CN220137309U - Semiconductor static testing device - Google Patents

Abstract

The utility model provides a semiconductor static testing device, which relates to the technical field of electronic hardware and comprises a static gun and a camera, wherein a connecting piece is sleeved and fixed on the surface of the static gun, two rotating rods are symmetrically fixed on the surface of the camera, one ends of the two rotating rods are respectively and rotatably connected with a side wall adjacent to the connecting piece through bearings, a motor is fixed on the surface of the connecting piece, and one end of one rotating rod penetrates through the side wall of the connecting piece and is fixedly connected with an output shaft of the motor. Through setting up slip table, slider, round bar, installation piece, extension board and through-hole, the static rifle is fixed vertical state to the semiconductor of placing in its below, and the static rifle is by the surface slip of slider at the slip table, just can make the static rifle remove wantonly in the fore-and-aft direction, and the slip table can drive the static rifle and remove wantonly in the left and right directions through the surface slip of installation piece at the round bar to need not the manual work and hold the static rifle always, make things convenient for people's test work.

Description

Semiconductor static testing device

Technical Field

The utility model relates to the technical field of electronic hardware, in particular to a semiconductor static electricity testing device.

Background

The semiconductor is a substance with conductivity between an insulator and a conductor, the conductivity of the substance is easy to control, the substance can be used as an element material for information processing, the manufacturing level of an integrated circuit is higher and higher along with the process of the integrated circuit, the feature size of each structure in the circuit is smaller and smaller, each structure is more sensitive to the interference of electrostatic discharge, in the practical application environment, pins in the packaging structure of the integrated circuit can be subjected to ESD interference, in particular to ball grid array packaging, the packaging form is small in size, the number of pins which can be placed in a unit area is large, the distance between the pins is smaller, and the ESD interference is easier to generate.

At present, when a semiconductor is subjected to electrostatic testing, a manual handheld electrostatic gun is usually used for testing the semiconductor, and when the semiconductor is tested, the vertical state of the electrostatic gun and a tested body needs to be maintained, and when the semiconductor is manually held, the semiconductor cannot be ensured to be in the vertical state at all times, and the semiconductor is detected in the mode for a long time, so that fatigue is easily generated by personnel, and the testing progress and the testing result are influenced.

Disclosure of Invention

The utility model aims to solve the problems that the manual holding can not ensure the vertical state at any time, and the detection is adopted for a long time, so that the fatigue of personnel is easy to generate, and the test progress and the result are influenced.

In order to achieve the above purpose, the present utility model adopts the following technical scheme: the utility model provides a semiconductor static testing arrangement, includes static rifle and camera, the surface cover of static rifle is established and is fixed with the connecting piece, the surface symmetry of camera is fixed with two bull sticks, two the one end of bull stick all rotates with the adjacent lateral wall of connecting piece respectively through the bearing and is connected, the fixed surface of connecting piece has the motor, one of them the one end of bull stick runs through the lateral wall of connecting piece and with the output shaft fixed connection of motor, one side of static rifle is provided with the slip table, be fixed with the slider on the static rifle, the surface at the slip table is established to the slider cover, the below symmetry of slip table is provided with two round bars, the equal sliding connection in surface of round bar has the installation piece, the bottom of slip table is fixed at the top of two installation pieces, two the both ends department of round bar all is provided with the extension board, the both ends sentence sliding connection of round bar is in adjacent extension board.

Preferably, through holes matched with the round rods are formed in the middle of the mounting blocks.

Preferably, both ends of the round rods penetrate through the side walls of the support plates and are fixed with mounting plates, one side wall of each support plate is fixed with an air cylinder, and output shafts of the air cylinders are fixedly connected with surfaces of adjacent mounting plates respectively.

Preferably, the middle part of each support plate is provided with a sliding opening, and two ends of each round rod are respectively and slidably connected in the sliding openings of the adjacent support plates.

Preferably, two mounting holes are formed in the bottom of the support plate.

Compared with the prior art, the utility model has the advantages and positive effects that,

1. according to the utility model, the static gun is in a fixed vertical state for a semiconductor placed below the static gun through the arrangement of the sliding table, the sliding block, the round rod, the mounting block, the support plate and the through hole, the static gun can be enabled to move randomly in the front-back direction through sliding of the sliding block on the surface of the sliding table, and the sliding table can drive the static gun to move randomly in the left-right direction through sliding of the mounting block on the surface of the round rod, so that the static gun is not required to be manually held all the time, and the testing work of people is facilitated.

2. According to the utility model, the camera, the connecting piece, the rotating rod and the motor are arranged, so that the working range of the electrostatic gun can be monitored by the camera, a person can conveniently test semiconductors which are difficult to view by naked eyes, and the shooting direction of the camera can be conveniently adjusted by the motor according to actual use requirements.

Drawings

FIG. 1 is a perspective view showing the overall structure of a semiconductor electrostatic testing device according to the present utility model;

FIG. 2 is a perspective view showing a structure of a transfer lever in a semiconductor electrostatic testing apparatus according to the present utility model;

fig. 3 is a perspective view of a through hole structure in a semiconductor electrostatic testing device according to the present utility model.

Legend description: 1. an electrostatic gun; 2. a camera; 3. a connecting piece; 4. a rotating rod; 5. a motor; 6. a sliding table; 7. a slide block; 8. a round bar; 9. a mounting block; 10. a support plate; 11. a through hole; 12. a mounting plate; 13. a cylinder; 14. a sliding port; 15. and (5) mounting holes.

Detailed Description

In order that the above objects, features and advantages of the utility model will be more clearly understood, a further description of the utility model will be rendered by reference to the appended drawings and examples. It should be noted that, without conflict, the embodiments of the present utility model and features in the embodiments may be combined with each other.

In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present utility model, however, the present utility model may be practiced otherwise than as described herein, and therefore the present utility model is not limited to the specific embodiments of the disclosure that follow.

In the embodiment 1, as shown in fig. 1-3, the utility model provides a semiconductor electrostatic testing device, which comprises an electrostatic gun 1 and a camera 2, wherein a connecting piece 3 is sleeved and fixed on the surface of the electrostatic gun 1, two rotating rods 4 are symmetrically fixed on the surface of the camera 2, one ends of the two rotating rods 4 are respectively and rotatably connected with one side wall adjacent to the connecting piece 3 through bearings, a motor 5 is fixed on the surface of the connecting piece 3, one end of one rotating rod 4 penetrates through the side wall of the connecting piece 3 and is fixedly connected with an output shaft of the motor 5, a sliding table 6 is arranged on one side of the electrostatic gun 1, a sliding block 7 is fixed on the electrostatic gun 1, the sliding block 7 is sleeved and arranged on the surface of the sliding table 6, two round rods 8 are symmetrically arranged below the sliding table 6, the surfaces of the round rods 8 are all connected with mounting blocks 9 in a sliding manner, the bottoms of the sliding table 6 are fixed on the tops of the two mounting blocks 9, two ends of the round rods 8 are respectively provided with a supporting plate 10, and two ends of the round rods 8 are connected in the adjacent supporting plates 10 in a sliding manner.

The effect that its whole embodiment 1 reaches is, static rifle 1 is fixed vertical state to the semiconductor of placing in its below, and personnel can control bull stick 4 by motor 5 and rotate, and bull stick 4 just can drive camera 2 and rotate, just can adjust the monitoring direction of camera 2 as required, makes things convenient for personnel to test the semiconductor that less naked eyes are difficult to look over, under slip table 6 and round bar 8's effect, after personnel can around arbitrary removal static rifle 1 to suitable position, tests by clicking the switch of static rifle 1, changes traditional handheld static rifle 1 test and leads to the relatively poor problem of test effect.

In the embodiment 2, as shown in fig. 1-3, through holes 11 matched with the round rods 8 are formed in the middle of the mounting blocks 9; the two ends of the two round rods 8 penetrate through the side wall of the support plate 10 and are fixedly provided with mounting plates 12, one side wall of the support plate 10 is fixedly provided with air cylinders 13, and output shafts of the air cylinders 13 are fixedly connected with the surfaces of the adjacent mounting plates 12 respectively; the middle parts of the support plates 10 are provided with sliding ports 14, and two ends of the two round rods 8 are respectively and slidably connected in the sliding ports 14 of the adjacent support plates 10; two mounting holes 15 are respectively formed in the bottom of the support plate 10.

The effect achieved by the whole embodiment 2 is that the through holes 11 are used for enabling the mounting blocks 9 to smoothly slide on the surface of the round rod 8; the personnel starts the four cylinders 13 at the same time, can drive the round rod 8 to move up and down together, and can drive the electrostatic gun 1 to move to a proper height when the test is needed, so that the distance between the output end of the electrostatic gun and the semiconductor is proper; the sliding opening 14 is used for enabling the round rod 8 to smoothly slide through the side wall of the support plate 10; the mounting holes 15 facilitate the personnel to fixedly mount the support plate 10 in a proper position as required.

Working principle: the device can be installed on a table or a conveying belt through the installation holes 15, the camera 2 can monitor the vicinity of the output end of the electrostatic gun 1, a person can control the rotating rod 4 to rotate through the motor 5, the rotating rod 4 can drive the camera 2 to rotate, the monitoring direction of the camera 2 can be adjusted according to the needs, then the person starts the four cylinders 13 simultaneously and can drive the round rod 8 to move up and down together, the electrostatic gun 1 can be driven to move to a proper height when the test is needed, the distance between the output end of the round rod 8 and a semiconductor is proper, after the adjustment is finished, the person can hold the gun tail of the electrostatic gun 1, under the action of the sliding table 6 and the round rod 8, after the person can move the electrostatic gun 1 to a proper position at will, the person can test by pressing the switch of the electrostatic gun 1, and the problem set in the background is solved.

The present utility model is not limited to the above-mentioned embodiments, and any equivalent embodiments which can be changed or modified by the technical content disclosed above can be applied to other fields, but any simple modification, equivalent changes and modification made to the above-mentioned embodiments according to the technical substance of the present utility model without departing from the technical content of the present utility model still belong to the protection scope of the technical solution of the present utility model.

Claims (5)

1. A semiconductor static electricity testing device is characterized in that: including static rifle (1) and camera (2), be fixed with connecting piece (3) are established to the surface cover of static rifle (1), the surface symmetry of camera (2) is fixed with two bull sticks (4), two the one end of bull stick (4) all rotates with the adjacent side wall of connecting piece (3) respectively through the bearing and is connected, the fixed surface of connecting piece (3) has motor (5), one of them the one end of bull stick (4) runs through the lateral wall of connecting piece (3) and with the output shaft fixed connection of motor (5), one side of static rifle (1) is provided with slip table (6), be fixed with slider (7) on static rifle (1), the surface at slip table (6) is established to slider (7) cover, the below symmetry of slip table (6) is provided with two round bars (8), the equal sliding connection in surface of round bar (8) has installation piece (9), the bottom of slip table (6) is fixed at the top of two installation piece (9), two the both ends of round bar (8) are provided with round bar (10) in adjacent two ends of a pair of round bar (8), all be connected at the both ends of round bar (10).

2. The semiconductor electrostatic testing device according to claim 1, wherein: through holes (11) matched with the round rods (8) are formed in the middle of the mounting blocks (9).

3. The semiconductor electrostatic testing device according to claim 1, wherein: the two ends of the round rods (8) penetrate through the side walls of the support plates (10) and are fixedly provided with mounting plates (12), one side wall of each support plate (10) is fixedly provided with an air cylinder (13), and output shafts of the air cylinders (13) are fixedly connected with the surfaces of the adjacent mounting plates (12) respectively.

4. The semiconductor electrostatic testing device according to claim 1, wherein: the middle parts of the support plates (10) are respectively provided with a sliding opening (14), and two ends of the round rods (8) are respectively and slidably connected in the sliding openings (14) of the adjacent support plates (10).

5. The semiconductor electrostatic testing device according to claim 1, wherein: two mounting holes (15) are formed in the bottom of the support plate (10).