CN100383699C - Automatic testing system and method for CPU temperature - Google Patents
Automatic testing system and method for CPU temperature Download PDFInfo
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- CN100383699C CN100383699C CNB2003101176900A CN200310117690A CN100383699C CN 100383699 C CN100383699 C CN 100383699C CN B2003101176900 A CNB2003101176900 A CN B2003101176900A CN 200310117690 A CN200310117690 A CN 200310117690A CN 100383699 C CN100383699 C CN 100383699C
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Abstract
The present invention provides a system and a method for automatically testing the temperature of a central processing unit (CPU). The system comprises a central processing unit (CPU), a temperature sensing unit, a data processing unit, a data store unit, a temperature monitoring unit and a result outputting unit. The method for automatically testing the temperature of a central processing unit comprises the steps: the maximum working temperature and the temperature testing time of the central processing unit are set; then, the current working temperature test is executed by the central processing unit, and the current temperature is compared with the set maximum working temperature and the temperature testing time so as to sent out a corresponding control signal; finally, the test result is displayed to a tester, and the process is completed. The system and the method for automatically testing the temperature of a central processing unit of the present invention can automatically test and record the working temperature of the central processing unit, and the test result is displayed to a tester so as to be favorable to subsequent product development and quality improvement.
Description
[technical field]
The invention relates to a kind of test and recording method, particularly about a kind of system and method that can test and write down central processor temperature automatically.
[background technology]
Along with development of computer, the dominant frequency of core one central processing unit of the performance of computing machine, especially computing machine is greatly enhanced.But meanwhile, the raising of central processing unit dominant frequency causes its power consumption also significantly to increase, and when the dominant frequency of central processing unit reached 1GHz, it is very important that the heat dissipation problem of central processing unit just becomes.If the temperature of untimely reduction central processing unit just might cause the deadlock of computing machine, communicating interrupt, the vital document data that is therefore caused lost even incident such as indivedual hardware damage happens occasionally, and brings immeasurable loss to the user.
Based on above consideration, be necessary to make just strict its temperature characterisitic of control when dispatching from the factory at central processing unit, make it reach specified heatproof value, the QC quality control of each central processing unit manufacturer just observes the displays temperature of temperature indicator with eyes when carrying out temperature test at present, if reaching test request at the appointed time just checks and accepts by quality, but, the QC personnel might be because carelessness fails to observe the temperature displayed value, thereby cause defective products to pass through to check and accept, also might surpass the test duration and fail to stop test, cause good product damage, no matter which kind of situation all can cause unnecessary loss, therefore, need a kind of system and method that can test and write down central processor temperature automatically.
The China national Department of Intellectual Property patent application case that April 17, disclosed publication number was CN1345425A in 2002, its name is called " method and apparatus of monitoring temperature of processor ", this patent application case discloses a kind of monitoring method and equipment of temperature of processor, it adopts the temperature of a temperature sensing diode and an external control circuit measurements and calculations processor, and will measure temperature and compare with a maximum operating temperature, the central processing unit heat alarm is transmitted by control bus.But this patent application case does not solve how the temperature changing process of processor is made record, is not easy to follow-up product development and product quality and improves.
At the deficiency of above-mentioned patent, the present invention proposes a kind of central processor temperature Auto-Test System and method, and it can test and write down the working temperature of central processing unit automatically, is convenient to follow-up product development and quality improvement.
[summary of the invention]
Fundamental purpose of the present invention is to provide a kind of central processor temperature Auto-Test System and method, and it can test and write down the working temperature of central processing unit automatically, is convenient to follow-up product development and quality improvement.
The invention provides a kind of central processor temperature Auto-Test System, this system comprises a central processing unit, and this central processing unit is the processing core of computing machine, is used to receive control signal; One temperature sensing unit is used for perception and the current operating temperature of measuring central processing unit, and exports the current operating temperature of central processing unit to data processing unit; One data processing unit, be used to receive the central processing unit current operating temperature of temperature sensing unit output, and should export data storage cell after treatment to by current working temperature measured value, output unit and monitoring temperature unit as a result, simultaneously, this data processing unit also is responsible for calculating the central processing unit maximum operating temperature in this time temperature test process, minimum operating temperature and average working temperature, and with this maximum operating temperature, minimum operating temperature and the output of average working temperature, data processing unit is with all measured temperature additions in this time temperature test process, then with addition result divided by the temperature test real time, can draw the medial temperature of central processing unit in this time test process, the above-mentioned temperature test time is the temperature test time of the actual experience of data processing unit; One data storage cell is used for the thermograph that the record data processing unit is exported, and this thermograph is stored with a kind of data logging tableau format; One monitoring temperature unit, be used for the Current Temperatures of data processing unit output is monitored, and the maximum operating temperature that will this current temperature and one sets in advance compares, and send one according to comparative result and control signal to central processing unit and output unit as a result, the duty of control central processing unit guarantees that central processing unit is working properly; One output unit as a result is used to receive the output result of data processing unit and the control signal of displays temperature monitoring unit.
The present invention also provides a kind of central processor temperature automatic test method, and this method may further comprise the steps: the maximum operating temperature that central processing unit allows is set; The central processor temperature test duration is set; Test central processing unit current operating temperature produces a Current Temperatures record value; Storage central processing unit current operating temperature record value; The maximum operating temperature that compares central processing unit current operating temperature and above-mentioned setting, relatively whether this central processing unit current operating temperature surpasses this maximum operating temperature; If the central processing unit current operating temperature surpasses this maximum operating temperature, then send one and control signal to central processing unit, stop the central processing unit running, and test result is exported; If current operating temperature is lower than this maximum operating temperature, whether the continuation current test duration of inquiry reaches the temperature test time of setting; If the current test duration does not also reach the default temperature test time, then return and continue test central processing unit current operating temperature; If reach the temperature test time, then stop temperature test, maximum operating temperature in the analysis temperature test process, minimum operating temperature and average working temperature, and export above-mentioned maximum operating temperature, minimum operating temperature and average working temperature to output unit as a result, utilize the test result of red and green signals pilot lamp indication central processing unit simultaneously, red light represents that this central processing unit is a defective products, and green light represents that this central processing unit is good product, and flow process finishes.
By central processor temperature Auto-Test System provided by the invention and method, can realize the working temperature of test automatically and record central processing unit, and test result is shown to the tester, be convenient to subsequent product exploitation and quality improvement.
[description of drawings]
Fig. 1 is that central processor temperature Auto-Test System of the present invention is implemented environment map.
Fig. 2 is a central processor temperature Auto-Test System data processing unit functional block diagram of the present invention.
Fig. 3 is the data logging hoist pennants of central processor temperature Auto-Test System of the present invention.
Fig. 4 is the test and record process flow diagram of central processor temperature automatic test approach of the present invention.
[embodiment]
Consulting shown in Figure 1ly, is that central processor temperature Auto-Test System of the present invention is implemented environment map.Heavy line is represented control signal among the figure, the fine line designate data signal, and control signal is transmitted by control bus, and data-signal transmits by data bus.This central processor temperature is tested automatically and register system comprises a central processing unit 10, a temperature sensing unit 11, a data processing unit 13, a data storage cell 12, a monitoring temperature unit 14 and an output unit 15 as a result.Wherein monitoring temperature unit 14 receives data processing units 13 data signals transmitted, sends a control signal to central processing unit 10 and output unit 15 as a result after treatment.
Central processing unit 10 is processing cores of computer system, is used to receive control signal, and carries out corresponding operating according to this control signal, and for example, central processing unit 10 receives a stopping signal, then carries out the action of cutting off the electricity supply.
One temperature sensing unit 11 is used for perception and the current operating temperature of measuring central processing unit 10, and exports the current operating temperature of central processing unit 10 to data processing unit 13.Temperature sensing unit 11 utilizes a thermistor (Thermistor, not shown) perception and the current operating temperature of measuring central processing unit 10, this thermistor and the coupling of central processing unit 10 close thermal, to reach accurate perception and to measure central processing unit 10 current operating temperatures, and export central processing unit 10 current operating temperatures to data processing unit 13, above-mentioned thermistor is made by semiconductor, its resistance changes with ambient temperature, thereby can reflect the temperature variations of external object.
One data processing unit 13, be used to receive central processing unit 10 current operating temperatures of temperature sensing unit 11 outputs, and relatively these central processing unit 10 current operating temperatures and central processing unit 10 maximum operating temperatures that set in advance, compare 10 test duration of central processing unit length and the test duration that sets in advance simultaneously, this data processing unit 13 can be analyzed the maximum operating temperature in central processing unit 10 test processs, minimum operating temperature and average working temperature, and export these central processing unit 10 current operating temperatures to data storage cell 12 after treatment, output unit 15 and monitoring temperature unit 14 as a result.
One data storage cell 12, the Current Temperatures record that is used for the central processing unit 10 of record data processing unit 13 outputs, central processing unit 10 each Current Temperatures record values are constantly formed data form, this data form adopts a kind of fixed table form, this fixed table form can adopt the Structured Query Language (SQL) form (Structure Query Language, SQL), Oracle table format or known any table format.The test moment, Current Temperatures and the test duration (as shown in Figure 3) of these data form record central processing unit 10 working temperatures.
One monitoring temperature unit 14, be used for the Current Temperatures of the central processing unit 10 of data processing unit 13 output is monitored, it can receive the temperature comparative result of data processing unit 13, and send one according to this temperature comparative result and control signal to central processing unit 10 and output unit 15 as a result, the duty of control central processing unit 10, guarantee that central processing unit 10 is working properly, and will control the result and be shown to the tester; One output unit 15 as a result, be used to receive the output result of data processing unit 13 and the control signal of displays temperature monitoring unit 14, this as a result output unit 15 utilize the test result of red and green signals pilot lamp indication central processing unit 10, red light represents that this central processing unit 10 is defective products, and green light represents that this central processing unit 10 is good product.
Consulting shown in Figure 2ly, is the functional block diagram of central processor temperature Auto-Test System data processing unit of the present invention.This data processing unit 13 comprises: a temperature data memory module 21, each temperature data constantly that is used for the central processing unit 10 that will get access to is stored to data storage cell 12, and above-mentioned temperature data is formed data form and is stored in the data storage cell 12.One temperature data acquisition module 22 is used for obtaining the data form that is stored in data storage cell 12.One temperature is provided with module 23, is used to be provided with the maximum operating temperature of central processing unit, for example, the central processing unit maximum operating temperature is set can not surpasses 70 degree Celsius.One temperature comparison module 24, the maximum operating temperature that is used for comparison central processing unit current operating temperature and setting, if central processing unit 10 current operating temperatures surpass the maximum operating temperature that is provided with, then comparative result is sent to monitoring temperature unit 14, send a stopping signal by monitoring temperature unit 14, indication central processing unit 10 decommissions; If central processing unit 10 current operating temperatures are lower than default maximum operating temperature, then proceed temperature relatively, simultaneously, this temperature comparison module 24 also is responsible for calculating central processing unit maximum operating temperature and the minimum operating temperature in this time temperature test process, and with this maximum operating temperature and minimum operating temperature output.One test duration was provided with module 25, was used to be provided with the central processing unit test duration, and this is provided with and comprises that the test duration is provided with and test duration pattern setting altogether test duration, for example, was provided with altogether that the test duration is 30 minutes, and temperature survey was measured once every 5 minutes.One test duration comparison module 26, be used for the test duration whether more current test duration of having experienced reaches setting, if reach the test duration, then stop the temperature test of central processing unit 10, test result is exported, this test result comprises the maximum operating temperature in central processing unit 10 test processs, minimum operating temperature and average working temperature, this average working temperature is to be calculated by temperature comparison module 24 and test duration comparison module 26, temperature comparison module 24 is with all measured temperature additions in this time temperature test process, then with addition result divided by the temperature test real time, can draw the medial temperature of central processing unit 10 in this time test process, the above-mentioned temperature test real time is the temperature test time of test duration comparison module 26 records; If do not reach the test duration of setting, then continue to carry out temperature test.One output module 27 as a result, be used for exporting the temperature test result of central processing unit 10 to monitoring temperature unit 14, send control signal by monitoring temperature unit 14, shut down or work in order to indication central processing unit 10, whether output module 27 also outputs to test result output unit 15 as a result as a result simultaneously, be used to indicate the test of this central processing unit 10 of tester to pass through.
Consulting shown in Figure 3ly, is the data logging hoist pennants of central processor temperature Auto-Test System of the present invention.This data form is stored in the non-voltile memory, comprises test duration point 301, Current Temperatures 303 and test duration length 305.Test duration point 301, the temperature test moment that is used to write down central processing unit 10; Current Temperatures 303 is used to write down central processing unit 10 temperature at a time; Test duration length 305, the temperature test time that is used to write down the central processing unit 10 that has experienced.
Consulting shown in Figure 4ly, is the test flow chart of central processor temperature automatic test approach of the present invention.At first, temperature is provided with the maximum operating temperature (step S41) that module 23 is provided with central processing unit 10; Test duration is provided with the test duration setting (step S42) that module 25 is carried out central processing unit 10, this test duration is provided with and comprises that the test duration is provided with and test duration pattern setting altogether, for example, the test duration is set to 30 minutes, and the test duration pattern is set to test in per 5 minutes once; Then, by temperature sensing unit 11 perception with measure central processing unit 10 current operating temperatures, and export central processing unit 10 current operating temperature measured values to data processing unit 13 (step S43); Data storage cell 12 is stored to non-voltile memory (step S44) with central processing unit 10 current operating temperature measured values; After data processing unit 13 receives the Temperature Datum of temperature sensing unit 11 outputs, relatively whether these central processing unit 10 current operating temperatures surpass central processing unit 10 maximum operating temperatures (step S45) that are provided with, if surpass maximum operating temperature, then directly send comparative result to monitoring temperature unit 14, send a stopping signal to central processing unit 10 by monitoring temperature unit 14, indication central processing unit 10 decommission (step S47), return central processing unit 10 test results to output unit 15 as a result, the current test result of central processing unit 10 is shown to tester (step S48); If central processing unit 10 current operating temperatures do not surpass maximum operating temperature, whether continue the more current test duration of having experienced arrives the test duration (step S46) of setting, if the test duration that no show is provided with is then returned step S43, proceed temperature test; If arrived the test duration, then stop central processing unit 10 tests, analyze maximum operating temperature, minimum operating temperature and average working temperature in central processing unit 10 test processs, and exporting above-mentioned maximum operating temperature, minimum operating temperature and average working temperature to output unit 15 (step S48) as a result, flow process finishes.
Claims (8)
1. a central processor temperature Auto-Test System is characterized in that, this central processor temperature Auto-Test System comprises:
One central processing unit is used for process data signal and control signal;
One temperature sensing unit is used for perception and the current operating temperature of measuring central processing unit, and exports the current operating temperature of central processing unit to data processing unit;
One data storage cell, each the described current operating temperature constantly of central processing unit that is used for the institute's perception of storing temperature sensing cell and measures;
One monitoring temperature unit is used to transmit control signal, the running and the shutdown of indication central processing unit;
One data processing unit is used to receive the central processing unit current operating temperature that temperature sensing unit is exported, and with the output of temperature data result, this data processing unit comprises:
One temperature data memory module, each temperature data constantly of central processing unit that is used for getting access to is formed data form and is stored to described data storage cell;
One temperature data acquisition module is used for obtaining the central processor temperature data form from data storage cell;
One temperature is provided with module, is used to be provided with the maximum operating temperature of central processing unit;
One temperature comparison module is used for comparison and plays processor current operating temperature and the maximum operating temperature that is set up;
One test duration was provided with module, was used to be provided with the test duration of central processing unit;
One test duration comparison module is used for more current test duration of having experienced and the test duration that is set up.
2. central processor temperature Auto-Test System as claimed in claim 1 is characterized in that, this system also comprises an output unit as a result, is used to receive the temperature data result of data processing unit and the test result of indication central processing unit.
3. central processor temperature Auto-Test System as claimed in claim 2, it is characterized in that, output unit as a result wherein utilizes the test result of red green pilot lamp indication central processing unit, and wherein red light represents that this central processing unit is a defective products, and green light represents that this central processing unit is good product.
4. central processor temperature Auto-Test System as claimed in claim 2, it is characterized in that, data processing unit wherein also comprises an output module as a result, is used for exporting described temperature data result to monitoring temperature unit, output unit and data storage cell as a result.
5. central processor temperature Auto-Test System as claimed in claim 4 is characterized in that, temperature data result wherein comprises maximum operating temperature, minimum operating temperature and the average working temperature of the central processing unit in the temperature test process.
6. central processor temperature Auto-Test System as claimed in claim 1 is characterized in that temperature sensing unit wherein is made of thermistor, physically is coupled with the central processing unit close thermal.
7. a central processor temperature automatic test approach is characterized in that, this central processor temperature automatic test approach comprises the steps:
The maximum operating temperature that central processing unit allows is set;
The central processor temperature test duration is set;
Test central processing unit current operating temperature produces a Current Temperatures record value;
Storage central processing unit current operating temperature record value, each Current Temperatures record value is formed data form;
Compare central processing unit current operating temperature and described maximum operating temperature, relatively whether this central processing unit current operating temperature surpasses this maximum operating temperature;
If the central processing unit current operating temperature surpasses this maximum operating temperature, then send one and control signal to central processing unit, stop the central processing unit running, and test result is exported;
If the central processing unit current operating temperature is lower than this maximum operating temperature, continues the more current test duration and whether reach the temperature test time of setting;
If the current test duration does not also reach the temperature test time of setting, then return and continue test central processing unit current operating temperature; And
If reach the test duration, then with the output of central processor temperature test result, flow process finishes.
8. central processor temperature automatic test approach as claimed in claim 7 is characterized in that, test result wherein comprises maximum operating temperature, minimum operating temperature and the average working temperature of the central processing unit in the temperature test process.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2003101176900A CN100383699C (en) | 2003-12-27 | 2003-12-27 | Automatic testing system and method for CPU temperature |
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| CNB2003101176900A CN100383699C (en) | 2003-12-27 | 2003-12-27 | Automatic testing system and method for CPU temperature |
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| CN1635448A CN1635448A (en) | 2005-07-06 |
| CN100383699C true CN100383699C (en) | 2008-04-23 |
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Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI324297B (en) | 2006-03-20 | 2010-05-01 | Via Tech Inc | Thermal throttling duty estimation methods and systems for a cpu |
| CN100410842C (en) * | 2006-05-19 | 2008-08-13 | 威盛电子股份有限公司 | Central processing unit temperature regulating method and system |
| CN105373461A (en) * | 2014-08-22 | 2016-03-02 | 国基电子（上海）有限公司 | Terminal device and heat dissipation detection method therefor |
| US20170322607A1 (en) * | 2014-12-03 | 2017-11-09 | Mitsubishi Electric Corporation | Programmable logic controller system |
| CN109959862A (en) * | 2019-03-12 | 2019-07-02 | 杭州长川科技股份有限公司 | A kind of integrated circuit test device real time temperature monitoring system and method |
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| US5805403A (en) * | 1996-03-28 | 1998-09-08 | 3Com Ltd. | Integrated circuit temperature monitoring and protection system |
| CN2394211Y (en) * | 1999-08-23 | 2000-08-30 | 李树山 | Intellectual temperature difference sensor |
| CN1345424A (en) * | 1999-03-26 | 2002-04-17 | 因芬尼昂技术股份公司 | Manipulation proof integrated circuit |
| US20020104030A1 (en) * | 2001-01-31 | 2002-08-01 | Hee-Geol Ahn | ACPI compliant computer system and overtemperature protection method therefor |
| CN2519947Y (en) * | 2002-01-07 | 2002-11-06 | 友致企业股份有限公司 | Overheat protector for computer |
| US20030225542A1 (en) * | 2002-05-28 | 2003-12-04 | Chang-Ming Liu | Electronic fan capable of automatic fan speed adjustment according to ambient temperature conditions |
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2003
- 2003-12-27 CN CNB2003101176900A patent/CN100383699C/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5805403A (en) * | 1996-03-28 | 1998-09-08 | 3Com Ltd. | Integrated circuit temperature monitoring and protection system |
| CN1345424A (en) * | 1999-03-26 | 2002-04-17 | 因芬尼昂技术股份公司 | Manipulation proof integrated circuit |
| CN2394211Y (en) * | 1999-08-23 | 2000-08-30 | 李树山 | Intellectual temperature difference sensor |
| US20020104030A1 (en) * | 2001-01-31 | 2002-08-01 | Hee-Geol Ahn | ACPI compliant computer system and overtemperature protection method therefor |
| CN2519947Y (en) * | 2002-01-07 | 2002-11-06 | 友致企业股份有限公司 | Overheat protector for computer |
| US20030225542A1 (en) * | 2002-05-28 | 2003-12-04 | Chang-Ming Liu | Electronic fan capable of automatic fan speed adjustment according to ambient temperature conditions |
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