CN220105085U - Atomic force probe clamp and atomic force probe clamping tool - Google Patents
Atomic force probe clamp and atomic force probe clamping tool Download PDFInfo
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- CN220105085U CN220105085U CN202321509205.3U CN202321509205U CN220105085U CN 220105085 U CN220105085 U CN 220105085U CN 202321509205 U CN202321509205 U CN 202321509205U CN 220105085 U CN220105085 U CN 220105085U
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- clamp
- atomic force
- clamp body
- probe
- force probe
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- 239000000523 sample Substances 0.000 title claims abstract description 168
- 238000009434 installation Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 239000003292 glue Substances 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
Abstract
The utility model provides an atomic force probe clamp and an atomic force probe clamping tool, wherein the atomic force probe clamp comprises a first clamp body and a second clamp body, the first clamp body is provided with a probe mounting groove, and the first clamp body and the second clamp body are elastically connected in an openable and closable manner; the atomic force probe clamp has an open state and a clamped state; when in an open state, the second clamp body and the probe mounting groove are away from each other; when in a clamping state, the second clamp body is elastically pressed against the probe mounting groove. When a force is applied to the first clamp body and the second clamp body away from each other, the first clamp body and the second clamp body open; when the force is removed, the first clamp body and the second clamp body can be folded by means of elasticity and clamp the atomic force probe in the probe mounting groove by means of elasticity. Compared with the existing atomic force probe clamp, the atomic force probe clamp has the advantages of being simple to use, convenient to clamp, reliable in work and the like. The atomic force probe clamping tool has the advantages of the atomic force probe clamp, and therefore, the atomic force probe clamp is also provided.
Description
Technical Field
The utility model belongs to the technical field of auxiliary tools of atomic force microscopes, and particularly relates to an atomic force probe clamp and an atomic force probe clamping tool.
Background
An atomic force microscope is an analytical instrument for researching the surface structure of a substance by utilizing the interaction force between atoms and molecules. It is capable of imaging and analyzing the sample surface with high resolution on the order of nanometers. The atomic force microscope mainly comprises a probe, a sensor, a scanner and a computer control unit, and the working principle of the atomic force microscope is that one end of a cantilever of the probe is fixed, one end of a needle tip of the probe is close to a sample, and the acting force of the needle tip and the sample can enable the cantilever to deform or change in motion state. When a sample is scanned, the sensor is used for detecting the changes, so that acting force distribution information can be obtained, and surface morphology structure information and surface roughness information can be obtained with nanometer resolution. Atomic force microscopes are widely used in various fields of scientific research and the like.
The probe of an atomic force microscope is one of its key components. Probes are typically composed of a tiny tip and a cantilever, with the overall size of the probe being small, typically between tens of nanometers and hundreds of nanometers, to maintain high sensitivity. At present, the probe is mainly manually installed on an atomic force microscope, and the installation difficulty is high due to the small size of the probe. There are also risks associated with manual mounting, such as unstable grasping with forceps, damage to the probe by falling, breakage due to the forceps or the hand being prone to touching the probe cantilever, etc. In addition, incorrect mounting angles and mounting depths of the probes may cause abnormal vibration of the probes.
Disclosure of Invention
The embodiment of the utility model aims to provide an atomic force probe clamp and an atomic force probe clamping tool, which are used for solving the technical problem of high probe installation difficulty of an atomic force microscope in the prior art.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
an atomic force probe clamp is provided, which comprises a first clamp body and a second clamp body, wherein the first clamp body is provided with a probe mounting groove, and the first clamp body and the second clamp body are elastically connected in an openable and closable manner;
the atomic force probe clamp has an open state and a clamped state; when in an open state, the second clamp body and the probe mounting groove are away from each other; and in the clamping state, the second clamp body is elastically pressed against the probe mounting groove.
As a further improvement of the above technical scheme:
optionally, the first clamp body further has a through hole, and one end of the through hole is guided to the second clamp body.
Optionally, the plane projection area of the first clamp body is larger than the plane projection area of the second clamp body.
Optionally, the first clamp body and the second clamp body are both plate-shaped clamp bodies.
The utility model also provides an atomic force probe clamping tool which comprises a base, a top cover and the atomic force probe clamp, wherein the base is hinged with the top cover, and the top cover is used for driving the second clamp body and the probe mounting groove to be away from each other when the atomic force probe clamp is mounted on the base.
As a further improvement of the above technical scheme:
optionally, the base is provided with a lifting protrusion, when the atomic force probe clamp is mounted on the base, the top cover is pressed against the first clamp body, and the lifting protrusion penetrates through the through hole, so that the lifting protrusion is pressed against the second clamp body.
Optionally, the device further comprises a top cover driving structure, wherein the top cover driving structure is connected with the top cover in a driving manner and is used for driving the top cover to be pressed against the first clamp body.
Optionally, the top cover driving structure includes a screw and a screw hole, the screw is connected to one of the base and the top cover, the screw hole is connected to the other of the base and the top cover, and when the screw is connected to the screw hole, the screw is used for driving the top cover to press against the first clamp body or separate from the first clamp body.
Optionally, the top cover has an avoidance groove, when the atomic force probe clamp is in an open state, the avoidance groove is used for avoiding the second clamp body.
Optionally, a guide groove is formed in the base, and one end of the guide groove corresponds to the probe mounting groove.
The atomic force probe clamp and the atomic force probe clamping tool provided by the utility model have the beneficial effects that:
the utility model provides an atomic force probe clamp, which comprises a first clamp body and a second clamp body, wherein the first clamp body is provided with a probe mounting groove, and the first clamp body and the second clamp body are elastically connected in an openable and closable manner; the atomic force probe clamp has an open state and a clamped state; when in an open state, the second clamp body and the probe mounting groove are away from each other; when in a clamping state, the second clamp body is elastically pressed against the probe mounting groove.
The first clamp body and the second clamp body are respectively two clamp petals of the atomic force probe clamp, the probe mounting groove is a groove used for mounting the atomic force probe on the first clamp body, and the probe mounting groove can play a role in fixing and limiting the atomic force probe so that the atomic force probe is positioned at a correct mounting position after being mounted. When the first clamp body and the second clamp body are closed, the atomic force probe clamp is in a clamping state so as to clamp the atomic force probe mounted to the probe mounting groove; when the first clamp body and the second clamp body are opened, the atomic force probe clamp is in an opened state, so that the clamping of the atomic force probe is released, and the atomic force probe is conveniently taken out; alternatively, the flared first and second clamps can also form a relief space to facilitate installation of the atomic force probe. The first clamp body and the second clamp body are connected in an elastic and openable manner through springs, elastic sheets, elastic glue and the like. When a force is applied to the first clamp body and/or the second clamp body away from each other, the first clamp body and the second clamp body open; when the force is removed, the first clamp body and the second clamp body can be folded by means of elasticity and clamp the atomic force probe in the probe mounting groove by means of elasticity.
Compared with the existing atomic force probe clamp, the atomic force probe clamp has the advantages of being simple to use, convenient to clamp, reliable in work and the like.
The utility model also provides an atomic force probe clamping tool which comprises a base, a top cover and the atomic force probe clamp in the embodiment, wherein the base is hinged with the top cover, and the top cover is used for driving the second clamp body and the probe mounting groove to be away from each other when the atomic force probe clamp is mounted on the base.
The base is used for loading the atomic force probe clamp, the base is connected with the top cover in a hinged mode, and the atomic force probe clamp is driven to switch between an open state and a clamping state through the top cover. In addition, the atomic force probe clamping tool has the advantages of the atomic force probe clamp, and therefore the atomic force probe clamp also has the advantages of the atomic force probe clamp.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the drawings that are needed in the embodiments or the description of the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present utility model, and that other drawings can be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a three-dimensional structure of an atomic force probe clamp provided by the utility model;
FIG. 2 is a schematic perspective view of a first body of an atomic force probe chuck according to the present utility model;
fig. 3 is a schematic diagram of a three-dimensional structure of the clamping tool for an atomic force probe provided by the utility model;
FIG. 4 is a schematic view of a partial enlarged structure in FIG. 3;
fig. 5 is a schematic diagram of a three-dimensional structure of the clamping tool for an atomic force probe provided by the utility model;
FIG. 6 is a schematic cross-sectional structural view of the atomic force probe clamping tool provided by the utility model;
fig. 7 is a partially enlarged schematic view of the structure of fig. 6.
Wherein, each reference sign in the figure:
1. a first clamp body; 2. A second clamp body;
3. a probe mounting groove; 4. A through hole;
5. a base; 51. Lifting the bulge;
52. a guide groove; 6. A top cover;
61. an avoidance groove; 7. A top cover driving structure;
71. a screw; 72. A screw hole;
8. an atomic force probe.
Detailed Description
In order to make the technical problems, technical schemes and beneficial effects to be solved more clear, the utility model is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the utility model.
It will be understood that when an element is referred to as being "mounted" or "disposed" on another element, it can be directly on the other element or be indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or be indirectly connected to the other element.
It is to be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are merely for convenience in describing and simplifying the description based on the orientation or positional relationship shown in the drawings, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus are not to be construed as limiting the utility model.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature. In the description of the present utility model, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
As shown in fig. 1 and 2, the present utility model provides an atomic force probe clamp, which comprises a first clamp body 1 and a second clamp body 2, wherein the first clamp body 1 is provided with a probe mounting groove 3, and the first clamp body 1 and the second clamp body 2 are elastically connected in an openable and closable manner; the atomic force probe clamp has an open state and a clamped state; in the open state, the second clamp body 2 and the probe mounting groove 3 are away from each other; in the clamped state, the second clamp body 2 is elastically pressed against the probe mounting groove 3.
The first clamp body 1 and the second clamp body 2 are two clamp flaps of an atomic force probe clamp respectively, the probe mounting groove 3 is a groove used for mounting the atomic force probe 8 on the first clamp body 1, and the probe mounting groove 3 can play a role in fixing and limiting the atomic force probe 8 so that the atomic force probe 8 is positioned at a correct mounting position after being mounted. When the first clamp body 1 and the second clamp body 2 are closed, the atomic force probe clamp is in a clamping state so as to play a clamping role on the atomic force probe 8 mounted to the probe mounting groove 3; when the first clamp body 1 and the second clamp body 2 are opened, the atomic force probe clamp is in an opened state, so that the clamping of the atomic force probe 8 is released, and the atomic force probe 8 is conveniently taken out; alternatively, the flared first and second clamps 1, 2 can also form a relief space to facilitate installation of the atomic force probe 8.
The first clamp body 1 and the second clamp body 2 are connected in an elastic and openable manner through springs, elastic sheets, elastic glue and the like. When a force is applied to the first clamp 1 and/or the second clamp 2 away from each other, the first clamp 1 and the second clamp 2 open; when the force is removed, the first clamp 1 and the second clamp 2 can be closed by elasticity and clamp the atomic force probe 8 in the probe installation groove 3 by elasticity.
Compared with the existing atomic force probe clamp, the atomic force probe clamp has the advantages of being simple to use, convenient to clamp, reliable in work and the like.
As shown in fig. 1 and 2, in one embodiment of the present utility model, the first clip body 1 further has a through hole 4, and one end of the through hole 4 is guided to the second clip body 2. Wherein the through hole 4 is a hole for the jacking member to pass through the first clamping body 1 so that the jacking member can jack the second clamping body 2.
As shown in fig. 1 and 2, in one embodiment of the present utility model, the planar projection area of the first clip body 1 is larger than the planar projection area of the second clip body 2, so that the external fixing device is pressed against the end surface of the first clip body 1.
As shown in fig. 1 and 2, in one embodiment of the present utility model, the first clip body 1 and the second clip body 2 are both plate-shaped clip bodies. That is, the first clamping body 1 and the second clamping body 2 are clamping plates, and the clamping plates can form surface contact with the cantilever ends of the atomic force probes 8, so that the clamping plates can clamp the atomic force probes 8 stably. Specifically, the profile shape of the first clamp body 1 corresponds to the profile shape of the atomic force microscope where the atomic force probe clamp is installed, so that the atomic force probe clamp is installed on the atomic force microscope.
As shown in fig. 3 to 7, the utility model further provides an atomic force probe clamping tool, which comprises a base 5, a top cover 6 and an atomic force probe clamp in the above embodiment, wherein the base 5 and the top cover 6 are hinged, and when the atomic force probe clamp is installed on the base 5, the top cover 6 is used for driving the second clamp body 2 and the probe installation groove 3 to be far away from each other.
Wherein, base 5 is used for loading atomic force probe clamp, and base 5 and top cap 6 are articulated to be connected, drive atomic force probe clamp through top cap 6 and switch between open state and clamping state. In addition, the atomic force probe clamping tool has the advantages of the atomic force probe clamp, and therefore the atomic force probe clamp also has the advantages of the atomic force probe clamp.
As shown in fig. 2 and fig. 7, in one embodiment of the present utility model, a lifting protrusion 51 is provided on the base 5, when the atomic force probe chuck is mounted on the base 5, the top cover 6 is pressed against the first chuck body 1, and the lifting protrusion 51 penetrates through the through hole 4, so that the lifting protrusion 51 abuts against the second chuck body 2.
In use, the atomic force probe is clamped to the base 5 and the jacking projections 51 are penetrated through the through holes 4. Since the gravity of the atomic force probe clamp is smaller than the elastic force of the first clamp body 1 and the second clamp body 2, which are elastically opened and closed, the second clamp body 2 is supported on the lifting protrusion 51, and the first clamp body 1 is slightly lifted on the base 5. When the top cover 6 is pressed against the first clamp 1, the pressure is greater than the elastic force of the first clamp 1 and the second clamp 2 for elastic opening and closing, and the first clamp 1 is pressed against the base 5 along the pressure direction due to the pressing of the jacking protrusion 51 against the second clamp 2, so that the first clamp 1 and the second clamp 2 are opened.
As shown in fig. 3 and 5, in one embodiment of the present utility model, the device further includes a top cover driving structure 7, where the top cover driving structure 7 is in driving connection with the top cover 6, and is used to drive the top cover 6 to press against the first clip body 1. The top cover driving structure 7 may be a pneumatic/hydraulic cylinder, an electric push rod, etc.
As shown in fig. 3 and 5, in one embodiment of the present utility model, the top cover driving structure 7 includes a screw 71 and a screw hole 72, the screw 71 is connected to one of the base 5 and the top cover 6, the screw hole 72 is connected to the other of the base 5 and the top cover 6, and the screw 71 is used to drive the top cover 6 to press against the first clamp 1 or separate from the first clamp 1 when the screw 71 is connected to the screw hole 72.
Wherein, the screw 71 is connected to the base 5, and the screw hole 72 is connected to the top cover 6; alternatively, the screw 71 is connected to the top cover 6, and the screw hole 72 is connected to the base 5. The driving top cover 6 is pressed against the first clamp body 1 or separated from the first clamp body 1 through the threaded connection of the screw 71 and the screw hole 72; the cooperation of screw 71 and screw 72 can also play laborsaving and spacing effect to make the operation of atomic force probe clamping frock simpler.
In one embodiment of the present utility model, as shown in fig. 5 and 6, the top cap 6 has a relief groove 61, and the relief groove 61 is used to relieve the second clamp body 2 when the atomic force probe clamp is in an open state.
When the top cover 6 presses down the first clamp body 1, the second clamp body 2 is lifted up by the lifting projection 51. In order to avoid the interference of the top cover 6 on the second clamp 2, the top cover 6 is provided with an avoiding groove 61, and the cross-sectional area of the avoiding groove 61 should be larger than the cross-sectional area of the second clamp 2, so as to avoid the contact between the second clamp 2 and the top cover 6.
As shown in fig. 4 and 5, in one embodiment of the present utility model, a guide groove 52 is provided on the base 5, and one end of the guide groove 52 corresponds to the probe mounting groove 3.
The guiding groove 52 can guide the atomic force probe 8, one end of the guiding groove 52 corresponds to the opening position of the probe mounting groove 3, so that the atomic force probe 8 can be conveniently and directly pushed into the probe mounting groove 3 along the direction of the guiding groove 52, the alignment difficulty of the atomic force probe 8 is reduced, and the mounting precision of the atomic force probe 8 is improved.
When the atomic force probe clamping tool of the utility model is used,
first, the top cover 6 is opened;
secondly, placing an atomic force probe clamp on the base 5, and enabling the jacking protrusion 51 to penetrate through the through hole 4 on the first clamp body 1;
thirdly, closing the top cover 6, and pressing the first clamp body 1 by the top cover 6 through screwing the screw hole 72, and opening the first clamp body 1 and the second clamp body 2 under the propping action of the jacking bulge 51 of the second clamp body 2 so as to open the atomic force probe clamp; placing the atomic force probe 8 into the probe mounting groove 3 along the guide groove 52;
finally, by screwing the screw holes 72, the pressure of the top cover 6 on the first clamp body 1 is reduced, and the first clamp body 1 and the second clamp body 2 are elastically folded to clamp the atomic force probe 8. When the top cap 6 is completely released and the top cap 6 is opened, the atomic force probe holder with the atomic force probe 8 mounted thereon can be taken out.
The foregoing description of the preferred embodiments of the utility model is not intended to be limiting, but rather is intended to cover all modifications, equivalents, and alternatives falling within the spirit and principles of the utility model.
Claims (10)
1. An atomic force probe clamp is characterized by comprising a first clamp body (1) and a second clamp body (2), wherein the first clamp body (1) is provided with a probe mounting groove (3), and the first clamp body (1) and the second clamp body (2) are elastically connected in an openable and closable manner;
the atomic force probe clamp has an open state and a clamped state; when in an open state, the second clamp body (2) and the probe mounting groove (3) are far away from each other; when in a clamping state, the second clamp body (2) is elastically pressed against the probe mounting groove (3).
2. The atomic force probe clamp according to claim 1, characterized in that the first clamp body (1) further has a through hole (4), one end of the through hole (4) being directed to the second clamp body (2).
3. Atomic force probe clamp according to claim 1, characterized in that the planar projection area of the first clamp body (1) is larger than the planar projection area of the second clamp body (2).
4. Atomic force probe clamp according to claim 1, characterized in that the first clamp body (1) and the second clamp body (2) are both plate-shaped clamp bodies.
5. An atomic force probe clamping tool, which is characterized by comprising a base (5), a top cover (6) and the atomic force probe clamp according to any one of claims 2 to 4, wherein the base (5) and the top cover (6) are hinged, and the top cover (6) is used for driving the second clamp body (2) and the probe mounting groove (3) to be far away from each other when the atomic force probe clamp is mounted on the base (5).
6. The atomic force probe clamping tool according to claim 5, wherein a jacking protrusion (51) is arranged on the base (5), when the atomic force probe clamp is installed on the base (5), the top cover (6) is pressed against the first clamp body (1), and the jacking protrusion (51) penetrates through the through hole (4) so that the jacking protrusion (51) is pressed against the second clamp body (2).
7. The atomic force probe clamping tool according to claim 6, further comprising a top cover driving structure (7), wherein the top cover driving structure (7) is in driving connection with the top cover (6) and is used for driving the top cover (6) to press against the first clamping body (1).
8. The atomic force probe clamping tool according to claim 7, wherein the top cover driving structure (7) comprises a screw (71) and a screw hole (72), the screw (71) is connected to one of the base (5) and the top cover (6), the screw hole (72) is connected to the other of the base (5) and the top cover (6), and when the screw (71) is connected to the screw hole (72), the screw (71) is used for driving the top cover (6) to press against the first clamping body (1) or separate from the first clamping body (1).
9. The atomic force probe clamping tool according to claim 5, wherein the top cover (6) is provided with an avoidance groove (61), and the avoidance groove (61) is used for avoiding the second clamp body (2) when the atomic force probe clamp is in an open state.
10. The atomic force probe clamping tool according to claim 5, wherein the base (5) is provided with a guide groove (52), and one end of the guide groove (52) corresponds to the probe mounting groove (3).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321509205.3U CN220105085U (en) | 2023-06-13 | 2023-06-13 | Atomic force probe clamp and atomic force probe clamping tool |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321509205.3U CN220105085U (en) | 2023-06-13 | 2023-06-13 | Atomic force probe clamp and atomic force probe clamping tool |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220105085U true CN220105085U (en) | 2023-11-28 |
Family
ID=88841336
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321509205.3U Active CN220105085U (en) | 2023-06-13 | 2023-06-13 | Atomic force probe clamp and atomic force probe clamping tool |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220105085U (en) |
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2023
- 2023-06-13 CN CN202321509205.3U patent/CN220105085U/en active Active
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