CN2639986Y - Testing circuit of liquid crystal display driver - Google Patents
Testing circuit of liquid crystal display driver Download PDFInfo
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- CN2639986Y CN2639986Y CN 03231668 CN03231668U CN2639986Y CN 2639986 Y CN2639986 Y CN 2639986Y CN 03231668 CN03231668 CN 03231668 CN 03231668 U CN03231668 U CN 03231668U CN 2639986 Y CN2639986 Y CN 2639986Y
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- lcd driver
- row
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- test
- crystal display
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Abstract
The utility model relates to a test circuit for testing liquid crystal display driver, which comprises a test panel control part (1), a microprocessor test control part (2), a liquid crystal display driver part (3), a dividing voltage circuit and simulation switch part (4) and a liquid crystal display part (5); the test panel control part (1) controls the liquid crystal display driver part (3) by the bi-directional connection with the microprocessor test control part (2); the liquid crystal display driver part (3) exports the control signal, the row control signal and the column control signal to the dividing voltage circuit and simulation switch part (4); the dividing voltage circuit and simulation switch part (4) exports the row drive and the column drive scanning voltage to the liquid crystal display part (5). The utility model has the advantages that the technicians can directly make analysis and judgment of the liquid crystal display driver by the emulational display results and improve the design of the integrate circuit of the liquid crystal display driver.
Description
Technical field
The utility model relates to the test circuit of LCD, relates in particular to the test circuit of LCD driver.
Background technology
Along with the maximization of notebook computer liquid crystal display screen curtain, and LCD is towards the development of desk-top computer monitor application direction, and the LCD performance just develops towards high resolving power, full color direction.Increasing of the raising of resolution and number of colors (being number of greyscale levels) makes people more and more higher to the requirement of the integrated circuit of LCD driver, and makes great efforts to explore new driving method.
But how effectively to pass through the test to the integrated circuit of LCD driver, the design that improves the integrated circuit of LCD driver is the relevant technologies personnel technical issues that need to address.
Summary of the invention
The utility model technical issues that need to address have provided the test circuit of LCD driver, be intended to solve the test that also not have at present how effectively to pass through to the integrated circuit of LCD driver, improve the defective of design of the integrated circuit of LCD driver.
In order to solve the problems of the technologies described above, the utility model is achieved through the following technical solutions:
The utility model comprises the test panel control section, microprocessor test control section, LCD driver part, bleeder circuit, analog switch part, liquid-crystal display section; Described test panel control section by with the two-way control LCD driver part that is connected of microprocessor test control section; Described LCD driver part outputs to bleeder circuit, analog switch part with control signal and row control signal and row control signal: described bleeder circuit, analog switch part will be gone driving, row driven sweep voltage and be outputed to liquid-crystal display section.
Compared with prior art, the beneficial effects of the utility model are: the technician can carry out analysis and judgement according to the emulation display result to LCD driver very intuitively, improves the design of the integrated circuit of LCD driver based on this.
Description of drawings
Fig. 1 is a test circuit block scheme of the present utility model;
Fig. 2 is a row driving voltage generator block scheme;
Fig. 3 is a row driving voltage generator block scheme;
Fig. 4 is a line-sweep voltage generator block scheme;
Fig. 5 is a column scan voltage generator block scheme;
Fig. 6 is a row, column driving voltage generator circuit diagram;
Fig. 7 is a line-sweep voltage generator circuit diagram;
Fig. 8 is a column scan voltage generator circuit diagram;
Fig. 9 is the method for testing process flow diagram;
Figure 10 is the process flow diagram of step 63 among Fig. 9;
Wherein: test panel control section 1, microprocessor test control section 2, LCD driver part 3, bleeder circuit, analog switch part 4, liquid-crystal display section 5, row driving voltage generator 41, row driving voltage generator 42, line-sweep voltage generator 43, column scan voltage generator 44, precision resistance 45.
Embodiment
Below in conjunction with accompanying drawing and embodiment the utility model is described in further detail:
VDD, V1, V2, V3, V4, V5 are the branch pressure voltage signals that is produced respectively by the precision resistance 45 in bleeder circuit, the analog switch part; VCOMA and VCOMB are that row drives stepped-up voltage; VSEGA and VSEGB are that row drive stepped-up voltage;
By Fig. 1 to Fig. 8 as seen: the utility model comprises test panel control section 1, microprocessor test control section 2, LCD driver part 3, bleeder circuit, analog switch part 4, liquid-crystal display section 5; Described test panel control section 1 by with the two-way control LCD driver part 3 that is connected of microprocessor test control section 2; Described LCD driver part 3 outputs to bleeder circuit, analog switch part 4 with control signal and row control signal and row control signal; Described bleeder circuit, analog switch part 4 will be gone driving, row driven sweep voltage and be outputed to liquid-crystal display section 5;
Described bleeder circuit, analog switch part 4 comprise capable driving voltage generator 41, row driving voltage generator 42, line-sweep voltage generator 43, column scan voltage generator 44; The input end of described capable driving voltage generator 41 is controlled under VDD, V1, V4, the V5 branch pressure voltage signal in the control signal of LCD driver part 3 outputs, output VCOMA or the capable driving of VCOMB stepped-up voltage; The input end of described row driving voltage generator 42 is controlled under VDD, V2, V3, the V5 branch pressure voltage signal in the control signal of LCD driver part 3 outputs, and output VSEGA or VSEGB row drive stepped-up voltage; The input end of described line-sweep voltage generator 43 is exported row driven sweep voltage under the capable driving of capable control signal control VCOMA, the VCOMB of LCD driver part 3 outputs stepped-up voltage; The input end of described column scan voltage generator 44 drives under the stepped-up voltage at the control of row control signal VSEGA, the VSEGB of 3 outputs of LCD driver part row, output row driven sweep voltage;
Described test panel control section 1 can be a PC, tests the two-way of control section 2 by RS232 bus wherein with microprocessor and is connected;
Described LCD driver part 3 can be a field programmable logic array (FPLA), comprises order register, command decoder, data register, video data register, character generator ROM (read-only memory), character generator read-write memory, parallel-to-serial converter and shift register module.
By Fig. 9, Figure 10 as seen, method of the present utility model realizes by following steps:
Produce test vector by the test panel control section, and send test vector to microprocessor test control section 61;
Give liquid crystal display driver part by microprocessor test control section sending controling instruction data, LCD driver part return state data are to microprocessor test control section 62;
By LCD driver part control signal and row control signal and row control signal are outputed to bleeder circuit, analog switch part 63:
To go driving, row driven sweep voltage by bleeder circuit, analog switch part and output to liquid-crystal display section, this scanning voltage is finished the demonstration 64 of liquid-crystal display section in order to the scan control liquid-crystal display section;
Realize by following steps in the described step 63:
Produce row by row driving voltage generator and drive stepped-up voltage 631;
Produce row by row driving voltage generator and drive stepped-up voltage 632;
Produce row driven sweep voltage 633 by the line-sweep voltage generator;
Produce row driven sweep voltage 634 by the column scan voltage generator.
Below principle of the present utility model is described as follows:
The printed circuit board (PCB) that uses in electronic equipment (PCB) has many being used to obtain Analogous Integrated Electronic Circuits (IC) and the digital IC chip that row drives row driving stepped-up voltage, and these IC chips are connected to each other on PCB.The technician can select the quantity and the connected mode thereof of analog IC and digital IC chip to this according to the capacity of display size of LCD (LCD), realizes that LCD drives demonstration emulation testing function.
The utility model design and method of testing be divided into test panel control section, microprocessor (MCU) test control section, LCD driver (LCD Driver) partly, bleeder circuit, analog switch part and liquid-crystal display section totally five parts form.
The test panel control section is mainly finished the writing and carry out exchanges data with LCD Driver of content measurement, test vector of LCD Driver, shows also to keep detecting information.It is to send test vector by PC RS232 bus to MCU, is instructed by the MCU executable operations.
MCU test control section is finished the instruction manipulation of MCU to LCD Driver mainly by the interface of MCU and LCD Driver.The MCU testing software has comprised all instruction actions that LCD Driver can respond.The test vector that it sends by MCU serial ports acceptance test panel control section, MCU are carried out the operational order of response to LCD Driver according to test vector.
The LCD driver section replaces with field programmable logic array (FPLA) (FPGA) in the utility model, its functional module mainly comprises order register (IR), command decoder (ID), data register (DR), video data register (DDRAM), character generator ROM (read-only memory) (CGROM), character generator read-write memory (CGRAM), parallel-to-serial converter (PTS), shift register parts such as (SR), and finally produce the LCD drive signal, simultaneously status data is returned to MCU test control section.
Bleeder circuit, analog switch part can be divided into capable driving voltage generator, row driving voltage generator, its key is that bleeder circuit, analog switch partly utilize chip to realize the gating and the combination of aanalogvoltage, reaches the LCD scan-control voltage, realizes dividing potential drop by precision resistance.VDD, V1, V2, V3, V4, V5 are precision resistance branch pressure voltage signal.Can set V5=0V, V4=1V, V3=2V, V2=3V, V1=4V, VDD=5V.
Its principle of work is; FPGA LCD driver produces FPGA_Ctrl control figure amount signal, five kinds of voltages of control chip gating V5-VDD, produce VCOMA, VCOMB, four kinds of combination voltage signals of VSEGA, VSEGB, FPGA_Ki, FPGA_Ci (i=1 that FPGA LCD driver produces, 2..) control figure amount signal, control chip gate voltage VSEGA or VSEGB, VCOMA or VCOMB produce combination voltage signal LCD_Si, LCD_Ci, LCD_Si, LCD_Ci (i=1,2..) scan control LCD lattice point bright or dark, to reach that LCD shows and the low-power consumption life-span such as grows at advantages.
Driving voltage generator of the present utility model has been realized the required voltage difference of scan control LCD.Implementation method is: the row driving voltage has two kinds of states such as VCOMA, VCOMB, wherein VCOMA has two kinds of voltages such as 4V, 1V, VCOMB has two kinds of voltages such as 0V, 5V: in like manner, the row driving voltage has two kinds of states such as VSEGA, VSEGB, wherein VSEGA has two kinds of voltages such as 5V, 0V, VSEGB has two kinds of voltages such as 3V, 2V, and by row driving voltage generator, row driving voltage generator is realized respectively in their realization.
Line scanning and column scan stepped-up voltage generator.Row drives stepped-up voltage, selects VCOMA by lcd driver integrated circuit (IC) chip controls, and VCOMB produces; Row drive stepped-up voltage, select VSEGA by lcd driver integrated circuit (IC) chip controls, and VSEGB produces.Row drives stepped-up voltage and row drive stepped-up voltage synchronous scanning control LCD, shows the data result of test.Among Fig. 4 FPGA_C1, FPGA_C2, the capable control signal of FPGA_C3, FPGA_C4, control line-sweep voltage LCD_C1, LCD_C2, LCD_C3, LCD_C4 produce, FPGA_K1, FPGA_K2, FPGA_K3, FPGA_K4 are the row control signal among Fig. 5, and control column scan voltage LCD_S1, LCD_S2, LCD_S3, LCD_S4 produce.
After the LCD display part shows that then test vector is through LCD Driver, actual displaying contents under scanning voltage control, the technician can partly carry out analysis and judgement according to the emulation display result to LCDDriver very intuitively.
The test vector of this method of testing is produced by panel control program in the test panel control section (PCPanel Programmer), and panel control program device sends test vector by computing machine RS232 interface to MCU.MCU is connected with lcd driver (LCD Driver) chip, and MCU sending controling instruction data are given the lcd driver chip, and lcd driver chip return state data are given MCU.After the lcd driver chip receives the steering order data, produce control signal and row driving (COMMON Driver) row and drive (SEGMENT Driver) instruction output, drive bleeder circuit, analog switch part, the analog switch part produces row driving and row driving stepped-up voltage according to control signal and row driving row drive signal.This scanning voltage is finished LCD and is shown in order to scan control LCD.
Claims (4)
1. the test circuit of a LCD driver comprises test panel control section (1), microprocessor test control section (2), LCD driver part (3), liquid-crystal display section (5); It is characterized in that: also comprise bleeder circuit, analog switch part (4); Described test panel control section (1) by with the two-way control LCD driver part (3) that is connected of microprocessor test control section (2); Described LCD driver part (3) outputs to bleeder circuit, analog switch part (4) with control signal and row control signal and row control signal; Described bleeder circuit, analog switch part (4) will be gone driving, row driven sweep voltage and be outputed to liquid-crystal display section (5).
2. the test circuit of a kind of LCD driver according to claim 1, it is characterized in that: described bleeder circuit, analog switch part (4) comprise capable driving voltage generator (41), row driving voltage generator (42), line-sweep voltage generator (43), column scan voltage generator (44), the branch pressure voltage signal that the precision resistance (45) in described bleeder circuit, the analog switch part (4) produces is respectively: VDD, V1, V2, V3, V4, V5; The input end of described capable driving voltage generator (41) is controlled under VDD, V1, V4, the V5 branch pressure voltage signal in the control signal of LCD driver part (3) output, output VCOMA or the capable driving of VCOMB stepped-up voltage; The input end of described row driving voltage generator (42) is controlled under VDD, V2, V3, the V5 branch pressure voltage signal in the control signal of LCD driver part (3) output, and output VSEGA or VSEGB row drive stepped-up voltage; The input end of described line-sweep voltage generator (43) is exported row driven sweep voltage under the capable driving of capable control signal control VCOMA, the VCOMB of LCD driver part (3) output stepped-up voltage; The input end of described column scan voltage generator (44) drives under the stepped-up voltage at the control of row control signal VSEGA, the VSEGB of LCD driver part (3) output row, output row driven sweep voltage.
3. the test circuit of a kind of LCD driver according to claim 1, it is characterized in that: described test panel control section (1) can be a PC, the RS232 bus by wherein and two-way connection of microprocessor test control section (2).
4. the test circuit of a kind of LCD driver according to claim 1, it is characterized in that: described LCD driver part (3) can be a field programmable logic array (FPLA), comprises order register, command decoder, data register, video data register, character generator ROM (read-only memory), character generator read-write memory, parallel-to-serial converter and shift register module.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 03231668 CN2639986Y (en) | 2003-05-30 | 2003-05-30 | Testing circuit of liquid crystal display driver |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 03231668 CN2639986Y (en) | 2003-05-30 | 2003-05-30 | Testing circuit of liquid crystal display driver |
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| CN2639986Y true CN2639986Y (en) | 2004-09-08 |
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| CN 03231668 Expired - Fee Related CN2639986Y (en) | 2003-05-30 | 2003-05-30 | Testing circuit of liquid crystal display driver |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101419345B (en) * | 2007-10-22 | 2010-09-29 | 奇景光电股份有限公司 | Display driver and built-in test circuit thereof |
| CN101452680B (en) * | 2007-12-03 | 2010-12-01 | 奇景光电股份有限公司 | Display driver with built-in test circuit and test method thereof |
| CN102339581A (en) * | 2011-09-28 | 2012-02-01 | 深圳市华星光电技术有限公司 | Virtual load board and testing system and testing method for liquid crystal display control panel |
| CN101710937B (en) * | 2009-11-24 | 2012-09-19 | 中国科学院长春光学精密机械与物理研究所 | Digital video signal generating system |
| CN109917571A (en) * | 2019-04-19 | 2019-06-21 | 广东省汕尾市质量计量监督检测所 | A kind of liquid crystal display device photoelectric parameter detection interface system |
-
2003
- 2003-05-30 CN CN 03231668 patent/CN2639986Y/en not_active Expired - Fee Related
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101419345B (en) * | 2007-10-22 | 2010-09-29 | 奇景光电股份有限公司 | Display driver and built-in test circuit thereof |
| CN101452680B (en) * | 2007-12-03 | 2010-12-01 | 奇景光电股份有限公司 | Display driver with built-in test circuit and test method thereof |
| CN101710937B (en) * | 2009-11-24 | 2012-09-19 | 中国科学院长春光学精密机械与物理研究所 | Digital video signal generating system |
| CN102339581A (en) * | 2011-09-28 | 2012-02-01 | 深圳市华星光电技术有限公司 | Virtual load board and testing system and testing method for liquid crystal display control panel |
| CN102339581B (en) * | 2011-09-28 | 2014-04-09 | 深圳市华星光电技术有限公司 | Virtual load board and testing system and testing method for liquid crystal display control panel |
| CN109917571A (en) * | 2019-04-19 | 2019-06-21 | 广东省汕尾市质量计量监督检测所 | A kind of liquid crystal display device photoelectric parameter detection interface system |
| CN109917571B (en) * | 2019-04-19 | 2024-05-28 | 广东省汕尾市质量计量监督检测所 | Photoelectric parameter detection interface system of liquid crystal display device |
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Legal Events
| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C19 | Lapse of patent right due to non-payment of the annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |