CN219715554U - Chip testing machine tilting mechanism - Google Patents
Chip testing machine tilting mechanism Download PDFInfo
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- CN219715554U CN219715554U CN202321205771.5U CN202321205771U CN219715554U CN 219715554 U CN219715554 U CN 219715554U CN 202321205771 U CN202321205771 U CN 202321205771U CN 219715554 U CN219715554 U CN 219715554U
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- 238000012360 testing method Methods 0.000 title claims abstract description 64
- 230000007246 mechanism Effects 0.000 title claims abstract description 49
- 230000007306 turnover Effects 0.000 claims abstract description 21
- 230000002457 bidirectional effect Effects 0.000 claims description 9
- 238000009434 installation Methods 0.000 claims 4
- 238000000034 method Methods 0.000 description 9
- 230000008569 process Effects 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model relates to a turnover mechanism of a chip testing machine, which comprises a testing table, wherein the top of the testing table is provided with the turnover mechanism, the outside of the testing table is provided with an auxiliary assembly, the turnover mechanism comprises a testing module body fixedly connected with the testing table, the top of the testing table is fixedly connected with a supporting frame, the right side of the supporting frame is fixedly connected with a variable speed motor, and the output end of the variable speed motor is fixedly connected with a first gear. This chip testing machine tilting mechanism, through setting up tilting mechanism, overturn the chip, convenient to use person is to the test of chip, and convenient to use person adjusts, is applicable to the upset to the big or small chip of multiple size, has improved chip testing machine tilting mechanism's practicality, has solved inconvenient user according to the size of chip, adjusts the locating rack, can not be applicable to the location and the upset of the chip of multiple size, has influenced the problem of chip testing machine's tilting mechanism's practicality.
Description
Technical Field
The utility model relates to the technical field of chip testing, in particular to a turnover mechanism of a chip testing machine.
Background
Chips are a collective term for semiconductor device products, integrated circuits, i.e., microcircuits, microchips, wafers/chips, are one way of miniaturizing circuits in electronics, and are often manufactured on the surface of semiconductor wafers.
At present, in the processing production of chips, in order to test the quality of the chips, a chip tester is generally used for testing the chips, and in order to facilitate the testing of the chips by the chip tester, a turnover mechanism can be used for turning over the chips.
Please refer to tilting mechanism of chip testing machine of bulletin number CN213041951U, the intelligent testing machine comprises a workbench, the front side and the rear side at workstation top are provided with mount and expansion bracket respectively, the equal fixedly connected with fixed cover in bottom of mount both sides, the top of workstation is provided with the fixed establishment who uses with the fixed cover cooperation, the top of mount inner chamber is provided with the holder, the left side fixedly connected with of holder and the movable rod of mount cooperation use, the left side and the mount swing joint of movable rod, the right side fixedly connected with rotary rod of holder, the right side of rotary rod runs through to the outside of mount and fixedly connected with knob, the positioning mechanism who uses with the knob cooperation is provided with at the top of knob and bottom, the test machine body that uses with the fixed establishment cooperation is all offered at the top of expansion bracket, through setting up workstation, mount, expansion bracket, fixed cover, fixed establishment, holder, movable rod, knob, positioning mechanism, rotary rod, test machine, die, user's the through-holder, the chip can not consume the chip in the time of the user's the time of the test is spent in the chip, and the chip has solved the time of the user's the time of the test is spent in the test, and the chip to the user's that the user's has carried out the time to the test.
However, there is a defect in this patent that the positioning frame is not convenient to be adjusted by the user according to the size of the chip, and the positioning frame cannot be suitable for positioning and turning of chips with various sizes, so that the practicability of the turning mechanism of the chip tester is affected.
Disclosure of Invention
Aiming at the defects of the prior art, the utility model provides the turnover mechanism of the chip tester, which has the advantages of convenience in adjustment, practicability, strong applicability and the like, and solves the problem that a user cannot adjust a positioning frame according to the size of the chip, cannot adapt to the positioning and turnover of chips with various sizes and influences the practicability of the turnover mechanism of the chip tester.
In order to achieve the above purpose, the present utility model provides the following technical solutions: the turnover mechanism of the chip tester comprises a test bench, wherein the top of the test bench is provided with the turnover mechanism, and an auxiliary assembly is arranged outside the test bench;
the turnover mechanism comprises a test module body fixedly connected with a test bench, a support frame is fixedly connected to the top of the test bench, a variable speed motor is fixedly connected to the right side of the support frame, a first gear is fixedly connected to the output end of the variable speed motor, a second gear is meshed to the top of the first gear, a mounting frame which is rotationally connected with the support frame is fixedly connected to the inside of the second gear, two support blocks are fixedly connected to the inside of the mounting frame, and a chip body is placed at the top of each support block;
the turnover mechanism further comprises an adjusting rod rotationally connected with the mounting frame, the back surface of the adjusting rod is fixedly connected with a driving bevel gear positioned in the mounting frame, a driven bevel gear is meshed with the right side of the driving bevel gear, and the inside of the driven bevel gear is fixedly connected with an external thread of a bidirectional screw rod rotationally connected with the mounting frame; the sliding seats with the number of two are connected, and clamping blocks which are in sliding connection with the mounting frame are fixedly connected to the back surfaces of the sliding seats.
Further, a through hole is formed in the right side of the support frame, and the output end of the variable speed motor penetrates through the support frame through the through hole and is fixedly connected with the first gear.
Further, a first rotating hole is formed in the support frame, and the mounting frame is connected with the support frame in a rotating mode through the first rotating hole.
Further, the mounting hole has been seted up to the inside of installing frame, adjust the pole and rotate with the installing frame through the mounting hole and be connected.
Further, the second rotating hole is formed in the mounting frame, and the bidirectional screw rod is rotationally connected with the mounting frame through the second rotating hole.
Further, the back fixedly connected with slider of grip block, the grip block passes through slider and erection frame sliding connection.
Further, the auxiliary assembly comprises a buffer cushion fixedly connected with the clamping block, and a limiting block clamped with the mounting frame is sleeved in the adjusting rod.
Further, the front of the mounting frame is provided with a clamping hole, and the limiting block is clamped with the mounting frame through the clamping hole.
Compared with the prior art, the technical scheme of the utility model has the following beneficial effects:
1. this chip testing machine tilting mechanism, through setting up tilting mechanism, overturn the chip, convenient to use person is to the test of chip, and convenient to use person adjusts, is applicable to the upset to the big or small chip of multiple size, has improved chip testing machine tilting mechanism's practicality, has solved inconvenient user according to the size of chip, adjusts the locating rack, can not be applicable to the location and the upset of the chip of multiple size, has influenced the problem of chip testing machine's tilting mechanism's practicality.
2. This chip testing machine tilting mechanism through setting up auxiliary assembly, has increased the protection to the chip, has improved chip testing machine tilting mechanism and has to the stability of chip centre gripping location.
Drawings
FIG. 1 is a cross-sectional view of the structure of the present utility model;
FIG. 2 is a top view of the mounting frame structure of the present utility model;
fig. 3 is a side view of the structure of the present utility model.
In the figure: 1. a test bench; 2. a test module body; 3. a support frame; 4. a variable speed motor; 5. a first gear; 6. a second gear; 7. a mounting frame; 8. a support block; 9. a chip body; 10. an adjusting rod; 11. a drive bevel gear; 12. a driven bevel gear; 13. a two-way screw rod; 14. a sliding seat; 15. a clamping block; 16. a cushion pad; 17. a slide block; 18. and a limiting block.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
Referring to fig. 1-3, a turnover mechanism of a chip tester in this embodiment includes a test bench 1, wherein the turnover mechanism is disposed at the top of the test bench 1, and an auxiliary component is disposed outside the test bench 1.
Embodiment one: the turnover mechanism comprises a test module body 2 fixedly connected with a test bench 1, a support frame 3 is fixedly connected to the top of the test bench 1, a variable speed motor 4 is fixedly connected to the right side of the support frame 3, a first gear 5 is fixedly connected to the output end of the variable speed motor 4, a second gear 6 is meshed to the top of the first gear 5, a mounting frame 7 is rotatably connected with the support frame 3 through the fixedly connected inside the second gear 6, a through hole is formed in the right side of the support frame 3, the output end of the variable speed motor 4 penetrates through the support frame 3 and is fixedly connected with the first gear 5 through the through hole, the variable speed motor 4 is electrified to drive the first gear 5 to rotate, the first gear 5 drives the second gear 6 and the mounting frame 7 to rotate, so that chips are turned over and adjusted, a supporting block 8 with two numbers is fixedly connected to the inside of the mounting frame 7, a chip body 9 is placed at the top of the supporting block 8, a first rotating hole is formed in the inside of the support frame 3, the mounting frame 7 is rotatably connected with the support frame 3 through the first rotating hole, the mounting frame 7 is limited by the mounting frame 7, and a user can conveniently turn over and adjust the chip body 9.
The turnover mechanism further comprises an adjusting rod 10 rotationally connected with the mounting frame 7, a driving bevel gear 11 positioned in the mounting frame 7 is fixedly connected to the back surface of the adjusting rod 10, a driven bevel gear 12 is meshed with the right side of the driving bevel gear 11, and external threads of a bidirectional screw rod 13 and a bidirectional screw rod 13 rotationally connected with the mounting frame 7 are fixedly connected to the inside of the driven bevel gear 12; the two sliding seats 14 are connected, the second rotating holes are formed in the mounting frame 7, the two-way screw rod 13 is rotationally connected with the mounting frame 7 through the second rotating holes, the two-way screw rod 13 is limited, the two-way screw rod 13 is rotated, and the two sliding seats 14 are made to slide relatively or slide relatively and separately outside the two-way screw rod 13 through the rotation of the two-way screw rod 13.
Wherein, the back fixedly connected with of sliding seat 14 and the grip block 15 of installing frame 7 sliding connection, the mounting hole has been seted up to the inside of installing frame 7, adjust pole 10 and install frame 7 rotation through the mounting hole and be connected, the person of facilitating the use rotates regulation pole 10 and adjusts, thereby be suitable for carrying out the centre gripping to the chip body 9 of multiple size fixedly, the person of user rotates regulation pole 10 and drives drive bevel gear 11 and rotate, drive bevel gear 11 rotates, drive driven bevel gear 12 and two-way lead screw 13 rotate, make two sliding seats 14 slide in the outside of two-way lead screw 13, adjust the position of grip block 15, adapt to the chip body 9 of equidimension not, the back fixedly connected with slider 17 of grip block 15, grip block 15 passes through slider 17 and installing frame 7 sliding connection, it is spacing to grip block 15 and sliding seat 14, the convenience of use carries out the slip of grip block 15 and sliding seat 14, the position of facilitating the user to two grip block 15 is adjusted.
It is to be noted that, through setting up tilting mechanism, overturn the chip, convenient to use person is to the test of chip, and convenient to use person adjusts, is applicable to the upset to the big or small chip of multiple size, has improved chip testing machine tilting mechanism's practicality, has solved inconvenient user and has adjusted the locating rack according to the size of chip, can not be applicable to the location and the upset of the chip of multiple size, has influenced the problem of chip testing machine's tilting mechanism's practicality.
Specifically, when the chip needs to be tested and turned over, the chip body 9 is placed on the top of the supporting block 8, the user rotates the adjusting rod 10 to drive the driving bevel gear 11 to rotate, the driving bevel gear 11 rotates to drive the driven bevel gear 12 and the bidirectional screw rod 13 to rotate, the two sliding seats 14 slide relatively outside the bidirectional screw rod 13 to adjust the position of the clamping block 15, so that the chip testing machine is suitable for clamping and positioning the chip body 9 with different sizes, then, the variable speed motor 4 is electrified to drive the first gear 5 to rotate, the first gear 5 drives the second gear 6 and the mounting frame 7 to rotate, and the chip body 9 is driven to turn over and adjust, so that the purposes of adapting to the positioning and turning over of chips with different sizes and improving the practicability of the chip testing machine are achieved.
Referring to fig. 1-3, the auxiliary assembly includes a buffer pad 16 fixedly connected with the clamping block 15, the buffer pad 16 is made of rubber, and has elasticity, so that damage to the chip body 9 caused by clamping force can be reduced, a limiting block 18 clamped with the mounting frame 7 is sleeved in the adjusting rod 10, a clamping hole is formed in the front face of the mounting frame 7, the limiting block 18 is clamped with the mounting frame 7 through the clamping hole, the limiting block 18 is square, the adjusting rod 10 is limited, after the adjusting rod 10 is rotated, the buffer pad 16 is tightly attached to the chip body 9, the chip body 9 is buffered and protected, damage to the chip body 9 assembly in the clamping process is reduced, and then the limiting block 18 is pushed, so that the limiting block 18 is clamped with the mounting frame 7, the adjusting rod 10 is limited, rotation of the adjusting rod 10 is reduced, and stability of clamping the chip body 9 is improved.
It should be noted that, through setting up auxiliary assembly, increased the protection to the chip, improved chip testing machine tilting mechanism to the stability of chip centre gripping location.
Specifically, when testing the upset to the chip, blotter 16 closely laminates with chip body 9, carries out buffer protection to chip body 9, reduces the centre gripping in-process to chip body 9 assembly damage, then promotes stopper 18, makes stopper 18 and mounting frame 7 joint, carries out spacingly to adjusting lever 10, reduces the rotation of adjusting lever 10, increases the stability to chip body 9 centre gripping.
The working principle of the embodiment is as follows:
(1) This chip testing machine tilting mechanism, when needs test the upset to the chip, place chip body 9 with the top of supporting shoe 8, the user rotates regulation pole 10 and drives the drive bevel gear 11 and rotate, the drive bevel gear 11 rotates, drive driven bevel gear 12 and two-way lead screw 13 rotate, make two sliding seats 14 carry out the relative slip in the outside of two-way lead screw 13 and adjust the position of grip block 15, thereby be suitable for the centre gripping location to chip body 9 of equidimension not, then, variable speed motor 4 circular telegram drives first gear 5 and rotates, first gear 5 drives second gear 6 and installing frame 7 and rotates, drive chip body 9 overturn and adjust, thereby reach the location and the upset of adaptation not equidimension chip, improve chip testing machine tilting mechanism practicality's purpose.
(2) This chip testing machine tilting mechanism, when testing the upset to the chip, blotter 16 closely laminates with chip body 9, carries out buffer protection to chip body 9, reduces the centre gripping in-process to chip body 9 assembly damage, then promotes stopper 18, makes stopper 18 and mounting frame 7 joint, carries out spacingly to adjusting lever 10, reduces the rotation of adjusting lever 10, increases the stability to the centre gripping of chip body 9.
It is noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.
Claims (8)
1. The utility model provides a chip testing machine tilting mechanism, includes testboard (1), its characterized in that: the top of the test bench (1) is provided with a turnover mechanism, and an auxiliary component is arranged outside the test bench (1);
the turnover mechanism comprises a test module body (2) fixedly connected with a test bench (1), a support frame (3) is fixedly connected to the top of the test bench (1), a variable speed motor (4) is fixedly connected to the right side of the support frame (3), a first gear (5) is fixedly connected to the output end of the variable speed motor (4), a second gear (6) is meshed with the top of the first gear (5), a mounting frame (7) rotationally connected with the support frame (3) is fixedly connected to the inside of the second gear (6), two support blocks (8) are fixedly connected to the inside of the mounting frame (7), and a chip body (9) is placed at the top of the support blocks (8);
the turnover mechanism further comprises an adjusting rod (10) rotationally connected with the mounting frame (7), a driving bevel gear (11) positioned inside the mounting frame (7) is fixedly connected to the back surface of the adjusting rod (10), a driven bevel gear (12) is meshed with the right side of the driving bevel gear (11), and a bidirectional screw rod (13) rotationally connected with the mounting frame (7) is fixedly connected to the inside of the driven bevel gear (12) and is externally threaded to the bidirectional screw rod (13); the two sliding seats (14) are connected, and clamping blocks (15) which are in sliding connection with the mounting frame (7) are fixedly connected to the back surfaces of the sliding seats (14).
2. The flip-flop mechanism of claim 1, wherein: the right side of the support frame (3) is provided with a through hole, and the output end of the variable speed motor (4) penetrates through the support frame (3) through the through hole and is fixedly connected with the first gear (5).
3. The flip-flop mechanism of claim 1, wherein: the inside of support frame (3) has seted up first pivot hole, mounting frame (7) are connected with support frame (3) rotation through first pivot hole.
4. The flip-flop mechanism of claim 1, wherein: the installation frame (7) is internally provided with an installation hole, and the adjusting rod (10) is rotationally connected with the installation frame (7) through the installation hole.
5. The flip-flop mechanism of claim 1, wherein: the inside of the mounting frame (7) is provided with a second rotating hole, and the bidirectional screw rod (13) is rotationally connected with the mounting frame (7) through the second rotating hole.
6. The flip-flop mechanism of claim 1, wherein: the back of the clamping block (15) is fixedly connected with a sliding block (17), and the clamping block (15) is in sliding connection with the mounting frame (7) through the sliding block (17).
7. The flip-flop mechanism of claim 1, wherein: the auxiliary assembly comprises a buffer pad (16) fixedly connected with the clamping block (15), and a limiting block (18) clamped with the mounting frame (7) is sleeved in the adjusting rod (10).
8. The flip-flop mechanism of claim 7, wherein: the front of the mounting frame (7) is provided with a clamping hole, and the limiting block (18) is clamped with the mounting frame (7) through the clamping hole.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321205771.5U CN219715554U (en) | 2023-05-18 | 2023-05-18 | Chip testing machine tilting mechanism |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321205771.5U CN219715554U (en) | 2023-05-18 | 2023-05-18 | Chip testing machine tilting mechanism |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219715554U true CN219715554U (en) | 2023-09-19 |
Family
ID=87998091
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321205771.5U Active CN219715554U (en) | 2023-05-18 | 2023-05-18 | Chip testing machine tilting mechanism |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219715554U (en) |
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2023
- 2023-05-18 CN CN202321205771.5U patent/CN219715554U/en active Active
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