CN220362373U - Automatic probe card needle grinding machine - Google Patents
Automatic probe card needle grinding machine Download PDFInfo
- Publication number
- CN220362373U CN220362373U CN202322019726.7U CN202322019726U CN220362373U CN 220362373 U CN220362373 U CN 220362373U CN 202322019726 U CN202322019726 U CN 202322019726U CN 220362373 U CN220362373 U CN 220362373U
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- Prior art keywords
- probe card
- grinding
- cleaning
- polishing
- roller
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- 239000000523 sample Substances 0.000 title claims abstract description 59
- 238000004140 cleaning Methods 0.000 claims abstract description 34
- 238000005498 polishing Methods 0.000 claims abstract description 30
- 230000005540 biological transmission Effects 0.000 claims abstract description 12
- 230000003028 elevating effect Effects 0.000 claims abstract description 6
- 238000009434 installation Methods 0.000 claims description 2
- 238000000034 method Methods 0.000 abstract description 6
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 230000001681 protective effect Effects 0.000 description 5
- 239000004744 fabric Substances 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Abstract
The application provides an automatic probe card grinds needle machine belongs to probe card production technical field. The automatic probe card needle grinding machine comprises a base, a lifting mechanism and a fixing mechanism, wherein the lifting mechanism and the fixing mechanism are arranged on the base, a bearing platform is arranged on the lifting mechanism, an abrasive belt grinding mechanism and a cleaning piece are arranged at the top of the bearing platform, the abrasive belt grinding mechanism and the cleaning piece are used for grinding probe card probes and can circularly rotate, and the cleaning piece is in transmission connection with the abrasive belt grinding mechanism and is used for cleaning the abrasive belt grinding mechanism. Through installing loading platform on elevating system, loading platform is last to install circulation pivoted abrasive band grinding machanism, and then makes abrasive band circulation rotate to realize the purpose of polishing to the probe, abrasive band grinding machanism is connected with the clearance piece transmission simultaneously, and then the sweeps that produce in the process of polishing follow abrasive band grinding machanism motion, further realize automatic clearance through the clearance piece, and then need not shut down the clearance sweeps, improved probe efficiency of polishing to a certain extent.
Description
Technical Field
The application relates to the field of probe card production, in particular to an automatic probe card needle grinding machine.
Background
The probe card is an interface between the electronic test system and the semiconductor wafer, and probes thereof need to be subjected to a grinding process during the production process of the probe card so as to ensure the normal use of the probe card.
The utility model patent with the patent number of CN214603745U discloses a probe card probe grinding device, which can realize automatic grinding of a probe card probe, can improve grinding efficiency, can control the grinding length of a probe card tip and can improve the quality of a finished product, and comprises a base, a fixing mechanism, a lifting mechanism, a horizontal moving mechanism and a grinding table, wherein the fixing mechanism, the lifting mechanism, the horizontal moving mechanism and the grinding table are arranged on the base.
In the above scheme, the lifting mechanism drives the grinding table to lift and contact with the probe card probe, and the horizontal moving mechanism drives the grinding table to horizontally move so as to realize the grinding purpose of the probe card, however, the inventor finds that in the grinding process of the probe, scraps can be generated and stay on the grinding table, and as the probe card probe grinding process is continuously carried out, scraps can be accumulated on the grinding table, the scraps cannot be cleaned timely, and the scraps are contacted with the probe, so that the grinding quality of the probe is influenced, and therefore, the scraps need to be cleaned continuously in the grinding process, and the grinding efficiency of the probe can be influenced to a certain extent.
Disclosure of Invention
In order to overcome the defects, the application provides an automatic probe card needle grinding machine, which aims to solve the problem that waste scraps need to be cleaned frequently in the prior art.
The embodiment of the application provides an automatic probe card needle grinding machine, including elevating system and fixed establishment on base and the installation base, install loading platform on the elevating system, loading platform installs at the top and is used for polishing probe card probe and circulated pivoted abrasive band grinding machanism and clearance piece, the clearance piece with abrasive band grinding machanism transmission is connected, and is used for clearance abrasive band grinding machanism.
In a specific embodiment, a mounting opening is formed in a side wall of one end of the bearing platform, a chip removing bucket is mounted in the mounting opening, and the chip removing bucket is located below the cleaning piece.
In a specific embodiment, the abrasive belt polishing mechanism comprises a driving roller and a driven roller which are arranged at the top of the bearing platform, the same polishing abrasive belt is wound on the driving roller and the driven roller, a driving motor for driving the driving roller to rotate is connected to the driving roller, and the driving roller is in transmission connection with the cleaning piece.
In a specific embodiment, a plurality of supporting blocks are fixedly arranged on the top of the bearing platform, the same supporting plate is fixedly arranged on the tops of the supporting blocks, and the polishing abrasive belt slides on the supporting plate.
In a specific embodiment, the cleaning member is a cleaning roller mounted on the bearing platform, a cleaning brush contacting with the polishing abrasive belt is arranged on the cleaning roller, and an inner shaft of the cleaning roller is in transmission connection with an inner shaft of the driving roller.
In a specific embodiment, a first flat gear is connected to the shaft of the driving roller, a second flat gear is connected to the shaft of the cleaning roller, and the first flat gear is meshed with the second flat gear.
In a specific embodiment, a protective cover is mounted on the bearing platform, and the protective cover is covered on the first flat gear and the second flat gear.
In a specific embodiment, a collection box is placed on top of the base, the collection box being located below the chip hopper outlet.
The beneficial effects of this application: through installing loading platform on elevating system, loading platform is last to install circulation pivoted abrasive band grinding machanism, and then makes abrasive band circulation rotate to realize the purpose of polishing to the probe, abrasive band grinding machanism is connected with the clearance piece transmission simultaneously, and then the sweeps that produce in the process of polishing follow abrasive band grinding machanism motion, further realize automatic clearance through the clearance piece, and then need not shut down the clearance sweeps, improved probe efficiency of polishing to a certain extent.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the embodiments will be briefly described below, it being understood that the following drawings only illustrate some examples of the present application and therefore should not be considered as limiting the scope, and that other related drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic view of a first view angle structure of an automatic probe card grinding machine according to an embodiment of the present application;
fig. 2 is a schematic diagram of a second view angle structure of an automatic probe card grinding machine according to an embodiment of the present application;
fig. 3 is a schematic structural view of an abrasive belt polishing mechanism and a cleaning member in an automatic probe card polishing machine according to an embodiment of the present application.
In the figure: 10-a base; 110-a collection box; 20-lifting mechanism; 30-a fixing mechanism; 40-bearing platform; 410-a mounting port; 420-chip removing hopper; 430-supporting blocks; 440-supporting plates; 450-protecting cover; 50-an abrasive belt polishing mechanism; 510-a drive roll; 520-driven roller; 530-sanding the abrasive belt; 540-a drive motor; 60-cleaning piece; 610-cleaning rollers; 70-a first flat gear; 710-second flat gear.
Detailed Description
The technical solutions in the embodiments of the present application will be described below with reference to the drawings in the embodiments of the present application.
Referring to fig. 1-3, the present application provides an automatic probe card needle grinding machine, including a base 10, and a lifting mechanism 20 and a fixing mechanism 30 mounted on the base 10, it should be noted that, the specific structures and control modes of the lifting mechanism 20 and the fixing mechanism 30 are all in the prior art, a bearing platform 40 is mounted on the lifting mechanism 20, an abrasive belt polishing mechanism 50 and a cleaning member 60 for polishing probe card probes and capable of circularly rotating are mounted on the top of the bearing platform 40, the cleaning member 60 is in transmission connection with the abrasive belt polishing mechanism 50, and is used for cleaning the abrasive belt polishing mechanism 50, the probe card is fixed on the fixing mechanism 30, and the bearing platform 40 is driven to rise via the lifting mechanism 20, so that the probe card probes are contacted with an abrasive belt, and further polishing purposes are achieved.
The mounting opening 410 has been seted up on the one end lateral wall of loading platform 40, installs the chip removal fill 420 in the mounting opening 410, chip removal fill 420 is located clearance piece 60 below, chip removal fill 420 and mounting opening 410 specific connection structure be prior art, and the sweeps clear up in chip removal fill 420 through clearance piece 60 to realize the sweeps and discharge downwards.
The belt sander 50 comprises a driving roller 510 and a driven roller 520 mounted on the top of the carrying platform 40, specifically, two sets of fixing blocks are mounted on the top of the carrying platform 40, each set of fixing blocks is another and parallel to each other, the inner shaft of the driving roller 510 rotates to penetrate through the fixing blocks of the same set, and similarly, the driven roller 520 is also arranged on the driving roller 510 and the driven roller 520, the same sanding belt 530 is wound on the driving roller 510 and the driven roller 520, the shaft of the driving roller 510 is connected with a driving motor 540 for driving the driving roller to rotate, the driving motor 540 is mounted on one of the fixing blocks, the driving shaft of the driving motor is connected with the driving roller 510, and the shaft of the driving motor is in transmission connection with the cleaning member 60.
The bearing platform 40 top fixed mounting has a plurality of supporting shoe 430, and a plurality of supporting shoe 430 top fixed mounting has same backup pad 440, and the abrasive band 530 of polishing slides on backup pad 440, and backup pad 440 is used for the support to abrasive band 530 of polishing, prevents that it from when polishing, with the contact inadequately between the probe.
The cleaning member 60 is a cleaning roller 610 installed on the carrying platform 40, a cleaning brush (not shown in the figure) contacting with the polishing abrasive belt 530 is disposed on the cleaning roller 610, and an internal shaft thereof is in transmission connection with an internal shaft of the driving roller 510, specifically, two obliquely disposed fixing blocks are installed at the bottom of the carrying platform 40, and the shaft rotation of the cleaning roller 610 is disposed through the two fixing blocks.
The shaft of the driving roller 510 is connected with a first flat gear 70, the shaft of the cleaning roller 610 is connected with a second flat gear 710, the first flat gear 70 and the second flat gear 710 are meshed, the bearing platform 40 is provided with a protective cover 450, the protective cover 450 is covered on the first flat gear 70 and the second flat gear 710, and the protective cover 450 is used for protecting the first flat gear 70 and the second flat gear 710.
The collecting box 110 is placed on the top of the base 10, the collecting box 110 is located below the outlet of the chip removing hopper 420, and when the chip removing hopper 420 is specifically arranged, the bottom of the chip removing hopper 420 can be connected with a cloth bag, so that the bottom of the cloth bag is placed in the collecting box 110.
When the automatic probe card needle grinding machine is used: the probe card is fixed on the fixing mechanism 30, then the lifting mechanism 20 and the driving motor 540 can be started, the lifting mechanism 20 drives the bearing platform 40 to move upwards, the polishing abrasive belt 530 is further contacted with the probe, meanwhile, the driving motor 540 drives the driving roller 510 to rotate, the purpose of circularly rotating the polishing abrasive belt 530 is achieved, the purpose of automatically polishing the probe is achieved, further, the driving roller 510 drives the cleaning roller 610 to rotate through the first flat gear 70 and the second flat gear 710, the cleaning roller 610 can clean scraps on the polishing abrasive belt 530, the scraps can be cleaned into the chip removing hopper 420, and the scraps can be further discharged into the collecting box 110.
It should be noted that, the specific model specification of the driving motor 540 needs to be determined by selecting a model according to the actual specification of the device, and the specific model selection calculation method adopts the prior art in the field, so that detailed description is omitted.
The power supply of the driving motor 540 and its principle will be apparent to those skilled in the art and will not be described in detail herein.
The foregoing is merely exemplary embodiments of the present application and is not intended to limit the scope of the present application, and various modifications and variations may be suggested to one skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principles of the present application should be included in the protection scope of the present application. It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, it need not be further defined and explained in the following figures 。
Claims (8)
1. The utility model provides an automatic probe card grinds needle machine, its characterized in that includes elevating system (20) and fixed establishment (30) on base (10) and installation base (10), install loading platform (40) on elevating system (20), but loading platform (40) top is installed and is used for polishing probe card probe and circulated pivoted abrasive band grinding machanism (50) and clearance piece (60), clearance piece (60) with abrasive band grinding machanism (50) transmission is connected, and is used for clearance abrasive band grinding machanism (50).
2. The automatic probe card needle grinding machine according to claim 1, wherein a mounting opening (410) is formed in a side wall of one end of the bearing platform (40), a chip removing bucket (420) is mounted in the mounting opening (410), and the chip removing bucket (420) is located below the cleaning piece (60).
3. An automatic probe card needle grinder according to claim 2, wherein the abrasive belt grinding mechanism (50) comprises a driving roller (510) and a driven roller (520) which are mounted on the top of the bearing platform (40), the same abrasive belt (530) is wound on the driving roller (510) and the driven roller (520), a driving motor (540) for driving the driving roller (510) to rotate is connected on the shaft of the driving roller (510), and the shaft of the driving roller is in transmission connection with the cleaning member (60).
4. An automatic probe card needle grinder according to claim 3, wherein a plurality of supporting blocks (430) are fixedly mounted on the top of the bearing platform (40), the same supporting plate (440) is fixedly mounted on the top of a plurality of supporting blocks (430), and the polishing abrasive belt (530) slides on the supporting plate (440).
5. An automatic probe card needle grinder according to claim 3 or 4, wherein the cleaning member (60) is a cleaning roller (610) mounted on the carrying platform (40), the cleaning roller (610) is provided with a cleaning brush contacting with the polishing abrasive belt (530), and an inner shaft thereof is in transmission connection with an inner shaft of the driving roller (510).
6. The automatic probe card needle grinding machine according to claim 5, wherein a first flat gear (70) is connected to the shaft of the driving roller (510), a second flat gear (710) is connected to the shaft of the cleaning roller (610), and the first flat gear (70) is meshed with the second flat gear (710).
7. The automatic probe card needle grinder of claim 6, wherein a shield (450) is mounted on the carrying platform (40), and the shield (450) is covered on the first flat gear (70) and the second flat gear (710).
8. An automatic probe card needle grinder according to claim 2, wherein a collection box (110) is placed on top of the base (10), and the collection box (110) is located below the outlet of the chip hopper (420).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322019726.7U CN220362373U (en) | 2023-07-31 | 2023-07-31 | Automatic probe card needle grinding machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322019726.7U CN220362373U (en) | 2023-07-31 | 2023-07-31 | Automatic probe card needle grinding machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220362373U true CN220362373U (en) | 2024-01-19 |
Family
ID=89517000
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202322019726.7U Active CN220362373U (en) | 2023-07-31 | 2023-07-31 | Automatic probe card needle grinding machine |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220362373U (en) |
-
2023
- 2023-07-31 CN CN202322019726.7U patent/CN220362373U/en active Active
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