CN2854858Y - Connectors for IC Test - Google Patents

Abstract

The utility model discloses a connector for connecting Integrated Circuit (IC) for testing the circuit connection state and electrical characteristics, which mainly comprises a press frame, a base, a slide seat contained by the base and a plurality of terminals buried in the base, wherein, the press frame and the base are elastically connected by a first elastic element, the slide seat is arranged in a containing chamber of the base, one side of the slide seat is matched with the base by a second elastic element, the opposite side is provided with a guide part, the press frame is provided with a driving part, the driving part and the guide part are mutually propped against each other in normal state, when the press frame is pressed down, the driving part triggers the guide part to make the slide seat generate displacement, the displacement can drive the integrated circuit loaded on the slide seat, the contact point of the integrated circuit is contacted with the terminal in the base in a transverse moving mode and generates a distance for scraping, thereby removing an oxide layer formed by the contact part of the terminal, so as to increase the service life and reliability of the test connector.

Description

Connectors for IC Test

technical field

The utility model relates to a connector, in particular to a connector for connecting an integrated circuit and testing the circuit state and electrical characteristics of the integrated circuit.

Background technique

After the integrated circuit (IC) is manufactured, it usually performs some necessary tests to determine its function and reliability. The items tested generally include the connection status of the pins, input impedance, power consumption, basic Logic and voltage levels, etc.

In order to detect these manufactured integrated circuits, a connector is usually used to electrically connect the detection circuit or device, and the integrated circuit is removed from the connector after it is determined that the integrated circuit is free of defects.

Relevant known technologies such as China Taiwan Patent Announcement No. M251366 "Integrated Circuit Testing Socket" new patent, which discloses a kind of "pressing the pressing frame cover 60 located on the upper end surface by pressing down, and its driving arm 62 will be used during the pressing down process." The sliding plate 20 moves to the right, and opens the movable claw 47 of the terminal 44; at the same time, pressing the pressing arm 66 of the frame cover 60 will press the overhang 73 of the clasp 70, so that the clasp 70 takes its lower shaft 71 as the axis Open it; at this time, the integrated circuit 90 to be tested can be put in, and when the frame cover 60 is pressed and released, the movable claw 47 of the terminal 44 moves back to clamp the solder ball 91 on the bottom surface of the integrated circuit 90 to be tested, and simultaneously The lifted buckle 70 bounces back to its original position with its lower support shaft 71 as the axis, and the upper hook ear 72 clamps the integrated circuit 90 to be tested to perform various functional tests" (the figure numbers marked in the above description Please refer to the content of the patent specification of this case, the purpose is to accurately locate the IC to be tested through a connector to perform various functional tests on it.

In the above-mentioned known technology, the designer found that there are several deficiencies that need to be improved urgently, including:

(1) The components of the connector are too complicated to be assembled.

(2) The connector clamps the conduction part of the integrated circuit 90, that is, the solder ball 91, with the movable claw 47 of the terminal deformed and shifted with the fixed claw 46 of the terminal, but the connector has a large number of terminals , it is very difficult to require each terminal to have a certain elastic recovery force; moreover, the deformation distance of the terminal is too large to refer to the movable claw 47, so that the more times the connector is activated, the faster the elastic fatigue of the terminal And reducing the service life also directly affects its reliability.

(3) The terminals of the connector should be made of metal, usually copper. After a long time of contact with the air, an oxide layer will be formed on the surface. The oxide layer will directly affect the quality of the conduction and is not easy to be found. How to effectively improve This dilemma is not discussed in this known technology.

Utility model content

The technical problem to be solved by the utility model is to provide a connector for integrated circuit testing to overcome the above-mentioned defects of the known technology.

The technical solution of the utility model is: a connector for integrated circuit testing, including a pressure frame, a base, a sliding seat contained by the base, and a plurality of terminals buried in the base; wherein:

The pressure frame has an opening through which the integrated circuit can penetrate, and a frame is connected to the outer edge of the opening, and the frame is provided with a driving part toward the base, and two opposite sides of the driving part are different from the driving part. A pressure plate is respectively provided towards the direction of the sliding seat, and the pressure frame and the base are connected by a first elastic element;

There is a chamber in the base where the sliding seat can be moved, a terminal seat is provided at the bottom of the chamber, and a plurality of terminal slots for accommodating terminals are provided in the terminal seat;

The sliding seat is formed by a hollow frame, which has a plurality of walls, including corresponding first and second walls, and another pair of corresponding third and fourth walls, the first The wall is against one end of the second elastic element. Under normal circumstances, the second wall is supported by the second elastic element against the driving part of the pressure frame. The second wall has a guide part, and the frame is provided with a Measuring the step where the integrated circuit is placed, a positioning mechanism is provided outside the aforementioned third and fourth walls, and the positioning mechanism cooperates with the aforementioned pressing plate to present a state of releasing or clamping the integrated circuit;

The terminal has a conduction portion and a contact portion, the conduction portion is used to connect and conduct with an external circuit or device, and the contact portion is exposed to the aforementioned terminal slot for conduction with the contact of the integrated circuit;

During operation, press down the pressing frame to move the driving part and touch the guiding part of the sliding seat, so that the sliding seat slides for a certain distance toward the second elastic element. At this time, the pressing plate of the pressing frame will also press against the positioning mechanism. Make the positioning mechanism lift up. At this time, place the integrated circuit to be tested on the step in the slide seat, and the contacts of the integrated circuit fall between the contact parts of adjacent terminals; after the integrated circuit is placed, release the pressure frame , the pressing frame is returned to the original position by the elastic force of the first elastic element. During this process, the positioning mechanism is released from the pressure of the pressing plate, so that the integrated circuit is indeed clamped in the sliding seat by the positioning mechanism, and the sliding seat is also held by the first elastic element. The restoring elastic force of the two elastic elements makes the sliding seat slide to the initial position, and the contact of the integrated circuit also slides into the contact portion of the terminal, forming a scraping distance.

The above-mentioned connector for integrated circuit testing, wherein the frame is provided with a clasp facing the base at the position opposite to the driving part, and the base is provided with a limiting groove on the outer wall corresponding to the clasp. The top surface of the slot is provided with a holding portion for the hook to hold.

In the above-mentioned connector for testing integrated circuits, one end of the driving part has an inclined surface, and the guiding part is also an inclined surface, and the two inclined surfaces are opposed to each other.

The above-mentioned connector for integrated circuit testing, wherein the positioning mechanism includes a pair of uprights, and an axis is arranged between the uprights, and the axis passes through a clip, and a guide plate extends toward one end of the clip, and the guide plate Corresponding to the aforementioned pressure plate, and the surface of the clip is pressed against by a torsion spring.

In the above-mentioned connector for testing integrated circuits, at least one limiting hole is provided on the surface of the base corresponding to the position of the driving part.

The above-mentioned connector for integrated circuit testing, wherein the terminal is integrally formed, and its two ends are pre-expanded in the same direction to form an outer expansion part, and the inner surface of the outer expansion part forms a loading surface, and the terminal is folded in half. The loading surfaces of the two outer expansion parts correspond to each other.

The above-mentioned connector for testing integrated circuits, wherein the loading surfaces are all corrugated.

In the above-mentioned connector for testing integrated circuits, a tin hole is reserved when the conduction portion of the terminal is formed.

In the above-mentioned connector for integrated circuit testing, wherein the pressure frame is provided with a pillar for elastic connection with the base toward the base, and the arrangement of the pillar is mainly to make the frame balance when the frame performs elastic movement; the base The seat surface is provided with an accommodating hole for the first elastic element to be placed at a position corresponding to the aforementioned pillar, and the other end of the first elastic element wraps around the pillar.

The above-mentioned connector for testing integrated circuits, wherein there is a first channel between the two sides of the terminal base and the inner wall of the base, and there is a first channel between the other side of the terminal base and the wall of the chamber. The second channel is provided with at least one positioning groove on the wall of the chamber opposite to the second channel, and the positioning groove is used for accommodating the second elastic element.

Features and advantages of the utility model are as follows:

The utility model is used to connect the integrated circuit IC for testing its circuit connection status and electrical characteristics. Among them, the first elastic element is used to form an elastic connection between the pressure frame and the base. The sliding seat is located in a chamber of the base, one side of which is matched with the base through the second elastic element, and a guide part is provided on the opposite side. , the pressure frame has a driving part. Under normal conditions, the driving part is in contact with the guide part. When the pressure frame is pressed down, the driving part touches the guide part to make the sliding seat displace. The action of this displacement can push the load on the sliding seat. an integrated circuit, make the conduction end of the integrated circuit contact with the terminal in the base in a lateral movement manner and generate a scraping distance, thereby removing the oxide layer formed on the surface of the terminal, so as to increase the use of the test connector life and reliability.

Compared with the known technology, the connector of the present invention has the following effects:

(1) The components are relatively simple, which is convenient for assembly and mass production.

(2) The mechanism is used to move the integrated circuit so that the conduction portion of the integrated circuit contacts the terminal of the connector. The small deformation of the terminal can prolong the service life, and the reliability is better.

(3) The conduction part of the integrated circuit contacts the terminal in the base in a lateral movement manner and creates a scraping distance, thereby removing the oxide layer produced on the surface of the terminal to increase the service life of the connector and reliability.

Description of drawings

Fig. 1 is a three-dimensional exploded view of the connector of the present invention.

Fig. 2 is an assembled appearance diagram of the connector of the present invention.

FIG. 3 is a three-dimensional schematic diagram of the socket connector of the present invention after the assembly is completed, in which the pressing frame is pressed down and the clip of the sliding seat is lifted.

Fig. 4 is a terminal appearance view of the connector of the present invention.

FIG. 5 is a partial cross-section and a schematic view of the terminal action when the integrated circuit is installed in the connector of the present invention but has not yet been fixed and assembled.

FIG. 6 is a contact state diagram of a ball contact of an integrated circuit and a terminal contact portion, wherein the figure shows that the contact has not been in contact with the terminal contact portion.

FIG. 7 is a partial cross-section and a schematic diagram of terminal action when the integrated circuit is installed in the connector of the present invention and fixed and assembled.

FIG. 8 is a contact state diagram of a ball contact of an integrated circuit and a terminal contact portion, wherein the figure shows that the contact has been in contact with the terminal contact portion.

Explanation of reference numbers:

Press frame 1 opening part 10

Frame 11 Buckle Hook 110

Drive unit 111 Press plate 112

Pillar 113 Slope 114

Pedestal 2 Compartment 20

Locating slot 201 Terminal block 21

Terminal slot 211

First Channel 22 Second Channel 23

Limiting hole 24 Limiting groove 25

Holder 251 Slider 3

Hollow frame body 30 first wall 31

Second wall 32 Third wall 33

The fourth wall 34 guide part 321

Steps 301 Feet 35

Column 36, 37 Axis 38

Clip 39 Guide Plate 391

Torsion Spring 392 Terminal 4

Conduction part 40 Contact part 41

External expansion department 411, 412 loading surface 413, 414

Carrying surface trough 415, 416 tin hole 401

First Elastic Element 5 Second Elastic Element 6

Integrated Circuits 7 7 Ball Contacts 70

Detailed ways

As shown in Figures 1 to 4, the connector of the present invention includes a pressure frame 1, a base 2, a sliding seat 3 contained by the base 2, and a plurality of terminals 4 embedded in the base 2; wherein,

The pressure frame 1 has an opening 10 that can penetrate the integrated circuit 7 (please refer to FIG. 2 and FIG. 3 ) to be tested. The outer edge of the opening 10 is connected with a frame 11, and the frame 11 is provided with a buckle toward the base 2. Hook 110 is provided with a driving part 111 facing the base 2 at the opposite position with the buckle hook 110. The bottom of the driving part 111 has an inclined surface 114, and the two opposite sides on different sides of the buckle hook 110 and the driving part 111 are facing toward Each direction of the sliding seat 3 is provided with a pressure plate 112 and a pillar 113 for elastic connection with the base 2. The arrangement of the pillar 113 is mainly to make the frame 11 produce balance when elastically moving.

There is a chamber 20 inside the base 2, which can be inserted into the sliding seat 3. A terminal seat 21 is provided at the bottom of the chamber 20. The terminal seat 21 is provided with a plurality of terminal slots 211 for accommodating the terminals 4. The terminal seat 21 There are first passages 22 on both sides, and a second passage 23 between the other side of the terminal base 21 and the wall of the chamber 20, and at least one other channel 23 is provided on the wall of the chamber 20 opposite to the second passage 23. The positioning slot 201 is used for accommodating the second elastic element 6 (shown as a compression spring).

The surface of the base 2 is provided with at least one limiting hole 24 corresponding to the position of the aforementioned driving part 111, for the driving part 111 to extend into, and a limiting groove 25 is provided on the outer wall of the base 2 corresponding to the aforementioned buckle hook 110. The top surface of the limiting groove 25 is provided with a clamping portion 251 for the buckle hook 110 to be buckled, and at the position corresponding to the aforementioned pillar 113 is provided with an accommodation for the first elastic element 5 (shown as a compression spring). hole 26, the other end of the first elastic element 5 wraps around the pillar 113; in other words, the buckle 110 can move in the limit groove 25 after the pressure frame 1 is pressed down, and the buckle 110 can move in the reverse direction , the limit is limited by the clamping portion 251, which can prevent the pressure frame 1 from detaching from the base 2 (please refer to FIG. 7 for this action).

The sliding seat 3 is basically formed by a hollow frame body 30. The frame body 30 has a plurality of walls, including corresponding first and second wall surfaces 31, 32, and another pair of corresponding third and fourth wall surfaces. 33, 34, wherein the first wall 31 is used to abut against one end of the second elastic element 6, and under normal conditions, the support of the second elastic element 6 makes the second wall 32 abut against the driving part 111 of the pressure frame 1; the second The wall surface 32 has a guide part 321. The guide part 321 shown in the figure is an inclined surface, which just resists the inclined surface at the bottom of the drive part 111, so that the drive part touches the guide part 321 when the pressing frame 1 is pressed down, so that the slide seat 3 slides towards the direction of the second elastic element 6.

The bottom of the frame body 30 of the slide seat 3 has a foot portion 35 avoiding the terminal block 21, and the foot portion 35 falls on the first channel 22 of the aforementioned base 2 to facilitate the movement of the slide seat 3. The frame body 30 is provided with The step portion 301 for placing the integrated circuit 7 to be tested is provided with a positioning mechanism on the outside of the third and fourth walls 33, 34. The positioning mechanism includes a pair of columns 36, 37, and an axis 38 is arranged between the columns. , the axis 38 runs through a clip 39, and the clip 39 extends to one end with a guide plate 391, the guide plate 391 corresponds to the above-mentioned pressure plate 112, and the surface of the clip 39 is pressed against by a torsion spring 392, and the clip 39 is stationary in normal state. It moves, and has a force of pressing against the integrated circuit 7 to be tested, so as to locate the integrated circuit 7. After the pressing plate 112 presses the guide plate 391, its force is greater than the pressing force of the torsion spring 392, so that the clip 39 is set off. status for placing or taking out the integrated circuit 7 under test.

As shown in Figure 4, the terminal 4 has a conduction portion 40 and a contact portion 41, the conduction portion 40 is used to connect and conduct with an external detection circuit or device, and the contact portion 41 is used to connect with the integrated circuit 7 to be tested. 70 is turned on. For the integrated circuit 7 disclosed in this embodiment, its contact 70 is a ball matrix arrangement (BGA). Therefore, in order to enhance the contact effect between the terminal 4 and the contact 70, the contact portion 41 is designed to sandwich In other words, the terminal 4 is integrally formed, and its two ends are pre-expanded in the same direction to form an outer expansion part 411, 412, and the inner surface of the outer expansion part 411, 412 forms a loading surface 413, 414, and then the The terminal 4 is folded in half so that the carrying surfaces 413, 414 of the two outer expansion parts 411, 412 correspond to each other, and the contact 70 of the aforementioned integrated circuit 7 is just embraced by the two carrying surfaces 413, 414; The surfaces 413 and 414 are both designed to be wave-shaped. Please refer to FIG. 6 and FIG. 8 at the same time. The ball joint 70 will eventually fall between the opposite troughs 415 and 416 of the two surfaces 413 and 414 to be positioned accurately.

The terminal 4 is assembled in the terminal groove 211, and the terminal 4 is provided with a protruding spine 42 for tightly fitting with the inner wall of the terminal groove 211; and the conducting portion 40 of the terminal is reserved for a tin The hole 401, the tin-holding hole 401 is specially reserved when the aforementioned terminal is folded and formed to increase the tin-holding capacity when connecting with an external circuit or device, so as to increase the reliability of soldering.

During operation, please refer to Fig. 5, press down the pressure frame 1, and the interlocking driving part 111 touches the guide part 321 of the slide seat 3 on the second channel 23 of the base 2, so that the slide seat 3 moves towards the second elastic direction. The component 6 slides a certain distance in the direction. At this time, the pressure plate 112 of the pressure frame 1 will also press against the guide plate 391 of the slide seat, so that the clip 39 (as shown in FIG. 3 ) is in a lifted state. At this time, the integrated circuit to be tested 7 is placed on the step portion 301 in the sliding seat 3, and the contact point 70 of the integrated circuit 7 falls between the adjacent terminal contact portions 41 as shown in FIG. , the pressure frame 1 can be released, and the pressure frame 1 is returned to the initial position by the elastic force of the first elastic element 5. During this process, the guide plate 391 is detached from the pressure of the pressure plate 112, so that the clip 39 is pressed by the elastic force of the torsion spring 392 Move towards the direction of the integrated circuit 7, and the integrated circuit 7 is firmly clamped in the slide seat 3, and the slide seat 3 also slides to the initial position by the recovery force of the second elastic element 6, which 8, the ball contact 70 of the integrated circuit 7 also slides between the two loading surfaces 413, 414 of the contact portion 41 of the terminal 4 to form a scraping distance, that is, the friction can The oxidation layer produced after the carrying surfaces 413 and 414 are left for a long time is removed, thereby prolonging the service life of the terminal 4 and increasing its contact reliability.

Although the utility model has been disclosed with specific embodiments, it is not intended to limit the utility model. Any person skilled in the art can replace equivalent components without departing from the concept and scope of the utility model, or The equivalent changes and modifications made according to the scope of protection of the utility model patent should still fall within the category covered by this patent.

Claims (10)

1. A connector for testing an integrated circuit is characterized by comprising a pressing frame, a base, a sliding seat contained by the base and a plurality of terminals embedded in the base; wherein,

the pressing frame is provided with an opening part for the integrated circuit to penetrate through, the outer edge of the opening part is connected with a frame, the frame is provided with a driving part towards the base, two opposite sides at different sides of the driving part are respectively provided with a pressing plate towards the direction of the sliding seat, and the pressing frame is connected with the base through a first elastic element;

the base is internally provided with a chamber for the slide seat to be placed in, the bottom of the chamber is provided with a terminal seat, and a plurality of terminal grooves for containing terminals are arranged in the terminal seat;

the sliding seat is formed by a hollow frame body, the frame body is provided with a plurality of wall surfaces and comprises a first wall surface and a second wall surface which correspond to each other, and a third wall surface and a fourth wall surface which correspond to each other, the first wall surface abuts against one end of a second elastic element, the second wall surface is supported by the second elastic element to abut against a driving part of the pressing frame under the normal state, the second wall surface is provided with a guide part, a step part for placing an integrated circuit to be tested is arranged in the frame body, and a positioning mechanism is arranged outside the third wall surface and the fourth wall surface and is matched with the pressing plate to present the state of releasing or clamping the integrated circuit;

the terminal has a conduction part and a contact part, the conduction part is used for connecting and conducting with an external circuit or device, and the contact part is exposed out of the terminal groove and used for conducting with the contact of the integrated circuit.

2. The connector for testing an integrated circuit as claimed in claim 1, wherein the frame has a hook facing the base at a position opposite to the driving portion, the base has a position-limiting groove corresponding to an outer wall of the hook, and a top surface of the position-limiting groove has a retaining portion for retaining the hook.

3. The connector as claimed in claim 1, wherein the driving portion has an inclined surface at one end thereof, the guiding portion is also an inclined surface, and the two inclined surfaces are abutted against each other.

4. The connector as claimed in claim 1, wherein the positioning mechanism comprises a pair of posts, a shaft is disposed between the posts, the shaft extends through a clip, a guide plate extends from one end of the clip, the guide plate corresponds to the pressing plate, and a torsion spring presses against the surface of the clip.

5. The connector for testing integrated circuits according to claim 1, wherein the surface of the base has at least one position-limiting hole corresponding to the driving portion.

6. The connector as claimed in claim 1, wherein the terminals are integrally formed, and both ends of the terminals are outwardly expanded in the same direction to form an outwardly expanded portion, an inner surface of the outwardly expanded portion forms a mounting surface, and the mounting surfaces of the outwardly expanded portions correspond to each other after the terminals are folded in half.

7. The connector for testing integrated circuits of claim 6, wherein said carrier surface is corrugated.

8. The connector for testing an integrated circuit as claimed in claim 1 or 6, wherein the conductive portion of the terminal is formed to leave a tin-receiving hole.

9. The connector for testing integrated circuits according to claim 1, wherein said press frame has a support pillar facing the base for elastically connecting with the base to balance the frame when the frame is elastically moved; the surface of the base is provided with a containing hole for the first elastic element to be placed in at the position corresponding to the support post, and the other end of the first elastic element covers the support post.

10. The connector as claimed in claim 1, wherein a first channel is formed between two sides of the terminal block and the inner wall of the base, a second channel is formed between the other side of the terminal block and the wall of the chamber, and at least one positioning groove is formed in the wall of the chamber opposite to the second channel for receiving the second elastic element.

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