CN220709287U - Thermoelectric unit circulation aging tester - Google Patents
Thermoelectric unit circulation aging tester Download PDFInfo
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- CN220709287U CN220709287U CN202321067303.6U CN202321067303U CN220709287U CN 220709287 U CN220709287 U CN 220709287U CN 202321067303 U CN202321067303 U CN 202321067303U CN 220709287 U CN220709287 U CN 220709287U
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- thermoelectric unit
- direct current
- aging tester
- relay module
- thermoelectric
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- 230000032683 aging Effects 0.000 title claims abstract description 36
- 125000004122 cyclic group Chemical group 0.000 claims abstract description 12
- 239000004065 semiconductor Substances 0.000 claims description 29
- 238000004891 communication Methods 0.000 claims description 9
- 238000005057 refrigeration Methods 0.000 claims description 7
- 238000013500 data storage Methods 0.000 claims description 5
- 238000001816 cooling Methods 0.000 claims description 4
- 230000001105 regulatory effect Effects 0.000 claims description 2
- 238000001514 detection method Methods 0.000 abstract description 10
- 230000000694 effects Effects 0.000 abstract description 4
- 238000012360 testing method Methods 0.000 description 18
- 238000012545 processing Methods 0.000 description 4
- 230000001276 controlling effect Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 238000007792 addition Methods 0.000 description 1
- 238000007405 data analysis Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000011897 real-time detection Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model provides a cyclic aging tester for a thermoelectric unit, which solves the problems of aging detection and the like of the thermoelectric unit. The utility model has the advantages of good aging detection effect, stable structure and the like of the thermoelectric unit.
Description
Technical Field
The utility model belongs to the technical field of thermoelectric detection, and particularly relates to a thermoelectric unit circulation aging tester.
Background
Burn-in testing helps reduce the number of prematurely failed devices by placing the semiconductor component under certain high stress conditions to replicate an enhanced field environment. By this test mode, the manufacturer can identify and eliminate defective parts. In the test stage, the semiconductor element is fixed on the burn-in board and then placed in a burn-in system, such as an environmental chamber. In this laboratory, the part is pressure tested at or above normal operating conditions to phase out any components that failed prior to the rated life of the semiconductor. The thermoelectric unit consists of a semiconductor refrigerating sheet, a heat radiation fan, a heat radiation fin and a temperature guide module. The existing burn-in test scheme is generally only aimed at semiconductor devices and is mostly applied to power semiconductor devices, and the burn-in test scheme of thermoelectric semiconductor devices and complete thermoelectric units is not available, so that the burn-in situation of the thermoelectric units in practical application cannot be reflected.
In order to solve the defects existing in the prior art, long-term exploration is performed, and various solutions are proposed. For example, chinese patent literature discloses a burn-in test system [201010187295.X ], which includes a burn-in test box, a test module, a data processing module, and a system control module, where the test module is used to test functions and/or dc and/or ac parameters of a device to be tested; the data processing module is used for processing the test data obtained by the test module; the system control module is used for sending out various control signals so as to control the completion of the aging test; the burn-in test box is internally provided with at least one adapting plate for placing a device to be tested, and the at least one adapting plate, the test module, the data processing module and the system control module are connected through interfaces.
The scheme solves the problem of the aging test of the semiconductor device to a certain extent, but the scheme still has a plurality of defects, such as poor aging detection effect on the electrothermal semiconductor in the thermoelectric unit.
Disclosure of Invention
The utility model aims to solve the problems and provides a thermoelectric unit circulation aging tester which is reasonable in design and good in aging detection effect on an electrothermal semiconductor.
In order to achieve the above purpose, the present utility model adopts the following technical scheme: the utility model provides a thermoelectric unit circulation aging tester, includes the host computer, and the host computer passes through parallelly connected direct current stabilized power supply, direct current resistance appearance and alternating current resistance appearance and is connected with relay module, and relay module is connected with a plurality of thermoelectric units.
In the thermoelectric unit circulation aging tester, the upper computer is directly connected with the relay module by serial communication.
In the thermoelectric unit circulation aging tester, the upper computer is respectively connected with the direct-current stabilized power supply, the direct-current resistance meter and the alternating-current resistance meter through serial communication.
In the above thermoelectric unit cyclic aging tester, the thermoelectric unit includes a semiconductor cooling sheet and a blower fan opposite to the semiconductor cooling sheet.
In the thermoelectric unit circulation aging tester, the direct-current stabilized power supply supplies power to the semiconductor refrigerating sheet and the fan, and the direct-current stabilized power supply is connected with the relay module by adopting contacts.
In the thermoelectric unit cycle aging tester, the direct current resistance meter collects the resistance value of the on-chip thermistor of the semiconductor refrigeration piece in real time, and the direct current resistance meter is connected with the relay module by adopting a contact.
In the thermoelectric unit cycle aging tester, the alternating current resistor periodically collects the resistance value of the on-chip thermistor of the semiconductor refrigeration piece, and the alternating current resistor is connected with the relay module by adopting contacts.
In the thermoelectric unit cyclic aging tester, the relay module is connected with the thermoelectric unit by adopting contacts.
In the thermoelectric unit cyclic aging tester, the relay module is connected with the three thermoelectric units in parallel.
In the thermoelectric unit cycle aging tester, the host computer is internally provided with the main control module and the data storage module.
Compared with the prior art, the utility model has the advantages that: the direct current resistance meter and the alternating current resistance meter are adopted for monitoring the resistance change of the thermoelectric units, and the direct current resistance meter and the alternating current resistance meter are combined with a plurality of thermoelectric units to further improve the overall detection effect of the thermoelectric units; the relay module is connected with other components by adopting contacts, so that higher on-off sensitivity is obtained, and detection mode switching is realized in time; the data storage module arranged in the upper computer stores the detection data, so that the long-time aging data analysis requirement is met.
Drawings
FIG. 1 is a schematic diagram of the structure of the present utility model;
in the figure, a host computer 1, a direct-current stabilized power supply 2, a direct-current resistance meter 3, an alternating-current resistance meter 4, a relay module 5 and a thermoelectric unit 6.
Detailed Description
The utility model will be described in further detail with reference to the drawings and the detailed description.
As shown in fig. 1, the thermoelectric unit circulation aging tester comprises an upper computer 1, wherein the upper computer 1 is connected with a relay module 5 through a direct current stabilized power supply 2, a direct current resistance meter 3 and an alternating current resistance meter 4 which are connected in parallel, and the relay module 5 is connected with a plurality of thermoelectric units 6. The direct current stabilized power supply 2 supplies power to the thermoelectric unit 6 through the relay module 5, wherein the direct current resistance meter 3 and the alternating current resistance meter 4 respectively detect the resistance value of the thermoelectric unit 6, and the upper computer 1 analyzes the resistance value change to judge the aging state of the thermoelectric unit 6.
Specifically, the upper computer 1 is directly connected with the relay module 5 by adopting serial communication, specifically adopting RS232 serial communication, and the upper computer 1 is directly connected with the relay module 5 to control the on-off of the subsequent contacts.
In depth, the upper computer 1 is also connected with the direct current stabilized power supply 2, the direct current resistance meter 3 and the alternating current resistance meter 4 through serial communication respectively, and the resistance values detected by the direct current stabilized power supply 2 and the direct current resistance meter 3 are collected through serial communication.
Further, the thermoelectric unit 6 comprises a semiconductor refrigerating sheet and a fan opposite to the semiconductor refrigerating sheet, and besides the semiconductor refrigerating sheet and the fan, the thermoelectric unit 6 is also provided with a corresponding radiating fin and a corresponding temperature-conducting module, so that the normal heat exchange of the thermoelectric unit 6 is satisfied.
Further, the direct current stabilized power supply 2 supplies power to the semiconductor refrigerating sheet and the fan, and the direct current stabilized power supply 2 is connected with the relay module 5 by adopting contacts. The upper computer 1 controls the start and stop of the semiconductor refrigerating sheet and the fan by controlling the contact on-off of the direct-current stabilized power supply 2, and simultaneously, the upper computer 1 directly controls the output power of the direct-current stabilized power supply 2 by utilizing serial communication.
In addition, the direct current resistance meter 3 collects the resistance value of the chip thermistor of the semiconductor refrigeration chip in real time, and the direct current resistance meter 3 is connected with the relay module 5 by adopting a contact. The alternating current resistance meter 4 periodically collects the resistance value of the chip thermistor of the semiconductor refrigeration chip, and the alternating current resistance meter 4 is connected with the relay module 5 by adopting contacts. The resistance change amplitude of the on-chip thermistor of the semiconductor refrigeration chip is analyzed in a real-time detection and cycle detection mode, so that the aging degree of the on-chip thermistor in unit time is judged.
The relay module 5 is connected with the thermoelectric units 6 by adopting contacts, the thermoelectric units 6 are relatively independent, and the number of the thermoelectric units 6 is expanded according to actual needs, so that the detection precision and efficiency of the thermoelectric units 6 are further improved.
It is evident that the relay module 5 in the present application is connected in parallel with three thermoelectric units 6. The direct current resistor 3 and the alternating current resistor 4 collect the resistance value changes of the thermoelectric units 6, and transmit the collected resistance data to the upper computer 1.
Preferably, the host computer 1 is internally provided with a main control module and a data storage module. The upper computer 1 coordinates the resistors and the thermoelectric unit 6, and controls the contact operation of the relay module 5. And driving the output and state readback of the direct current stabilized power supply 2, judging the test data, and storing the test data into a data storage module for convenient calling.
In summary, the principle of this embodiment is as follows: the upper computer 1 is used for controlling the start and stop of contacts between the relay module 5 and the thermoelectric units 6, and the direct current resistance meter 3 and the alternating current resistance meter 4 are used for detecting the resistance value of the chip thermistor of the semiconductor refrigerating chip in the thermoelectric units 6, so that the aging degree of the thermoelectric units 6 is judged.
The specific embodiments described herein are offered by way of example only to illustrate the spirit of the utility model. Those skilled in the art may make various modifications or additions to the described embodiments or substitutions thereof without departing from the spirit of the utility model or exceeding the scope of the utility model as defined in the accompanying claims.
Although terms such as the host computer 1, the dc regulated power supply 2, the dc resistor meter 3, the ac resistor meter 4, the relay module 5, the thermoelectric unit 6, etc. are used more herein, the possibility of using other terms is not excluded. These terms are used merely for convenience in describing and explaining the nature of the utility model; they are to be interpreted as any additional limitation that is not inconsistent with the spirit of the present utility model.
Claims (10)
1. The utility model provides a thermoelectric unit circulation aging tester, includes host computer (1), its characterized in that, host computer (1) pass through parallelly connected direct current regulated power supply (2), direct current resistance appearance (3) and alternating current resistance appearance (4) and be connected with relay module (5), relay module (5) be connected with a plurality of thermoelectric units (6).
2. The thermoelectric unit cyclic aging tester according to claim 1, wherein the upper computer (1) is directly connected with the relay module (5) by serial communication.
3. The thermoelectric unit cyclic aging tester according to claim 1, wherein the upper computer (1) is connected with the direct current stabilized power supply (2), the direct current resistance meter (3) and the alternating current resistance meter (4) through serial communication respectively.
4. The thermoelectric unit cyclic aging tester according to claim 1, wherein the thermoelectric unit (6) comprises a semiconductor cooling sheet and a blower fan opposite to the semiconductor cooling sheet.
5. The thermoelectric unit cyclic aging tester according to claim 4, wherein the direct current stabilized power supply (2) supplies power to the semiconductor refrigerating sheet and the fan, and the direct current stabilized power supply (2) is connected with the relay module (5) by adopting contacts.
6. The thermoelectric unit circulation aging tester according to claim 4, wherein the direct current resistor (3) collects the resistance value of the on-chip thermistor of the semiconductor refrigeration sheet in real time, and the direct current resistor (3) is connected with the relay module (5) by adopting contacts.
7. The thermoelectric unit cyclic aging tester according to claim 4, wherein the alternating current resistor (4) periodically collects the resistance value of the on-chip thermistor of the semiconductor refrigeration sheet, and the alternating current resistor (4) is connected with the relay module (5) by adopting contacts.
8. The thermoelectric unit cyclic aging tester according to claim 1, wherein the relay module (5) is connected with the thermoelectric unit (6) by adopting contacts.
9. The thermoelectric unit cyclic aging tester according to claim 1, wherein the relay module (5) is connected in parallel with three thermoelectric units (6).
10. The thermoelectric unit cyclic aging tester according to claim 1, wherein the host computer (1) is internally provided with a main control module and a data storage module.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321067303.6U CN220709287U (en) | 2023-04-28 | 2023-04-28 | Thermoelectric unit circulation aging tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321067303.6U CN220709287U (en) | 2023-04-28 | 2023-04-28 | Thermoelectric unit circulation aging tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220709287U true CN220709287U (en) | 2024-04-02 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321067303.6U Active CN220709287U (en) | 2023-04-28 | 2023-04-28 | Thermoelectric unit circulation aging tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220709287U (en) |
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2023
- 2023-04-28 CN CN202321067303.6U patent/CN220709287U/en active Active
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