CN215954546U - Experimental mechanism for electrical property research - Google Patents
Experimental mechanism for electrical property research Download PDFInfo
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- CN215954546U CN215954546U CN202122016894.1U CN202122016894U CN215954546U CN 215954546 U CN215954546 U CN 215954546U CN 202122016894 U CN202122016894 U CN 202122016894U CN 215954546 U CN215954546 U CN 215954546U
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Abstract
The utility model relates to the technical field of electrical property tests, in particular to an electrical property research experiment mechanism, which comprises a device main body, a large current cabinet, a voltage adjustment cabinet and a microcomputer system main console, wherein one side of the device main body is provided with an electric telescopic rod, and the top end of the electric telescopic rod is fixedly connected with a property research device; the inside of heavy current cabinet is provided with large-scale circuit breaker and current sensor, inside column type voltage regulator and the capacitance compensation unit of being provided with of voltage adjustment cabinet, the inside of microcomputer system main control cabinet is provided with drive unit. According to the electrical property process experiment system, the large current cabinet, the voltage adjusting cabinet and the microcomputer system main control console are arranged, the system is started by one key after test parameters are set, manual intervention is not needed in the whole test process, the zero position is automatically returned after the test is finished, the high-precision sensor is matched with the high-performance AD acquisition chip, and the measured data are accurate and reliable.
Description
Technical Field
The utility model relates to the technical field of electrical property tests, in particular to an electrical property research and experiment mechanism.
Background
The electrical product performance test is a test performed to confirm that the electrical product performance meets the technical requirements. For different types of electrical products, the test items selected are different according to different performance test types. For example, the low-voltage apparatus type test has the test items of off time and arcing time.
However, the above products have the following drawbacks in use: when a machine on the market is used for a thermal cycle test, the time is generally long, and due to the influences of factors such as power grid voltage fluctuation, temperature rise of a connecting piece, temperature rise of a tested product and the like, output current is unstable, the output current can deviate from a target value seriously, and in the using process, external interference factors are overlarge, so that a large influence is generated on the test, and therefore, an electrical property research experiment mechanism needs to be designed.
SUMMERY OF THE UTILITY MODEL
The utility model aims to provide an electrical property research experiment mechanism to solve the problems that when a machine on the market provided in the background art is used for a thermal cycle test, the time is generally long, the output current is unstable and may deviate from a target value seriously due to the influence of factors such as power grid voltage fluctuation, connection piece temperature rise, temperature rise of a tested product and the like, and in the using process, external interference factors are overlarge, so that the experiment is greatly influenced.
In order to achieve the purpose, the utility model provides the following technical scheme: electrical properties research experimental mechanism includes:
the device comprises a device main body, a large current cabinet, a voltage adjusting cabinet and a microcomputer system main console, wherein an electric telescopic rod is arranged on one side of the device main body, and the top end of the electric telescopic rod is fixedly connected with a performance research device;
the inside of heavy current cabinet is provided with large-scale circuit breaker and current sensor, inside column type voltage regulator and the capacitance compensation unit of being provided with of voltage adjustment cabinet, the inside of computer system main control cabinet is provided with drive unit, signal conditioning and sampling unit, system protection unit, control and data analysis unit and industrial computer and display, receiving mechanism includes the mount table and connects the knee, electric telescopic handle one end fixedly connected with mount table, one side swing joint of mount table has the connection knee, one side slidable mounting of device main part has the closure plate, the one end swing joint of connecting the knee is in one side of closure plate, one side of device main part is provided with the transfer mechanism.
Preferably, the transfer mechanism comprises a containing groove and a first connecting rod, the first connecting rod is inserted into one side of the containing groove, a handle is fixedly connected to one end of the first connecting rod, a bevel gear set is fixedly connected to one end of the first connecting rod, a fixing rod is fixedly connected to the inside of the bevel gear set, a lead screw is connected to one side of the fixing rod through a belt, the lead screw is installed inside the containing groove through a bearing, one side of the lead screw is installed inside the push rod through threads, a sliding plate is fixedly connected to one end of the push rod, and the sliding plate is sleeved inside the containing groove.
Preferably, the surface of the handle is fixedly connected with a protective pad, and the surface of the protective pad is provided with anti-skid lines.
Preferably, both ends of the sliding plate are fixedly connected with first sliding blocks, first sliding grooves are formed in both sides of the interior of the accommodating groove, and the first sliding blocks are slidably mounted in the first sliding grooves.
Preferably, a second sliding groove is formed in one side of the sliding plate, a second sliding block is slidably mounted inside the second sliding groove, one end of the second sliding block is movably connected with a second connecting rod, one end of the second connecting rod is movably connected inside the accommodating groove, and a first spring is fixedly connected to one side close to the two second connecting rods.
Preferably, one side of the sliding plate is fixedly connected with a telescopic cylinder, a telescopic rod is sleeved inside the telescopic cylinder, one end of the telescopic rod is fixedly connected with a bottom plate, one end of the telescopic rod is fixedly connected with a limiting block, the inside of the telescopic cylinder is fixedly connected with a sliding rail, the limiting block is slidably mounted on the sliding rail, one side of the limiting block is fixedly connected with a second spring, and one end of the second spring extends to the inside of the telescopic cylinder.
Preferably, an advanced microelectronic processing technology is adopted, the whole using process can be set in advance, the gears of the current output can be automatically selected by the large-current cabinet through the large-scale circuit breaker, and only one gear can be used each time.
Preferably, the high-current cabinet can automatically select the gear of current output through a large-scale circuit breaker, only one gear can be used each time, and the output loop and the gear of the current sensor can be automatically selected according to the target current.
Preferably, the device has forced air cooling and overheating protection functions, and can automatically adjust the compensation amount according to the load condition so as to achieve the optimal compensation effect.
Compared with the prior art, the utility model has the beneficial effects that:
1. through being provided with heavy current cabinet, voltage adjustment cabinet and microcomputer system main control cabinet, this electrical property technology experimental system, after the system sets up test parameter, a key starts, whole testing process need not artificial intervention, after the experiment is accomplished, get back to the zero-bit automatically, intelligent work overall process has been realized, the automatic tracking target current, automatic stabilization output current, have ground connection detection function and zero-return detection function, ground connection and zero-return confirm just can test after zero-return, high accuracy sensor cooperation high performance AD acquisition chip, measured data is accurate reliable.
2. Through being provided with transfer mechanism, make the device at the in-process that uses, through the linkage nature between the device, make the device remove between the better in-process that removes the device, convenience when greatly increased uses makes the device more high-efficient when removing.
Drawings
FIG. 1 is a schematic sectional elevation view of the structure of the present invention;
FIG. 2 is a schematic elevational sectional view of the mounting table and closure plate mounting structure of the present invention;
FIG. 3 is a schematic sectional front view of the transfer mechanism of the present invention;
FIG. 4 is an enlarged partial cross-sectional view of the structure of FIG. 3A according to the present invention;
FIG. 5 is a schematic circuit diagram of the present invention.
In the figure: 1. a device main body; 2. a performance study device; 3. an electric telescopic rod; 4. a storage mechanism; 41. An installation table; 42. connecting the bent rod; 43. a closing plate; 5. a transfer mechanism; 51. a receiving groove; 52. a first connecting rod; 53. a grip; 54. a bevel gear set; 55. fixing the rod; 56. a screw rod; 57. a push rod; 58. A sliding plate; 59. a first chute; 510. a first slider; 511. a second chute; 512. a second slider; 513. A second connecting rod; 514. a first spring; 515. a telescopic cylinder; 516. a retracting lever; 517. a slide rail; 518. A limiting block; 519. a second spring; 520. a base plate.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1-5, an embodiment of the present invention is shown:
electrical properties research experimental mechanism includes:
the device comprises a device main body 1, a large current cabinet, a voltage adjusting cabinet and a microcomputer system main console, wherein an electric telescopic rod 3 is arranged on one side of the device main body 1, and the top end of the electric telescopic rod 3 is fixedly connected with a performance research device 2;
the large-scale circuit breaker and the current sensor are arranged in the large-current cabinet, the column type voltage regulator and the capacitance compensation unit are arranged in the voltage adjustment cabinet, the driving unit, the signal conditioning and sampling unit, the system protection unit, the control and data analysis unit, the industrial computer and the display are arranged in the main console of the microcomputer system, the storage mechanism 4 comprises a mounting table 41 and a connecting bent rod 42, one end of the electric telescopic rod 3 is fixedly connected with the mounting table 41, one side of the mounting table 41 is movably connected with the connecting bent rod 42, one side of the device main body 1 is slidably provided with a closing plate 43, one end of the connecting bent rod 42 is movably connected with one side of the closing plate 43, one side of the device main body 1 is provided with a transfer mechanism 5, the electrical property process experimental system is started by one key after test parameters are set, and the whole test process does not need manual intervention, after the test is finished, the test device automatically returns to the zero position, and the whole intelligent working process is realized.
Further, the transfer mechanism 5 comprises a containing groove 51 and a first connecting rod 52, the first connecting rod 52 is inserted into one side of the containing groove 51 in a penetrating manner, a handle 53 is fixedly connected to one end of the first connecting rod 52, a bevel gear set 54 is fixedly connected to one end of the first connecting rod 52, a fixing rod 55 is fixedly connected to the inside of the bevel gear set 54, a lead screw 56 is connected to one side of the fixing rod 55 through a belt, the lead screw 56 is installed inside the containing groove 51 through a bearing, one side of the lead screw 56 is installed inside a push rod 57 through threads, a sliding plate 58 is fixedly connected to one end of the push rod 57, the sliding plate 58 is sleeved inside the containing groove 51, and in the using process between the devices, the devices are enabled to better move between the devices in the moving process, and convenience in use is greatly improved.
Further, the fixed surface of the handle 53 is fixedly connected with a protective pad, and the surface of the protective pad is provided with anti-slip lines, so that the friction force on the surface of the device is increased, and the device is more efficient in use.
Further, both ends of the sliding plate 58 are fixedly connected with first sliding blocks 510, first sliding grooves 59 are formed in both sides of the interior of the accommodating groove 51, and the first sliding blocks 510 are slidably mounted in the first sliding grooves 59, so that the device is more stable in the adjusting process.
Furthermore, a second sliding groove 511 is formed in one side of the sliding plate 58, a second sliding block 512 is arranged inside the second sliding groove 511 in a sliding mode, one end of the second sliding block 512 is movably connected with a second connecting rod 513, one end of the second connecting rod 513 is movably connected inside the accommodating groove 51, a first spring 514 is fixedly connected to one side, close to the two second connecting rods 513, of each second connecting rod 513, linkage between the devices is achieved, the devices can be better used, and buffering is achieved between the devices.
Further, one side fixedly connected with of sliding plate 58 is flexible section of thick bamboo 515, shrink pole 516 has been cup jointed to the inside of flexible section of thick bamboo 515, the one end fixedly connected with bottom plate 520 of shrink pole 516, the one end fixedly connected with stopper 518 of shrink pole 516, the inside fixedly connected with slide rail 517 of flexible section of thick bamboo 515, stopper 518 slidable mounting is on slide rail 517, one side fixedly connected with second spring 519 of stopper 518, the one end of second spring 519 extends to the inside of flexible section of thick bamboo 515, support better between the device, make the device carry out the in-process that supports more cushion, it is more stable when making the device support.
Furthermore, an advanced microelectronic processing technology is adopted, the whole using process can be set in advance, the gears of the current output can be automatically selected by the large-current cabinet through the large-scale circuit breaker, and only one gear can be used each time. The operation is simple and clear due to a full Chinese interface. The test is automatically carried out after the parameters are set, the manual intervention is avoided, the automation degree is high, the reliability is good, and the manual intervention is not needed in the test process.
Furthermore, the large-current cabinet can automatically select the gear of current output through a large-scale circuit breaker, only one gear can be used each time, and the output loop and the gear of the current sensor can be automatically selected according to the target current.
Furthermore, the device has forced air cooling and overheating protection functions, and can automatically adjust the compensation amount according to the load condition so as to achieve the optimal compensation effect.
The working principle is as follows: through the extrusion of electric telescopic handle 3, mount table 41 with electric telescopic handle 3 one end connection drives, the connection knee 42 with the connection of mount table 41 one side passes through the connection effect, slide closure plate 43 in one side of device main part 1, accomodate and stretch out performance research device 2, through rotatory handle 53, the first connecting rod 52 with handle 53 one end connection drives bevel gear group 54 and rotates, through the screw-thread fit between catch bar 57 and lead screw 56, slide sliding plate 58 with catch bar 57 drive one side connection slides in the inside of accomodating groove 51, telescopic cylinder 515 that will connect moves, make shrink pole 516 stretch out and draw back in telescopic cylinder 515's inside, when flexible, slide on slide rail 517 through stopper 518, contact with ground through bottom plate 520, support the device.
The tested object is placed on a test stand of an insulation box, a large-current lead is connected, a temperature sensing probe of a temperature inspection instrument is fixed, a power supply main switch of an AR1 voltage regulation control cabinet is turned on, a heat radiation fan switch is turned on, a current output type is selected to turn on a key switch of an operation table, the instrument has display, manual test or automatic test is selected to control output, and the manual test regulates the output current by four buttons of 'coarse regulation and lifting, fine regulation and lifting' and 'fine regulation and lifting' in a panel of the operation table;
the automatic test sets the target current, the system automatically adjusts the output current, and the test process does not need manual intervention;
in the test process, burning out of the tested article and the test bracket due to overlarge loading current is avoided, and the temperature rise of the tested article is controlled within 200 ℃.
It will be evident to those skilled in the art that the utility model is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential attributes thereof. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the utility model being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Claims (9)
1. Electrical properties research laboratory mechanism, its characterized in that includes:
the device comprises a device main body (1), a large current cabinet, a voltage adjusting cabinet and a microcomputer system main console, wherein an electric telescopic rod (3) is arranged on one side of the device main body (1), and the top end of the electric telescopic rod (3) is fixedly connected with a performance research device (2);
the large-scale circuit breaker and the current sensor are arranged in the large-current cabinet, the column type voltage regulator and the capacitance compensation unit are arranged in the voltage adjustment cabinet, the microcomputer system main console is internally provided with a driving unit, a signal conditioning and sampling unit, a system protection unit, a control and data analysis unit, an industrial computer, a display and a storage mechanism (4), the receiving mechanism (4) comprises a mounting table (41) and a connecting bent rod (42), one end of the electric telescopic rod (3) is fixedly connected with an installation platform (41), one side of the installation platform (41) is movably connected with a connecting bent rod (42), one side slidable mounting of device main part (1) has closing plate (43), the one end swing joint of connecting knee-rod (42) is in one side of closing plate (43), one side of device main part (1) is provided with transfer mechanism (5).
2. The electrical property research laboratory apparatus of claim 1, wherein: the transfer mechanism (5) comprises a containing groove (51) and a first connecting rod (52), the first connecting rod (52) penetrates through one side of the containing groove (51), one end of the first connecting rod (52) is fixedly connected with a handle (53), one end of the first connecting rod (52) is fixedly connected with a bevel gear set (54), a fixing rod (55) is fixedly connected inside the bevel gear set (54), one side of the fixing rod (55) is connected with a lead screw (56) through a belt, the lead screw (56) is installed inside the containing groove (51) through a bearing, one side of the lead screw (56) is installed inside a push rod (57) through threads, one end of the push rod (57) is fixedly connected with a sliding plate (58), and the sliding plate (58) is sleeved inside the containing groove (51).
3. The electrical property research laboratory apparatus of claim 2, wherein: the surface of the handle (53) is fixedly connected with a protective pad, and anti-skid lines are arranged on the surface of the protective pad.
4. The electrical property research laboratory apparatus of claim 2, wherein: both ends of the sliding plate (58) are fixedly connected with first sliding blocks (510), both sides of the interior of the accommodating groove (51) are provided with first sliding grooves (59), and the first sliding blocks (510) are slidably mounted in the first sliding grooves (59).
5. The electrical property research laboratory apparatus of claim 2, wherein: a second sliding groove (511) is formed in one side of the sliding plate (58), a second sliding block (512) is installed inside the second sliding groove (511) in a sliding mode, one end of the second sliding block (512) is movably connected with a second connecting rod (513), one end of the second connecting rod (513) is movably connected inside the accommodating groove (51), and a first spring (514) is fixedly connected to one side, close to the two second connecting rods (513).
6. The electrical property research laboratory apparatus of claim 2, wherein: one side fixedly connected with telescopic tube (515) of sliding plate (58), shrink pole (516) has been cup jointed to telescopic tube (515) inside, the one end fixedly connected with bottom plate (520) of shrink pole (516), the one end fixedly connected with stopper (518) of shrink pole (516), the inside fixedly connected with slide rail (517) of telescopic tube (515), stopper (518) slidable mounting is on slide rail (517), one side fixedly connected with second spring (519) of stopper (518), the one end of second spring (519) extends to the inside of telescopic tube (515).
7. The electrical property research laboratory apparatus of claim 1, wherein: by adopting an advanced microelectronic processing technology, all use processes can be set in advance, the gears of the current output can be automatically selected by the large-current cabinet through the large-scale circuit breaker, and only one gear can be used each time.
8. The electrical property research laboratory apparatus of claim 1, wherein: the large-current cabinet can automatically select the gear of current output through a large-scale circuit breaker, only one gear can be used at each time, and the output loop and the gear of the current sensor can be automatically selected according to the target current.
9. The electrical property research laboratory apparatus of claim 1, wherein: it has forced air cooling and overheat protection functions, and can automatically regulate compensation amount according to load condition to obtain optimum compensation effect.
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CN202122016894.1U CN215954546U (en) | 2021-08-25 | 2021-08-25 | Experimental mechanism for electrical property research |
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CN202122016894.1U CN215954546U (en) | 2021-08-25 | 2021-08-25 | Experimental mechanism for electrical property research |
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