CN220252107U - Test circuit and test board card - Google Patents

Abstract

The utility model discloses a test circuit and a test board card, wherein the test circuit comprises a plurality of driving/detecting units which are sequentially ordered; each floating voltage source/meter channel is connected with the tested unit in a one-to-one correspondence manner through each driving/detecting unit; the driving/detecting unit comprises a high-end driving branch, a low-end driving branch, a high-end detecting branch and a low-end detecting branch; the high-end driving branch and the high-end detection branch are electrically connected with the first end of the tested unit connected with the driving/detection unit; the low-end driving branch and the low-end detection branch are electrically connected with the second end of the tested unit connected with the driving/detection unit; the test circuit further comprises a plurality of drive series switches; the drive series switch is connected between the low-side drive leg of the drive/sense unit and the high-side drive leg of the next adjacent drive/sense unit. By adopting the technical scheme, the output voltage and the testing capability of the test board card are improved, and the testing cost is reduced.

Description

Test circuit and test board card

Technical Field

The present utility model relates to the field of integrated circuit testing technology, and in particular, to a test circuit and a test board.

Background

In integrated circuit testing, signal excitation and voltage and current measurement are required to be performed on a chip, and in order to improve the testing efficiency, a plurality of floating voltage sources/meter channels are required to be arranged so as to perform a plurality of chip tests simultaneously.

However, when the tested chip has a high-voltage test requirement, the common method is to increase the voltage capability of a single channel, so that the number of channels of a single board card is sacrificed to replace the increase of the single-channel voltage capability to avoid electromagnetic radiation interference, and when the same number of test requirements are met, more board cards are required to be configured to realize the test purpose, so that the test cost is increased. In addition, in the actual testing process, if all channels are required to perform serial output collection, the design is generally performed on a testing board, and the serial output collection is performed by adopting a single board card, so that the testing difficulty and the testing cost are increased.

Disclosure of Invention

The utility model provides a test circuit and a test board card, which are used for improving the test capability of the board card and reducing the test cost.

According to an aspect of the present utility model, there is provided a test circuit for connecting a plurality of floating voltage source/meter channels and a plurality of units under test of a controller; the test circuit includes: a plurality of driving/detecting units sequentially ordered; each floating voltage source/meter channel is connected with the tested unit in a one-to-one correspondence through each driving/detecting unit;

The driving/detecting unit comprises a high-end driving branch, a low-end driving branch, a high-end detecting branch and a low-end detecting branch; the high-end driving branch circuit and the high-end detection branch circuit are electrically connected with the first end of the tested unit connected with the driving/detection unit; the low-end driving branch and the low-end detection branch are electrically connected with the second end of the tested unit connected with the driving/detection unit;

the test circuit further comprises a plurality of drive series switches; the drive series switch is connected between the low-side drive leg of the drive/sense unit and the high-side drive leg of the next adjacent drive/sense unit.

Optionally, the test circuit further includes a plurality of detection series switches;

the detection series switch is connected between the low-side detection branch of the driving/detection unit and the high-side detection branch of the next adjacent driving/detection unit.

Optionally, the high-side driving branch circuit includes a first high-side driving switch; the low-side driving branch circuit comprises a first low-side driving switch; the high-end detection branch circuit comprises a first high-end detection switch; the low-end detection branch circuit comprises a first low-end detection switch;

The floating voltage source/meter channel comprises a high-end driving end, a low-end driving end, a high-end detection end and a low-end detection end; each high-end driving end is electrically connected with the first end of each unit to be tested through each first high-end driving switch; each low-end driving end is electrically connected with the second end of each unit under test through each first low-end driving switch; each high-end detection end is electrically connected with the first end of each unit to be detected through each first high-end detection switch; each low-end detection end is electrically connected with the second end of each unit to be detected through each first low-end detection switch.

Optionally, a first end of the driving series switch is electrically connected with a second end of the tested unit connected with the driving/detecting unit through the first low-end driving switch of the driving/detecting unit; the second end of the driving series switch is electrically connected with the first end of the tested unit connected with the next adjacent driving/detecting unit through the first high-end driving switch of the next adjacent driving/detecting unit.

Optionally, the test circuit includes a series test mode;

in the series test mode, the first high-side drive switch and the first high-side detection switch of the first drive/detection unit, the first low-side drive switch and the first low-side detection switch of the last drive/detection unit, and the drive series switch are all closed, and the first low-side drive switch and the first low-side detection switch of the first drive/detection unit, the first high-side drive switch, the first low-side drive switch, the first high-side detection switch and the first low-side detection switch of the drive/detection unit, and the first high-side drive switch and the first high-side detection switch of the last drive/detection unit are all closed.

Optionally, the method further comprises: a high-side drive bus, a low-side drive bus, a high-side detection bus, and a low-side detection bus;

the high-end driving branch circuit further comprises a second high-end driving switch and a third high-end driving switch; in each driving/detecting unit, the first high-side driving switch, the second high-side driving switch and the third high-side driving switch are connected to a high-side driving node; each first high-end driving switch is also electrically connected with a first end of each tested unit; each second high-end driving switch is also electrically connected with each high-end driving end; each third high-side drive switch is also electrically connected with the same high-side drive bus;

the low-end driving branch circuit further comprises a second low-end driving switch and a third low-end driving switch; in each driving/detecting unit, the first low-side driving switch, the second low-side driving switch and the third low-side driving switch are connected to a low-side driving node; each first low-end driving switch is also electrically connected with the second end of each tested unit; each second low-end driving switch is also electrically connected with each low-end driving end; each third low-side drive switch is also electrically connected with the same low-side drive bus;

The high-end detection branch circuit further comprises a second high-end detection switch and a third high-end detection switch; in each driving/detecting unit, the first high-side detecting switch, the second high-side detecting switch and the third high-side detecting switch are connected to a high-side detecting node; each first high-end detection switch is also electrically connected with a first end of each unit to be detected; each second high-end detection switch is also electrically connected with each high-end detection end; each third high-end detection switch is also electrically connected with the same high-end detection bus;

the low-end detection branch circuit further comprises a second low-end detection switch and a third low-end detection switch; in each driving/detecting unit, the first low-side detecting switch, the second low-side detecting switch and the third low-side detecting switch are connected to a low-side detecting node; each first low-end detection switch is also electrically connected with the second end of each unit to be detected; each second low-end detection switch is also electrically connected with each low-end detection end; each third low-side detection switch is also electrically connected with the same low-side detection bus.

Optionally, the method further comprises: an external high-side drive switch, an external low-side drive switch, an external high-side detection switch, and an external low-side detection switch;

The high-side driving bus is electrically connected with a first driving end of an external voltage/current source through the external high-side driving switch; the low-side drive bus is electrically connected with the second drive end of the external voltage/current source through the external low-side drive switch;

the high-side detection bus is electrically connected with a first detection end of the external voltage/current source through the external high-side detection switch; the low-side detection bus is electrically connected with a second detection end of the external voltage/current source through the external low-side detection switch.

Optionally, the method further comprises: a high-side drive calibration switch, a low-side drive calibration switch, a high-side detection calibration switch and a low-side detection calibration switch;

the high-end driving bus is electrically connected with the high end of the calibrating device through the high-end driving calibrating switch; the low-side driving bus is electrically connected with the low side of the calibrating device through the low-side driving calibrating switch;

the high-end detection bus is electrically connected with the high end of the calibration device through the high-end detection calibration switch; the low-side detection bus is electrically connected with the low side of the calibrating device through the low-side detection calibrating switch.

Optionally, the method further comprises: a high-side self-checking switch and a low-side self-checking switch;

The high-end driving bus is electrically connected with the high-end detection bus through the high-end self-detection switch; the low-side driving bus is electrically connected with the low-side detecting bus through the low-side self-detecting switch.

According to another aspect of the present utility model, there is provided a test board including the above test circuit.

According to the technical scheme, through the driving/detecting units, each floating voltage source/meter channel and each detected unit are correspondingly connected, the driving/detecting units comprise a high-end driving branch, a low-end driving branch, a high-end detecting branch and a low-end detecting branch, and the Kelvin four-wire method can be adopted to accurately detect each detected unit; the voltage sources in the adjacent floating voltage source/meter channels can be connected in series through driving the series switch, the voltage sources in the floating voltage source/meter channels are overlapped, the output voltage is improved, the voltage of the low-end driving end of the voltage source of the previous floating voltage source/meter channel is equal to the voltage of the high-end driving end of the voltage source of the next floating voltage source/meter channel, mutual electromagnetic radiation interference of adjacent driving/detecting units is avoided, the number of the floating voltage source/meter channels and the number of the driving/detecting units on a single board can be improved, the testing capability of the board where the testing circuit is located is improved, the testing efficiency is further improved, and the testing cost is reduced.

It should be understood that the description in this section is not intended to identify key or critical features of the embodiments of the utility model or to delineate the scope of the utility model. Other features of the present utility model will become apparent from the description that follows.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present utility model, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.

FIG. 1 is a schematic diagram of a test circuit according to an embodiment of the present utility model;

FIG. 2 is a schematic diagram of yet another test circuit provided by an embodiment of the present utility model;

fig. 3 is a schematic diagram of yet another test circuit according to an embodiment of the present utility model.

Wherein 10, 20, 30, & gtis a drive/detection unit, 11 is a high-side drive bus, 12 is a low-side drive bus, 13 is a high-side sense bus, and 14 is a low-side sense bus.

Detailed Description

In order that those skilled in the art will better understand the present utility model, a technical solution in the embodiments of the present utility model will be clearly and completely described below with reference to the accompanying drawings in which it is apparent that the described embodiments are only some embodiments of the present utility model, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the present utility model without making any inventive effort, shall fall within the scope of the present utility model.

It should be noted that the terms "first," "second," and the like in the description and the claims of the present utility model and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that the embodiments of the utility model described herein may be implemented in sequences other than those illustrated or otherwise described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.

Fig. 1 is a schematic diagram of a test circuit according to an embodiment of the present utility model. Referring to fig. 1, the test circuit includes a plurality of driving/detecting units (10, 20, 30) sequentially ordered; the floating voltage source/meter channels (01, 02, 03) connected with the controller are connected with the tested units (D1, D2, D3) in a one-to-one correspondence through the driving/detecting units (10, 20, 30).

Taking the example that the test circuit includes three driving/detecting units, the driving/detecting unit 10 includes a high-end driving branch FH1, a low-end driving branch FL1, a high-end detecting branch SH1, and a low-end detecting branch SL1, where the high-end driving branch FH1 and the high-end detecting branch SH1 are electrically connected to a first end of the detected unit D1 connected to the driving/detecting unit 10, and the low-end driving branch FL1 and the low-end detecting branch SL1 are electrically connected to a second end of the detected unit D1 connected to the driving/detecting unit 10; the driving/detecting unit 20 includes a high-end driving branch FH2, a low-end driving branch FL2, a high-end detecting branch SH2, and a low-end detecting branch SL2, where the high-end driving branch FH2 and the high-end detecting branch SH2 are electrically connected to a first end of the unit under test D2 connected to the driving/detecting unit 20, and the low-end driving branch FL2 and the low-end detecting branch SL2 are electrically connected to a second end of the unit under test D2 connected to the driving/detecting unit 20; the driving/detecting unit 30 includes a high-end driving branch FH3, a low-end driving branch FL3, a high-end detecting branch SH3, and a low-end detecting branch SL3, where the high-end driving branch FH3 and the high-end detecting branch SH3 are electrically connected to a first end of the unit under test D3 connected to the driving/detecting unit 30, and the low-end driving branch FL3 and the low-end detecting branch SL3 are electrically connected to a second end of the unit under test D3 connected to the driving/detecting unit 30.

With continued reference to FIG. 1, the test circuit also includes a plurality of drive series switches (KSF 01, KSF 02). Taking the test circuit including three driving/detecting units as an example, the driving serial switch KSF01 is connected between the low-side driving branch FL1 of the driving/detecting unit 10 and the high-side driving branch FH2 of the next adjacent driving/detecting unit 20; the drive series switch KSF02 is connected between the low-side drive leg FL2 of the drive/detection unit 20 and the high-side drive leg FH3 of the next adjacent drive/detection unit 30.

The controller can control each floating voltage source/meter channel (01, 02, 03) to output a floating voltage source to each tested unit (D1, D2, D3) through each driving/detecting unit (10, 20, 30), and can also control each floating voltage source/meter channel (01, 02, 03) to detect the voltage at two ends of each tested unit (D1, D2, D3) through each driving/detecting unit (10, 20, 30). Each unit under test (D1, D2, D3) can be a unit under test in different devices under test, the devices under test include but are not limited to chips under test, the units under test include but are not limited to circuits composed of resistors; alternatively, each unit under test (D1, D2, D3) may be a unit under test in the same device under test; alternatively, the units (D1, D2, D3) to be tested may be located in the same device to be tested, and at least two units (D1, D2, D3) to be tested have a circuit structure partially shared by them.

Each unit under test (D1, D2, D3) has two ports, namely a first end and a second end, for convenience of understanding, the units under test (D1, D2, D3) are located in the same device under test and are adjacent in sequence, namely, the second end of the first unit under test D1 is multiplexed with the first end of the second unit under test D2, the second end of the second unit under test D2 is multiplexed with the first end of the third unit under test D3, for example, the first port C0 is the first end of the unit under test D1, the second port C1 is the second end of the unit under test D1 and the first end of the unit under test D2, the third port C2 is the second end of the unit under test D2 and the first end of the unit under test D3, and the fourth port C3 is the second end of the unit under test D3.

Illustratively, the floating voltage source/meter channel 01 detects the unit under test D1 using the kelvin four-wire method, and the floating voltage source/meter channel 01 provides a voltage source to the unit under test D1 through the high-side driving branch FH1 and the low-side driving branch FL1, and a current flows into the unit under test D1 from the high-side driving branch FH1 and flows out of the unit under test D1 from the low-side driving branch FL1, forming a loop, wherein the current value in the loop is known. The floating voltage source/meter channel 01 detects the voltages at two ends of the detected unit D1 through the high-end detection branch SH1 and the low-end detection branch SL1, the difference between the voltages of the high-end detection branch SH1 and the low-end detection branch SL1 is the voltage at two ends of the detected unit D1, and the resistance of the detected unit D1 can be measured according to ohm's law and the current value flowing through the detected unit D1 and the voltage at two ends of the detected unit D1. The same principle is adopted, the resistance of the measured unit D2 can be measured through the floating voltage source/meter channel 02, and the resistance of the measured unit D3 can be measured through the floating voltage source/meter channel 03, which will not be described herein. The resistances of the individual cells (D1, D2, D3) to be tested can be measured by means of the individual drive/detection units (10, 20, 30) via a plurality of floating voltage source/meter channels (01, 02, 03) connected by a controller.

Illustratively, with continued reference to FIG. 1, closing drive series switch KSF01 and drive series switch KSF02 may connect the low side of the voltage source in floating voltage source/meter channel 01 with the high side of the voltage source in floating voltage source/meter channel 02, and the low side of the voltage source in floating voltage source/meter channel 02 with the high side of the voltage source in floating voltage source/meter channel 03, i.e., drive series switch KSF01 may connect the voltage source in floating voltage source/meter channel 01 with the voltage source in floating voltage source/meter channel 02 in series, and drive series switch KSF02 may connect the voltage source in floating voltage source/meter channel 02 with the voltage source in floating voltage source/meter channel 03 in series. The voltage sources in the floating voltage source/meter channels (01, 02, 03) are connected in series, on one hand, the voltage sources in the floating voltage source/meter channels (01, 02, 03) can be overlapped, the floating voltage source/meter channels can be used as a whole as a large-range voltage source, corresponding to the voltage source to be tested, the unit to be tested can also be used as a whole to receive the electric signals of the large-range voltage source, so that the output voltage can be improved, and the voltage sources at the two ends of the unit to be tested (D1, D2, D3) can be controlled while the output voltage is improved, and the voltage source can be applied to chip tests requiring the voltage source series connection, such as BMS chip tests; on the other hand, by closing the drive series switch, the low-end drive end of the voltage source of the previous floating voltage source/meter channel and the high-end drive end of the voltage source of the next floating voltage source/meter channel are connected, the voltage of the low-end drive end of the voltage source of the previous floating voltage source/meter channel is equal to the voltage of the high-end drive end of the voltage source of the next floating voltage source/meter channel, so that the voltage of the low-end drive branch of the previous drive/detection unit is equal to the voltage of the high-end drive branch of the next drive/detection unit, mutual electromagnetic radiation interference of adjacent drive/detection units can be avoided, and the number of the floating voltage source/meter channels and the number of the drive/detection units on a single board card can be increased.

It should be noted that in an alternative embodiment, the test circuit includes 10 or more driving/detecting units, and the test circuit may be connected to 10 or more floating voltage source/meter channels and a corresponding number of units under test, so that the test efficiency may be improved and the test cost may be reduced.

In an alternative embodiment, only a part of the floating voltage source/meter channels may be connected in series, for example, the driving series switch KSF01 is turned off, the driving series switch KSF02 is turned on, and only the voltage source in the floating voltage source/meter channel 02 and the voltage source in the floating voltage source/meter channel 03 may be connected in series, so that the first end of the tested unit D2 has a higher voltage, so that according to the test requirement, the corresponding driving series switch may be turned on or off, and different numbers of floating voltage source/meter channels are connected in series, thereby improving the flexibility and convenience of the test.

According to the embodiment of the utility model, through a plurality of driving/detecting units, each floating voltage source/meter channel and each detected unit are correspondingly connected, and each driving/detecting unit comprises a high-end driving branch, a low-end driving branch, a high-end detecting branch and a low-end detecting branch, so that the accurate detection of each detected unit can be realized by adopting a Kelvin four-wire method; the voltage sources in the adjacent floating voltage source/meter channels can be connected in series through driving the series switch, the voltage sources in the floating voltage source/meter channels are overlapped, the output voltage is improved, the voltage of the low-end driving end of the voltage source of the previous floating voltage source/meter channel is equal to the voltage of the high-end driving end of the voltage source of the next floating voltage source/meter channel, mutual electromagnetic radiation interference of adjacent driving/detecting units is avoided, the number of the floating voltage source/meter channels and the number of the driving/detecting units on a single board can be improved, the testing capability of the board where the testing circuit is located is improved, the testing efficiency is further improved, and the testing cost is reduced.

Optionally, with continued reference to fig. 1, the test circuit further includes a plurality of detection series switches (KSS 01, KSS 02). Taking the test circuit including three driving/detecting units as an example, the detecting series switch KSS01 is connected between the low-side detecting branch SL1 of the driving/detecting unit 10 and the high-side detecting branch SH2 of the next adjacent driving/detecting unit 20, and the detecting series switch KSS02 is connected between the low-side detecting branch SL2 of the driving/detecting unit 20 and the high-side detecting branch SH3 of the next adjacent driving/detecting unit 30.

Illustratively, when the voltage source in the floating voltage source/meter channel 01 and the voltage source in the floating voltage source/meter channel 02 are connected in series, the voltage of the second end of the first unit under test D1 is equal to the voltage of the first end of the second unit under test D2, and the low-side detection branch SL1 in the driving/detecting unit 10 and the high-side detection branch SH2 in the driving/detecting unit 20 can be combined into one detection line by detecting the series switch KSS01, so that the detection of the second end of the unit under test D1 or the detection of the first end of the unit under test D2 by the voltage meter in the floating voltage source/meter channel 01 or the floating voltage source/meter channel 02 is reduced, so as to reduce the power consumption. By the same principle, the detection of the second end of the detected unit D2 or the first end of the detected unit D3 by the voltmeter in the floating voltage source/meter channel 02 or the floating voltage source/meter channel 03 can be reduced by combining the low-end detection branch SL2 in the driving/detecting unit 20 and the high-end detection branch SH3 in the driving/detecting unit 30 into one detection line through the detection serial switch KSS02, so that the energy consumption is reduced.

Optionally, with continued reference to fig. 1, the high-side drive branches (FH 1, FH2, FH 3) include a first high-side drive switch (KOFH 01, KOFH02, KOFH 03); the low-side drive branch (FL 1, FL2, FL 3) comprises a first low-side drive switch (KOFL 01, KOFL02, KOFL 03); the high-end detection branches (SH 1, SH2, SH 3) comprise first high-end detection switches (KOSH 01, KOSH02, KOSH 03); the low-side detection branch (SL 1, SL2, SL 3) comprises a first low-side detection switch (KOSL 01, KOSL02, KOSL 03).

The floating voltage source/meter channel (01, 02, 03) comprises a high-end driving end (01 FH, 02FH, 03 FH), a low-end driving end (01 FL, 02FL, 03 FL), a high-end detecting end (01 SH, 02SH, 03 SH) and a low-end detecting end (01 SL, 02SL, 03 SL); each high-end driving end (01 FH, 02FH, 03 FH) is electrically connected with the first end of each unit under test (D1, D2, D3) through each first high-end driving switch (KFH 01, KFH 02, KFH 03); the low-side driving ends (01 FL, 02FL, 03 FL) are electrically connected with the second ends of the units (D1, D2, D3) to be tested through the first low-side driving switches (KOFL 01, KOFL02, KOFL 03); each high-end detection end (01 SH, 02SH, 03 SH) is electrically connected with the first end of each unit under test (D1, D2, D3) through each first high-end detection switch (KOSH 01, KOSH02, KOSH 03); the low-side detection terminals (01 SL, 02SL, 03 SL) are electrically connected to the second terminals of the units (D1, D2, D3) to be tested by means of the first low-side detection switches (KOSL 01, KOSL02, KOSL 03).

Specifically, through the first high-side driving switch (KOFH 01, KOFH02, KOFH 03), the first low-side driving switch (KOFL 01, KOFL02, KOFL 03), the first high-side detecting switch (KOSH 01, KOSH02, KOSH 03) and the first low-side detecting switch (KOSL 01, KOSL02, KOSL 03), the unit to be tested can be selected, and the series-connected switches (KSF 01, KSF 02) can be driven to test high voltage or other requirements, so that the flexibility of the test is improved.

Optionally, a first end of the drive series switch (KSF 01, KSF 02) is electrically connected to a second end of the measured unit (D1, D2) connected to the drive/detection unit (10, 20) via a first low-end drive switch (KOFL 01, KOFL 02) of the drive/detection unit (10, 20); the second end of the drive series switch (KSF 01, KSF 02) is electrically connected to the first end of the measured unit (D2, D3) of the next adjacent drive/detection unit (20, 30) via the first high-end drive switch (KFH 02, KFH 03) of the next adjacent drive/detection unit (20, 30). In this way, the voltage supply series connection in the floating voltage supply/meter channel (01, 02, 03) is not influenced when part of the first high-side drive switches (KOFH 01, KOFH02, KOFH 03) and/or part of the first low-side drive switches (KOFL 01, KOFL02, KOFL 03) are turned off.

In an alternative embodiment, the test circuit comprises a series test mode in which the first high-side drive switch KOFH01 and the first high-side detection switch KOSH01 of the first drive/detection unit 10, the first low-side drive switch KOFL03 and the first low-side detection switch KOSL03 of the last drive/detection unit 30, and the drive series switches (KSF 01, KSF 02) are all closed, the first low-side drive switch KOFL01 and the first low-side detection switch KOSL01 of the first drive/detection unit 20, the first high-side drive switch KOSH02, the first low-side drive switch KOFL02, the first high-side detection switch KOSH02 and the first low-side detection switch KOSL02 of the intermediate drive/detection unit 20, and the first high-side drive switch KOFL03 and the first high-side detection switch KOSH03 of the last drive/detection unit 30 are all open.

For example, taking three floating voltage source/meter channels (01, 02 and 03) in series, three units under test (D1, D2 and D3) in series are tested, at this time, after the three floating voltage source/meter channels (01, 02 and 03) are in series, they can be used as an integration of a large-range voltage source and a large-range voltmeter, the three units under test (D1, D2 and D3) in series can be used as a whole under test, the high end of the large-range voltage source (i.e. the high end driving end 01FH of the floating voltage source/meter channel 01) and the high end of the large-range voltmeter (i.e. the high end detecting end 01SH of the floating voltage source/meter channel 01) are electrically connected with the first end of the whole under test (i.e. the first end of the tested unit D1), the low end of the large-range voltage source (i.e. the low end driving end 03FL of the floating voltage source/meter channel 03) and the low end of the large-range voltmeter (i.e. the low end detecting end 03) of the floating voltage source/meter channel 03) are electrically connected with the high end of the second end of the whole under test (i.e. the second end of the tested unit D3) of the floating voltage source/meter channel 01, so that the high end of the high voltage source/meter can meet the requirements of the voltage source/meter (01) and the sum.

Optionally, fig. 2 is a schematic diagram of yet another test circuit according to an embodiment of the present utility model. Referring to fig. 2, the test circuit further includes a high-side drive bus 11, a low-side drive bus 12, a high-side sense bus 13, and a low-side sense bus 14.

The high-side driving branches (FH 1, FH2 and FH 3) also comprise second high-side driving switches (KCFH 01, KCFH02 and KCFH 03) and third high-side driving switches (KBFH 01, KBFH02 and KBFH 03); in each driving/detecting unit (10, 20, 30), a first high-side driving switch (KFH 01, KFH 02, KFH 03), a second high-side driving switch (KCFH 01, KCFH02, KCFH 03) and a third high-side driving switch (KBFH 01, KBFH02, KBFH 03) are connected to high-side driving nodes (FHN 1, FHN2, FHN 3); each first high-end driving switch (KFH 01, KFH 02, KFH 03) is also electrically connected with the first end of each unit under test (D1, D2, D3); each second high-side drive switch (KCFH 01, KCFH02, KCFH 03) is also electrically connected with each high-side drive end (01 FH, 02FH, 03 FH); each third high-side drive switch (KBFH 01, KBFH02, KBFH 03) is also electrically connected to the same high-side drive bus 11.

The low-side drive branches (FL 1, FL2, FL 3) further comprise second low-side drive switches (KCFL 01, KCFL02, KCFL 03) and third low-side drive switches (kffl 01, kffl 02, kffl 03); in each driving/detecting unit (10, 20, 30), a first low-side driving switch (KOFL 01, KOFL02, KOFL 03), a second low-side driving switch (KCFL 01, KCFL02, KCFL 03) and a third low-side driving switch (KBFL 01, KBFL02, KBFL 03) are connected to a low-side driving node (FLN 1, FLN2, FLN 3); the first low-side drive switches (KOFL 01, KOFL02, KOFL 03) are also electrically connected to the second side of the units (D1, D2, D3) to be tested; each second low-side drive switch (KCFL 01, KCFL02, KCFL 03) is also electrically connected to each low-side drive terminal (01 FL, 02FL, 03 FL); each third low-side drive switch (KBFL 01, KBFL02, KBFL 03) is also electrically connected to the same low-side drive bus 12.

The high-end detection branches (SH 1, SH2, SH 3) further comprise second high-end detection switches (KCSH 01, KCSH02, KCSH 03) and third high-end detection switches (KBSH 01, KBSH02, KBSH 03); in each driving/detecting unit (10, 20, 30), a first high-side detecting switch (KOSH 01, KOSH02, KOSH 03), a second high-side detecting switch (KCSH 01, KCSH02, KCSH 03) and a third high-side detecting switch (KBSH 01, KBSH02, KBSH 03) are connected to high-side detecting nodes (SHN 1, SHN2, SHN 3); the first high-end detection switches (KOSH 01, KOSH02, KOSH 03) are also electrically connected with the first ends of the tested units (D1, D2, D3); each second high-side detection switch (KCSH 01, KCSH02, KCSH 03) is also electrically connected with each high-side detection terminal (01 SH, 02SH, 03 SH); the third high-side detection switches (KBSH 01, KBSH02, KBSH 03) are also electrically connected to the same high-side detection bus 13.

The low-side detection branches (SL 1, SL2, SL 3) further comprise a second low-side detection switch (KCSL 01, KCSL02, KCSL 03) and a third low-side detection switch (KBSL 01, KBSL02, KBSL 03); in each driving/detecting unit (10, 20, 30), a first low-side detecting switch (KOSL 01, KOSL02, KOSL 03), a second low-side detecting switch (KCSL 01, KCSL02, KCSL 03) and a third low-side detecting switch (KBSL 01, KBSL02, KBSL 03) are connected to a low-side detecting node (SLN 1, SLN2, SLN 3); the first low-side detection switches (KOSL 01, KOSL02, KOSL 03) are also electrically connected with the second ends of the units (D1, D2, D3) to be detected; each second low-side detection switch (KCSL 01, KCSL02, KCSL 03) is further electrically connected to each low-side detection terminal (01 SL, 02SL, 03 SL); the third low-side detection switches (KBSL 01, KBSL02, KBSL 03) are also electrically connected to the same low-side detection bus 14.

Illustratively, the high-side drive bus 11, the low-side drive bus 12, the high-side detection bus 13, and the low-side detection bus 14 may be electrically connected to the high-side drive branches (FH 1, FH2, FH 3), the low-side drive branches (FL 1, FL2, FL 3), the high-side detection branches (SH 1, SH2, SH 3), and the low-side detection branches (SL 1, SL2, SL 3) of the respective drive/detection units (10, 20, 30), respectively, and further electrically connected to the first or second ends of the units under test (D1, D2, D3) to test the units under test (D1, D2, D3) using external voltage/current sources instead of floating voltage sources/meter channels (01, 02, 03); the high-side drive bus 11, the low-side drive bus 12, the high-side detection bus 13, and the low-side detection bus 14 may be electrically connected to the high-side drive terminals (01 FH, 02FH, 03 FH), the low-side drive terminals (01 FL, 02FL, 03 FL), the high-side detection terminals (01 SH, 02SH, 03 SH), and the low-side detection terminals (01 SL, 02SL, 03 SL) of the floating voltage source/meter channels (01, 02, 03), the low-side drive terminals (01 FL, 02FL, 03 FL), the high-side detection terminals (01 SH, 02SH, 03 SH), and the low-side detection terminals (01 SL, 02SL, 03 SL), respectively, by using an external calibration device, and may also be used to verify the switching of the respective drive/detection units (10, 20, 30) by using the floating voltage source/meter channels (01, 02, 03).

Optionally, with continued reference to fig. 2, the test circuit further includes an external high-side drive switch kbfh 00, an external low-side drive switch kbfl 00, an external high-side detection switch kbsh 00, and an external low-side detection switch kbsl 00. The high-side drive bus 11 is electrically connected with the first driving end FH of the external voltage/current source through an external high-side drive switch KBFH 00; the low-side drive bus 12 is electrically connected to the second driving terminal FL of the external voltage/current source through an external low-side drive switch kbfl 00; the high-side detection bus 13 is electrically connected with a first detection end SH of an external voltage/current source through an external high-side detection switch KBBSH 00; the low-side detection bus 14 is electrically connected to the second detection terminal SL of the external voltage/current source through the external low-side detection switch KBBSL00.

Specifically, the test circuit can be connected with an external voltage/current source, so that the expansion function of the board card where the test circuit is located is increased, for example, a working environment with high voltage or high current is introduced. The external voltage/current source can replace any floating voltage source/meter channel (01, 02, 03) to test the single tested unit (D1, D2, D3); the series connection of the tested units (D1, D2, D3) can also be tested instead of the series connection of the floating voltage source/meter channels (01, 02, 03), and the principle is similar to that of the previous embodiment, and the description is omitted here. Therefore, the corresponding external voltage/current source can be connected according to the test requirement, so that the board card with the test circuit can adapt to the working environment of high voltage and large current, different test requirements are met, and the flexibility of the test is improved.

For example, taking an example that an external voltage/current source may replace the floating voltage source/meter channel 01 to test a single tested unit D1, the external high-side driving switch KBFH 00, the external low-side driving switch KBFL 00, the external high-side detecting switch KBSH 00, the external low-side detecting switch KBSL 00, and the first high-side driving switch KOFH01, the third high-side driving switch KBFH01, the first low-side driving switch KOFL01, the third low-side driving switch KBFL01, the first high-side detecting switch KOSH01, the third high-side detecting switch KBSH01, the first low-side detecting switch KOSL01, the third low-side detecting switch KBSL01, and the other switches shown in the shutdown diagram may test the tested unit D1 through the external voltage/current source. Taking an example that an external voltage/current source replaces a series floating voltage source/meter channel (01, 02, 03) to test a series tested unit (D1, D2, D3), closing an external high-side driving switch KBBH00, an external low-side driving switch KBBHL 00, an external high-side detecting switch KBBHH 00, an external low-side detecting switch KBBBSL 00, a first high-side driving switch KFH 01, a third high-side driving switch KBFH01, a first low-side driving switch KFL 03, a third low-side driving switch KBFL03, a first high-side detecting switch KOSH01, a third high-side detecting switch KBSH01, a first low-side detecting switch KSL 03, a third low-side detecting switch KBSL03, and turning off other switches shown in the figure, the series tested unit (D1, D2, D3) can be tested through the external voltage/current source. Therefore, the test of different tested units (D1, D2 and D3) can be realized by only one external voltage/current source, and the test of different forms can be also performed, so that the cost of the external voltage/current source test is reduced.

Optionally, with continued reference to fig. 2, the test circuit further includes a high-side drive calibration switch kbfh01, a low-side drive calibration switch kbfl01, a high-side detection calibration switch kbsh01, and a low-side detection calibration switch kbsl 01. The high-side drive bus 11 is electrically connected with the high side of the calibration device through a high-side drive calibration switch KBFH 01; the low-side drive bus 12 is electrically connected with the low side of the calibration device through a low-side drive calibration switch KBFL 01; the high-side detection bus 13 is electrically connected with the high side of the calibration device through a high-side detection calibration switch KBBSH 01; the low-side detection bus 14 is electrically connected to the low side of the calibration device via a low-side detection calibration switch KBBSL01.

Illustratively, the test circuit further includes an external calibration mode; the external calibration mode includes voltage source calibration and voltmeter calibration. Taking the calibration of the voltage source in the floating voltage source/meter channel 01 as an example, the high-side driving calibration switch KBFH01, the low-side driving calibration switch KBFL01, the second high-side driving switch KCFH01, the third high-side driving switch KBFH01, the second low-side driving switch KCFL01 and the third low-side driving switch KBFL01 are closed, other switches shown in the figure are turned off, the voltage source in the floating voltage source/meter channel 01 is set to be an expected value, the high side and the low side of the calibration device can detect the actual measurement value of the voltage source in the floating voltage source/meter channel 01, and the calibration of the voltage source in the floating voltage source/meter channel 01 can be performed by comparing the expected value of the voltage source with the actual measurement value of the calibration device. Taking the calibration of the voltmeter in the floating voltage source/meter channel 01 as an example, closing the high-side detection calibration switch KBBSH01, the low-side detection calibration switch KBBSSL 01, the second high-side detection switch KCSH01, the third high-side detection switch KBSH01, the second low-side detection switch KCSL01 and the third low-side detection switch KBSL01, turning off other switches shown in the figure, setting the high side and the low side of the calibration device as expected values, the voltmeter in the floating voltage source/meter channel 01 can detect the actual measurement value of the calibration device, and the voltmeter in the floating voltage source/meter channel 01 can be calibrated by comparing the expected value of the calibration device with the actual measurement value of the voltmeter in the floating voltage source/meter channel 01. The calibration principle of the other floating voltage source/meter channels (02, 03) is the same and will not be described in detail here.

Therefore, by arranging the high-end driving calibration switch KBFH01, the low-end driving calibration switch KBBHL 01, the high-end detection calibration switch KBBSH01 and the low-end detection calibration switch KBBSL01 and connecting only one calibration device, the voltage source and the voltmeter in each floating voltage source/meter channel (01, 02 and 03) can be calibrated in sequence, one calibration device is not required to be connected at each floating voltage source/meter channel (01, 02 and 03), and the calibration cost can be saved.

Optionally, fig. 3 is a schematic diagram of yet another test circuit according to an embodiment of the present utility model. Referring to fig. 3, the test circuit further includes a high-side self-test switch KH and a low-side self-test switch KL; the high-side drive bus 11 is electrically connected with the high-side detection bus 13 through a high-side self-detection switch KH; the low-side drive bus 12 is electrically connected to the low-side detection bus 14 through a low-side self-detection switch KL.

Illustratively, the high-side self-checking switch KH includes a high-side self-checking drive switch KH01 and a high-side self-checking detection switch KH02, and the low-side self-checking switch KL includes a low-side self-checking drive switch KL01 and a low-side self-checking detection switch KL02. Taking floating voltage source/meter channel 01 self-test as an example, high-side self-test driving switch KH01, high-side self-test detecting switch KH02, low-side self-test driving switch KL01, low-side self-test detecting switch KL02, second high-side driving switch KCFH01, third high-side driving switch KBFH01, second low-side driving switch KCFL01, third low-side driving switch KBFL01, second high-side detecting switch KCSH01, third high-side detecting switch KBSH01, second low-side detecting switch KCSL01, third low-side detecting switch KBSL01, and other switches shown in the figure are turned off. The high-end driving end 01FH of the floating voltage source/meter channel 01 is electrically connected with the high-end detection end 01SH of the floating voltage source/meter channel 01, the low-end driving end 01FL of the voltage source/meter channel 01 is electrically connected with the low-end detection end 01SL of the floating voltage source/meter channel 01, the high-end self-checking switch KH and the low-end self-checking switch KL can be used for shorting the high-end detection end 01SH of the floating voltage source/meter channel 01 with the high-end detection end 01SH of the floating voltage source/meter channel 01, the low-end driving end 01FL of the floating voltage source/meter channel 01 is shorted with the low-end detection end 01SL of the floating voltage source/meter channel 01, and mutual checking is carried out by utilizing a voltmeter and a voltage source in the floating voltage source/meter channel 01.

In addition, the voltmeter and the voltage source in the floating voltage source/meter channel 01 can be used for self-checking short circuits and open circuits of the second high-side driving switch KCFH01, the third high-side driving switch KBFH01, the second low-side driving switch KCFL01, the third low-side driving switch KBFL01, the second high-side detecting switch KCSH01, the third high-side detecting switch KBSH01 and the second low-side detecting switch KCSL01, and the third low-side detecting switch KBSL01, for example, when the switch of the short circuit is closed, the voltmeter reads normally, the switch can be checked to have no open circuit, and when the switch of the short circuit is closed, the voltmeter does not read, and the switch can be checked to have no adhesion. The checking principle of other floating voltage source/meter channels (02, 03) is the same and will not be described in detail here.

Based on the same inventive concept, the embodiment of the present utility model further provides a test board card, where the test board card provided by the embodiment of the present utility model includes the test circuit provided by any embodiment of the present utility model, and has corresponding technical features and beneficial effects of the test circuit, and details of the detailed description of the embodiment of the test board card are not described in detail herein, and reference may be made to the description of the test circuit above.

Note that the above is only a preferred embodiment of the present utility model and the technical principle applied. It will be understood by those skilled in the art that the present utility model is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the utility model. Therefore, while the utility model has been described in connection with the above embodiments, the utility model is not limited to the embodiments, but may be embodied in many other equivalent forms without departing from the spirit or scope of the utility model, which is set forth in the following claims.

Claims (10)

1. A test circuit characterized by a plurality of floating voltage source/meter channels and a plurality of units under test for connecting a controller; the test circuit includes: a plurality of driving/detecting units sequentially ordered; each floating voltage source/meter channel is connected with the tested unit in a one-to-one correspondence through each driving/detecting unit;

the driving/detecting unit comprises a high-end driving branch, a low-end driving branch, a high-end detecting branch and a low-end detecting branch; the high-end driving branch circuit and the high-end detection branch circuit are electrically connected with the first end of the tested unit connected with the driving/detection unit; the low-end driving branch and the low-end detection branch are electrically connected with the second end of the tested unit connected with the driving/detection unit;

The test circuit further comprises a plurality of drive series switches; the drive series switch is connected between the low-side drive leg of the drive/sense unit and the high-side drive leg of the next adjacent drive/sense unit.

2. The test circuit of claim 1, further comprising a plurality of sense series switches;

the detection series switch is connected between the low-side detection branch of the driving/detection unit and the high-side detection branch of the next adjacent driving/detection unit.

3. The test circuit of claim 1, wherein the high-side drive leg comprises a first high-side drive switch; the low-side driving branch circuit comprises a first low-side driving switch; the high-end detection branch circuit comprises a first high-end detection switch; the low-end detection branch circuit comprises a first low-end detection switch;

the floating voltage source/meter channel comprises a high-end driving end, a low-end driving end, a high-end detection end and a low-end detection end; each high-end driving end is electrically connected with the first end of each unit to be tested through each first high-end driving switch; each low-end driving end is electrically connected with the second end of each unit under test through each first low-end driving switch; each high-end detection end is electrically connected with the first end of each unit to be detected through each first high-end detection switch; each low-end detection end is electrically connected with the second end of each unit to be detected through each first low-end detection switch.

4. A test circuit according to claim 3, wherein a first end of the drive series switch is electrically connected to a second end of the unit under test to which the drive/sense unit is connected via the first low-side drive switch of the drive/sense unit; the second end of the driving series switch is electrically connected with the first end of the tested unit connected with the next adjacent driving/detecting unit through the first high-end driving switch of the next adjacent driving/detecting unit.

5. The test circuit of claim 4, wherein the test circuit comprises a series test mode;

in the series test mode, the first high-side drive switch and the first high-side detection switch of the first drive/detection unit, the first low-side drive switch and the first low-side detection switch of the last drive/detection unit, and the drive series switch are all closed, and the first low-side drive switch and the first low-side detection switch of the first drive/detection unit, the first high-side drive switch, the first low-side drive switch, the first high-side detection switch and the first low-side detection switch of the drive/detection unit, and the first high-side drive switch and the first high-side detection switch of the last drive/detection unit are all closed.

6. The test circuit of claim 4, further comprising: a high-side drive bus, a low-side drive bus, a high-side detection bus, and a low-side detection bus;

the high-end driving branch circuit further comprises a second high-end driving switch and a third high-end driving switch; in each driving/detecting unit, the first high-side driving switch, the second high-side driving switch and the third high-side driving switch are connected to a high-side driving node; each first high-end driving switch is also electrically connected with a first end of each tested unit; each second high-end driving switch is also electrically connected with each high-end driving end; each third high-side drive switch is also electrically connected with the same high-side drive bus;

the low-end driving branch circuit further comprises a second low-end driving switch and a third low-end driving switch; in each driving/detecting unit, the first low-side driving switch, the second low-side driving switch and the third low-side driving switch are connected to a low-side driving node; each first low-end driving switch is also electrically connected with the second end of each tested unit; each second low-end driving switch is also electrically connected with each low-end driving end; each third low-side drive switch is also electrically connected with the same low-side drive bus;

The high-end detection branch circuit further comprises a second high-end detection switch and a third high-end detection switch; in each driving/detecting unit, the first high-side detecting switch, the second high-side detecting switch and the third high-side detecting switch are connected to a high-side detecting node; each first high-end detection switch is also electrically connected with a first end of each unit to be detected; each second high-end detection switch is also electrically connected with each high-end detection end; each third high-end detection switch is also electrically connected with the same high-end detection bus;

the low-end detection branch circuit further comprises a second low-end detection switch and a third low-end detection switch; in each driving/detecting unit, the first low-side detecting switch, the second low-side detecting switch and the third low-side detecting switch are connected to a low-side detecting node; each first low-end detection switch is also electrically connected with the second end of each unit to be detected; each second low-end detection switch is also electrically connected with each low-end detection end; each third low-side detection switch is also electrically connected with the same low-side detection bus.

7. The test circuit of claim 6, further comprising: an external high-side drive switch, an external low-side drive switch, an external high-side detection switch, and an external low-side detection switch;

The high-side driving bus is electrically connected with a first driving end of an external voltage/current source through the external high-side driving switch; the low-side drive bus is electrically connected with the second drive end of the external voltage/current source through the external low-side drive switch;

the high-side detection bus is electrically connected with a first detection end of the external voltage/current source through the external high-side detection switch; the low-side detection bus is electrically connected with a second detection end of the external voltage/current source through the external low-side detection switch.

8. The test circuit of claim 6, further comprising: a high-side drive calibration switch, a low-side drive calibration switch, a high-side detection calibration switch and a low-side detection calibration switch;

the high-end driving bus is electrically connected with the high end of the calibrating device through the high-end driving calibrating switch; the low-side driving bus is electrically connected with the low side of the calibrating device through the low-side driving calibrating switch;

the high-end detection bus is electrically connected with the high end of the calibration device through the high-end detection calibration switch; the low-side detection bus is electrically connected with the low side of the calibrating device through the low-side detection calibrating switch.

9. The test circuit of claim 6, further comprising: a high-side self-checking switch and a low-side self-checking switch;

the high-end driving bus is electrically connected with the high-end detection bus through the high-end self-detection switch; the low-side driving bus is electrically connected with the low-side detecting bus through the low-side self-detecting switch.

10. A test board comprising the test circuit of any one of claims 1-9.