CN220963231U

CN220963231U - Sample holder of scanning electron microscope

Info

Publication number: CN220963231U
Application number: CN202322421871.8U
Authority: CN
Inventors: 张亮
Original assignee: Jiangsu Caisiyuan Technology Co ltd
Current assignee: Jiangsu Caisiyuan Technology Co ltd
Priority date: 2023-09-07
Filing date: 2023-09-07
Publication date: 2024-05-14
Anticipated expiration: 2033-09-07

Abstract

The utility model discloses a sample holder of a scanning electron microscope, which comprises a half cylinder and a brake box, wherein the outer walls of the two sides of the half cylinder are respectively provided with a protractor body, the surface of the protractor body is slidably provided with a base, one end of the surface of the half cylinder is provided with an angle conversion structure, the inside of the brake box is provided with a ratchet and pawl self-locking structure, and the inside of the base is provided with a manual clamping structure. According to the utility model, the manual clamping structure is arranged to clamp samples to be tested with different specifications and sizes, the manual clamping structure can be easily adjusted, the flexibility is higher, and the ratchet pawl self-locking structure is matched to enable the manual clamping structure to realize one-direction movement of an object when the manual clamping structure clamps the samples to be tested, so that displacement of the samples to be tested caused by inversion of the manual clamping structure is effectively prevented, in addition, the angle conversion structure is arranged to realize multi-angle adjustment, so that the observation of irregular or inclined-plane samples to be tested by workers is more convenient, and the observation result is more accurate.

Description

Sample holder of scanning electron microscope

Technical Field

The utility model relates to the technical field of sample holders, in particular to a sample holder of a scanning electron microscope.

Background

The main function of the sample holder of the scanning electron microscope is to place the sample to be observed and enable the sample to move so as to select the interested sample vision field, usually the sample holder moves in the horizontal direction, the observation angle needs to be continuously adjusted for irregular or inclined surface samples so as to achieve the best visual effect, the adjustment time in the observation process is longer, the working efficiency is influenced, and omission is easily caused by the problem of the visual angle, so that the sample holder capable of easily adjusting the angle is needed. The pretilt angle sample holder for a scanning electron microscope disclosed by the authority publication No. CN206947293U comprises a base and pretilt angle support columns, wherein the pretilt angles of the pretilt angle support columns are different, the corresponding angles are 15 degrees, 45 degrees and 60 degrees respectively, the pretilt angle support column matched with the pretilt angle support column is selected according to the tilt angle condition of a fracture, the cross section of a sample is adjusted to be in a horizontal state (vertical to an electron beam light source), double-sided conductive adhesive (such as carbon adhesive, copper adhesive and aluminum adhesive) is adhered on the slope surface of the support column, morphology observation, analysis and measurement are directly carried out, the pretilt angle stand column is added on the original sample holder, the large-angle inclination and repeated adjustment of the sample holder in the prior art are avoided when the fracture sample is observed until the cross section is vertical to the electron beam light source, the labor hour is saved, and the working efficiency is improved; the sample stage of the device is prevented from impacting the receiving probe when tilting at a large angle, so that the safe use of a scanning electron microscope is ensured, the service life of the device is prolonged, but the tilting angle options of the pretilt angle sample holder are few, the requirements of various tilting angles are difficult to meet, most of the pretilt angle sample holder can only fix materials with the same specification in the use process, the proper adjustment is difficult to be carried out according to actual conditions, and the application range is small.

Disclosure of utility model

The utility model aims to provide a sample holder of a scanning electron microscope, which solves the problems that the sample holder in the background technology has few inclinable angle options, is difficult to meet the requirements of various inclination angles, and can only fix materials with the same specification in the use process of the sample holder.

In order to achieve the above purpose, the present utility model provides the following technical solutions: the sample seat of the scanning electron microscope comprises a semi-cylinder, wherein angle gauge bodies are arranged on the outer walls of two sides of the semi-cylinder, sliding grooves are formed in the surfaces of the two angle gauge bodies, a base is slidably arranged on the surface of the angle gauge body, and a second baffle is arranged on the back surface of the base;

one end of the surface of the semi-cylinder is provided with an angle conversion structure, one end of the angle conversion structure is provided with a handle for driving the semi-cylinder to work, the outer wall of one side of the base is provided with a brake box, and the inside of the brake box is provided with a ratchet pawl self-locking structure;

The inside of base is provided with manual clamping structure, the pivot that drives manual clamping structure work is installed to the inside one end of base, the one end of pivot extends to the inside of brake housing and with ratchet pawl auto-lock structure interconnect.

Preferably, the angle conversion structure comprises a sector worm wheel fixed at one end of the surface of the semi-cylinder and two bearings fixedly arranged at the bottom end of the base, a worm is rotatably arranged between the two bearings, two ends of the worm penetrate through the outer parts of the two bearings, the worm is meshed with the sector worm wheel, and one end of the handle is fixedly connected with one end of the worm.

Preferably, the manual clamping structure comprises a gear arranged at one end of the surface of the rotating shaft, a rack meshed with the gear is slidably arranged at the top of the base, a connecting block is arranged at one side of the top end of the rack, and the top end of the connecting block penetrates out of the base and is provided with a first baffle.

Preferably, the ratchet pawl self-locking structure comprises a ratchet unit arranged at the top end of the rotating shaft and a pawl unit hinged on the inner wall of one side of the brake box, a spring for downwards tensioning the pawl unit is hinged on the inner wall of one side of the brake box, and the top end of the spring is hinged with the outer wall of one side of the pawl unit.

Preferably, an indication arrow is arranged on the vertical central line of the base surface.

Preferably, a rectangular hollow groove for the connecting block to slide and pass out is formed in the top end of the base.

Compared with the prior art, the utility model has the beneficial effects that: according to the sample seat of the scanning electron microscope, a sample to be detected is fixed on one side through a manual clamping structure, the sample to be detected is further fixed through a ratchet pawl self-locking structure arranged at the bottom end of the manual clamping structure, and then the angle conversion structure is driven by a handle to conduct angle adjustment; can carry out the centre gripping to the sample that awaits measuring of different specification sizes through setting up manual clamping structure, and can easily adjust, the flexibility ratio is higher, and cooperation ratchet pawl auto-lock structure makes manual clamping structure prevent the sample displacement that awaits measuring when the centre gripping awaits measuring the sample, realizes multi-angle adjustment through setting up angle conversion structure in addition, makes things convenient for the staff to observe irregular or the sample that awaits measuring that has the inclined plane more for the observation result is more accurate.

Drawings

FIG. 1 is a schematic side view of the present utility model;

FIG. 2 is a schematic top view of a semi-cylindrical body according to the present utility model;

FIG. 3 is a schematic top view of a base of the present utility model;

FIG. 4 is a schematic diagram of a front cross-sectional structure of a brake housing according to the present utility model;

Fig. 5 is a schematic diagram of a front view structure of the present utility model.

In the figure: 1. a semi-cylinder; 2. a protractor body; 3. a chute; 4. a base; 5. a sector worm wheel; 6. a bearing; 7. a worm; 8. a handle; 9. a first baffle; 901. a second baffle; 10. a brake box; 11. a rotating shaft; 12. a gear; 13. a rack; 14. a connecting block; 15. a ratchet monomer; 16. pawl monomer; 17. and (3) a spring.

Detailed Description

The technical solutions in the embodiments of the present utility model will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present utility model. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

Referring to fig. 1-5, an embodiment of the present utility model is provided: the sample seat of the scanning electron microscope comprises a semi-cylinder 1, wherein the outer walls of two sides of the semi-cylinder 1 are provided with protractors 2, the surfaces of the two protractors 2 are provided with sliding grooves 3, the surfaces of the protractors 2 are slidably provided with a base 4, the back of the base 4 is provided with a baffle II 901, the vertical central line of the surface of the base 4 is provided with an indication arrow, the top end of the base 4 is provided with a rectangular hollow groove for a connecting block 14 to slide and penetrate, and the angle of rotation can be more intuitively seen through the indication arrow for marking in the protractors 2;

The manual clamping structure is arranged in the base 4, the angle conversion structure is arranged at one end of the surface of the semi-cylinder 1, the handle 8 for driving the semi-cylinder 1 to work is arranged at one end of the angle conversion structure, the brake box 10 is arranged on the outer wall of one side of the base 4, the ratchet pawl self-locking structure is arranged in the brake box 10, the angle adjustment range can be enlarged through the angle conversion structure, the application range is wider, and in addition, the sample to be tested is more stable when the manual clamping structure clamps the sample to be tested through the ratchet pawl self-locking structure;

One end of the inside of the base 4 is provided with a rotating shaft 11 for driving the manual clamping structure to work, and one end of the rotating shaft 11 extends into the brake box 10 and is connected with the ratchet pawl self-locking structure, so that the manual clamping structure can be controlled by limiting the rotation of the rotating shaft 11;

The angle conversion structure comprises a sector worm wheel 5 fixed at one end of the surface of the semi-cylinder 1 and two bearings 6 fixedly arranged at the bottom end of the base 4, a worm 7 is rotatably arranged between the two bearings 6, two ends of the worm 7 penetrate through the outer parts of the two bearings 6, the worm 7 is meshed with the sector worm wheel 5, one end of a handle 8 is fixedly connected with one end of the worm 7, the worm 7 and the bearings 6 are driven to rotate simultaneously by rotating the handle 8, the worm 7 is meshed with the sector worm wheel 5, the sector worm wheel 5 is fixed on the semi-cylinder 1, and therefore the worm 7 is displaced along the radian of the sector worm wheel 5, and the base 4 is driven to move to finish angle adjustment;

The manual clamping structure comprises a gear 12 arranged at one end of the surface of a rotating shaft 11, a rack 13 which is meshed with the gear 12 is slidably arranged at the top of the base 4, a connecting block 14 is arranged at one side of the top end of the rack 13, the top end of the connecting block 14 penetrates out of the base 4 and is provided with a first baffle 9, when the first baffle 9 is manually pulled to move towards a second baffle 901, the gear 12 meshed with the rack 13 starts to rotate, and the distance between the first baffle 9 and the second baffle 901 is more conveniently adjusted through the mutual matching rotation of the gear 12 and the rack 13 so as to clamp samples to be tested with different specifications;

The ratchet pawl self-locking structure comprises a ratchet single body 15 arranged at the top end of a rotating shaft 11 and a pawl single body 16 hinged on the inner wall of one side of a brake box 10, a spring 17 used for downwards tensioning the pawl single body 16 is hinged on the inner wall of one side of the brake box 10, the top end of the spring 17 is hinged with the outer wall of one side of the pawl single body 16, the ratchet single body 15 is driven to rotate through the rotating shaft 11, the top end of the ratchet single body 15 can freely rotate when the ratchet single body 15 stops rotating, the ratchet single body 15 can not rotate due to the fact that the pawl single body 16 is blocked by the ratchet single body 16 due to the special shape of the ratchet single body 15, the contact between the ratchet single body 15 and the pawl single body 16 is ensured through the spring 17, so that a baffle I9 cannot be displaced due to angle adjustment after a sample to be detected is fixed, and after the observation work is finished, the baffle I9 can be restored by only opening the brake box 10 and lifting the pawl single body 16.

When the embodiment of the application is used, firstly, a worker needs to place a sample to be observed on the base 4, then pulls the manual clamping structure to fix the sample to be observed on one side of 902, the manual clamping structure is convenient for the worker to adjust the clamping width according to the actual size of the sample to be observed, so that the sample to be detected is more stable to fix, the manual clamping structure is in power connection with the ratchet pawl self-locking structure through the rotating shaft 11, the displacement of the sample to be detected can be effectively prevented when the base 4 is in angle adjustment, then the handle 8 is manually rotated, the angle conversion structure is driven to work through the handle 8, the base 4 is driven to slide along the radian of the protractor body 2 through the angle conversion structure, at the moment, the worker can adjust the angle according to the marked degree on the protractor body 2 and the indication arrow on the base 4, the angle adjustment from zero to one hundred eighty degrees is realized, the angle selection range is larger, and the observation effect is clearer.

Claims

1. A sample holder for a scanning electron microscope, characterized by: the angle gauge comprises a semi-cylinder body (1), wherein angle gauge bodies (2) are arranged on the outer walls of two sides of the semi-cylinder body (1), sliding grooves (3) are formed in the surfaces of the two angle gauge bodies (2), a base (4) is slidably arranged on the surface of the angle gauge body (2), and a second baffle (901) is arranged on the back surface of the base (4);

One end of the surface of the semi-cylinder (1) is provided with an angle conversion structure, one end of the angle conversion structure is provided with a handle (8) for driving the semi-cylinder to work, the outer wall of one side of the base (4) is provided with a brake box (10), and the inside of the brake box (10) is provided with a ratchet and pawl self-locking structure;

The inside of base (4) is provided with manual clamping structure, pivot (11) that drives manual clamping structure work are installed to the inside one end of base (4), the one end of pivot (11) extends to the inside of brake box (10) and with ratchet pawl auto-lock structure interconnect.

2. A sample holder for a scanning electron microscope as claimed in claim 1, wherein: the angle conversion structure comprises a sector worm wheel (5) fixed at one end of the surface of the semi-cylinder body (1) and two bearings (6) fixedly installed at the bottom end of the base (4), wherein a worm (7) is rotatably installed between the two bearings (6), two ends of the worm (7) penetrate through the outer parts of the two bearings (6), the worm (7) is meshed with the sector worm wheel (5), and one end of the handle (8) is fixedly connected with one end of the worm (7).

3. A sample holder for a scanning electron microscope as claimed in claim 1, wherein: the manual clamping structure comprises a gear (12) arranged at one end of the surface of a rotating shaft (11), a rack (13) meshed with the gear (12) is slidably arranged at the top of the base (4), a connecting block (14) is arranged on one side of the top end of the rack (13), and the top end of the connecting block (14) penetrates out of the base (4) and is provided with a first baffle (9).

4. A sample holder for a scanning electron microscope as claimed in claim 1, wherein: the ratchet pawl self-locking structure comprises a ratchet unit (15) arranged at the top end of a rotating shaft (11) and a pawl unit (16) hinged on the inner wall of one side of a brake box (10), a spring (17) used for downwards tensioning the pawl unit (16) is hinged on the inner wall of one side of the brake box (10), and the top end of the spring (17) is hinged with the outer wall of one side of the pawl unit (16).

5. A sample holder for a scanning electron microscope as claimed in claim 1, wherein: an indication arrow is arranged on the vertical central line of the surface of the base (4).

6. A sample holder for a scanning electron microscope as claimed in claim 1, wherein: the top of base (4) is provided with the rectangle hollow groove that supplies connecting block (14) to slide and wear out.