CN2685891Y - Connecting sheet tester - Google Patents
Connecting sheet tester Download PDFInfo
- Publication number
- CN2685891Y CN2685891Y CN 200420006089 CN200420006089U CN2685891Y CN 2685891 Y CN2685891 Y CN 2685891Y CN 200420006089 CN200420006089 CN 200420006089 CN 200420006089 U CN200420006089 U CN 200420006089U CN 2685891 Y CN2685891 Y CN 2685891Y
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- Prior art keywords
- test
- circuit under
- flakes
- proving installation
- under test
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- Expired - Fee Related
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Abstract
The utility model provides a connecting sheet tester which is provided with a pedestal, a drive unit, a data processing unit and an image positioning unit. The pedestal is provided with a test area that is used for placing a circuit to be tested, and the driving unit is arranged on the pedestal and can drive a test unit to carry out moving above the test area in a three-dimensional directional mode. The data processing unit is used for processing test data tested by the test unit, and the image positioning unit can check the position of the circuit to be tested and control the driving unit to carry out fine adjustment of the test unit to make the test unit carry out accurately testing the circuit to be tested.
Description
Technical field
The utility model relates to a kind of proving installation in flakes, the proving installation in flakes of a particularly a kind of framing unit and a data processing unit.
Background technology
Along with science and technology and procedure for producing development of technology, make the volume of present electronic product towards microminiaturization evolution, therefore under the influence of microminiaturization, more need in the process of production test to locate accurately, to guarantee that electronic product has good test contact, the especially test process of high-frequency electronic product, if not test contact is accurately arranged slightly, will cause very high fraction defective, so promptly can cause greatest influence production.
In addition, in some high-frequency electronic products (for example VCO), in process of production can be because of the accurate value range of electronics materials and parts, and the variation that produces .. parameters such as frequency, power, therefore needing to collect a large amount of test datas is adjusted, in view of this, the utility model provides a kind of proving installation in flakes, can collect test data automatically and have good test position fix.
Summary of the invention
Fundamental purpose of the present utility model provides a kind of proving installation in flakes, can provide location accurately by a framing unit.
Secondary objective of the present utility model provides a kind of proving installation in flakes, can be by a data processing unit in order to collection/analytical test result, and with as with reference to foundation.
Proving installation in flakes of the present utility model includes: a base, a driver element, a data processing unit and a framing unit.This base has a test section, in order to put a circuit under test, this driver element is arranged on this base and can drives a test cell carries out three-dimensional above this test section motion, data processing unit is in order to handle the measured test data of this test cell, this framing unit can detect the position of this circuit under test and control the trimming movement that this driver element carries out this test cell, so that this test cell carries out correct test action to this circuit under test.
Be cognitive better and understand feature of the present utility model, purpose and function, now conjunction with figs. describe in detail as after.
The accompanying drawing summary
Fig. 1 is the block schematic diagram for proving installation in flakes of the present utility model.
Fig. 2 is the schematic perspective view for proving installation in flakes of the present utility model.
Fig. 3 A is circuit under test preferred embodiment of the present utility model.
Fig. 3 B is another preferred embodiment of circuit under test of the present utility model.
Fig. 4 is the synoptic diagram for test result of the present utility model.
The drawing number explanation:
10-is proving installation in flakes
The 11-base
The 111-slide rail
The 12-base station
The 13-test cell
The 14-data processing unit
The 15-driver element
The 151-spreader
The 152-pillar
The 153-step motor
16-framing unit
The 17-display unit
The 18-circuit under test
181,181A-anchor point
1811-the one VCO
1812-the 2nd VCO
1813-the 3rd VCO
1814-the 4th VCO
The 19-substrate
The 91-first direction
The 92-second direction
The 93-third direction
Embodiment
Proving installation in flakes of the present utility model, usefulness that one circuit under test carries out testing electrical property can be provided and provide accurate location by a framing unit, in order to carrying out testing electrical property and utilize the test result of data reasons unit in order to record, arrangement circuit under test, this test result can provide the slip-stick artist as the reference foundation.
See also shown in Figure 1ly, be the circuit block diagram and the schematic perspective view of proving installation in flakes of the present utility model preferred embodiment.This is proving installation 10 in flakes, includes: a base 11, a base station 12, a test cell 13, a data processing unit 14, a driver element 15, a framing unit 16 and a display unit 17.This base has a test section, and this base station 12 is arranged on this test section and this base station 12 can be put a circuit under test 18 to carry out follow-up test action.This test cell 13 is to be positioned at this top, position, test section, and this test cell 13 has at least one probe (figure does not show), the quantity of this probe, decide according to actual testing requirement, when this test cell 13 is tested, probe directly couples circuit under test 18 to carry out testing electrical property, and this data processing unit 14 can be collected the test data of circuit under test 18, and after this test data processing, be presented on this display unit 17, make the tester can learn result to be measured immediately, this data processing unit 14 more can be collected several test results and this test result is analyzed/put in order in addition, one form or a chart can be provided, learn the yield of circuit under test 18 for the slip-stick artist.This driver element 15 is in order to drive the motion that this test cell 13 carries out three-dimensional (first direction 91, a second direction 92 and a third direction 93), as shown in Figure 2, this driver element 15 has a spreader 151 and two pillars 152 and two step motor (153a, 154b), this base 11 offers two slide rails 111 in addition, form a type structure in order to provide this two pillar 152 to be separately positioned in the slide rail 111 and, and this spreader 151 is provided with a sliding seat 154 with this spreader 151.By this step motor (153a, 154b) drive this sliding seat 154 and these two pillars 152, make these two pillars 152 carry out moving of a first direction 91 and this sliding seat 154 and carry out moving of a second direction 92 along the bearing of trend of spreader 151 along the bearing of trend of slide rail 111, wherein this sliding seat 154 more can carry out the motion of a third direction 93 by a pneumatic cylinder (figure does not show).This test cell 13 and this framing unit 16 are arranged on this sliding seat 154, to carry out the motion of three-dimensional, it is so that this test cell 13 is corresponding with the position of circuit under test 18, to carry out both testing electrical properties smoothly, and this two pillar 152 has a height perpendicular with this base 11, can make the height of this test cell 13, be seated on this base station 12 in order to circuit under test 18 at a distance of this base station.In addition, framing unit 16 is connected with this driver element 15, the position of this framing unit this circuit under test 18 of 16 fechtables and carry out the trimming movement of this test cell 13 according to this driver element 15 of position control of this circuit under test 18, so that this test cell 13 can have location more accurately with this circuit under test 18, correctly to carry out test action, among another embodiment, this base station 12 has an angle adjusting (figure does not show), this angle adjusting can be adjusted the angle of this base station 12, when produce because of mechanical precision sometimes between circuit under test 18 and the test cell 13 slightly differential seat angle apart from the time, can finely tune circuit under test 18 and test cell 13 angle between the two by angle adjusting, can make to have contact closely between the two, so that test position fix more accurately to be provided.
In this preferred embodiment, this circuit under test 18 usefulness one voltage controlled oscillator (Voltage ControlledOscillator, be designated hereinafter simply as VCO) explanation, though in this preferred embodiment, this circuit under test 18 is a VCO, but this circuit under test 18 also can be the circuit under test of other high-frequency circuit or the accurate assignment test of other needs.As shown in Figure 3A, this circuit under test 18 has an anchor point 181, and this framing unit 16 captures the image of these anchor points 181, and learns this position of object under test 18 on base station 12 by the image of location electricity, in order to carry out trimming movement.
These are in flakes during proving installation 10 starts, place this circuit under test 18 on this base station 12 and this driver element 15 can order about this framing unit 16 and this test cell 13 moves to this place, circuit under test 18 tops, begin to capture the position of this anchor point 181 by this framing unit 16 again and according to this position, finely tune the position of this test cell 13, make this test cell 13 can be correctly with this circuit under test to should circuit under test, and motion and this circuit under test of carrying out third direction 93 couple to carry out testing electrical property, as frequency test, power test, sensitivity and phase noise, and test result can be presented on this display unit 17.
See also shown in Fig. 3 B, generally speaking VCO circuit volume is very small, therefore have a plurality of VCO and a plurality of anchor point 181A at a plate base 19 (this substrate can be a PCB or a ceramic substrate) usually in the manufacturing production run, each anchor point 181A is a corresponding VCO respectively, so that the accurate position of each VCO of identification of this framing device 16 is to be four VCO (one the one VCO1811, one the 2nd VCO1812, one the 3rd VCO1813, one the 4th VCO1814) and four anchor point 181A among the figure.This is in flakes during the proving installation start, this pcb board 19 places on this base station 12 and this driver element 15 can order about this framing device 16 and this test cell 13 moves to place, VCO1811 top, begin to capture the anchor point 181A of a VCO by this framing device 16 again and according to the position of anchor point 181A, finely tune this test cell 13, so that this test cell 13 can correctly couple with a VCO1811, to carry out testing electrical property, test the 2nd VCO1812 more in regular turn, the 3rd VCO1813 and the 4th VCO1814, and test data is stored in this data processing unit 14, in addition, this in flakes proving installation 10 after VCO all on the pcb board 19 test finishes, can be with the test result of each VCO, should be presented on this display unit 17 (as shown in Figure 4) according to the corresponding position of the VCO on the pcb board 19, when the 2nd VCO1812 is mistake, the printed words unit that can show " not passing through " at the 2nd VCO1812 opposite position, make the tester just can learn the test result of each VCO at once, data processing unit more can be collected the test result of a large amount of VCO in addition, analyzes/usefulness of adjustment so that the slip-stick artist to be provided.
Only the above person only is preferred embodiment of the present utility model, when can not with restriction scope of the present utility model.Promptly the equalization of being done according to the utility model claim generally changes and modifies, and will not lose main idea of the present utility model place, does not also break away from spirit and scope of the present utility model, and the former capital should be considered as further enforcement situation of the present utility model.
Claims (12)
1. a proving installation in flakes can carry out testing electrical property to a circuit under test, this in flakes proving installation comprise:
One base has a test section, in order to put this circuit under test;
One driver element is arranged on this base, can drive a test cell carries out three-dimensional above this test section motion; And
One data processing unit couples this test cell, in order to handle the measured test data of this test cell;
One framing unit, it is to be connected with this driver element, can detect the position of this circuit under test and control the trimming movement that this driver element carries out this test cell, so that this test cell carries out test action to this circuit under test.
2. proving installation in flakes as claimed in claim 1 more comprises a base station, is arranged on this test section, and wherein, this circuit under test is arranged on this base station.
3. proving installation in flakes as claimed in claim 1 wherein, more comprises a display unit, and it is to couple this data processing unit, and this display unit can show the test data of this test cell.
4. proving installation in flakes as claimed in claim 1, wherein, this test cell has at least one probe, and this probe can provide this circuit under test to carry out testing electrical property.
5. proving installation in flakes as claimed in claim 2, wherein, this base station is connected with an angle adjusting, and this angle adjusting can be adjusted the angle of this base station.
6. proving installation in flakes as claimed in claim 1, wherein, this circuit under test has at least one anchor point, and this framing unit captures this anchor point, and adjusts the position of this test cell according to this anchor point.
7. proving installation in flakes comprises:
One substrate to be measured, it is to have a plurality of circuit under test and a plurality of anchor point, this anchor point and the corresponding setting of this circuit under test;
One base has a test section, in order to put this substrate to be measured;
One driver element is arranged on this base, can drive a test cell and carry out the motion of three-dimensional in this top, test section; And
One data processing unit couples this test cell, in order to handle the measured test data of this test cell;
One framing unit, it is to be connected with this driver element, can detect the position of this circuit under test and control the trimming movement that this driver element carries out this test cell, so that this test cell carries out test action to this circuit under test.
8. proving installation in flakes as claimed in claim 7 more comprises a base station, is arranged on this test section, and wherein, this substrate to be measured is arranged on this base station.
9. proving installation in flakes as claimed in claim 7, wherein, removable this test cell of this driver element can be tested this test cell one by one to these a plurality of circuit under test.
10. proving installation in flakes as claimed in claim 9, wherein, this data processing unit can be collected the test data of these a plurality of circuit under test, and shows with a suitable chart.
11. proving installation in flakes as claimed in claim 7, wherein, this test cell has at least one probe, and this probe can provide this circuit under test to carry out testing electrical property.
12. proving installation in flakes as claimed in claim 7, wherein, this base station is connected with an angle adjusting, and this angle adjusting can be adjusted the angle of this base station.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200420006089 CN2685891Y (en) | 2004-04-02 | 2004-04-02 | Connecting sheet tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200420006089 CN2685891Y (en) | 2004-04-02 | 2004-04-02 | Connecting sheet tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN2685891Y true CN2685891Y (en) | 2005-03-16 |
Family
ID=34668033
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200420006089 Expired - Fee Related CN2685891Y (en) | 2004-04-02 | 2004-04-02 | Connecting sheet tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN2685891Y (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102654559A (en) * | 2012-05-10 | 2012-09-05 | 致茂电子(苏州)有限公司 | Test system for testing semiconductor-encapsulated stacked wafer and semiconductor automatic test machine thereof |
| CN103219257A (en) * | 2012-05-10 | 2013-07-24 | 致茂电子(苏州)有限公司 | Testing device of stack type wafer |
| CN104360203A (en) * | 2014-11-26 | 2015-02-18 | 南京国睿微波器件有限公司 | Test system of ferrite phase shifter |
| WO2018157718A1 (en) * | 2017-03-02 | 2018-09-07 | 叶秀慧 | Mechanism for testing semiconductor article using electrostatic carrier |
| CN114152905A (en) * | 2021-12-31 | 2022-03-08 | 信阳圆创磁电科技有限公司 | Full-automatic magnetic steel polarity detection equipment |
| CN114167259A (en) * | 2021-12-07 | 2022-03-11 | 华东光电集成器件研究所 | Method for programming and testing on-off of through holes of multi-piece substrate |
-
2004
- 2004-04-02 CN CN 200420006089 patent/CN2685891Y/en not_active Expired - Fee Related
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102654559A (en) * | 2012-05-10 | 2012-09-05 | 致茂电子(苏州)有限公司 | Test system for testing semiconductor-encapsulated stacked wafer and semiconductor automatic test machine thereof |
| CN103219257A (en) * | 2012-05-10 | 2013-07-24 | 致茂电子(苏州)有限公司 | Testing device of stack type wafer |
| CN102654559B (en) * | 2012-05-10 | 2015-04-15 | 致茂电子(苏州)有限公司 | Test system for testing semiconductor-encapsulated stacked wafer and semiconductor automatic test machine thereof |
| CN103219257B (en) * | 2012-05-10 | 2015-10-21 | 致茂电子(苏州)有限公司 | The testing apparatus of stacked wafer |
| CN104360203A (en) * | 2014-11-26 | 2015-02-18 | 南京国睿微波器件有限公司 | Test system of ferrite phase shifter |
| CN104360203B (en) * | 2014-11-26 | 2018-02-02 | 南京国睿微波器件有限公司 | A kind of test system of ferrite phase shifter |
| WO2018157718A1 (en) * | 2017-03-02 | 2018-09-07 | 叶秀慧 | Mechanism for testing semiconductor article using electrostatic carrier |
| CN114167259A (en) * | 2021-12-07 | 2022-03-11 | 华东光电集成器件研究所 | Method for programming and testing on-off of through holes of multi-piece substrate |
| CN114152905A (en) * | 2021-12-31 | 2022-03-08 | 信阳圆创磁电科技有限公司 | Full-automatic magnetic steel polarity detection equipment |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C19 | Lapse of patent right due to non-payment of the annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |