CN220455511U - Calibration adapter for semiconductor discrete device test system - Google Patents
Calibration adapter for semiconductor discrete device test system Download PDFInfo
- Publication number
- CN220455511U CN220455511U CN202321857836.4U CN202321857836U CN220455511U CN 220455511 U CN220455511 U CN 220455511U CN 202321857836 U CN202321857836 U CN 202321857836U CN 220455511 U CN220455511 U CN 220455511U
- Authority
- CN
- China
- Prior art keywords
- discrete device
- bottom plate
- semiconductor discrete
- test system
- device test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 32
- 239000004065 semiconductor Substances 0.000 title claims abstract description 23
- 239000002356 single layer Substances 0.000 claims description 3
- 241000234295 Musa Species 0.000 abstract description 5
- 235000018290 Musa x paradisiaca Nutrition 0.000 abstract description 5
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000002035 prolonged effect Effects 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses a calibration adapter of a semiconductor discrete device testing system, which comprises a bottom plate, a socket and a precise resistor group, wherein the precise resistor group consists of a group of precise resistors with different resistance values and is respectively arranged on the bottom plate; the sockets are banana head sockets and are welded on the bottom plate. The utility model can connect different precision resistors for calibration according to the requirements of a calibrated semiconductor discrete device test system, ensures good line contact and prolongs the service life due to the banana head socket, and can calibrate the fixed position for the test of the precision resistor group so as to reduce errors introduced by leads.
Description
Technical Field
The utility model relates to the field of calibration of semiconductor test systems, in particular to a calibration adapter of a semiconductor discrete device test system.
Background
The semiconductor discrete device testing system is used for screening and inspecting components in factories, research institutions and the like, and the device manufacturing factories are used for production testing, and the accuracy of the system is directly related to the judgment of the test results of the components. Most semiconductor discrete device testing systems calibrate the semiconductor discrete device by adopting standard resistors so as to ensure uniform magnitude and accurate and reliable testing results. Currently, calibration is performed using a single standard resistor connected to the test system one by one with clips or clips. This alignment method is prone to poor contact, resulting in increased lead resistance and thus greater alignment errors. Meanwhile, the service life of the lead wire of the resistor is shortened due to repeated use, and an operator must carefully check whether the metal clip or the clamping piece is connected correctly or not and prevent short circuit every time, so that the calibration efficiency is low.
Disclosure of Invention
The utility model aims to provide a calibration adapter for a semiconductor discrete device testing system, which is used for solving the problems of small grounding area, shortened service life of a terminal, easy misoperation, easy large test data error, low calibration efficiency and the like caused by adopting conventional clamping when the semiconductor discrete device testing system is calibrated.
The technical scheme adopted by the utility model is that the calibration adapter of the semiconductor discrete device testing system comprises a base plate, a socket and a precise resistor group, wherein the precise resistor group consists of a group of precise resistors with different resistance values, the precise resistors are respectively arranged on the base plate, one end of each resistor of the precise resistor group is uniformly led out to a public end socket through a base plate circuit, and the other end of each resistor of the precise resistor group is led out to an independent end socket through the base plate circuit.
Preferably, the precision resistor group accuracy is +/-0.1%, and the precision resistor group comprises ten resistors of 0.1 omega, 1 omega, 10 omega, 100 omega, 1k omega, 10k omega, 100k omega, 1M omega, 10M omega and 100M omega, wherein the resistor of 0.1 omega is in a four-wire system.
Preferably, the sockets are banana head sockets and are welded on the bottom plate.
Preferably, the precision resistor group is welded on the bottom plate.
Preferably, the bottom plate adopts a single-layer printed board.
Preferably, the four corners of the bottom plate bottom are respectively provided with a support leg, the support legs are arranged in the box body, the joints of the support legs and the box body are provided with buffer springs, the top of the box body is hinged with a cover body, and the inner wall of the cover body is provided with a sponge cushion block corresponding to the bottom plate.
Compared with the prior art, the utility model has the beneficial effects that different precision resistors can be connected for calibration according to the requirements of a calibrated semiconductor discrete device test system, and the banana head socket is adopted, so that good line contact is ensured, the service life is prolonged, the calibration can be carried out on the fixed position of the precision resistor group for testing, the error introduced by a lead is reduced, and the problems of small grounding area, shortened service life of a terminal, easy misoperation, easy larger test data error, low calibration efficiency and the like caused by adopting conventional clamping when the semiconductor discrete device test system is calibrated are effectively solved.
Drawings
FIG. 1 is a schematic top view of the present utility model;
fig. 2 is a front view of the present utility model.
Detailed Description
The utility model will be further explained in relation to the drawings of the specification, so as to be better understood by those skilled in the art.
As shown in fig. 1-2, a semiconductor discrete device test system calibration adapter includes a base plate 1, a socket, and a precision resistor group 3. The base plate 1 is a single-layer printed board, the precise resistor group 3 is composed of a group of precise resistors with different resistance values, the precise resistors are respectively welded on the base plate 1, one end of each resistor of the precise resistor group 3 is uniformly led out to the public end socket 2 through a base plate circuit, and the other end of each resistor is led out to the independent end socket 4 through the base plate circuit.
Further, the precision resistor group 3 has an accuracy of ±0.1%, and includes ten resistors of 0.1Ω, 1Ω, 10Ω, 100deg.OMEGA, 1kΩ, 10kΩ, 100deg.KΩ, 1mΩ, 10mΩ, and 100deg.mΩ, where the resistor of 0.1 Ω is four-wire. Different precision resistors can be connected for calibration according to the requirements of a calibrated semiconductor discrete device testing system, and the test of the precision resistor group 3 can be calibrated at a fixed position, so that errors introduced by leads are reduced.
Furthermore, the sockets are banana head sockets and are welded on the bottom plate 1, so that good circuit contact is ensured, and the service life is prolonged.
The bottom four corners of the bottom plate 1 are respectively provided with the supporting feet 5, the supporting feet are arranged in the box body 6, the buffer springs 7 are arranged at the joints of the supporting feet 5 and the box body 6, the shock absorption effect is achieved, the top of the box body 6 is hinged with the cover body 8, the inner wall of the cover body 8 is provided with the sponge cushion block 9 corresponding to the bottom plate 1, the box body 6 protects the bottom plate 1 and components on the bottom plate 1, and when the cover body 8 is folded, the sponge cushion block 9 contacts with the socket and the precision resistor bank 3 to protect the socket and the precision resistor bank 3.
When the utility model is used for calibrating the semiconductor discrete device testing system, the working is stable, the method is scientific and reasonable, the uncertainty of the measurement result is small, the testing data is accurate and reliable, and the consistency is good.
Claims (6)
1. The utility model provides a semiconductor discrete device test system calibration adapter which characterized in that, includes bottom plate, socket and accurate resistance group, accurate resistance group comprises the accurate resistance of a set of different resistance values, installs on the bottom plate respectively, and every resistance one end of accurate resistance group is drawn forth to public end socket through the bottom plate circuit unification, and the other end is drawn forth to independent end socket through the bottom plate circuit respectively.
2. The semiconductor discrete device test system calibration adapter of claim 1 wherein the precision resistor group accuracy is ± 0.1% comprising ten resistors of 0.1 Ω, 1 Ω, 10 Ω, 100 Ω, 1k Ω, 10k Ω, 100k Ω, 1mΩ, 10mΩ, 100mΩ, wherein 0.1 Ω resistor is four wire.
3. The semiconductor discrete device test system calibration adapter of claim 1 wherein the sockets are banana-head sockets and are soldered to the base plate.
4. A semiconductor discrete device test system calibration adapter as recited in claim 1, wherein said precision resistor group is soldered to the base plate.
5. A semiconductor discrete device test system calibration adapter as recited in claim 1, wherein said backplane is a single layer printed board.
6. The calibration adapter for a semiconductor discrete device testing system according to claim 1, wherein the four corners of the bottom plate are respectively provided with a support leg, the support legs are arranged in the box body, the connection part of the support legs and the box body is provided with a buffer spring, the top of the box body is hinged with a cover body, and the inner wall of the cover body is provided with a sponge cushion block corresponding to the bottom plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321857836.4U CN220455511U (en) | 2023-07-14 | 2023-07-14 | Calibration adapter for semiconductor discrete device test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321857836.4U CN220455511U (en) | 2023-07-14 | 2023-07-14 | Calibration adapter for semiconductor discrete device test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220455511U true CN220455511U (en) | 2024-02-06 |
Family
ID=89738620
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321857836.4U Active CN220455511U (en) | 2023-07-14 | 2023-07-14 | Calibration adapter for semiconductor discrete device test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220455511U (en) |
-
2023
- 2023-07-14 CN CN202321857836.4U patent/CN220455511U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP3491824B2 (en) | Test instrument for matching impedance test | |
| CN220455511U (en) | Calibration adapter for semiconductor discrete device test system | |
| US3537000A (en) | Electrical probe including pivotable contact elements | |
| US4290015A (en) | Electrical validator for a printed circuit board test fixture and a method of validation thereof | |
| KR0155573B1 (en) | Device for testing semiconductor device | |
| CN212060337U (en) | PCB performance testing device | |
| JPH1019960A (en) | Translator fixing unit for testing printed wiring board | |
| US10739382B2 (en) | Testing apparatus having a configurable probe fixture | |
| JPH07254468A (en) | Ic measuring socket | |
| JPH0829475A (en) | Contact probe of mounted substrate inspection device | |
| CN215005746U (en) | Detection apparatus suitable for multiple FPC board | |
| CN219104997U (en) | Test seat for dual-chip simultaneous measurement | |
| CN209878819U (en) | High-density LED circuit board test jig | |
| CN217116490U (en) | PCB and probe card | |
| CN212410773U (en) | Portable analog quantity processing plate checking device for nuclear power station | |
| CN215493738U (en) | Clamp for four-wire test of sheet resistor | |
| CN211374829U (en) | Aging board test equipment | |
| CN213843887U (en) | Automatic testing jig for digital temperature controller | |
| CN218003570U (en) | Electronic element test seat | |
| KR102572320B1 (en) | Adapter for test apparatus | |
| CN220855050U (en) | Filter tester | |
| WO2024057188A1 (en) | Foldable test bench | |
| CN218037201U (en) | Chip testing device | |
| CN217954497U (en) | Device for measuring sheet resistance of flexible electrode | |
| CN115097173B (en) | Golden finger, circuit board assembly and test equipment |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |