-pass filters

350 low-pass filters

370 root mean square change DC circuit

Embodiment

See also Fig. 2, Figure 2 shows that an embodiment synoptic diagram of circuit test device that the utility model proposes.The circuit test device 200 of present embodiment is used for testing an assembly 110 to be tested, and wherein, assembly 110 to be tested can be an analog signal IC or a mixed-signal IC to be tested who is arranged on the assembly circuit plate to be tested (DUT board) 120.

The circuit test device 200 of present embodiment includes a signal modular converter 220, one ammeter (Meter) 240, one logic tester (logic tester) 260, an and waveform generator 280, wherein, but logic tester 260 is the tester table of combine digital computing, except the test circuit that is used for the combine digital computing, logic tester 260 can also include a continuity built-in testing (Continuous built-in test, C-Bit) control module 262, be used for according to testing requirement the running of controlling signal modular converter 220 and waveform generator 280.In addition, logic tester 260 also can include a general purpose interface bus (General purpose interface bus, GPIB) 264, be used for receiving the digital measurement result that ammeter 240 is produced.

Waveform generator 280 is according to the control of logic tester 260, one analog input signal AIS is provided the assembly to be tested 110 to the assembly circuit plate 120 to be tested, assembly 110 treatment of simulated input signal AIS to be tested produce a simulation output signal AOS, signal modular converter 220 is used for converting simulation output signal AOS to a direct current signal DCS (it can be a direct current voltage or a DC current), ammeter 240 is used for measuring dc signal DCS, and DMR is (for instance as a result to produce a digital measurement, digital measurement DMR as a result can be voltage level or the current level of dc signal DCS, with the digital form performance), 260 of logic testers can be according to digital measurement DMR as a result, decide treat test suite 110 test result why.

In order to allow signal modular converter 220 possess the function of " converting analog signal to dc signal ", can be from amplifier, trapper (Notch filter), A weighting filter (A weighting filter), Hi-pass filter, low-pass filter, and root mean square changes in the circuit unit of DC circuit (RMS-to-DC converter) or the like, select suitable circuit unit and be combined into signal modular converter 220, for instance, an embodiment synoptic diagram that is signal modular converter 220 shown in Figure 3, by the amplifier of arranging in regular turn 310, trapper 320, A weighting filter 330, Hi-pass filter 340, low-pass filter 350, amplifier 360, and root mean square commentaries on classics DC circuit 370, signal modular converter 220 can convert simulation output signal AOS to dc signal DCS.Note that putting in order of each circuit unit shown in Figure 3 is not the restrictive condition of signal modular converter 220 necessity, and not necessarily will include all circuit units shown in Figure 3 in the signal modular converter 220.In addition, signal modular converter 220 can also be looked testing requirement (for instance, according to the control of logic tester 260), optionally bypass (Bypass) one or more circuit units shown in Figure 3.

For instance, carry out noise testing if need treat test suite 110, then can bypass trapper 320, Hi-pass filter 340 and low-pass filter 350 shown in Figure 3, and use amplifier 310 provide+signal of 40dB amplifies, use A weighting filter 330 to carry out the A weighted filtering, use amplifier 360 provide+signal of 40dB amplifies, re-using root mean square changes the dc signal DCS that DC circuit 370 produces institute's desire output.Measured dc signal DCS and produced digital measurement as a result behind the DMR by ammeter 240, logic tester 260 can be according to digital measurement DMR as a result, decide treat test suite 110 the noise testing result why.

For another example, if need treat the test that test suite 110 is carried out total harmonic distortion (THD), then can be under the situation of bypass amplifier 310, trapper 320, A weighting filter 330, Hi-pass filter 340, low-pass filter 350 and amplifier 360, use root mean square to change DC circuit 370 and will simulate output signal AOS and convert dc signal DCS to, and measure dc signal DCS to draw digital measurement DMR (suppose at this moment digital measurement the value of DMR equal A) as a result as a result by ammeter 240.And under the situation of bypass A weighting filter 330, use amplifier 310 provide+signal of 20dB amplifies, use trapper 320 to carry out trap frequency and be 1kHz and enlargement ratio notch filter for-80dB, use Hi-pass filter 340 to carry out the high-pass filtering of band connection frequency (pass band frequency) as 400Hz, use low-pass filter 350 to carry out the low-pass filtering of band connection frequency as 30kHz, use amplifier 360 provide+signal of 40dB amplifies, re-using root mean square at last changes DC circuit 370 and produces dc signal DCS, and measures dc signal DCS to draw digital measurement DMR (suppose at this moment digital measurement the value of DMR equal B) as a result as a result by ammeter 240.Receive after A value and the B value, logic tester 260 can pass through following formula, decides total harmonic distortion THD (%) what equal according to A value and B value:

$\mathrm{THD}(\%)=\frac{\sqrt{{H_2}^2+{H_3}^2+...{{+H}_N}^2}}{\sqrt{{{\mathrm{<figure-callout\; id="1"\; label="H"\; filenames="Y20062011649700101.png"\; state="\{\{state\}\}">H</figure-callout>}}_1}^2}}\&times;100=\frac{B}{A}\&times;100.$

And when need are treated test suite 110 and carried out test more than the passages (channel), then can adopt Fig. 4 or multiple channel test framework shown in Figure 5.In the embodiment of Fig. 4, circuit test device 400 includes M signal modular converter (M is the positive integer greater than 1), wherein, the simulation output signal AOS_m that signal modular converter 220_m is used for that assembly 110 to be tested is exported convert to a direct current signal DCS_ m (m between 1 and M between positive integer), ammeter 240 is used for measuring dc signal DCS_1, ..., DCS_M is to produce the pairing digital measurement of each dc signal DMR_1 as a result, ..., DMR_M (for instance, digital measurement DMR_m as a result can be voltage level or the current level of dc signal DCS_m, with the digital form performance), the digital measurement that 260 of logic testers can be produced according to ammeter 240 is DMR_1 as a result, ..., DMR_M decides the test result for the treatment of test suite 110.

In the embodiment of Fig. 5, circuit test device 500 includes N signal modular converter and N ammeter (N is the positive integer greater than 1), wherein, the simulation output signal AOS_n that signal modular converter 220_n is used for that assembly 110 to be tested is exported convert to a direct current signal DCS_n (n between 1 and N between positive integer), ammeter 240_n then is used for measuring dc signal DCS_n, and DMR_n is (for instance as a result to produce its pairing digital measurement, digital measurement DMR_n as a result can be voltage level or the current level of dc signal DCS_n, with the digital form performance), 260 of logic testers can be according to ammeter 240_1, ..., the digital measurement that ammeter 240_N is produced is DMR_1 as a result, ..., DMR_N decides the test result for the treatment of test suite 110.

In each embodiment of the present utility model, owing to used signal modular converter 220 to convert the simulation output signal AOS that assembly 110 to be tested is produced to dc signal DCS, so follow-up ammeter 240 and logic tester 260, purpose that can realize testing assembly 110 to be tested only need used.And signal modular converter 220, ammeter 240 all are the not high devices of cost with logic tester 260, use mixed-signal test machine (Mixed-signal tester compared to prior art, its price is quite expensive usually) test structure, the test structure of each embodiment of the utility model not only can reduce hardware cost required when testing, can also promote testing efficiency, these all are the characteristics that the utility model is better than prior art.

The above only is preferred embodiment of the present utility model, and all equalizations of doing according to claim of the present utility model change and modify, and all should belong to covering scope of the present utility model.

Claims (8)

1. a circuit test device is used for testing an assembly to be tested, it is characterized in that this device includes:

One signal modular converter is coupled to this assembly to be tested, and a simulation output signal that is used for this assembly to be tested is produced converts a direct current signal to;

One ammeter is coupled to this signal modular converter, is used for measuring this dc signal to produce a digital measurement result; And

One logic tester is coupled to this ammeter, is used for deciding according to this digital measurement result the test result of this assembly to be tested.

2. device as claimed in claim 1, wherein this signal modular converter includes:

One amplifier, a trapper, an A weighting filter, a Hi-pass filter, a low-pass filter or a root mean square change DC circuit, are used for converting this simulation output signal to this dc signal.

3. device as claimed in claim 1, wherein this ammeter in order to the voltage level that measures this dc signal to produce this digital measurement result.

4. device as claimed in claim 1, wherein this ammeter in order to the current level that measures this dc signal to produce this digital measurement result.

5. device as claimed in claim 1, wherein this logic tester receives this digital measurement result by a general purpose interface bus from this ammeter.

6. device as claimed in claim 1, wherein this device also includes:

One waveform generator is coupled to this assembly to be tested, is used to provide an analog input signal to this assembly to be tested;

Wherein this assembly to be tested produces this simulation output signal according to this analog input signal.

7. device as claimed in claim 6, wherein this logic tester is controlled this signal modular converter and this waveform generator by a continuity built-in testing control module, so that this assembly to be tested is carried out test.

8. device as claimed in claim 1, wherein this assembly to be tested includes an analog signal integrated circuit or a mixed-signal integrated circuit.

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