CN219810874U - Quick analyzer for high-concentration pyrite pulp - Google Patents
Quick analyzer for high-concentration pyrite pulp Download PDFInfo
- Publication number
- CN219810874U CN219810874U CN202320956049.9U CN202320956049U CN219810874U CN 219810874 U CN219810874 U CN 219810874U CN 202320956049 U CN202320956049 U CN 202320956049U CN 219810874 U CN219810874 U CN 219810874U
- Authority
- CN
- China
- Prior art keywords
- pyrite
- optical filter
- pulp
- ray generator
- rays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- NIFIFKQPDTWWGU-UHFFFAOYSA-N pyrite Chemical compound [Fe+2].[S-][S-] NIFIFKQPDTWWGU-UHFFFAOYSA-N 0.000 title claims abstract description 23
- 229910052683 pyrite Inorganic materials 0.000 title claims abstract description 23
- 239000011028 pyrite Substances 0.000 title claims abstract description 23
- 230000003287 optical effect Effects 0.000 claims abstract description 22
- 238000001514 detection method Methods 0.000 claims abstract description 18
- 230000005284 excitation Effects 0.000 claims abstract description 15
- 238000005286 illumination Methods 0.000 claims abstract description 13
- 238000012545 processing Methods 0.000 claims abstract description 12
- 238000005057 refrigeration Methods 0.000 claims description 11
- 238000004891 communication Methods 0.000 claims description 7
- 230000005461 Bremsstrahlung Effects 0.000 claims description 3
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 abstract description 21
- 229910052717 sulfur Inorganic materials 0.000 abstract description 20
- 239000011593 sulfur Substances 0.000 abstract description 20
- 238000000034 method Methods 0.000 abstract description 12
- 239000002002 slurry Substances 0.000 abstract description 6
- 238000004458 analytical method Methods 0.000 description 13
- 239000012141 concentrate Substances 0.000 description 6
- 229920002799 BoPET Polymers 0.000 description 4
- 239000005041 Mylar™ Substances 0.000 description 4
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- RAHZWNYVWXNFOC-UHFFFAOYSA-N Sulphur dioxide Chemical compound O=S=O RAHZWNYVWXNFOC-UHFFFAOYSA-N 0.000 description 2
- 238000002441 X-ray diffraction Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- MBMLMWLHJBBADN-UHFFFAOYSA-N Ferrous sulfide Chemical compound [Fe]=S MBMLMWLHJBBADN-UHFFFAOYSA-N 0.000 description 1
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- UCKMPCXJQFINFW-UHFFFAOYSA-N Sulphide Chemical compound [S-2] UCKMPCXJQFINFW-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000013064 chemical raw material Substances 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 229910052500 inorganic mineral Inorganic materials 0.000 description 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 1
- 229960000907 methylthioninium chloride Drugs 0.000 description 1
- 239000011707 mineral Substances 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 239000000178 monomer Substances 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000004448 titration Methods 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
- 238000004846 x-ray emission Methods 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The utility model discloses a rapid analyzer for high-concentration pyrite pulp, which comprises the following components: the excitation light source device comprises an X-ray generator and a high-voltage generator, wherein the high-voltage generator is used for exciting the X-ray generator to emit X-rays; the optical filter control system comprises an optical filter and a motor driving device, wherein the motor driving device is used for driving the optical filter; the sample side illumination device is connected with the optical filter and generates characteristic X-rays; the signal detection device is used for detecting and receiving the characteristic X-rays; the signal processing device is used for receiving the pulse signal generated by the signal detection device and transmitting the pulse signal to the integrated embedded computer; the integrated embedded computer is connected with the singlechip controller, and the singlechip controller is connected with the excitation light source device. The utility model has the advantages that: the method can rapidly and stably measure and analyze the high-concentration sulfur content in the pyrite slurry with high precision, and is convenient to install and operate.
Description
Technical Field
The utility model relates to an analysis instrument, in particular to a rapid analyzer for high-concentration pyrite pulp.
Background
The sulfur concentrate is mainly used as chemical raw material for producing sulfuric acid. The method for accurately measuring the content of the sulfur element in the sulfur concentrate has important significance for controlling the quality of the sulfur concentrate. In the beneficiation process of sulfur concentrate, the determination of sulfur content adopts a traditional method: the method for measuring the content of available sulfur in GBT2462-1996 pyrite and sulfur concentrate comprises the following steps: the sample was tender burned in an air stream at 850 c, and the monomer sulfur and sulfur in the sulfide were converted to sulfur dioxide gas, evolved, absorbed with hydrogen peroxide solution and oxidized to sulfuric acid. And (3) taking methyl red-methylene blue as a mixed indicator, and titrating with a sodium hydroxide standard titration solution.
The main disadvantages of the method are: the ore pulp sample needs to be dried, ground and then analyzed, the process is complex, the time is long, and the analysis of one ore pulp sample needs 2 hours. The method has serious hysteresis effect on the guiding of ore dressing, can not adjust the proportion in time, controls the ore dressing process in time, and influences the grade of sulfur concentrate and the quality control of tailings.
The X-ray analysis method is a rapid analysis method on site. Particularly, in recent years, the rapid development of X-ray analysis technology greatly improves the analysis precision, the field adaptability and the like of an X-ray analyzer. In recent years, with the development of high-resolution high-count-rate electrically-cooled semiconductor detectors, the X-ray analyzer is increasingly applied to the mine mineral processing industry. However, the currently used X-ray analyzer is required to dry the sulfur ore slurry, grind the slurry to 180-200 meshes, then perform tabletting, and send the pressed tablet sample to an instrument for analysis, so that the whole process time is longer, more than 30 minutes are required, for example, the method of measuring sulfur element in the sulfur ore slurry by using the X-ray fluorescence spectrometry (chemometric analysis metric 2015.11) published by the monitoring center Zhao Yonghong of the molybdenum industry, such as Jin Dui city, has a larger hysteresis for guiding the ore dressing, and is not suitable for rapidly monitoring the high-concentration sulfur content of the sulfur iron ore slurry on site.
Disclosure of Invention
Aiming at the defects existing in the prior art, one of the purposes of the utility model is to provide a rapid analyzer for high-concentration pyrite pulp, which is used for rapidly and accurately analyzing the sulfur content in the pyrite pulp.
In order to achieve the above purpose, the utility model adopts the technical scheme that:
the rapid analyzer for the high-concentration pyrite pulp comprises an excitation light source device, a signal detection device, a signal processing device, an optical filter control system, a sample side illumination device, an integrated embedded computer and a singlechip controller; the excitation light source device comprises an X-ray generator and a high-voltage generator, wherein the high-voltage generator is used for exciting the X-ray generator to emit X-rays;
the optical filter control system comprises an optical filter and a motor driving device, wherein the motor driving device is used for driving the optical filter;
the sample side illumination device is connected with the optical filter and generates characteristic X-rays;
the signal detection device is used for detecting and receiving the characteristic X-rays;
the signal processing device is used for receiving the pulse signal generated by the signal detection device and transmitting the pulse signal to the integrated embedded computer;
the integrated embedded computer is connected with the singlechip controller, and the singlechip controller is connected with the excitation light source device.
Preferably, the signal detection device comprises an SI-PIN electrical refrigeration detector and a detector power supply, wherein the detector power supply is used for supplying power to the SI-PIN electrical refrigeration detector.
Preferably, the SI-PIN electrically cooled detector is disposed below the X-ray generator.
Preferably, the signal processing device comprises an amplifier, an analog-to-digital converter and a singlechip, wherein the amplifier is connected with one end of the analog-to-digital converter, and the other end of the analog-to-digital converter is connected with the singlechip.
Preferably, the filter is arranged in front of the X-ray generator.
Preferably, the X-ray generator employs a bremsstrahlung X-ray tube having a Be window thickness of 75 microns.
Preferably, the integrated embedded computer is connected with an integrated touch display and a micro printer.
Preferably, the integrated embedded computer is provided with a USB interface, an RS232 serial port and an Ethernet communication interface.
Preferably, the sample side illumination device adopts a measuring mode that an upper side is an X-ray generator and a lower side is a signal detection device.
The beneficial effects of the utility model are as follows:
by adopting devices such as an embedded integrated computer and the like, the integrated high-concentration pyrite pulp rapid analyzer can rapidly and stably measure and analyze the high-concentration sulfur content in the pyrite pulp with high precision, can also improve the vibration resistance and the anti-interference capability, reduce the external influence and is convenient to install and operate.
Drawings
FIG. 1 is a schematic block diagram of a high concentration pyrite slurry rapid analyzer;
FIG. 2 is a side view of a sample side-view testing device;
fig. 3 is a front view of the sample side-view testing device.
The figures are labeled as follows: 1. an excitation light source device; 101. an X-ray generator; 102. a high voltage generator; 2. a signal detection device; 201. SI-PIN electric refrigeration detector; 202. a detector power supply; 3. a signal processing device; 301. an amplifier; 302. an analog-to-digital converter; 303. a single chip microcomputer; 4. a light filter; 5. a sample side illumination device; 501. a sample bottle support; 502. a sample bottle; 503. a measurement window; 6. a micro printer; 7. an integrated embedded computer; 8. a mouse keyboard; 9. a singlechip controller; 10. a motor driving device; 11. mylar film.
Detailed Description
The present utility model will be described in further detail with reference to the drawings and the detailed description below, in order to make the objects, technical solutions and advantages of the present utility model more clear and distinct. It is to be understood that the specific embodiments described herein are merely illustrative of the utility model and are not limiting thereof. It should be further noted that, for convenience of description, only some, but not all of the matters related to the present utility model are shown in the accompanying drawings.
As shown in fig. 1 to 3, the utility model provides a rapid analyzer for high-concentration pyrite pulp, which comprises an excitation light source device 1, a signal detection device 2, a signal processing device 3, an optical filter control system, a sample side illumination device 5, an integrated embedded computer 7 and a singlechip controller 9;
an excitation light source device 1, comprising an X-ray generator 101 and a high voltage generator 102, wherein the high voltage generator 102 uses high voltage 50KV as an excitation source for exciting the X-ray generator 101 to emit X-rays;
the optical filter control system comprises an optical filter 4 and a motor driving device 10, wherein the motor driving device 10 is used for driving the optical filter 4;
the sample side illumination device 5 is connected with the optical filter 4 and generates characteristic X-rays;
signal detection means 2 for detecting and receiving characteristic X-rays;
a signal processing device 3 for receiving the pulse signal generated by the signal detecting device 2 and transmitting to the integrated embedded computer 7;
wherein, integrated embedded computer 7 is connected with singlechip controller 9, and singlechip controller 9 is connected with excitation light source device 1.
The working principle of the utility model is as follows:
in operation, the sample bottle 502 packaged with the mylar film 11 is directly placed at a test position on the support frame 501 of the sample side illumination device 5, the X-ray generator 101 emits X-rays, the X-rays pass through the optical filter 4 and excite the measurement sample, so that extra-nuclear electrons in atoms of each element in the measurement sample are excited and released, especially K layers of electrons are generated at the original position, at the moment, outer electrons fill the hole position, especially L layers of electrons, excessive energy is released in the form of characteristic X-rays, the characteristic X-rays enter the SI-PIN electric refrigeration detector 201 to generate pulse signals, the pulse signals are amplified and pulse-shaped by the amplifier 301, the pulse signals are sent to the analog-to-digital converter 302, the analog signals are converted into digital quantities, the digital quantities are sent to the singlechip 303, the singlechip 303 sends the data to the integrated embedded computer 7 in a communication mode, and the singlechip controller 9 feeds back to the excitation light source device 1 after receiving information analyzed by the singlechip controller 9, so that the high-voltage generator 102 is regulated, and the specific condition of X-rays emitted by the X-ray generator 101 is controlled.
Through the verification of the on-site actual analysis result, the utility model has the advantages of high analysis speed, convenient use, high precision, low cost, low failure rate and short measurement time, and the international advanced SI-PIN electric refrigeration detector 201 can analyze the sulfur (16S) element in the periodic table of elements, especially has higher detection precision on the effective sulfur with high concentration (the S content concentration is between 40 percent and 50 percent), can reach the deviation value within 0.5 percent (higher than the national standard by 0.6 percent), and completely achieves the expected purpose.
Optionally, the signal detection device 2 includes an SI-PIN electric refrigeration detector 201 and a detector power supply 202, where the detector power supply 202 is used to supply power to the SI-PIN electric refrigeration detector 201; the voltage and current of the high voltage generator 102 are controlled and displayed by automatic digital codes, and the X-ray stability is: 0.3%/8 hours, voltage range: 0V to 50kV continuously adjustable, current range: 0mA to 1mA are continuously adjustable; SI-PIN electrically cooled detector 201 with high resolution, high count rate, available from AMPTEK corporation, usa, is selected to operate at low temperatures (-40 ℃) which are required to be provided by semiconductor refrigeration without liquid nitrogen cooling.
Optionally, the SI-PIN electrically cooled detector 201 is disposed below the X-ray generator 101, i.e. at a position of an optimal reflection angle of the X-ray generator excitation radiation, so as to ensure that the SI-PIN electrically cooled detector can detect and acquire the X-rays more quickly and accurately.
Optionally, the signal processing device 3 includes an amplifier 301, an analog-to-digital converter 302 and a single chip microcomputer 303, where the amplifier 301 is connected to one end of the analog-to-digital converter 302, and the other end of the analog-to-digital converter 302 is connected to the single chip microcomputer 303.
Optionally, the optical filter 4 is arranged in front of the X-ray generator 101 and is used for reducing the background of the element to be detected, improving the sensitivity of the analysis element and enabling the analysis lower limit to reach the PPM level; preferably, 4 filters 4 are provided to accommodate different analysis requirements, and primary X-rays generated from the X-ray generator 101 are passed through the filters 4 to directly excite the sample on the sample-side illumination device 5, so that optimal analysis results can be obtained by selecting excitation conditions.
Alternatively, the X-ray generator 101 adopts a bremsstrahlung X-ray tube with a Be window thickness of 75 micrometers, has high sensitivity and resolution for 55Fe 5.9keV X-rays with a counting rate of 1000CPS of 145eV, can obtain satisfactory results in 200 seconds for a general sample, and can select an Ag (silver target) target according to practical application requirements.
Optionally, the integrated embedded computer 7 is connected with an integrated touch display which can be checked at any time and a micro printer 6 with other functions; the computer is embedded in the front panel of the instrument, so the mouse and keyboard 8 adopts an external wireless Bluetooth mode to carry out auxiliary communication and control.
Optionally, the integrated embedded computer 7 is provided with a USB interface, an RS232 serial port and an ethernet communication interface, which are used as communication interfaces, so that the singlechip 303 can transmit the analysis result of acquiring multiple channels of data to the integrated embedded computer 7 for display and processing in a USB interface or ethernet communication mode.
Optionally, the sample side illumination device 5 adopts a measuring mode that the upper side is an X-ray generator 101 and the lower side is a signal detection device 2; the measuring window 503 of the sample side illumination device 5 is sealed by a Mylar film 11, so that the window of the sample bottle 502 is prevented from being broken, and ore pulp liquid is prevented from leaking into the measuring chamber; the sample bottle 502 adopts a bottle cap opening and Mylar film 11 packaging mode, is particularly suitable for rapid detection of ore pulp samples, and can measure the ore pulp of 40% -50% high-concentration pyrite with the accuracy of less than 0.5%.
The embodiments of the present utility model have been described in detail with reference to the drawings, but the present utility model is not limited thereto, and various changes can be made within the knowledge of those skilled in the art without departing from the spirit of the present utility model.
Claims (9)
1. The fast analyzer for high concentration pyrite pulp includes exciting light source, signal detector, signal processor, optical filter control system, sample side lighting device, integrated embedded computer and single chip computer controller,
the excitation light source device comprises an X-ray generator and a high-voltage generator, wherein the high-voltage generator is used for exciting the X-ray generator to emit X-rays;
the optical filter control system comprises an optical filter and a motor driving device, wherein the motor driving device is used for driving the optical filter;
the sample side illumination device is connected with the optical filter and generates characteristic X-rays;
the signal detection device is used for detecting and receiving the characteristic X-rays;
the signal processing device is used for receiving the pulse signal generated by the signal detection device and transmitting the pulse signal to the integrated embedded computer;
the integrated embedded computer is connected with the singlechip controller, and the singlechip controller is connected with the excitation light source device.
2. The rapid analyzer for high concentration pyrite pulp according to claim 1, wherein: the signal detection device comprises an SI-PIN electric refrigeration detector and a detector power supply, wherein the detector power supply is used for supplying power to the SI-PIN electric refrigeration detector.
3. The rapid analyzer for high concentration pyrite pulp according to claim 2, wherein: the SI-PIN electrical refrigeration detector is arranged below the X-ray generator.
4. The rapid analyzer for high concentration pyrite pulp according to claim 1, wherein: the signal processing device comprises an amplifier, an analog-to-digital converter and a singlechip, wherein the amplifier is connected with one end of the analog-to-digital converter, and the other end of the analog-to-digital converter is connected with the singlechip.
5. According to claim1The rapid analyzer for the high-concentration pyrite pulp is characterized in that: the optical filter is arranged in front of the X-ray generator.
6. The rapid analyzer for high concentration pyrite pulp according to claim 1, wherein: the X-ray generator adopts a bremsstrahlung X-ray tube with a Be window thickness of 75 microns.
7. The rapid analyzer for high concentration pyrite pulp according to claim 1, wherein: the integrated embedded computer is connected with an integrated touch display and a micro printer.
8. The rapid analyzer for high concentration pyrite pulp according to claim 1, wherein: the integrated embedded computer is provided with a USB interface, an RS232 serial port and an Ethernet communication interface.
9. The rapid analyzer for high concentration pyrite pulp according to claim 1, wherein: the sample side illumination device adopts a measuring mode that an upper side is an X-ray generator and a lower side is a signal detection device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202320956049.9U CN219810874U (en) | 2023-04-25 | 2023-04-25 | Quick analyzer for high-concentration pyrite pulp |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202320956049.9U CN219810874U (en) | 2023-04-25 | 2023-04-25 | Quick analyzer for high-concentration pyrite pulp |
Publications (1)
Publication Number | Publication Date |
---|---|
CN219810874U true CN219810874U (en) | 2023-10-10 |
Family
ID=88208691
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202320956049.9U Active CN219810874U (en) | 2023-04-25 | 2023-04-25 | Quick analyzer for high-concentration pyrite pulp |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN219810874U (en) |
-
2023
- 2023-04-25 CN CN202320956049.9U patent/CN219810874U/en active Active
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN100595575C (en) | Diffuse transmission type composition of ores real time on-line testing apparatus | |
CN101788508A (en) | Ore pulp grade on-line measuring device | |
CN103323319A (en) | Enriching and detecting equipment for particles | |
US3791743A (en) | Portable flame photometer and sampling probe | |
CN201373858Y (en) | Energy chromatic dispersion X fluorescence analyser | |
CN203929681U (en) | A kind of superhigh precision X-fluorescence sulfur detector | |
CN101706422A (en) | Infrared carbon and sulfur determination analyzer | |
CN203824940U (en) | Handheld type X-ray fluorescence analyzer | |
CN201373857Y (en) | X fluorescence analyser | |
CN219810874U (en) | Quick analyzer for high-concentration pyrite pulp | |
CN201034951Y (en) | X fluorescent measuring sulphur instrument used for petroleum crude and oil products | |
CN105371965A (en) | Temperature measurement device of atomizer graphite furnace | |
CN100593116C (en) | X fluorescent multi-element analyser | |
CN103837559B (en) | The quick sulphur meter of many target scans formula | |
CN203732474U (en) | X-ray fluorescence tester for copper alloys | |
CN203405428U (en) | Energy dispersion x fluorescence analyzer | |
CN207366483U (en) | A kind of marine lubricant Wear metal xrf analysis instrument | |
CN102798695A (en) | Method for measuring content of trace chlorine in high pure, ultra pure ammonia | |
CN113720811B (en) | Micro-plasma excitation source and excitation method based on ultrasonic atomization sampling | |
CN109596540A (en) | Gas phase molecular absorption spectrometer with redundancy function of temperature control | |
CN202837182U (en) | Atomic fluorescence spectrophotometer optical system | |
CN214408699U (en) | Micro nitrogen analyzer based on plasma emission spectrum | |
CN203758915U (en) | Multi-parameter instrument for atomic fluorescence spectrum detection | |
KR101158859B1 (en) | Portable X-ray fluorescence analytical apparatus including alignment system for optical components | |
CN111537496B (en) | Titration analyzer based on point discharge atomic emission spectrometry detection |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
GR01 | Patent grant | ||
GR01 | Patent grant |