CN219676076U - Integrated circuit testing mechanism - Google Patents
Integrated circuit testing mechanism Download PDFInfo
- Publication number
- CN219676076U CN219676076U CN202320847634.5U CN202320847634U CN219676076U CN 219676076 U CN219676076 U CN 219676076U CN 202320847634 U CN202320847634 U CN 202320847634U CN 219676076 U CN219676076 U CN 219676076U
- Authority
- CN
- China
- Prior art keywords
- integrated circuit
- fixedly mounted
- testing mechanism
- plates
- circuit testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 35
- 230000007246 mechanism Effects 0.000 title claims abstract description 24
- 239000000523 sample Substances 0.000 claims abstract description 22
- 238000001514 detection method Methods 0.000 claims abstract description 10
- 230000000149 penetrating effect Effects 0.000 claims description 7
- 230000000694 effects Effects 0.000 abstract description 2
- 238000000034 method Methods 0.000 description 7
- 230000008569 process Effects 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005489 elastic deformation Effects 0.000 description 1
- 238000001125 extrusion Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model relates to an integrated circuit testing mechanism which comprises a base, wherein a supporting frame is fixedly arranged at the top of the base, the integrated circuit testing mechanism is arranged at the top of the base and comprises a detection head assembly fixedly arranged at the top of the supporting frame, and a bottom block is fixedly arranged at the top of the base. This integrated circuit testing mechanism, through placing the integrated circuit board between two splint, two electric putter promote two splint and draw close each other and extrude the both sides of integrated circuit board and cause two probes to stretch into respectively to pushing away the inside of frame, two probes contact with two pressure sensor respectively and extrude it afterwards, two pressure sensor sense pressure just control two electric putter and close this moment, and then prevent that electric putter from exerting oneself excessively and press from both sides the bad with the circuit board promptly, also fix the circuit board between two splint, thereby reached stable centre gripping test, the effect of preventing the circuit board damage.
Description
Technical Field
The utility model relates to the technical field of integrated circuit testing, in particular to an integrated circuit testing mechanism.
Background
The integrated circuit is miniaturized, and the components such as transistors, resistors, capacitors, inductors and the like and wiring needed in a circuit are interconnected by adopting a certain process, are manufactured on a small semiconductor wafer or a plurality of small semiconductor wafers or dielectric substrates, and are then packaged in a tube shell to form the microstructure with the needed circuit function.
The utility model provides an integrated circuit testing device, which is provided by Chinese patent publication No. CN218546942U, and the technical scheme provides the problems that the existing integrated circuit testing device needs to clamp and fix an integrated circuit board when in use so as to test the work, and because the structure of a clamping and fixing mechanism is single, the clamping interval can not be adjusted, the integrated circuit board with the same specification and size can only be fixed, so that the integrated circuit testing device has poorer flexibility when in use and is inconvenient to use, and the utility model provides the following technical scheme: the test head assembly comprises a bottom plate, wherein the lower end outer surface of the bottom plate is provided with a test head assembly, the upper end outer surface of the bottom plate is fixedly provided with a damper, the upper end outer surface of the damper is connected with a connecting plate, the right side outer surface of the connecting plate is fixedly connected with a cross rod … …, and the elasticity of the damper and a buffer spring can be utilized to further weaken the extrusion force applied to the integrated circuit board, so that the test head assembly is prevented from directly penetrating through the circuit board to be damaged. The above scheme suffers from the following drawbacks: according to the integrated circuit testing device, the integrated circuit board is clamped by the protective sponge pads at the two groups of clamping plates together through utilizing the elastic deformation of the clamping springs, however, the circuit board is clamped bad easily when the elasticity of the springs is too strong, and the clamping of the circuit board is unstable when the elasticity of the springs is too weak, so that the integrated circuit testing mechanism is provided to solve the problems.
Disclosure of Invention
Aiming at the defects of the prior art, the utility model provides an integrated circuit testing mechanism which has the advantages of stable clamping test, circuit board damage prevention and the like.
In order to achieve the above purpose, the present utility model provides the following technical solutions: the integrated circuit testing mechanism comprises a base, wherein a supporting frame is fixedly arranged at the top of the base, and the integrated circuit testing mechanism is arranged at the top of the base.
The integrated circuit testing mechanism comprises a detection head assembly fixedly mounted at the top of a support frame, a bottom block is fixedly mounted at the top of a base, a sliding rail is fixedly mounted at the top of the bottom block, electric push rods penetrating through the inside of the support frame are fixedly mounted at the left side and the right side of the support frame, pushing frames are fixedly mounted at the inner sides of the electric push rods, pushing plates are fixedly mounted at the inner sides of the pushing frames, hook plates with two numbers are fixedly mounted at the bottoms of the pushing plates, sliding grooves are formed in the inner portions of lower bottom walls of the pushing plates, sliding blocks are slidably mounted in the sliding grooves, clamping plates are fixedly mounted at the tops of the sliding blocks, probes penetrating through the inner portions of the pushing frames are fixedly mounted at the outer sides of the clamping plates, springs sleeved outside the probes are fixedly mounted at the outer sides of the clamping plates, and pressure sensors are fixedly mounted at the inner portions of the pushing frames.
Further, the bottom area of base is greater than the top area of support frame, detect the head subassembly and run through to the inside of support frame, bottom block and slide rail all are located the bottom that detects the head subassembly.
Further, the unfolding directions of the two electric push rods face the inside of the supporting frame, the outer parts of the two pushing frames are of a -shaped structure, and the outer parts of the two pushing plates are of an L-shaped structure.
Further, four hook plates are respectively clamped at the front end and the rear end of the sliding rail, the four hook plates are in sliding connection with the sliding rail, and the two sliding blocks respectively slide left and right in the two sliding grooves.
Further, the outside of two splint is "" shape structure, two the probe is sliding connection with the push pedal, two the outside of spring is fixed connection with the push pedal.
Further, the inner diameters of the two springs are smaller than the diameter of the probe, the two pressure sensors and the probe are located on the same horizontal line, and the two pressure sensors are respectively electrically connected with the two electric push rods.
Compared with the prior art, the technical scheme of the utility model has the following beneficial effects:
this integrated circuit testing mechanism, through placing the integrated circuit board between two splint, two electric putter promote two splint and draw close each other and extrude the both sides of integrated circuit board and cause two probes to stretch into respectively to pushing away the inside of frame, two probes contact with two pressure sensor respectively and extrude it afterwards, two pressure sensor sense pressure just control two electric putter and close this moment, and then prevent that electric putter from exerting oneself excessively and press from both sides the bad with the circuit board promptly, also fix the circuit board between two splint, thereby reached stable centre gripping test, the effect of preventing the circuit board damage.
Drawings
FIG. 1 is a schematic diagram of the structure of the present utility model;
FIG. 2 is a front elevational view of the structure of the present utility model;
FIG. 3 is a right side view of the structural slide rail of the present utility model;
fig. 4 is an enlarged schematic view of a first embodiment of the present utility model.
In the figure: 1. a base; 2. a support frame; 3. a detection head assembly; 4. a bottom block; 5. a slide rail; 6. an electric push rod; 7. pushing a frame; 8. a push plate; 9. a hook plate; 10. a chute; 11. a slide block; 12. a clamping plate; 13. a probe; 14. a spring; 15. a pressure sensor.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
Referring to fig. 1-4, an integrated circuit testing mechanism in this embodiment includes a base 1, a support frame 2 is fixedly mounted on the top of the base 1, the bottom area of the base 1 is larger than the top area of the support frame 2, the bottom of the device is supported by the base 1, and the integrated circuit testing mechanism is disposed on the top of the base 1.
The integrated circuit testing mechanism comprises a detection head assembly 3 fixedly mounted at the top of a support frame 2, the detection head assembly 3 penetrates into the support frame 2, a circuit board is detected through the detection head assembly 3, a bottom block 4 is fixedly mounted at the top of a base 1, a sliding rail 5 is fixedly mounted at the top of the bottom block 4, the bottom of the sliding rail 5 is supported through the bottom block 4, the bottom block 4 and the sliding rail 5 are located at the bottom of the detection head assembly 3, electric push rods 6 penetrating into the support frame 2 are fixedly mounted at the left side and the right side of the support frame 2, the unfolding directions of the two electric push rods 6 face the inside of the support frame 2, pushing frames 7 are fixedly mounted at the inner sides of the two electric push rods 6, pushing frames 7 are of a -shaped structure, pushing plates 8 are fixedly mounted at the inner sides of the two pushing frames 7, L-shaped structures are arranged at the outer sides of the two pushing plates 8, the bottoms of the two pushing plates 8 can be driven to move through the two electric push rods 6 in a telescopic manner, and hook plates 9 with two quantities are fixedly mounted at the bottom of the two pushing plates 8.
The four hook plates 9 are respectively clamped at the front end and the rear end of the sliding rail 5, the four hook plates 9 are in sliding connection with the sliding rail 5, the two push plates 8 are respectively limited to slide at the top of the sliding rail 5 through the four hook plates 9, sliding grooves 10 are respectively formed in the lower bottom wall of the two push plates 8, sliding blocks 11 are respectively and slidably mounted in the sliding grooves 10, the sliding blocks 11 respectively slide left and right in the sliding grooves 10, clamping plates 12 are respectively and fixedly mounted at the tops of the sliding blocks 11, the outer parts of the clamping plates 12 are of a -shaped structure, two sides of a circuit board are clamped through the clamping plates 12, probes 13 penetrating through the push rods 7 are fixedly mounted at the outer sides of the clamping plates 12, the two probes 13 are in sliding connection with the push plates 8, springs 14 sleeved outside the probes 13 are fixedly mounted at the outer sides of the two clamping plates 12, the outer sides of the two springs 14 are fixedly connected with the push plates 8, the inner diameters of the two springs 14 are smaller than the diameters of the probes 13, the probes 13 and the springs 14 are pushed by the two clamping plates 12, the two clamping plates 7 are fixedly mounted at the inner sides of the two push rods 7, the two electric pressure sensors 15 are fixedly mounted at the two electric pressure sensors and are respectively and are in parallel to the same electric pressure sensor 15, and are connected with the push rod 15, and are in turn-off mode of the two push rod 6, and are connected with the electric pressure sensor 15.
The working principle of the embodiment is as follows:
when the integrated circuit board is used, firstly, the integrated circuit board is placed between the two clamping plates 12, then the electric push rods 6 arranged in the two side walls of the support frame 2 are unfolded to respectively push the pushing frame 7 and the pushing plates 8 to be close to each other, at the moment, the two pushing plates 8 drive the two clamping plates 12 to squeeze the two sides of the integrated circuit board, at the moment, the two clamping plates 12 are contacted with the integrated circuit board to form reverse thrust, and then the springs 14 arranged on the outer sides of the two clamping plates 12 are retracted, so that the probes 13 arranged on the outer sides of the two clamping plates 12 extend into the pushing frame 7, then the two probes 13 are respectively contacted with the two pressure sensors 15 and squeeze the pushing frames, at the moment, the two pressure sensors 15 sense pressure to control the two electric push rods 6 to be closed, and then the electric push rods 6 are prevented from forcefully clamping the circuit board to be damaged, the circuit board is also fixed between the two clamping plates 12, then the detection head assembly 3 arranged on the top of the support frame 2 is lowered to detect the circuit board, and after detection is completed, the two electric push rods 6 are controlled to respectively drive the pushing frame 7 and the pushing plates 8 to retract to enable the two clamping plates 12 to be contacted with the circuit board to be separated from the circuit board.
The control mode of the utility model is controlled by the controller, the control circuit of the controller can be realized by simple programming by a person skilled in the art, the supply of power also belongs to common knowledge in the art, and the utility model is mainly used for protecting the mechanical device, so the utility model does not explain the control mode and circuit connection in detail.
It is noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.
Claims (6)
1. An integrated circuit testing mechanism comprising a base (1), characterized in that: the top of the base (1) is fixedly provided with a supporting frame (2), and the top of the base (1) is provided with an integrated circuit testing mechanism;
the integrated circuit testing mechanism comprises a detection head assembly (3) fixedly mounted at the top of a support frame (2), a bottom block (4) is fixedly mounted at the top of a base (1), sliding rails (5) are fixedly mounted at the top of the bottom block (4), electric push rods (6) penetrating through the inside of the support frame (2) are fixedly mounted at the left side and the right side of the support frame (2), push frames (7) are fixedly mounted at the inner sides of the electric push rods (6), push plates (8) are fixedly mounted at the inner sides of the push frames (7), hook plates (9) with the number of two are fixedly mounted at the bottom of the push plates (8), sliding grooves (10) are formed in the inner side of the lower bottom wall of the push plates (8), sliding blocks (11) are slidably mounted in the inner sides of the sliding grooves (10), clamping plates (12) are fixedly mounted at the top of the sliding blocks (11), probes (13) penetrating through the inner sides of the push frames (7) are fixedly mounted at the outer sides of the clamping plates (12), and the two probes (13) are fixedly mounted at the outer sides of the two clamping plates (12) are fixedly mounted at the outer sides of the two clamping plates (14).
2. An integrated circuit testing mechanism according to claim 1, wherein: the bottom area of base (1) is greater than the top area of support frame (2), detect head subassembly (3) and run through to the inside of support frame (2), bottom piece (4) and slide rail (5) all are located the bottom that detects head subassembly (3).
3. An integrated circuit testing mechanism according to claim 1, wherein: the unfolding directions of the two electric push rods (6) face the inside of the supporting frame (2), the outsides of the two pushing frames (7) are of a -shaped structure, and the outsides of the two pushing plates (8) are of an L-shaped structure.
4. An integrated circuit testing mechanism according to claim 1, wherein: the four hook plates (9) are respectively clamped at the front end and the rear end of the sliding rail (5), the four hook plates (9) are in sliding connection with the sliding rail (5), and the two sliding blocks (11) respectively slide left and right in the two sliding grooves (10).
5. An integrated circuit testing mechanism according to claim 1, wherein: the outside of two splint (12) is "" shape structure, two probe (13) are sliding connection with push pedal (8), the outside of two spring (14) all is fixed connection with push pedal (8).
6. An integrated circuit testing mechanism according to claim 1, wherein: the inner diameters of the two springs (14) are smaller than the diameter of the probe (13), the two pressure sensors (15) and the probe (13) are located on the same horizontal line, and the two pressure sensors (15) are respectively electrically connected with the two electric push rods (6).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320847634.5U CN219676076U (en) | 2023-04-17 | 2023-04-17 | Integrated circuit testing mechanism |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320847634.5U CN219676076U (en) | 2023-04-17 | 2023-04-17 | Integrated circuit testing mechanism |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219676076U true CN219676076U (en) | 2023-09-12 |
Family
ID=87924221
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320847634.5U Active CN219676076U (en) | 2023-04-17 | 2023-04-17 | Integrated circuit testing mechanism |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219676076U (en) |
-
2023
- 2023-04-17 CN CN202320847634.5U patent/CN219676076U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN212721385U (en) | Flat glass flatness detection device | |
| CN219676076U (en) | Integrated circuit testing mechanism | |
| CN206184496U (en) | Test special detachable test -tube rack | |
| CN209656007U (en) | A kind of dimension automatic detection device | |
| CN214107031U (en) | Chemical reagent detects uses workstation | |
| CN212159862U (en) | Tool is used in integrated circuit's inspection | |
| CN219799558U (en) | Aging detection equipment for silicon carbide semiconductor chip | |
| CN115951095B (en) | Integrated circuit test fixture with position correction function | |
| CN112881898A (en) | High-temperature aging test device for integrated circuit | |
| CN220357123U (en) | Quick detection device of PLC module wiring | |
| CN217358477U (en) | Glass original sheet levelness detection device in toughened glass processing | |
| CN219495953U (en) | PTFE film tensile strength and extensibility testing arrangement | |
| CN219657680U (en) | Novel electric capacity detects clamping device | |
| CN218765698U (en) | Temperature-detecting device for capacitor machining | |
| CN218937352U (en) | Detection device for detecting thickness of semiconductor | |
| CN215575485U (en) | LDMOS transistor performance detection device | |
| CN219533322U (en) | Graphene electrothermal packaging chip performance detection | |
| CN213069085U (en) | Integrated circuit testing device | |
| CN218512574U (en) | Test detection table with chip protection overturning function | |
| CN219178865U (en) | Impact resistance testing mechanism for knee pad and elbow pad | |
| CN210893593U (en) | Shock absorber performance detection table | |
| CN221148848U (en) | Quick chip test realizing device | |
| CN217058784U (en) | Glass wafer flatness detection device | |
| CN219179074U (en) | Desktop panel compressive property detection device convenient to fix | |
| CN219957325U (en) | Visual inspection auxiliary device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |