CN219590199U - Inspection device for lens transmittance - Google Patents

Abstract

The utility model discloses a device for inspecting the transmittance of a lens, which comprises: a scissor lift; the bottom plate is provided with a chip and is detachably arranged on the scissor lifting table; the probe platform is provided with a plurality of probes; the quick clamp is detachably arranged on the bottom plate, and the action of the quick clamp can drive the probe platform to move up and down; a base on which a power meter is arranged; the three-axis adjusting translation table is detachably provided with a lens support, and a plurality of groove positions are formed in the lens support. According to the utility model, the lens bracket is moved between the scissor type lifting platform and the base by adjusting the triaxial adjusting translation platform, the lens is placed in the groove, the same current is used for powering up, the reading b of the power meter at the same position is read, and the front value and the rear value are compared, so that the transmittance of the lens is obtained, and the device has a simple integral structure and is convenient to operate.

Description

Inspection device for lens transmittance

Technical Field

The utility model relates to the technical field of lens inspection, in particular to an inspection device for lens transmittance.

Background

In a conventional optical path, an optical lens is an indispensable component, and the transmittance of the optical lens is determined by the material of the lens itself and the surface coating film of the lens. Light will be reflected in small portions as it passes through the lens, forming stray light, resulting in reduced coupling power and spot quality of the final optical path. In summary, it is important to control the transmittance of the optical lens, and before coupling, the lens needs to detect whether the transmittance reaches the standard, so the platform needs to be designed for inspection.

Disclosure of Invention

The present utility model is directed to a device for inspecting transmittance of a lens, which solves the above-mentioned problems.

The technical scheme of the utility model is as follows: a device for inspecting lens transmittance, comprising:

a scissor lift;

the bottom plate is provided with a chip and is detachably arranged on the scissor lifting table;

the probe platform is provided with a plurality of probes;

the quick clamp is detachably arranged on the bottom plate, and the action of the quick clamp can drive the probe platform to move up and down;

a base on which a power meter is arranged;

the three-axis adjusting translation table is detachably provided with a lens support, and a plurality of groove positions are formed in the lens support.

Preferably, the scissor lifting platform comprises a screw rod, a pushing block, two working platforms and two supporting frames, wherein the screw rod is arranged on one of the working platforms, the two supporting frames are connected with each other in a rotating mode, and the pushing block is connected with the screw rod and one of the supporting frames.

Preferably, the bottom plate is provided with at least two guide pins.

Preferably, the device further comprises a backing plate, wherein the shear type lifting platform, the base and the triaxial adjustment translation platform are detachably arranged on the backing plate, and the position of the backing plate is adjustable.

The beneficial effects of the utility model are as follows: according to the utility model, the lens bracket is moved between the scissor type lifting platform and the base by adjusting the triaxial adjusting translation platform, the lens is placed in the groove, the same current is used for powering up, the reading b of the power meter at the same position is read, and the front value and the rear value are compared, so that the transmittance of the lens is obtained, and the device has a simple integral structure and is convenient to operate.

Drawings

FIG. 1 is a perspective view of the overall structure of a preferred embodiment of the present utility model;

FIG. 2 is an enlarged view of a portion of FIG. 1 at A;

FIG. 3 is a schematic view of a scissor lift in accordance with a preferred embodiment of the utility model;

FIG. 4 is a schematic illustration of the attachment of a tri-axial adjustment translation stage to a lens holder in accordance with a preferred embodiment of the present utility model.

Reference numerals: the device comprises a scissor type lifting platform 10, a screw rod 101, a pushing block 102, a working platform 103, a supporting frame 104, a bottom plate 2, guide pins 21, a probe platform 3, a probe 4, a quick clamp 5, a base 6, a power meter 7, a triaxial adjustment translation platform 8, a lens bracket 9, a slot 91 and a base plate 11.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

Referring to fig. 1 to 4, a lens transmittance inspection apparatus includes:

a scissor lift 10;

the bottom plate 2 provided with a chip is detachably arranged on the scissor lift 10;

a probe platform 3 on which a plurality of probes 4 are arranged;

the quick clamp 5 is detachably arranged on the bottom plate 2, and the action of the quick clamp 5 can drive the probe platform 3 to move up and down;

a base 6 on which a power meter 7 is provided;

the triaxial adjusts translation stage 8, and its detachably is equipped with lens support 9, is equipped with a plurality of trench 91 on the lens support 9. In the utility model, during inspection, the movable handle of the quick clamp 5 is pressed down to enable the probe 4 to be abutted against the semiconductor chip on the bottom plate 2, the semiconductor chip is electrified, the current is controlled to be a fixed value, the numerical value a of the power meter 7 is read, the lens support 9 is moved between the scissor type lifting table 10 and the base 6 by adjusting the triaxial adjusting translation table 8, a lens is placed in the groove 91, the same current is used for powering up, the reading b of the power meter 7 at the same position is read, and the front numerical value and the rear numerical value are compared, so that the transmittance of the lens is T=b/a%, and the whole structure is simple and the operation is convenient. Specifically, the quick clamp 5 and the triaxial adjustment translation stage 8 are in the prior art, when the movable handle of the quick clamp 5 acts, the push rod on the quick clamp is driven to move up and down, the probe platform 3 is arranged on the push rod so as to drive the probe platform 3 to move up and down, and the triaxial adjustment translation stage 8 can be adjusted up and down, front and back, left and right; the size of the slot 91 is determined according to the size of the lens; the bottom plate 2 is connected with the scissor lift 10 through bolts; the quick clamp 5 is connected with the bottom plate 2 through bolts; the triaxial adjustment translation stage 8 is connected with the lens bracket 9 through bolts.

As a preferred embodiment of the utility model, it may also have the following additional technical features:

in this embodiment, the scissor lifting platform 10 includes a screw rod 101, a pushing block 102, and two working platforms 103 and supporting frames 104, where the number of the two working platforms 103 and the screw rod 101 are set on one of the working platforms 103, the two supporting frames 104 are rotationally connected with each other, the pushing block 102 connects the screw rod 101 with one of the supporting frames 104, and the upper and lower ends of the supporting frames 104 are respectively slidably connected with the working platforms 103, and by rotating the screw rod 101, the pushing block 102 moves to drive one supporting frame 104 to move, so that the inclined angle of the two supporting frames 104 changes, and then the position of the bottom plate 2 is adjusted. Specifically, the scissor lift 10 and the triaxial adjustment translation stage 8 are arranged to enable rapid installation of the semiconductor chip, the lens and the power meter 7.

In this embodiment, at least two guide pins 21 are provided on the base plate 2 to ensure vertical up-and-down movement of the probe platform 3.

In this embodiment, the device further comprises a backing plate 11, on which a scissor lift 10, a base 6 and a triaxial adjustment translation stage 8 are detachably arranged, and the position is adjustable, so that the scissor lift 10, the base 6 and the triaxial adjustment translation stage 8 are fixed in position and convenient for overall transportation. Specifically, a plurality of threaded holes are formed in the base plate 11, and the scissor lift table 10, the base 6 and the triaxial adjustment translation table 8 are connected with the base plate 11 through bolts.

It should be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.

Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.

Claims (4)

1. A device for inspecting transmittance of a lens, comprising:

a scissor lift (10);

a bottom plate (2) provided with a chip is detachably arranged on the scissor lifting table (10);

a probe platform (3) on which a plurality of probes (4) are arranged;

the rapid clamp (5) is detachably arranged on the bottom plate (2), and the rapid clamp (5) can drive the probe platform (3) to move up and down;

a base (6) on which a power meter (7) is arranged;

the three-axis adjusting translation table (8) is detachably provided with a lens support (9), and a plurality of slots (91) are formed in the lens support (9).

2. The device for inspecting lens transmittance according to claim 1, wherein: the shear type lifting platform (10) comprises a screw rod (101), pushing blocks (102), and two working platforms (103) and supporting frames (104), wherein the number of the working platforms (103) and the supporting frames (104) are two, the screw rod (101) is arranged on one of the working platforms (103), the two supporting frames (104) are connected with each other in a rotating mode, and the pushing blocks (102) are connected with the screw rod (101) and one of the supporting frames (104).

3. The device for inspecting lens transmittance according to claim 1, wherein: at least two guide pins (21) are arranged on the bottom plate (2).

4. The device for inspecting lens transmittance according to claim 1, wherein: the device also comprises a base plate (11), wherein the base plate is detachably provided with the scissor lifting table (10), the base (6) and the triaxial adjustment translation table (8), and the position of the base plate is adjustable.