CN220509085U - Multi-station test fixture for chip detection - Google Patents
Multi-station test fixture for chip detection Download PDFInfo
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- CN220509085U CN220509085U CN202321717795.9U CN202321717795U CN220509085U CN 220509085 U CN220509085 U CN 220509085U CN 202321717795 U CN202321717795 U CN 202321717795U CN 220509085 U CN220509085 U CN 220509085U
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- chip
- push rod
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- 238000012360 testing method Methods 0.000 title claims abstract description 36
- 238000001514 detection method Methods 0.000 title claims abstract description 17
- 230000000670 limiting effect Effects 0.000 claims description 14
- 238000009434 installation Methods 0.000 claims description 7
- 238000000034 method Methods 0.000 claims description 3
- 238000003466 welding Methods 0.000 claims description 2
- 238000007689 inspection Methods 0.000 claims 6
- 238000000926 separation method Methods 0.000 description 7
- 230000008093 supporting effect Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 239000011435 rock Substances 0.000 description 1
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses a multi-station test jig for chip detection, relates to the technical field of jigs, and aims to solve the problems that when the existing chip performs multi-station detection, each station is provided with one jig, the chip needs to be detached and re-fixed, time and labor are wasted, the chip moves one chip, and the detection efficiency is affected. The upper end of the mounting underframe is provided with a ball screw sliding rail, and the upper end of the ball screw sliding rail is provided with a movable base; further comprises: the storage rack is arranged at the upper end of the movable base, a classification frame is arranged in the storage rack, the classification frame and the storage rack are of an integrated structure, a placing cavity is arranged in the classification frame, the placing cavity and the classification frame are of an integrated structure, the placing base is arranged in the placing cavity, fixed side edges are arranged on two sides of the storage rack, and the fixed side edges are in threaded fixation with the movable base through threaded fasteners.
Description
Technical Field
The utility model relates to the technical field of jigs, in particular to a multi-station testing jig for chip detection.
Background
The jig is used as a tool for assisting in controlling the position or the action, can be divided into three types of process assembly jigs, project test jigs and circuit board test jigs, and can be divided into three types of process assembly jigs, project test jigs and circuit board test jigs, wherein the test jigs comprise a life test jig, a packaging test jig, an environment test jig, an optical test jig, a shielding test jig, a sound insulation test jig and the like; especially, chip detection, the number of items detected is relatively large, and the detection needs to be carried out in all directions through a plurality of stations.
However, when the existing core chip performs multi-station detection, a jig is arranged at each station, the chip needs to be detached and re-fixed, time and labor are wasted, and the chip moves one by one, so that the detection efficiency is affected; therefore, the existing requirements are not met, and a multi-station test fixture for chip detection is provided.
Disclosure of Invention
The utility model aims to provide a multi-station test fixture for chip detection, which aims to solve the problems that when the existing chip provided in the background technology is used for multi-station detection, each station is provided with one fixture, the chip needs to be detached for re-fixing, time and labor are wasted, and the detection efficiency is affected due to the fact that the chip moves one chip.
In order to achieve the above purpose, the present utility model provides the following technical solutions: a multistation test fixture for chip detection includes: the device comprises a mounting underframe, wherein the upper end of the mounting underframe is provided with a ball screw sliding rail, and the upper end of the ball screw sliding rail is provided with a movable base;
further comprises:
the storage rack is arranged at the upper end of the movable base, a classification frame is arranged in the storage rack, the classification frame and the storage rack are of an integrated structure, a placing cavity is arranged in the classification frame, the placing cavity and the classification frame are of an integrated structure, the placing base is arranged in the placing cavity, fixed side edges are arranged on two sides of the storage rack, and the fixed side edges are in threaded fixation with the movable base through threaded fasteners;
the ejection column is arranged at the lower end of the placement base, a movable top plate is arranged at the lower end of the ejection column, and an electric push rod is arranged at the center of the lower end of the movable top plate.
Preferably, a fixing bolt is arranged at the center of the ejection column, the ejection column is in threaded connection with the movable top plate through the fixing bolt, and the number of the ejection columns is consistent with the number of the placement bases.
Preferably, a connecting slot is arranged at the center of the lower surface of the placing base, the connecting slot and the placing base are of an integrated structure, and the upper end of the ejection column is inserted into the connecting slot.
Preferably, the outer wall all around of putting the base is provided with spacing movable block, and spacing movable block and put the base structure as an organic whole, the inner wall all around of putting the chamber all is provided with spacing movable groove, and spacing movable block removes along spacing movable groove.
Preferably, a mounting groove is arranged between the electric push rod and the movable base, and the mounting groove and the movable base are of an integrated structure.
Preferably, the both ends of electric putter all are provided with the push rod fixed disk, and electric putter both ends pass through push rod fixed disk external bolt respectively with remove roof and removal base threaded connection.
Preferably, the both sides of installation chassis all are provided with the slide rail frame, the lower extreme welding of slide rail frame is provided with the support column, the front end of slide rail frame is provided with the station division board, station division board passes through single-head fastener and slide rail frame threaded connection.
Compared with the prior art, the utility model has the beneficial effects that:
1. according to the utility model, the ball screw sliding rail is arranged between the mounting underframe and the movable base, the electric push rod is arranged in the movable base, the movable base is driven to move to the next station for testing by using the ball screw sliding rail, and then the next station is performed, so that each station is not required to be provided with a tool, a chip is not required to be reinstalled every time when one station is moved, the testing efficiency is improved, when the chip is required to be taken down after the testing is finished, the electric push rod is used for pushing the movable top plate upwards to drive the ejection column to move upwards, and the force is applied to the lower end of the placing base by the ejection column, so that the placing base moves upwards, the chip is moved out of the placing cavity, the chip is convenient to take out by personnel, and the convenience is improved.
2. Through setting up spacing movable groove at putting the intracavity wall, all set up spacing movable block around putting the base, when putting the base and reciprocate, spacing movable block removes along spacing movable groove, plays spacing effect, avoids perk limit to rock, improves the mobility stability to the upper end of ejecting post inserts the inside of connecting slot of putting the base lower surface, does not use the bolt fastening, and the quick separation of being convenient for is changed, improves the dismantlement convenience.
Drawings
FIG. 1 is a schematic diagram of the overall structure of the present utility model;
FIG. 2 is a schematic view of the internal structure of the mobile base of the present utility model;
FIG. 3 is a schematic top view of a movable top plate according to the present utility model;
FIG. 4 is a schematic view of a separation structure of a classification frame and a placement base according to the present utility model;
FIG. 5 is a schematic view of the lower surface structure of the placement base of the present utility model;
in the figure: 1. installing an underframe; 2. a slide rail frame; 3. a support column; 4. a ball screw slide rail; 5. a movable base; 6. a storage rack; 7. a classification frame; 8. placing the cavity; 9. placing a base; 10. fixing the side edges; 11. a threaded fastener; 12. station separation plates; 13. a single-headed fastener; 14. a mounting groove; 15. an electric push rod; 16. a push rod fixing plate; 17. moving the top plate; 18. an ejection column; 19. a fixing bolt; 20. limiting the moving groove; 21. limiting the moving block; 22. and a connection slot.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments.
Referring to fig. 1-5, an embodiment of the present utility model is provided: a multistation test fixture for chip detection includes: the device comprises a mounting underframe 1, wherein a ball screw sliding rail 4 is arranged at the upper end of the mounting underframe 1, and a movable base 5 is arranged at the upper end of the ball screw sliding rail 4;
further comprises:
the storage rack 6 is arranged at the upper end of the movable base 5, a classification frame 7 is arranged in the storage rack 6, the classification frame 7 and the storage rack 6 are of an integrated structure, a placing cavity 8 is arranged in the classification frame 7, the placing cavity 8 and the classification frame 7 are of an integrated structure, a placing base 9 is arranged in the placing cavity 8, fixed side edges 10 are arranged on two sides of the storage rack 6, and the fixed side edges 10 are in threaded fixation with the movable base 5 through threaded fasteners 11;
the ejection column 18 is arranged at the lower end of the placement base 9, a movable top plate 17 is arranged at the lower end of the ejection column 18, and an electric push rod 15 is arranged at the center of the lower end of the movable top plate 17.
The ball screw slide rail 4 is utilized to drive the movable base 5 to move to the next station for testing, and then the next station is carried out, so that each station is not required to be provided with a tool, a chip is not required to be reinstalled every time when one station is removed, the testing efficiency is improved, when the chip is required to be removed after the testing is finished, the electric push rod 15 is utilized to push the movable top plate 17 upwards to drive the ejection column 18 to move upwards, the force is applied to the lower end of the placing base 9 by the ejection column 18, the placing base 9 is moved upwards, and when moving, the limiting movable block 21 moves along the limiting movable groove 20, so that the limiting effect is achieved, the edge warping shaking is avoided, the moving stability is improved, the chip is enabled to move out of the placing cavity 8, the taking out of people is facilitated, and the convenience is improved.
Referring to fig. 2 and 3, a fixing bolt 19 is disposed at the center of the ejection column 18, and the ejection column 18 is screwed with the movable top plate 17 by the fixing bolt 19, and the number of the ejection columns 18 is consistent with the number of the placement bases 9, so that the ejection column 18 is convenient to fix and detach.
Referring to fig. 1, 2 and 5, a connecting slot 22 is arranged at the center of the lower surface of the placement base 9, the connecting slot 22 and the placement base 9 are of an integrated structure, and the upper end of the ejection column 18 is inserted into the connecting slot 22, so that the ejection column 18 is fixed with the placement base 9, and the quick separation is facilitated.
Referring to fig. 4 and 5, the outer walls around the placement base 9 are provided with the limit moving blocks 21, the limit moving blocks 21 and the placement base 9 are of an integral structure, the inner walls around the placement cavity 8 are provided with the limit moving grooves 20, the limit moving blocks 21 move along the limit moving grooves 20, and when the placement base 9 moves upwards, the limit moving blocks 21 move along the limit moving grooves 20, so that the limit effect is achieved, the edge tilting is avoided, and the movement stability is improved.
Referring to fig. 2, a mounting groove 14 is disposed between the electric push rod 15 and the moving base 5, and the mounting groove 14 and the moving base 5 are integrally configured for mounting the electric push rod 15.
Referring to fig. 2, push rod fixing plates 16 are disposed at two ends of the electric push rod 15, and the two ends of the electric push rod 15 are respectively connected with the movable top plate 17 and the movable base 5 by screw threads through external bolts of the push rod fixing plates 16, so as to fix the electric push rod 15.
Referring to fig. 1, two sides of an installation underframe 1 are provided with a sliding rail frame 2, the lower end of the sliding rail frame 2 is welded and provided with a supporting column 3, the front end of the sliding rail frame 2 is provided with a station separation plate 12, the station separation plate 12 is in threaded connection with the sliding rail frame 2 through a single-head fastener 13, and the sliding rail frame 2 has a supporting effect on a movable base 5.
Working principle: when the device is used, chips are placed into the placing cavity 8, the placing base 9 is used for supporting, stations are divided by the station separation plate 12, after the chips are tested at the first station, the ball screw sliding rail 4 is used for driving the movable base 5 to move to the next station for testing, and then the next station is used for conducting the next operation, so that each station is not required to be provided with a tool, one side of chips are not required to be reinstalled each time, the testing efficiency is improved, the placing cavity 8 is provided with a plurality of chips, the chips can be placed simultaneously for multi-chip testing, convenience is improved, when the chips need to be taken down after the testing, the electric push rod 15 is used for pushing the movable top plate 17 upwards, the ejector column 18 is driven to move upwards, the force is applied to the lower end of the placing base 9 by the ejector column 18, when the placing base 9 is moved upwards, the limiting movable block 21 moves along the limiting movable groove 20, the limiting effect is achieved, the edge of shaking is avoided, the movement stability is improved, the chips are moved out of the placing cavity 8, convenience is improved, and personnel are convenient to take out.
It will be evident to those skilled in the art that the utility model is not limited to the details of the foregoing illustrative embodiments, and that the present utility model may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The present embodiments are, therefore, to be considered in all respects as illustrative and not restrictive, the scope of the utility model being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Claims (7)
1. The multi-station testing jig for chip detection comprises an installation underframe (1), wherein a ball screw sliding rail (4) is arranged at the upper end of the installation underframe (1), and a movable base (5) is arranged at the upper end of the ball screw sliding rail (4);
the method is characterized in that: further comprises:
the storage rack (6) is arranged at the upper end of the movable base (5), a classification frame (7) is arranged in the storage rack (6), the classification frame (7) and the storage rack (6) are of an integrated structure, a placing cavity (8) is arranged in the classification frame (7), the placing cavity (8) and the classification frame (7) are of an integrated structure, a placing base (9) is arranged in the placing cavity (8), fixed side edges (10) are arranged on two sides of the storage rack (6), and the fixed side edges (10) are in threaded fixation with the movable base (5) through threaded fasteners (11);
the ejection column (18) is arranged at the lower end of the placement base (9), a movable top plate (17) is arranged at the lower end of the ejection column (18), and an electric push rod (15) is arranged at the center of the lower end of the movable top plate (17).
2. The multi-station test fixture for chip inspection according to claim 1, wherein: the center of the ejection column (18) is provided with a fixing bolt (19), the ejection column (18) is in threaded connection with the movable top plate (17) through the fixing bolt (19), and the number of the ejection columns (18) is consistent with the number of the placing bases (9).
3. The multi-station test fixture for chip inspection according to claim 1, wherein: the center of the lower surface of the placing base (9) is provided with a connecting slot (22), the connecting slot (22) and the placing base (9) are of an integrated structure, and the upper end of the ejection column (18) is inserted into the connecting slot (22).
4. The multi-station test fixture for chip inspection according to claim 1, wherein: the utility model discloses a device is characterized in that the outer wall around the placing base (9) is provided with a limiting moving block (21), the limiting moving block (21) and the placing base (9) are of an integrated structure, the inner wall around the placing cavity (8) is provided with a limiting moving groove (20), and the limiting moving block (21) moves along the limiting moving groove (20).
5. The multi-station test fixture for chip inspection according to claim 1, wherein: an installation groove (14) is formed between the electric push rod (15) and the movable base (5), and the installation groove (14) and the movable base (5) are of an integrated structure.
6. The multi-station test fixture for chip inspection according to claim 1, wherein: the two ends of the electric push rod (15) are provided with push rod fixing discs (16), and the two ends of the electric push rod (15) are respectively in threaded connection with the movable top plate (17) and the movable base (5) through external bolts of the push rod fixing discs (16).
7. The multi-station test fixture for chip inspection according to claim 1, wherein: the utility model discloses a rack, including installation chassis (1), slide rail frame (2), support column (3) are provided with in the welding of the lower extreme of slide rail frame (2), the front end of slide rail frame (2) is provided with station division board (12), station division board (12) are through single-head fastener (13) and slide rail frame (2) threaded connection.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321717795.9U CN220509085U (en) | 2023-07-03 | 2023-07-03 | Multi-station test fixture for chip detection |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321717795.9U CN220509085U (en) | 2023-07-03 | 2023-07-03 | Multi-station test fixture for chip detection |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220509085U true CN220509085U (en) | 2024-02-20 |
Family
ID=89865467
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321717795.9U Active CN220509085U (en) | 2023-07-03 | 2023-07-03 | Multi-station test fixture for chip detection |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220509085U (en) |
-
2023
- 2023-07-03 CN CN202321717795.9U patent/CN220509085U/en active Active
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