CN2426981Y - Broadband spectrum crystal spectrometer - Google Patents
Broadband spectrum crystal spectrometer Download PDFInfo
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- CN2426981Y CN2426981Y CN 00205765 CN00205765U CN2426981Y CN 2426981 Y CN2426981 Y CN 2426981Y CN 00205765 CN00205765 CN 00205765 CN 00205765 U CN00205765 U CN 00205765U CN 2426981 Y CN2426981 Y CN 2426981Y
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- 239000013078 crystal Substances 0.000 title claims abstract description 54
- 238000001228 spectrum Methods 0.000 title claims abstract description 24
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 4
- 229910052751 metal Inorganic materials 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 3
- 230000003595 spectral effect Effects 0.000 abstract description 7
- 238000002083 X-ray spectrum Methods 0.000 abstract description 6
- 238000005259 measurement Methods 0.000 abstract description 3
- 238000000034 method Methods 0.000 abstract description 3
- 230000008685 targeting Effects 0.000 abstract 1
- 230000005855 radiation Effects 0.000 description 14
- 238000005452 bending Methods 0.000 description 4
- 238000002474 experimental method Methods 0.000 description 4
- 238000003306 harvesting Methods 0.000 description 4
- 239000006185 dispersion Substances 0.000 description 3
- 239000010445 mica Substances 0.000 description 3
- 229910052618 mica group Inorganic materials 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 230000004304 visual acuity Effects 0.000 description 2
- 238000000441 X-ray spectroscopy Methods 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
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Abstract
The utility model relates to a crystal spectrometer for measuring broadband X-ray spectrum. By adopting a plurality of spectral crystals with limited width and the same curvature radius to be closely arranged or separately arranged according to the wavelength sequence, the spectrum of a plurality of discrete wave bands or the wave band required by expansion can be obtained in one-time laser targeting, thereby obtaining useful space-time information and improving the measurement precision. The utility model discloses simplify the procedure, improved measurement of efficiency.
Description
The utility model relates to the X-ray spectrum field of measuring technique, particularly relates to a kind of crystal spectrometer of measuring the broadband X-ray spectrum.
Crystal spectrometer is to measure the line spectrum of short wavelength radiation (X ray, gamma-rays) and the important instrument of continuous spectrum, it makes people get on to understand in depth the structure of matter at atomic scale, thereby sets up the X ray spectroscopy of be widely used a field and a most important theories meaning.
Crystal spectrometer can be divided into two classes according to shape that crystal reflection face is got: optical flat spectrometer and bent crystal spectrometer.The latter's beam split wafer is bent to cylinder shape or dome shape, spectrum can be focused on, thereby than the former (reflecting surface is the plane) much higher light harvesting degree (light intensity/unit area) be arranged, and more wide application is arranged.
Von Hamos spectrometer is that the beam split wafer bending is become a kind of bent crystal spectrometer [document 1, L.Von Hamos, Naturwissenschaften, 20 (38), 705 (1932)] of cylinder shape to realize focusing on perpendicular to dispersion direction.As shown in Figure 1, the radius-of-curvature of crystal C is R, and the curvature axis is SS ', is fallen on the crystal face by the X ray that is positioned at the emission of SS ' radiation source S, wherein incides the light of the last each point of camber line aa ' and the inclination angle of crystal face and is θ
B(Bragg angle) will be assembled S ' point on the curvature axis by the Bragg law behind the crystal diffraction, corresponding to a wavelength X.Order is apart from SS '=L, then L=2RCOS θ
B, when wavelength increases, θ
BAlso increase, some A and S ' will shift near S, otherwise, then leave S; If the wafer width is big more, the wavelength coverage of the X-ray spectrum of acquisition is just wide more.
Von Hamos spectrometer is specially adapted to the analysis of small radiation source, is used for the X ray micro-zone analysis of metal, alloy material in early days.It is widely used in important research field such as laser inertial confinement fusion, x-ray laser and laser plasma in recent years, is used to diagnose plasma parameter, the basic process of research plasma [document 2, B.Yaakabi, et al, Rev.Sci.Instrum, 50,1609 (1979)]; Document 3, Λ. Π .eBe Λ bko, KBAHTOBA э Λ EKTPOHUKA.4,2013 (1997)].These study common expectation can obtain space time information as much as possible from a laser target shooting X-ray spectrum that single exposure obtains in other words.Because Hamos spectrometer light harvesting degree height (doubly) than the high 10-100 of optical flat spectrometer, be easy in a laser target shooting, obtain X-ray spectrum, avoid plasma self instability and the not repeated difficulty of bringing, it also is applicable to measures some weak spectral lines (spectrum of for example compressed target core emission, the spectral line of high level transition and high ionization states ion etc.).In addition, can also obtain higher spatial resolution with it and measure, this is significant for the heterogeneity in the research plasma.Yet Hamos spectrometer in the past only adopts an analyzing crystal, and in order to obtain the bending quality that high light harvesting degree and high resolving power must guarantee wafer, wafer can not be done too widely usually.Therefore, the wavelength coverage of a laser target shooting acquisition is very narrow.For example, be example with following three kinds of crystal commonly used, if radius-of-curvature is 63mm, the wafer width is 20mm, available maximum wavelength scope △ λ is respectively: MICA～2.388 , ADP～1.280 , QTZ～0.243 .If want ben, perhaps obtain the spectrum of another wave band, then need change θ
BSuitable crystal is perhaps changed at angle (spectrometer certainly will strengthen along the dispersion direction size).These all must readjust spectrometer, and carry out another time laser target shooting.This not only increases the trouble of adjusting, priorly will influence measuring accuracy (accurately regulate spectrometer and could obtain high light harvesting degree and high resolving power), and the laser target shooting experiment is only allowed in once practicing shooting and obtained required data under many situations.In addition, rely on the crystal of a finite width can not obtain the spectrum of a plurality of discrete wave bands that wavelength differs greatly simultaneously.
The purpose of this utility model is at the shortcoming and defect of Von Hamos spectrometer in the past, be implemented in the spectrum that obtains a plurality of discrete wave bands in laser target shooting by the analyzing crystal that adopts the polylith finite width, or expand required wave band, thus obtain when useful, empty information, improve measuring accuracy.
The purpose of this utility model is achieved in that
The utility model is according to required wave band, correspondingly select the analyzing crystal 2 of two or more than two variety classes or identical type for use, they are bent to identical required radius of curvature R, press wavelength then and closely arrange in regular turn or the separation arrangement, and their reflecting surface is on the same face of cylinder.Analyzing crystal 2 and detector 4 are in respectively on the pedestal on the parallel guide rail of two strictnesses, can move to change θ along guide rail respectively
BDifferent wavelength coverages is surveyed at the angle; Also can move,, they be dropped on the curvature axis of analyzing crystal to regulate the position of x-ray radiation source 1 and detector 4 plane of incidences perpendicular to the guide rail direction.Like this, as shown in Figure 2, the spectrum that will produce a plurality of discrete wave bands by the Bragg law after by analyzing crystal 2 diffraction from the X radiation of x-ray radiation source 1 emission is arranged on the crystal curvature axis in regular turn, by detector 4 records, obtain the spectrum of a plurality of discrete wave bands simultaneously or expand required wave band thereby be implemented in a laser target shooting.
In use for ease of measuring and compare the spectrum of different wavelength range, selected polylith analyzing crystal both can closely be arranged, and also can separate arrangement.
When certain selected analyzing crystal 2 can not obtain enough width technically, when perhaps being restricted, can selecting for use this kind of polylith crystal closely to arrange or separate to arrange and obtain broadband spectrum for assurance crystal bending quality width.
As Bragg angle θ
BWhen big, x-ray radiation source 1 is too near apart with detector 4, can make parallelogram to pedestal, makes x-ray radiation source 1 bigger free space be arranged on every side, is convenient to experimental establishment.
In use, can select for use metals such as different-thickness Be, Al to do filter disc 3 according to measured wavelength coverage, enter detector to prevent unwanted radiation.
Detector 4 can adopt exograph, or is applicable to the CCD (charge-coupled image sensor) or the PDA solid state image devices such as (photodiode array) of X radiation area, also available streak camera.Under the situation of weak x-ray source, can adopt the coupling of MCP (microchannel plate) image intensifier and above-mentioned solid state image device, or be coupled, to improve detection efficiency with the visible light egative film.
The utility model selects for use the different types of crystal of polylith can realize that laser target shooting obtains the spectrum of a plurality of discrete wave bands, and " to the light " that improved measuring accuracy and removed trouble from regulates formality, has improved efficiency of measurement.If different experiments wavelength difference to be measured, utilize the utility model correspondingly to select different crystal simultaneously for use, only need change target during experiment, and need not change crystal, again to loaded down with trivial details formalities such as light.Utilize the utility model to select for use polylith variety classes analyzing crystal just can obtain required broadband and need not increase the size of spectrometer.Below in conjunction with drawings and Examples the utility model is described further:
Fig. 1 is a Von Hamos spectrometer principle schematic, and Fig. 2 is a broadband spectrum crystal spectrometer structural drawing of the present utility model, and Fig. 3 is the structural drawing of embodiment 2, and Fig. 4 is the structural drawing of embodiment 3, and wherein: 1 x-ray radiation source, 2 radius-of-curvature are the beam split wafer of R,
3 filter discs, 4 detectors
Embodiment 1
The employing width is 1cm, highly be 5cm, radius-of-curvature is three blocks of different types of analyzing crystals of R=6.3cm: 2-1 MICA (002), and 2-2 ADP (101), 2-3 QTZ (224-3) closely connect arrangement reduces the spectrometer size to obtain the broadband spectrum application example.As shown in Figure 2, by the X ray of x-ray radiation source 1 emission with different Bragg angle θ
B(63 °-45 °) incide on three crystal, behind crystal diffraction, pass through a wide 7cm, high 0.6cm, Be filter disc 3 backs of thick 25 μ m produce the spectrum of three discrete wave bands on crystal curvature axis, by detector 4 records that are positioned at this place, detector 4 is made up of windowless image intensifier and visible light egative film.Windowless image intensifier is made up of MCP and video screen, and by fibre faceplate and egative film coupling.MCP incident face length 8cm, high 1cm; Channel diameter～22 μ m.The wave band of three kinds of crystal generations is respectively:
MICA： 17．728-16．544
ADP： 8．869-8．220
QTZ： 1．560-1．442
The tight connection of the wave band that these three wavelength differ greatly is arranged in and can reduces the size of spectrometer on dispersion direction together, and is very convenient to the experiment of some dingus.
Embodiment 2
For ease of measuring and some spectral line relatively, perhaps predeterminedly will successively measure these spectral lines, and the wavelength of these spectral lines differs bigger, can adopt and should use example for avoiding changing trouble that crystal " to light " regulates.
For measuring Al k α line (8.339 ) and Cu k α line (1.542 ), correspondingly select two kinds of crystal for use: 2-1 PET (002), 2-2 QTZ (224-3) separates arrangement.The wide 1cm of crystal, high 5cm, R=10cm.The wide 25mm of filter disc 3-1,3-2, high 4mm, the Be film of thick 25 μ m.Detector 4-1,4-2 is coupled with MCP image intensifier and the CCD of Φ 25.The channel diameter of MCP～11 μ m, CCD photosensitive area 7mm * 25mm, picture dot centre distance～8 μ m.By the X radiation of source 1 emission, work as θ
BBe respectively 76 °-70.7 °, in the time of 51.34 °-48 °, the wavelength coverage that obtains behind two crystal diffractions is respectively: 8.465-8.236 , and 1.580-1.504 , they have comprised Al k α and two spectral lines of Cu k α respectively.Change θ
BPerhaps regulate the position of detector 4 on crystal curvature axis, can obtain two wavelength coverages in addition.
Embodiment 3
Certain crystal of selecting for use in using is because of technical reason or for guaranteeing that the bending quality width can adopt this kind of polylith crystal to connect and arrange to obtain the broadband spectrum when being restricted.As shown in Figure 4, select high 50cm for use, it is 3cm that two PET (002) crystal 2-1 of wide 1.5cm, 2-2 connect into width, the bent crystal of R=6.3cm.Detector 4 adopts the exograph of wide 10cm, high 1cm to be contained in the magazine, makees window with the Be filter disc 3 (thick～25 μ m) of corresponding size.Behind the beam split wafer diffraction of X ray through widening by radiation source 1 emission, what detector 4 obtained is the spectrum of having expanded wavelength coverage.
Claims (4)
1, a kind of broadband spectrum crystal spectrometer, it is characterized in that: in Von Hamos spectrometer, select the analyzing crystal (2) of two or more than two variety classes or identical type for use, they are bent to identical required radius of curvature R, pressing wavelength then closely arranges in regular turn, and the reflecting surface that makes them is on the same face of cylinder, and analyzing crystal (2) and detector (4) are in respectively on the rectangle pedestal on the parallel guide rail of two strictnesses, and can move along guide rail respectively; Or move perpendicular to the guide rail direction, filter disc (3) selects for use metal to make.
2, by the described broadband spectrum of claim 1 crystal spectrometer, it is characterized in that: the analyzing crystal (2) of two or more than two selected variety classes or identical type can also separate arrangement in regular turn by wavelength.
3, by the described broadband spectrum of claim 1 crystal spectrometer, it is characterized in that: can also make parallelogram to the rectangle pedestal.
4, by the described broadband spectrum of claim 1 crystal spectrometer, it is characterized in that: filter disc (3) can be selected the Be or the Al of different-thickness for use.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 00205765 CN2426981Y (en) | 2000-02-22 | 2000-02-22 | Broadband spectrum crystal spectrometer |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 00205765 CN2426981Y (en) | 2000-02-22 | 2000-02-22 | Broadband spectrum crystal spectrometer |
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| CN2426981Y true CN2426981Y (en) | 2001-04-18 |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102053095A (en) * | 2009-10-26 | 2011-05-11 | 通用电气公司 | Elemental composition detection system and method |
| CN105301025A (en) * | 2015-10-26 | 2016-02-03 | 中国工程物理研究院上海激光等离子体研究所 | Multi-band crystal spectrometer and adjusting method thereof |
| CN105510955B (en) * | 2015-12-01 | 2018-07-13 | 中国工程物理研究院上海激光等离子体研究所 | The offline accurate adjustment of elliptically bent crystal spectrometer and the online accurate method for resetting collimation |
| CN110361406A (en) * | 2019-07-10 | 2019-10-22 | 华中科技大学 | A kind of Spectrometer measures removing method and Spectrometer device affected by vibration |
-
2000
- 2000-02-22 CN CN 00205765 patent/CN2426981Y/en not_active Expired - Fee Related
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102053095A (en) * | 2009-10-26 | 2011-05-11 | 通用电气公司 | Elemental composition detection system and method |
| CN105203573A (en) * | 2009-10-26 | 2015-12-30 | 通用电气公司 | Elemental composition detection system and method |
| CN105301025A (en) * | 2015-10-26 | 2016-02-03 | 中国工程物理研究院上海激光等离子体研究所 | Multi-band crystal spectrometer and adjusting method thereof |
| CN105301025B (en) * | 2015-10-26 | 2017-11-14 | 中国工程物理研究院上海激光等离子体研究所 | A kind of multiband crystal spectrometer and its adjusting method |
| CN105510955B (en) * | 2015-12-01 | 2018-07-13 | 中国工程物理研究院上海激光等离子体研究所 | The offline accurate adjustment of elliptically bent crystal spectrometer and the online accurate method for resetting collimation |
| CN110361406A (en) * | 2019-07-10 | 2019-10-22 | 华中科技大学 | A kind of Spectrometer measures removing method and Spectrometer device affected by vibration |
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| CF01 | Termination of patent right due to non-payment of annual fee |