CN219695194U

CN219695194U - Adjustable test platform

Info

Publication number: CN219695194U
Application number: CN202320576506.1U
Authority: CN
Inventors: 莫俊安; 米野; 庞土田
Original assignee: Shenzhen Xiongmai Advanced Semiconductor Technology Co ltd
Current assignee: Shenzhen Xiongmai Advanced Semiconductor Technology Co ltd
Priority date: 2023-03-14
Filing date: 2023-03-14
Publication date: 2023-09-15
Anticipated expiration: 2033-03-14

Abstract

The embodiment of the utility model discloses an adjustable test platform. The adjustable test platform comprises a test bench, an adjusting mechanism and an installing mechanism, wherein the test bench is installed on the adjusting mechanism and used for placing a chip, the adjusting mechanism is installed on the installing mechanism and used for adjusting the test positions of the test bench and the chip, the installing mechanism comprises a fixing seat and an installing plate detachably connected with the fixing seat, the fixing seat is installed on a chip test sorting machine and comprises a seat body and a clamping assembly, and the clamping assembly is installed on the seat body and used for clamping and fixing the installing plate on the seat body. Through the operation clamping assembly, the adjustable test platform can be conveniently disassembled and assembled so as to be convenient to exchange among different chip test sorting machines.

Description

Adjustable test platform

Technical Field

The utility model relates to the technical field of chip detection, in particular to an adjustable test platform.

Background

The test sorting of chips is an important ring in the chip production process, and the chips need to be placed on a chip test seat for contact testing of electrical parameters. Along with the reduction of the physical volume of the chip, the test time of a single chip is shortened, the test content requirement is increased, and the precision requirement on a chip test seat is also improved in order to ensure the precision, the efficiency and the stability in the chip production test process. The chip test seat is arranged on the chip test sorting machine. In order to save the cost, a chip test seat can be commonly used among different chip test sorting machines. However, the existing chip test seat is difficult to disassemble, assemble and shift, and is inconvenient to exchange among different chip test sorters.

Disclosure of Invention

The utility model aims to provide an adjustable test platform, which aims to solve the problems that the existing chip test seat is difficult to disassemble, assemble and shift and is inconvenient to exchange among different chip test sorters.

In order to solve the technical problems, the utility model provides an adjustable test platform, which comprises a test bench, an adjusting mechanism and a mounting mechanism, wherein the test bench is arranged on the adjusting mechanism and is used for placing a chip, and the adjusting mechanism is arranged on the mounting mechanism and is used for adjusting the test positions of the test bench and the chip;

the mounting mechanism comprises a fixing seat and a mounting plate detachably connected with the fixing seat, the fixing seat is mounted on the chip testing sorting machine, the fixing seat comprises a seat body and a clamping assembly, and the clamping assembly is mounted on the seat body and used for clamping and fixing the mounting plate on the seat body.

In one embodiment, the clamping assembly comprises a fixing structure and a clamping structure which are oppositely arranged at two sides of the seat body, and the clamping structure can push the mounting plate to prop against the fixing structure so as to clamp and fix the mounting plate to the seat body;

the mounting plate is provided with a first abutting surface and a second abutting surface, wherein the first abutting surface is inclined to the horizontal plane and is used for abutting against the fixing structure, and the second abutting surface is inclined to the horizontal plane and is used for abutting against the clamping structure.

In one embodiment, the clamping structure comprises a mounting frame and a mounting piece, the mounting frame is mounted on the seat body, a mounting hole is formed in the mounting frame, the mounting piece is in threaded connection with the hole wall of the mounting hole, and the mounting piece can penetrate through the mounting hole and offset with the mounting plate.

In one embodiment, the mounting frame is rotatably connected to the seat body, so that the abutting direction of the mounting member can be adjusted by an angle of the mounting frame relative to a horizontal plane.

In one embodiment, the fixing structure is formed with a positioning groove, and the mounting plate is formed with a positioning protrusion adapted to the positioning groove.

In one embodiment, the seat body is provided with a limit bump, and the mounting plate is provided with a limit groove in sliding fit with the limit bump; and/or

The seat body is provided with a guide rail, and the mounting plate is provided with a guide groove in sliding fit with the guide rail.

In one embodiment, the adjusting mechanism includes a first adjusting component, a second adjusting component and a third adjusting component, the first adjusting component is connected with the test bench and is used for adjusting the position of the test bench in a first direction, the second adjusting component is connected with the first adjusting component and is used for adjusting the position of the test bench in a second direction, the third adjusting component is connected with the second adjusting component and is used for adjusting the position of the test bench in a third direction, and the first direction, the second direction and the third direction are mutually arranged in an angle mode.

In one embodiment, the first adjusting assembly comprises a first sliding block and a first adjusting piece, the second adjusting assembly comprises a second sliding block and a second adjusting piece, the third adjusting assembly comprises a third sliding block and a third adjusting piece, the first sliding block is slidably arranged on the second sliding block, the second sliding block is slidably arranged on the third sliding block, and the third sliding block is slidably arranged on the mounting plate;

the test bench is arranged on the first sliding block, the first adjusting piece comprises a first screw sleeve and a first screw rod in threaded connection with the first screw sleeve, the first screw sleeve is rotationally connected with the second sliding block, and the first screw rod can be driven to prop against the first sliding block by rotating the first screw sleeve so as to push the first sliding block to move along the first direction;

the second adjusting piece comprises a second screw sleeve and a second screw rod in threaded connection with the second screw sleeve, the second screw sleeve is rotationally connected with the third sliding block, and the second screw rod can be driven to abut against the second sliding block by rotating the second screw sleeve so as to push the second sliding block to move along the second direction;

the third adjusting piece comprises a third screw sleeve and a third screw rod in threaded connection with the third screw sleeve, the third screw sleeve is rotationally connected to the mounting plate, and the third screw rod can be driven to abut against the third sliding block by rotating the third screw sleeve, so that the third sliding block can be pushed to move along the third direction.

In one embodiment, the first, second and third adjusting members are micrometer.

In one embodiment, the first adjusting assembly further comprises a first elastic member elastically connecting the first slider and the second slider and for driving the first slider to move in a fourth direction, the fourth direction being opposite to the first direction;

the second adjusting assembly further comprises a second elastic piece, wherein the second elastic piece is elastically connected with the second sliding block and the third sliding block and is used for driving the second sliding block to move along a fifth direction, and the fifth direction is opposite to the second direction;

the third adjusting assembly further comprises a third elastic piece, wherein the third elastic piece is elastically connected with the third sliding block and the mounting plate and used for driving the third sliding block to move along a sixth direction, and the sixth direction is opposite to the third direction.

The embodiment of the utility model has the following beneficial effects:

the adjustable test platform is characterized in that the test platform is arranged on the adjusting mechanism and used for placing chips, the adjusting mechanism is arranged on the installing mechanism and used for adjusting the test positions of the test platform and the chips, the installing mechanism comprises a fixing seat and a mounting plate detachably connected with the fixing seat, the fixing seat is arranged on the chip test sorting machine and comprises a seat body and a clamping assembly, and the clamping assembly is arranged on the seat body and used for clamping and fixing the mounting plate on the seat body. Through the operation clamping assembly, the adjustable test platform can be conveniently disassembled and assembled so as to be convenient to exchange among different chip test sorting machines.

Drawings

In order to more clearly illustrate the embodiments of the utility model or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, it being obvious that the drawings in the following description are only some embodiments of the utility model, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.

Wherein:

FIG. 1 is a schematic diagram of an adjustable test platform in one embodiment.

Fig. 2 is a front view of the adjustable test platform of fig. 1.

Fig. 3 is a rear view of the adjustable test platform of fig. 1.

Fig. 4 is a schematic view of a mounting seat in the adjustable test platform shown in fig. 1.

FIG. 5 is a schematic view of a mounting plate of the adjustable test platform of FIG. 1.

Fig. 6 is an exploded view of the adjustment mechanism of the adjustable test platform of fig. 1.

Reference numerals:

100. a test bench; 110. a test seat; 120. a test board;

200. an adjusting mechanism; 211. a first block body; 212. a first connection block; 220. a first adjustment member; 221. a first screw sleeve; 222. a first screw; 230. a first elastic member; 241. a second block body; 242. a second connection block; 243. a first positioning plate; 2431. a first travel slot; 244. a second positioning plate; 2441. a second travel groove; 245. a second abutment; 250. a second adjusting member; 251. a second screw sleeve; 252. a second screw; 260. a second elastic member; 270. a third slider; 271. a second positioning hole; 272. a third positioning plate; 2721. a third travel groove; 273. a first abutment; 280. a third adjustment member; 281. a third screw sleeve; 282. a third screw; 290. a third elastic member;

300. a mounting mechanism; 310. a fixing seat; 320. a seat body; 321. a limit bump; 322. a guide rail; 330. a clamping assembly; 340. a clamping structure; 341. a mounting member; 3411. a handle portion; 3412. an abutting portion; 342. a mounting frame; 350. a fixed structure; 351. a positioning groove; 360. a mounting plate; 370. a plate body; 371. a first abutment surface; 372. positioning the bulge; 373. a limit groove; 374. a limit part; 380. an abutment block; 381. a second abutment surface; 390. a mounting base; 391. a third positioning hole; 392. and a third abutting piece.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

It should be noted that all directional indicators (such as up, down, left, right, front, and rear … …) in the embodiments of the present utility model are merely used to explain the relative positional relationship, movement, etc. between the components in a specific posture (as shown in the drawings), and if the specific posture is changed, the directional indicators are correspondingly changed.

Furthermore, the description of "first," "second," etc. in this disclosure is for descriptive purposes only and is not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In addition, the technical solutions of the embodiments may be combined with each other, but it is necessary to base that the technical solutions can be realized by those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should be considered to be absent and not within the scope of protection claimed in the present utility model.

Referring to fig. 1 to 5, an adjustable test platform of an embodiment includes a test bench 100, an adjusting mechanism 200 and a mounting mechanism 300, wherein the test bench 100 is mounted on the adjusting mechanism 200 and is used for placing a chip, the adjusting mechanism 200 is mounted on the mounting mechanism 300 and is used for adjusting test positions of the test bench 100 and the chip, the mounting mechanism 300 includes a fixing base 310 and a mounting plate 360 detachably connected with the fixing base 310, the fixing base 310 is mounted on a chip test handler, the fixing base 310 includes a base body 320 and a clamping assembly 330, and the clamping assembly 330 is mounted on the base body 320 and is used for clamping and fixing the mounting plate 360 on the base body 320.

In the present embodiment, the adjustment mechanism 200 can adjust the testing position of the test stand 100 from three directions, respectively. Realize fixing base 310 and mounting panel 360's detachable connection through clamping assembly 330, can improve the dismouting speed of mounting panel 360, and then conveniently dismouting adjustable test platform to change between different chip test sorting machines.

In an embodiment, referring to fig. 4 and 5, the clamping assembly 330 includes a fixing structure 350 and a clamping structure 340 disposed opposite to each other on two sides of the seat body 320, the clamping structure 340 can push the mounting plate 360 against the fixing structure 350 to clamp and fix the mounting plate 360 to the seat body 320, the mounting plate 360 has a first abutment surface 371 and a second abutment surface 381, the first abutment surface 371 is inclined to a horizontal plane and is used for being abutted against the fixing structure 350, and the second abutment surface 381 is inclined to a horizontal plane and is used for being abutted against the clamping structure 340.

In this embodiment, the fixing structure 350 has a third contact surface formed thereon. The third abutment surface is disposed obliquely to the horizontal plane and is configured to abut against the first abutment surface 371. The mounting plate 360 includes a plate body 370, and an abutment block 380 mounted on the plate body 370, a first abutment surface 371 being formed on the plate body 370, and a second abutment surface 381 being formed on the abutment block 380. The first abutment surface 371 and the second abutment surface 381 are disposed at both ends of the mounting plate 360.

The clamping structure 340 is abutted against the second abutting surface 381 and pushes the mounting plate 360 to enable the first abutting surface 371 to be abutted against the third abutting surface, so that the mounting plate 360 is clamped and fixed on the fixing seat 310, and the adjustable test platform is conveniently mounted. The clamping structure 340 is far away from the second abutting surface 381, so that the mounting plate 360 can be released and detached, and the adjustable test platform can be detached conveniently.

Further, the first abutment surface 371 and the second abutment surface 381 are inclined to the horizontal plane, so that the clamping assembly 330 can apply pressure to the mounting plate 360 towards the fixing base 310, thereby limiting the movement of the mounting plate 360 in the vertical direction, so as to stably clamp the mounting plate 360 on the fixing base 310.

In another embodiment, the clamping assembly 330 includes two sets of clamping structures 340 disposed on two opposite sides of the seat body 320, and the two sets of clamping structures 340 can respectively abut against the first abutment surface 371 and the second abutment surface 381 and clamp the mounting plate 360 from two ends. Further, the mounting plate 360 can be detached from the two ends of the fixing seat 310 respectively, so that the detachment adaptability of the adjustable test platform is stronger.

In an embodiment, referring to fig. 4 and 5, the clamping structure 340 includes a mounting frame 342 and a mounting member 341, the mounting frame 342 is mounted on the base body 320, a mounting hole is formed in the mounting frame 342, the mounting member 341 is in threaded connection with a hole wall of the mounting hole, and the mounting member 341 can penetrate through the mounting hole and abut against the mounting plate 360.

In this embodiment, the mounting hole is formed in the middle of the mounting frame 342, and two ends of the mounting frame 342 are respectively connected to two sides of the seat body 320. Mount 341 includes an abutment 3412 and a handle 3411 connected to abutment 3412, where abutment 3412 is screwed to the wall of the mounting hole. The operating handle 3411 can drive the abutting portion 3412 to penetrate through the mounting hole and abut against the second abutting surface 381, so as to push the mounting plate 360 against the fixing structure 350, and further clamp and fix the mounting plate 360 to the seat body 320. Further, the handle portion 3411 can drive the abutment 3412 away from the second abutment 381 to release the mounting plate 360, thereby facilitating easy disassembly and assembly of the adjustable test platform for replacement between different chip test sorters.

In an embodiment, referring to fig. 4, the mounting frame 342 is rotatably connected to the base body 320, so that the abutment direction of the mounting member 341 can be adjusted by the angle of the mounting frame 342 relative to the horizontal plane.

In this embodiment, two ends of the mounting frame 342 are rotatably connected to two sides of the seat body 320, respectively. According to the specific fitting situation, the abutting direction of the mounting member 341 is adjusted by the angle of the mounting frame 342 relative to the horizontal plane, so that the clamping assembly 330 can clamp and fix the mounting plate 360 to the seat body 320 more firmly. Further, when the mounting plate 360 is detached, the mounting plate 360 can be taken out conveniently by adjusting the angle of the mounting frame 342 relative to the horizontal plane, and then the adjustable test platform can be disassembled and assembled conveniently.

In an embodiment, referring to fig. 4 and 5, a positioning groove 351 is formed on the fixing structure 350, and a positioning protrusion 372 matching the positioning groove 351 is formed on the mounting plate 360.

In this embodiment, the positioning protrusion 372 can be matched with the positioning groove 351 so as to position the mounting plate 360 and ensure accurate position matching between the mounting plate 360 and the fixing base 310. Specifically, the positioning groove 351 is formed in the fixing structure 350, and the clamping structure 340 can push the mounting plate 360 and push the positioning protrusion 372 into the positioning groove 351. When the positioning protrusion 372 is located in the positioning groove 351, the first abutment surface 371 can abut against the third abutment surface, so that the position between the mounting plate 360 and the fixing base 310 is accurately matched.

In an embodiment, referring to fig. 4 and 5, the seat body 320 is provided with a limiting protrusion 321, and the mounting plate 360 is provided with a limiting groove 373 slidably engaged with the limiting protrusion 321.

In this embodiment, the limiting bump 321 is cylindrical, and a protruding portion is formed on the limiting bump 321 by protruding in the circumferential direction. The limiting groove 373 is formed in the plate body 370. The two side groove walls of the limiting groove 373 are partially protruded to form limiting parts 374, the two side limiting parts 374 are correspondingly arranged, and the limiting parts 374 extend along the extending direction of the limiting groove 373 and can be in sliding fit with the limiting convex blocks 321. The limiting projection 321 can extend into the limiting groove 373 from the notch of the limiting groove 373 which is not shielded by the limiting part 374, and the position of the limiting projection 321 in the limiting groove 373 can be adjusted by pushing the mounting plate 360. When the limiting projection 321 is located between the limiting portions 374 on both sides, the lower end surface of the protruding portion is slidably abutted against the limiting portions 374, so that the movement of the mounting plate 360 in the vertical direction is limited, and the mounting accuracy of the mounting mechanism 300 is improved.

In an embodiment, referring to fig. 4 and 5, the seat body 320 is provided with a guide rail 322, and the mounting plate 360 is provided with a guide groove slidably engaged with the guide rail 322.

In the present embodiment, the guide rail 322 is formed protruding from the seat body 320 and extends along the extending direction of the limiting groove 373. The guide groove extends along the extending direction of the limit groove 373 and is communicated with the limit groove 373. The guide rail 322 can be matched with the groove wall of the guide groove so as to position the mounting plate 360 and ensure accurate position matching between the mounting plate 360 and the fixing seat 310. Further, the guide rail 322 can be slidably connected with the groove wall of the guide groove, so that the mounting plate 360 can be conveniently dismounted, the adjustable test platform can be conveniently dismounted, and the mounting precision of the mounting mechanism 300 can be improved.

In an embodiment, referring to fig. 1 to 3, the adjusting mechanism 200 includes a first adjusting component, a second adjusting component and a third adjusting component, where the first adjusting component is connected with the test bench 100 and is used for adjusting a position of the test bench 100 in a first direction, the second adjusting component is connected with the first adjusting component and is used for adjusting a position of the test bench 100 in a second direction, and the third adjusting component is connected with the second adjusting component and is used for adjusting a position of the test bench 100 in a third direction, and the first direction, the second direction and the third direction are set at angles.

In this embodiment, the test bench 100 includes a test board 120 and a test seat 110, the test board 120 is mounted on the first adjusting component, and the test seat 110 is mounted on the test board 120 and is used for placing chips. The mounting mechanism 300 further includes a mount 390, the third adjustment assembly being coupled to the mount 390, the mount 390 being mounted to the mounting plate 360. The first direction, the second direction and the third direction are mutually perpendicular.

In an embodiment, referring to fig. 2, 3 and 6, the first adjusting assembly includes a first slider and a first adjusting member 220, the second adjusting assembly includes a second slider and a second adjusting member 250, the third adjusting assembly includes a third slider 270 and a third adjusting member 280, the first slider is slidably disposed on the second slider, the second slider is slidably disposed on the third slider 270, and the third slider 270 is slidably disposed on the mounting plate 360.

The test bench 100 is mounted on a first slider, the first adjusting member 220 includes a first screw sleeve 221 and a first screw rod 222 in threaded connection with the first screw sleeve 221, the first screw sleeve 221 is rotatably connected to a second slider, and rotating the first screw sleeve 221 can drive the first screw rod 222 to abut against the first slider so as to push the first slider to move along a first direction.

The second adjusting member 250 includes a second screw sleeve 251 and a second screw rod 252 screwed with the second screw sleeve 251, the second screw sleeve 251 is rotatably connected to the third slider 270, and rotating the second screw sleeve 251 can drive the second screw rod 252 to abut against the second slider, so as to push the second slider to move along the second direction.

The third adjusting member 280 includes a third screw 281, and a third screw 282 screwed with the third screw 281, where the third screw 281 is rotatably connected to the mounting plate 360, and rotating the third screw 281 drives the third screw 282 to abut against the third slider 270, so as to push the third slider 270 to move along the third direction.

In the present embodiment, the first slider includes a first block body 211 and a first connection block 212 connected to the first block body 211. The second slider includes a second block body 241 and a second connection block 242 connected to the second block body 241. The test stand 100 is mounted to the first connection block 212.

The first block body 211 and the second connection block 242 are slidably connected, the first screw 221 is rotatably connected to the second connection block 242, and the first screw 222 can abut against the first connection block 212. Rotating the first sleeve 221 drives the first screw 222 to move the first slider on the second connection block 242 in the first direction.

The second block body 241 is slidably connected with the third slider 270, the second screw sleeve 251 is rotatably connected to the second block body 241, the third slider 270 is provided with a first abutting part 273, and the second screw rod 252 can be driven to abut against the first abutting part 273 by rotating the second screw sleeve 251, so that the second screw sleeve 251 moves towards the second direction, and the second screw sleeve 251 drives the second slider to move along the second direction on the third slider 270.

The third slider 270 is slidably connected to the mounting seat 390, the third threaded sleeve 281 is rotatably connected to the mounting seat 390, and the third threaded rod 282 can abut against the third slider 270. Turning the third screw 281 drives the third screw 282 to move the third slider 270 in a third direction on the mount 390.

Specifically, the first block body 211 and the second connection block 242 are slidably connected by using the cross roller guide rail, the second block body 241 and the third block 270 are slidably connected by using the cross roller guide rail, the third block 270 and the mounting seat 390 are slidably connected by using the cross roller guide rail, the cross roller guide rail is stable in guiding and small in occupied space, the volume of the adjusting mechanism 200 can be reduced, and the structure of the adjusting mechanism 200 is more compact and attractive. The first block body 211 and the first connection block 212 are integrally formed, and the second connection block 242 is mounted to the second block body 241.

In this embodiment, the first adjustment assembly further includes a first positioning member. The second connection block 242 is provided with a first positioning plate 243. The first positioning plate 243 is provided with a first travel groove 2431 extending along a first direction, and the first block body 211 is provided with a first positioning hole adapted to the first travel groove 2431. The first positioning piece penetrates through the first travel groove 2431 and is detachably connected with the hole wall of the first positioning hole. The first positioning members can respectively abut against the groove walls at two ends of the first travel groove 2431 to limit the movement travel of the first slider. The first positioning member is operated to abut against the first positioning plate 243, so that the sliding of the first slider can be limited, and the first slider can be positioned on the second connecting member.

The second adjustment assembly further includes a second positioning member. The second block body 241 is provided with a second positioning plate 244. The second positioning plate 244 is provided with a second travel groove 2441 extending along the second direction, and the third slider 270 is provided with a second positioning hole 271 matched with the second travel groove 2441. The second positioning member penetrates through the second travel groove 2441 and is detachably connected with the hole wall of the second positioning hole 271. The second positioning pieces can respectively prop against the groove walls at two ends of the second stroke groove 2441 so as to limit the movement stroke of the second sliding block. Operating the second positioning member against the second positioning plate 244 limits the sliding of the second slider and positions the second slider on the third slider 270.

The third adjustment assembly further includes a third positioning member. The third slider 270 is provided with a third positioning plate 272. The third positioning plate 272 is provided with a third travel groove 2721 extending along a third direction, and the mounting seat 390 is provided with a third positioning hole 391 matched with the third travel groove 2721. The third positioning member penetrates through the third travel groove 2721 and is detachably connected with the hole wall of the third positioning hole 391. The third positioning members can respectively abut against the groove walls at two ends of the third stroke groove 2721 to limit the movement stroke of the third slider 270. The third positioning member is operated to abut against the third positioning plate 272, so that the sliding of the third slider 270 is restricted, and the third slider 270 is positioned on the mount 390.

In one embodiment, referring to fig. 2, 3 and 6, the first adjusting member 220, the second adjusting member 250 and the third adjusting member 280 are micrometer. In this embodiment, the first adjusting member 220, the second adjusting member 250 and the third adjusting member 280 are all selected as micrometer, so as to realize high-precision adjustment of the test bench 100, thereby matching with the high-precision test requirement in the chip test process.

In an embodiment, referring to fig. 2, 3 and 6, the first adjusting assembly further includes a first elastic member 230, where the first elastic member 230 is elastically connected to the first slider and the second slider and is used for driving the first slider to move along a fourth direction, and the fourth direction is opposite to the first direction.

The second adjusting assembly further includes a second elastic member 260, where the second elastic member 260 is elastically connected to the second slider and the third slider 270, and is used to drive the second slider to move along a fifth direction, and the fifth direction is opposite to the second direction.

The third adjusting assembly further includes a third elastic member 290, the third elastic member 290 elastically connecting the third slider 270 and the mounting plate 360 and serving to drive the third slider 270 to move in a sixth direction, which is opposite to the third direction.

In the present embodiment, the first elastic member 230 is elastically coupled with the first connection block 212 and the second connection block 242. The first elastic member 230 can provide a pre-tightening force, so that the first adjusting member 220 can more accurately adjust the position of the first slider in the first direction. Further, the first elastic member 230 can be engaged with the first adjusting member 220, and pull the first slider to move along the fourth direction when the first screw 222 moves along the fourth direction.

The second block body 241 is provided with a second abutting piece 245, and the second elastic piece 260 is elastically connected with the second abutting piece 245 and the first sliding block. The second elastic member 260 can provide a pre-tightening force, so that the second adjusting member 250 can more accurately adjust the position of the second slider in the second direction. Further, the second elastic member 260 can cooperate with the second adjusting member 250, and push the second slider to move along the fifth direction when the second screw 252 moves along the fifth direction.

The mounting seat 390 is provided with a third abutting piece 392, and the third elastic piece 290 is elastically connected with the third abutting piece 392 and the third sliding block 270. The third elastic member 290 can provide a pre-tightening force, so that the third adjusting member 280 can more precisely adjust the position of the third slider 270 in the third direction. Further, the third elastic member 290 can be engaged with the third adjusting member 280, and push the third slider 270 to move in the sixth direction when the third screw 282 moves in the sixth direction.

The foregoing disclosure is illustrative of the present utility model and is not to be construed as limiting the scope of the utility model, which is defined by the appended claims.

Claims

1. An adjustable test platform, comprising: the test bench is arranged on the adjusting mechanism and used for placing chips, and the adjusting mechanism is arranged on the mounting mechanism and used for adjusting the test positions of the test bench and the chips;

2. The adjustable test platform of claim 1, wherein the clamping assembly comprises a fixing structure and a clamping structure which are oppositely arranged at two sides of the seat body, and the clamping structure can push the mounting plate to prop against the fixing structure so as to clamp and fix the mounting plate to the seat body;

3. The adjustable test platform of claim 2, wherein the clamping structure comprises a mounting bracket and a mounting member, the mounting bracket is mounted on the seat body, a mounting hole is formed in the mounting bracket, the mounting member is in threaded connection with a hole wall of the mounting hole, and the mounting member can penetrate through the mounting hole and abut against the mounting plate.

4. The adjustable test platform of claim 3, wherein the mounting bracket is rotatably coupled to the seat body to enable adjustment of the abutment direction of the mounting member by an angle of the mounting bracket relative to a horizontal plane.

5. The adjustable test platform of claim 2, wherein the fixed structure is formed with a positioning slot, and the mounting plate is formed with a positioning protrusion adapted to the positioning slot.

6. The adjustable test platform of claim 1, wherein the seat body is provided with a limit bump, and the mounting plate is provided with a limit groove in sliding fit with the limit bump; and/or

7. The adjustable test platform of claim 1, wherein the adjustment mechanism comprises a first adjustment assembly coupled to the test platform and configured to adjust a position of the test platform in a first direction, a second adjustment assembly coupled to the first adjustment assembly and configured to adjust a position of the test platform in a second direction, and a third adjustment assembly coupled to the second adjustment assembly and configured to adjust a position of the test platform in a third direction, the first direction, the second direction, and the third direction being angularly disposed relative to one another.

8. The adjustable test platform according to claim 7, wherein the first adjustment assembly comprises a first slider and a first adjustment member, the second adjustment assembly comprises a second slider and a second adjustment member, the third adjustment assembly comprises a third slider and a third adjustment member, the first slider is slidably disposed on the second slider, the second slider is slidably disposed on the third slider, and the third slider is slidably disposed on the mounting plate;

9. The adjustable test platform of claim 8, wherein the first adjustment member, the second adjustment member, and the third adjustment member are micrometer.

10. The adjustable test platform according to claim 8, wherein the first adjustment assembly further comprises a first resilient member resiliently connecting the first slider and the second slider and for driving the first slider to move in a fourth direction, the fourth direction being opposite the first direction;