CN220932861U - Light path calibrating device and mass spectrometer - Google Patents

Abstract

The application relates to an optical path calibration device and a mass spectrometer, wherein the optical path calibration device comprises an upper end positioning piece, a lower end positioning piece and a calibration rope, an optical path system is arranged at the upper part of the mass spectrometer, the upper end positioning piece and a first through groove are arranged in the optical path system, the upper end positioning piece is communicated with the first through groove, a mass analyzer shell is arranged at the lower part of the mass spectrometer, the lower end positioning piece and a second through groove are arranged in the optical path system, the lower end positioning piece is communicated with the second through groove, the first through groove and the second through groove are concentrically arranged in the vertical direction, an optical path extracted by laser light scattering in the mass spectrometer and an optical path extracted by the optical path system are concentrically arranged, one end of the calibration rope penetrates through the first through groove to be connected with the upper end positioning piece, the other end penetrates through the second through groove to be connected with the lower end positioning piece, and the tensioned calibration rope is perpendicular to the bottom of the mass analyzer shell, so that the optical path keeps a mutually perpendicular relation relative to the bottom plate of the mass analyzer shell, and repeated calibration is not needed.

Description

Light path calibrating device and mass spectrometer

Technical Field

The present application relates to the field of optical path calibration technologies, and in particular, to an optical path calibration device and a mass spectrometer.

Background

In the application of SPAMS (single particle mass spectrometer), the optical path for laser light scattering extraction needs to be calibrated, in the related technology, a gravity plumb line is mostly adopted to simulate an 'ion beam' channel, and then the optical path is tuned and corrected by the light scattering signal of laser on a plumb line and a CCD camera system.

However, the correction method must perform absolute horizontal correction on the overall structure of the SPAMS instrument before operation, and then the plumb line is perpendicular to the plane of the bottom surface of the SPAMS instrument.

Disclosure of utility model

Based on the above, it is necessary to provide an optical path calibration device and a mass spectrometer, which solve the technical problems of complicated optical path calibration operation and repeated calibration in the SPAMS.

An embodiment of a first aspect of the present application proposes an optical path calibration device for calibrating an optical path extracted by laser light scattering between an optical path system and a mass analyzer housing in a SPAMS mass spectrometer, the optical path system being disposed at an upper portion of the mass analyzer housing, the optical path calibration device comprising:

The upper end positioning piece is arranged in the optical path system, a first through groove is formed in the middle of the optical path system, and the upper end positioning piece is communicated with the first through groove;

The lower end positioning piece is arranged in the mass analyzer shell, a second through groove is formed in the middle of the mass analyzer shell, the lower end positioning piece is communicated with the second through groove, and the first through groove and the second through groove are concentrically arranged along the vertical direction and concentrically arranged with a light path extracted by laser light scattering between a light path system in the SPAMS mass spectrometer and the mass analyzer shell;

And one end of the calibration rope penetrates through the first through groove to be connected with the upper end locating piece, the other end of the calibration rope penetrates through the second through groove to be connected with the lower end locating piece, and the calibration rope is in a tensioning state and is perpendicular to the bottom of the shell of the mass analyzer.

In one embodiment, the upper end positioning member includes a positioning column, and a mounting hole for inserting the calibration rope is formed in the positioning column along an axial direction, so that the calibration rope is connected with the positioning column.

In one embodiment, the upper end positioning member further comprises a limiting member, and the limiting member is sleeved on the positioning column, so that the positioning column locks the calibration rope.

In one embodiment, the side wall of the positioning column is provided with a positioning hole, the limiting piece is a locking stud, and the locking stud is matched with the positioning hole to be in threaded connection with the positioning column so as to prevent the calibration rope from falling out of the mounting hole.

In one embodiment, the lower end positioning member includes a plumb portion and a locking portion, one end of the plumb portion is connected with one end of the calibration rope away from the upper end positioning member, the plumb portion is detachably connected with the locking portion, and the calibration rope is in a tensioning state.

In one embodiment, a connecting hole is formed in one end of the plumb toward the upper end positioning piece, and the connecting hole is used for inserting the calibration rope so that the calibration rope is connected with the plumb.

In one embodiment, a stud is disposed at one end of the plumb portion facing away from the upper end positioning member, and the locking portion is provided with a mating thread, and the stud is in threaded connection with the mating thread, so that the alignment rope connects the upper end positioning member and the lower end positioning member in a centering manner.

In one embodiment, the calibration cord is provided as a rigid cord.

An embodiment of the second aspect of the present application proposes a mass spectrometer comprising an optical path system and a mass analyser housing, the optical path system being arranged at an upper part of the mass analyser housing and the optical path system being detachably connected to the mass analyser housing, the mass spectrometer further comprising an optical path calibration device as described above.

In one embodiment, a positioning step is arranged on one side, facing the mass analyzer shell, of the optical path system, a stepped hole matched with the positioning step is arranged on the mass analyzer shell, and the positioning step is matched with the stepped hole step, so that the optical path system and the mass analyzer shell are detachably connected.

The optical path calibration device is used for calibrating the optical path extracted by laser light scattering between the optical path system and the mass analyzer shell in the mass spectrometer, the optical path system is arranged at the upper part of the mass analyzer shell, the first through groove is arranged in the middle of the optical path system, the upper end positioning piece communicated with the first through groove is arranged in the optical path system, the second through groove is arranged in the mass analyzer shell, the lower end positioning piece communicated with the second through groove is arranged in the mass analyzer shell, the first through groove and the second through groove are oppositely arranged, the two ends of the calibration rope are respectively connected with the upper end positioning piece and the lower end positioning piece, so that the relative position of the calibration rope in the mass spectrometer is concentrically arranged with the optical path extracted by laser light scattering between the optical path system and the mass analyzer shell, and the mutual perpendicular relation between the calibration rope and the mass analyzer shell bottom plate in the mass analyzer shell is ensured, and therefore, the optical path extracted by laser light scattering between the optical path system and the mass analyzer shell can form relative to the mass analyzer shell bottom plate, and the whole calibration operation is simple without repeated calibration.

Drawings

FIG. 1 is a structural perspective view of a mass spectrometer of an embodiment;

FIG. 2 is a front view of the structure of a mass spectrometer of an embodiment;

FIG. 3 is a cross-sectional view taken along A-A of FIG. 2 of an embodiment;

Reference numerals: 100. a mass spectrometer; 110. an optical path system; 111. a first through groove; 112. a first positioning step; 120. a mass analyzer housing; 121. a second through groove; 200. an upper end positioning member; 300. a lower end positioning member; 310. a plumb; 311. a connection hole; 312. a stud; 320. a locking part; 400. and (5) calibrating the rope.

Detailed Description

In order that the above objects, features and advantages of the application will be readily understood, a more particular description of the application will be rendered by reference to the appended drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present application. The present application may be embodied in many other forms than described herein and similarly modified by those skilled in the art without departing from the spirit of the application, whereby the application is not limited to the specific embodiments disclosed below.

In the description of the present application, it should be understood that, if any, these terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., are used herein with respect to the orientation or positional relationship shown in the drawings, these terms refer to the orientation or positional relationship for convenience of description and simplicity of description only, and do not indicate or imply that the apparatus or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the application.

Furthermore, the terms "first," "second," and the like, if any, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present application, the terms "plurality" and "a plurality" if any, mean at least two, such as two, three, etc., unless specifically defined otherwise.

In the present application, unless explicitly stated and limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly. For example, the two parts can be fixedly connected, detachably connected or integrated; can be mechanically or electrically connected; either directly or indirectly, through intermediaries, or both, may be in communication with each other or in interaction with each other, unless expressly defined otherwise. The specific meaning of the above terms in the present application can be understood by those of ordinary skill in the art according to the specific circumstances.

In the present application, unless expressly stated or limited otherwise, the meaning of a first feature being "on" or "off" a second feature, and the like, is that the first and second features are either in direct contact or in indirect contact through an intervening medium. Moreover, a first feature being "above," "over" and "on" a second feature may be a first feature being directly above or obliquely above the second feature, or simply indicating that the first feature is level higher than the second feature. The first feature being "under", "below" and "beneath" the second feature may be the first feature being directly under or obliquely below the second feature, or simply indicating that the first feature is less level than the second feature.

It will be understood that if an element is referred to as being "fixed" or "disposed" on another element, it can be directly on the other element or intervening elements may also be present. If an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and the like as used herein, if any, are for descriptive purposes only and do not represent a unique embodiment.

Referring to fig. 1 to 3, an embodiment of the first aspect of the present application provides an optical path calibration device for calibrating an optical path extracted by laser light scattering between an optical path system 110 and a mass analyzer housing 120 in a SPAMS mass spectrometer 100, wherein the optical path system 110 is disposed at an upper portion of the mass analyzer housing 120, the optical path calibration device includes an upper end positioning member 200, a lower end positioning member 300 and a calibration rope 400, the upper end positioning member 200 is disposed in the optical path system 110, a first through slot 111 is disposed in a middle portion of the optical path system 110, and the upper end positioning member 200 is in communication with the first through slot 111. The lower end positioning piece 300 is arranged in the mass analyzer housing 120, a second through groove 121 is arranged in the middle of the mass analyzer housing 120, the lower end positioning piece 300 is communicated with the second through groove 121, and the first through groove 111 and the second through groove 121 are concentrically arranged along the vertical direction and concentrically arranged with a light path extracted by laser light scattering between the light path system 110 and the mass analyzer housing 120 in the SPAMS mass spectrometer 100. One end of the calibration rope 400 passes through the first through-slot 111 to be connected with the upper end positioner 200, the other end passes through the second through-slot 121 to be connected with the lower end positioner 300, and the calibration rope 400 is in a tensioned state and is perpendicular to the bottom of the mass analyzer housing 120.

The above-mentioned optical path calibration device is used for calibrating the optical path extracted by the scattering of laser light between the optical path system 110 and the mass analyzer housing 120 in the mass spectrometer 100, the optical path system 110 is arranged at the upper part of the mass analyzer housing 120 in the mass spectrometer 100, the first through groove 111 is arranged in the middle of the optical path system 110, the upper end positioning piece 200 communicated with the first through groove 111 is arranged in the optical path system 110, the second through groove 121 is arranged in the mass analyzer housing 120, the lower end positioning piece communicated with the second through groove 121 is arranged in the mass analyzer housing 120, the first through groove 111 and the second through groove 121 are oppositely arranged, the two ends of the calibration rope 400 are respectively connected with the upper end positioning piece 200 and the lower end positioning piece 300, so that the relative position of the calibration rope 400 in the mass spectrometer 100 and the optical path extracted by the scattering of laser light between the optical path system 110 and the mass analyzer housing 120 are concentrically arranged, and the mutual perpendicular relation between the calibration rope 400 and the bottom plate of the mass analyzer housing 120 in the mass spectrometer 100 is ensured, so that the whole optical path extracted by the optical path between the system 110 and the mass analyzer housing 120 is not required to be repeatedly calibrated.

Referring to fig. 3, in some embodiments, the upper end spacer 200 includes a spacer column provided with a mounting hole for inserting the alignment rope 400 in an axial direction so that the alignment rope 400 is connected with the spacer column.

Further, the positioning column is disposed at the top of the first through slot 111, one end of the positioning column is connected with the top of the first through slot 111, the other end deviating from the top is provided with a mounting hole along the axial direction, the upper end of the calibration rope 400 is connected with the positioning column by the mounting hole, and the lower end of the calibration rope extends into the second through slot 121 of the mass analyzer housing 120 at the lower part of the mass spectrometer 100 after passing through the first through slot 111.

In some embodiments, the upper end positioning member 200 further includes a limiting member, and the limiting member is sleeved on the positioning post, so that the positioning post locks the calibration rope 400.

Further, the positioning column outer side is provided with external threads, the limiting piece is arranged to be a sleeve cover which can be in threaded connection with the positioning column, the sleeve cover is provided with a butt joint hole corresponding to the mounting hole, when the sleeve cover is connected to the positioning column lower end, the calibration rope 400 can sequentially pass through the mounting hole and the butt joint hole and then penetrate out of the first through groove 111, and the connection stability between the calibration rope 400 and the upper end positioning piece 200 is improved through the sleeve cover.

In some embodiments, the sidewall of the positioning post is provided with a positioning hole, the limiting member is configured as a locking stud 312, and the locking stud 312 is in threaded connection with the positioning post in cooperation with the positioning hole, so as to prevent the calibration rope 400 from being pulled out of the mounting hole.

Further, when the limiting piece is set to be the locking stud 312, the locking stud 312 penetrates into the positioning hole and then is in threaded connection with the positioning hole, the calibration rope 400 arranged in the mounting hole is tightly propped up through the locking stud 312, the calibration rope 400 is prevented from being connected with the lower end positioning piece 300 to be stretched and aligned, and the calibration rope is pulled out of the mounting hole after being stretched, so that the stability of the calibration device is improved.

Referring to fig. 1 and 3, in some embodiments, the lower end positioning member 300 includes a plumb portion 310 and a locking portion 320, one end of the plumb portion 310 is connected to an end of the calibration rope 400 remote from the upper end positioning member 200, the plumb portion 310 is detachably connected to the locking portion 320, and the calibration rope is in a tensioned state.

Further, when other operations such as cleaning are performed on the optical path system 110 and the mass analyzer housing 120, the plumb portion 310 and the locking portion 320 are detachably connected, so that the calibration rope 400 does not interfere with other operations, thereby improving the applicability of the calibration device.

Referring to fig. 3, in some embodiments, an end of the plumb 310 toward the upper end positioning member 200 is provided with a coupling hole 311, and the coupling hole 311 is used to insert the calibration string 400 to couple the calibration string 400 with the plumb 310.

Further, when the device is calibrated, one end of the calibration rope 400 is connected with the positioning column of the upper end positioning piece 200, the other end of the calibration rope is provided with the plumb portion 310 with a certain weight, the calibration rope 400 can be connected with the plumb portion 310 by arranging the connecting hole 311, the plumb portion 310 is subjected to gravity factors to realize suspension action, and the subsequent centering connection with the lower mass analyzer housing 120 is facilitated.

Referring to fig. 3, in some embodiments, the plumb 310 is provided with a stud 312 at an end facing away from the upper positioner 200, and the lock 320 is provided with mating threads, with which the stud 312 is threadably connected, such that the alignment cord 400 centrally connects the upper positioner 200 with the lower positioner 300.

Further, during calibration, the device connects the calibration rope 400 with the upper end positioning member 200, the calibration rope 400 with the plumb portion 310 at the lower end sequentially passes through the first through groove 111 and the second through groove 121 under the gravity force, and hangs to the lower end positioning member 300, and the calibration rope 400 between the upper end positioning member 200 and the lower end positioning member 300 is in a tensioning state by the threaded connection of the stud 312 and the threads, that is, the calibration rope 400 is perpendicular to the bottom of the lower mass analyzer housing 120, and the upper end positioning member 200 and the lower end positioning member 300 are connected in a centering manner by the calibration rope 400, so that the calibration of the optical path extracted by the laser light scattering between the optical path system 110 and the mass analyzer housing 120 in the mass spectrometer 100 is realized.

In some embodiments, the calibration cord 400 is provided as a rigid cord.

Furthermore, the rigid rope can adopt a rope with higher hardness such as steel wires, so that the rigid rope can be prevented from being broken or generating larger expansion and contraction amount when being subjected to larger traction force in the calibration process, and the calibration accuracy is ensured.

Referring to fig. 1, an embodiment of the second aspect of the present application proposes a mass spectrometer 100, which includes an optical path system 110 and a mass analyzer housing 120, wherein the optical path system 110 is disposed on an upper portion of the mass analyzer housing 120, and the optical path system 110 is detachably connected to the mass analyzer housing 120, and the mass spectrometer 100 further includes the optical path calibration device described above.

Further, since the optical path system 110 and the mass analyzer housing 120 in the conventional mass spectrometer 100 in the prior art are integrally provided, cleaning is inconvenient, and the optical path system 110 and the mass analyzer housing 120 are detachably connected, so that the problem of cavity pollution is solved by integrally replacing the particle deposition area structure in the lower mass analyzer housing 120, or the cleaning of pollutants is facilitated on the bottom of the mass analyzer housing 120, and the accuracy of the analysis result of the mass spectrometer 100 is ensured.

In some embodiments, the side of the optical path system 110 facing the mass analyzer housing 120 is provided with a positioning step, and the mass analyzer housing 120 is provided with a stepped hole adapted to the positioning step, and the positioning step is matched with the stepped hole step, so that the optical path system 110 and the mass analyzer housing 120 are detachably connected.

Further, through the cooperation of location step and shoulder hole step to make light path system 110 and mass analyzer shell 120 can dismantle the connection, be convenient for follow-up clean work, simultaneously because the recess that forms in the shoulder hole is on a parallel with the horizontal plane with the contact surface of location step butt joint, promptly when location step and shoulder hole step cooperation back, light path system 110 can be for mass analyzer shell 120 parallel arrangement, cooperation light path calibrating device realizes follow-up calibration work.

The technical features of the above-described embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above-described embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.

The above examples illustrate only a few embodiments of the application, which are described in detail and are not to be construed as limiting the scope of the claims. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the application, which are all within the scope of the application. Accordingly, the scope of protection of the present application is to be determined by the appended claims.

Claims (10)

1. An optical path calibration device for calibrating an optical path extracted by laser light scattering between an optical path system (110) and a mass analyzer housing (120) in a SPAMS mass spectrometer (100), the optical path system (110) being disposed on an upper portion of the mass analyzer housing (120), the optical path calibration device comprising:

The upper end positioning piece (200) is arranged in the optical path system (110), a first through groove (111) is formed in the middle of the optical path system (110), and the upper end positioning piece (200) is communicated with the first through groove (111);

the lower end positioning piece (300), the lower end positioning piece (300) is arranged in the mass analyzer shell (120), a second through groove (121) is formed in the middle of the mass analyzer shell (120), the lower end positioning piece (300) is communicated with the second through groove (121), and the first through groove (111) and the second through groove (121) are concentrically arranged along the vertical direction and concentrically arranged with a light path extracted by laser light scattering between a light path system (110) and the mass analyzer shell (120) in the SPAMS mass spectrometer (100);

and one end of the calibration rope (400) penetrates through the first through groove (111) to be connected with the upper end positioning piece (200), the other end penetrates through the second through groove (121) to be connected with the lower end positioning piece (300), and the calibration rope (400) is in a tensioning state and is perpendicular to the bottom of the mass analyzer shell (120).

2. The optical path alignment device according to claim 1, wherein the upper end positioning member (200) includes a positioning column provided with a mounting hole for inserting the alignment rope (400) in an axial direction so that the alignment rope (400) is connected with the positioning column.

3. The optical path calibration device according to claim 2, wherein the upper end positioning member (200) further comprises a limiting member, and the limiting member is sleeved on the positioning post, so that the positioning post locks the calibration rope (400).

4. A light path alignment device according to claim 3, wherein the side wall of the positioning column is provided with a positioning hole, the limiting member is provided as a locking stud (312), and the locking stud (312) cooperates with the positioning hole to be in threaded connection with the positioning column so as to prevent the alignment rope (400) from falling out of the mounting hole.

5. The optical path calibration device according to claim 1, wherein the lower end positioning member (300) includes a plumb portion (310) and a locking portion (320), one end of the plumb portion (310) is connected to an end of the calibration rope (400) remote from the upper end positioning member (200), the plumb portion (310) is detachably connected to the locking portion (320), and the calibration rope is in a tensioned state.

6. The optical path alignment device according to claim 5, wherein an end of the plumb portion (310) facing the upper end positioning member (200) is provided with a connection hole (311), and the connection hole (311) is used for inserting the alignment rope (400) so that the alignment rope (400) is connected with the plumb portion (310).

7. The optical path alignment device according to claim 5, wherein an end of the plumb portion (310) facing away from the upper end positioning member (200) is provided with a stud (312), the locking portion (320) is provided with a mating thread, and the stud (312) is screwed with the mating thread, so that the alignment rope (400) centrally connects the upper end positioning member (200) with the lower end positioning member (300).

8. The light path calibration device according to claim 1, characterized in that the calibration string (400) is provided as a rigid string.

9. A mass spectrometer comprising an optical path system (110) and a mass analyser housing (120), characterized in that the optical path system (110) is arranged in an upper part of the mass analyser housing (120) and the optical path system (110) is detachably connected to the mass analyser housing (120), the mass spectrometer (100) further comprising an optical path calibration device according to any one of claims 1-8.

10. The mass spectrometer according to claim 9, wherein the side of the optical path system (110) facing the mass analyser housing (120) is provided with a positioning step, the mass analyser housing (120) is provided with a stepped hole adapted to the positioning step, and the positioning step cooperates with the stepped hole step to detachably connect the optical path system (110) and the mass analyser housing (120).