CN221004417U - Horizontal XYZR-axis free-movement diffraction test integrated device - Google Patents
Horizontal XYZR-axis free-movement diffraction test integrated device Download PDFInfo
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- CN221004417U CN221004417U CN202322667347.9U CN202322667347U CN221004417U CN 221004417 U CN221004417 U CN 221004417U CN 202322667347 U CN202322667347 U CN 202322667347U CN 221004417 U CN221004417 U CN 221004417U
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- 238000012360 testing method Methods 0.000 title claims abstract description 53
- 230000003287 optical effect Effects 0.000 claims abstract description 32
- 230000000694 effects Effects 0.000 claims description 3
- 230000005540 biological transmission Effects 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
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- 230000003993 interaction Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
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Abstract
The utility model discloses a horizontal XYZR-axis free-movement diffraction test integrated device, which comprises a base, wherein a base column is arranged at the top of the base, a Z-axis adjusting component, an X-axis adjusting component, a Y-axis adjusting component, an R-axis adjusting component and an X-axis inclination angle adjusting component are respectively arranged on the base column, an objective table is movably arranged on the base column, an optical product test platform for placing an optical product is arranged on the objective table, and the optical product test platform is respectively adjusted to a required test position through the Z-axis adjusting component, the X-axis adjusting component, the Y-axis adjusting component, the R-axis adjusting component and the X-axis inclination angle adjusting component.
Description
Technical Field
The utility model relates to the technical field of optical product performance, in particular to a horizontal XYZR-axis free-movement diffraction test integrated device.
Background
The diffraction test platform is a weight index for detecting the performance of optical products with different densities and different sizes, is an indispensable performance and detection part in the field of the optical products with different densities and different sizes, and shows that whether the diffraction requirements provided by customers are met or not, the optical products with different densities and different sizes play a very important role in diffraction, transmission test and other purposes, but the conventional diffraction test platform device cannot flexibly move along any scale in the XYZR axial direction, the test accuracy is not high for a specific point, and the optical products with different densities, different sizes and different angles cannot be subjected to diffraction and transmission test in the effective range of the optical fiber, so that the conventional diffraction test platform has more auxiliary test pieces, large space occupation rate and inconvenience in carrying and placing.
Based on the above, the utility model designs a horizontal XYZR-axis free-moving diffraction test integrated device to solve the above problems.
Disclosure of utility model
The utility model aims to provide a horizontal XYZR-axis free-movement diffraction test integrated device so as to solve the technical problems.
In order to achieve the above purpose, the present utility model provides the following technical solutions: the utility model provides a level XYZR axle freely removes integrative device of diffraction test, includes the base, the base top is equipped with the base post, be equipped with Z axle adjusting part, X axle adjusting part, Y axle adjusting part, R axle adjusting part and X axle tilt angle adjusting part on the base post respectively, the activity is equipped with the objective table on the base post, be equipped with the optical product test platform that is used for placing optical product on the objective table, optical product test platform adjusts to required test position through Z axle adjusting part, X axle adjusting part, Y axle adjusting part, R axle adjusting part and X axle tilt angle adjusting part respectively.
Preferably, the objective table is L type setting, and Z axle adjusting part includes Z axle removal alignment jig, gear and rack, the rack is fixed in on the inner wall on the vertical limit of objective table, Z axle removal alignment jig slides from top to bottom and sets up on the base post, gear rotation set up in one side of Z axle removal alignment jig, and be connected with the rack meshing, be equipped with on the Z axle removal alignment jig with the fixed Z axle mounting of base post.
Preferably, the X-axis adjusting assembly comprises an X-axis sliding rail and an X-axis sliding plate, wherein the X-axis sliding rail is fixed at the top of the object stage, the X-axis sliding plate is arranged on the X-axis sliding rail in a sliding manner, and an X-axis fixing piece for fixing the X-axis sliding plate on the X-axis sliding rail is arranged on the X-axis sliding plate.
Preferably, the Y-axis adjusting assembly comprises a Y-axis sliding rail and a Y-axis sliding plate, wherein the Y-axis sliding rail is fixed at the top of the X-axis sliding plate, the Y-axis sliding plate is arranged on the Y-axis sliding rail in a sliding manner, and a Y-axis fixing piece for fixing the Y-axis sliding plate on the Y-axis sliding rail is arranged on the Y-axis sliding plate.
Preferably, the R-axis adjusting assembly comprises an R-axis dial fixed on the top of the Y-axis sliding plate and an X-axis inclination angle adjusting assembly rotatably arranged on the R-axis dial, and an R-axis fixing piece used for limiting the rotation of the X-axis inclination angle adjusting assembly is arranged on the R-axis dial.
Preferably, the X-axis inclination angle adjusting assembly comprises an X-axis angle dial rotatably arranged on the R-axis dial and an adjusting seat fixedly connected with the optical product testing platform, and an angle adjusting assembly for adjusting the X-axis inclination angle of the adjusting seat is arranged on the X-axis angle dial.
Preferably, the X-axis angle scale is provided with an arc dovetail groove, the bottom of the adjusting seat is provided with an arc rod which is in sliding fit with the arc dovetail groove, the angle adjusting assembly comprises worm gear teeth arranged at the bottom of the arc rod and a worm meshed with the worm gear teeth, and the worm is rotationally arranged on the X-axis angle scale.
Compared with the prior art, the utility model has the beneficial effects that:
The horizontal XYZR-axis free-movement diffraction test integrated device is simple in structure and convenient to use, can realize the free-movement function of X-axis, Y-axis, Z-axis and R-axis directions, is convenient to take, can detect the angle measurement performance of optical products with different densities and different sizes, reduces equipment investment, and improves the performance detection efficiency of the optical products.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the drawings that are needed for the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present utility model, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic view of the overall structure of the present embodiment;
FIG. 2 is an exploded view of the present embodiment highlighting the R-axis dial and the X-axis angular dial;
fig. 3 is an exploded schematic view of the broken line X-axis angle dial and the R-axis dial of the present embodiment.
In the drawings, the list of components represented by the various numbers is as follows:
1. A base; 2. a base column; 3. a Z-axis adjustment assembly; 31. an adjusting frame; 32. a gear; 33. a rack; 4. an X-axis adjusting assembly; 41. an X-axis sliding rail; 42. an X-axis sliding plate; 5. a Y-axis adjustment assembly; 51. a Y-axis sliding rail; 52. a Y-axis sliding plate; 6. an R-axis adjustment assembly; 61. an R-axis dial; 62. an X-axis angle adjustment assembly; 621. an X-axis angle dial; 622. worm gear teeth; 623. a worm; 8. an objective table; 9. a Z-axis bolt; 10. an X-axis sliding block; 11. an X-axis bolt; 12. a Y-axis slider; 13. a Y-axis bolt; 14. a rotating shaft; 15. an R-axis bolt; 16. an arc-shaped rod; 17. and (5) adjusting the seat.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
Referring to fig. 1-3, the present utility model provides a technical solution: the utility model provides a level XYZR axle freely removes diffraction test integrative device, including base 1, base 1 top is equipped with foundation column 2, is equipped with Z axle adjusting part 3 on the foundation column 2 respectively, X axle adjusting part 4, Y axle adjusting part 5, R axle adjusting part 6 and X axle tilt angle adjusting part, and the activity is equipped with objective table 8 on the foundation column 2, is equipped with the optical product test platform that is used for placing optical product on the objective table 8, and optical product test platform adjusts to required test position through Z axle adjusting part 3, X axle adjusting part 4, Y axle adjusting part 5, R axle adjusting part 6 and X axle tilt angle adjusting part respectively.
Specifically, objective table 8 is L type setting, Z axle adjusting part 3 includes Z axle removal alignment jig 31, gear 32 and rack 33, rack 33 is fixed in on the inner wall on the vertical limit of objective table 8, Z axle removal alignment jig 31 slides from top to bottom and sets up on base post 2, gear 32 rotates and sets up in one side of Z axle removal alignment jig 31, and be connected with rack 33 meshing, be equipped with on the Z axle removal alignment jig 31 and form fixed Z axle mounting with base post 2, Z axle removal alignment jig 31 one end is connected with gear 32, the other pot head is located on base post 2, Z axle mounting can use Z axle bolt 9, after Z axle removal alignment jig 31 height is adjusted through the cooperation of gear 32 and rack 33, lock on base post 2 through Z axle bolt 9 and fix.
Specifically, the X-axis adjusting assembly 4 includes an X-axis sliding rail 41 and an X-axis sliding plate 42, the X-axis sliding rail 41 is fixed on the top of the stage 8, the X-axis sliding plate 42 is slidably disposed on the X-axis sliding rail 41, an X-axis fixing member for fixing the X-axis sliding plate 42 on the X-axis sliding rail 41 is disposed on the X-axis sliding plate 42, an X-axis limiting groove is disposed at the bottom of the X-axis sliding rail 41, the X-axis fixing member includes an X-axis sliding block 10 and an X-axis bolt 11, the X-axis sliding block 10 is slidably disposed in the X-axis limiting groove, the X-axis bolt 11 is threadedly connected to the X-axis sliding plate 42, and the bottom end is rotatably connected to the X-axis sliding block 10, and the X-axis sliding block 10 can be driven to abut against the inner wall of the X-axis limiting groove by rotating the X-axis sliding block 11, thereby limiting the sliding of the X-axis sliding plate 42.
Specifically, the Y-axis adjusting assembly 5 includes a Y-axis sliding rail 51 and a Y-axis sliding plate 52, the Y-axis sliding rail 51 is fixed on the top of the X-axis sliding plate 42, the Y-axis sliding plate 52 is slidably disposed on the Y-axis sliding rail 51, a Y-axis fixing member for fixing the Y-axis sliding plate 52 on the Y-axis sliding rail 51 is disposed on the Y-axis sliding plate 52, a Y-axis limiting groove is disposed at the bottom of the Y-axis sliding rail 51, the Y-axis fixing member includes a Y-axis sliding block 12 and a Y-axis bolt 13, the Y-axis sliding block 12 is slidably disposed in the Y-axis limiting groove, the Y-axis bolt 13 is threadedly connected to the Y-axis sliding plate 52, and the bottom end is rotatably connected to the Y-axis sliding block 12, and the Y-axis sliding block 12 can be driven to abut against the inner wall of the Y-axis limiting groove by rotating the Y-axis sliding block 13, thereby limiting the sliding of the Y-axis sliding plate 52.
Specifically, the R-axis adjusting assembly 6 includes an R-axis dial 61 fixed on the top of the Y-axis sliding plate 52 and an X-axis tilt angle adjusting assembly rotatably disposed on the R-axis dial 61, an R-axis fixing member for restricting rotation of the X-axis tilt angle adjusting assembly is disposed on the R-axis dial 61, a rotating shaft 14 is fixed to the bottom end of the X-axis angle adjusting assembly 62, the rotating shaft 14 is rotatably disposed on the R-axis dial 61, the R-axis fixing member is an R-axis bolt 15, and the R-axis bolt 15 is screwed on the R-axis dial 61 and is used for abutting against the rotating shaft 14.
Specifically, the X-axis inclination angle adjusting assembly comprises an X-axis angle dial 621 rotatably arranged on the R-axis dial 61 and an adjusting seat 17 fixedly connected with the optical product testing platform, and the X-axis angle dial 621 is provided with an angle adjusting assembly for adjusting the X-axis angle of the adjusting seat 17.
Specifically, an arc dovetail groove is formed in the X-axis angle disk 621, an arc rod 16 which is in sliding fit with the arc dovetail groove is arranged at the bottom of the adjusting seat 17, the angle adjusting assembly comprises worm gear teeth 622 arranged at the bottom of the arc rod 16 and a worm 623 meshed with the worm gear teeth 622, the worm 623 is rotatably arranged on the X-axis angle disk 621, an optical product testing platform is slidably arranged on the X-axis angle disk 621 through the matching of the arc rod 16 and the arc dovetail groove without separation, and the optical product testing platform can be driven to slide on the X-axis angle disk 621 by rotating the worm 623.
One specific application embodiment of this embodiment is:
When the device is used, firstly, optical products with different regular square densities and different sizes are placed on an optical product testing platform, secondly, the optical products are tightly attached to a square column supported at the rear of the optical product testing platform, finally diffraction or transmission testing is carried out, in the testing process, due to the fact that the sizes of the optical products are different or the densities are different, diffraction angles required by the products and product testing areas are different, only the gear 32 is required to drive the rack 33 to move through rotating the gear 32, so that the objective table 8 is driven to lift any position along the Z axis, the R-axis dial 61 (with scales) is rotated to carry out angle adjustment, the X-axis sliding plate 42 is slid or slid at will along the X axis direction according to product diffraction testing requirements, the Y-axis sliding plate 52 is moved along the Y axis, meanwhile, a certain point is tested according to the optical product requirements, after the positions of the X axis, the Y axis and the R axis are all adjusted, the X-axis inclination angles of the optical product testing platform can be adjusted through rotating the worm 623, and the situation that testing efficiency of testing of some special products or other testing factors cannot be improved due to the fact that the special requirements are met is avoided through the adjustment of the mode.
Compared with the existing diffraction testing device, the diffraction testing device can conduct diffraction testing on optical products with different densities and different sizes according to requirements in any dimensions of a Z axis, an X axis, a Y axis and an R axis, is convenient and fast, improves working efficiency, and avoids excessive investment of parts and space occupation ratio.
In the description of the present utility model, it should be understood that the terms "coaxial," "bottom," "one end," "top," "middle," "another end," "upper," "one side," "top," "inner," "front," "center," "two ends," etc. indicate orientations or positional relationships based on the drawings, merely to facilitate description of the present utility model and simplify the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present utility model.
In the present utility model, unless explicitly specified and limited otherwise, the terms "mounted," "configured," "connected," "secured," "screwed," and the like are to be construed broadly and may be, for example, fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; either directly or indirectly through intermediaries, or in communication with each other or in interaction with each other, unless explicitly defined otherwise, the meaning of the terms described above in this application will be understood by those of ordinary skill in the art in view of the specific circumstances.
Although embodiments of the present utility model have been shown and described, it would be appreciated by those skilled in the art that changes may be made in these embodiments without departing from the principles and spirit of the utility model, the scope of which is defined in the claims and their equivalents.
Claims (7)
1. The utility model provides a horizontal XYZR axle free movement diffraction test integrative device, includes base (1), its characterized in that: the base (1) top is equipped with reference column (2), be equipped with Z axle adjusting part (3), X axle adjusting part (4), Y axle adjusting part (5), R axle adjusting part (6) and X axle tilt angle adjusting part on reference column (2) respectively, the activity is equipped with objective table (8) on reference column (2), be equipped with the optical product test platform that is used for placing optical product on objective table (8), optical product test platform adjusts to required test position through Z axle adjusting part (3), X axle adjusting part (4), Y axle adjusting part (5), R axle adjusting part (6) and X axle tilt angle adjusting part respectively.
2. A horizontal XYZR axis free-running diffraction testing integrated device as claimed in claim 1, wherein: the utility model discloses a Z axle adjusting device, including objective table (8), Z axle adjusting part (3) are including Z axle removal alignment jig (31), gear (32) and rack (33), rack (33) are fixed in on the inner wall on the vertical limit of objective table (8), Z axle removal alignment jig (31) slide from top to bottom and set up on foundation column (2), gear (32) rotate set up in one side of Z axle removal alignment jig (31) and with rack (33) meshing be connected, be equipped with on Z axle removal alignment jig (31) with foundation column (2) form fixed Z axle mounting.
3. A horizontal XYZR axis free-running diffraction testing integrated device as claimed in claim 1, wherein: the X-axis adjusting assembly (4) comprises an X-axis sliding rail (41) and an X-axis sliding plate (42), wherein the X-axis sliding rail (41) is fixed at the top of the objective table (8), the X-axis sliding plate (42) is arranged on the X-axis sliding rail (41) in a sliding mode, and an X-axis fixing piece used for fixing the X-axis sliding plate (42) on the X-axis sliding rail (41) is arranged on the X-axis sliding plate (42).
4. A horizontal XYZR axis free-running diffraction testing integrated device as claimed in claim 1, wherein: the Y-axis adjusting assembly (5) comprises a Y-axis sliding rail (51) and a Y-axis sliding plate (52), wherein the Y-axis sliding rail (51) is fixed at the top of the X-axis sliding plate (42), the Y-axis sliding plate (52) is arranged on the Y-axis sliding rail (51) in a sliding mode, and a Y-axis fixing piece used for fixing the Y-axis sliding plate (52) on the Y-axis sliding rail (51) is arranged on the Y-axis sliding plate (52).
5. A horizontal XYZR axis free-running diffraction testing integrated device as claimed in claim 1, wherein: the R-axis adjusting assembly (6) comprises an R-axis dial (61) fixed on the top of the Y-axis sliding plate (52) and an X-axis inclination angle adjusting assembly rotatably arranged on the R-axis dial (61), and an R-axis fixing piece used for limiting the rotation of the X-axis inclination angle adjusting assembly is arranged on the R-axis dial (61).
6. The integrated horizontal XYZR axis free-running diffraction testing device as set forth in claim 5, wherein: the X-axis inclination angle adjusting assembly comprises an X-axis angle dial (621) which is rotatably arranged on the R-axis dial (61) and an adjusting seat (17) which is fixedly connected with the optical product testing platform, and the X-axis angle dial (621) is provided with an angle adjusting assembly for adjusting the X-axis angle of the adjusting seat (17).
7. The integrated horizontal XYZR axis free-running diffraction testing device as defined in claim 6, wherein: the X-axis angle dial (621) is provided with an arc dovetail groove, the bottom of the adjusting seat (17) is provided with an arc rod (16) which is in sliding fit with the arc dovetail groove, the angle adjusting assembly comprises worm gear teeth (622) arranged at the bottom of the arc rod (16) and a worm (623) meshed with the worm gear teeth (622), and the worm (623) is rotatably arranged on the X-axis angle dial (621).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322667347.9U CN221004417U (en) | 2023-10-07 | 2023-10-07 | Horizontal XYZR-axis free-movement diffraction test integrated device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322667347.9U CN221004417U (en) | 2023-10-07 | 2023-10-07 | Horizontal XYZR-axis free-movement diffraction test integrated device |
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| CN221004417U true CN221004417U (en) | 2024-05-24 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202322667347.9U Active CN221004417U (en) | 2023-10-07 | 2023-10-07 | Horizontal XYZR-axis free-movement diffraction test integrated device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118654638A (en) * | 2024-08-13 | 2024-09-17 | 临沂市国土资源局测绘院 | Survey device is measured with ground slope in territory space planning |
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2023
- 2023-10-07 CN CN202322667347.9U patent/CN221004417U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118654638A (en) * | 2024-08-13 | 2024-09-17 | 临沂市国土资源局测绘院 | Survey device is measured with ground slope in territory space planning |
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