CN2849732Y - Circuit for testing matching character of energy storage element - Google Patents

Circuit for testing matching character of energy storage element Download PDF

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Publication number
CN2849732Y
CN2849732Y CN 200520129334 CN200520129334U CN2849732Y CN 2849732 Y CN2849732 Y CN 2849732Y CN 200520129334 CN200520129334 CN 200520129334 CN 200520129334 U CN200520129334 U CN 200520129334U CN 2849732 Y CN2849732 Y CN 2849732Y
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China
Prior art keywords
energy
circuit
travelling wave
wave tube
storage travelling
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Expired - Lifetime
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CN 200520129334
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Chinese (zh)
Inventor
高境鸿
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United Microelectronics Corp
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United Microelectronics Corp
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Abstract

The utility model relates to a circuit for testing matching character of energy storage elements, which comprises a linear resistor and a power supply device. In addition, the circuit is electrically coupled between the two energy storage elements which are connected in series; if two of the energy storage elements are capacitors, the slope of a functional graph of input voltage and output voltage in the circuit is tested to obtain the matching state of the two capacitors.

Description

Be used to test the circuit of the matching properties of energy-storage travelling wave tube
Technical field
The utility model relates to a kind of circuit of the coupling situation in order to testing electronic element, and particularly relevant for a kind of circuit of testing the coupling situation of energy-storage travelling wave tube.
Background technology
In the mixed mode circuit design, the coupling of adjacent electronic elements is considerably important, is example with electric capacity, the reference when the coupling situation of measuring two adjacent electric capacity can provide circuit designers as design.But owing to measure the accuracy deficiency of the board of capacitance now, so can't be by the accurate capacitance of obtaining electric capacity to learn the coupling situation between two electric capacity.
For illustrating in order to measure the known circuit 10 of electric capacity coupling situation, it comprises PMOS transistor 11 and current supply device 13 with reference to figure 1, and wherein the first leakage/source terminal of PMOS transistor 11 is electrically coupled to current supply device 13 and output voltage V OutTwo testing capacitances are respectively first testing capacitance 91 and second testing capacitance 93, and second end of this first testing capacitance 91 is electrically coupled to the gate terminal of first end and the PMOS transistor 11 of second testing capacitance 93.
If first end of first testing capacitance 91 is that second end of the P1 and second testing capacitance 93 is P3, known way is at first with the P3 of second testing capacitance 93 end ground connection, and with the P1 end electric property coupling input voltage V of first testing capacitance 91 InaAnd obtain output voltage V OutaSuppose that at this capacitance of first testing capacitance 91 is that the capacitance of the C1 and second testing capacitance 93 is C3, then input voltage V InaWith output voltage V OutaRelation can represent by following formula after as calculated:
V outa=V ina×C1/(C1+C3+C par)
(1)
Similarly, the P1 with first testing capacitance 91 holds electric property coupling input voltage V InbAnd obtain corresponding output voltage V Outb, input voltage V then InbWith output voltage V OutbRelation can represent by following formula:
V outb=V inb×C1/(C1+C3+C par)
(2)
Fig. 2 is above-mentioned input voltage V InWith output voltage V OutFunctional arrangement.Please refer to Fig. 2, its cathetus 21 is input voltage V InWith output voltage V OutFunctional arrangement, and its slope value S1 can be expressed as:
S1=(V outb-V outa)/(V inb-V ina)
And following formula can be rewritten as follows according to (1) and (2) formula:
S1=C1/(C1+C3+C par)
(3)
Wherein, C ParBe the parasitic capacitance value in the known circuit 10.
Then, with the P1 end ground connection of first testing capacitance 91 and the P3 end electric property coupling DC input voitage V of second testing capacitance 93 In, the slope value S2 (being the slope of straight line 22) that similarly can draw the function of input voltage and output voltage is as follows:
S2=C3/(C1+C3+C par)
(4)
Next, (3) and (4) formula are carried out computing and can obtain following result:
2×(S1-S2)/(S1+S2)=2×(C1-C2)/(C1+C2)
(5)
By (5) formula as can be known, if try to achieve two slope S 1 and S2 of the functional arrangement of output voltage and output voltage, just can calculate the matching relationship of first testing capacitance 91 and second testing capacitance 93.
But known way has following shortcoming:
If the capacitance of a testing capacitance is bigger, or when being interdigital capacitor (interdigitalcapacitor), just the PMOS transistor is destroyed so that can't measure because of antenna effect easily.
Two, the PMOS transistor is easily because of the difference of its design or specification, and make that test condition needs to change thereupon, that is to say that the PMOS transistor design that the gauger is required to be different designs or specification there emerged a other test condition, this measure will make that measuring process is complicated and increase gauger's burden.
Three, have in the known circuit of coupling situation of electric capacity of different sized capacitors values with reference to the measurement of figure 3, input voltage is corresponding to the functional arrangement of output voltage.In Fig. 3, corresponding to the functional digraph of the input voltage of respective capacitances value and output voltage and inequality, and because of the PMOS transistor is the relation of nonlinear element, so in fact only some is a linear zone in its functional digraph, as the zone of obtaining slope is that the inelastic region then can't obtain correct result.
Summary of the invention
The purpose of this utility model is to be to provide a kind of circuit that is used to test the coupling of energy-storage travelling wave tube, can calculate two for example matching parameter between the energy-storage travelling wave tube of electric capacity accurately.
The utility model provides a kind of circuit that is used to test the coupling of energy-storage travelling wave tube, can be used for testing first energy-storage travelling wave tube and second energy-storage travelling wave tube, wherein, and first end of the second end electric property coupling, second energy-storage travelling wave tube of first energy-storage travelling wave tube.And circuit provided by the utility model comprises linear resistance and power supply device.Wherein, the signal output part of first end meeting electric property coupling circuit of the present utility model of linear resistance, and its second end can electric property coupling first energy-storage travelling wave tube second end and first end of second energy-storage travelling wave tube, and also second end of electric property coupling linear resistance of the output of power supply device.
In embodiment of the present utility model, above-mentioned first energy-storage travelling wave tube and second energy-storage travelling wave tube can be all capacitor.In addition, power supply device then can be a current supply device.
Of the present utility model being characterised in that, earlier with the first end electric property coupling DC voltage of first energy-storage travelling wave tube, being used as the signal input part of circuit of the present utility model, and with the second end ground connection of second energy-storage travelling wave tube.Relation between measuring-signal input end and the signal output part then is to obtain first relation function.Then, with the first end ground connection of first energy-storage travelling wave tube, and with the second end electric property coupling DC voltage of second energy-storage travelling wave tube, to be used as the signal input part of circuit.Relation between measuring-signal input end and the signal output part again, and obtain second relation function.According to first relation function and second relation function, just can obtain the matching parameter between first energy-storage travelling wave tube and second energy-storage travelling wave tube then.
Because the utility model is to utilize linear resistance, thus except can avoid PMOS transistor in the known circuit be subjected to easily antenna effect interference and the ruined shortcoming.And because of linear resistance is the relation of linear element, the functional arrangement of the input voltage of the utility model circuit and output voltage relation is pure straight line, not exclusively be linear shortcoming so can improve the functional arrangement of input voltage and output voltage relation in the known circuit, thereby the accuracy when improving measurement.
For above-mentioned and other purpose, feature and advantage of the present utility model can be become apparent, preferred embodiment cited below particularly, and cooperate appended graphicly, be described in detail below.
Description of drawings
Fig. 1 illustrates and is the known circuit in order to measurement electric capacity coupling situation.
Fig. 2 illustrates and is the input voltage of known circuit and the functional arrangement of output voltage.
Fig. 3 illustrates to measurement has in the known circuit of coupling situation of electric capacity of different sized capacitors values, and input voltage is corresponding to the functional arrangement of output voltage.
Fig. 4 illustrates the circuit that is used to test the coupling situation of energy-storage travelling wave tube for of the present utility model.
Fig. 5 illustrates and is the input voltage of circuit of the present utility model and the functional arrangement of output voltage.
Fig. 6 illustrates under the capacitance difference of testing capacitor, the input voltage of circuit of the present utility model and the functional arrangement of output voltage.
[main element label declaration]
10: known circuit 11:PMOS transistor
13: 91: the first testing capacitances of power supply device
93: the second testing capacitance P1: first end of first testing capacitance
P3: second end of second testing capacitance
40: the circuit that is used to test the matching properties of energy-storage travelling wave tube
41: linear resistance 43: current supply device
97: the second testing capacitances of 95: the first testing capacitances
P5: the first end P7 of first testing capacitance: second end of second testing capacitance
V C: input voltage V R: output voltage
Embodiment
Fig. 4 is the circuit 40 that is used to test the coupling situation of energy-storage travelling wave tube of the present utility model.Please refer to Fig. 4, circuit 40 provided by the utility model is to be used for the situation of test case as the coupling of energy-storage travelling wave tubes such as first testing capacitance 95 and second testing capacitance 97, wherein first end of the second end electric property coupling, second testing capacitance 97 of first testing capacitance 95.In the present embodiment, circuit 40 mainly is made up of linear resistance 41 and current supply device 43.Wherein, first end of linear resistance 41 is electrically coupled to an output voltage signal V R, second end then is electrically coupled to second end of first testing capacitance 95.In the present embodiment, first end of first testing capacitance 95 is denoted as P5, second end of second testing capacitance 97 then is denoted as P7.
Fig. 5 promptly illustrates and is the input voltage of circuit of the present utility model and the functional arrangement of output voltage.Please merge with reference to Fig. 4 and Fig. 5, the resistance value of supposing linear resistance 41 in the present embodiment is R, and the current value of current supply device 43 output is I, and the capacitance of first testing capacitance 95 is that the capacitance of the C5 and second testing capacitance 97 is C7 again.Way then of the present utility model at first can be with the P7 end ground connection of electric capacity 97, and the P5 with electric capacity 95 holds electric property coupling input voltage V then Ca, and obtain output voltage V from first end of linear resistance 41 RaInput voltage V then CaWith output voltage V RaRelation can represent by following formula:
V Ra=V Ca×C5/(C5+C7+C par1)+I×R
(6)
Similarly, the P5 with first testing capacitance 95 holds electric property coupling one input voltage V Cb, just can obtain output voltage V from first end of linear resistance 41 RbInput voltage V then CbWith output voltage V RbRelation can represent by following formula:
V Rb=V Cb×C5/(C5+C7+C par1)+I×R
(7)
According to (6) and (7) formula, can obtain input voltage V CAnd output voltage V ROutput voltage the slope relational expression, just the slope of straight line 53 is as follows:
S3=(V Rb-V Ra)/(V Cb-V Ca)=C5/(C5+C7+C par1)
(8)
With reference to Fig. 5, wherein, input voltage V CWith output voltage V RSlope be S3, the slope of straight line 53 just, and C Par1Be the parasitic capacitance value in the circuit 40 of the present utility model.
Next, with the P5 of first testing capacitance 95 end ground connection, and with the P7 end electric property coupling DC voltage V of second testing capacitance 97 C, draw input voltage V according to method same as described above again CAnd output voltage V RThe slope S 4 of output voltage, just the slope of straight line 54 is as follows:
S4=C7/(C5+C7+C par1)
(9)
(8) and (9) are put in order, just can be obtained following relational expression:
2×(S3-S4)/(S3+S4)=2×(C5-C7)/(C5+C7)
(10)
By (10) formula as can be known, if try to achieve two slope S 3 and S4 of the functional arrangement of output voltage and output voltage, just can calculate the matching relationship of first testing capacitance 95 and second testing capacitance 97.
Comprehensive above description that is to say that the gauger is earlier with P5 electric property coupling DC input voitage V CAnd, can draw this moment and measure input voltage V simultaneously with P7 ground connection CWith output voltage V RFunctional arrangement, to obtain slope S 3.Again with P7 electric property coupling DC input voitage V CAnd, can draw this moment and measure input voltage V simultaneously with P5 ground connection CWith output voltage V RFunctional arrangement, to obtain slope S 4, can draw the matching relationship of first testing capacitance 95 and second testing capacitance 97 again according to (10) formula.
Current supply device 43 of the present utility model (for example: be to be used to the electric current that output has high stability in the circuit 40 of the present utility model HP C4156), to guarantee the measurement accuracy of circuit 40 of the present utility model.
Fig. 6 is the input voltage V of circuit 40 of the present utility model CWith output voltage V RFunctional arrangement, by in can find out output voltage V RMagnitude of voltage less than the magnitude of voltage V of input voltage CHalf, this be because circuit 40 in have the parasitic capacitance value C that can not ignore Par1Therefore and reduce output voltage V RShared partial pressure ratio in circuit 40 of the present utility model.(90*90) parasitic capacitance value C therefore time the then when the capacitance of testing capacitance is big Par1The ratio of integral capacitor value that accounts for circuit of the present utility model is less, so the magnitude of voltage V of the output voltage when measuring the coupling of big electric capacity (90*90) RBe in close proximity to input voltage V CHalf of magnitude of voltage.
Though the utility model discloses as above with preferred embodiment; right its is not in order to limit the utility model; any those skilled in the art; in not breaking away from spirit and scope of the present utility model; when doing a little change and retouching, therefore protection domain of the present utility model is as the criterion when looking appended the claim scope person of defining.

Claims (5)

1. circuit that is used to test the coupling of energy-storage travelling wave tube, the coupling situation that is suitable for testing first energy-storage travelling wave tube and second energy-storage travelling wave tube, wherein second end of this first energy-storage travelling wave tube couples first end of this second energy-storage travelling wave tube, and this circuit comprises:
Linear resistance, the signal output part of its this circuit of first end electric property coupling, and first end of second end of its this first energy-storage travelling wave tube of second end electric property coupling and this second energy-storage travelling wave tube; And
Power supply device, its output terminal are second ends that is electrically coupled to this linear resistance.
2. circuit according to claim 1, wherein this first energy-storage travelling wave tube and this second energy-storage travelling wave tube all are capacitor.
3. circuit according to claim 1, wherein this power supply device is a current supply device.
4. circuit according to claim 1, the wherein first end electric property coupling DC voltage of this first energy-storage travelling wave tube, and the second end ground connection of this second energy-storage travelling wave tube.
5. circuit according to claim 1, the second end electric property coupling DC voltage of the wherein first end ground connection of this first energy-storage travelling wave tube, and this second energy-storage travelling wave tube.
CN 200520129334 2005-10-28 2005-10-28 Circuit for testing matching character of energy storage element Expired - Lifetime CN2849732Y (en)

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Application Number Priority Date Filing Date Title
CN 200520129334 CN2849732Y (en) 2005-10-28 2005-10-28 Circuit for testing matching character of energy storage element

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Application Number Priority Date Filing Date Title
CN 200520129334 CN2849732Y (en) 2005-10-28 2005-10-28 Circuit for testing matching character of energy storage element

Publications (1)

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CN2849732Y true CN2849732Y (en) 2006-12-20

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109975617A (en) * 2019-04-23 2019-07-05 晶晨半导体(上海)股份有限公司 A kind of the test circuit and test method of matched crystal load capacitance

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109975617A (en) * 2019-04-23 2019-07-05 晶晨半导体(上海)股份有限公司 A kind of the test circuit and test method of matched crystal load capacitance

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CX01 Expiry of patent term

Granted publication date: 20061220

EXPY Termination of patent right or utility model