CN219871099U - Sample support of stretchable temperature-variable X-ray diffractometer for film sample - Google Patents
Sample support of stretchable temperature-variable X-ray diffractometer for film sample Download PDFInfo
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- CN219871099U CN219871099U CN202321298129.6U CN202321298129U CN219871099U CN 219871099 U CN219871099 U CN 219871099U CN 202321298129 U CN202321298129 U CN 202321298129U CN 219871099 U CN219871099 U CN 219871099U
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- sample
- clamp
- ray diffractometer
- stress sensor
- temperature
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 24
- 239000010408 film Substances 0.000 claims description 60
- 239000010409 thin film Substances 0.000 claims description 4
- 238000006073 displacement reaction Methods 0.000 claims description 3
- 238000012360 testing method Methods 0.000 abstract description 23
- 238000011065 in-situ storage Methods 0.000 abstract description 6
- 238000004458 analytical method Methods 0.000 abstract description 5
- 238000000034 method Methods 0.000 description 4
- 239000000843 powder Substances 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 239000003921 oil Substances 0.000 description 2
- 238000002441 X-ray diffraction Methods 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 239000010724 circulating oil Substances 0.000 description 1
- 230000003811 curling process Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
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- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The utility model relates to a sample support of a stretchable variable-temperature X-ray diffractometer for a film sample, which belongs to the technical field of analysis and test, and structurally comprises a sample fixing frame (1), a moving platform (2), a first clamp (3) with a stress sensor, a second clamp (4), a first chute (5), a second chute (6), a jackscrew (7), a screw rod (8), a screw (9), a water inlet guide pipe (10), a water outlet guide pipe (11) and scale marks (12); the utility model can realize the coincidence of the surfaces of the film samples with different thicknesses and the central axis of the goniometer, can realize the in-situ test of the film samples in a stretching state, and can realize the temperature change test of the film samples.
Description
Technical Field
The utility model belongs to the technical field of analysis and test, and particularly relates to a sample support of a stretchable variable-temperature X-ray diffractometer for a film sample.
Background
The goniometer is a core part of an X-ray diffractometer for accurately measuring the diffraction angle. The sample stage is located at the goniometer central axis, which requires that the sample surface exactly coincides with the goniometer central axis. Different kinds of samples such as powder, film and block all need to ensure that the samples are flat and the surfaces are tangential to the focusing circle of the goniometer during the test. The powder sample can realize the surface leveling of the sample and the tangency of the sample and the surrounding plane of the sample frame by utilizing the aluminum hollow sample frame through a positive pressure method, a back pressure method and the like. However, the film sample has large elasticity and is easy to curl, the uneven curling surface can influence signals in the actual test process, meanwhile, the thickness of the film sample is different, and data errors can be caused by the deviation of the film surface and the focus circle, so that the film bracket which can be used for constructing the stretchable film sample and can adjust the height of the film sample has important significance in laboratory construction and test. CN 216646317U discloses a diaxon film sample platform for X-ray diffractometer, the sample platform includes adapter, electric lift slip table, electric swing slip table and cushion, electric lift slip table's top can be dismantled and be connected with the cushion, the film sample of different thickness is through the height of changing the cushion adjustment film sample of different thickness, but above-mentioned sample platform changes the cushion step loaded down with trivial details, and be not applicable to the big test of film sample of different thickness and unable to flatten the film surface of flexible.
In addition, the temperature-changing X-ray diffraction is required to be provided with a special temperature-changing sample stage for testing, and the commercially available temperature-changing sample stage is high in cost and is suitable for powder samples. When the variable-temperature sample stage tests a film sample, the film sample can be deformed in a curling process and the like, and the deviation of a film plane and a focusing circle can influence the analysis and test result, so that peak position deviation is caused. Therefore, the film sample support is endowed with a temperature changing function, and the accuracy of the test is greatly improved.
In summary, the research and development of the tensile XRD sample support with the temperature changing function for the film sample has practical significance.
Disclosure of Invention
The utility model aims to provide a stretchable variable-temperature XRD sample support for a film sample, which is used for realizing the coincidence of the surface of the film sample and the central axis of a goniometer by stretching and adjusting the height of the film samples with different thicknesses, so that the influence of sample unevenness on analysis and test results is avoided; and the in-situ temperature change test of the film sample is realized through the load temperature change function.
In order to achieve the above purpose, the technical scheme of the utility model is as follows:
the structure of the sample support of the stretchable temperature-changing X-ray diffractometer for the film sample comprises a sample fixing frame 1 and a moving platform 2, and is characterized by further comprising a first clamp 3 with a stress sensor, a second clamp 4, a first chute 5, a second chute 6, a jackscrew 7, a lead screw 8, a screw 9, a water inlet conduit 10, a water outlet conduit 11 and a scale mark 12; the sample fixing frame 1 is connected with an X-ray diffractometer; the jackscrew 7 penetrates through the sample fixing frame 1 to be connected with the movable platform 2, and drives the movable platform 2 to slide up and down through the first chute 5; the lead screw 8 respectively penetrates through the sample fixing frame 1 and the first clamp 3 with the stress sensor, the first clamp 3 with the stress sensor is driven by the second chute 6 to move up and down, and the displacement value can be displayed through the scale mark 12; the second clamp 4 is fixed with the first clamp 3 with the stress sensor through a screw 9; the water inlet conduit 10 and the water outlet conduit 11 are connected with the hollow cavity of the mobile platform 2.
Preferably, the travel of the moving platform 2 is 0mm-20mm, and the moving precision is 0.01mm.
Preferably, the moving stroke of the first clamp 3 with the stress sensor is 0mm-20mm, the moving precision is 0.5mm, the measuring range of the scale mark 12 is 0mm-20mm, the precision is 0.5mm, the measuring range of the stress sensor is 0.01N-20N, and the precision is 0.01N.
Preferably, the temperature adjustment range of the movable platform 2 is 0 ℃ to 100 ℃ with the accuracy of 1 ℃.
According to the utility model, the first clamp 3 and the second clamp 4 with stress sensors at two sides are used for fixing a sample, after a film sample is placed in the moving platform 2, the height of the moving platform 2 is adjusted through the jackscrew 7, so that the surface of the film sample is overlapped with the central axis of the goniometer, and the tightness of the second clamp 4 is adjusted through the screw 9, so that the fixing and leveling of the film sample are realized; the screw rod 8 can adjust the height of the first clamp 3 with a stress sensor, the film sample is stretched and in-situ test is realized, the stress sensor displays a real-time stress value, and the strain can be obtained by the graduation marks 12; the water inlet conduit 10 and the water outlet conduit 11 are connected with the hollow cavity of the mobile platform 2, and the temperature change test of the film sample is realized by adjusting the water temperature or the oil temperature; the fixing frame 1 is connected with an X-ray diffractometer, so that the film sample, the light source and the detector are positioned in the same plane.
The beneficial effects are that:
compared with the prior art, the utility model has the beneficial effects that: when a film sample is placed in the movable platform 2, the height of the movable platform 2 is adjusted through the jackscrew 7, so that the coincidence of the surfaces of the film samples with different thicknesses and the central axis of the goniometer can be realized, different sample frames do not need to be processed according to the film samples with different thicknesses, the measurement efficiency is improved, and the waste caused by repeatedly processing the sample platforms is avoided; the first clamp 3 and the second clamp 4 with the stress sensor fix the film sample, can play a role in leveling the film sample, and avoid the influence of the uneven shielding light path of the sample on the test result; the film sample can be stretched by adjusting the height of the first clamp 3 with the stress sensor through the lead screw 8, so that in-situ test of the film sample in a stretched state is realized, the stress sensor displays a real-time stress value, and the strain is obtained by the graduation marks 12; circulating water with different temperatures can circulate in the hollow cavity of the mobile platform 2 through the water inlet conduit 10 and the water outlet conduit 11, and the temperature change test of the film sample can be realized by changing the temperature of the mobile platform 2.
Drawings
Fig. 1 is an isometric view of the present utility model.
Fig. 2 is a top view of the present utility model.
Fig. 3 is a front view of the present utility model.
Fig. 4 is a side view of the present utility model.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
The utility model aims to provide a stretchable variable-temperature XRD sample support for a film sample, which is used for realizing the coincidence of the surface of the film sample and the central axis of a goniometer by stretching and adjusting the height of the film samples with different thicknesses, so that the influence of sample unevenness on analysis and test results is avoided; and the in-situ temperature change test of the film sample is realized through the load temperature change function.
In order that the above-recited objects, features and advantages of the present utility model will become more readily apparent, a more particular description of the utility model will be rendered by reference to the appended drawings and appended detailed description.
Example 1 specific construction of the utility model
Fig. 1 is an isometric view of a sample holder for a tensile variable temperature X-ray diffractometer for a thin film sample according to an embodiment of the present utility model. Fig. 2 to 4 are a top view, a front view and a side view thereof, respectively. As shown in fig. 1 to 4: the sample support of the tensile variable-temperature X-ray diffractometer for a film sample mainly comprises a sample fixing frame 1, a moving platform 2, a first clamp 3 with a stress sensor, a second clamp 4, a first chute 5, a second chute 6, a jackscrew 7, a lead screw 8, a screw 9, a water inlet conduit 10, a water outlet conduit 11 and scale marks 12; the sample fixing frame 1 is connected with an X-ray diffractometer; the jackscrew 7 penetrates through the sample fixing frame 1 to be connected with the movable platform 2, and drives the movable platform 2 to slide up and down through the first chute 5; the lead screw 8 respectively penetrates through the sample fixing frame 1 and the first clamp 3 with the stress sensor, the first clamp 3 with the stress sensor is driven by the second chute 6 to move up and down, and the displacement value can be calculated through the scale mark 12; the second clamp 4 is fixed with the first clamp 3 with a stress sensor through a screw 9; the water inlet conduit 10 and the water outlet conduit 11 are connected with the hollow cavity of the mobile platform 2.
Further, the fixing frame 1 is connected with an X-ray diffractometer, so that the film sample, the light source and the detector are located in the same plane.
Further, the travel of the moving platform 2 is 0mm-20mm, and the moving precision is 0.01mm.
Further, the moving stroke of the first clamp 3 with the stress sensor is 0mm-20mm, the moving precision is 0.5mm, the measuring range of the scale mark 12 is 0mm-20mm, the moving precision is 0.5mm, the measuring range of the stress sensor is 0.01N-20N, and the precision is 0.01N.
Further, the temperature adjustment range of the mobile platform 2 is 0 ℃ to 100 ℃ and the precision is 1 ℃.
Example 2 specific leveling use procedure of the utility model
Firstly, placing a film sample with a certain thickness above a mobile platform 2, clamping the film on one side exceeding the mobile platform 2 by a first clamp 3 and a second clamp 4 with stress sensors, fixing the film by an adjusting screw 9, clamping the film on the other side exceeding the mobile platform 2 by the first clamp 3 and the second clamp 4 with the stress sensors, adjusting the tightness of the second clamp 4 by the screw 9, fixing the film sample, then rotating a screw rod 8, and enabling the first clamp 3 and the second clamp 4 with the stress sensors to move up and down along a second chute 6 along with the screw rod 8, so as to level the film sample; the jackscrew 7 passes through the sample fixing frame 1 and is connected with the movable platform 2, and the first chute 5 of the jackscrew 7 can be adjusted to drive the movable platform 2 to realize up-and-down sliding, so that the upper surface of the film sample coincides with the central axis of the goniometer.
Film stretching function: firstly, a film sample is fixed by a first clamp 3 and a second clamp 4 which are provided with stress sensors at two sides of a bracket, a lead screw 8 respectively penetrates through a sample fixing frame 1 and the first clamp 3 with the stress sensors, when the lead screw is rotated, the first clamp 3 with the stress sensors moves up and down along a second chute 6 along with the lead screw 8, and the first clamp 3 with the stress sensors drives the second clamp 4 and the film sample to move at the same time, so that the stretching purpose is realized. The stress sensor displays a real-time stress value in a tensile state, and the strain is read through the scale marks 12 on the fixing frame 1.
Film variable temperature test function: firstly, stretching and fixing a film sample and adjusting the height to enable the surface of the film sample to coincide with the central axis of the goniometer, then introducing circulating water or circulating oil into the hollow cavity of the mobile platform 2 through the water inlet conduit 10 and the water outlet conduit 11, and adjusting the temperature of the mobile platform 2 through adjusting the water temperature or the oil temperature so as to change the temperature of the film sample, thereby realizing the in-situ temperature change test of the film sample.
Claims (4)
1. The structure of the sample support of the stretchable temperature-changing X-ray diffractometer for the film sample comprises a sample fixing frame (1) and a moving platform (2), and is characterized by further comprising a first clamp (3) with a stress sensor, a second clamp (4), a first chute (5), a second chute (6), a jackscrew (7), a screw rod (8), a screw (9), a water inlet guide pipe (10), a water outlet guide pipe (11) and scale marks (12); the sample fixing frame (1) is connected with an X-ray diffractometer; the jackscrew (7) penetrates through the sample fixing frame (1) to be connected with the mobile platform (2), and the mobile platform (2) is driven to slide up and down through the first sliding groove (5); the screw rod (8) respectively penetrates through the sample fixing frame (1) and the first clamp (3) with the stress sensor, the first clamp (3) with the stress sensor is driven by the second chute (6) to move up and down, and the displacement value can be displayed through the scale mark (12); the second clamp (4) is fixed with the first clamp (3) with the stress sensor through a screw (9); the water inlet conduit (10) and the water outlet conduit (11) are connected with the hollow cavity of the mobile platform (2).
2. The stretchable temperature-changing X-ray diffractometer sample holder for thin film samples according to claim 1, wherein the travel of the moving platform (2) is 0mm-20mm and the moving precision is 0.01mm.
3. The sample support for the tensile temperature-variable X-ray diffractometer for thin film samples according to claim 1, wherein the moving stroke of the first clamp (3) with the stress sensor is 0mm-20mm, the moving precision is 0.5mm, the measuring range of the scale mark (12) is 0mm-20mm, the precision is 0.5mm, the measuring range of the stress sensor is 0.01N-20N, and the precision is 0.01N.
4. A stretchable temperature-variable X-ray diffractometer sample holder for thin film samples according to claim 1 characterized in that the temperature adjustment range of the moving platform (2) is 0 ℃ to 100 ℃ with a precision of 1 ℃.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321298129.6U CN219871099U (en) | 2023-05-26 | 2023-05-26 | Sample support of stretchable temperature-variable X-ray diffractometer for film sample |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321298129.6U CN219871099U (en) | 2023-05-26 | 2023-05-26 | Sample support of stretchable temperature-variable X-ray diffractometer for film sample |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219871099U true CN219871099U (en) | 2023-10-20 |
Family
ID=88325153
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321298129.6U Active CN219871099U (en) | 2023-05-26 | 2023-05-26 | Sample support of stretchable temperature-variable X-ray diffractometer for film sample |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219871099U (en) |
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2023
- 2023-05-26 CN CN202321298129.6U patent/CN219871099U/en active Active
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