CN219641868U - Chip testing device - Google Patents
Chip testing device Download PDFInfo
- Publication number
- CN219641868U CN219641868U CN202223151131.9U CN202223151131U CN219641868U CN 219641868 U CN219641868 U CN 219641868U CN 202223151131 U CN202223151131 U CN 202223151131U CN 219641868 U CN219641868 U CN 219641868U
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- Prior art keywords
- chip
- testing device
- chip testing
- groove
- ash
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000003825 pressing Methods 0.000 claims abstract description 15
- 230000002265 prevention Effects 0.000 claims abstract description 11
- 230000003405 preventing effect Effects 0.000 claims description 14
- 230000001681 protective effect Effects 0.000 claims description 6
- 230000003139 buffering effect Effects 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 5
- 238000003466 welding Methods 0.000 claims description 5
- 230000003014 reinforcing effect Effects 0.000 claims description 4
- 238000001514 detection method Methods 0.000 description 17
- 239000000428 dust Substances 0.000 description 8
- 238000010586 diagram Methods 0.000 description 5
- 230000008901 benefit Effects 0.000 description 3
- 230000008094 contradictory effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Abstract
The utility model discloses a chip testing device which comprises a chip testing device main body and a bottom plate, wherein the chip testing device main body is bolted to the top of the bottom plate, a chip table is arranged on the front side of the top of the chip testing device main body, a buffer pressing mechanism is arranged on the front side of the top of the chip table, an ash prevention moving mechanism is arranged on the rear side of the top of the chip table, and when a chip is detected, the chip testing device main body is communicated with the bottom plate and is placed at a horizontal position through a detector, then the detector moves the ash prevention moving mechanism on the top of the chip table to a position which does not prevent the chip from being placed at the position for detecting the chip, and when the chip is placed at the position for detecting the chip, the detector needs to manually press and move the angle and the position of the chip.
Description
Technical Field
The present disclosure relates to chip testing devices, and particularly to a chip testing device.
Background
The chip detector is a tool for detecting the chip, the type of the detected chip is input through a keyboard, then a determination key is pressed, the system can detect the chip, and the chip detector is special instrument equipment for testing the chip and is one of key means for guaranteeing the performance and quality of a chip circuit.
The chip groove that is used for placing the chip on current chip detector chip bench, when the inspector places the chip, because of placing needs adjustment position, needs manual press to remove, places the chip groove of chip and does not have the buffering, causes the damage to the chip easily, and is used for shelving the chip groove of chip and deposits easily, and the dust also can cause damaging the chip or cause the error to the experimental result when inspector detects the chip to staff's operation has been hindered.
Disclosure of Invention
The main objective of the present utility model is to provide a chip testing device, which aims to solve the above technical problems.
In order to achieve the above purpose, the chip testing device provided by the utility model comprises a chip testing device main body and a bottom plate, wherein the chip testing device main body is bolted to the top of the bottom plate, a chip table is arranged on the front side of the top of the chip testing device main body, a buffer pressing mechanism is arranged on the front side of the top of the chip table, and an ash preventing moving mechanism is arranged on the rear side of the top of the chip table;
the buffering is supported and is pressed mechanism includes kerve, movable groove, two fixed blocks, supports clamp plate, buffer spring, places board and chip storage tank, the front side at chip bench top is offered to the kerve, the both sides at the kerve are offered to the movable groove, fixed block sliding connection is at the inner wall of movable groove, movable groove and fixed block cooperation are used, support the clamp plate welding between two opposite one sides of fixed block, buffer spring welding is in the bottom of supporting the clamp plate, buffer spring quantity is four, buffer spring's bottom and the bottom contact of movable groove, place the board bolt at the top of supporting the clamp plate, the top at placing the board is offered to the chip storage tank.
In an embodiment, prevent grey moving mechanism includes T type movable tank, T type movable block, prevents grey movable shell, first fixed slot, second fixed slot and elasticity stopper, the both sides at the chip bench top are seted up to T type movable tank, T type movable block sliding connection is at the inner wall of T type movable tank, prevent grey movable shell welding at the top of T type movable block, the left side at the chip bench top is seted up to first fixed slot, the left side at the chip bench top is seted up to the second fixed slot, elasticity stopper bolt is at preventing grey movable shell left front side inner wall, the one end card of preventing grey movable shell is established in the inside of first fixed slot is kept away from to elasticity stopper.
In an embodiment, the top card of bottom plate is equipped with outer body protecting crust, the inside of outer body protecting crust is the cavity, the bolt of the top of outer body protecting crust has the lifting handle.
In an embodiment, the bottom of the bottom plate is welded with four supporting legs, and the bottom of each supporting leg is adhered with a reinforcing sucker.
In one embodiment, the four corners of the main body of the chip testing device are adhered with protective sleeves, and the protective sleeves are made of rubber materials.
In an embodiment, a limiting plate is bolted to the top of the inside of the movable groove, and the bottom of the limiting plate is in contact with the top of the fixed block.
In an embodiment, the top of the ash-proof movable shell is bolted with a push-pull handle, and the outer side of the push-pull handle is provided with anti-skid grains.
In an embodiment, an extension lifting rod is welded on the left side of the elastic limiting block, and a rubber sleeve is sleeved on the outer side of the extension lifting rod.
According to the technical scheme, when the chip is detected, the chip testing device body is communicated with the bottom plate through the detection personnel and is placed at the horizontal position, then the detection personnel moves the ash prevention moving mechanism at the top of the chip table to a position which does not prevent the chip from being placed at the detection chip, when the chip is placed at the position of the detection chip, the detection personnel needs to manually press and move the angle and the position of the chip, the buffer pressing mechanism in the chip table can effectively buffer the chip when the detection personnel presses the chip to adjust the position, damage to the chip is avoided, stability of subsequent detection is improved, when the chip is taken out after detection is completed, the buffer pressing mechanism is used for buffering the chip again, and then the ash prevention moving mechanism at the top of the chip table is moved back to the position where the chip is placed for ash prevention, so that dust is not prevented at the place where the chip is detected, the dust is prevented from damaging during detection, accuracy of a chip and efficiency of an experiment result is improved, and the efficiency of the working personnel is improved.
Drawings
In order to more clearly illustrate the embodiments of the present utility model or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, and it is obvious that the drawings in the following description are only some embodiments of the present utility model, and other drawings may be obtained according to the structures shown in these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a structure in an embodiment of the present utility model;
FIG. 2 is a schematic diagram of the structure of an embodiment of the present utility model;
FIG. 3 is a schematic diagram of the structure of an embodiment of the present utility model;
FIG. 4 is a schematic diagram of the structure of an embodiment of the present utility model;
fig. 5 is a schematic structural diagram of an embodiment of the present utility model.
Reference numerals illustrate: 1. a chip testing device main body; 2. a bottom plate; 3. a chip stage; 4. a buffer pressing mechanism; 401. a bottom groove; 402. a movable groove; 403. a fixed block; 404. a pressing plate; 405. a buffer spring; 406. placing a plate; 407. a chip storage tank; 5. an ash prevention moving mechanism; 501. a T-shaped moving groove; 502. a T-shaped moving block; 503. an ash-proof movable shell; 504. a first fixing groove; 505. a second fixing groove; 506. an elastic limiting block; 6. an outer body protective shell; 7. a lifting handle; 8. a support leg; 9. reinforcing a sucker; 10. a protective sleeve; 11. a limiting plate; 12. push-pull handle; 13. lengthening the lifting rod.
The achievement of the objects, functional features and advantages of the present utility model will be further described with reference to the accompanying drawings, in conjunction with the embodiments.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the utility model. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
It should be noted that all directional indicators (such as up, down, left, right, front, and rear … …) in the embodiments of the present utility model are merely used to explain the relative positional relationship, movement, etc. between the components in a particular posture (as shown in the drawings), and if the particular posture is changed, the directional indicator is changed accordingly.
Furthermore, descriptions such as those referred to as "first," "second," and the like, are provided for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implying an order of magnitude of the indicated technical features in the present disclosure. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present utility model, the meaning of "plurality" means at least two, for example, two, three, etc., unless specifically defined otherwise.
Moreover, the technical solutions of the embodiments of the present utility model may be combined with each other, but it is necessary to be based on the fact that those skilled in the art can implement the technical solutions, and when the technical solutions are contradictory or cannot be implemented, it should be considered that the combination of the technical solutions does not exist, and is not within the scope of protection claimed by the present utility model.
The utility model provides a chip testing device.
As shown in fig. 1-5, the chip testing device provided by the embodiment of the utility model comprises a chip testing device main body 1 and a bottom plate 2, wherein the chip testing device main body 1 is bolted on the top of the bottom plate 2, a chip table 3 is arranged on the front side of the top of the chip testing device main body 1, a buffer pressing mechanism 4 is arranged on the front side of the top of the chip table 3, and an ash preventing moving mechanism 5 is arranged on the rear side of the top of the chip table 3;
the buffering pressing mechanism 4 comprises a bottom groove 401, a movable groove 402, two fixed blocks 403, pressing plates 404, buffer springs 405, a placing plate 406 and a chip storage groove 407, wherein the bottom groove 401 is formed in the front side of the top of the chip table 3, the movable groove 402 is formed in two sides of the bottom groove 401, the fixed blocks 403 are slidably connected to the inner walls of the movable groove 402, the movable groove 402 and the fixed blocks 403 are matched for use, the pressing plates 404 are welded between the opposite sides of the two fixed blocks 403, the buffer springs 405 are welded at the bottoms of the pressing plates 404, the number of the buffer springs 405 is four, the bottoms of the buffer springs 405 are in contact with the bottoms of the movable groove 402, the placing plate 406 is bolted to the top of the pressing plates 404, and the chip storage groove 407 is formed in the top of the placing plate 406
According to the technical scheme, the chip testing device main body 1, the bottom plate 2, the chip table 3, the buffer pressing mechanism 4 and the ash preventing moving mechanism 5 are arranged, when chips are detected, the chip testing device main body 1 is communicated with the bottom plate 2 and is placed at a horizontal position through detection personnel, then the ash preventing moving mechanism 5 at the top of the chip table 3 is moved to a position which does not prevent the chips from being placed in the chip storage groove 407 by the detection personnel, then the chips are placed in the chip storage groove 407 at the top of the placing plate 406, the detection personnel need to manually press and move the angles and the positions of the chips, the pressing plate 404 at the bottom of the placing plate 406 can perform certain buffer in the bottom groove 401 at the top of the chip table 3 by utilizing the buffer spring 405, then the fixed block 403 slides in the movable groove 402, limiting is performed to prevent random shaking, the chips are effectively buffered when the chips are pressed in the chip storage groove 407 by the detection personnel, the subsequent detection stability is avoided, the chips are taken out after the detection is completed, then the ash preventing moving mechanism 5 at the top of the chip table 3 is blocked by the chip storage groove 407, dust preventing effect is further avoided, and dust is further avoided when dust is detected, and dust is prevented from being damaged by the detection personnel.
Referring to fig. 4, the ash preventing moving mechanism 5 includes a T-shaped moving slot 501, a T-shaped moving block 502, an ash preventing moving shell 503, a first fixing slot 504, a second fixing slot 505 and an elastic limiting block 506, wherein the T-shaped moving slot 501 is formed on two sides of the top of the die table 3, the T-shaped moving block 502 is slidably connected to an inner wall of the T-shaped moving slot 501, the ash preventing moving shell 503 is welded on the top of the T-shaped moving block 502, the first fixing slot 504 is formed on the left side of the top of the die table 3, the second fixing slot 505 is formed on the left side of the top of the die table 3, the elastic limiting block 506 is bolted on the front inner wall of the left side of the ash preventing moving shell 503, and one end of the elastic limiting block 506, which is far away from the ash preventing moving shell 503, is clamped inside the first fixing slot 504. In this embodiment, through setting up the anti-ash moving mechanism 5, chip storage slot 407 of the chip is shelved at chip bench 3 top is prevented ash, when not detecting the chip, with the manual inside that breaks away from first fixed slot 504 of elasticity stopper 506, it moves in the inside of the T type movable slot 501 at chip bench 3 top to drive anti-ash movable shell 503 through T type movable block 502, stop moving when reaching the top of chip storage slot 407, push into the inside of second fixed slot 505 with elasticity stopper 506 and can accomplish the anti-ash processing to chip storage slot 407, when needing to detect the chip, break away from second fixed slot 505 again with elasticity stopper 506, move in the inside of the T type movable slot 501 at chip bench 3 top through T type movable block 502 drive anti-ash movable shell 503 again, push into first fixed slot 504 with elasticity stopper 506 can, effectually avoid because of the influence of dust to the chip that detects, promote the practicality.
Further, referring to fig. 1, an outer body protecting shell 6 is clamped at the top of the bottom plate 2, a cavity is formed in the outer body protecting shell 6, and a lifting handle 7 is bolted to the top of the outer body protecting shell 6. In this embodiment, through setting up outer body protecting crust 6 and carrying handle 7, when not using chip testing device main part 1, outer body protecting crust 6 cover is established in the outside of chip testing device main part 1, protects chip testing device main part 1, carries handle 7 and further makes things convenient for the inspector to put to carry of outer body protecting crust 6, promotes the practicality.
With continued reference to fig. 2, the bottom of the base plate 2 is welded with four legs 8, and the bottom of the legs 8 is bonded with a reinforcing suction cup 9. In this embodiment, through setting up landing leg 8 and consolidate sucking disc 9, support bottom plate 2 through four landing legs 8, do benefit to holistic stability, add the consolidate sucking disc 9 of landing leg 8 bottom again, fix in the use, do benefit to the use of inspector.
Referring to fig. 2, a protection sleeve 10 is bonded to four corners of a main body 1 of the chip testing apparatus, and the protection sleeve 10 is made of rubber material. In this embodiment, through setting up lag 10, when chip testing device main part 1 receives the collision in the testing process, the striking point can protect chip testing device main part 1 through lag 10, and further rubber material's rubber material has still avoided the careless collision of inspector, promotes the practicality.
Referring to fig. 3, a limiting plate 11 is bolted to the top of the inside of the movable slot 402, and the bottom of the limiting plate 11 contacts the top of the fixed block 403. In this embodiment, through setting up limiting plate 11, when fixed block 403 goes up and down vertically in movable groove 402 inside, can effectively avoid the popping up of fixed block 403 to carry out spacingly through limiting plate 11, promotes the practicality.
Referring to fig. 4, a push-pull handle 12 is bolted to the top of the ash-proof movable housing 503, and anti-slip lines are formed on the outer side of the push-pull handle 12. In this embodiment, by providing the push-pull handle 12, when the ash-proof moving shell 503 is used for moving, the detection personnel can push and pull more conveniently through the push-pull handle 12 at the top of the ash-proof moving shell, thereby increasing convenience.
In addition, referring to fig. 5, an elongated lifting rod 13 is welded on the left side of the elastic limiting block 506, and a rubber sleeve is sleeved on the outer side of the elongated lifting rod 13. In this embodiment, through setting up extension pull rod 13 for can be lighter when using elasticity stopper 506 to carry out vertical movement, extension pull rod 13 has also further promoted the convenience of inspector when using.
The foregoing description is only of the preferred embodiments of the present utility model and is not intended to limit the scope of the utility model, and all equivalent structural changes made by the specification and drawings of the present utility model or direct/indirect application in other related technical fields are included in the scope of the present utility model.
Claims (8)
1. The chip testing device is characterized by comprising a chip testing device main body (1) and a bottom plate (2), wherein the chip testing device main body (1) is bolted to the top of the bottom plate (2), a chip table (3) is arranged on the front side of the top of the chip testing device main body (1), a buffer pressing mechanism (4) is arranged on the front side of the top of the chip table (3), and an ash preventing moving mechanism (5) is arranged on the rear side of the top of the chip table (3);
the buffering is supported and is pressed mechanism (4) including kerve (401), movable groove (402), two fixed blocks (403), support clamp plate (404), buffer spring (405), place board (406) and chip storage tank (407), the front side at chip platform (3) top is seted up in kerve (401), the both sides at kerve (401) are seted up in movable groove (402), fixed block (403) sliding connection is in the inner wall of movable groove (402), movable groove (402) and fixed block (403) cooperation are used, support clamp plate (404) welding between the opposite one side of two fixed blocks (403), buffer spring (405) welding is in the bottom of support clamp plate (404), buffer spring (405) quantity is four, the bottom of buffer spring (405) is contacted with the bottom of movable groove (402), place the top at support clamp plate (404) is seted up at the top of placing board (406).
2. The chip testing device according to claim 1, wherein the ash prevention moving mechanism (5) comprises a T-shaped moving groove (501), a T-shaped moving block (502), an ash prevention moving shell (503), a first fixing groove (504), a second fixing groove (505) and an elastic limiting block (506), the T-shaped moving groove (501) is formed in two sides of the top of the chip table (3), the T-shaped moving block (502) is slidably connected to the inner wall of the T-shaped moving groove (501), the ash prevention moving shell (503) is welded to the top of the T-shaped moving block (502), the first fixing groove (504) is formed in the left side of the top of the chip table (3), the second fixing groove (505) is formed in the left side of the top of the chip table (3), the elastic limiting block (506) is bolted to the inner wall of the front side of the left side of the ash prevention moving shell (503), and one end of the elastic limiting block (506) far away from the ash prevention moving shell (503) is blocked inside the first fixing groove (504).
3. The chip testing device according to claim 1, wherein an outer body protecting shell (6) is clamped at the top of the bottom plate (2), the inner part of the outer body protecting shell (6) is a cavity, and a lifting handle (7) is bolted to the top of the outer body protecting shell (6).
4. The chip testing device according to claim 1, wherein the bottom of the bottom plate (2) is welded with four legs (8), and the bottom of the legs (8) is bonded with a reinforcing sucker (9).
5. The chip testing apparatus according to claim 1, wherein a protective cover (10) is bonded to four corners of the chip testing apparatus main body (1), and the protective cover (10) is made of a rubber material.
6. The chip testing apparatus according to claim 1, wherein a limiting plate (11) is bolted to the top of the inside of the movable slot (402), and the bottom of the limiting plate (11) is in contact with the top of the fixed block (403).
7. The chip testing device according to claim 2, wherein a push-pull handle (12) is bolted to the top of the ash-proof mobile casing (503), and anti-slip lines are provided on the outer side of the push-pull handle (12).
8. The chip testing device according to claim 2, wherein an elongated pull rod (13) is welded on the left side of the elastic limiting block (506), and a rubber sleeve is sleeved on the outer side of the elongated pull rod (13).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223151131.9U CN219641868U (en) | 2022-11-25 | 2022-11-25 | Chip testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223151131.9U CN219641868U (en) | 2022-11-25 | 2022-11-25 | Chip testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219641868U true CN219641868U (en) | 2023-09-05 |
Family
ID=87812373
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202223151131.9U Active CN219641868U (en) | 2022-11-25 | 2022-11-25 | Chip testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219641868U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117228268A (en) * | 2023-11-15 | 2023-12-15 | 深圳华太芯创有限公司 | Modularized storage structure for chip transfer and storage method thereof |
-
2022
- 2022-11-25 CN CN202223151131.9U patent/CN219641868U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117228268A (en) * | 2023-11-15 | 2023-12-15 | 深圳华太芯创有限公司 | Modularized storage structure for chip transfer and storage method thereof |
| CN117228268B (en) * | 2023-11-15 | 2024-01-26 | 深圳华太芯创有限公司 | Modularized storage structure for chip transfer and storage method thereof |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20240127 Address after: Room 201, No. 11, Lane 243, Jiugan Road, Sijing Town, Songjiang District, Shanghai, 201601 Patentee after: Shanghai Jingling Electronic Technology Co.,Ltd. Country or region after: China Address before: 201601 Room 408, Building 2, No. 18, Fangsi Road, Sijing Town, Songjiang District, Shanghai Patentee before: Shanghai Cloud Scale Data Technology Co.,Ltd. Country or region before: China |
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| TR01 | Transfer of patent right |