CN221038654U - Multifunctional detection equipment for semiconductor - Google Patents

Multifunctional detection equipment for semiconductor Download PDF

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Publication number
CN221038654U
CN221038654U CN202322384307.3U CN202322384307U CN221038654U CN 221038654 U CN221038654 U CN 221038654U CN 202322384307 U CN202322384307 U CN 202322384307U CN 221038654 U CN221038654 U CN 221038654U
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plate
fixedly connected
sliding
semiconductor
observation
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CN202322384307.3U
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Chinese (zh)
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罗长春
王嘉辉
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Sinoidea Engineering & Consulting Co ltd
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Sinoidea Engineering & Consulting Co ltd
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Abstract

The utility model discloses multifunctional detection equipment for semiconductors, which relates to the technical field of semiconductor detection equipment and comprises a detection support, wherein an optical detector is fixedly connected to the top end of the inner side of the detection support, an observation plate is fixedly connected to the bottom end of the inner side of the detection support, a fixing structure is fixedly connected to the top of the observation plate, a backlight plate is arranged in the middle of the observation plate, and the fixing structure comprises a fixing clamping plate. When the semiconductor with different sizes is fixed, the pushing plate slides, so that the pushing block can compress the semiconductor, and simultaneously the pushing block can shrink towards the inside of the pushing plate and squeeze the pushing spring, so that the sliding column can slide in the sliding plate side sliding groove, the sliding plate can be driven to slide, the squeezing plate can be driven to compress two sides of the semiconductor, the fixing effect of the semiconductor is improved, the semiconductor with different sizes is conveniently fixed, and the use of equipment is facilitated.

Description

Multifunctional detection equipment for semiconductor
Technical Field
The utility model relates to the technical field of semiconductor detection equipment, in particular to multifunctional detection equipment for a semiconductor.
Background
The semiconductor refers to a material with conductivity between a conductor and an insulator at normal temperature, and has application in the fields of integrated circuits, consumer electronics, communication systems, photovoltaic power generation, illumination, high-power conversion and the like, for example, a diode is a device manufactured by adopting a semiconductor, the importance of the semiconductor is very great from the aspects of science and technology or economic development, and most of electronic products, such as a core unit in a computer, a mobile phone or a digital recorder, are very closely related with the semiconductor, and the semiconductor needs to be optically detected by using detection equipment in the production process to check whether the semiconductor is qualified or not.
According to patent publication number CN 217521044U: the utility model discloses a semiconductor optical detection device, which relates to the technical field of semiconductor detection devices and comprises a supporting seat, wherein one end of the supporting seat is fixedly provided with a detection device, the upper surface of the supporting seat is fixedly provided with a supporting plate, the upper surface of the supporting plate is slidably provided with an observation plate, one end of the upper surface of the observation plate is rotatably provided with a squeezing plate, one end of the upper surface of the observation plate, which is far away from the squeezing plate, is slidably provided with a guide plate, one end of the guide plate is provided with a threaded rod capable of controlling the sliding of the guide plate, the bottom of the observation plate is fixedly provided with a sliding block, the upper surface of the supporting plate is provided with a sliding groove matched with the sliding block, the upper surface of the supporting plate is provided with a positioning mark beside the sliding groove, and the guide plate is extruded by rotating the threaded rod, so that the squeezing plate can fix semiconductors with different sizes, and the semiconductors cannot shake in the process of position calibration of the detection, and the speed of the semiconductors is improved.
The above-mentioned patent can be through the lifting to the stripper plate, fix the semiconductor of equidimension not, but all can hug closely with the observation board to the semiconductor of equidimension not to make the lifting to the stripper plate unable play the effect, the aforesaid patent lacks light filling device simultaneously, and the semiconductor product carries out the light filling in the detection process of being inconvenient for, is inconvenient for detecting the light transmissivity of semiconductor product.
Disclosure of utility model
The present utility model provides a multifunctional inspection apparatus for semiconductors, which solves the problems set forth in the background art.
In order to solve the technical problems, the utility model adopts the following technical scheme:
The utility model provides a semiconductor is with multi-functional check out test set, includes the detection support, the inboard top fixedly connected with optical detector of detection support, the inboard bottom fixedly connected with observation board of detection support, the top fixedly connected with fixed knot of observation board constructs, the middle part of observation board is provided with the back light plate, fixed knot constructs including fixed cardboard.
The fixed cardboard includes the fly leaf, fly leaf sliding connection is at the top of fly leaf, the inside right side sliding connection of fly leaf has the kicking block, the inside left end fixedly connected with top tight spring of kicking block, the both ends fixedly connected with slip post of kicking block, the side sliding connection of slip post has the fly leaf, fly leaf swing joint is in the inside of fly leaf, the side fixedly connected with stripper plate of fly leaf.
The technical scheme of the utility model is further improved as follows: the fixed knot constructs including the connecting plate, connecting plate fixed connection is at the top of observing the board, the side swing joint of connecting plate has driving handle, driving handle's one end fixedly connected with bevel gear one, bevel gear one swing joint is in the inside of connecting plate, the side meshing of bevel gear one is connected with bevel gear two.
By adopting the technical scheme, the connecting plate, the driving handle, the first bevel gear and the second bevel gear in the scheme are matched with each other, so that the sliding of the fixed clamping plate can be controlled.
The technical scheme of the utility model is further improved as follows: the side fixedly connected with threaded rod of bevel gear II, the side threaded connection of threaded rod has the screw thread slider, the side swing joint of screw thread slider has the telescopic link, the one end sliding connection of telescopic link has the carriage, carriage fixed connection is in the side of fixed cardboard.
By adopting the technical scheme, the threaded rod, the threaded sliding block, the telescopic rod and the sliding frame in the scheme are matched with each other, and the fixed clamping plate can be pushed to slide through the telescopic rod.
The technical scheme of the utility model is further improved as follows: the backlight plate comprises a connecting frame, the connecting frame is slidably connected to the middle of the observation plate, and the middle of the connecting frame is fixedly connected with a backlight module.
By adopting the technical scheme, the connecting frame and the backlight module in the scheme are matched with each other, so that light supplementing can be carried out on the detection of the semiconductor, and the detection effect is improved.
The technical scheme of the utility model is further improved as follows: the inside sliding connection of connecting frame has fixed fixture block, the one end of fixed fixture block extends to the inside of observing the board, the other end fixedly connected with fixed spring of fixed fixture block, the inside sliding connection of connecting frame has the slip guide arm, the side fixedly connected with push away the piece to one side of slip guide arm, the side of push away the piece to one side setting at fixed fixture block to one side.
By adopting the technical scheme, the fixing clamping block, the fixing spring, the sliding guide rod and the inclined pushing block in the scheme are matched with each other, so that the installation and fixation of the backlight plate can be controlled.
The technical scheme of the utility model is further improved as follows: the bottom of connecting frame is provided with the ejector plate, ejector plate swing joint is in the inside of observation board, the inboard fixedly connected with ejection spring of ejector plate.
By adopting the technical scheme, the ejector plate and the ejector spring in the scheme are matched with each other, so that the backlight plate can be conveniently ejected.
By adopting the technical scheme, compared with the prior art, the utility model has the following technical progress:
1. The utility model provides a multifunctional detection device for semiconductors, which is characterized in that when semiconductors with different sizes are fixed through mutual matching among a pushing plate, a pushing block, a pushing spring, a sliding column, a sliding plate and an extruding plate, the pushing block can be enabled to compress the semiconductors, and meanwhile, the pushing block can be enabled to shrink towards the inside of the pushing plate and compress the pushing spring, so that the sliding column can slide in a sliding groove on the side face of the sliding plate, the sliding plate can be driven to slide, the extruding plate can be driven to compress two sides of the semiconductors, the fixing effect of the semiconductors is improved, the semiconductors with different sizes are conveniently fixed, and the device is convenient to use.
2. The utility model provides a multifunctional detection device for a semiconductor, which is characterized in that a connecting frame, a backlight module, a fixed clamping block, a fixed spring, a sliding guide rod, an inclined pushing block, an ejector plate and an ejector spring are matched with each other, when the semiconductor is detected, the connecting frame is slid into the middle part of an observation plate, the fixed clamping block can be tightly pushed by the fixed spring, so that the fixed clamping block is clamped into the observation plate, the backlight module is conveniently fixed, the light supplementing can be carried out on the detection of the semiconductor by the backlight module, the detection effect is improved, and the use of the detection device is more convenient.
Drawings
FIG. 1 is a schematic diagram of the structure of the present utility model;
FIG. 2 is a schematic cross-sectional view of a fixing structure according to the present utility model;
FIG. 3 is a schematic cross-sectional view of the fixing clip of the present utility model;
fig. 4 is a schematic cross-sectional view of a backlight unit according to the present utility model.
In the figure: 1. detecting a bracket; 2. an optical detector; 3. an observation plate; 4. a fixed structure; 41. a connecting plate; 42. a fixed clamping plate; 421. a pushing plate; 422. a top block; 423. a spring is tightly propped; 424. a sliding column; 425. a sliding plate; 426. an extrusion plate; 43. a drive handle; 44. bevel gears I; 45. bevel gears II; 46. a threaded rod; 47. a thread slider; 48. a telescopic rod; 49. a carriage; 5. a backlight plate; 51. a connection frame; 52. a backlight module; 53. fixing the clamping block; 54. a fixed spring; 55. a sliding guide rod; 56. an inclined pushing block; 57. an ejector plate; 58. and (5) ejecting a spring.
Detailed Description
The utility model is further illustrated by the following examples:
example 1
As shown in fig. 1-4, the utility model provides a multifunctional semiconductor detection device, which comprises a detection support 1, wherein the top end of the inner side of the detection support 1 is fixedly connected with an optical detector 2, the bottom end of the inner side of the detection support 1 is fixedly connected with an observation plate 3, the top of the observation plate 3 is fixedly connected with a fixing structure 4, the middle part of the observation plate 3 is provided with a backlight plate 5, the fixing structure 4 comprises a fixing clamping plate 42, the fixing structure 4 comprises a connecting plate 41, the connecting plate 41 is fixedly connected to the top of the observation plate 3, the side surface of the connecting plate 41 is movably connected with a driving handle 43, one end of the driving handle 43 is fixedly connected with a bevel gear one 44, the bevel gear one 44 is movably connected to the inside of the connecting plate 41, the side surface of the bevel gear one 44 is meshed with a bevel gear two 45, the side surface of the bevel gear two 45 is fixedly connected with a threaded rod 46, the side surface of the threaded rod 46 is in threaded connection with a threaded slider 47, the side surface of the threaded slider 47 is movably connected with a telescopic rod 48, one end of the telescopic rod 48 is slidably connected with a sliding frame 49, and the sliding frame 49 is fixedly connected to the side surface of the fixing clamping plate 42.
In this embodiment, when the semiconductor is fixed, the semiconductor is placed on the observation board 3, by rotating the driving handle 43, the first bevel gear 44 can be driven to rotate, the second bevel gear 45 can be driven to rotate, the threaded slider 47 can be driven to slide by the threaded rod 46, the telescopic rod 48 can be extended, and the fixing clamping board 42 can be pushed to slide under the limitation of the sliding frame 49, so that the semiconductor can be fixed in a top fastening manner.
Example 2
As shown in fig. 1-4, on the basis of embodiment 1, the present utility model provides a technical solution: preferably, the fixed clamping plate 42 comprises a pushing plate 421, the pushing plate 421 is slidably connected to the top of the observation plate 3, a top block 422 is slidably connected to the right side of the pushing plate 421, a top spring 423 is fixedly connected to the left end of the top block 422, sliding columns 424 are fixedly connected to the two ends of the top block 422, sliding plates 425 are slidably connected to the sides of the sliding columns 424, the sliding plates 425 are movably connected to the inside of the pushing plate 421, and extruding plates 426 are fixedly connected to the sides of the sliding plates 425.
In this embodiment, when fixing semiconductors with different sizes, the pushing plate 421 slides, so that the top block 422 compresses the semiconductors, and meanwhile, the top block 422 contracts towards the inside of the pushing plate 421 and presses the pushing spring 423, so that the sliding plate 425 can be driven to slide through the sliding column 424 sliding in the sliding groove on the side face of the sliding plate 425, and the pressing plate 426 can be driven to compress two sides of the semiconductors, thereby improving the fixing effect of the semiconductors, and facilitating the fixing of semiconductors with different sizes and the use of the detection device.
Example 3
As shown in fig. 1-4, on the basis of embodiment 1, the present utility model provides a technical solution: preferably, the backlight plate 5 comprises a connecting frame 51, the connecting frame 51 is slidably connected to the middle part of the observation plate 3, the middle part of the connecting frame 51 is fixedly connected with a backlight module 52, the inside of the connecting frame 51 is slidably connected with a fixing clamping block 53, one end of the fixing clamping block 53 extends to the inside of the observation plate 3, the other end of the fixing clamping block 53 is fixedly connected with a fixing spring 54, the inside of the connecting frame 51 is slidably connected with a sliding guide rod 55, the side surface of the sliding guide rod 55 is fixedly connected with an inclined pushing block 56, the inclined pushing block 56 is arranged on the side surface of the fixing clamping block 53, the bottom end of the connecting frame 51 is provided with an ejector plate 57, the ejector plate 57 is movably connected to the inside of the observation plate 3, and the inner side of the ejector plate 57 is fixedly connected with an ejector spring 58.
In this embodiment, when detecting the semiconductor, slide the connection frame 51 into the middle part of the observation board 3, can carry out the top to the fixed fixture block 53 through the fixed spring 54, thereby can make the fixed fixture block 53 card advance the inside of the observation board 3, the convenience is fixed to backlight unit 52, can carry out the light filling through the detection of backlight unit 52 to the semiconductor, the effect of detection has been improved, make the use of check out test set more convenient, when dismantling and changing backlight unit 52, through pressing down connection frame 51, thereby can make the slip guide arm 55 slide in the inside of connection frame 51, and can promote the withdrawal of fixed fixture block 53 through the oblique ejector pad 56, afterwards through under the top of ejecting spring 58, can make ejector pad 57 ejecting the backlight unit 52, make the use of backlight unit 5 more convenient.
The following specifically describes the operation principle of the multifunctional inspection apparatus for semiconductors.
As shown in fig. 1 to 4, when the semiconductor is detected, the connecting frame 51 is slid into the middle part of the observation plate 3, the fixing clamping block 53 can be pushed by the fixing spring 54 to be clamped into the observation plate 3, the backlight module 52 is convenient to fix, the semiconductor can be detected by the backlight module 52 to be supplemented with light, then the semiconductor is placed on the observation plate 3, the first bevel gear 44 can be driven by the driving handle 43 to rotate, the second bevel gear 45 can be driven by the driving handle 43 to slide, the fixing clamping plate 42 can be pushed by the telescopic rod 48 to tightly push the semiconductor, the top block 422 can be compressed to the inner part of the pushing plate 421, the sliding plate 425 can be driven by the sliding column 424 to slide, the two sides of the extruding plate 426 can be driven to be compressed, the fixing effect of the semiconductor is improved, and the semiconductor is detected by the optical detector 2.
The foregoing utility model has been generally described in great detail, but it will be apparent to those skilled in the art that modifications and improvements can be made thereto. Accordingly, it is intended to cover modifications or improvements within the spirit of the inventive concepts.

Claims (6)

1. The utility model provides a semiconductor is with multi-functional check out test set, includes detects support (1), the inboard top fixedly connected with optical detector (2) of detecting support (1), the inboard bottom fixedly connected with observation board (3), its characterized in that of detecting support (1): the top of the observation plate (3) is fixedly connected with a fixing structure (4), the middle part of the observation plate (3) is provided with a backlight plate (5), and the fixing structure (4) comprises a fixing clamping plate (42);
The fixed clamping plate (42) comprises a pushing plate (421), the pushing plate (421) is slidably connected to the top of the observation plate (3), a top block (422) is slidably connected to the right side of the pushing plate (421), a top tight spring (423) is fixedly connected to the left end of the top block (422), sliding columns (424) are fixedly connected to the two ends of the top block (422), sliding plates (425) are slidably connected to the side faces of the sliding columns (424), the sliding plates (425) are movably connected to the inside of the pushing plate (421), and extruding plates (426) are fixedly connected to the side faces of the sliding plates (425).
2. A multi-functional inspection apparatus for semiconductors as recited in claim 1, wherein: the fixing structure (4) comprises a connecting plate (41), the connecting plate (41) is fixedly connected to the top of the observation plate (3), a driving handle (43) is movably connected to the side face of the connecting plate (41), a first bevel gear (44) is fixedly connected to one end of the driving handle (43), the first bevel gear (44) is movably connected to the inside of the connecting plate (41), and a second bevel gear (45) is connected to the side face of the first bevel gear (44) in a meshed mode.
3. A multi-function inspection apparatus for semiconductors as set forth in claim 2, wherein: the side fixedly connected with threaded rod (46) of bevel gear two (45), the side threaded connection of threaded rod (46) has screw thread slider (47), the side swing joint of screw thread slider (47) has telescopic link (48), the one end sliding connection of telescopic link (48) has carriage (49), carriage (49) fixed connection is in the side of fixed cardboard (42).
4. A multi-functional inspection apparatus for semiconductors as recited in claim 1, wherein: the backlight plate (5) comprises a connecting frame (51), the connecting frame (51) is connected to the middle of the observation plate (3) in a sliding mode, and a backlight module (52) is fixedly connected to the middle of the connecting frame (51).
5. The multi-purpose inspection apparatus for semiconductors as set forth in claim 4, wherein: the inside sliding connection of connecting frame (51) has fixed fixture block (53), the one end of fixed fixture block (53) extends to the inside of observing board (3), the other end fixedly connected with fixed spring (54) of fixed fixture block (53), the inside sliding connection of connecting frame (51) has slip guide arm (55), the side fixedly connected with of slip guide arm (55) pushes away piece (56) to one side, push away piece (56) to one side of setting at fixed fixture block (53) to one side.
6. A multi-functional inspection apparatus for semiconductors as recited in claim 5, wherein: the bottom of connecting frame (51) is provided with liftout plate (57), liftout plate (57) swing joint is in the inside of observation board (3), liftout plate (57) inboard fixedly connected with ejection spring (58).
CN202322384307.3U 2023-09-04 2023-09-04 Multifunctional detection equipment for semiconductor Active CN221038654U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202322384307.3U CN221038654U (en) 2023-09-04 2023-09-04 Multifunctional detection equipment for semiconductor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202322384307.3U CN221038654U (en) 2023-09-04 2023-09-04 Multifunctional detection equipment for semiconductor

Publications (1)

Publication Number Publication Date
CN221038654U true CN221038654U (en) 2024-05-28

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN202322384307.3U Active CN221038654U (en) 2023-09-04 2023-09-04 Multifunctional detection equipment for semiconductor

Country Status (1)

Country Link
CN (1) CN221038654U (en)

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