CN221405930U

CN221405930U - Semiconductor test fixture table

Info

Publication number: CN221405930U
Application number: CN202322984129.8U
Authority: CN
Inventors: 梅宇峰; 黄达鹏
Original assignee: Quality Lead Electron Suzhou Co ltd
Current assignee: Quality Lead Electron Suzhou Co ltd
Priority date: 2023-11-06
Filing date: 2023-11-06
Publication date: 2024-07-23
Anticipated expiration: 2033-11-06

Abstract

The utility model relates to the technical field of semiconductor testing, and discloses a semiconductor testing tool table, which comprises a tool table body, wherein a fixing component is arranged above the tool table body, a displacement component is arranged above the tool table body, the fixing component comprises a fixing seat fixedly arranged on the right side of the top of the tool table body, the top of the tool table body is slidably connected with a movable seat, and fixing grooves are formed in the fixing seat and the top of the movable seat. This semiconductor test fixture platform through setting up fixed subassembly, places the semiconductor after the fixed slot is inside, can carry out stable fixed to the semiconductor, conveniently carries out accurate test to the semiconductor, avoids the semiconductor to take place the skew in the test process to influence the accuracy of semiconductor test result, can adjust the distance between two fixed slots through setting up displacement subassembly, thereby make two fixed slots can place and fix the semiconductor of equidimension not.

Description

Semiconductor test fixture table

Technical Field

The utility model relates to the technical field of semiconductor testing, in particular to a semiconductor testing tool table.

Background

The conductor refers to a material with conductivity between the conductor and an insulator at normal temperature, and the semiconductor is applied to the fields of integrated circuits, consumer electronics, communication systems, photovoltaic power generation, illumination, high-power conversion and the like, for example, a diode is a device made of a semiconductor, and the importance of the semiconductor is very great from the aspects of science and technology or economic development, and most of electronic products, such as core units in computers, mobile phones or digital recorders, are very closely related to the semiconductor.

In the production process of semiconductors, the semiconductors need to be tested by using a test fixture, while the existing test fixture generally utilizes a fixture table, a groove for preventing the semiconductors is formed in the top of the fixture table, the semiconductors are placed in the groove, then the semiconductors are tested, but the semiconductor cannot be stably fixed by the test method, the semiconductors can be offset in the test process, and the accuracy of the semiconductor test result can be affected seriously, so that the semiconductor test fixture table is provided to solve the problems.

Disclosure of utility model

(One) solving the technical problems

Aiming at the defects of the prior art, the utility model provides a semiconductor test fixture table which has the advantages of being capable of stably fixing semiconductors with different sizes and the like, and solves the problem that the existing semiconductor test fixture table can not stably fix semiconductors with different sizes.

(II) technical scheme

In order to achieve the purpose of stably fixing semiconductors with different sizes, the utility model provides the following technical scheme: the utility model provides a semiconductor test fixture platform, includes the fixture platform body, the top of fixture platform body is provided with fixed subassembly, the top of fixture platform body is provided with displacement subassembly.

The fixed subassembly includes fixed mounting in the fixing base on frock bench body top right side, the top sliding connection of frock bench body has the removal seat, the fixed slot has all been seted up at the top of fixing base and removal seat, the fixing base is connected with the dwang with the top of removal seat is all rotated through the bearing, two the equal fixed mounting in top of dwang has the fixed plate, two the equal fixed mounting in bottom of fixed plate has the fixed block, two the movable slot has all been seted up to the bottom of fixed block, two the equal rotation in top of fixed plate is connected with one end and runs through and extend to the inside first threaded rod of movable slot, two equal fixed mounting in top of first threaded rod has the knob, two equal threaded connection in the outside of first threaded rod has the movable block, two the left and right sides of movable block all is provided with spacing subassembly, two the equal fixed mounting in bottom of movable block has the rubber block.

Further, displacement subassembly is including fixed mounting in the left backup pad in frock bench body top, the left side of fixing base rotates and is connected with one end and runs through and extend to the left second threaded rod of backup pad, the left side fixed mounting of second threaded rod has the commentaries on classics handle, the left side fixed mounting of fixing base has two one ends and backup pad left side fixed connection's slide bar.

Further, the bottom four corners of frock platform body are all fixed mounting has the base, four the bottom of base is all fixed mounting has the slipmat.

Further, the opposite side walls of the inner cavities of the two fixing grooves are communicated with the outside.

Further, the limiting assembly comprises limiting blocks fixedly arranged on the left side and the right side of the movable block, and limiting grooves which are in sliding connection with the limiting blocks are formed in the left side wall and the right side wall of the inner cavity of the movable groove.

Further, the bottom positions of the rubber blocks are located above the fixed seat and the movable seat, and the positions of the two fixed blocks correspond to the positions of the two fixed grooves respectively.

Further, the movable seat is in threaded connection with the outer side of the second threaded rod, and the movable seat is in sliding connection with the outer sides of the two sliding rods.

(III) beneficial effects

Compared with the prior art, the utility model provides a semiconductor test tool table, which comprises the following components

The beneficial effects are that:

This semiconductor test fixture platform through setting up fixed subassembly, places the semiconductor after the fixed slot is inside, can carry out stable fixed to the semiconductor, conveniently carries out accurate test to the semiconductor, avoids the semiconductor to take place the skew in the test process to influence the accuracy of semiconductor test result, can adjust the distance between two fixed slots through setting up displacement subassembly, thereby make two fixed slots can place and fix the semiconductor of equidimension not, greatly increased the practicality of semiconductor test fixture platform.

Drawings

FIG. 1 is a schematic diagram of the structure of the present utility model;

FIG. 2 is an enlarged view of A in the structure of the present utility model;

fig. 3 is a top view of a displacement assembly in the structure of the present utility model.

In the figure: 1. a tool table body; 2. a fixing assembly; 201. a fixing seat; 202. a movable seat; 203. a fixing groove; 204. a rotating lever; 205. a fixing plate; 206. a fixed block; 207. a movable groove; 208. a first threaded rod; 209. a knob; 210. a movable block; 211. a limit component; 212. a rubber block; 3. a displacement assembly; 301. a support plate; 302. a second threaded rod; 303. a rotating handle; 304. a slide bar; 4. a base; 5. an anti-slip mat.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

Referring to fig. 1-3, the present utility model provides a technical solution: the utility model provides a semiconductor test fixture platform, includes fixture platform body 1, and the top of fixture platform body 1 is provided with fixed subassembly 2, and the top of fixture platform body 1 is provided with displacement subassembly 3.

Wherein, the equal fixed mounting in bottom four corners of frock platform body 1 has base 4, carries out stable support to frock platform body 1 through base 4, and the equal fixed mounting in bottom of four bases 4 has slipmat 5, can prevent that frock platform body 1 from taking place the displacement through slipmat 5.

In the present embodiment, the fixing unit 2 is a unit for fixing a semiconductor.

As shown in fig. 1, fig. 2 and fig. 3, the fixed subassembly 2 includes fixed seat 201 fixedly mounted on the right side of the top of the tool table body 1, the top sliding connection of the tool table body 1 has movable seat 202, fixed groove 203 has all been seted up at the top of fixed seat 201 and movable seat 202, fixed seat 201 and movable seat 202's top all are connected with dwang 204 through the bearing rotation, fixed plate 205 is all fixedly mounted at the top of two dwang 204, fixed block 206 is all fixedly mounted at the bottom of two fixed plates 205, movable groove 207 has all been seted up at the bottom of two fixed block 206, the top of two fixed plate 205 is all rotated and is connected with one end and runs through and extend to the inside first threaded rod 208 of movable groove 207, the top of two first threaded rod 208 is all fixedly mounted with knob 209, the outside of two first threaded rod 208 is all threaded connection has movable block 210, the left and right sides of two movable block 210 all are provided with spacing subassembly 211, the bottom of two movable block 210 is all fixedly mounted with rubber block 212.

Wherein, the opposite side walls of the inner cavities of the two fixing grooves 203 are communicated with the outside, and the semiconductor can be placed through the two fixing grooves 203.

In addition, the limiting component 211 comprises limiting blocks fixedly mounted on the left side and the right side of the movable block 210, limiting grooves which are in sliding connection with the limiting blocks are formed in the left side wall and the right side wall of the inner cavity of the movable groove 207, when the two knobs 209 are rotated, the two knobs 209 can respectively drive the two first threaded rods 208 to rotate, and the movable block 210 can be prevented from rotating through the limiting blocks and the limiting grooves, so that the two first threaded rods 208 can respectively drive the two movable blocks 210 to move downwards under the action of thread thrust, and meanwhile, the movement track of the movable block 210 can be limited through the limiting blocks and the limiting grooves, so that the movable block 210 is prevented from being separated from the movable groove 207.

It should be noted that, the positions of the two fixing blocks 206 respectively correspond to the positions of the two fixing slots 203, and the two fixing plates 205 are rotated under the action of the two rotating rods 204, so that the two fixing blocks 206 can be rotated, and the two fixing blocks 206 can be not located above the two fixing slots 203, and at this time, the semiconductor is conveniently placed inside the fixing slots 203.

In addition, the bottom of the rubber block 212 is located above the fixed seat 201 and the movable seat 202, so as to ensure that the fixed plate 205 can drive the fixed block 206 to rotate, and avoid the limit of the fixed block 206, the fixed seat 201 and the movable seat 202.

It should be noted that, when the two movable blocks 210 move downward, the two movable blocks 210 respectively drive the two rubber blocks 212 to move downward until the bottoms of the two rubber blocks 212 are abutted against the top of the semiconductor, then the semiconductor can be tested, and the semiconductor can be prevented from being damaged when being fixed by the rubber blocks 212.

In this embodiment, the displacement assembly 3 is an assembly for driving the movable base 202 to displace.

As shown in fig. 1 and 3, the displacement assembly 3 includes a support plate 301 fixedly mounted on the left side of the top of the tooling table body 1, a second threaded rod 302 with one end penetrating and extending to the left side of the support plate 301 is rotatably connected to the left side of the fixing seat 201, a rotating handle 303 is fixedly mounted on the left side of the second threaded rod 302, and two sliding rods 304 with one ends fixedly connected to the left side of the support plate 301 are fixedly mounted on the left side of the fixing seat 201.

The movable seat 202 is screwed on the outer side of the second threaded rod 302, and the movable seat 202 is slidably connected on the outer sides of the two sliding rods 304, so that the movable seat 202 can be guided and limited by the two sliding rods 304, and the movable seat 202 can move more stably.

In addition, when the rotating handle 303 is rotated, the rotating handle 303 drives the second threaded rod 302 to rotate, and under the action of the thread thrust, the second threaded rod 302 drives the movable seat 202 to move leftwards or rightwards, so as to adjust the distance between the movable seat 202 and the fixed seat 201, and further adjust the distance between the two fixed slots 203, so that the semiconductor can be just placed in the two fixed slots 203.

The working principle of the embodiment is as follows:

When the semiconductor test tool table is used, according to the size of a semiconductor, the rotating handle 303 is rotated firstly, the rotating handle 303 drives the second threaded rod 302 to rotate, under the action of a thread thrust, the second threaded rod 302 drives the movable seat 202 to move leftwards or rightwards, so that the distance between the movable seat 202 and the fixed seat 201 is adjusted, the semiconductor can be just placed in the two fixed grooves 203, then the two fixed plates 205 are respectively rotated through the two rotating rods 204, when the fixed blocks 206 are not located above the fixed grooves 203, the semiconductor is placed in the fixed grooves 203, then the two fixed plates 205 are reversely rotated, the two fixed blocks 206 are respectively located above the two fixed grooves 203, then the two knobs 209 are rotated, the two first threaded rods 208 respectively drive the two movable blocks 210 to move downwards under the action of the thread thrust, the two movable blocks 210 respectively drive the two rubber blocks 212 to move downwards until the bottoms of the two rubber blocks 212 are in contact with the tops of the semiconductor, and then the semiconductor can be reversely rotated, so that the semiconductor test tool table can be tested according to the principle.

The electrical components appearing herein are all electrically connected with the master controller and the power supply, the master controller can be a conventional known device for controlling a computer and the like, and the prior art of power connection is not described in detail herein.

It should be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.

Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The utility model provides a semiconductor test fixture platform, includes fixture platform body (1), its characterized in that: a fixed component (2) is arranged above the tool table body (1), and a displacement component (3) is arranged above the tool table body (1);

Fixed subassembly (2) are including fixed mounting in fixing base (201) on frock bench body (1) top right side, the top sliding connection of frock bench body (1) has movable seat (202), fixed slot (203) have all been seted up at the top of fixing base (201) and movable seat (202), fixing base (201) all are connected with dwang (204) through the bearing rotation with the top of movable seat (202), two equal fixed mounting in top of dwang (204) has fixed plate (205), two equal fixed mounting in bottom of fixed plate (205) has fixed block (206), two movable slot (207) have all been seted up to the bottom of fixed block (206), two equal swivelling joint in top of fixed plate (205) has one end to run through and extend to inside first (208) of movable slot (207), two equal fixed mounting in top of first threaded rod (208) has knob (209), two equal threaded connection in the outside of threaded rod (208) has movable block (210), two equal fixed mounting in the left and right sides of movable block (210) has two fixed block (212).

2. The semiconductor test fixture of claim 1, wherein: the displacement assembly (3) comprises a supporting plate (301) fixedly mounted on the left side of the top of the tool table body (1), a second threaded rod (302) with one end penetrating through and extending to the left side of the supporting plate (301) is connected to the left side of the fixing seat (201) in a rotating mode, a rotating handle (303) is fixedly mounted on the left side of the second threaded rod (302), and two sliding rods (304) with one ends fixedly connected with the left side of the supporting plate (301) are fixedly mounted on the left side of the fixing seat (201).

3. The semiconductor test fixture of claim 1, wherein: the tool table is characterized in that bases (4) are fixedly installed at four corners of the bottom of the tool table body (1), and anti-slip pads (5) are fixedly installed at the bottoms of the four bases (4).

4. The semiconductor test fixture of claim 1, wherein: the opposite side walls of the inner cavities of the two fixing grooves (203) are communicated with the outside.

5. The semiconductor test fixture of claim 1, wherein: the limiting assembly (211) comprises limiting blocks fixedly mounted on the left side and the right side of the movable block (210), and limiting grooves which are in sliding connection with the limiting blocks are formed in the left side wall and the right side wall of the inner cavity of the movable groove (207).

6. The semiconductor test fixture of claim 1, wherein: the bottom of the rubber block (212) is positioned above the fixed seat (201) and the movable seat (202), and the positions of the two fixed blocks (206) respectively correspond to the positions of the two fixed grooves (203).

7. The semiconductor test fixture of claim 2, wherein: the movable seat (202) is in threaded connection with the outer side of the second threaded rod (302), and the movable seat (202) is in sliding connection with the outer sides of the two sliding rods (304).