CN220120932U - FET pair tube testing device - Google Patents

Abstract

The utility model belongs to the technical field of field effect transistors and discloses a pair transistor testing device which comprises a testing table, wherein one end of the upper end face of the testing table is provided with a controller, the upper end face of the testing table is provided with a through hole, a lifting supporting plate is arranged in the through hole, the upper end face of the supporting plate is provided with a placing plate and a testing component, the placing plate is provided with a placing groove for accommodating a transistor, two opposite sides of the placing groove are respectively provided with a retaining plate, and the retaining plates can be close to or far away from each other through a moving part. According to the utility model, the lifting supporting plate is arranged, the placing plate and the testing component are arranged on the supporting plate, when the device is not used, the supporting plate can be moved downwards, so that the placing plate and the testing component on the supporting plate retract into the accommodating cavity for storage, the occurrence of collision damage of the placing plate and the testing component can be effectively reduced, the service life of the placing plate is prolonged, and in addition, the moving part is utilized to move the resisting plates, so that the distance between the two opposite resisting plates can be quickly adjusted.

Description

FET pair tube testing device

Technical Field

The utility model belongs to the technical field of field effect transistors, and particularly relates to a pair tube testing device of a field effect transistor.

Background

The field effect transistor is a semiconductor device for controlling the output loop current by utilizing the electric field effect of the control input loop, and in the production process of the field effect transistor pair tube, parameter test is often required to be carried out on the field effect transistor pair tube so as to screen out the device with high matching degree.

When the conventional field effect transistor pair tube is used for testing, the field effect transistor is required to be placed well, then connection with the test device is carried out, and then parameter test is carried out, but the conventional test device is usually placed or installed on a test table top directly, and when the test device is not used, the test device is exposed, and if collision occurs, damage is easily caused.

Disclosure of Invention

The utility model aims to provide a pair tube testing device for a field effect transistor, which solves the problems that the prior testing device proposed in the background art is mostly directly placed or installed on a testing table, and the testing device is exposed when not used and is easy to damage if knocked.

In order to achieve the above purpose, the present utility model provides the following technical solutions: the utility model provides a field effect transistor geminate transistor testing arrangement, includes the testboard, the controller is installed to testboard up end one end, just the through-hole has been seted up to the up end of testboard, be equipped with liftable layer board in the through-hole, place board and test module are installed to the layer board up end, place the standing groove that has the holding transistor on the board, the opposite both sides of standing groove all are equipped with the board of keeping out, the board of keeping out can be close to or keep away from mutually through the moving part.

Preferably, the moving member is a threaded rod screwed through the placement plate, and one end of the threaded rod is connected with the abutment plate through a bearing.

Preferably, the bottom of the abutting plate is connected with a sliding block, a sliding groove is formed in the bottom of the placing groove, and the sliding block is in sliding fit with the sliding groove.

Preferably, a bottom frame is arranged at the bottom end of the test bench, and a containing cavity is arranged in the bottom frame.

Preferably, the test assembly comprises an instrument amplifier and a relay set, and a programmable power module is arranged at one end of the inside of the accommodating cavity.

Preferably, a hydraulic cylinder is installed at the inner bottom of the accommodating cavity, and the output end of the hydraulic cylinder is connected with the lower end face of the supporting plate.

Compared with the prior art, the utility model has the beneficial effects that:

(1) According to the utility model, the lifting supporting plate is arranged, the placing plate and the testing component are arranged on the supporting plate, when the device is not used, the supporting plate can be moved downwards, so that the placing plate and the testing component on the supporting plate retract into the accommodating cavity for storage, the occurrence of collision damage of the placing plate and the testing component can be effectively reduced, and the service life of the device is prolonged.

(2) The utility model uses the moving part to move the retaining plates, can quickly adjust the distance between the two opposite retaining plates, and can be further suitable for fixing field effect transistors with different widths.

Drawings

FIG. 1 is a schematic diagram of the structure of the present utility model;

FIG. 2 is a top view of the placement plate of the present utility model;

FIG. 3 is a top view of the test stand of the present utility model;

FIG. 4 is a front view of a retaining plate of the present utility model;

in the figure: 1. a test bench; 2. a bottom frame; 3. a receiving chamber; 4. a controller; 5. placing a plate; 6. an instrumentation amplifier; 7. a relay group; 8. a hydraulic cylinder; 9. a program-controlled power supply module; 10. a placement groove; 11. a threaded rod; 12. a retaining plate; 13. a chute; 14. a through hole; 15. a supporting plate; 16. a sliding block.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

Fig. 1 is a schematic structural diagram of the present utility model, and in combination with fig. 3, the pair transistor testing device of the present utility model includes a test bench 1, a controller 4 is installed at one end of an upper end surface of the test bench 1, the controller 4 may be a single chip microcomputer, an integrated circuit chip, etc., and has a capability of signal processing and control, a through hole 14 is provided at the upper end surface of the test bench 1, a liftable supporting plate 15 is provided in the through hole 14, a bottom frame 2 is provided at a bottom end of the test bench 1, a containing cavity 3 is provided in the bottom frame 2, a placing plate 5 and a testing component are installed at an upper end surface of the supporting plate 15, a placing groove 10 for containing a transistor is provided on the placing plate 5, and a retaining plate 12 is provided at opposite sides of the placing groove 10, and the retaining plate 12 can approach or separate from each other through a moving member.

By the above, when not using the device, can move the layer board 15 down, make place board 5 and the test assembly on the layer board 15 retract to hold in the chamber 3 and deposit, can reduce the emergence of colliding with the damage.

In addition, the moving member is utilized to move the retaining plates 12, so that the distance between the two retaining plates 12 can be quickly adjusted, and the device is suitable for fixing field effect transistors with different widths.

Further, a hydraulic cylinder 8 is installed at the inner bottom of the accommodating chamber 3, and an output end of the hydraulic cylinder 8 is connected with a lower end face of the supporting plate 15.

Specifically, the supporting plate 15 can be driven to move up and down by utilizing the hydraulic movement of the hydraulic cylinder 8, so that the placing plate 5 and the testing component can be retracted or extended upwards conveniently.

In addition, two hydraulic cylinders 8 are preferably provided, on both sides below the hydraulic cylinders 8. And the hydraulic cylinder 8 may be replaced by a cylinder or a telescopic rod.

In one embodiment of the present utility model, referring to fig. 2, the moving member is a threaded rod 11 screwed through the placement plate 5, and one end of the threaded rod 11 is connected to the abutment plate 12 through a bearing.

Therefore, when the distance between the two opposite retaining plates 12 needs to be adjusted, the threaded rod 11 is rotated, so that the retaining plates 12 can be moved, and the adjustment is convenient and quick.

Further, referring to fig. 2 and 4, the bottom end of the retaining plate 12 is connected with a sliding block 16, the bottom of the placement groove 10 is provided with a sliding groove 13, and the sliding block 16 is slidably matched with the sliding groove 13.

Specifically, when the retaining plate 12 moves, the slider 16 can move along the chute 13, so that the stability of the movement of the retaining plate 12 can be improved.

In a specific embodiment, referring to fig. 1, the test assembly includes an instrumentation amplifier 6 and a relay set 7, the relay set 7 includes a first relay and a second relay, and a programmable power module 9 is disposed at one end of the interior of the accommodating cavity 3.

In addition, the device also comprises a sampling resistor (not shown), wherein one end of the first relay is connected with the controller 4, and the other end of the first relay is respectively connected with the drains of the two field effect transistors of the pair of field effect transistor tubes; one end of the second relay is connected with the controller 4, the other end of the second relay is respectively connected with the grid electrodes of the two field effect transistors of the pair of field effect transistor, one end of the programmable power supply module 9 is connected with the sampling resistor, and the other end of the programmable power supply module is connected with the controller 4; the input end of the instrumentation amplifier 6 is connected to two ends of the sampling resistor for detecting the voltage of two ends of the sampling resistor, and the output end of the instrumentation amplifier 6 is connected to the controller 4 via an analog-to-digital converter (not shown), which is connected between the controller and the second relay.

In addition, the specific testing process and testing parameters of the testing device are equal to the application number 202022162161.4, and the patent name is a testing process and testing parameters disclosed in the field effect transistor pair transistor testing device, which are not described herein again.

Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.

Claims (6)

1. A field effect transistor pair transistor testing device, characterized in that: including testboard (1), controller (4) are installed to testboard (1) up end one end, just through-hole (14) have been seted up to the up end of testboard (1), be equipped with liftable layer board (15) in through-hole (14), place board (5) and test module are installed to layer board (15) up end, place standing groove (10) that have holding transistor on board (5), the both sides that standing groove (10) are relative all are equipped with and bear board (12), bear board (12) can be close to or keep away from mutually through the moving part.

2. A field effect transistor pair transistor testing apparatus according to claim 1, wherein: the moving part is a threaded rod (11) which penetrates through the placing plate (5), and one end of the threaded rod (11) is connected with the resisting plate (12) through a bearing.

3. A field effect transistor pair transistor testing apparatus according to claim 1, wherein: the bottom of the abutting plate (12) is connected with a sliding block (16), a sliding groove (13) is formed in the bottom of the placing groove (10), and the sliding block (16) is in sliding fit with the sliding groove (13).

4. A field effect transistor pair transistor testing apparatus according to claim 1, wherein: the bottom of testboard (1) is equipped with underframe (2), be equipped with in underframe (2) and hold chamber (3).

5. The fet pair tube testing device of claim 4, wherein: the testing assembly comprises an instrument amplifier (6) and a relay set (7), and a programmable power module (9) is arranged at one end of the inside of the accommodating cavity (3).

6. The fet pair tube testing device of claim 4, wherein: the hydraulic cylinder (8) is installed at the inner bottom of the accommodating cavity (3), and the output end part of the hydraulic cylinder (8) is connected with the lower end surface of the supporting plate (15).