CN220913167U - Adjustable integrated circuit test fixture - Google Patents
Adjustable integrated circuit test fixture Download PDFInfo
- Publication number
- CN220913167U CN220913167U CN202322309065.1U CN202322309065U CN220913167U CN 220913167 U CN220913167 U CN 220913167U CN 202322309065 U CN202322309065 U CN 202322309065U CN 220913167 U CN220913167 U CN 220913167U
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- Prior art keywords
- integrated circuit
- double
- plate
- adjustable integrated
- test fixture
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- 238000012360 testing method Methods 0.000 title claims abstract description 33
- 230000000149 penetrating effect Effects 0.000 claims description 2
- 239000000463 material Substances 0.000 claims 1
- 230000001681 protective effect Effects 0.000 claims 1
- 230000000694 effects Effects 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 3
- 230000003139 buffering effect Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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Abstract
The utility model discloses an adjustable integrated circuit test fixture which comprises a test bench, double-ended screws, clamping plates, a driving assembly, sliding blocks and sliding cavities, wherein the sliding cavities are formed in the test bench, the double-ended screws are arranged in the sliding cavities, the driving assembly is arranged on the test bench, the driving end of the driving assembly is in threaded connection with the double-ended screws, two sliding blocks are arranged on the double-ended screws, and the clamping plates are arranged on the sliding blocks. According to the scheme, through the design of the electric push rod, the fixing plate and the buffer assembly, the downward movement of the pressing plate is realized, the integrated circuit board is compressed, due to the design of the springs, the buffer effect is achieved, the damage of the pressing plate to the integrated circuit board is avoided, the integrated circuit boards with different thicknesses can be held, meanwhile, through the design of the clamping plate and the driving assembly, the clamping plate moves oppositely, so that the adjustment is conducted according to the width of the integrated circuit board, the two sides of the integrated circuit board are abutted tightly, and the integrated circuit boards with different widths can be clamped.
Description
Technical Field
The utility model belongs to the field of integrated circuit testing, and particularly relates to an adjustable integrated circuit testing clamp.
Background
In the field of integrated circuit testing, a fixture is required to hold an integrated circuit board to be tested.
In the prior art: the clamp in the novel adjustable integrated circuit testing clamp is characterized in that the CN202022732858.0 is arranged in the clamping operation process, the distance between the two clamps cannot be controlled rapidly and accurately in a manual clamping mode, the integrated circuit board is pressed under the movable block to be pressed, a protection pad is arranged, and the integrated circuit board is easy to damage due to the pressing.
Therefore, there is a need for an adjustable integrated circuit test fixture that can precisely adjust the distance and that has buffering and protection functions during clamping.
Disclosure of Invention
In order to solve the technical defects in the prior art, the utility model provides an adjustable integrated circuit test fixture.
The technical solution for realizing the purpose of the utility model is as follows:
an adjustable integrated circuit test fixture comprises a test bench, a double-ended screw rod, a clamping plate, a driving assembly, a sliding block and a sliding cavity;
A sliding cavity is formed in the test board, and a double-head screw rod is arranged in the sliding cavity;
The test bench is provided with a driving assembly, and the driving end of the driving assembly is in threaded connection with the double-head screw rod;
two sliding blocks are arranged on the double-headed screw, and clamping plates are arranged on the sliding blocks.
Further, set up electric putter on the splint, electric putter's bottom links firmly the fixed plate, and the lower extreme of fixed plate sets up buffer unit.
Further, the buffer assembly comprises a spring, a pressing plate and a sliding rod;
Two sliding rods penetrate through the fixed plate, a pressing plate is arranged at the other end of the two sliding rods, and a spring is sleeved on the sliding rod between the fixed plate and the pressing plate.
Further, one end of the spring is fixedly connected with the lower end of the fixed plate, and the other end of the spring is fixedly connected with the upper end of the pressing plate.
Further, an anti-slip pad is arranged at the lower end of the pressing plate.
Further, the anti-skid pad is made of rubber.
Further, the driving assembly is a driving motor.
Further, the thread directions of the two ends of the double-end screw rod are opposite.
Further, the side wall of the clamping plate is provided with a protection pad.
Compared with the prior art, the utility model has the remarkable advantages that:
according to the utility model, through the design of the electric push rod, the fixed plate and the buffer component, the downward movement of the pressing plate is realized, the integrated circuit board is compressed, and due to the design of the springs, the buffer effect is realized, the damage of the pressing plate to the integrated circuit board is avoided, and the integrated circuit boards with different thicknesses can be held;
According to the utility model, through the design of the clamping plates and the driving assembly, the clamping plates move in opposite directions so as to adjust according to the width of the integrated circuit board, and the two sides of the integrated circuit board are abutted tightly, so that the integrated circuit boards with different widths can be clamped.
The utility model is described in further detail below with reference to the drawings and the detailed description.
Drawings
FIG. 1 is a schematic diagram of an adjustable integrated circuit test fixture according to the present utility model.
Fig. 2 is a schematic diagram of a specific structure at a in a schematic diagram of an adjustable integrated circuit test fixture according to the present utility model.
Detailed Description
It is easy to understand that various embodiments of the present utility model can be envisioned by those of ordinary skill in the art without altering the true spirit of the present utility model in light of the present teachings. Accordingly, the following detailed description and drawings are merely illustrative of the utility model and are not intended to be exhaustive or to limit or restrict the utility model. Rather, these embodiments are provided so that this disclosure will be thorough and complete by those skilled in the art. Preferred embodiments of the present utility model are described in detail below with reference to the attached drawing figures, which form a part of the present utility model and are used in conjunction with the embodiments of the present utility model to illustrate the innovative concepts of the present utility model.
In the description of the present utility model, it should be understood that the terms "upper," "lower," "front," "rear," "left," "right," "top," "bottom," "inner," "outer," and the like indicate or are based on the orientation or positional relationship shown in the drawings, merely to facilitate description of the present utility model and to simplify the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present utility model.
Examples
Referring to fig. 1 to 2, an adjustable integrated circuit testing fixture comprises a test bench 1, a double-ended screw 3, a clamping plate 5, a driving assembly, a sliding block 7 and a sliding cavity 8;
The test bench 1 is provided with a sliding cavity 8, a double-ended screw rod 3 is arranged in the sliding cavity 8, and threads at two ends of the double-ended screw rod 3 are oppositely arranged.
The test bench 1 is provided with a driving assembly, the driving end of the driving assembly is in threaded connection with the double-headed screw 3, and the driving motor 2 is coaxially fixed with the double-headed screw 3;
Two sliders 7 are connected to the double-end screw 3 through threads in a sliding manner, clamping plates 5 are arranged on the sliders 7, and protection pads are arranged on the side walls of the clamping plates 5 to avoid damage caused by abutting against the integrated circuit board.
Further, an electric push rod 6 is arranged on the clamping plate 5, a fixing plate 9 is fixedly connected to the bottom of the electric push rod 6, and a buffer assembly is arranged at the lower end of the fixing plate 9.
Further, the buffer assembly comprises a spring 10, a pressing plate 11 and a sliding rod 12;
two slide bars 12 are arranged on the fixed plate 9 in a penetrating mode, the section of each slide bar 12 is of a T-shaped structure, a pressing plate 11 is arranged at the other end of each slide bar 12, the pressing plate 11 can move on each slide bar 12, and a spring 10 is sleeved on each slide bar 12 between the fixed plate 9 and the pressing plate 11.
Further, one end of the spring 10 is fixedly connected with the lower end of the fixed plate 9, the other end of the spring is fixedly connected with the upper end of the pressing plate 11, and an anti-slip pad is arranged at the lower end of the pressing plate 11 and made of rubber.
Further, in this embodiment, the driving component is a driving motor 2.
When the integrated circuit board is used, the integrated circuit board is placed between the two clamping plates 5, the driving motor 2 is turned on, the driving motor 2 drives the double-headed screw 3 to rotate, the double-headed screw 3 rotates to enable the two sliding blocks 7 to move in opposite directions, and accordingly the two clamping plates 5 are driven to move in opposite directions, and adjustment is conducted according to the width of the integrated circuit board;
After the two sides of the integrated circuit board are propped tightly, the electric push rod 6 is pressed down, the integrated circuit board is compressed by the pressing plate 11, the spring 10 is designed to play a buffering role, the integrated circuit board is prevented from being damaged by the pressing plate 11, the circuit board is fixed, the integrated circuit boards with different lengths and thicknesses can be clamped, the integrated circuit is not damaged, and the adjusting precision is accurate.
The foregoing embodiments illustrate and describe the basic principles, principal features of the utility model. It will be understood by those skilled in the art that the present utility model is not limited to the embodiments described above, and that the above embodiments and descriptions are merely illustrative of the principles of the present utility model, and various changes and modifications may be made without departing from the spirit and scope of the utility model, which is defined in the appended claims.
Claims (8)
1. The adjustable integrated circuit testing clamp is characterized by comprising a test bench (1), a double-head screw (3), a clamping plate (5), a driving assembly, a sliding block (7) and a sliding cavity (8);
A sliding cavity (8) is formed in the test table (1), and a double-head screw rod (3) is arranged in the sliding cavity (8);
a driving assembly is arranged on the test bench (1), and the driving end of the driving assembly is in threaded connection with the double-head screw rod (3);
two sliding blocks (7) are arranged on the double-headed screw (3), and clamping plates (5) are arranged on the sliding blocks (7);
The clamping plate (5) is provided with an electric push rod (6), the bottom of the electric push rod (6) is fixedly connected with a fixing plate (9), and the lower end of the fixing plate (9) is provided with a buffer assembly.
2. The adjustable integrated circuit test fixture according to claim 1, wherein the buffer assembly comprises a spring (10), a pressure plate (11) and a slide bar (12);
Two slide bars (12) are arranged on the fixed plate (9) in a penetrating mode, a pressing plate (11) is arranged at the other end of each of the two slide bars (12), and a spring (10) is sleeved on each slide bar (12) between the fixed plate (9) and the pressing plate (11).
3. The adjustable integrated circuit testing fixture according to claim 2, wherein one end of the spring (10) is fixedly connected with the lower end of the fixing plate (9), and the other end is fixedly connected with the upper end of the pressing plate (11).
4. Adjustable integrated circuit test fixture according to claim 2, characterized in that the lower end of the pressure plate (11) is provided with a non-slip mat.
5. The adjustable integrated circuit test fixture of claim 4, wherein the non-slip mat is a rubber material.
6. The adjustable integrated circuit test fixture according to any one of claims 1-5, wherein the drive assembly is a drive motor (2).
7. The adjustable integrated circuit test fixture according to claim 1, wherein the thread directions of both ends of the double-ended screw (3) are opposite.
8. Adjustable integrated circuit test fixture according to claim 1, characterized in that the side walls of the clamping plate (5) are provided with protective pads.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322309065.1U CN220913167U (en) | 2023-08-28 | 2023-08-28 | Adjustable integrated circuit test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322309065.1U CN220913167U (en) | 2023-08-28 | 2023-08-28 | Adjustable integrated circuit test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220913167U true CN220913167U (en) | 2024-05-07 |
Family
ID=90911071
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202322309065.1U Active CN220913167U (en) | 2023-08-28 | 2023-08-28 | Adjustable integrated circuit test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220913167U (en) |
-
2023
- 2023-08-28 CN CN202322309065.1U patent/CN220913167U/en active Active
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