CN221103353U - Antenna near field coupling test assembly and antenna performance test equipment - Google Patents
Antenna near field coupling test assembly and antenna performance test equipment Download PDFInfo
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- CN221103353U CN221103353U CN202322708155.8U CN202322708155U CN221103353U CN 221103353 U CN221103353 U CN 221103353U CN 202322708155 U CN202322708155 U CN 202322708155U CN 221103353 U CN221103353 U CN 221103353U
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- 238000011056 performance test Methods 0.000 title description 2
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Abstract
The application relates to the technical field of antenna testing devices, and provides an antenna near-field coupling testing component and antenna performance testing equipment, wherein the testing component comprises: the first circuit board, the second circuit board and the electric connection structure; the first circuit board comprises a first dielectric plate, a first metal ground, a second metal ground, a matching load and a feed structure, wherein the first metal ground is arranged on the lower surface of the first dielectric plate, a coplanar waveguide wire is arranged in the first metal ground, the second metal ground is arranged on the upper surface of the first dielectric plate, the first metal ground is electrically connected with the second metal, the matching load is respectively connected with the first dielectric plate and the coplanar waveguide wire, and the feed structure is respectively connected with the first dielectric plate and the coplanar waveguide wire; the second circuit board comprises a second dielectric plate and a third metal ground, and the antenna near-field coupling test assembly has good anti-interference performance and test flatness.
Description
Technical Field
The application relates to the technical field of antenna testing devices, in particular to an antenna near-field coupling testing component and antenna performance testing equipment.
Background
In the production process of a wireless communication device, detection and control are required to be performed on the wireless performance of the wireless communication device, and the detection is usually a coupling test, and the coupling test can eliminate the following fault conditions of the device: 1. falling part, collision part, chip virtual welding, antenna welding failure, cable line, tin bead short circuit, material abnormality, and the like. The strict test needs to be carried out in a clean electromagnetic environment, but in practice, the general electromagnetic environment is quite complex and chaotic, so from the aspect of test topology, a tester needs to ensure not only the test stability, but also good anti-interference capability, and adverse effects on the test caused by interference signals in the environment are prevented, thereby improving the design difficulty of the antenna coupling test board for accompany test. Therefore, the antenna coupling test board is required to be stable in test, good in anti-interference capability, convenient to assemble with a clamp and wide in frequency coverage band range (LTE frequency band and WIFI frequency band).
The patent with publication number KR1020090088351A describes an antenna near-field coupling test board based on a microstrip patch antenna, wherein the test board is composed of a PCB where a PCB radiation patch is located and a metal reflective back cavity, and is a standing wave antenna in a resonant mode. The standing wave variation is large in the working frequency band, namely the test flatness is poor; the far field gain at the resonance point is high, i.e. the anti-interference capability is poor.
Disclosure of utility model
The utility model mainly aims to provide an antenna near-field coupling test assembly, and aims to solve the technical problems of poor test flatness and poor anti-interference capability of an antenna near-field coupling test board in the prior art.
In order to achieve the above purpose, the utility model adopts the following technical scheme: an antenna near field coupling test assembly, comprising:
The circuit comprises a first circuit board, a second circuit board and an electric connection structure, wherein the second circuit board is arranged below the first circuit board at intervals, and the first circuit board is electrically connected with the second circuit board through the electric connection structure;
The first circuit board comprises a first dielectric plate, a first metal ground, a second metal ground, a matching load and a feed structure, wherein the first metal ground is arranged on the lower surface of the first dielectric plate, a coplanar waveguide wire is arranged in the first metal ground, the second metal ground is arranged on the upper surface of the first dielectric plate, the projection of the second metal ground on the lower surface of the first dielectric plate is positioned around the coplanar waveguide wire at intervals, the first metal ground is electrically connected with the second metal, the matching load is respectively connected with the first dielectric plate and the coplanar waveguide wire, and the feed structure is respectively connected with the first dielectric plate and the coplanar waveguide wire;
The second circuit board comprises a second dielectric plate and a third metal ground arranged above the second dielectric plate.
Further, the profile of the beginning end and the profile of the ending end of the coplanar waveguide line are both gradual profiles that taper gradually in a direction away from the coplanar waveguide line.
Further, the gradual profile narrows gradually along a straight line or an arc.
Further, a notch is formed at one end of the first dielectric plate, and the feed structure is located in the notch.
Further, the first circuit board and the second circuit board are mechanically connected through the electrical connection structure.
Further, the electric connection structure is a metal column assembly, and two ends of the metal column assembly are respectively connected with the first circuit board and the second circuit board.
Further, the metal column assembly comprises a stud, a first screw and a second screw, wherein the stud is located between the first circuit board and the second circuit board, the first screw penetrates through the first circuit board downwards from the upper side of the first circuit board to be in threaded connection with the stud, and the second screw penetrates through the second circuit board from the lower side of the second circuit board to be in threaded connection with the stud.
Further, the electric connection structure and the third metal ground are enclosed to form an equivalent metal back cavity structure, and the first circuit board is located above the equivalent metal back cavity structure and connected with the side wall of the equivalent metal back cavity structure.
Further, the feed structure is an MCX patch mother seat, the outer surface of the MCX patch mother seat is welded to the first dielectric plate, and the inner conductor needle of the MCX patch mother seat is welded to the coplanar waveguide line.
In addition, the utility model also provides antenna performance testing equipment, wherein the antenna performance testing equipment comprises the antenna near-field coupling testing component.
The antenna near-field coupling test assembly provided by the application has the beneficial effects that:
In the antenna near field coupling test assembly provided by the embodiment of the utility model, the coplanar waveguide line is positioned on the lower surface of the first dielectric plate, the antenna near field coupling test assembly is based on the inverted coplanar waveguide line, and the matching load is respectively connected with the first dielectric plate and the coplanar waveguide line to absorb electromagnetic wave energy at the tail end of the coplanar waveguide line, at the moment, only traveling waves are transmitted on the coplanar waveguide line, and the near field coupling is designed by utilizing leakage electromagnetic waves in the wave transmission process, so that the electric field at the near field is uniform, and the far field gain is reduced, so as to inhibit the influence of far field interference signals, so that the antenna near field coupling test assembly has good anti-interference performance.
In a further aspect, the profile of the beginning end and the profile of the ending end of the coplanar waveguide line are both tapered profiles that taper in a direction away from the coplanar waveguide line. The adoption of the gradual change profile basically does not introduce local distribution parameters, and the impedance continuity at different frequencies is good. Meanwhile, matching load is loaded at the tail end of the coplanar waveguide line, so that ideal matching of broadband is realized, and only traveling waves are transmitted, so that radiation is reduced. Specifically, when the characteristic impedance of the coplanar waveguide line is consistent with the matching load impedance and the input impedance, broadband perfect matching is achieved so that electromagnetic waves are not reflected.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the embodiments or the description of the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings can be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is an exploded perspective view of an antenna near field coupling test assembly according to one embodiment of the present application;
FIG. 2 is a perspective view of an antenna near field coupling test assembly according to one embodiment of the present application;
FIG. 3 is a front view of a first circuit board of an antenna near field coupling test assembly according to one embodiment of the present application;
FIG. 4 is a rear view of a first circuit board of an antenna near field coupling test assembly according to one embodiment of the present application;
FIG. 5 is a graph of reflection coefficient of an antenna near field coupling test assembly according to one embodiment of the present application;
FIG. 6 is a 3D pattern of an antenna near field coupling test assembly at a frequency of 2.45GHz according to one embodiment of the present application;
FIG. 7 is a diagram of electric field strength thermodynamic diagram of an antenna at 10mm above a near field coupling test assembly according to one embodiment of the present application;
FIG. 8 is an E-plane pattern of an antenna near field coupling test assembly according to one embodiment of the present application;
Fig. 9 is a schematic diagram illustrating coupling test simulation of an antenna near field coupling test assembly according to an embodiment of the present application.
Reference numerals related to the above figures are as follows:
1-a gradual change profile; 2-a stud;
3-a first screw; 4-a second screw;
5-mounting through holes; 100-a first circuit board;
101-a first dielectric plate; 102-a first metal ground;
103-a second metal ground; 104-coplanar waveguide lines;
105-matching load; 106-a feed structure;
107-notch; 200-a second circuit board;
201-a second dielectric plate; 202-a third metal ground;
300-dipole antenna; 301-a first metal arm;
302-a second metal arm; 303-dielectric plate;
304-feeding point.
Detailed Description
In order to make the technical problems, technical schemes and beneficial effects to be solved more clear, the application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the application.
It will be understood that when an element is referred to as being "fixed" or "disposed" on another element, it can be directly on the other element or be indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or be indirectly connected to the other element.
It is to be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are merely for convenience in describing and simplifying the description based on the orientation or positional relationship shown in the drawings, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus are not to be construed as limiting the application.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature. In the description of the present application, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
In order to explain the technical scheme of the application, the following is a detailed description with reference to the specific drawings and embodiments.
Referring to fig. 1 to 4, an embodiment of the present utility model provides an antenna near field coupling testing assembly, which includes:
The first circuit board 100, the second circuit board 200 and the electrical connection structure, wherein the second circuit board 200 is arranged below the first circuit board 100 at intervals, and the first circuit board 100 and the second circuit board 200 are electrically connected through the electrical connection structure;
The first circuit board 100 comprises a first dielectric board 101 (FR-4 may be adopted), a first metal ground 102, a second metal ground 103, a coplanar waveguide line 104, a matching load 105 and a feed structure 106, wherein the first metal ground 102 is arranged on the lower surface (back surface) of the first dielectric board 101, the first metal ground 102 is provided with the coplanar waveguide line 104, which is equivalent to that the first metal ground 102 comprises the coplanar waveguide line 104 and a peripheral part surrounding the coplanar waveguide line 104, the second metal ground 103 is arranged on the upper surface of the first dielectric board 101, the first metal ground 102 is electrically connected with the second metal ground 103, the first metal ground 102 and the second metal ground 103 can be electrically connected with each other by adopting a metallized via hole, the matching load 105 is respectively connected with the first dielectric board 101 and the coplanar waveguide line 104 to absorb electromagnetic wave energy at the tail end of the coplanar waveguide line 104, at this time, the coplanar waveguide line 104 only transmits travelling waves, and the feed structure 106 is respectively connected with the first dielectric board 101 and the coplanar waveguide line 104 to feed the radio frequency signal, so that the transmission and reception of the radio frequency signal and the working efficiency of the antenna can be ensured;
The second circuit board 200 includes a second dielectric board 201 (FR-4 may be employed) and a third metal ground 202 disposed above the second dielectric board 201.
In the antenna near-field coupling test assembly provided by the embodiment of the utility model, the coplanar waveguide line 104 is positioned on the lower surface of the first dielectric plate 101, the antenna near-field coupling test assembly is based on the inverted coplanar waveguide line 104, and the matching load 105 is respectively connected with the first dielectric plate 101 and the coplanar waveguide line 104 to absorb electromagnetic wave energy at the tail end of the coplanar waveguide line 104, at the moment, only traveling waves are transmitted on the coplanar waveguide line 104, near-field coupling is designed by utilizing leakage electromagnetic waves in the wave transmission process, so that an electric field at a near field is uniform, and far-field gain is reduced at the same time, so that the influence of far-field interference signals is inhibited, the antenna near-field coupling test assembly has good anti-interference performance, and the antenna near-field coupling test assembly adopts a form of a traveling wave antenna, and is well matched in a wide-band range, so that the test flatness under different frequencies can be ensured.
Referring to fig. 4, according to a preferred embodiment of the present utility model, the profile of the beginning and ending ends of the coplanar waveguide line 104 are each a gradual profile 1 that tapers in a direction away from the coplanar waveguide line 104. The adoption of the gradual change profile 1 basically does not introduce local distribution parameters, and the impedance continuity at different frequencies is good. Meanwhile, a matching load 105 is loaded at the tail end of the coplanar waveguide line 104, so that ideal broadband matching is realized, and only traveling waves are transmitted, thereby reducing radiation. Specifically, when the characteristic impedance of the coplanar waveguide line 104 coincides with the matching load 105 impedance and the input impedance, broadband perfect matching will be achieved so that electromagnetic waves propagate without reflection.
According to one embodiment of the utility model, the tapering profile 1 tapers along a straight line or an arc, in particular a tapering profile 1 of trapezoidal configuration, circular, hyperbolic, etc. may be formed.
Referring to fig. 1 and 2, according to a preferred embodiment of the present utility model, a notch 107 is formed at one end of the first dielectric plate 101, and the feeding structure 106 is located in the notch 107.
According to the preferred embodiment of the present utility model, the first circuit board 100 and the second circuit board 200 are also mechanically connected by the electrical connection structure, so that the electrical connection and mechanical connection of the first circuit board 100 and the second circuit board 200 are achieved only by the electrical connection structure without using an additional mechanical connection structure, but the solution of using an additional mechanical connection structure to achieve the mechanical connection of the first circuit board 100 and the second circuit board 200 is not excluded.
As an embodiment, the electrical connection structure is a metal pillar assembly, two ends of the metal pillar assembly are respectively connected with the first circuit board 100 and the second circuit board 200, and the scheme is equivalent to a closed metal back cavity, so that materials and material processing cost can be saved.
Referring to fig. 1 and 2, in this embodiment, specifically, the metal pillar assembly includes a stud 2, a first screw 3 and a second screw 4, where the stud 2 is located between the first circuit board 100 and the second circuit board 200, the first screw 3 passes through the first circuit board 100 from an upper side of the first circuit board 100 and is screwed with the stud 2, and the second screw 4 passes through the second circuit board 200 from a lower side of the second circuit board 200 and is screwed with the stud 2, and of course, the metal pillar assembly is not limited to the form of the stud 2, the first screw 3 and the second screw 4, for example, the connection of the first circuit board 100 and the second circuit board 200 is performed by adopting a screw rod with threads at both ends, or the connection of the first circuit board 100 and the second circuit board 200 is performed by adopting a connection pin, and the mounting through holes 5 for the first screw 3 and the second screw 4 to pass through and can play a role are also provided on the first dielectric board 101 and the second dielectric board 201.
As another embodiment, the electrical connection structure is an all-metal back cavity structure, and the first circuit board 100 and the second circuit board 200 are respectively disposed in the cavity of the all-metal back cavity structure and connected to the side wall of the all-metal back cavity structure, and the all-metal back cavity can be manufactured by CNC ((computer numerical control) processing) or die casting.
According to one embodiment of the present utility model, the feeding structure 106 is an MCX patch female socket, and specifically, the connection manner may be, but is not limited to,: the outer surface of the MCX patch mother seat is welded to the first dielectric plate 101, and the inner conductor needle of the MCX patch mother seat is welded to the coplanar waveguide line 104, and in this embodiment, a mode of feeding to the side of the MCX patch mother seat is adopted. As other embodiments, other rf device feeds (e.g., SMA, etc.) may be used, or a bottom feed approach may be used.
Fig. 5 is a graph of reflection coefficient of the near field coupling test component of the antenna according to an embodiment of the present application, and as can be seen from fig. 5, the reflection coefficient of the near field coupling test component of the antenna is less than-10 dB in the frequency range of 0.7GHz-6GHz, so that the matching state is satisfied during testing at different frequencies, and the test flatness is better.
Fig. 6 is a 3D directional diagram of an antenna near field coupling test assembly according to an embodiment of the present application at a frequency of 2.45GHz, and as can be seen from fig. 6, the maximum gain of the far field of the antenna near field coupling test assembly is-9.6 dBi at 2.45GHz, and the gain of the far field of the antenna near field coupling test assembly is low.
It should be noted that, the coplanar waveguide line 104 is a semi-closed structure, and leakage occurs from an open structure during electromagnetic wave propagation, and because the first dielectric plate 101 is covered above the coplanar waveguide line 104, the first dielectric plate 101 is more likely to bind the electromagnetic field, so that the leakage electromagnetic field is concentrated in the field of the antenna near-field coupling test assembly. Fig. 7 is a thermodynamic diagram of electric field intensity at 10mm above an antenna near field coupling test assembly according to an embodiment of the present application, and as can be seen from fig. 7, the distribution of electric field above the antenna near field coupling test assembly is relatively uniform.
It should be noted that, because the leaky wave only occupies a small part of the electromagnetic wave, most of the energy is absorbed by the load resistor, the radiation capability of the antenna near-field coupling test component is very weak, the far-field gain is very low, and the capability of receiving the external far-field interference signal is very weak, thus having good anti-interference performance. FIG. 8 is a plane E-plane direction diagram of an antenna near-field coupling test assembly according to an embodiment of the present application, and as can be seen from FIG. 8, the maximum gain at 2.45GHz is-9.6 dBi, and the maximum gain at 5.5GHz is-4.6 dBi
Fig. 9 is a schematic diagram illustrating coupling test of an antenna near field coupling test assembly according to an embodiment of the present application, and it can be seen from fig. 9 that a dipole antenna 300 operating at 2.45GHz is disposed above the antenna near field coupling test assembly, wherein the dipole antenna 300 includes a first metal arm 301, a second metal arm 302, a dielectric plate 303, and a feeding point 304, and test stability is described by simulating test position variation on test by simulating isolation fluctuation of 2.45GHz by moving the dipole antenna 300 in a X, Y direction or rotating the dipole antenna 300. The test results are shown in the following table 1, and isolation fluctuation is smaller than 0.2dB under the conditions of 2mm translation and 5 DEG rotation, so that the test stability of the antenna near-field coupling test assembly is good.
| Position fluctuation | Move 2mm in X direction | Move 2mm in Y direction | Rotated by 5 ° |
| Isolation fluctuation (dB) | 0.10 | 0.03 | 0.17 |
TABLE 1
In addition, the utility model also provides an antenna performance testing device, wherein the antenna performance testing device comprises the antenna near-field coupling testing component, and besides the antenna performance testing device can also comprise a testing component or a testing device for testing other performances of an antenna, such as a network analyzer, a spectrum analyzer and the like.
The above description is illustrative of the various embodiments of the application and is not intended to be limiting, but is intended to cover all modifications, equivalents, and alternatives falling within the spirit and principles of the application.
Claims (10)
1. An antenna near field coupling test assembly, comprising:
The circuit comprises a first circuit board, a second circuit board and an electric connection structure, wherein the second circuit board is arranged below the first circuit board at intervals, and the first circuit board is electrically connected with the second circuit board through the electric connection structure;
the first circuit board comprises a first dielectric plate, a first metal ground, a second metal ground, a matching load and a feed structure, wherein the first metal ground is arranged on the lower surface of the first dielectric plate, a coplanar waveguide wire is arranged in the first metal ground, the second metal ground is arranged on the upper surface of the first dielectric plate, the first metal ground is electrically connected with the second metal, the matching load is respectively connected with the first dielectric plate and the coplanar waveguide wire, and the feed structure is respectively connected with the first dielectric plate and the coplanar waveguide wire;
The second circuit board comprises a second dielectric plate and a third metal ground arranged above the second dielectric plate.
2. The antenna near field coupling test assembly of claim 1, wherein the profile of the beginning end and the profile of the ending end of the coplanar waveguide line are both tapered profiles that taper in a direction away from the coplanar waveguide line.
3. The antenna near field coupling test assembly of claim 2, wherein the tapered profile tapers along a straight line or an arc.
4. The antenna near field coupling test assembly of claim 1, wherein one end of the first dielectric plate forms a notch, the feed structure being located in the notch.
5. The antenna near field coupling test assembly of any one of claims 1 to 4, wherein the first circuit board and the second circuit board are further mechanically connected by the electrical connection structure.
6. The antenna near field coupling test assembly of claim 5, wherein the electrical connection structure is a metal post assembly, and two ends of the metal post assembly are respectively connected to the first circuit board and the second circuit board.
7. The antenna near field coupling test assembly of claim 6, wherein the metal post assembly comprises a stud, a first screw and a second screw, the stud being located between the first dielectric plate and the second circuit plate, the first screw being threaded down through the first circuit plate from an upper side of the first circuit plate to the stud, the second screw being threaded up through the second circuit plate from a lower side of the second circuit plate to the stud.
8. The antenna near field coupling test assembly of claim 6, wherein the electrical connection structure and the third metal ground enclose an equivalent metal back cavity structure, and the first circuit board is located above the equivalent metal back cavity structure and connected with a side wall of the equivalent metal back cavity structure.
9. The antenna near field coupling test assembly of any one of claims 1 to 4, wherein the feed structure is an MCX patch bezel, an outer surface of the MCX patch bezel is soldered to the first dielectric plate, and an inner conductor pin of the MCX patch bezel is soldered to the coplanar waveguide line.
10. An antenna performance testing apparatus, characterized in that it comprises an antenna near field coupling testing component according to any of claims 1 to 9.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322708155.8U CN221103353U (en) | 2023-10-10 | 2023-10-10 | Antenna near field coupling test assembly and antenna performance test equipment |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322708155.8U CN221103353U (en) | 2023-10-10 | 2023-10-10 | Antenna near field coupling test assembly and antenna performance test equipment |
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| Publication Number | Publication Date |
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| CN221103353U true CN221103353U (en) | 2024-06-07 |
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| CN202322708155.8U Active CN221103353U (en) | 2023-10-10 | 2023-10-10 | Antenna near field coupling test assembly and antenna performance test equipment |
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| CN (1) | CN221103353U (en) |
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