CN2199543Y

CN2199543Y - Infrared remote-meter for dielectric loss

Info

Publication number: CN2199543Y
Application number: CN 94214657
Authority: CN
Inventors: 施亚民
Original assignee: Individual
Current assignee: Individual
Priority date: 1994-06-20
Filing date: 1994-06-20
Publication date: 1995-05-31
Anticipated expiration: 2004-06-20

Abstract

The utility model belongs to electrical measuring instruments and is suitable for measuring the dielectric loss value and the capacitance value of the insulation property of high voltage electric equipment. The utility model is characterized in that a positive connection method measuring system 2 and a negative connection method measuring system 1 of the instrument are respectively provided with an infrared light emitting and receiving circuit which is formed by series connection of an infrared luminescence driving circuit 17 (27), an infrared light emitting and receiving device 1C (2C) and an infrared light receiving circuit 18 (28), and the infrared light emitting and receiving circuit is controlled by a microcomputer 19 (29). Wireless communication and data transmission are carried out between the two systems 1, 2 through infrared light. The utility model has the advantages of low manufacture difficulty, high measuring precision, remote control, remote measuring, etc.

Description

Infrared remote-meter for dielectric loss

The utility model infrared telemetry dielectric loss tester is a kind of instrument that is used to measure the high voltage electric equipment insulating property.

The dielectric loss tester that generally uses has QS type high-tension bridge at present.Because of adopting principle of balance bridge, it measures, so exist defectives such as complicated operation, precision be low.Another kind is that the patent No. is the dielectric loss measurer by optical fibre and microcomputer of CN89100046.1, getting in touch between its opposition method measuring system and the positive connection measuring system adopts optical fiber to transmit simulating signal, because measurement is very high to the requirement of transmitting device, so difficult control of the precision of instrument and manufacturing cost are also higher.

The purpose of this utility model provides the infrared telemetry dielectric loss tester that adopts wireless contact of infrared ray and Data transmission amount between a kind of opposition method measuring system and the positive connection measuring system.

The utility model infrared telemetry dielectric loss tester comprises an opposition method measuring system and a positive connection measuring system.The front end of two systems is connected to a confession and obtains the standard high-voltage impedor that reference signal is used.The output terminal of positive connection measuring system is connected to a medium and decreases display and a capacitance display.There is a low-voltage supply to be connected with positive and negative two measuring systems power supply with a high-pressure side working power, an inverter.In positive and negative two measuring systems, have one separately and transmit and receive device, an infrared light emission and the receiving loop that the series connection of infrared light receiving circuit constitutes by an infraluminescence driving circuit and an infrared light.Transmit and receive by infrared light emission and receiving loop between two systems that infrared light is got in touch with and data transfer.

Adopted infrared light to carry out wireless contact and data transfer between positive and negative two measuring systems in the utility model infrared telemetry dielectric loss tester, because what transmit is digital quantity, so the property difference of illuminator and optical receiver does not influence the authenticity of the data that are transmitted, thereby improved the measuring accuracy of instrument, reduced manufacture difficulty.Again owing to adopted the wireless contact of infrared light, the opposition method measuring system of pretending to an instrument part can be loaded in the on high-tension side device of test specimen, by infrared light and the positive connection measuring system wireless contact of infrared light and the data transfer that are contained in the instrument body, play the effect of remote measurement.

Accompanying drawing 1 is the utility model frame principle figure; Accompanying drawing 2 is the circuit diagram of the emission of the infrared light between positive opposition method measuring system of the present utility model with receiving loop; Fig. 3 is the circuit frame principle figure of the utility model inverter 7; Fig. 4 adopts positive connection to measure the entity synoptic diagram of High-Voltage Electrical Appliances medium damage value and capacitance when using for the utility model is on-the-spot; Fig. 5 adopts opposition method to measure the entity synoptic diagram of High-Voltage Electrical Appliances medium damage value and capacitance when using for the utility model is on-the-spot, and among the figure, 6 is the utility model instrument body, and M4 is for supporting insulated column.

Following adjoint is further done embodiment explanation: the utility model infrared telemetry dielectric loss tester, by the positive connection measuring system of an opposition

method measuring system

1 and 2, standard high-voltage impedor ZB, medium decrease display 3, capacitance display 4, low-voltage supply 5, high-pressure side working power 6, an inverter 7 is formed.Wherein: opposition method measuring system 1 is by a high-pressure side sample resistance RBH, test product current selected switch K1, one group of high-pressure side test product current sampling resistor RIH, measurement that is made of side by side two electronic switch K2, K3 and proofread and correct chip microprocessor 19 that selector switch 10, one adopt 87C51, one and transmit and receive device IC and infrared light receiving circuit 18 infrared light emission and the receiving loop that constitutes of connect by an infrared light driving circuit 17 and infrared light and constitute.And the input end eb1 of the upper end of the lower end of high-pressure side sample resistance RBH and external measuring resistance ZB, voltage signal passage 1B, measure in parallel with the input end of an electronic switch K3 in the correction selector switch 10.The upper end of high-pressure side sample resistance RBH is connected with the end that high voltage side current sample resistance RIH meets high voltage UH.The high-pressure side H of the external test specimen CX of the other end of test product current sampling resistor RIH.The end of the external test specimen CX of test product current sampling resistor RIH and centre tap thereof are by test product current selected switch K1 and measure with the input end of an electronic switch K2 in the correction selector switch 10 and link to each other.Two output control terminal PO11 of microprocessor 19, PO12 control linkage are measured and two controlled ends proofreading and correct selector switch 10.Channel current signal 1A, by a bandpass filter 11 and a shaping circuit 12, an A/D converter 13 constitutes, wherein, the input end of bandpass filter 11 is connected with the output terminal of measuring with proofreading and correct selector switch 10, its output terminal is connected with the input end of shaping circuit 12, A/D converter 13 respectively, and the output terminal of shaping circuit 12 is connected with a serial input terminal PI11 of microcomputer 19.Voltage signal passage 1B is made of a bandpass filter 14, shaping circuit 15, an A/D converter 16 equally.And the connection between the three 14,15,16 is identical with channel current signal 1A, the output terminal of shaping circuit 15 is connected with a serial input terminal PI12 of microcomputer 19, and A/D converter 16 is connected with the A/D converter 13 of channel current signal 1A and a control end PD11 of microcomputer 19 by DCB.The far infrared emission is connected with a serial output terminal PO13 of microcomputer 19 with the input end of receiving loop, and the output terminal in loop is connected with another serial input terminal PI13 of microcomputer 19; The circuit structure of positive connection measuring system 2 is corresponding identical with the circuit structure of reversal connection measuring system 1, and just, external high voltage corresponds to earth point, and an end that connects test specimen CX corresponds to low pressure end L.Other, there is the microcomputer 29 that adopts 8752 single-chip microcomputers to decrease display 3 and capacitance display 4 by the external medium of output bus PD22, another serial input terminal PI24 of microcomputer 29 measures selector switch M1 ground connection by a positive opposition method, and the serial input terminal PI25 of microcomputer 29 is by a measurement start button M3 ground connection; Low-pressure side working power 5, provide energy by power frequency supply Uac by switch M2, circuit such as its step-down by routine, rectification, filtering, voltage stabilizing constitute, and its output terminal UD, US, UC send positive connection measuring system 2 and medium to decrease display 3 and capacitance display 4 is made the work power supply.Its output terminal VP send inverter 7 to make the work power supply; Inverter 7 is for opposition method measuring system 1 provides working power.When contact e is communicated with contact e2, power to inverter 7 by high-pressure work power supply 6.High-pressure work power supply 6 is generally substituted by dry cell, and K7 is the fling-cut switch of high-pressure work power supply 6.When contact e is communicated with contact e1, power to inverter by low-pressure side working power 5.Inverter 7 is by input end eP input power supply, after its inner square wave oscillator 71 is alternating current with dc inverter, again through power amplifier 72 power amplifications, boost through pulse transformer 73, behind current rectifying and wave filtering circuit 74 rectifying and wave-filterings, again through integrated

regulator

75,76,77 voltage stabilizings of three parallel connections, output voltage V dh, Vsh, Vcn are as the working power of opposition method measuring system 1 respectively.Be example with the opposition method measuring system now, be described below: channel current signal 1A is identical with voltage signal passage 1B circuit theory.The C point is the common point of metering circuit, itself and trial voltage VH

equipotential.Bandpass filter

11,14 is in order to the harmonic wave deal in the filtering input signal.A/

D converter

13,16 links to each other with the PD11 interface of microcomputer 19 through DCB, to realize the measurement to the input

signal amplitude.Reshaper

12,15 sine wave shaped with its input become square wave to send serial input terminal PI11, the PI12 of microcomputer 19, mistiming when microcomputer 19 can be according to two square wave upward transitions calculates the phase differential of two passages output square wave and the dielectric loss angle tangent of test product, because electric current and

voltage signal passage

1A and 1B characteristic can not be consistent for a long time, can produce additive error.For eliminating this additive error, the utility model is provided with the self-correcting function.When instrument started use, it was low level that microcomputer 19 is at first put output control terminal PO11, and PO12 is a high level.At this moment, measure and the electronic switch K2 disconnection of proofreading and correct in the selector switch 10, the K3 closure, two

passage

1A, 1B are from the terminal voltage eB1 that is voltage sampling resistor RBH of input end eB1 input.Instrument is in the self-correcting state.Microcomputer 19 at first records the square wave phase difference of two reshapers, 12,15 outputs and the amplitude ratio of two A/D converters, 13,16 outputs, and with this corrected value internal memory.Microcomputer 19 makes that output control terminal PO11 is that high level, PO12 are low level then.At this moment, electronic switch K2 closure, K3 disconnects.Instrument is converted to the measurement state.Channel current signal 1A is from the input end eb1 input measuring-signal that is directly proportional with test specimen CX electric current.Make microcomputer 19 record the phase differential of square wave of two

passage

1A, 1B output and the amplitude ratio of two A/

D converters

13,16 output once more, and with this measured value internal memory, microcomputer 19 can obtain real capacitance of test specimen CX and medium damage value from corrected value and correction measured value when data processing then.Infrared light emission and receiving loop, as shown in Figure 2: it is by a not gate U17(U27) and a current-limiting resistance R11(R21) formation infrared light driving circuit 17(27); By an infrarede emitting diode D1F(D2F) with an infrared receiver tube D1S(D2S) the relative infrared light that connects into of positive pole transmits and receives device 1C(C2) by resistance R 13(R23) with resistance R 14(R24) forms bleeder circuit and meets voltage comparison amplifier U18(U28 respectively) and negative input end formation infrared light receiving circuit.In the circuit, voltage comparison amplifier U18(U28) negative pole positive input termination infrared light receiving tube D1S(D2S), a resistance R 12(R22 is arranged) be connected in parallel on voltage comparator U18(U28) positive pole and power supply zero utmost point between as the photocurrent sample resistance, an output resistance R15(R25 is arranged) be connected on voltage comparison amplifier U18(U28) output terminal and infrarede emitting diode D1F(D2F), infrared receiving diode D1S(D2S) between.Voltage comparison amplifier U18(U28) serial input terminal PI13(PI23 output termination microcomputer 19(29)).When test specimen CX low pressure end L insulation against ground, the electric current that high voltage U4 flows through test product CX can be commonly referred to positive connection from the low pressure end L sampling of test product CX.When the direct ground connection of the low pressure end L of test specimen CX, in the time of can't taking apart, the test product electric current can only be commonly referred to opposition method from the high-pressure side H sampling and testing of test product CX.When positive connection is worked (its entity as shown in Figure 4), opposition method measuring system 1 device and two infrared lights emissions are not all devoted oneself to work with receiver 1C, 2C.And the low pressure end N insulation against ground of the low pressure end L of test specimen CX and standard impedance unit ZB, and these two ends L, N be connected with two input end IX, IB on this instrument body 6 respectively.During measurement, at first the positive opposition method on the instrument body 6 is measured selector switch M1 and switch to positive connection position.Press start button M3 then, at this moment, microcomputer 29 is by output terminal PO21, and PO22 connects the electronic switch K4 disconnection, the K5 that measure with proofreading and correct in the selector switch 20.Make and enter channel current signal 2A and the signal of voltage signal passage 2B from input end eb2 and be standard signal (pressure drop on the voltage sampling resistor RBL) microcomputer 29 that is directly proportional with the electric current that flows through standard impedance unit ZB and will record the phase differential of two passage 2A, 2B output signal and amplitude than (being corrected value) internal memory.Then, microcomputer 29 makes electronic switch K4 connection, K5 disconnect again.Voltage signal passage 2B input this moment be still standard signal, and channel current signal 2A input is the measured signal (being the pressure drop on the sample resistance RIL) that is directly proportional with the electric current that flows through test specimen CX.After this, microcomputer 29 records the phase differential and the amplitude ratio of two passage 2A, 2B output once more, then the phase differential that records for twice is subtracted each other and calculates the real medium damage value of test specimen CX.Calculate the actual capacitance value of test specimen CX after simultaneously the amplitude that records for twice being compared.At last two values are sent medium to decrease

display

3 and 4 demonstrations of capacitance display.During opposition method work, (its entity as shown in Figure 5), earlier high voltage UH is put on test specimen CX, standard impedance unit ZB(high pressure standard capacitance) and opposition method measuring system of the present utility model 1 device on, and the positive opposition method measurement selector switch M1 that will be loaded on the utility model body 6 switches to the opposition method position, open working power switch M2, press start button M3 then.Microcomputer 29 in this moment instrument body 6 is through serial output terminal PO23, driving circuit 27, infraluminescence pipe D2F, and operational order is passed on the receiving plane with the infrared emission of high voltage UH equipotential work and the infrared receiving tube D1S among the receiver 1C.D1S output photocurrent is sent into the PI13 serial input terminal of the microcomputer 19 in opposition method measuring system 1 device after voltage comparison amplifier 18 amplifies.Microcomputer 19 is discerned this order, confirm as at first will measure with proofreading and correct selector switch 10 after the startup command and switch to correction position, record the corrected value and the internal memory of phase differential and difference in magnitude channel current signal 1A in opposition method measuring system 1 device and the voltage signal passage 1B by output control terminal PO11, PO12.To measure then with proofreading and correct selector switch 10 and switch to the measuring position, carry out phase place and amplitude measurement with the electric current that flows through standard impedance unit ZB flowing through test specimen CX.On microcomputer 19 passes to twice measurement and result of calculation low-pressure side through serial output terminal PO13, driving circuit 17, infraluminescence pipe D1F infrared light emission and the receiving plane of the infrared receiving tube D2S of receiver 2C, the photocurrent of D2S output send among the serial input terminal PI23 of the microcomputer 29 in the instrument body 6 after voltage comparison amplifier 28 amplifies.After the string number signal that 29 pairs of microcomputers are received is handled, decrease the measured value that demonstrates test specimen CX on display 3 and the capacitance display 4 through output terminal PD22 at medium again, to reach the purpose of this utility model.

Claims

1, a kind of infrared telemetry dielectric loss tester that is used to measure the high voltage electric equipment insulating property, comprise an opposition method measuring system (1) and a positive connection measuring system (2), two systems (1,2) front end is connected to a confession and obtains the standard high-voltage impedor ZB that reference signal is used, the output terminal of positive connection measuring system (2) is connected to a medium and decreases a display (3) and a capacitance display (4), a low-voltage supply (5) and a high-pressure side working power (6) are arranged, an inverter (7) and two systems (1,2) power supply connects, it is characterized in that described opposition method measuring system (1) and just have one separately by an infraluminescence driving circuit (17 in the connection measuring system (2), 27) and an infrared light transmit and receive device (1C, 2C), an infrared light receiving circuit (18, the infrared light emission and the receiving loop of 28) series connection formation, two systems (1,2) be by infrared light emission and receiving loop between, transmit and receive infrared light and carry out wireless contact and data transfer.

2, infrared telemetry dielectric loss tester according to claim 1, it is characterized in that said opposition method measuring system (1), transmit and receive the loop and constitute with correction selector switch (10), a channel current signal (1A), a voltage signal passage (1B), a microprocessor (19), an infrared light by a high-pressure side sample resistance (RBH), a test product current selected switch (K1), one group of high-pressure side test product current sampling resistor (RIH), a measurement that constitutes side by side by two electronic switches (K2, K3), wherein:

The upper end of the lower end of high-pressure side sample resistance (RBH) and external measuring resistance ZB, the input end (eb1) of voltage signal passage (1B), measure in parallel with the input end of an electronic switch (K3) in the correction selector switch (10), the upper end of high-pressure side sample resistance (RBH) is connected with the end that high-pressure side test product current sampling resistor (RIH) connects high voltage (UH), the high-pressure side H of the external test specimen of the other end (CX) of test product current sampling resistor (RIH), the end of the external test specimen CX of test product current sampling resistor (RIH) and centre tap thereof are by a test product current selected switch (K1) and measure with the input end of an electronic switch (K2) in the correction selector switch (10) and link to each other, two output control terminal (P011 of microprocessor (19), P012) control linkage is measured and two controlled ends proofreading and correct selector switch (10), channel current signal (1A) is by a bandpass filter (11) and a shaping circuit (12), an A/D converter (13) constitutes, wherein, the input end of bandpass filter (11) is connected with the output terminal of measuring with proofreading and correct selector switch (10), its output terminal respectively with shaping circuit (12), the input end of A/D converter (13) connects, the output terminal of shaping circuit (12) is connected with a serial input terminal (PI11) of microcomputer (19), voltage signal passage (IB) is equally by a bandpass filter (14), a shaping circuit (15), an A/D converter (16) constitutes, the three (14,15,16) connection between is identical with channel current signal (1A), the output terminal of shaping circuit (15) is connected with a serial input terminal (PI12) of microcomputer (19), A/D converter (16) is connected with the A/D converter (13) of channel current signal (1A) and an input end (PD11) of microcomputer (19) by DCB, the far infrared emission is connected with a serial output terminal (P013) of microcomputer (19) with the input end of receiving loop, and the output terminal in loop is connected with another serial input terminal (PI13) of microcomputer (19).

3, infrared telemetry dielectric loss tester according to claim 2, it is characterized in that described positive connection measuring system (2), constitute with receiving loop with correction selector switch (20), a channel current signal (2A), a voltage signal passage (2B), a microprocessor (29), an infrared light emission by a low-pressure side voltage sampling resistor (RBL), a test product current selected switch (K6), one group of low-pressure side test product current sampling resistor (RIL), a measurement of forming side by side by two electronic switches (K4, K5), wherein:

The lower end N of the upper end of low pressure sample resistance (RBL) and external measuring resistance (ZB), the input end (eb2) of voltage signal passage (2B), measure in parallel with the input end of the electronic switch (K5) of proofreading and correct selector switch (20), its lower end is connected with the earth terminal of test product current sampling resistor (RIL), the low pressure end L of the external test specimen CX of the other end of test product current sampling resistor (RIL), the end of the external test specimen CX of test product current sampling resistor (RIL) and centre tap thereof are by a test product current selected switch (K6) and measure with the input end of an electronic switch (K4) in the correction selector switch (20) and link to each other, two control end (PO21 of microprocessor (29), PO22) control linkage is measured and two controlled ends proofreading and correct selector switch (20), channel current signal (2A) is by a bandpass filter (21) and a shaping circuit (22), an A/D converter (23) constitutes, wherein, the input end of bandpass filter (21) is connected with the output terminal of measuring with proofreading and correct selector switch (10), its output terminal respectively with shaping circuit (22), the input end of A/D converter (23) connects, the output terminal of shaping circuit (22) is connected with a serial input terminal (PI21) of microcomputer (29), voltage signal passage (2B) is equally by a bandpass filter (24) and a shaping circuit (25), an A/D converter (26) constitutes, the three (24,25,26) connection between is identical with current signal logical number (2A), the output terminal of shaping circuit (25) is connected with another serial input terminal (PI22) of microcomputer (29), A/D converter (26) is connected with the A/D converter (23) of channel current signal (2A) and a control end (PD21) of microcomputer (29) by DCB, the far infrared emission is connected with a serial output terminal (PO23) of microcomputer (29) with the input end of receiving loop, the output terminal in loop is connected with a serial input terminal (PI23) of microcomputer (29), microcomputer (29) decreases display (3) and capacitance display (4) by the external medium of output bus, another serial input terminal (PI24) of microcomputer (29) is by a positive opposition method working mode selection switch (M1) ground connection, and another serial input terminal (PI25) of microcomputer (29) is by a measurement start button (M3) ground connection.