CN220491221U - Control circuit capable of automatically adjusting test temperature - Google Patents
Control circuit capable of automatically adjusting test temperature Download PDFInfo
- Publication number
- CN220491221U CN220491221U CN202321733330.2U CN202321733330U CN220491221U CN 220491221 U CN220491221 U CN 220491221U CN 202321733330 U CN202321733330 U CN 202321733330U CN 220491221 U CN220491221 U CN 220491221U
- Authority
- CN
- China
- Prior art keywords
- triode
- control circuit
- resistor
- electrically connected
- automatically adjusting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 37
- 230000032683 aging Effects 0.000 description 14
- 238000000034 method Methods 0.000 description 5
- 101100236764 Caenorhabditis elegans mcu-1 gene Proteins 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses a control circuit capable of automatically adjusting test temperature, which comprises a plurality of control units, wherein each control unit is independently controlled and connected with a plurality of tested bodies; a plurality of diodes, each of which is electrically connected with a plurality of the control units, respectively; the first triode and the second triode, a plurality of diodes are also electrically connected with the base electrode of the second triode, and the collector electrode of the second triode is electrically connected with the base electrode of the first triode; the upper computer is electrically connected with the collector electrode of the first triode and is also electrically connected with the temperature control box. The control unit is used for controlling the diodes to enter the cut-off state, the Vbe voltage of the second triode is larger than the starting voltage, the second triode enters the conducting state, the first triode enters the cut-off state, and the upper computer is used for adjusting the temperature value in the temperature control box, so that the operation condition of a plurality of measured objects under different temperature environments can be automatically tested.
Description
Technical Field
The utility model relates to the technical field of control circuits, in particular to a control circuit capable of automatically adjusting test temperature.
Background
In some aging test projects, the tested product needs to circularly operate under the environment of high temperature and low temperature, so that the operation condition of the tested product under different temperatures can be tested.
In some related technologies, the process of testing needs to be completed by means of an upper computer on the tested product located in the temperature box, but a tester needs to manually control the testing temperature in the temperature box, so that the process is time-consuming and labor-consuming.
Disclosure of Invention
In order to overcome the defects of the prior art, the embodiment of the utility model provides a control circuit for automatically adjusting the test temperature.
The technical scheme adopted for solving the technical problems is as follows:
a control circuit for automatically adjusting a test temperature, the control circuit comprising:
a plurality of control units, each of which is individually controlled and connected with a plurality of tested bodies;
a plurality of diodes, each of which is electrically connected with a plurality of the control units, respectively;
the first triode and the second triode, a plurality of diodes are also electrically connected with the base electrode of the second triode, and the collector electrode of the second triode is electrically connected with the base electrode of the first triode;
the upper computer is electrically connected with the collector electrode of the first triode and is also electrically connected with the temperature control box.
As a preferable technical scheme of the utility model, the control circuit further comprises a first resistor, and the first resistor is arranged at a connection point between the power supply device and the collector electrode of the first triode.
As a preferable technical scheme of the utility model, the control circuit further comprises a second resistor, and the second resistor is arranged at connection points between the diodes and the base electrodes of the second triode.
As a preferable technical scheme of the utility model, the control circuit further comprises a third resistor, and the third resistor is arranged at a connection point between the second resistor and the first grounding terminal.
As a preferable technical scheme of the utility model, the control circuit further comprises a fourth resistor and a fifth resistor, wherein the fourth resistor is arranged at a connection point between a first power supply end and a collector electrode of the second triode; the fifth resistor is arranged at a connection point between the base electrode of the first triode and the fourth resistor.
As a preferable technical scheme of the utility model, the control circuit further comprises a sixth resistor, and the sixth resistor is arranged at a connection point between the collector electrode of the first triode and the second power supply end.
As a preferred embodiment of the present utility model, the control circuit further includes a seventh resistor, and the seventh resistor is disposed at a connection point between each of the diodes and the third power supply terminal.
As a preferable technical scheme of the utility model, the control circuit comprises a module end, and the module end is arranged at a connection point between the collector electrode of the first triode and the upper computer.
As a preferable technical scheme of the utility model, the control circuit further comprises a second grounding terminal, and the emitter junction of the first triode is electrically connected with the second grounding terminal.
As a preferable technical scheme of the utility model, the control circuit further comprises a third grounding terminal, and the emitter junction of the second triode is electrically connected with the third grounding terminal.
Compared with the prior art, the utility model has the beneficial effects that:
the control unit is used for controlling the diodes to enter the cut-off state, the Vbe voltage of the second triode is larger than the starting voltage, the second triode enters the conducting state, the first triode enters the cut-off state, and the upper computer is used for adjusting the temperature value in the temperature control box, so that the operation condition of a plurality of measured objects under different temperature environments can be automatically tested.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the drawings required for the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present utility model, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a control circuit diagram of an embodiment of the present utility model.
Fig. 2 is an enlarged partial circuit diagram of fig. 1.
Detailed Description
In order to make the technical problems, technical schemes and beneficial effects to be solved by the present application more clear, the present application is further described in detail below with reference to the accompanying drawings and embodiments.
It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the present application.
It will be understood that when an element is referred to as being "mounted" or "disposed" on another element, it can be directly on the other element or be indirectly on the other element.
When an element is referred to as being "connected to" another element, it can be directly connected to the other element or be indirectly connected to the other element.
It is to be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like indicate or are based on the orientation or positional relationship shown in the drawings, merely to facilitate description of the present application and simplify description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be configured and operated in a particular orientation, and therefore should not be construed as limiting the present application.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature.
In the description of the present application, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
In order to solve the technical problem that in the prior art, a tester manually controls the test temperature in the temperature box, so that the process is time-consuming and labor-consuming, the embodiment of the utility model provides a control circuit for automatically adjusting the test temperature.
The following details a specific scheme of a control circuit for automatically adjusting a test temperature according to an embodiment of the present utility model, which is shown in fig. 1 and fig. 2, includes a plurality of MCUs, a plurality of diodes D, a first transistor Q1, a second transistor Q3, and an upper computer 2.
Each MCU is connected with a plurality of detected bodies 1 in an independent control mode. Specifically, each MCU communicates with a plurality of objects 1 at the same time, so that the operation condition of each object 1 in the test environment can be monitored at any time.
It should be noted that, IO0 of each MCU is preset to be in a low level state, a logic and gate is formed by a plurality of diodes D in the control circuit, and a diode logic and gate is formed by a plurality of transistors in the control circuit.
It should also be noted that MCUMUC is MCU (Microcontroller Unit), i.e. a single-chip microcomputer.
Further, each diode D is electrically connected to a plurality of MCUs, respectively. Specifically, the plurality of diodes D are used for converting the alternating current with low voltage output by the alternating current voltage-reducing circuit into unidirectional pulsating direct current, that is, a rectification process of the alternating current, and the rectification circuit mainly comprises the rectification diodes D. The voltage after passing through the rectifying circuit does not belong to alternating voltage, and belongs to a mixed voltage containing direct voltage and alternating voltage.
Further, the plurality of diodes D are also electrically connected to the base of the second transistor Q3, and the collector of the second transistor Q3 is electrically connected to the base of the first transistor Q1. Specifically, in the test process, only the cathode of one diode D of the plurality of diodes D is set to be in a low level state by the MCU, and under the effect of the clamping characteristic of the diode D, the Vbe voltage value of the triode is always lower than the voltage value when the triode is turned on, and the second triode Q3 at this time enters into a cut-off state; conversely, if the Vbe voltage value of the first transistor Q1 is greater than the voltage value when turned on, the first transistor Q1 enters the on state.
Further, the upper computer 2 is electrically connected with the collector of the first triode Q1, and the upper computer 2 is also electrically connected with the temperature control box 3. Specifically, when the first transistor Q1 is turned on, the upper computer 2 cannot adjust the temperature of the test environment of the temperature control box 3 because the level acquired by the upper computer 2 is low.
The upper computer 2 is electrically connected to the temperature control box 3 via a wired bus.
Specifically, after the tested body 1 completes the aging test, one of the tested bodies 1 sends a signal for completing the aging test to its corresponding MCU, and after the at least one MCU receives the aging signal sent by the tested body 1 through the control GPIO pin IO1, the aging signal is recorded in the preset software until the remaining tested bodies 1 send a signal for completing the aging test to the corresponding MCUs, so that each tested body 1 enters the aging test state.
It should be noted that, if one of the tested bodies 1 does not complete the aging test, the IO0 pin of the MCU is kept in a low level state; otherwise, if all the tested bodies 1 finish the aging test, the MCU controls the GPIO pins to receive the aging test finishing signals sent by all the tested bodies 1, and then the MCU at the moment converts the low level into the high level through controlling the IO 0.
For example, the number of the tested bodies 1 is 25 in total, and when the tested body 11 completes the burn-in test, the tested body 11 sends a signal of the burn-in completion to the corresponding MCU 1. MCU1 receives the aging signal sent by the tested body 1 through controlling GPIO pin IO1, and marks through preset software; and then waits for the remaining test objects 12 to 124 to transmit the aging completion signals to the corresponding MCUs 2 to 25, respectively. If the tested object 13 cannot finish aging, the IO0 pin of the MCU3 is kept in a low-level state.
If all the tested objects 1 finish the test and send signals to the corresponding MCUs, the MCUs will change the low level into the high level by controlling IO0, wherein the cathode of one diode D is adjusted to the high level, and the anode of the diode D is adjusted to the high level by the action of the corresponding resistor.
In a specific embodiment, the control circuit includes a module terminal 4, where the module terminal 4 is disposed at a connection point between the collector of the first triode Q1 and the host 2. Specifically, when the first triode Q1 enters a conducting state, the DINO pin of the module terminal 4 supporting the CAN bus is adjusted to a low level; conversely, when the first triode Q1 enters a cut-off state, the DINO pin of the module end 4 supporting the CAN bus is adjusted to be at a high level; that is, the upper computer 2 reads the low level or the high level of the IO module ding through the CAN bus, thereby controlling and adjusting the temperature of the test environment.
After each MCU receives signals for completing the aging test of the corresponding tested body 1, the IO0 pin of each MCU is adjusted from low level to high level, each diode D enters an off state, the Vbe voltage of the second triode Q3 is higher than the voltage when the second triode Q3 is started, and the second triode Q3 is adjusted from the off state to the on state; if the Vbe voltage of the first transistor Q1 is lower than the on voltage, the first transistor is turned from the on state to the off state.
In a specific embodiment, the control circuit further includes a first resistor R1, where the first resistor R1 is disposed at a connection point between the power supply device and the collector of the first transistor Q1. Specifically, if only the first transistor Q1 is turned on, the low level of the pin DIN0 of the module terminal 4 supporting the CAN bus is pulled to the high level of the voltage of the power supply device through the first resistor R1.
It can be understood that the module end 4 in the embodiment of the present utility model is an IO module.
Further, the control circuit further includes a second resistor R2, a third resistor R3, a fourth resistor R10, a fifth resistor R9, a sixth resistor R5, and a seventh resistor R4, where the second resistor R2 is disposed at a connection point between the plurality of diodes D and the base of the second triode Q3. The third resistor R3 is disposed at a connection point between the second resistor R2 and the first ground. The fourth resistor R10 is arranged at a connection point between the first power supply end and the collector electrode of the second triode Q3; the fifth resistor R9 is disposed at a connection point between the base of the first triode Q1 and the fourth resistor R10. The sixth resistor R5 is disposed at a connection point between the collector of the first transistor Q1 and the second power supply terminal. The seventh resistor R4 is disposed at a connection point between each diode D and the third power supply terminal. The current output to the circuit does not exceed the rated value or the specified value required by actual work through a plurality of resistors so as to ensure the integral normal work, a variable resistor can be connected in series in the circuit, and when a plurality of electric appliances with different rated currents are connected on the main circuit of the circuit at the same time, a resistor can be connected in parallel at two ends of the electric appliance with smaller rated current.
Further, the control circuit further comprises a second grounding end and a third grounding end, the transmitting junction of the first triode Q1 is electrically connected with the second grounding end, and the transmitting junction of the second triode Q3 is electrically connected with the third grounding end, so that current in the circuit can flow back to the ground, and personnel and equipment are protected from dangers such as electric shock.
While the utility model has been described with reference to certain preferred embodiments, it will be understood by those skilled in the art that various changes and substitutions of equivalents may be made and equivalents will be apparent to those skilled in the art without departing from the scope of the utility model. Therefore, the protection scope of the utility model is subject to the protection scope of the claims.
Claims (10)
1. A control circuit for automatically adjusting a test temperature, the control circuit comprising:
a plurality of control units, each of which is individually controlled and connected with a plurality of tested bodies;
a plurality of diodes, each of which is electrically connected with a plurality of the control units, respectively;
the first triode and the second triode, a plurality of diodes are also electrically connected with the base electrode of the second triode, and the collector electrode of the second triode is electrically connected with the base electrode of the first triode;
the upper computer is electrically connected with the collector electrode of the first triode and is also electrically connected with the temperature control box.
2. The control circuit for automatically adjusting a test temperature according to claim 1, further comprising a first resistor disposed at a connection point between a power supply device and a collector of the first transistor.
3. The control circuit for automatically adjusting a test temperature according to claim 1, further comprising a second resistor disposed at a connection point between the plurality of diodes and the base of the second transistor.
4. The control circuit for automatically adjusting a test temperature according to claim 3, further comprising a third resistor disposed at a connection point between the second resistor and the first ground.
5. The control circuit for automatically adjusting a test temperature according to claim 1, further comprising a fourth resistor and a fifth resistor, wherein the fourth resistor is disposed at a connection point between a first power supply terminal and a collector of the second triode; the fifth resistor is arranged at a connection point between the base electrode of the first triode and the fourth resistor.
6. The control circuit for automatically adjusting a test temperature according to claim 1, further comprising a sixth resistor disposed at a connection point between a collector of the first transistor and a second power supply terminal.
7. The control circuit for automatically adjusting a test temperature according to claim 1, further comprising a seventh resistor disposed at a connection point between each of the diodes and a third power supply terminal.
8. The control circuit for automatically adjusting a test temperature according to claim 1, wherein the control circuit comprises a module terminal, the module terminal being disposed at a connection point between a collector of the first triode and the host.
9. The control circuit for automatically adjusting a test temperature according to claim 1, further comprising a second ground, wherein the emitter junction of the first transistor is electrically connected to the second ground.
10. The control circuit for automatically adjusting a test temperature according to claim 1, further comprising a third ground, wherein the emitter junction of the second transistor is electrically connected to the third ground.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321733330.2U CN220491221U (en) | 2023-07-04 | 2023-07-04 | Control circuit capable of automatically adjusting test temperature |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321733330.2U CN220491221U (en) | 2023-07-04 | 2023-07-04 | Control circuit capable of automatically adjusting test temperature |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220491221U true CN220491221U (en) | 2024-02-13 |
Family
ID=89842728
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321733330.2U Active CN220491221U (en) | 2023-07-04 | 2023-07-04 | Control circuit capable of automatically adjusting test temperature |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220491221U (en) |
-
2023
- 2023-07-04 CN CN202321733330.2U patent/CN220491221U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US11555849B2 (en) | Detection device for detecting line quality of electric circuit | |
| CN211148807U (en) | Pull-load test fixture | |
| CN220491221U (en) | Control circuit capable of automatically adjusting test temperature | |
| CN205450134U (en) | HDMI -CEC function detection circuitry and HDMI -CEC functional test frock | |
| US9063169B2 (en) | Apparatus and method for measuring electrical parameters of circuit | |
| CN108132445B (en) | Detection device of linear power supply | |
| CN212932876U (en) | On-board relay contact detection circuit | |
| CN210119553U (en) | Detection apparatus for whether short circuit exists between each pin of DB plug | |
| CN218956671U (en) | Isolation detection circuit and control board for alternating current input voltage of commercial power | |
| TWI772075B (en) | Electric circuit line quality detection device | |
| CN216885776U (en) | Test device for heating mechanism of cup baking machine | |
| CN214750559U (en) | Loop impedance detection device | |
| CN2304130Y (en) | D. C. resistance detecting instrument | |
| CN114784783A (en) | Automatic identification selection input power supply system | |
| CN212060495U (en) | Fault test vector generating circuit | |
| CN210572628U (en) | Device for testing feedback circuit of PG motor | |
| CN109828188B (en) | Inductance measuring device for direct current reactor of medium voltage frequency converter | |
| CN221056644U (en) | Handheld adjustable load device | |
| CN110703154A (en) | Socket test circuit and broadcast control method for socket test | |
| CN219475739U (en) | Energy-saving alternating-current charging pile aging equipment | |
| CN220820160U (en) | LED lamp strip detection device | |
| CN219676154U (en) | Overload testing device for piezoresistor of power supply product | |
| CN221573141U (en) | Detection device for computer expansion equipment | |
| CN217879519U (en) | Automatic test circuit and electronic equipment | |
| CN112363103B (en) | Communication time delay detection device and detection method for intelligent electric energy meter |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |