CN219978470U - Adjusting mechanism of chip tester - Google Patents

Abstract

The utility model discloses an adjusting mechanism of a chip testing machine, which comprises a supporting frame, and further comprises a first clamping assembly and a second clamping assembly which are arranged at two sides of the inside of the supporting frame, wherein the first assembly comprises a first connecting plate, a rotating connecting rod and a first clamping plate, the rotating connecting rod is rotationally connected to the inner side wall of the first connecting plate, the first clamping plate is fixedly connected to the inner side of the rotating connecting rod, the second clamping assembly comprises a second connecting plate, a rotating motor and a second clamping plate, and the rotating motor is connected to the outer side of the second connecting plate in an embedded manner; when the chip is tested, the height and the angle of the chip tester can be accurately regulated and controlled by the regulating structure through the accurate calculation of the computer, and the manual regulation is not needed, so that the problem of angle deviation of the tester caused by manual regulation is avoided, and the efficiency of the chip test and the test effect are effectively improved.

Description

Adjusting mechanism of chip tester

Technical Field

The utility model relates to the technical field of chip testing, in particular to an adjusting mechanism of a chip testing machine.

Background

In the field of chip testing, when a chip is tested, a chip tester is generally placed on a fixed placing frame, the chip tester is required to be connected with a probe card and then aligned with a test wafer before testing, and the chip tester on the placing frame is required to be rotated to different directions and adjusted to different angles for alignment aiming at the test wafers of different types.

The existing chip tester is generally fixed on a workbench of a test area through a bracket when in use, and the chip is required to be subjected to position adjustment due to the placed position when in test, the existing adjustment mode is generally manually adjusted to the chip tester, but the chip tester is difficult to move due to heavier body of the chip tester, so that the adjustment and movement of the chip tester consume manpower and time, the adjustment difficulty is high, and the test efficiency of the chip is reduced. For this purpose, we propose an adjustment mechanism for a chip tester.

Disclosure of Invention

The utility model mainly aims to provide an adjusting mechanism of a chip testing machine, which can effectively solve the problems in the background technology.

In order to achieve the above purpose, the technical scheme adopted by the utility model is as follows:

the utility model provides an adjustment mechanism of chip testing machine, includes the support frame, still including locating the inside both sides of support frame first clamping component and second clamping component, first clamping component includes first connecting plate, rotates connecting rod and first grip block, it connects at first connecting plate inside wall to rotate the connecting rod rotation, first grip block fixed connection is inboard at the connecting rod that rotates, second clamping component includes second connecting plate, rotating motor and second grip block, it connects in the second connecting plate outside to rotate the motor inlay, and rotates motor power take off and run through the second connecting plate and extend to the second connecting plate inboard, second grip block fixed connection is at rotating motor power take off, the inside both sides of support frame are all inlayed and are connected with a plurality of electric telescopic cylinder, and electric telescopic cylinder telescopic end can dismantle with first connecting plate and second connecting plate lateral wall respectively and be connected.

Further, the support column is arranged on the back of the support frame, a sliding groove is formed in one side of the support column surface, which is opposite to the support frame, of the support column surface, a connecting sliding block which is matched with the sliding groove is connected in a sliding manner, and the outer side wall of the connecting sliding block is fixedly connected with the back of the support frame.

Further, the inside rotation of support column is connected with drive screw, and drive screw runs through the connection slider and with connection slider threaded connection.

Further, the top end of the support column is embedded and connected with a driving motor, and the power output end of the driving motor is detachably connected with the driving screw.

Further, a control panel is embedded and connected on one side surface of the support column.

Further, the support column bottom fixedly connected with base.

Further, a plurality of rubber anti-skid blocks are fixedly connected to the inner side walls of the first clamping plate and the second clamping plate.

Further, the threaded holes matched with the driving screw are formed in the connecting sliding blocks, and the threaded holes penetrate through the connecting sliding blocks and extend to the bottom ends of the connecting sliding blocks.

Compared with the prior art, the utility model has the following beneficial effects: according to the utility model, the supporting frame, the electric telescopic cylinder, the first connecting plate, the rotating connecting rod, the first clamping plate, the second connecting plate, the rotating motor and the second clamping plate are arranged, when the chip tester tests chips, the tester body is placed on the supporting frame, the electric telescopic cylinder is controlled by the controller to drive the first clamping plate and the second clamping plate to move inwards so as to clamp the tester inside the supporting frame, when the chip tester tests, the rotating motor is controlled by the control panel to drive the second clamping plate to rotate according to the placing position of the chips, the first clamping plate can rotate in the clamping process in a way of connecting the rotating connecting rod with the first connecting plate, and when the rotating motor drives the second clamping plate to rotate, the chip tester clamped inside and the first clamping plate rotate along with the rotation, so that the angle adjustment of the chip tester is realized, the chip tester is conveniently tested, the rotating angle of the servo motor is controlled by the computer, the rotating angle of the tester is accurately controlled, the chip tester is not required to be manually adjusted, the problem of angle deviation of the tester caused by manual adjustment is avoided, and the testing efficiency and the testing effect of the chip is effectively improved.

Drawings

FIG. 1 is a schematic diagram of an overall structure of an adjusting mechanism of a chip tester according to the present utility model.

Fig. 2 is a schematic structural view of a second clamping assembly of the adjusting mechanism of the chip tester according to the present utility model.

Fig. 3 is a schematic structural view of a first clamping assembly of an adjusting mechanism of a chip tester according to the present utility model.

In the figure: 1. a base; 2. a support column; 3. a control panel; 4. a driving motor; 5. a support frame; 6. a chute; 7. driving a screw; 8. the connecting slide block; 9. a first clamping assembly; 10. a second clamping assembly; 11. an electric telescopic cylinder; 12. rubber anti-skid blocks; 901. a first connection plate; 902. rotating the connecting rod; 903. a first clamping plate; 1001. a second connecting plate; 1002. a rotating motor; 1003. and a second clamping plate.

Detailed Description

The utility model is further described in connection with the following detailed description, in order to make the technical means, the creation characteristics, the achievement of the purpose and the effect of the utility model easy to understand.

As shown in fig. 1-3, the adjusting mechanism of the chip testing machine comprises a supporting frame 5, and further comprises a first clamping component 9 and a second clamping component 10 which are arranged on two sides of the inside of the supporting frame 5, wherein the first clamping component 9 comprises a first connecting plate 901, a rotating connecting rod 902 and a first clamping plate 903, the rotating connecting rod 902 is rotationally connected to the inner side wall of the first connecting plate 901, the first clamping plate 903 is fixedly connected to the inner side of the rotating connecting rod 902, the second clamping component 10 comprises a second connecting plate 1001, a rotating motor 1002 and a second clamping plate 1003, the rotating motor 1002 is embedded and connected to the outer side of the second connecting plate 1001, a power output end of the rotating motor 1002 penetrates through the second connecting plate 1001 and extends to the inner side of the second connecting plate 1001, the second clamping plate 1003 is fixedly connected to the power output end of the rotating motor 1002, a plurality of electric telescopic cylinders 11 are embedded and connected to two sides of the inside of the supporting frame 5, and the telescopic ends of the electric telescopic cylinders 11 are detachably connected with the first connecting plate 901 and the outer side wall of the second connecting plate 1001 respectively; the rotation motor 1002 drives the second grip block 1003 to rotate, and the first grip block 903 can also rotate when the centre gripping through the mode that the rotation connecting rod 902 is connected with first connection plate 901 to when this rotation motor 1002 drives the rotation of second grip block 1003, the chip tester of inboard centre gripping and first grip block 903 follow the rotation, thereby realize the angle modulation of chip tester, conveniently test the chip.

The support column 2 is arranged on the back of the support frame 5, a sliding groove 6 is formed in one side, opposite to the support frame 5, of the support column 2, a connecting sliding block 8 which is matched with the sliding groove 6 is connected in a sliding manner, the outer side wall of the connecting sliding block 8 is fixedly connected with the back of the support frame 5, a driving screw 7 is connected in the support column 2 in a rotating manner, the driving screw 7 penetrates through the connecting sliding block 8 and is in threaded connection with the connecting sliding block 8, a driving motor 4 is embedded and connected at the top end of the support column 2, and the power output end of the driving motor 4 is detachably connected with the driving screw 7; the driving screw rod 7 is driven to rotate positively and negatively through the driving motor 4, the connecting sliding block 8 in threaded connection with the driving screw rod 7 slides up and down along the sliding groove 6 formed on the surface of the supporting column 2, and the supporting frame 5 connected to the outer side is driven to slide up and down, so that the up and down height of the testing machine is adjusted.

The surface of one side of the support column 2 is embedded and connected with a control panel 3, and the bottom end of the support column 2 is fixedly connected with a base 1; the support column 2 is conveniently and stably placed on the ground through the base 1, and the later stage of being convenient for supports the testing machine and uses.

The inner side walls of the first clamping plate 903 and the second clamping plate 1003 are fixedly connected with a plurality of rubber anti-skid blocks 12, threaded holes matched with the driving screw 7 are formed in the connecting sliding blocks 8, and the threaded holes penetrate through the connecting sliding blocks 8 and extend to the bottom ends of the connecting sliding blocks 8; the anti-skid property of the first clamping plate 903 and the second clamping plate 1003 can be improved through the rubber anti-skid block 12, the clamping stability is ensured, the connecting sliding block 8 is conveniently connected with the driving screw 7 through the threaded hole, and the connecting sliding block 8 is conveniently driven to move up and down through the driving screw 7 which rotates.

It should be noted that, when the adjusting mechanism of the chip testing machine of the present utility model is used, the body of the testing machine is placed on the supporting frame 5, and the electric telescopic cylinder 11 is controlled by the controller to drive the first clamping plate 903 and the second clamping plate 1003 to move inwards so as to clamp the testing machine on the inner side of the supporting frame 5, the driving screw 7 is driven to rotate forward and backward by the driving motor 4, the connecting sliding block 8 connected with the driving screw 7 in a threaded manner slides up and down along the sliding groove 6 arranged on the surface of the supporting column 2, and drives the supporting frame 5 connected with the outer side to slide up and down, so as to adjust the up and down height of the testing machine, then the rotating motor 1002 is controlled by the control panel to drive the second clamping plate 1003 to rotate, and the first clamping plate 903 can also rotate during clamping by the way of connecting the rotating connecting rod 902 with the first connecting plate 901, so that the rotating motor 1002 drives the second clamping plate 1003 to rotate, the chip testing machine clamped on the inner side and the first clamping plate 903 follow to rotate, thereby realizing the angle adjustment of the chip testing machine, the chip testing surface of the testing machine can be accurately aligned, and the chip is not required to be adjusted manually, the efficiency and the testing effect of testing is improved.

The foregoing has shown and described the basic principles and main features of the present utility model and the advantages of the present utility model. It will be understood by those skilled in the art that the present utility model is not limited to the embodiments described above, and that the above embodiments and descriptions are merely illustrative of the principles of the present utility model, and various changes and modifications may be made without departing from the spirit and scope of the utility model, which is defined in the appended claims. The scope of the utility model is defined by the appended claims and equivalents thereof.

Claims (8)

1. The utility model provides an adjustment mechanism of chip testing machine, includes support frame (5), its characterized in that still includes first clamping component (9) and second clamping component (10) of locating the inside both sides of support frame (5), first clamping component (9) are including first connecting plate (901), rotation connecting rod (902) and first clamping plate (903), rotation connecting rod (902) rotate and connect at first connecting plate (901) inside wall, first clamping plate (903) fixed connection is inboard at rotation connecting rod (902), second clamping component (10) are including second connecting plate (1001), rotation motor (1002) and second clamping plate (1003), rotation motor (1002) are inlayed and are connected in the second connecting plate (1001) outside, and rotation motor (1002) power take off end runs through second connecting plate (1001) and extend to second connecting plate (1001) inboard, second clamping plate (1003) fixed connection is at rotation motor (1002) power take off end, the inside both sides of support frame (5) are all inlayed and are connected with a plurality of electric telescopic cylinder (11), and electric telescopic cylinder (11) end respectively with first connecting plate (1001) and outer connecting plate (1001) can dismantle.

2. The adjustment mechanism of a chip tester according to claim 1, wherein: still including locating support column (2) at support frame (5) back, spout (6) have been seted up to one side of support column (2) face looks support frame (5), inside sliding connection of spout (6) has connecting slider (8) of looks adaptation, and connecting slider (8) lateral wall and support frame (5) back fixed connection.

3. The adjustment mechanism of a chip tester according to claim 2, wherein: the support column (2) is internally connected with a driving screw (7) in a rotating way, and the driving screw (7) penetrates through the connecting sliding block (8) and is in threaded connection with the connecting sliding block (8).

4. The adjustment mechanism of a chip tester according to claim 2, wherein: the top end of the supporting column (2) is embedded and connected with a driving motor (4), and the power output end of the driving motor (4) is detachably connected with a driving screw (7).

5. The adjustment mechanism of a chip tester according to claim 2, wherein: one side surface of the support column (2) is embedded and connected with a control panel (3).

6. The adjustment mechanism of a chip tester according to claim 2, wherein: the bottom end of the support column (2) is fixedly connected with a base (1).

7. The adjustment mechanism of a chip tester according to claim 1, wherein: the inner side walls of the first clamping plate (903) and the second clamping plate (1003) are fixedly connected with a plurality of rubber anti-skid blocks (12).

8. The adjustment mechanism of a chip tester according to claim 2, wherein: the connecting sliding block (8) is provided with a threaded hole matched with the driving screw (7), and the threaded hole penetrates through the connecting sliding block (8) and extends to the bottom end of the connecting sliding block (8).