CN219657789U - IO module testing mechanism - Google Patents
IO module testing mechanism Download PDFInfo
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- CN219657789U CN219657789U CN202320988287.8U CN202320988287U CN219657789U CN 219657789 U CN219657789 U CN 219657789U CN 202320988287 U CN202320988287 U CN 202320988287U CN 219657789 U CN219657789 U CN 219657789U
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- 238000012360 testing method Methods 0.000 title claims abstract description 65
- 230000007246 mechanism Effects 0.000 title claims abstract description 26
- 239000000523 sample Substances 0.000 claims description 51
- 238000010586 diagram Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
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- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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Abstract
The utility model belongs to the technical field of IO modules, and particularly relates to an IO module testing mechanism. The device comprises a working bottom plate, a guide rail sliding block assembly, an IO module positioning bottom plate, a power-on assembly, a testing assembly and a lifting assembly, wherein the guide rail sliding block assembly and the lifting assembly are arranged on the working bottom plate, and the IO module positioning bottom plate is arranged on the guide rail sliding block assembly and used for positioning an IO module; the power-on assembly is arranged at one end of the IO module positioning bottom plate and is used for powering on the IO module; the test assembly is arranged on the lifting assembly and used for testing the IO module. The utility model has simple structure and wide application range, can realize the requirements of testing IO modules with different numbers by using one set of mechanism, and greatly improves the working efficiency.
Description
Technical Field
The utility model belongs to the technical field of IO modules, and particularly relates to an IO module testing mechanism.
Background
The IO module is an industrial-grade remote acquisition and control module, and the module provides the functions of switching value input acquisition, relay output, high-frequency counter and the like of the passive node. In recent years, with the recent and new development of technology, the demands for PLC products are increasing, and the workload of IO module testing is also increasing. The IO module testing mechanisms with different numbers are various, have no universality, and the frequent replacement of the testing mechanisms makes the testing work of the IO modules complicated and low in efficiency.
Disclosure of Invention
Aiming at the problems, the utility model aims to provide an IO module testing mechanism which aims to solve the problems of single function, complex testing work and low testing efficiency of the traditional IO module testing mechanism.
In order to achieve the above purpose, the present utility model adopts the following technical scheme:
the utility model provides an IO module testing mechanism which comprises a working bottom plate, a guide rail sliding block assembly, an IO module positioning bottom plate, a power-on assembly, a testing assembly and a lifting assembly, wherein the guide rail sliding block assembly and the lifting assembly are arranged on the working bottom plate, and the IO module positioning bottom plate is arranged on the guide rail sliding block assembly and used for positioning an IO module; the power-on assembly is arranged at one end of the IO module positioning bottom plate and is used for powering on the IO module; the test assembly is arranged on the lifting assembly and used for testing the IO module.
The lifting assembly comprises a main supporting plate, a guide rod and a quick clamp, wherein the lower end of the main supporting plate is fixedly connected with the working bottom plate, the quick clamp is arranged on the upper part of the main supporting plate and is connected with the testing assembly, and the testing assembly is driven to move up and down through the quick clamp; the lower end of the guide rod is connected with the working bottom plate, the upper end of the guide rod is connected with the main support plate, and the test assembly is in sliding connection with the guide rod.
The quick clamp comprises an operating handle, a quick clamp fixing plate, a movable connecting piece, a quick clamp guide column and a quick clamp connecting plate, wherein the quick clamp fixing plate is connected with the main support plate, the upper end of the quick clamp fixing plate is provided with a hinge seat, and the lower end of the quick clamp fixing plate is provided with a shaft sleeve; the operation handle is hinged with the hinging seat, the quick clamp guide post is in sliding fit with the shaft sleeve, the movable connecting piece is connected between the operation handle and the quick clamp guide post, and the lower end of the quick clamp guide post is connected with the testing component through the quick clamp connecting plate.
The test assembly comprises a plurality of rows of probe plates, a probe plate fixing plate and probes I, wherein the plurality of rows of probes I are distributed on the plurality of rows of probe plates, the plurality of rows of probe plates are connected with the probe plate fixing plate, and the probe plate fixing plate is provided with bearings for being connected with the guide rods; the probe card fixing plate is connected with the quick clamp.
Side support plates are arranged on two sides of the back surface of the main support plate, and the lower ends of the side support plates are connected with the working bottom plate.
The power-on assembly comprises an upright post, a single-row probe plate and a probe II, wherein two ends of the single-row probe plate are respectively connected with the IO module positioning bottom plate through two upright posts, and the single-row probe plate is provided with the single-row probe II.
And one end of the IO module positioning bottom plate, which is provided with the power-on assembly, is provided with a clamping rail, and the clamping rail is used for positioning the IO module.
The guide rail sliding block assembly comprises a sliding rail and a sliding block, wherein the sliding rail is arranged on the working bottom plate, the sliding block is in sliding fit with the sliding rail, and the bottom of the IO module positioning bottom plate is connected with the sliding block.
The utility model has the advantages and beneficial effects that: the IO module testing mechanism provided by the utility model has the advantages that the structure is simple, the universality is strong, the requirements of testing different numbers of IO modules can be met by using one set of mechanism, the application range is wide, and the working efficiency is greatly improved.
Drawings
FIG. 1 is an isometric view of an IO module testing mechanism of the present utility model;
FIG. 2 is an enlarged view of a portion of an IO module tester according to the present utility model;
FIG. 3 is a schematic view of the structure of the quick clamp according to the present utility model;
FIG. 4 is a schematic diagram of a power-on module according to the present utility model;
FIG. 5 is a schematic view of the connection of the main support plate, side support plates and work floor of the present utility model;
fig. 6 is a schematic diagram of an operation state of an IO module testing mechanism according to the present utility model.
In the figure: 1 is a working bottom plate, 2 is a guide rail sliding block assembly, 201 is a sliding rail, 202 is a sliding block, 3 is an IO module positioning bottom plate, 4 is a stand column, 5 is a single-row probe card, 6 is a main supporting plate, 7 is a side supporting plate, 8 is a multi-row probe card, 9 is a probe card fixing plate, 10 is a guide rod, 11 is a guide rod upper connecting plate, 12 is a bearing, 13 is a quick clamp, 1301 is an operating handle, 1302 is a quick clamp fixing plate, 1303 is a movable connecting piece, 1304 is a quick clamp guide post, 1305 is a quick clamp connecting plate, 14 is a clamping rail, 15 is a probe I, and 16 is a probe II.
Detailed Description
In order to make the objects, technical solutions and advantages of the present utility model more apparent, the present utility model will be described in detail with reference to the accompanying drawings and specific embodiments.
Referring to fig. 1-2, the utility model provides an IO module testing mechanism, which comprises a working bottom plate 1, a guide rail sliding block assembly 2, an IO module positioning bottom plate 3, a power-on assembly, a testing assembly and a lifting assembly, wherein the guide rail sliding block assembly 2 and the lifting assembly are both arranged on the working bottom plate 1, and the IO module positioning bottom plate 3 is arranged on the guide rail sliding block assembly 2 and is used for positioning an IO module; the power-on component is arranged at one end of the IO module positioning bottom plate 3 and is used for powering on the IO module; the test assembly is arranged on the lifting assembly and used for testing the IO module.
Referring to fig. 2, in the embodiment of the present utility model, the lifting assembly includes a main support plate 6, a guide rod 10, and a quick clamp 13, wherein the lower end of the main support plate 6 is fixedly connected with the work bottom plate 1, the quick clamp 13 is disposed on the upper portion of the main support plate 6 and connected with the test assembly, and the test assembly is driven to move up and down by the quick clamp 13; the lower end of the guide rod 10 is connected with the working bottom plate 1, the upper end is connected with the main support plate 6 through the guide rod upper connecting plate 11, and the test assembly is in sliding connection with the guide rod 10.
Further, as shown in fig. 5, both sides of the back surface of the main support plate 6 are provided with side support plates 7, and the lower ends of the side support plates 7 are fixedly connected with the work floor 1. Specifically, the main support plate 6 and the side support plates 7 are provided at the rear of the work floor 1, and the slider guide assembly 2 is provided at the middle front of the work floor 1, improving the strength and stability of the main support plate 6 by providing the side support plates 7.
Referring to fig. 3, in the embodiment of the present utility model, the quick clamp 13 includes an operation handle 1301, a quick clamp fixing plate 1302, a movable connector 1303, a quick clamp guide post 1304, and a quick clamp connecting plate 1305, where the quick clamp fixing plate 1302 is fixedly connected with the main supporting plate 6, a hinge seat is disposed at an upper end of the quick clamp fixing plate 1302, and a shaft sleeve is disposed at a lower end of the quick clamp fixing plate 1302; the end of the operating handle 1301 is hinged with a hinging seat, the quick clamp guide column 1304 is inserted in the shaft sleeve and is in sliding fit with the shaft sleeve, the upper end of the movable connecting piece 1303 is hinged with the position of the operating handle 1301 close to the end, the lower end of the movable connecting piece 1303 is hinged with the upper end of the quick clamp guide column 1304, and the lower end of the quick clamp guide column 1304 is connected with a testing component through a quick clamp connecting plate 1305. When the quick clamp device works, the operating handle 1301 is manipulated to swing up and down, and the quick clamp guide column 1304 and the test assembly are driven to move up and down through the movable connecting piece 1303.
Referring to fig. 3, in the embodiment of the present utility model, the test assembly includes a plurality of rows of probe boards 8, a probe board fixing board 9 and probes i 15, wherein a plurality of rows of probes i 15 are arranged on the plurality of rows of probe boards 8, the plurality of rows of probe boards 8 are connected with the probe board fixing board 9, and bearings 12 for connecting with guide rods 10 are arranged on the probe board fixing board 9; the probe card fixing plate 9 is connected with the quick jig guide posts 1304 of the quick jig 13.
Referring to fig. 4, in the embodiment of the present utility model, the power-on assembly includes a column 4, a single-row probe card 5 and a probe ii 16, wherein two ends of the single-row probe card 5 are fixedly connected with the IO module positioning base plate 3 through two columns 4, and a row of probes ii 16 is disposed on the single-row probe card 5.
Further, the end of the IO module positioning bottom plate 3 provided with the power-on assembly is further provided with a clamping rail 14, and the clamping rail 14 is used for positioning the IO module.
Referring to fig. 4, in the embodiment of the present utility model, the rail-slider assembly 2 includes a sliding rail 201 and a sliding block 202, wherein the sliding rail 201 is disposed on the working base plate 1, the sliding block 202 is in sliding fit with the sliding rail 201, the bottom of the IO module positioning base plate 3 is in threaded connection with the sliding block 202, and the IO module positioning base plate 3 is in sliding connection with the sliding rail 201 through the sliding block 202.
Referring to fig. 6, the working principle of the IO module testing mechanism provided by the present utility model is:
the operation handle 1301 is manipulated to swing up and down, the up and down swing of the operation handle 1301 can be converted into up and down reciprocating motion of the rapid fixture guide column 1304 through the movable connecting piece 1303, and then the rapid fixture connecting plate 1305 drives the multiple rows of probes I15 to move up and down, so that the multiple rows of probes I15 are inserted into corresponding test modules, and the fixing function is achieved.
IO module test principle: firstly, a single-row probe II 16 is inserted into a power module and fixed, so that the power-on function of the whole IO module is realized. Then, the multiple rows of probes I15 are inserted into the IO module to be tested through the quick clamp 13 and fixed, so that whether the tested IO module is electrified or not and whether signals are output or not are tested. If the IO module is tested to be qualified, the quick clamp 13 is lifted, and the next group of IO modules is tested until all IO modules are tested. If the IO module test is not passed, the tested IO module is required to be taken out for corresponding problem investigation. In this embodiment, 32 IO modules may be tested continuously.
The utility model realizes the test work of the IO module by utilizing the sliding block guide assembly, the IO module fixing bottom plate and the quick clamp, has simple structure, firm and accurate test, and can adapt to the test work of a larger number of IO modules by adjusting the sliding block guide assembly and the IO module fixing bottom plate. The utility model utilizes one set of mechanism to realize the requirements of testing IO modules with different numbers, solves the problem that the testing mechanism needs to be replaced frequently in the testing of IO modules with different numbers, and has high working efficiency and wide application range.
The foregoing is merely an embodiment of the present utility model and is not intended to limit the scope of the present utility model. Any modification, equivalent replacement, improvement, expansion, etc. made within the spirit and principle of the present utility model are included in the protection scope of the present utility model.
Claims (8)
1. The IO module testing mechanism is characterized by comprising a working bottom plate (1), a guide rail sliding block assembly (2), an IO module positioning bottom plate (3), a power-on assembly, a testing assembly and a lifting assembly, wherein the guide rail sliding block assembly (2) and the lifting assembly are arranged on the working bottom plate (1), and the IO module positioning bottom plate (3) is arranged on the guide rail sliding block assembly (2) and used for positioning an IO module; the power-on assembly is arranged at one end of the IO module positioning bottom plate (3) and is used for powering on the IO module; the test assembly is arranged on the lifting assembly and used for testing the IO module.
2. The IO module testing mechanism according to claim 1, wherein the lifting assembly comprises a main support plate (6), a guide rod (10) and a quick clamp (13), wherein the lower end of the main support plate (6) is fixedly connected with the working bottom plate (1), the quick clamp (13) is arranged at the upper part of the main support plate (6) and is connected with the testing assembly, and the testing assembly is driven to move up and down through the quick clamp (13); the lower end of the guide rod (10) is connected with the working bottom plate (1), the upper end of the guide rod is connected with the main support plate (6), and the test assembly is in sliding connection with the guide rod (10).
3. The IO module testing mechanism of claim 2, wherein the quick clamp (13) comprises an operation handle (1301), a quick clamp fixing plate (1302), a movable connecting piece (1303), a quick clamp guide post (1304) and a quick clamp connecting plate (1305), wherein the quick clamp fixing plate (1302) is connected with the main support plate (6), a hinge seat is arranged at the upper end of the quick clamp fixing plate (1302), and a shaft sleeve is arranged at the lower end of the quick clamp fixing plate; the operation handle (1301) is hinged with the hinging seat, the quick clamp guide column (1304) is in sliding fit with the shaft sleeve, the movable connecting piece (1303) is connected between the operation handle (1301) and the quick clamp guide column (1304), and the lower end of the quick clamp guide column (1304) is connected with the testing component through the quick clamp connecting plate (1305).
4. The IO module testing mechanism according to claim 2, wherein the testing assembly comprises a plurality of rows of probe boards (8), a probe board fixing plate (9) and probes i (15), wherein a plurality of rows of probes i (15) are arranged on the plurality of rows of probe boards (8), the plurality of rows of probe boards (8) are connected with the probe board fixing plate (9), and bearings (12) for connecting with the guide rods (10) are arranged on the probe board fixing plate (9); the probe card fixing plate (9) is connected with the quick clamp (13).
5. IO module testing mechanism according to claim 2, characterized in that the back sides of the main support plate (6) are provided with side support plates (7), the lower ends of the side support plates (7) being connected with the working bottom plate (1).
6. The IO module testing mechanism according to claim 1, wherein the power-on assembly comprises an upright post (4), a single-row probe card (5) and probes ii (16), wherein two ends of the single-row probe card (5) are respectively connected with the IO module positioning base plate (3) through two upright posts (4), and a row of probes ii (16) are arranged on the single-row probe card (5).
7. The IO module testing mechanism according to claim 1, wherein a clamping rail (14) is arranged at one end of the IO module positioning bottom plate (3) provided with the power-on assembly, and the clamping rail (14) is used for positioning the IO module.
8. The IO module testing mechanism of claim 1, wherein the rail-slider assembly (2) comprises a sliding rail (201) and a slider (202), wherein the sliding rail (201) is disposed on the working base plate (1), the slider (202) is in sliding fit with the sliding rail (201), and the bottom of the IO module positioning base plate (3) is connected with the slider (202).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320988287.8U CN219657789U (en) | 2023-04-27 | 2023-04-27 | IO module testing mechanism |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320988287.8U CN219657789U (en) | 2023-04-27 | 2023-04-27 | IO module testing mechanism |
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| Publication Number | Publication Date |
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| CN219657789U true CN219657789U (en) | 2023-09-08 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202320988287.8U Active CN219657789U (en) | 2023-04-27 | 2023-04-27 | IO module testing mechanism |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117215253A (en) * | 2023-11-08 | 2023-12-12 | 南京德克威尔自动化有限公司 | IO module debugging method based on configuration software |
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2023
- 2023-04-27 CN CN202320988287.8U patent/CN219657789U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117215253A (en) * | 2023-11-08 | 2023-12-12 | 南京德克威尔自动化有限公司 | IO module debugging method based on configuration software |
| CN117215253B (en) * | 2023-11-08 | 2024-01-30 | 南京德克威尔自动化有限公司 | IO module debugging method based on configuration software |
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