CN203732474U - X-ray fluorescence tester for copper alloys - Google Patents
X-ray fluorescence tester for copper alloys Download PDFInfo
- Publication number
- CN203732474U CN203732474U CN201420072410.2U CN201420072410U CN203732474U CN 203732474 U CN203732474 U CN 203732474U CN 201420072410 U CN201420072410 U CN 201420072410U CN 203732474 U CN203732474 U CN 203732474U
- Authority
- CN
- China
- Prior art keywords
- sample
- tester
- detector
- aldary
- fluorescence
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004876 x-ray fluorescence Methods 0.000 title abstract 4
- 229910000881 Cu alloy Inorganic materials 0.000 title abstract 3
- 238000012360 testing method Methods 0.000 claims abstract description 37
- 230000005284 excitation Effects 0.000 claims abstract description 25
- 238000005057 refrigeration Methods 0.000 claims abstract description 17
- 238000012545 processing Methods 0.000 claims description 16
- 230000005611 electricity Effects 0.000 claims description 15
- 238000003860 storage Methods 0.000 claims description 9
- 239000012528 membrane Substances 0.000 claims description 3
- 230000005540 biological transmission Effects 0.000 claims description 2
- 238000001514 detection method Methods 0.000 abstract description 9
- 230000035945 sensitivity Effects 0.000 abstract description 8
- 230000003287 optical effect Effects 0.000 abstract description 5
- 238000004458 analytical method Methods 0.000 description 8
- 239000011734 sodium Substances 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 229910001369 Brass Inorganic materials 0.000 description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- 239000010951 brass Substances 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 229910052708 sodium Inorganic materials 0.000 description 3
- 239000011135 tin Substances 0.000 description 3
- 229910000906 Bronze Inorganic materials 0.000 description 2
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 241001124569 Lycaenidae Species 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 229910052770 Uranium Inorganic materials 0.000 description 2
- 230000003321 amplification Effects 0.000 description 2
- 229910052790 beryllium Inorganic materials 0.000 description 2
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 2
- 239000010974 bronze Substances 0.000 description 2
- 235000014987 copper Nutrition 0.000 description 2
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 238000011065 in-situ storage Methods 0.000 description 2
- 229910052749 magnesium Inorganic materials 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 239000010948 rhodium Substances 0.000 description 2
- 238000007493 shaping process Methods 0.000 description 2
- 229910052717 sulfur Inorganic materials 0.000 description 2
- JFALSRSLKYAFGM-UHFFFAOYSA-N uranium(0) Chemical compound [U] JFALSRSLKYAFGM-UHFFFAOYSA-N 0.000 description 2
- 239000011800 void material Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910001051 Magnalium Inorganic materials 0.000 description 1
- 241000353097 Molva molva Species 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- BHIRTUJCQXDFRD-UHFFFAOYSA-N [Si].[P].[S] Chemical compound [Si].[P].[S] BHIRTUJCQXDFRD-UHFFFAOYSA-N 0.000 description 1
- 239000004411 aluminium Substances 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 239000011133 lead Substances 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 238000004445 quantitative analysis Methods 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
- 230000004304 visual acuity Effects 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The utility model discloses an X-ray fluorescence tester for copper alloys. The X-ray fluorescence tester comprises an excitation light source device, a signal detection device, a signal processor, a computer and a sample test platform, wherein a detector connected with the signal processor is arranged in the signal detection device; the signal processor is connected with the computer; the excitation light source device is in control connection with the computer, and an X-ray generator is arranged in the excitation light source device; the detector is located in the position of the optimum reflection angle of an excitation ray of the X-ray generator; an optical filter selecting device and a collimator are arranged in front of the X-ray generator; and the detector adopts a SUPER-SDD electrical refrigeration detector. According to the X-ray fluorescence tester, the detector adopts the SUPER-SDD electrical refrigeration detector, the counting efficiency is improved by 500% and improved by 5 times than a SI-PIN detector, and a satisfied result of an ordinary product can be acquired in 100 seconds; and the sensitivity and the detection limit of analyzed elements are improved, and the tester can test various copper alloy samples.
Description
Technical field
The utility model relates to a kind of analytical instrument, particularly a kind of X-fluorescence aldary tester.
Background technology
At present, the X-fluorescence aldary tester using, it comprises excitation light source device, signal detecting device, signal processing apparatus, computing machine and sample test platform; Wherein, the computing machine that excitation light source device is connected respectively with signal processing apparatus, this excitation source is arranged on the position near test sample device, and signal detecting device connects signal processing apparatus, and sample test platform is for depositing sample.This X-fluorescence aldary tester is owing to adopting SI-PIN detector, although this detector is enhanced than traditional Si (Li) detector performance, and no longer adopt cooled with liquid nitrogen mode, convenient in use, but the shortcoming of this detector is lower to the detector of light element, lower to the remolding sensitivity of magnalium silicon phosphorus sulphur; And can not vacuumize, therefore can not measure light element, as elements such as Mg, Al, Si, P, S, therefore general the measurement for heavy elements such as copper, zinc, iron, lead, nickel, tin, and measure the aldary sample that ledrite, basis brass etc. do not require light element, can not be used for the measurement of the sample such as xantal, silizin.In addition, before x ray generator, be not provided with filter selection device, thereby the background of sample to be tested is higher, has reduced sensitivity and the detection limit of analytical element, affected the degree of accuracy of sample measurement result.Moreover the size of current sample test platform is single, can not tests as required the size of sample and change the test zone scope of test platform.
Utility model content
The purpose of this utility model is for shortcomings and deficiencies of the prior art, provide a kind of easy to use, precision is high, the X-fluorescence aldary tester of highly versatile, improves sensitivity and the detection limit of analytical element, to address the above problem.
The technical matters that the utility model solves can realize by the following technical solutions:
A kind of X-fluorescence aldary tester, comprise excitation light source device, signal detecting device, signal processing apparatus, computing machine and sample test platform, in described signal detecting device, be provided with the detector being connected with described signal processing apparatus, described signal processing apparatus is connected with described computing machine, described excitation light source device is connected with described computer control, in described excitation light source device, be provided with x ray generator, described detector is positioned on the position of best reflection angle of described x ray generator excitation ray, before described x ray generator, be provided with filter selection device and collimating apparatus, it is characterized in that, described detector is SUPER-SDD electricity refrigeration detector.
In a preferred embodiment of the present utility model, described sample test platform is variable-sized sample test platform, it comprises sample splint, removable sample carrier and sample pressure ring, on described sample splint, be provided with a storage tank with holes, described sample carrier is arranged in described storage tank, on described sample carrier, be provided with an instrument connection passing for x ray generator excitation ray, described instrument connection is corresponding with the hole of described storage tank, and described sample pressure ring is pressed on a thick membrane advanced in years of 6 μ m on described sample carrier.
In a preferred embodiment of the present utility model, described variable-sized sample test platform periphery is sample chamber, and described sample chamber is connected with a vacuum system.
In a preferred embodiment of the present utility model, described signal processing apparatus comprises the amplifier being connected with described detector and the analog to digital converter being connected with described amplifier.
In a preferred embodiment of the present utility model, on described SUPER-SDD electricity refrigeration detector, be provided with USB interface, RS232 serial ports, ethernet interface.
In a preferred embodiment of the present utility model, be also provided with and be connected with analog to digital converter and obtain the single-chip microcomputer of multiple tracks data at described signal processing apparatus.
In a preferred embodiment of the present utility model, described computing machine is provided with USB interface, RS232 serial ports, ethernet interface, and the multiple tracks data transmission that described single-chip microcomputer obtains by USB interface handle is to computing machine.
In a preferred embodiment of the present utility model, be also provided with a camera in the bottom of described variable-sized sample test platform.
In a preferred embodiment of the present utility model, on described computing machine, be also connected with output device.
In a preferred embodiment of the present utility model, described output device comprises display and printer.
Principle of work of the present utility model is as follows:
X ray generator sends excitation of X-rays sample, make the extranulear electron (particularly K electron) in the atom of each element in sample be stimulated and emit, and in situ produce a hole, now outer-shell electron (particularly L layer electronics) will be filled this VOID POSITIONS, unnecessary energy is just emitted with the form of characteristic X-ray, these characteristic X-rays enter detector and produce pulse signal, send into pulse digit spectroscope amplifier through prime amplifier, through amplification and the pulse shaping of pulse digit spectroscope amplifier, send into analog to digital converter, analog to digital converter converts simulating signal to digital quantity, send into computer interface, software is composed the data acquisition and controlling of data by control interface.
Owing to having adopted technical scheme as above, detector of the present utility model adopts SUPER-SDD electricity refrigeration detector, its lowest resolution reaches 125eV, counting efficiency improves 500%, this SUPER-SDD electricity refrigeration detector has improved 5 times to the detection efficiency of the element such as aluminium, silicon than SI-PIN detector, make general sample in 100 seconds, can obtain satisfied result, improve sensitivity and the detection limit of analytical element.The utlity model has that analysis speed is fast, easy to use, precision is high, cost is low, failure rate is low, the short advantage of Measuring Time, in can analytical element periodic table by sodium (Na) to the whole elements uranium (U), reach the object of expection completely, and can detect various types of aldarys, as samples such as ledrite, xantal, tin bronze, basis brass, red coppers, sample form can be bulk, wire, clastic, Powdered, liquid etc., without carrying out special sample preparation, can directly measure.In addition, sample test platform is variable-sized sample test platform, and the size of the sample that can test as required and change the test zone scope of test platform increases versatility of the present utility model.
Brief description of the drawings
In order to be illustrated more clearly in the utility model embodiment or technical scheme of the prior art, to the accompanying drawing of required use in embodiment or description of the Prior Art be briefly described below, apparently, accompanying drawing in the following describes is only embodiment more of the present utility model, for those of ordinary skill in the art, do not paying under the prerequisite of creative work, can also obtain according to these accompanying drawings other accompanying drawing.
Fig. 1 is the theory diagram of a kind of X-fluorescence aldary of the utility model tester.
Fig. 2 is the detection schematic diagram that excites of the present utility model.
Fig. 3 is the structural representation after variable-sized sample test platform of the present utility model is installed.
Fig. 4 is the mounting structure schematic diagram of variable-sized sample test platform of the present utility model.
Embodiment
For technological means, creation characteristic that the utility model is realized, reach object and effect is easy to understand, below in conjunction with concrete diagram, further set forth the utility model.
With reference to figure 1 and Fig. 2, X-fluorescence aldary tester of the present utility model, comprises excitation light source device, signal detecting device, signal processing apparatus, computing machine 400 and variable-sized sample test platform 500.This signal detecting device is provided with SUPER-SDD electricity refrigeration detector 100, and SUPER-SDD electricity refrigeration detector 100 is connected with detector power supply 110.In signal processing apparatus, be provided with the amplifier 200a being connected with SUPER-SDD electricity refrigeration detector 100 and the analog to digital converter 200b being connected with amplifier 200a.Wherein, this SUPER-SDD electricity refrigeration detector 100 is SUPER-SDD electricity refrigeration detectors 100 with high resolving power, high count rate of AMPTEK company of U.S. recent development development, need (40 DEG C) work at low temperatures, low temperature need to be provided by semiconductor refrigerating mode.This SUPER-SDD electricity refrigeration detector 100 is without cooled with liquid nitrogen, Be(beryllium window) thickness is 7.5 microns, right
55the resolution of the X ray of Fe5.9keV in the time that counting rate is 1000CPS is 125eV.And light element Na, Mg, Al, Si, S etc. are had to high sensitivity and resolution, make general sample in 200 seconds, can obtain satisfied result.
Excitation light source device comprises the x ray generator 330 and the digital controller 320 that in high-voltage power supply 310, high-voltage power supply, connect, wherein, using the positive high voltage x ray generator 330 of high pressure 50KV as excitaton source, this x ray generator 330 adopts Be(beryllium) window thickness is that the bremstrahlen Xing ﹑ Di Gong of 75 microns is Shuaied the X-ray tube of the right Leng Que of ﹑ Zi ﹑ high life, and need to select target according to practical application, as selective target is: Rh(rhodium target), Ag(silver target), W(tungsten target) etc.In the utility model, before x ray generator 330, increase filter selection device 340, for reducing the background of element to be measured, improved sensitivity and the detection limit of analytical element.This filter selection device 340 adopts suitable optical filter, can improve the sensitivity for analysis of element-specific, makes to analyze lower limit and reaches PPM level.In the present embodiment, be equipped with 5 optical filters to adapt to different analysis requirements.Collimating apparatus 350 is installed before x ray generator 330, can be for the sample of different industries, select suitable collimating apparatus 350 and shooting conditions, make the adaptability of instrument broader, the initial X-ray 331 producing from x ray generator 330 directly excites the sample on variable-sized sample test platform 500 by optical filter and collimating apparatus 350, more can obtain best analysis result by selective excitation condition.
Digital controller 320 connects computing machine 400, is also connected with output device on computing machine 400, and this output device comprises display 410 and printer 420.In order to reduce the complicacy of data-interface link, reduce failure rate, be provided with the single-chip microcomputer that is connected with analog to digital converter 200b and can obtains multiple tracks data at signal processing apparatus, computing machine 400 is provided with USB interface, RS232 serial ports, ethernet interface, and this single-chip microcomputer is transferred to computing machine 400 by USB interface the analysis result that obtains multiple tracks data and shows and add up.
X-ray tube adopts positive high voltage to excite, and excites with test condition and adopts the digital control of computer software and show.In excitation light source device, the voltage of high-voltage power supply 310 and electric current adopt software digital control and demonstration automatically, X ray degree of stability: 0.3%/8 hour, voltage range: 0V to 50kV was adjustable continuously, and range of current: 0mA to 1mA is adjustable continuously.
Excitation light source device adopts unique inversion right angle optical texture design (as shown in Figure 2), on the position of the best reflection angle of SUPER-SDD electricity refrigeration detector 100 in x ray generator 330 excitation rays, be convenient to SUPER-SDD electricity refrigeration detector 100 and accept the ray reflecting.
Shown in Fig. 3 and Fig. 4, variable-sized sample test platform 500 comprises sample splint 510, removable sample carrier 520 and sample pressure ring 530, and variable-sized sample test platform 500 is driven by motor 700.On sample splint 510, be provided with one with holes 511 storage tank 512, sample carrier 520 is arranged in storage tank 512, on sample carrier 520, be provided with an instrument connection 521 passing for x ray generator 330 excitation rays, instrument connection 521 is corresponding with the hole 511 of storage tank 512, sample pressure ring 530 is pressed on a thick membrane advanced in years of 6 μ m on sample carrier 520, to prevent that sample powder or chip from falling into apparatus measures chamber interior.Variable-sized sample test platform 500 can hold the samples such as the metal sample of various sizes and powder, coating, can adapt to the test of various types of special-shaped samples, wherein instrument connection 521 diameters on sample carrier 520 are for changing, generally there are diameter of phi 10mm, Φ 15mm, Φ 20mm, Φ 25mm, Φ 30mm multiple choices, can need to carry out interim collocation according to user and use, highly versatile.
For the ease of observing shape and the position of sample, be also provided with a camera 360 in the bottom of variable-sized sample test platform 500.Variable-sized sample test platform 500 peripheries are sample chamber, and sample chamber is connected with a vacuum system 600, can automatically be controlled by software, without manual operation.
When the utility model work, place and measure sample on the test position of variable-sized sample test platform 500, x ray generator 330 sends initial X-ray 331 and after mating plate and collimating apparatus 350, excites measurement sample after filtration, the extranulear electron (particularly K electron) that makes to measure in the atom of each element in sample is stimulated and emits, and in situ produce a hole, now outer-shell electron (particularly L layer electronics) will be filled this VOID POSITIONS, unnecessary energy is just emitted with the form of characteristic X-ray 332, these characteristic X-rays 332 enter SUPER-SDD electricity refrigeration detector 100 and produce pulse signal, send into pulse spectroscope amplifier through prime amplifier, through amplification and the pulse shaping of pulse spectroscope amplifier, send into analog to digital converter 200b, analog to digital converter 200b converts simulating signal to digital quantity, send into computing machine 400 interfaces, software is composed the data acquisition and controlling of data by control interface.Xrf analysis software is by quantitative analysis obtaining result qualitatively to various characteristic X-rays 332, also know which kind of element sample contains, again by the intensity of characteristic X-ray 332 being calculated and being analyzed, finally complete analysis and the printing of each constituent content in sample, thereby realize the quality control of producing.
By on-the-spot actual analysis result verification, the utlity model has that analysis speed is fast, easy to use, precision is high, cost is low, failure rate is low, the short advantage of Measuring Time, in can analytical element periodic table by sodium (Na) to the whole elements uranium (U), reached the object of expection completely.When analytic sample, it is general as long as 100-200 can provide the content of each element second, and can detect various types of aldarys, as samples such as ledrite, xantal, tin bronze, basis brass, red coppers, sample form can be bulk, wire, clastic, Powdered, liquid etc., without carrying out special sample preparation, can directly measure.
More than show and described ultimate principle of the present utility model and principal character and advantage of the present utility model.The technician of the industry should understand; the utility model is not restricted to the described embodiments; that in above-described embodiment and instructions, describes just illustrates principle of the present utility model; do not departing under the prerequisite of the utility model spirit and scope; the utility model also has various changes and modifications, and these changes and improvements all fall within the scope of claimed the utility model.The claimed scope of the utility model is defined by appending claims and equivalent thereof.
Claims (10)
1. an X-fluorescence aldary tester, comprise excitation light source device, signal detecting device, signal processing apparatus, computing machine and sample test platform, in described signal detecting device, be provided with the detector being connected with described signal processing apparatus, described signal processing apparatus is connected with described computing machine, described excitation light source device is connected with described computer control, in described excitation light source device, be provided with x ray generator, described detector is positioned on the position of best reflection angle of described x ray generator excitation ray, before described x ray generator, be provided with filter selection device and collimating apparatus, it is characterized in that, described detector is SUPER-SDD electricity refrigeration detector.
2. a kind of X-fluorescence aldary tester as claimed in claim 1, it is characterized in that, described sample test platform is variable-sized sample test platform, it comprises sample splint, removable sample carrier and sample pressure ring, on described sample splint, be provided with a storage tank with holes, described sample carrier is arranged in described storage tank, on described sample carrier, be provided with an instrument connection passing for x ray generator excitation ray, described instrument connection is corresponding with the hole of described storage tank, described sample pressure ring is pressed on a thick membrane advanced in years of 6 μ m on described sample carrier.
3. a kind of X-fluorescence aldary tester as claimed in claim 2, is characterized in that, described variable-sized sample test platform periphery is sample chamber, and described sample chamber is connected with a vacuum system.
4. a kind of X-fluorescence aldary tester as claimed in claim 2, is characterized in that, described signal processing apparatus comprises the amplifier being connected with described detector and the analog to digital converter being connected with described amplifier.
5. a kind of X-fluorescence aldary tester as claimed in claim 2, is characterized in that, on described SUPER-SDD electricity refrigeration detector, is provided with USB interface, RS232 serial ports, ethernet interface.
6. a kind of X-fluorescence aldary tester as claimed in claim 2, is characterized in that, is also provided with and is connected with analog to digital converter and obtains the single-chip microcomputer of multiple tracks data at described signal processing apparatus.
7. a kind of X-fluorescence aldary tester as claimed in claim 6, is characterized in that, described computing machine is provided with USB interface, RS232 serial ports, ethernet interface, and the multiple tracks data transmission that described single-chip microcomputer obtains by USB interface handle is to computing machine.
8. a kind of X-fluorescence aldary tester as claimed in claim 2, is characterized in that, is also provided with a camera in the bottom of described variable-sized sample test platform.
9. a kind of X-fluorescence aldary tester as claimed in claim 2, is characterized in that, is also connected with output device on described computing machine.
10. a kind of X-fluorescence aldary tester as claimed in claim 9, is characterized in that, described output device comprises display and printer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420072410.2U CN203732474U (en) | 2014-02-20 | 2014-02-20 | X-ray fluorescence tester for copper alloys |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420072410.2U CN203732474U (en) | 2014-02-20 | 2014-02-20 | X-ray fluorescence tester for copper alloys |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203732474U true CN203732474U (en) | 2014-07-23 |
Family
ID=51202537
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420072410.2U Expired - Lifetime CN203732474U (en) | 2014-02-20 | 2014-02-20 | X-ray fluorescence tester for copper alloys |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203732474U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107782754A (en) * | 2017-10-29 | 2018-03-09 | 天津市博智伟业科技股份有限公司 | The device and method of antimony element content in a kind of XRF detection Silver Jewelry |
| CN109239115A (en) * | 2018-08-31 | 2019-01-18 | 和辰（深圳）科技有限公司 | XRF detector |
| CN111175334A (en) * | 2020-01-09 | 2020-05-19 | 中国原子能科学研究院 | Automatic graphite crystal pre-diffraction X-ray fluorescence instrument system |
-
2014
- 2014-02-20 CN CN201420072410.2U patent/CN203732474U/en not_active Expired - Lifetime
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107782754A (en) * | 2017-10-29 | 2018-03-09 | 天津市博智伟业科技股份有限公司 | The device and method of antimony element content in a kind of XRF detection Silver Jewelry |
| CN109239115A (en) * | 2018-08-31 | 2019-01-18 | 和辰（深圳）科技有限公司 | XRF detector |
| CN111175334A (en) * | 2020-01-09 | 2020-05-19 | 中国原子能科学研究院 | Automatic graphite crystal pre-diffraction X-ray fluorescence instrument system |
| CN111175334B (en) * | 2020-01-09 | 2021-11-02 | 中国原子能科学研究院 | Automatic graphite crystal pre-diffraction X-ray fluorescence instrument system |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN203824940U (en) | Handheld type X-ray fluorescence analyzer | |
| RU2007123032A (en) | DEVICE AND METHOD FOR DETERMINING THE PART OF THE PHASE OF A FLUID USING X-RAY RAYS | |
| CN203732474U (en) | X-ray fluorescence tester for copper alloys | |
| US2437935A (en) | Radiological measurement of the permeability of porous media | |
| CN103837558A (en) | Device and method for detecting multiple elements and content thereof in water solution based on PGNAA (Prompt Gamma-Ray Neutron Activation Analysis) technology | |
| CN203275323U (en) | X-ray fluorescence analyser | |
| CN107966727A (en) | A kind of neutron composite detecting device | |
| CN205317700U (en) | Novel archaeology division of history into periods X fluorescence analyser | |
| CN203929682U (en) | The special-purpose xrf analysis instrument of a kind of RoHS | |
| CN207611152U (en) | A kind of neutron composite detecting device | |
| CN201373857Y (en) | X fluorescence analyser | |
| EP2986974B1 (en) | Radiation source device | |
| CN203405428U (en) | Energy dispersion x fluorescence analyzer | |
| CN111650170A (en) | Measurement standard for calibration of luminescence immunoassay analyzer for bottom or lateral detection | |
| CN100593116C (en) | X fluorescent multi-element analyser | |
| CN105181726A (en) | Transmission-type X fluorescent device | |
| CN205091279U (en) | Integration X fluorescence analyser | |
| CN103424764B (en) | Measuring device for dose distribution of ray radiation field | |
| US2937276A (en) | Quantitative determination of metals | |
| CN114740520A (en) | Radioactive inert gas activity measuring device and method | |
| CN207366483U (en) | A kind of marine lubricant Wear metal xrf analysis instrument | |
| RU121077U1 (en) | PORTABLE X-RAY FLUORESCENT ENERGY DISPERSION ANALYZER | |
| CN110428917A (en) | Neutron fluence detector and corresponding experimental provision for fast reactor | |
| CN203732037U (en) | Ultrahigh-precision X fluorescence thickness gauge | |
| CN211652619U (en) | Portable coal ash content instrument using X-ray generator |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20140723 |
|
| CX01 | Expiry of patent term |