CN2235117Y - Combined Michelson interferometer - Google Patents

Combined Michelson interferometer Download PDF

Info

Publication number
CN2235117Y
CN2235117Y CN 95207765 CN95207765U CN2235117Y CN 2235117 Y CN2235117 Y CN 2235117Y CN 95207765 CN95207765 CN 95207765 CN 95207765 U CN95207765 U CN 95207765U CN 2235117 Y CN2235117 Y CN 2235117Y
Authority
CN
China
Prior art keywords
michelson interferometer
shifter
miniature
pedestal
optical axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN 95207765
Other languages
Chinese (zh)
Inventor
严家彪
严建伟
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to CN 95207765 priority Critical patent/CN2235117Y/en
Application granted granted Critical
Publication of CN2235117Y publication Critical patent/CN2235117Y/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Abstract

The utility model discloses a combined Michelson interferometer, which has a basal seat, wherein, a small hole screen, a spectroscopic plate, a compensating plate, and a fixed mirror are orderly arranged on an optical axis which is parallel to the basal plane of the basal seat on one side of the basal seat; a miniature shifter is arranged on a vertical optical axis on the other side of the basal seat; a shifting mirror is fixed on the miniature shifter; the shifting amount of the shifting mirror is 0 to 15 mm. The utility model has the advantages of low cost, simple structure, miniaturization, convenient operation, and visible optical path, and the utility model can be used for replacing the function of the traditional Michelson interferometer.

Description

The assembly unit Michelson interferometer
The utility model relates to interferometer, relates in particular to the assembly unit Michelson interferometer.
Michelson interferometer almost is the blank of all kinds of metering interferometers in modern age, do to also have many-sided purposes after change or the expansion on its basis slightly, as vibration measuring, collimation, survey surface smoothness, deformation, displacement, do not lose its ample scope for abilities in fields such as holographic and spectral analyses yet.As can on the moving lens of Michelson interference system, scanning by bonding piezoelectric ceramics; As with two catoptrons of Michelson interferometer with two diffusion planes replace diffused light interferometer etc.
The purpose of this utility model provides assembly unit Michelson interferometer a kind of simple for structure, easy to use.
The utility model is taked following measures in order to achieve the above object, it has pedestal, on the pedestal one side optical axis parallel, be provided with aperture screen, beam-splitter, compensating plate, fixed mirror successively with the basal plane of pedestal, on the vertical optical axis of pedestal opposite side, be provided with miniature shifter, on miniature shifter, be fixed with moving lens.
The utility model has the advantages that: cost is low, simple for structure, the function of miniaturization, easy to use, alternative traditional Michelson interferometer.
Do the detail explanation below in conjunction with accompanying drawing
Accompanying drawing is an assembly unit Michelson interferometer synoptic diagram.
The assembly unit Michelson interferometer has pedestal, on the pedestal one side optical axis parallel, be provided with aperture screen 1, beam-splitter 2, compensating plate 3, fixed mirror 4 successively with the basal plane of pedestal, on the vertical optical axis of pedestal opposite side, be provided with miniature shifter 6, on miniature shifter, be fixed with moving lens 5, use laser, white light and other monochromatic sources.The effect of setting up aperture screen 1 has two, and the first produces accurate equal inclination fringes; It two helps regulating.After the removal screen is changed parallel beam, can produce equal thickness fringes.Miniature amount of movement is 0~15 millimeter, is enough to finish before and after zero light path the function of signal Processing.
Using method of the present utility model is:
1. regulating laser instrument and instrument optical axis goes the same way contour;
2. put into the aperture screen, make laser pass through aperture;
3. transfer fixed mirror and index glass frame, each road reflected light is put on the perforation hole of aperture screen altogether;
4. move into beam expanding lens (disperse or parallel);
5. on screen, observe interference fringe, regulate the amount of movement of shifter, (uniform thickness) striped that inclines such as just can observe;
6. when transferring to zero light path, change white light into and can obtain satisfied white light fringe.

Claims (2)

1. assembly unit Michelson interferometer, it is characterized in that it has pedestal [7], on the pedestal one side optical axis parallel, be provided with aperture screen [1], beam-splitter [2], compensating plate [3], fixed mirror [4] successively with the basal plane of pedestal, on the vertical optical axis of pedestal opposite side, be provided with miniature shifter [6], on miniature shifter, be fixed with moving lens [5].
2. a kind of assembly unit Michelson interferometer according to claim 1 is characterized in that the amount of movement of moving lens fixing on the said miniature shifter is 0~15mm.
CN 95207765 1995-04-05 1995-04-05 Combined Michelson interferometer Expired - Fee Related CN2235117Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 95207765 CN2235117Y (en) 1995-04-05 1995-04-05 Combined Michelson interferometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 95207765 CN2235117Y (en) 1995-04-05 1995-04-05 Combined Michelson interferometer

Publications (1)

Publication Number Publication Date
CN2235117Y true CN2235117Y (en) 1996-09-11

Family

ID=33859299

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 95207765 Expired - Fee Related CN2235117Y (en) 1995-04-05 1995-04-05 Combined Michelson interferometer

Country Status (1)

Country Link
CN (1) CN2235117Y (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102288293A (en) * 2011-07-21 2011-12-21 中国科学院上海技术物理研究所 Low-temperature interferometer
CN105355124A (en) * 2015-11-17 2016-02-24 云南民族大学 Michelson interference experiment integrated light source device
CN105606488A (en) * 2016-01-11 2016-05-25 中国科学院上海光学精密机械研究所 Gas density measurement system easy to adjust and measurement method thereof

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102288293A (en) * 2011-07-21 2011-12-21 中国科学院上海技术物理研究所 Low-temperature interferometer
CN105355124A (en) * 2015-11-17 2016-02-24 云南民族大学 Michelson interference experiment integrated light source device
CN105355124B (en) * 2015-11-17 2018-02-16 云南民族大学 Michelson interference tests integrated optical source device
CN105606488A (en) * 2016-01-11 2016-05-25 中国科学院上海光学精密机械研究所 Gas density measurement system easy to adjust and measurement method thereof
CN105606488B (en) * 2016-01-11 2019-03-08 中国科学院上海光学精密机械研究所 The manoscopy system and its measurement method easily adjusted

Similar Documents

Publication Publication Date Title
US5737079A (en) System and method for interferometric measurement of aspheric surfaces utilizing test plate provided with computer-generated hologram
CN101324422B (en) Method and apparatus of fine distribution of white light interference sample surface shapes
US4201473A (en) Optical interferometer system with CCTV camera for measuring a wide range of aperture sizes
US2977847A (en) Optical system for microscopes or similar instruments
US6226092B1 (en) Full-field geometrically desensitized interferometer using refractive optics
CN2235117Y (en) Combined Michelson interferometer
CN110487205A (en) In conjunction with the aspherical parameter error interferometric method of the confocal positioning of dispersion
KR100385438B1 (en) Interferometer & Fourier Strain Spectrometer
CN103792648B (en) Interfere microcobjective optical system
CN110307805A (en) A kind of white light interference system for three-dimensional surface shape measurement
US5416587A (en) Index interferometric instrument including both a broad band and narrow band source
GB1486485A (en) Comparison microscope
US5452088A (en) Multimode-laser interferometric apparatus for eliminating background interference fringes from thin-plate measurements
CN101261159A (en) Double cat eyes moving mirror interferometer
CN112034582A (en) High-dispersion high-refractive-index binary optical lens
CN101303254A (en) Novel double-cat eye movable lens interferometer
US3695769A (en) Optical comparators
CN1019855B (en) The Moire fringe method of testing and the device of minute surface flatness
CN204315150U (en) Compact digital spectral interference instrument
SU1132906A1 (en) Endoscope
CN87210130U (en) Measuring instrument for level degree of mirror
CN1105121A (en) Super fine surface roughness non-contact type optical interference measuring method
CN208889151U (en) A kind of Michelson's interferometer
CN2299302Y (en) Levelling instrument liquid automatic levelling device
KR20000014677A (en) Inspection apparatus for lens characteristics

Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
C19 Lapse of patent right due to non-payment of the annual fee
CF01 Termination of patent right due to non-payment of annual fee