CN2829296Y - Circuit board with testing structure - Google Patents

Circuit board with testing structure Download PDF

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Publication number
CN2829296Y
CN2829296Y CN 200520044759 CN200520044759U CN2829296Y CN 2829296 Y CN2829296 Y CN 2829296Y CN 200520044759 CN200520044759 CN 200520044759 CN 200520044759 U CN200520044759 U CN 200520044759U CN 2829296 Y CN2829296 Y CN 2829296Y
Authority
CN
China
Prior art keywords
circuit board
testing
test
voltage
tests
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN 200520044759
Other languages
Chinese (zh)
Inventor
杨联亮
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Huanda Computer Shanghai Co Ltd
Shanghai Huanda Computer Technology Co Ltd
Mitac International Corp
Original Assignee
Shanghai Huanda Computer Technology Co Ltd
Mitac International Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Huanda Computer Technology Co Ltd, Mitac International Corp filed Critical Shanghai Huanda Computer Technology Co Ltd
Priority to CN 200520044759 priority Critical patent/CN2829296Y/en
Application granted granted Critical
Publication of CN2829296Y publication Critical patent/CN2829296Y/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

The utility model relates to a circuit board with a testing structure, which is suitable for testing a voltage testing unit, wherein the voltage testing unit is provided with two testing ends; the circuit board comprises an insulated base plate; a plurality of wirings are arranged on the insulating base plate; a plurality of communicating holes which are used for connection are respectively arranged in the wirings; the communicating holes which are used for connection are used for providing the respective penetration of the ends of a plurality of electronic elements; electrical connection is formed between the electronic elements. Two end parts used for testing are arranged on the same wiring in an interval way to be used for providing the respective contact of the testing ends of the voltage testing unit; electrical connection is formed. Under the condition that the circuit board is in a conducting state, two testing ends are simultaneously contacted with the two end parts used for testing, thereby, the voltage characteristics between the two end parts used for testing are tested. Voltage value is directly tested through a predetermined end part used for testing on the circuit board. After calculation, the current value can be obtained; the connection of conducting wires is omitted during the current test procedure.

Description

Circuit board with test structure
[technical field]
The utility model is a kind of circuit board, and particularly a kind of circuit board with test structure makes test operation convenient and quick.
[background technology]
See also shown in Figure 1, the available circuit plate comprises an insulated substrate 10 ', be formed with some distributions (for example first distribution 11 ' and second distribution 12 ') on this insulated substrate 10 ', wherein, be arranged with some connections on this first distribution 11 ' with through holes (C0 ' for example, C1 ', C2 ', C3 ' ...), and be arranged with some connections on this second distribution 12 ' with through holes (D0 ' for example, D1 ', D2 ', D3 ' ...), these connections wear respectively in order to some terminals of electronic components to be provided with through hole, for example, connect and use through hole C0 ', connect a power-supply unit 14 ' between the D0 ', connect and use through hole C1 ', connect one first electronic component 15 ' between the D1 ', connect and use through hole C2 ', connect one second electronic component 16 ' between the D2 ', connect and use through hole C3 ', connect other electron component between the D3 ', after power-supply unit 14 ' was unlocked, circuit board then was under the conduction state.
For guaranteeing the operate as normal of each electronic component on the circuit board, when producing and keep in repair, the staff needs carry out current detecting to each electronic component.Detection method commonly used can be consulted shown in Figure 2, end series connection at first electronic component 15 ' inserts an ammeter 20 ', the numerical value that shows in the ammeter 20 ' is then for flowing through the size of current of first electronic component 15 ', and the staff relies on this size of current then can judge whether operate as normal of first electronic component 15 '.
Though, though this kind electric current detecting method is directly perceived, before whenever once testing, the staff must carry out the work that lead connects, comparatively trouble operates.
[summary of the invention]
Main purpose of the present utility model is to provide a kind of circuit board with test structure, makes test job convenient quick again.
To achieve the above object, a kind of circuit board with test structure be applicable to when testing for a voltage measurement unit and use that wherein, this voltage tester unit is provided with two test leads, and this circuit board comprises: an insulated substrate; Be formed with some distributions on this insulated substrate; Be arranged with some connection through holes on these distributions, these connections wear respectively in order to some terminals of electronic components to be provided with through hole, and constitute electric connection between these electronic components; Be interval with two tests on the same distribution and use the end, contact respectively, and constitute electric connection in order to the test lead that this voltage tester unit is provided; Be under the conduction state at this circuit board, two test leads contacted two tests simultaneously use the end, test with the voltage characteristic between the end thereby can record two.
Compared to prior art, the utility model can be by test default on the circuit board with the end directly in order to record magnitude of voltage, can obtain current value after as calculated, and omit the connection of lead in the testing current process.
[description of drawings]
Fig. 1 is the structural representation of available circuit plate.
Fig. 2 is the structural representation that carries out current detecting at first electronic component among Fig. 1.
Fig. 3 is the structural representation during the utility model is applied to test.
Fig. 4 is the circuit block diagram of voltage tester unit.
Fig. 5 is test structure figure of the present utility model.
[embodiment]
See also shown in Figure 3ly, the circuit board that the utlity model has test structure comprises an insulated substrate 10, is formed with some distributions (for example first distribution 11 and second distribution 12) on this insulated substrate 10.Wherein, this first distribution 11 is provided with a connection through hole C0, and extend some branched wirings (for example first branched wirings 111, second branched wirings 112, the 3rd branched wirings 113 on first distribution 11 ...), the end of these branched wirings 111,112,113 is respectively equipped with and connects with through hole C1, C2, C3.In addition, on the length direction of these branched wirings 111,112,113, be interval with two test end (A1 respectively, B1), (A2, B2), (A3, B3), these tests end (A1, B1), (A2, B2), (A3 B3) can expose to the surface of circuit board, and two set on same branched wirings tests are used during for test with forming a test zone between the end.In present embodiment, (A1 B1) is coupled respectively to a voltage tester unit 30 with the end in two set on first branched wirings 111 tests.And be arranged with some connections on this second distribution 12 with through holes (for example D0, D1, D2, D3 ...), these connect with through hole (C0, C1 ... D0, D1 ...) wear respectively in order to some terminals of electronic components to be provided.For example, connect with connecting a power-supply unit 14 between through hole C0, the D0, connect with connecting one first electronic component 15 (E1) between through hole C1, the D1, connect with connecting one second electronic component 16 (E2) between through hole C2, the D2, connect with connecting other electron component between through hole C3, the D3, after power-supply unit 14 was unlocked, circuit board then was under the conduction state.
See also shown in Figure 4ly, this voltage tester unit 30 is provided with two test leads 301,302, is under the conduction state at this circuit board, and two test leads 301,302 are contacted two tests simultaneously with end A1, B1.Distribution on the circuit board can be the copper metal, and the copper metal is conductor, and then test (being assumed to be U with the voltage between end A1, the B1 A1B1) can be very little, thereby this voltage tester unit 30 can be by an amplifier 31 and a voltmeter 33 coupling back formation, so that read magnitude of voltage.The enlargement ratio of supposing this amplifier 31 is 100, and the magnitude of voltage that voltmeter 33 is read is U Out, then by calculating as can be known U A1B1=U Out/ 100.
, be example please with first branched wirings 111 in conjunction with consulting Fig. 3 and shown in Figure 5, the resistance value R of test between end A1, the B1 A1B1=σ * L/A (wherein, σ is the resistivity of copper, and L is the length between A1, the B1, and A is the area of section of first branched wirings 111).When producing circuit board, only need length and area of section between definite A1, the B1 can determine R A1B1Size.
Hence one can see that, passes through I A1B1=U A1B1/ R A1B1Thereby, obtain the size of current that flows through first electronic component 15, so that the staff judges comparison.In like manner, also be applicable to test with the end (A2, B2), (A3 B3) waits the test at place, to obtain the size of current that flows through second electronic component 16 or other electron component.

Claims (4)

1. circuit board with test structure be applicable to when testing for a voltage measurement unit and use that wherein, this voltage tester unit is provided with two test leads, and this circuit board comprises:
One insulated substrate,
Some distributions are formed on the insulated substrate,
Some connection through holes are divided on these distributions, wear respectively in order to some terminals of electronic components to be provided, and constitute electric connection between these electronic components;
The end is used in two tests, is located on the same distribution at interval, contacts respectively in order to the test lead that this voltage tester unit is provided, and constitutes electric connection;
Be under the conduction state at this circuit board, two test leads contacted two tests simultaneously use the end, test with the voltage characteristic between the end thereby can record two.
2. the circuit board with test structure according to claim 1, it is characterized in that: comprise one first distribution in these distributions, and extend some branched wirings on this first distribution, the end of these branched wirings is respectively equipped with to connect uses through hole, is interval with two tests respectively and uses the end on the length direction of these branched wirings.
3. the circuit board with test structure according to claim 1 and 2, it is characterized in that: these tests can expose to the surface of circuit board with the end, and two set on same branched wirings tests are used during for test with forming a test zone between the end.
4. the circuit board with test structure according to claim 1 and 2 is characterized in that: this voltage tester unit can form by an amplifier and voltmeter coupling back.
CN 200520044759 2005-09-02 2005-09-02 Circuit board with testing structure Expired - Fee Related CN2829296Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 200520044759 CN2829296Y (en) 2005-09-02 2005-09-02 Circuit board with testing structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 200520044759 CN2829296Y (en) 2005-09-02 2005-09-02 Circuit board with testing structure

Publications (1)

Publication Number Publication Date
CN2829296Y true CN2829296Y (en) 2006-10-18

Family

ID=37080845

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 200520044759 Expired - Fee Related CN2829296Y (en) 2005-09-02 2005-09-02 Circuit board with testing structure

Country Status (1)

Country Link
CN (1) CN2829296Y (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103543389A (en) * 2012-07-17 2014-01-29 日本电产理德株式会社 Insulation inspection method and insulation inspection apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103543389A (en) * 2012-07-17 2014-01-29 日本电产理德株式会社 Insulation inspection method and insulation inspection apparatus

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Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20061018

Termination date: 20091009