CN220603296U - Optical crystal internal quality detection system - Google Patents
Optical crystal internal quality detection system Download PDFInfo
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- CN220603296U CN220603296U CN202322194900.1U CN202322194900U CN220603296U CN 220603296 U CN220603296 U CN 220603296U CN 202322194900 U CN202322194900 U CN 202322194900U CN 220603296 U CN220603296 U CN 220603296U
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- 239000013078 crystal Substances 0.000 title claims abstract description 74
- 238000001514 detection method Methods 0.000 title claims abstract description 17
- 239000004065 semiconductor Substances 0.000 claims abstract description 32
- 230000000149 penetrating effect Effects 0.000 claims description 8
- 238000007689 inspection Methods 0.000 claims description 6
- 230000007547 defect Effects 0.000 abstract description 22
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Abstract
The utility model relates to the technical field of crystal blank optical uniformity detection, and provides an optical crystal internal quality detection system which comprises an optical platform, wherein a moving mechanism is arranged at the center of the top of the optical platform, the output end of the moving mechanism is connected with an objective table, and an optical crystal to be detected is arranged at the top of the objective table. The high-power semiconductor laser and the high-resolution CCD camera are matched for use to capture and analyze crystal images, the defect positions are recorded and are fitted into defect stripes or defect surfaces, then the effect of crystal detection is achieved, the position and the size of defects in a blank can be accurately detected, an optical non-uniform position diagram in the crystal blank is output, the blank defects are conveniently positioned in advance before crystal processing, waste of crystal resources is effectively reduced, and the use cost is reduced.
Description
Technical Field
The utility model relates to the technical field of crystal blank optical uniformity detection, in particular to an optical crystal internal quality detection system.
Background
The crystal is a structure in which a large number of microscopic substance units are orderly arranged according to a certain rule, so that the arrangement rule and crystal morphology can be studied and judged from the size of the structural units.
The existing method for detecting the internal quality (optical uniformity in the crystal) of the crystal blank mainly comprises the step of using a hand-held semiconductor laser to irradiate the crystal to observe the optical uniformity in the crystal blank. Due to the instability of the handheld device, the position and the size of the defect on the blank cannot be accurately detected due to the influence of factors such as the size of a laser beam, so that inaccurate cutting is caused, and crystals are wasted;
another method is to use a laser interferometer to perform finished product inspection on the crystal, that is, optical uniformity inspection inside the crystal can be performed only after precision polishing is completed. Because the optical uniformity of the crystal cannot be accurately judged before the blank is cut and selected, whether defects such as scattering points, stripes and the like exist in the crystal. Therefore, the qualification rate of finished products is low, precision machining work is wasted, the cost is increased, and the efficiency is reduced.
Disclosure of Invention
The utility model provides an optical crystal internal quality detection system, which solves the problems that the position and the size of a crystal blank cannot be accurately detected in the related technology, so that the cutting is inaccurate, the qualification rate of finished products is low, the waste of crystals is easy to occur, the use cost is increased, and the processing efficiency is reduced.
The technical scheme of the utility model is as follows: the optical crystal internal quality detection system comprises an optical platform, wherein a moving mechanism is arranged at the center of the top of the optical platform, the output end of the moving mechanism is connected with an objective table, and an optical crystal to be detected is arranged at the top of the objective table;
the top of the optical platform and positioned in front of the optical crystal to be measured are provided with a first supporting piece, the top of the optical platform and positioned on the left side of the optical crystal to be measured are provided with a second supporting piece, and the top ends of the first supporting piece and the second supporting piece are fixedly connected with a fixing seat;
the top of one fixing seat is provided with a high-power semiconductor laser, the top of the other fixing seat is provided with a high-resolution CCD camera, and the fixing seat is provided with a clamping mechanism for the high-power semiconductor laser and the high-resolution CCD camera;
the irradiation end of the high-power semiconductor laser is provided with an adjusting mechanism.
Preferably, the moving mechanism is composed of a three-dimensional moving platform fixedly arranged at the center of the top of the optical platform, and the objective table is fixedly arranged at the output end of the three-dimensional moving platform.
Preferably, the first support and the second support are respectively composed of a first optical adjusting frame and a second optical adjusting frame, the high-resolution CCD camera is fixed on the top of the first optical adjusting frame, and the high-power semiconductor laser is fixed on the top of the second optical adjusting frame.
Preferably, the clamping mechanism comprises two sliding grooves symmetrically penetrating through the inner bottom wall of the fixed seat, sliding rods penetrating through the sliding grooves and fixedly connected to two sides of the fixed seat, and a clamping frame fixedly connected to the opposite ends of the two sliding rods and connected with the sliding grooves in a sliding mode, the clamping mechanism further comprises a spring sleeved on the surface of the sliding rods and a gear rotationally connected to one side of the fixed seat, two ends of the spring are respectively connected with the fixed seat and the clamping frame, the clamping mechanism further comprises a connecting frame fixedly installed at the opposite ends of the two sliding rods and two racks fixedly connected to one side of the connecting frame and meshed with the gear, two sides of the fixed seat are connected with hand-screwed bolts in a penetrating mode, and one end of each hand-screwed bolt is rotationally connected with a rubber gasket.
Preferably, the adjusting mechanism comprises a beam expander arranged at the transmitting end of the high-power semiconductor laser and a diaphragm arranged at the end part of the beam expander.
The working principle and the beneficial effects of the utility model are as follows:
when the utility model is used, the high-power semiconductor laser emits light beams to pass through the crystal, the high-resolution CCD camera starts to capture the current crystal light beam image, the moving mechanism drives the crystal to move in the process, the whole overall light beam image capture of the crystal blank is achieved, the captured light beam image is analyzed through an algorithm to judge whether points with uneven optics in the crystal exist, the defect positions are recorded through the laser beams, the defect stripes or defect surfaces are fitted, finally, a report is generated, the effect of crystal detection is realized, the detection accuracy is high, the positions and the sizes of defects in the blank can be accurately detected, the evaluation of the optical uniformity in the crystal blank is facilitated, the optical uneven position diagram in the crystal blank is output, the defect can be conveniently positioned in advance before the crystal processing, the waste of crystal resources is effectively reduced, and the use cost is reduced.
Drawings
The utility model will be described in further detail with reference to the drawings and the detailed description.
FIG. 1 is a schematic diagram of the overall structure of the present utility model;
FIG. 2 is a schematic view of a partial structure of a support member of the present utility model;
FIG. 3 is a schematic view of a part of the structure of the fixing base of the present utility model;
FIG. 4 is a schematic diagram of a partial structure of a beam expander according to the present utility model;
in the figure: 1. an optical platform; 2. an objective table; 3. an optical crystal to be measured; 4. a fixing seat; 5. a high power semiconductor laser; 6. a high resolution CCD camera; 7. a three-dimensional mobile platform; 8. an optical adjusting frame I; 9. an optical adjusting frame II; 10. a chute; 11. a slide bar; 12. a clamping frame; 13. a spring; 14. a gear; 15. a connecting frame; 16. a rack; 17. screwing the bolt by hand; 18. a rubber gasket; 19. a beam expander; 20. a diaphragm.
Detailed Description
The technical solutions of the embodiments of the present utility model will be clearly and completely described below in conjunction with the embodiments of the present utility model, and it is apparent that the described embodiments are only some embodiments of the present utility model, not all embodiments. All other embodiments, which can be made by one of ordinary skill in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
Referring to fig. 1-4, the present utility model provides a technical scheme of an optical crystal internal quality detection system: the device comprises an optical platform 1, wherein a moving mechanism is arranged at the center of the top of the optical platform 1, the output end of the moving mechanism is connected with an objective table 2, and an optical crystal 3 to be measured is arranged at the top of the objective table 2;
the top of the optical platform 1 and positioned in front of the optical crystal 3 to be measured are provided with a first supporting piece, the top of the optical platform 1 and positioned on the left side of the optical crystal 3 to be measured are provided with a second supporting piece, and the top ends of the first supporting piece and the second supporting piece are fixedly connected with a fixing seat 4;
the top of one fixing seat 4 is provided with a high-power semiconductor laser 5, the top of the other fixing seat 4 is provided with a high-resolution CCD camera 6, and the fixing seat 4 is provided with a clamping mechanism for the high-power semiconductor laser 5 and the high-resolution CCD camera 6;
the irradiation end of the high-power semiconductor laser 5 is provided with an adjusting mechanism for adjusting the beam size.
During the use, through placing the optical crystal 3 that awaits measuring on objective table 2, simultaneously fix high-power semiconductor laser 5 and high-resolution CCD camera 6 on the fixing base 4 of corresponding support piece one or support piece two in proper order through fixture, after drawing the three-dimensional figure of crystal blank, and with drawing the three-dimensional figure that completes in leading into software, set up scanning starting point, select the scanning route, simultaneously high-power semiconductor laser 5 opens, the light beam passes the crystal, and begin to catch current crystal light beam image through high-resolution CCD camera 6, the in-process drives the crystal through moving mechanism and removes, reach the holistic overall light beam image capture of crystal blank, afterwards, through the analysis of external computer to the light beam image of capturing, judge whether there is the inside optical inhomogeneous point of crystal, and through laser beam record defect position, with the inside optical inhomogeneous point of crystal of discernment on the blank three-dimensional map, through the algorithm with the inhomogeneous point of acquireing, the defect stripe or defect face is formed in the fit, finally generate the report of the inside optical homogeneity of crystal blank, realize the effect of crystal detection, on the optical platform 1 is wholly, the equipment is arranged in, the optical blank is not present, the optical blank is convenient for the inside optical blank is measured in advance to the defect position is high, the accuracy is convenient for the position is little in the defect is adjusted, the optical blank is convenient to take the position is easy to be in the defect is easy to be measured, the position is easy to be in the position to the inside the crystal blank, the defect is easy to be measured, the defect is small is easy to be used to the defect the position is measured, and has the defect is easy.
It should be noted that: the high-power semiconductor laser 5 and the high-resolution CCD camera 6 are matched with an external computer for use, so that the crystal captured image can be conveniently transmitted to the computer for algorithm analysis.
Specific: the moving mechanism is composed of a three-dimensional moving platform 7 fixedly arranged at the center of the top of the optical platform 1, and the objective table 2 is fixedly arranged at the output end of the three-dimensional moving platform 7;
through setting up three-dimensional moving platform 7, can drive the optical crystal 3 that awaits measuring and carry out the position movement adjustment to be convenient for realize that high-power semiconductor laser 5 and high-resolution CCD camera 6 can shine each position of crystal, and record crystal current position, three-dimensional moving platform 7 is prior art, can reach the purpose that the crystal removed from X, Y, Z three direction, does not make excessive redundant description here.
Specific: the first support piece and the second support piece are respectively composed of an optical adjusting frame I8 and an optical adjusting frame II 9, the high-resolution CCD camera 6 is fixed on the top of the optical adjusting frame I8, and the high-power semiconductor laser 5 is fixed on the top of the optical adjusting frame II 9;
through setting up optical adjustment frame one 8 and optical adjustment frame two 9, can be convenient for adjust high power semiconductor laser 5 or high resolution CCD camera 6's height and position to make high power semiconductor laser 5 or high resolution CCD camera 6 can align with the crystal of equidimension, guarantee result of use, improved the flexibility of use, optical adjustment frame is prior art, does not make excessive redundant description here.
Specific: the clamping mechanism comprises two sliding grooves 10 symmetrically penetrating through the inner bottom wall of the fixed seat 4, sliding rods 11 penetrating through the sliding grooves and connected to two sides of the fixed seat 4 in a sliding manner, and a clamping frame 12 fixedly connected to the opposite ends of the two sliding rods 11 and connected with the sliding grooves 10 in a sliding manner, the clamping mechanism further comprises a spring 13 sleeved on the surface of the sliding rods 11 and a gear 14 rotatably connected to one side of the fixed seat 4, two ends of the spring 13 are respectively connected with the fixed seat 4 and the clamping frame 12, the clamping mechanism further comprises a connecting frame 15 fixedly installed at the opposite ends of the two sliding rods 11 and two racks 16 fixedly connected to one side of the connecting frame 15 and meshed with the gear 14, wherein the two racks 16 are arranged in a vertically staggered manner, a knob is installed on one side of the gear 14, two sides of the fixed seat 4 are connected with hand-screwed bolts 17 in a penetrating manner, and one end of the hand-screwed bolts 17 is rotatably connected with rubber gaskets 18;
when the high-power semiconductor laser 5 and the high-resolution CCD camera 6 are installed, the two racks 16 are driven to move relatively through the rotating gear 14, the clamping frames 12 on the two sides are synchronously driven to slide relatively in the sliding groove 10 through the connecting frame 15 and the sliding rod 11, meanwhile, the springs 13 are pressed, the high-power semiconductor laser 5 or the high-resolution CCD camera 6 is placed on the fixed seat 4 on the top of the corresponding first optical adjusting frame 8 or the second optical adjusting frame 9, the gear 14 is loosened, the clamping frames 12 on the two sides are driven to reset through the springs 13 to position, clamp and fix the high-power semiconductor laser 5 or the high-resolution CCD camera 6, so that the high-power semiconductor laser 5 or the high-resolution CCD camera 6 is conveniently detached and then maintained, after clamping, the rubber gaskets 18 are driven to move to be contacted with the high-power semiconductor laser 5 or the high-resolution CCD camera 6 through the rotating manual bolt 17, and further clamping and fixing the front side and the back side of the high-power semiconductor laser 5 or the high-resolution CCD camera 6 can be guaranteed.
Specific: the adjusting mechanism comprises a beam expander 19 arranged at the transmitting end of the high-power semiconductor laser 5 and a diaphragm 20 arranged at the end part of the beam expander 19;
the beam expander 19 and the diaphragm 20 are arranged to be matched for use, so that the size of the light beam emitted by the high-power semiconductor laser 5 can be adjusted, the effect of adapting to crystals of different types and sizes can be achieved, and the application range is effectively improved.
The foregoing description of the preferred embodiments of the utility model is not intended to be limiting, but rather is intended to cover all modifications, equivalents, alternatives, and improvements that fall within the spirit and scope of the utility model.
Claims (8)
1. The optical crystal internal quality detection system comprises an optical platform (1) and is characterized in that a moving mechanism is arranged at the center of the top of the optical platform (1), the output end of the moving mechanism is connected with an objective table (2), and an optical crystal (3) to be detected is arranged at the top of the objective table (2);
the top of the optical platform (1) and positioned in front of the optical crystal (3) to be detected are provided with a first supporting piece, the top of the optical platform (1) and positioned on the left side of the optical crystal (3) to be detected are provided with a second supporting piece, and the top ends of the first supporting piece and the second supporting piece are fixedly connected with a fixing seat (4);
the top of one fixing seat (4) is provided with a high-power semiconductor laser (5), the top of the other fixing seat (4) is provided with a high-resolution CCD camera (6), and the fixing seat (4) is provided with a clamping mechanism for the high-power semiconductor laser (5) and the high-resolution CCD camera (6);
the irradiation end of the high-power semiconductor laser (5) is provided with an adjusting mechanism.
2. An optical crystal internal quality inspection system according to claim 1, characterized in that the moving mechanism is composed of a three-dimensional moving platform (7) fixedly installed at the top center of the optical platform (1), and the stage (2) is fixedly installed at the output end of the three-dimensional moving platform (7).
3. An optical crystal internal quality inspection system according to claim 1, wherein the first and second supports are composed of a first optical adjustment frame (8) and a second optical adjustment frame (9), respectively, the high-resolution CCD camera (6) is fixed on top of the first optical adjustment frame (8), and the high-power semiconductor laser (5) is fixed on top of the second optical adjustment frame (9).
4. An optical crystal internal quality detection system according to claim 1, wherein the clamping mechanism comprises two sliding grooves (10) symmetrically penetrating through the inner bottom wall of the fixed seat (4), sliding rods (11) penetrating through and slidably connected to two sides of the fixed seat (4), and a clamping frame (12) fixedly connected to opposite ends of the two sliding rods (11) and slidably connected to the sliding grooves (10).
5. The optical crystal internal quality detection system according to claim 4, wherein the clamping mechanism further comprises a spring (13) sleeved on the surface of the sliding rod (11) and a gear (14) rotatably connected to one side of the fixed seat (4), and two ends of the spring (13) are respectively connected with the fixed seat (4) and the clamping frame (12).
6. An optical crystal internal quality inspection system according to claim 5, wherein the clamping mechanism further comprises a connecting frame (15) fixedly mounted on the opposite end of the two slide bars (11) and two racks (16) fixedly connected to one side of the connecting frame (15) and engaged with the gears (14).
7. An optical crystal internal quality detection system according to claim 5, wherein both sides of the fixing base (4) are connected with a hand-screwed bolt (17) through a thread, and one end of the hand-screwed bolt (17) is connected with a rubber gasket (18) in a rotating manner.
8. An optical crystal internal quality inspection system according to claim 1, characterized in that the adjusting mechanism comprises a beam expander (19) arranged at the emitting end of the high-power semiconductor laser (5) and a diaphragm (20) arranged at the end of the beam expander (19).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322194900.1U CN220603296U (en) | 2023-08-16 | 2023-08-16 | Optical crystal internal quality detection system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322194900.1U CN220603296U (en) | 2023-08-16 | 2023-08-16 | Optical crystal internal quality detection system |
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| Publication Number | Publication Date |
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| CN220603296U true CN220603296U (en) | 2024-03-15 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202322194900.1U Active CN220603296U (en) | 2023-08-16 | 2023-08-16 | Optical crystal internal quality detection system |
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| Country | Link |
|---|---|
| CN (1) | CN220603296U (en) |
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2023
- 2023-08-16 CN CN202322194900.1U patent/CN220603296U/en active Active
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