CN2854858Y - Connector for testing integrated circuit - Google Patents
Connector for testing integrated circuit Download PDFInfo
- Publication number
- CN2854858Y CN2854858Y CN 200520132850 CN200520132850U CN2854858Y CN 2854858 Y CN2854858 Y CN 2854858Y CN 200520132850 CN200520132850 CN 200520132850 CN 200520132850 U CN200520132850 U CN 200520132850U CN 2854858 Y CN2854858 Y CN 2854858Y
- Authority
- CN
- China
- Prior art keywords
- base
- connector
- terminal
- frame
- integrated circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 title claims description 25
- 238000003825 pressing Methods 0.000 claims description 49
- 230000007246 mechanism Effects 0.000 claims description 11
- 238000006073 displacement reaction Methods 0.000 abstract description 4
- 230000008878 coupling Effects 0.000 abstract 1
- 238000010168 coupling process Methods 0.000 abstract 1
- 238000005859 coupling reaction Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 6
- 210000000078 claw Anatomy 0.000 description 5
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 4
- 238000007790 scraping Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 229910000679 solder Inorganic materials 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 230000006835 compression Effects 0.000 description 2
- 238000007906 compression Methods 0.000 description 2
- 238000011990 functional testing Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000004308 accommodation Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Images
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses a connector for connecting with integrated circuit (IC) and detecting circuit connection state and electrical characters of the IC. The utility model mainly comprises a press frame, a base, a slide base enclosed within the base, and a plurality of terminals embedded in the base, wherein the press frame and the base form an elastic coupling by using a first elastic element; the slide base is disposed in a chamber of the base in such a way that one end of the slide base is engaged with the base by a second elastic element and the other end is provided with a guiding portion; and the press frame is fixed with a driving portion that offsets with the guiding portion in normal state. When the press frame is pressed downwards, the driving portion is allowed to contact with the guiding portion, resulting in the displacement of the slide base; and the actuation of the displacement can push the IC loaded in the slide base so that the contact of the IC contacts with the terminal inside the base in traversal movement manner and produces a scratch distance, thereby removing the oxide layer in the contact portion of the terminal and increasing the service life and reliability of the connector to be detected.
Description
Technical Field
The present invention relates to a connector, and more particularly to a connector for connecting an integrated circuit and testing the circuit status and electrical characteristics of the integrated circuit.
Background
Integrated Circuits (ICs) are typically tested after fabrication to determine their functionality and reliability, which typically includes pin connections, input impedance, power consumption, basic logic and voltage levels.
To test these finished ics, a connector is typically electrically connected to the test circuit or device, and the ic is removed from the connector after determining that the ic is free of defects.
Related art such as taiwan patent publication No. M251366, new patent of "socket for ic test", discloses a pressing frame 60 located on the upper end surface by pressing down, wherein the driving arm 62 moves the sliding plate 20 to the right during the pressing down process and opens the movable claw 47 of the terminal 44; meanwhile, the pressing arm 66 of the frame 60 is pressed to press the extension part 73 of the hook 70, so that the hook 70 is lifted by taking the lower shaft 71 as the axis; at this time, the ic 90 to be tested can be placed in the device, when the force is released by pressing the frame 60, the movable claw 47 of the terminal 44 moves back to wrap the solder ball 91 on the bottom surface of the ic 90 to be tested, and the lifted hook 70 springs back to the original position again with the lower shaft 71 as the axis, and the hook ear 72 clamps the ic 90 to be tested to perform various functional tests (the above description indicates the number of the drawing and the content of the patent specification), so as to position the ic to be tested by a connector to perform various functional tests on the ic.
In the above-described prior art, the present inventors have found several deficiencies to be improved, including:
the components of the connector are too complex to be assembled.
Secondly, the connector is used for clamping the conducting part of the integrated circuit 90, namely the solder ball 91, with the fixed claw 46 of the terminal after the movable claw 47 of the terminal is deformed and displaced, but the number of the terminals of the connector is large, and each terminal is required to have certain elastic restoring force, which is very difficult work; furthermore, the deformation distance of the terminal is too large to make the number of connector actions larger by the finger-moving claws 47, which accelerates the elastic fatigue of the terminal to reduce the service life, and also directly affects the reliability.
Third, the terminals of the connector should be made of metal, generally copper, and after a long time of contact with air, an oxide layer will be formed on the surface, which directly affects the quality of conduction and is not easy to be found, and how to effectively improve this dilemma is not discussed in the prior art.
SUMMERY OF THE UTILITY MODEL
The to-be-solved technical problem of the utility model is: a connector for testing an integrated circuit is provided to overcome the above-mentioned drawbacks of the prior art.
The technical solution of the utility model is that: a connector for testing an integrated circuit comprises a pressing frame, a base, a sliding seat contained by the base and a plurality of terminals embedded in the base; wherein:
the pressing frame is provided with an opening part for the integrated circuit to penetrate through, the outer edge of the opening part is connected with a frame, the frame is provided with a driving part towards the base, two opposite sides at different sides of the driving part are respectively provided with a pressing plate towards the direction of the sliding seat, and the pressing frame is connected with the base through a first elastic element;
the base is internally provided with a chamber for the slide seat to be placed in, the bottom of the chamber is provided with a terminal seat, and a plurality of terminal grooves for containing terminals are arranged in the terminal seat;
the sliding seat is formed by a hollow frame body, the frame body is provided with a plurality of wall surfaces and comprises a first wall surface and a second wall surface which correspond to each other, and a third wall surface and a fourth wall surface which correspond to each other, the first wall surface abuts against one end of a second elastic element, the second wall surface is supported by the second elastic element to abut against a driving part of the pressing frame under the normal state, the second wall surface is provided with a guide part, a step part for placing an integrated circuit to be tested is arranged in the frame body, and a positioning mechanism is arranged outside the third wall surface and the fourth wall surface and is matched with the pressing plate to present the state of releasing or clamping the integrated circuit;
the terminal is provided with a conduction part and a contact part, the conduction part is used for being connected and conducted with an external circuit or device, and the contact part is exposed out of the terminal groove and used for being conducted with a contact of the integrated circuit;
during operation, the pressing frame is pressed down to drive the linkage driving part and touch the guide part of the sliding seat, so that the sliding seat slides towards the direction of the second elastic element for a certain distance, at the moment, the pressing plate of the pressing frame also presses against the positioning mechanism to enable the positioning mechanism to be in a lifting state, at the moment, the integrated circuit to be tested is placed in the step part in the sliding seat, and the contact point of the integrated circuit falls between the adjacent terminal contact parts; after the IC is put in place, the press frame is released and restored to the initial position by the elastic force of the first elastic element, the positioning mechanism is released from the pressing of the press plate in the process, so that the IC is really clamped in the slide seat by the positioning mechanism, the slide seat is also slid to the initial position by the restoring elastic force of the second elastic element, and the contact of the IC is also slid to the contact part of the terminal to form a scraping distance.
The connector for testing the integrated circuit is characterized in that the frame is provided with a buckle hook facing the base at a position opposite to the driving part, the base is provided with a limiting groove corresponding to the outer wall of the buckle hook, and the top surface of the limiting groove is provided with a clamping part for clamping the buckle hook.
The connector for testing an integrated circuit as described above, wherein one end of the driving portion has an inclined surface, the guiding portion is also an inclined surface, and the two inclined surfaces are abutted against each other.
The connector for testing an integrated circuit as described above, wherein the positioning mechanism includes a pair of posts, an axis is disposed between the posts, the axis penetrates through a clamping piece, a guide plate extends from one end of the clamping piece to correspond to the pressing plate, and a torsion spring presses against the surface of the clamping piece.
The connector for testing an integrated circuit as described above, wherein the surface of the base is provided with at least one position-limiting hole corresponding to the position of the driving portion.
In the connector for testing an integrated circuit, the terminal is integrally formed, two end portions of the terminal are expanded outward in the same direction to form an expanded portion, an inner surface of the expanded portion forms a carrying surface, and the carrying surfaces of the expanded portions correspond to each other after the terminal is folded in half.
The connector for testing the integrated circuit is characterized in that the loading surface is wavy.
The connector for testing the integrated circuit is characterized in that a tin-containing hole is reserved when the conducting part of the terminal is formed.
The connector for testing an integrated circuit as described above, wherein the pressing frame is provided with a pillar for elastically connecting with the base in the direction of the base, and the pillar is arranged to mainly balance the frame during elastic movement; the surface of the base is provided with a containing hole for the first elastic element to be placed in at the position corresponding to the support post, and the other end of the first elastic element covers the support post.
The connector for testing an integrated circuit as described above, wherein a first channel is disposed between two sides of the terminal block and the inner wall of the base, a second channel is disposed between the other side of the terminal block and the wall of the accommodating chamber, and at least one positioning slot is disposed on the wall of the accommodating chamber opposite to the second channel, the positioning slot being used for accommodating the second elastic element.
The utility model discloses a characteristics and advantage as follows:
the connector of the utility model is used for connecting an integrated circuit IC for testing the circuit connection state and the electrical characteristics, which mainly comprises a pressing frame, a base, a sliding seat contained by the base and a plurality of terminals embedded in the base, wherein the pressing frame and the base are elastically connected by a first elastic element, the sliding seat is positioned in a containing chamber of the base, one side of the pressing frame is matched with the base through a second elastic element, the opposite side is provided with a guiding part, the pressing frame is provided with a driving part, the driving part is pressed against the guiding part in a normal state, when the pressing frame is pressed down, the driving part triggers the guide part to make the sliding seat generate displacement, the displacement action can push the integrated circuit loaded on the sliding seat, so that the conducting end of the integrated circuit is contacted with the terminal in the base in a transverse moving mode and generates a scraping distance, and the oxide layer formed on the surface of the terminal is removed, thereby prolonging the service life and the reliability of the test connector.
Compared with the prior art, the connector of the utility model has the following functions:
the component (I) is simple, and is beneficial to assembly and mass production.
And (II) the mechanism is used for moving the integrated circuit to enable the conduction part of the integrated circuit to be in contact with the terminal of the connector, the deformation of the terminal is small, the service life can be prolonged, and the reliability is good.
And thirdly, the conducting part of the integrated circuit is contacted with the terminal in the base in a transverse moving mode and generates a scraping distance, so that an oxide layer generated on the surface of the terminal can be removed, and the service life and the reliability of the connector are improved.
Drawings
Fig. 1 is an exploded perspective view of the connector of the present invention.
Fig. 2 is an assembled external view of the connector of the present invention.
Fig. 3 is a perspective view of the socket connector of the present invention after assembly, wherein the socket connector shows the pressing frame pressing down and the clamping piece of the sliding seat lifted.
Fig. 4 is an external view of the connector of the present invention.
Fig. 5 is a schematic diagram of a partial cross section and terminal operation when the ic is mounted in the connector of the present invention but the ic is not yet fixed and assembled.
Fig. 6 is a diagram of the contact state between the ball-shaped contact and the terminal contact portion of the integrated circuit, wherein the diagram shows that the contact has not yet come into contact with the terminal contact portion.
Fig. 7 is a schematic diagram of a partial cross section and terminal operation when the ic is mounted in the connector of the present invention and fixed assembly is completed.
Fig. 8 is a diagram of the contact state between a ball contact and a terminal contact portion of an integrated circuit, wherein the diagram shows that the contact has made contact with the terminal contact portion.
The reference numbers illustrate:
opening 10 of press frame 1
Limiting hole 24 and limiting groove 25
Holder 251 slide base 3
The fourth wall 34 guides the moving part 321
Clamping piece 39 guide plate 391
Torsion spring 392 terminal 4
First elastic element 5 second elastic element 6
Ball contact 70 for integrated circuit 7
Detailed Description
As shown in fig. 1 to 4, the connector of the present invention includes a pressing frame 1, a base 2, a sliding seat 3 contained by the base 2, and a plurality of terminals 4 embedded in the base 2; wherein,
the pressing frame 1 has an opening 10 for the ic 7 (please refer to fig. 2 and fig. 3) to penetrate through, the outer edge of the opening 10 is connected to the frame 11, the frame 11 is provided with a hook 110 toward the base 2, a driving part 111 facing the base 2 is provided at a position opposite to the hook 110, the bottom of the driving part 111 is provided with an inclined plane 114, two opposite sides at different sides of the hook 110 and the driving part 111 are respectively provided with a pressing plate 112 and a support 113 elastically connected to the base 2, the support 113 is arranged to balance the frame 11 during elastic movement.
The base 2 has a containing chamber 20 for accommodating the sliding seat 3, a terminal base 21 is disposed at the bottom of the containing chamber 20, a plurality of terminal slots 211 for accommodating the terminals 4 are disposed in the terminal base 21, two side edges of the terminal base 21 have first channels 22, a second channel 23 is disposed between the other side edge of the terminal base 21 and the wall surface of the containing chamber 20, at least one positioning groove 201 is disposed on the wall surface of the containing chamber 20 opposite to the second channel 23, and the positioning groove 201 is used for accommodating a second elastic element 6 (shown as a compression spring).
The surface of the base 2 is equipped with at least a spacing hole 24 corresponding to the position of the aforesaid driving part 111, for the driving part 111 to stretch into, there is a spacing groove 25 on the outer wall of the base 2 corresponding to the aforesaid buckle hook 110, the top of the spacing groove 25 is equipped with a clamping part 251 for buckle hook 110 to hold, there is an accommodation hole 26 for the first elastic component 5 (shown as a compression spring) to put into in the position corresponding to the aforesaid pillar 113, another end of the first elastic component 5 covers the pillar 113; in other words, the hook 110 can move in the limiting groove 25 after the pressing frame 1 is pressed down, and the limit of the hook 110 is limited by the retaining portion 251 when the hook moves in the reverse direction, so as to prevent the pressing frame 1 from separating from the base 2 (please refer to fig. 7 at the same time).
The sliding seat 3 is basically formed by a hollow frame 30, the frame 30 has a plurality of wall surfaces, including a corresponding first and second wall surfaces 31, 32, and another pair of corresponding third and fourth wall surfaces 33, 34, wherein the first wall surface 31 is used to abut against one end of the second elastic element 6, and the second wall surface 32 is normally abutted against the driving portion 111 of the pressing frame 1 by the support of the second elastic element 6; the second wall 32 has a guiding portion 321, the guiding portion 321 is an inclined surface, and the inclined surface just abuts against the inclined surface at the bottom of the driving portion 111, so that the driving portion touches the guiding portion 321 when the pressing frame 1 is pressed down, and the sliding base 3 slides towards the second elastic element 6.
The bottom of the frame 30 of the slide carriage 3 has a leg 35 avoiding the terminal base 21, the leg 35 is located on the first passage 22 of the base 2, so as to facilitate the moving position of the slide carriage 3, a step 301 for placing the integrated circuit 7 to be tested is provided in the frame 30, and a positioning mechanism is provided outside the third and fourth wall surfaces 33, 34, the positioning mechanism comprises a pair of upright posts 36, 37, a shaft 38 is disposed between the upright posts, the shaft 38 penetrates a clamping piece 39, a guide plate 391 extends from the clamping piece 39 to one end, the guiding plate 391 corresponds to the aforementioned pressing plate 112, and the surface of the clip 39 is pressed by a torsion spring 392, the clip 39 is stationary at normal state, and has a force pressing toward the ic 7 to be tested to position the ic 7, after the pressing plate 112 presses the guide plate 391, the force is larger than the pressing force of the torsion spring 392, so that the clamping piece 39 is in an lifted state to place or take out the ic 7 to be tested.
As shown in fig. 4, the terminal 4 has a conducting portion 40 and a contact portion 41, the conducting portion 40 is used to conduct with an external detection circuit or device, the contact portion 41 is used to conduct with a contact 70 of an ic 7 to be tested, in the case of the ic 7 disclosed in this embodiment, the contact 70 is a Ball Grid Array (BGA), so to enhance the contact effect between the terminal 4 and the contact 70, the contact portion 41 is designed to be sandwiched, that is, the terminal 4 is integrally formed, two end portions thereof are expanded to an outward expanding portion 411, 412 in the same direction in advance, inner surfaces of the outward expanding portions 411, 412 form a carrying surface 413, 414, the terminal 4 is folded to make the carrying surfaces 413, 414 of the outward expanding portions 411, 412 correspond to each other, and the contact 70 of the ic 7 is held by the two carrying surfaces 413, 414; in addition, the loading surfaces 413, 414 are both designed to be wavy, and as shown in fig. 6 and 8, the ball joint 70 will eventually fall between the opposite troughs 415, 416 of the two loading surfaces 413, 414 and be positioned securely.
The terminal 4 is assembled in the terminal groove 211, and the terminal 4 is provided with an overhanging ratchet part 42 for tightly matching with the inner wall surface of the terminal groove 211; and a tin-containing hole 401 is reserved in the conduction part 40 of the terminal during molding, and the tin-containing hole 401 is specially reserved during the folding molding of the terminal, so as to increase the tin-containing amount during the connection with an external circuit or device and increase the welding reliability.
In operation, please refer to fig. 5, the pressing frame 1 is pressed down, the driving portion 111 is linked to touch the guiding portion 321 of the sliding seat 3 on the second channel 23 of the base 2, so that the sliding seat 3 slides towards the second elastic element 6 for a certain distance, at this time, the pressing plate 112 of the pressing frame 1 is also pressed against the guiding plate 391 of the sliding seat, so that the clamping piece 39 (shown in fig. 3) is in an lifted state, at this time, the ic 7 to be tested is placed in the step portion 301 of the sliding seat 3, and the contact point 70 of the ic 7 is located between the adjacent terminal contact portions 41 as shown in fig. 6; after the ic 7 to be tested is placed, as shown in fig. 7, the pressing frame 1 can be released, the pressing frame 1 is restored to the initial position by the elastic force of the first elastic element 5, in this process, the guiding plate 391 is released from the pressing of the pressing plate 112, so that the clamping piece 39 is moved toward the ic 7 by the elastic force of the torsion spring 392, and the ic 7 is firmly clamped in the sliding seat 3, and the sliding seat 3 is also slid to the initial position by the restoring elastic force of the second elastic element 6, at this time, as shown in fig. 8, the ball contact 70 of the ic 7 is also slid between the two loading surfaces 413 and 414 of the contact portion 41 of the terminal 4, so as to form a scraping distance, that is, the oxidation layer generated after the loading surfaces 413 and 414 are removed by this friction, thereby prolonging the service life of the terminal 4 and increasing the contact reliability.
Although the present invention has been described with reference to particular embodiments, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention.
Claims (10)
1. A connector for testing an integrated circuit is characterized by comprising a pressing frame, a base, a sliding seat contained by the base and a plurality of terminals embedded in the base; wherein,
the pressing frame is provided with an opening part for the integrated circuit to penetrate through, the outer edge of the opening part is connected with a frame, the frame is provided with a driving part towards the base, two opposite sides at different sides of the driving part are respectively provided with a pressing plate towards the direction of the sliding seat, and the pressing frame is connected with the base through a first elastic element;
the base is internally provided with a chamber for the slide seat to be placed in, the bottom of the chamber is provided with a terminal seat, and a plurality of terminal grooves for containing terminals are arranged in the terminal seat;
the sliding seat is formed by a hollow frame body, the frame body is provided with a plurality of wall surfaces and comprises a first wall surface and a second wall surface which correspond to each other, and a third wall surface and a fourth wall surface which correspond to each other, the first wall surface abuts against one end of a second elastic element, the second wall surface is supported by the second elastic element to abut against a driving part of the pressing frame under the normal state, the second wall surface is provided with a guide part, a step part for placing an integrated circuit to be tested is arranged in the frame body, and a positioning mechanism is arranged outside the third wall surface and the fourth wall surface and is matched with the pressing plate to present the state of releasing or clamping the integrated circuit;
the terminal has a conduction part and a contact part, the conduction part is used for connecting and conducting with an external circuit or device, and the contact part is exposed out of the terminal groove and used for conducting with the contact of the integrated circuit.
2. The connector for testing an integrated circuit as claimed in claim 1, wherein the frame has a hook facing the base at a position opposite to the driving portion, the base has a position-limiting groove corresponding to an outer wall of the hook, and a top surface of the position-limiting groove has a retaining portion for retaining the hook.
3. The connector as claimed in claim 1, wherein the driving portion has an inclined surface at one end thereof, the guiding portion is also an inclined surface, and the two inclined surfaces are abutted against each other.
4. The connector as claimed in claim 1, wherein the positioning mechanism comprises a pair of posts, a shaft is disposed between the posts, the shaft extends through a clip, a guide plate extends from one end of the clip, the guide plate corresponds to the pressing plate, and a torsion spring presses against the surface of the clip.
5. The connector for testing integrated circuits according to claim 1, wherein the surface of the base has at least one position-limiting hole corresponding to the driving portion.
6. The connector as claimed in claim 1, wherein the terminals are integrally formed, and both ends of the terminals are outwardly expanded in the same direction to form an outwardly expanded portion, an inner surface of the outwardly expanded portion forms a mounting surface, and the mounting surfaces of the outwardly expanded portions correspond to each other after the terminals are folded in half.
7. The connector for testing integrated circuits of claim 6, wherein said carrier surface is corrugated.
8. The connector for testing an integrated circuit as claimed in claim 1 or 6, wherein the conductive portion of the terminal is formed to leave a tin-receiving hole.
9. The connector for testing integrated circuits according to claim 1, wherein said press frame has a support pillar facing the base for elastically connecting with the base to balance the frame when the frame is elastically moved; the surface of the base is provided with a containing hole for the first elastic element to be placed in at the position corresponding to the support post, and the other end of the first elastic element covers the support post.
10. The connector as claimed in claim 1, wherein a first channel is formed between two sides of the terminal block and the inner wall of the base, a second channel is formed between the other side of the terminal block and the wall of the chamber, and at least one positioning groove is formed in the wall of the chamber opposite to the second channel for receiving the second elastic element.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200520132850 CN2854858Y (en) | 2005-11-14 | 2005-11-14 | Connector for testing integrated circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200520132850 CN2854858Y (en) | 2005-11-14 | 2005-11-14 | Connector for testing integrated circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN2854858Y true CN2854858Y (en) | 2007-01-03 |
Family
ID=37581494
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200520132850 Expired - Fee Related CN2854858Y (en) | 2005-11-14 | 2005-11-14 | Connector for testing integrated circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN2854858Y (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103197104A (en) * | 2012-01-09 | 2013-07-10 | 京元电子股份有限公司 | Micro-pressure stress test seat |
| CN103727971A (en) * | 2012-10-15 | 2014-04-16 | 京元电子股份有限公司 | Test base provided with improved pressing pliers and dynamic test equipment using same |
-
2005
- 2005-11-14 CN CN 200520132850 patent/CN2854858Y/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103197104A (en) * | 2012-01-09 | 2013-07-10 | 京元电子股份有限公司 | Micro-pressure stress test seat |
| CN103197104B (en) * | 2012-01-09 | 2015-07-01 | 京元电子股份有限公司 | Micro-pressure stress test seat |
| CN103727971A (en) * | 2012-10-15 | 2014-04-16 | 京元电子股份有限公司 | Test base provided with improved pressing pliers and dynamic test equipment using same |
| CN103727971B (en) * | 2012-10-15 | 2016-04-27 | 京元电子股份有限公司 | The test bench of tool Improvement type pressing tongs and use the dynamic test equipment of this test bench |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C19 | Lapse of patent right due to non-payment of the annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |