CN221425818U - Laser wavelength measuring instrument - Google Patents

Laser wavelength measuring instrument Download PDF

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Publication number
CN221425818U
CN221425818U CN202420095974.1U CN202420095974U CN221425818U CN 221425818 U CN221425818 U CN 221425818U CN 202420095974 U CN202420095974 U CN 202420095974U CN 221425818 U CN221425818 U CN 221425818U
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Prior art keywords
detector
reflecting mirror
reflector
filter
wavelength
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CN202420095974.1U
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Chinese (zh)
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石元
朱雨雨
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Shaanxi Aowei Laser Technology Co ltd
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Shaanxi Aowei Laser Technology Co ltd
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Abstract

The utility model discloses a laser wavelength measuring instrument, and belongs to the field of laser wavelength measurement. The laser wavelength meter comprises a detector, an inclined transmission filter, a reflecting mirror, a filter and a gas absorption element; the filter plate comprises an FP (Fabry-Perot) standard filter plate and an inclined transmission filter plate; the reflecting mirror comprises a reflecting mirror A, a reflecting mirror B and a reflecting mirror C, and the reflecting mirror A, the reflecting mirror B and the reflecting mirror C are sequentially arranged on the same horizontal line; the detector includes a detector PD0, a detector PD1, a detector PD2, and a detector PD3, and the gas absorbing element is disposed between the mirror C and the detector PD 3. The utility model can more accurately test and determine the wavelength range of the laser and the wavelength position of the locking laser, and monitor the wavelength change in the optical fiber sensing system to demodulate the value of the physical quantity causing the wavelength change in the system.

Description

Laser wavelength measuring instrument
Technical Field
The utility model relates to the field of laser wavelength measurement, in particular to a laser wavelength measurement instrument.
Background
Currently, there are many methods for laser wavelength measurement, the most commonly used being interferometry, which is the most practical, accurate and feasible. In the existing laser wavelength measurement system, the most important applications are Michelson interferometer wavemeters, fizeau interferometer wavemeters and the like.
Most laser wavelength analysis instruments cannot be applied to real-time on-line laser detection and measurement of various field or sensing systems because of high cost or large volume. And is inconvenient to measure and detect the wavelength range and the wavelength stability of the laser, we propose a laser wavelength measuring instrument in view of this.
Disclosure of utility model
The present utility model is directed to a laser wavelength measuring instrument, which solves the above-mentioned problems of the prior art.
In order to achieve the above purpose, the present utility model provides the following technical solutions:
A laser wavelength measuring instrument comprises a detector, an inclined transmission filter, a reflecting mirror, a filter and a gas absorbing element, wherein one side of the filter is provided with the reflecting mirror, and the other side of the filter is provided with the detector;
The filter plate comprises an FP (Fabry-Perot) standard filter plate and an inclined transmission filter plate;
The reflecting mirror comprises a reflecting mirror A, a reflecting mirror B and a reflecting mirror C, and the reflecting mirror A, the reflecting mirror B and the reflecting mirror C are sequentially arranged on the same horizontal line;
The detector includes a detector PD0, a detector PD1, a detector PD2, and a detector PD3, and the gas absorbing element is disposed between the mirror C and the detector PD 3.
The FP marker filter is arranged above the reflector A, and the detector PD2 is arranged above the FP marker filter;
the inclined transmission filter is arranged above the reflecting mirror B, and the detector PD1 is arranged above the inclined transmission filter;
The detector PD0 is disposed below the mirror C.
The surfaces of the two sides of the reflector A, the reflector B and the reflector C are respectively provided with a light-transmitting film and an AR coating film, and the light-transmitting film is positioned on one side of the light source.
The reflector A, the reflector B and the reflector C are all obliquely arranged, the inclination directions of the reflector A and the reflector B are consistent, and the inclination directions of the reflector B and the reflector C are opposite.
Compared with the prior art, the utility model has the beneficial effects that:
The utility model can more accurately test and determine the wavelength range of the laser and the wavelength position of the locking laser through the arrangement of the gas absorption element, and monitor the wavelength change in the optical fiber sensing system to demodulate the value of the physical quantity causing the wavelength change in the system.
Drawings
Fig. 1 is a schematic diagram of the overall structure of the laser wavemeter of the present utility model.
The reference numerals in the figures illustrate: 1. a detector PD2; 2. FP etalon filter; 3. a reflecting mirror A; 4. a detector PD1; 5. tilting the transmission filter; 6. a reflecting mirror B; 7. a reflecting mirror C; 8. a gas absorbing element; 9. a detector PD3; 10. detector PD0.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments.
Examples:
Referring to fig. 1, a laser wavelength measuring instrument includes a detector, an oblique transmission filter 5, a reflector, a filter and a gas absorbing element 8, wherein one side of the filter is provided with the reflector, and the other side is provided with the detector, so that laser in a light path is converted into current through the detector;
the filter sheet comprises an FP (Fabry-Perot) standard filter sheet 2 and an oblique transmission filter sheet 5, and the combination of the FP standard filter sheet 2 and the oblique transmission filter sheet 5 can further improve the measurement precision and the resolution; the oblique transmission filter is a filter with oblique spectral transmittance.
The reflecting mirror comprises a reflecting mirror A3, a reflecting mirror B6 and a reflecting mirror C7, wherein the reflecting mirror A3, the reflecting mirror B4 and the reflecting mirror C7 are sequentially arranged on the same horizontal line, and the light source is emitted from the left side of the reflecting mirror A3.
The detector includes a detector PD0, a detector PD1, a detector PD2, and a detector PD3, and the gas absorbing member 8 is disposed between the mirror C7 and the detector PD 3. In this case, the gas absorbing element 8 is filled with different gases, and the wavelength measured by the detector PD3 is different because the different gases correspond to different wavelengths of the absorbed light.
Wherein the FP gauge filter 2 is disposed above the reflector A3, and the detector PD2 is disposed above the FP gauge filter 2; the inclined transmission filter is combined with the FP etalon, and the resolution and monitoring control precision of the wavelength meter are further improved by utilizing the transmission phase shift of the FP etalon.
The inclined transmission filter 5 is arranged above the reflecting mirror B6, and the detector PD1 is arranged above the inclined transmission filter 5; the detector PD0 is disposed below the mirror C7.
The surfaces of the two sides of the reflector A3, the reflector B6 and the reflector C7 are respectively provided with a light-transmitting film and an AR coating film, and the light-transmitting film is positioned on one side of the light source. The light-transmitting film and the AR coating reduce the loss of reflected light and improve the transmittance and definition of light.
The reflector A3, the reflector B6 and the reflector C7 are all obliquely arranged, the inclination directions of the reflector A3 and the reflector B6 are consistent, and the inclination directions of the reflector B6 and the reflector C7 are opposite.
In order to measure and accurately position the absolute wavelength position and wavelength stability of the laser, a laser wavemeter structural system is improved, and the system structure is shown in the following figure 1. The bright point of this structure is that a standard gas absorbing element 8 is added to the right of the detector PD0 and an H 13C14 N molecular absorption spectrum is used to determine the absolute wavelength position. The H 13C14 N molecular absorption spectrum is approved by the national standard organization, is used as the main wavelength reference (1530 nm-1565 nm) of the C wave band, and is compared with the wavelength spectrum measured by us to determine the absolute wavelength position.
The present application, through the arrangement of the gas absorbing element 8, can more accurately test and determine the wavelength range of the laser, as well as lock the wavelength position of the laser and monitor the wavelength change in the optical fiber sensing system to demodulate the value of the physical quantity in the system that causes the wavelength change.
The wavelength of the laser can be found by searching data as long as the current of the detector PD1 or the voltage V1 of the series resistor or other related parameters are calibrated, so that the wavelength of the laser is feedback controlled or the wavelength change in the optical fiber sensing system is demodulated, namely:
BV=VPD1/VPD0:BV=IPD1/IPD0
The ratio calculated from the tested data is compared with the value of the actual measured spectral curve of the oblique filter, thereby deriving a value of the wavelength or a value of the wavelength change.
The resolution and monitoring control accuracy of the wavemeter are further improved by using the transmission phase shift of the FP etalon.
The transmission equation for an ideal etalon, i.e., the Airy function, is:
Wherein: t is the transmission value, R is the reflectivity of the mirror, and Φ is the round-trip phase change of the light.
If any phase change on the mirror is ignored, the corresponding phase difference between two adjacent beams:
Wherein: l is the laser wavelength, n is the refractive index of the medium between the mirrors, d is the distance between the mirrors, and q is the angle of the incident light.
The distance between adjacent peaks is the free spectral range (D), and the width of each peak (FWHM full width at half maximum) is the resolution (D). The free spectral range can be expressed in three ways:
Another important concept of etalons is fringe finesse (F). This dimensionless parameter is the ratio of the free spectral range to the peak width.
For an ideal etalon, only the specular reflectivity determines the finesse. Namely:
the larger the value of finesse F, the sharper the fringes, and the better the wavelength locking.
The foregoing has shown and described the basic principles, principal features and advantages of the utility model. It will be understood by those skilled in the art that the present utility model is not limited to the above-described embodiments, and that the above-described embodiments and descriptions are only preferred embodiments of the present utility model, and are not intended to limit the utility model, and that various changes and modifications may be made therein without departing from the spirit and scope of the utility model as claimed. The scope of the utility model is defined by the appended claims and equivalents thereof.

Claims (4)

1. The laser wavelength measuring instrument is characterized by comprising a detector, an inclined transmission filter (5), a reflecting mirror, a filter and a gas absorbing element (8), wherein one side of the filter is provided with the reflecting mirror, and the other side of the filter is provided with the detector;
The filter comprises an FP (Fabry-Perot) standard filter (2) and an oblique transmission filter (5);
The reflecting mirror comprises a reflecting mirror A (3), a reflecting mirror B (6) and a reflecting mirror C (7), wherein the reflecting mirror A (3), the reflecting mirror B (6) and the reflecting mirror C (7) are sequentially arranged on the same horizontal line;
The detector comprises a detector PD0 (10), a detector PD1 (4), a detector PD2 (1) and a detector PD3 (9), and the gas absorbing element (8) is arranged between the reflecting mirror C (7) and the detector PD3 (9).
2. A laser wavelength measuring instrument as claimed in claim 1, wherein: the FP marker filter (2) is arranged above the reflecting mirror A (3), and the detector PD2 (1) is arranged above the FP marker filter (2);
The inclined transmission filter (5) is arranged above the reflecting mirror B (6), and the detector PD1 (4) is arranged above the inclined transmission filter (5);
The detector PD0 (10) is disposed below the mirror C (7).
3. A laser wavelength measuring instrument as claimed in claim 2, wherein: the surfaces of two sides of the reflector A (3), the reflector B (6) and the reflector C (7) are respectively provided with a light-transmitting film and an AR coating, and the light-transmitting film is positioned on one side where the light source is shot.
4. A laser wavelength measuring instrument as claimed in claim 1, wherein: the reflector A (3), the reflector B (6) and the reflector C (7) are all obliquely arranged, the inclination directions of the reflector A (3) and the reflector B (6) are consistent, and the inclination directions of the reflector B (6) and the reflector C (7) are opposite.
CN202420095974.1U 2024-01-15 2024-01-15 Laser wavelength measuring instrument Active CN221425818U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202420095974.1U CN221425818U (en) 2024-01-15 2024-01-15 Laser wavelength measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202420095974.1U CN221425818U (en) 2024-01-15 2024-01-15 Laser wavelength measuring instrument

Publications (1)

Publication Number Publication Date
CN221425818U true CN221425818U (en) 2024-07-26

Family

ID=92015701

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202420095974.1U Active CN221425818U (en) 2024-01-15 2024-01-15 Laser wavelength measuring instrument

Country Status (1)

Country Link
CN (1) CN221425818U (en)

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