CN219552281U - Optical element detection device - Google Patents

Abstract

An optical element detection device is characterized by comprising: the rotating module comprises a flat plate-shaped disc body capable of rotating around a rotating axis and at least one pickup assembly fixed on the disc body and used for picking up an optical element to be inspected, and the disc body drives the optical element to rotate through the at least one pickup assembly and forms a rotating path of the optical element; and a plurality of detection assemblies arranged in the radial direction of the rotating path and arranged at intervals around the rotating axis of the disc body, wherein each of the plurality of detection assemblies can detect at least one part of one of the surfaces of the optical element picked up by the at least one pickup assembly. Accordingly, the surfaces of the anisotropic optical element facing the plurality of detection modules can be subjected to multi-angle detection.

Description

Optical element detection device

Technical Field

The present utility model relates to an optical element inspection device capable of inspecting a plurality of surfaces of a deformed optical element, improving inspection efficiency, and reducing secondary damage.

Background

Various defects such as scratches, pits, cracks, pits and the like often exist in the processing process of the optical element, so that the user experience is reduced, and the performance of an optical system is affected. With the increasing demands of consumers at present, the requirements of many electronic products on the volume, the appearance and the optical quality of optical elements are also higher and higher, and more test items are also provided.

The existing detection mode is low in efficiency and basically blank in the automatic detection field of the special-shaped optical element. Patent document 1 discloses a "large-caliber optical element surface damage detection device and a corresponding detection method", which can meet the detection requirement of high precision, but needs to manually feed and clamp an optical element, and has low detection efficiency.

Patent document 2 discloses an automatic detection device and method for surface defects of a large-caliber curved surface optical element, which can rapidly detect the surface defects of the large-caliber optical element by automatically clamping the optical element by a manipulator in automatic production. However, the optical element to be detected has a single detection object, and the shape and the type of the optical element to be detected are limited, so that the optical element is not suitable for detecting various special-shaped optical elements.

Therefore, in the prior art, it is an object to detect various types of special-shaped optical elements and to improve the detection efficiency and accuracy.

Comparative literature

Patent document 1: CN103674977B

Patent document 2: CN109490313B

Disclosure of Invention

The utility model aims to provide an optical element detection device which can detect a plurality of surfaces of a special-shaped optical element, improve detection efficiency and reduce secondary damage. In order to achieve the above object, one aspect of the present utility model is an optical element inspection apparatus comprising a rotation module including a rotation body rotatable about a rotation axis thereof and at least one pickup unit fixed to the rotation body and spaced apart from the rotation axis of the rotation body by a predetermined distance for picking up an optical element to be inspected, the rotation body rotating the optical element about the rotation axis of the rotation body by the at least one pickup unit and forming a rotation path of the optical element;

The optical element detection device further includes a plurality of detection modules provided in a radial direction of the rotation path and spaced around the rotation axis of the rotating body, each of the plurality of detection modules being configured to detect at least a part of one of a plurality of surfaces of the optical element picked up by the at least one pickup module.

In a preferred embodiment, the rotating body is a flat plate-like disk.

According to the technical scheme, the optical element is driven to rotate through the turntable, and the plurality of detection assemblies are arranged in the radial direction of the rotating path, so that the surfaces of the optical element, which face the plurality of detection assemblies, can be subjected to multi-angle detection.

In a preferred form of the present invention,

each of the at least one pickup assembly has a pickup portion that picks up an optical element, the pickup portion being rotatable integrally with the picked-up optical element about a rotational axis of the pickup portion, the rotational axis of the pickup portion being parallel to the rotational axis of the rotating body,

further, each of the plurality of detecting members is configured to detect any one of the surfaces of the optical element facing the detecting member in a radial direction perpendicular to the rotation axis of the rotating body.

According to the technical scheme, the optical element is driven to revolve through the turntable, the pickup part drives the optical element to rotate, the surfaces of the optical element, which face the detection assemblies, can be detected in any direction, and 360-degree dead-angle-free detection can be realized.

In a preferred manner, at least a part of the plurality of detection modules is capable of detecting any one of the orientations in the radial direction of the side surface facing the side of the optical element picked up by the at least one pickup module.

According to the above-described technical means, it is possible to detect any orientation of the side surface of the optical element facing the side, or to detect the side surface without a dead angle of 360 degrees.

In a preferred manner, the pick-up part is also capable of performing a translational movement in the direction of the rotation axis of the disc, and a translational and/or rotational movement in a first direction and a second direction, respectively, in a radial section of the disc, the first direction and the second direction being perpendicular to each other.

According to the technical scheme, the pose of the pick-up part can be adjusted so as to pick up the optical element conveniently and improve the detection precision.

In a preferred manner, each of the at least one pickup assembly is provided with an elastic member connected to the pickup portion, the elastic member having a deformation allowance that allows the pickup portion to float in the rotation axis direction of the disk body.

According to the technical scheme, a certain tolerance can be absorbed, and damage to the optical element when the optical element is picked up can be avoided through elastic floating.

In a preferred mode, a top surface detecting member provided above the optical element to be inspected in the direction of the rotation axis of the disk body is used for detecting a top surface of the optical element toward at least a part of the top surface detecting member.

According to the technical scheme, detection of part of the top surface can be achieved through the top surface detection assembly.

In a preferred manner, a radial plane coordinate system is established along a radial cross-section of the disc, and the top surface detection assembly is further capable of acquiring coordinates of a center position of the top surface of the optical element before the pickup picks up the optical element.

According to the technical scheme, the position of the center of the top surface of the optical element can be accurately obtained, and the detection precision is improved.

In a preferred embodiment, a first lower detection means provided below the rotation path in the direction of the rotation axis of the disk body can detect a bottom surface of the optical element picked up by the pickup unit, the bottom surface being directed to at least a part of the first lower detection means.

According to the foregoing aspect, the bottom surface of the optical element facing downward can be detected.

In a preferred manner, the first lower detection assembly is further capable of acquiring the position coordinates of the radial cross-section center of the pick-up section in the radial plane coordinate system before the pick-up section picks up the optical element.

According to the technical scheme, the feeding transfer module can accurately convey the optical element to be detected to the position corresponding to the pick-up part.

In a preferred mode, the feeding transfer module conveys the optical element detected by the top surface detection component to a position corresponding to the pick-up part according to the position coordinate of the radial cross section center of the pick-up part in the radial plane coordinate system and the coordinate of the center position of the top surface of the optical element.

According to the technical scheme, the optical element can be conveniently picked up by the pick-up part, and the detection efficiency is improved.

In a preferred embodiment, the optical disk device further includes a second lower detection means provided below the rotation path in the direction of the rotation axis of the disk body, and the detection means is capable of detecting a region of the bottom surface of the optical element that is not detected by the first lower detection means.

According to the technical scheme, the bottom surface of the optical element can be detected more comprehensively.

In a preferred manner, the second lower detection assembly is further capable of acquiring a projected image of the pick-up portion of each of the at least one pick-up assembly on a radial cross section of the disc before the pick-up portion picks up the optical element; each of the at least one pickup assembly is calibrated based at least on the projection imaging.

According to the technical scheme, the consistency of the pose of the pick-up part of each pick-up assembly can be ensured, and the convenience of picking up the optical element and the detection precision are improved.

In a preferred embodiment, the optical element further includes a remaining non-inspected surface detecting unit configured to detect a remaining non-inspected surface of the optical element that is separated from the pickup unit and that passes the detection by the plurality of detecting units, the top surface detecting unit, the first lower detecting unit, and the second lower detecting unit.

According to the technical scheme, the surface which is left to be detected can be detected, and the comprehensiveness of the detection of the optical element is ensured.

In a preferred embodiment, the method further comprises: a storage unit for receiving the optical element which is separated from the pick-up part and is qualified by detection of the plurality of detection components, the top surface detection component, the first lower detection component and the second lower detection component; and the material throwing assembly is used for taking out the optical element with the unqualified residual surface from the material storage unit.

According to the technical scheme, good products can be picked up to the OK tray, and quick sorting is achieved.

In a preferred embodiment, the method further comprises: the height measurement assembly is used for acquiring the height position of the optical element to be detected in the direction of the rotation axis of the disc body; the top surface detection component can adjust the position along the rotation axis direction of the disc body according to the height position of the optical element acquired by the height measurement component.

According to the technical scheme, the optical element can be ensured to be positioned in the detection visual field range of the top surface detection assembly, and the detection precision is improved.

The optical element detection device provided by the embodiment of the utility model can realize the omnibearing detection of a plurality of surfaces of the special-shaped optical element, greatly improve the detection efficiency and reduce the secondary damage to the optical element in the detection process.

Drawings

In order to more clearly illustrate the present utility model, the following description and the accompanying drawings of the present utility model will be given. It should be apparent that the figures in the following description merely illustrate certain aspects of some exemplary embodiments of the present utility model, and that other figures may be obtained from these figures by one of ordinary skill in the art without undue effort.

Fig. 1 is an overall configuration diagram of an exemplary detection apparatus.

Fig. 2 is an exemplary carousel connection schematic.

Fig. 3 is a block diagram of an exemplary pick-up assembly.

Fig. 4 is a schematic diagram of an exemplary loading/unloading transfer module.

Fig. 5 is a schematic diagram of an exemplary location detection module.

Fig. 6 is a schematic view of an exemplary tray pick-and-place module.

Fig. 7 is an exemplary camera calibration schematic.

Fig. 8 is an exemplary optical element detection flow chart.

Description of the drawings:

100. detection device

101. Base mounting surface

102. Cross beam bracket

103. Storage bin

104. Material tray to be detected

105 OK tray

106 NG charging tray

1. Rotary module

11. Disk body

112. Gas-electric conveying and shunting rotary table

113. Turntable connected with turntable

114. Turntable base

12. Pick-up assembly

120. Pickup unit

121 X-direction translation adjusting part

122 Y-direction translation adjusting part

123 Z-direction translation adjusting part

124 X-direction rotation adjusting part

125 Y-direction rotation adjusting part

126 Z-direction rotation adjusting part

127. Pick-up part fixing mechanism

128. Elastic element

2. Side detection module

21. First side detection assembly

22. Second side detection assembly

23. Third side detection assembly

3. Bottom surface detection module

31. First lower detection assembly

32. Second lower detection assembly

5. Positioning detection assembly

51. Top surface detection assembly

52. Remaining non-inspected surface detection assembly

53. Material throwing assembly

54. Dust removal assembly

55. Height finding subassembly

56. Middle calibration camera

6. Material tray taking and placing module

61. Clamping jaw assembly of material tray to be detected

62 OK charging tray clamping jaw assembly

63 NG charging tray clamping jaw assembly

64. First translation track

65. Second translational track

7. Feeding transfer module

9. Blanking transfer module

Detailed Description

Various exemplary embodiments of the present disclosure are described in detail below with reference to the accompanying drawings. The description of the exemplary embodiments is merely illustrative, and is in no way intended to limit the disclosure, its application, or uses. The present disclosure may be embodied in many different forms and is not limited to the embodiments described herein. These embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art. It should be noted that: the relative arrangement of parts and steps, numerical expressions and values, etc. set forth in these embodiments are to be construed as illustrative only and not as limiting unless otherwise stated.

The use of the terms "comprising" or "including" and the like in this disclosure means that elements preceding the term encompass the elements recited after the term, and does not exclude the possibility of also encompassing other elements.

All terms (including technical or scientific terms) used in this disclosure have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs, unless specifically defined otherwise. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.

Parameters of, and interrelationships between, components, and control circuitry for, components, specific models of components, etc., which are not described in detail in this section, can be considered as techniques, methods, and apparatus known to one of ordinary skill in the relevant art, but are considered as part of the specification where appropriate.

(detection device)

In the processing and handling process of the optical element, defects such as pits, scratches, burrs, broken edges, bubbles, pits and the like are easy to generate. In the embodiment of the application, the optical element detection is a process of detecting the surface or the inside of an optical element product by an optical imaging technology and an image processing system so as to separate good products from defective products.

In consideration of the fact that the special-shaped optical element has an irregular shape and surface, the utility model adopts the suction nozzle in the rotary module to absorb the optical element and drive the optical element to revolve around the rotary axis of the turntable and rotate around the rotary axis of the suction nozzle, and the detection cameras arranged at different azimuth distances are utilized to complete sampling of a plurality of angles in the rotating process. And then, the image processing system processes the sampled image, extracts and analyzes target characteristics, and finally gives out detection results such as good products, defective products and the like.

The configuration of the optical element detecting device of the present utility model is described below with reference to fig. 1 to 7. Fig. 1 is a general structure diagram of a detection device, fig. 2 is a turntable connection schematic diagram, fig. 3 is a pickup assembly structure diagram, fig. 4 is a feeding and discharging transfer module schematic diagram, fig. 5 is a positioning detection module schematic diagram, fig. 6 is a tray picking and placing module schematic diagram, and fig. 7 is a camera calibration schematic diagram.

First, the rotary module 1 will be described.

As shown in fig. 1, the inspection apparatus 100 includes a flat base mounting surface 101 for mounting various modules and components of the inspection optical element. The rotation module 1 is mounted on the base mounting surface 101, and includes a disk 11 rotatable about its own rotation axis and at least one pickup assembly 12 mounted on the disk 11 for picking up an optical element to be inspected. In the detection process, the disc 11 drives the optical element to rotate through the pickup assembly 12 and forms a rotating path of the optical element. The pickup assembly 12 may be one or more, and may be disposed at equal intervals around the rotation axis of the disc 11, and the number may be determined according to actual needs, which is not particularly limited herein.

For convenience of description, the present application uses the rotation axis direction of the disk 11 as the axial direction of the detection device 100, uses the radial direction of the disk 11 perpendicular to the rotation axis as the radial direction of the detection device 100, uses the direction away from the base mounting surface 101 in the axial direction as the upper direction and uses the direction close to the base mounting surface 101 in the axial direction as the lower direction, and the description of the axial direction, the radial direction, the upper direction, and the lower direction is the same as the description of the axial direction, the radial direction, the upper direction, and the lower direction unless otherwise specified.

In the present embodiment, the disk 11 is disposed parallel to the base mounting surface 101, that is, the rotation axis of the disk 11 is perpendicular to the base mounting surface 101, and the disk 11 is preferably disk-shaped. At this time, the pickup assembly 12 is disposed at a position near the radially outer periphery of the disk 11 so as to pick up the optical element to be inspected. It will be appreciated that the disc 11 may also be annular in shape, in which case the pickup assembly 12 may be disposed adjacent the radially inner periphery of the disc 11, and the optical element being picked up is also adjacent the radially inner periphery of the disc 11. Furthermore, the disc 11 may be replaced by several rotating parts, which are arranged at intervals and extend in the radial direction, each of which is provided with a pickup assembly 12, as long as the pickup assembly 12 can be carried and rotated integrally therewith about the rotation axis. For simplicity, the present application will be described with reference to disc-shaped body 11.

As shown in fig. 2, the disk 11 is connected to the base mounting surface 101 by an electro-pneumatic slip ring structure, for example. Specifically, the tray 11 is connected to the turntable connecting turntable 113 through the pneumatic/electric transfer/distribution turntable 112, and the turntable connecting turntable 113 is fixed to the base mounting surface 101 through the turntable base 114. In the working process, the disc body 11, the gas-electricity conveying and distributing rotary table 112 and the rotary table 113 synchronously rotate around the axial direction, and meanwhile stable conveying of gas and electricity is realized.

Next, the pickup assembly 12 will be described.

In the present embodiment, as shown in fig. 3, the pickup assembly 12 has a pickup section 120 for picking up an optical element to be inspected, and an X-direction translation adjusting section 121, a Y-direction translation adjusting section 122, a Z-direction translation adjusting section 123, an X-direction rotation adjusting section 124, a Y-direction rotation adjusting section 125, and a Z-direction rotation adjusting section 126.

The X direction and the Y direction are perpendicular to each other and are located on a radial plane parallel to the base mounting surface 101, the Z direction is perpendicular to the radial plane, that is, is the same as the axial direction of the detection device 100, and through translational and rotational adjustment in the three directions, the pick-up portion 120 has 6 degrees of freedom in space, so that the specific position of the pick-up portion 120 can be more conveniently adjusted, and convenience, accuracy and detection accuracy of the optical element can be improved.

The pickup 120 extends in the Z direction, the lower end face of the pickup 120 faces the optical element to be picked up and has a suction hole communicating with the suction mechanism, and a pickup fixing mechanism 127 is connected to the upper end of the pickup 120. As an example, the pickup unit fixing mechanism 127 is provided with a negative pressure chamber communicating with the suction hole, and the suction mechanism causes a negative pressure to be formed in the negative pressure chamber, thereby sucking the optical element to the suction hole. At this time, the top surface of the optical element facing upward abuts against the lower end surface of the pickup 120, and the optical element moves from bottom to top by suction force of the pickup 120 to be extracted. Of course, in other embodiments, the pick-up 120 may also extend horizontally in the radial direction for sucking the side surface of the optical element facing the side, which is not repeated here.

In the process of picking up the optical element, a certain floating error is unavoidable in the relative position and the relative distance between the pickup part 120 and the optical element, and a certain impact force exists between the optical element and the lower end surface of the pickup part 120 when the optical element is sucked, so that the optical element is damaged. For this reason, it is preferable that an elastic member 128 connected to the pickup 120 is provided in the pickup fixing mechanism 127, the elastic member 128 having a deformation allowance that allows the pickup 120 to float up and down in the axial direction. Thus, the floating error between the pickup 120 and the optical element can be absorbed, and the impact force between the pickup and the optical element can be reduced. It will be appreciated that the lower end surface of the pick-up 120 is typically made of a soft elastic material such as rubber, PEEK plastic, etc., also to avoid damage to the optical elements.

Next, the side detection module 2 will be described.

As shown in fig. 1, the detection device 100 further includes a side detection module 2 disposed in a radial direction of the rotation path and including a first side detection module 21, a second side detection module 22, and a third side detection module 23 disposed at intervals around an axial direction. The actual number of side sensing assemblies is not limited to the three illustrated, but is illustrated here for simplicity.

When the disk 11 is disk-shaped, the first side detection unit 21, the second side detection unit 22, and the third side detection unit 23 are provided radially outside the radially outer peripheral edge of the disk 11, but when the disk 11 is annular, the first side detection unit 21, the second side detection unit 22, and the third side detection unit 23 may be provided radially inside the radially inner peripheral edge of the disk 11 so long as the optical element to be picked up can be detected in the direction of the pickup unit 12. Here, the first side detection unit 21, the second side detection unit 22, and the third side detection unit 23 are provided radially outside the radially outer peripheral edge of the disk 11.

In one embodiment, the first side detection assembly 21, the second side detection assembly 22, and the third side detection assembly 23 are used to detect multiple angles of the side facing the side of the optical element being picked up. The side surface may be an upper and lower vertical surface extending in the axial direction, or may be an inclined surface extending obliquely upward and downward with a certain angle to the axial direction, which is not particularly limited herein.

On the other hand, the first side detection unit 21, the second side detection unit 22, and the third side detection unit 23 are not limited to being directed to the radial cross-section center of the disk 11 in absolute terms, but may be configured to adjust the posture, for example, to approach or separate from the radial cross-section center of the disk 11, to perform pitch adjustment with respect to the radial cross-section of the disk 11 as a reference plane, or to swing left and right with respect to the direction directed to the radial cross-section center. The spacing angle between two adjacent ones of the first side detecting element 21, the second side detecting element 22, and the third side detecting element 23 is not particularly limited, and may be uniformly distributed at equal intervals or may have an indefinite included angle. In practice, before the optical element is picked up, the posture of the first side detecting assembly 21, the second side detecting assembly 22 and the third side detecting assembly 23 is adjusted to ensure that the sides of the optical element to be picked up are detected more fully.

On the other hand, after the optical element is picked up by the pickup 120, the optical element can be integrally rotated around the rotation axis of the pickup 120 with the pickup 120 by the Z-rotation adjusting section 126. That is, the optical element to be picked up revolves with the disk 11 and rotates with the pickup 120.

Specifically, during the inspection, the disc 11 first drives the optical element to revolve into the inspection field of the side inspection assembly 21, thereby completing the inspection of the first side area corresponding to the side inspection assembly 21. When the disc 11 drives the optical element to revolve to a specific position between the side detection assembly 21 and the side detection assembly 22, the pickup portion 120 drives the optical element to rotate by a certain angle, for example, 120 °, under the control of the control system, and then the optical element revolves to the detection field of the side detection assembly 22, so as to complete the detection of the second side area corresponding to the side detection assembly 22. When the disc 11 drives the optical element to revolve to a specific position between the side detection assembly 22 and the side detection assembly 23, the pickup portion 120 drives the optical element to rotate at a certain angle, for example, 120 °, the rotation directions of the two rotations are the same, and then the optical element revolves to the detection field of the side detection assembly 23, so as to complete the detection of the third side area corresponding to the side detection assembly 23.

Thus, each of the first side detecting unit 21, the second side detecting unit 22, and the third side detecting unit 23 can detect any orientation of the side surface of the optical element facing the side by revolution driven by the disk 11 and rotation driven by the pickup unit 120. It will be appreciated that the first side detection assembly 21, the second side detection assembly 22, and the third side detection assembly 23 cooperate with each other to perform 360 ° full circumferential detection on the side surface of the optical element, thereby ensuring the comprehensiveness of side surface detection and avoiding occurrence of detection blind areas and dead angles.

In another embodiment, the first side detecting component 21, the second side detecting component 22 and the third side detecting component 23 may also be disposed further down than the optical element to be picked up, i.e. from obliquely below toward the optical element, so as to detect the slope of the optical element toward the obliquely lower bottom. Alternatively, the first side detecting element 21, the second side detecting element 22, and the third side detecting element 23 may be disposed further upward than the optical element to be picked up, that is, from obliquely upward toward the optical element, so as to detect an oblique surface of the optical element toward the obliquely upward top. The revolution driven by the disc 11 and the rotation driven by the pick-up unit 120 can also realize the detection of any direction or 360 ° full circumference of the inclined plane of the bottom and the inclined plane of the top.

Next, the top surface detecting module 51 will be described.

As an example, the detection device 100 includes a beam bracket 102 provided in parallel with the base mounting surface 101, and a positioning detection module 5 mounted on the beam bracket 102. The positioning detection module 5 includes a top surface detection module 51 and a remaining non-detection surface detection module 52, which are disposed downward. Wherein, the top surface detecting component 51 is used for detecting at least a part of the top surface of the optical element facing upwards, and the remaining non-detected surface detecting component 52 is left to be described later.

In daily operation, a plurality of optical elements to be detected are arranged in advance in the tray 104 to be detected, and the trays 104 to be detected are stored in the bin 103 in a stacking manner. In the detection process, the detection device 100 firstly picks up and puts the single tray 104 to be detected into the feeding transfer module 7 through the tray pick-and-place module 6, and the feeding transfer module 7 comprises a stepping motor capable of precisely controlling the step number, so that the tray 104 to be detected can be driven to perform translational motion on a radial plane parallel to the base mounting surface 101. Under the control of the control system, the feeding transfer module 7 conveys the tray 104 to be detected to the lower part of the top surface detection assembly 51, so that each optical element to be detected is ensured to be in the detection visual field range of the top surface detection assembly 51. According to the application, the stacking bin is adopted for feeding, so that the convenience of feeding and discharging of equipment can be enhanced, the switching time of the equipment can be saved, and the automatic production efficiency can be improved.

In this embodiment, the top surface inspection assembly 51 only inspects a partial area of the top surface of the optical element in the tray 104 to be inspected, and an undetected area of the top surface is used to contact the pickup assembly 12 so that the pickup assembly 12 picks up the optical element.

The top surface detection assembly 51 also serves to locate the visual center of the top surface of the optical element. As an example, a radial plane coordinate system is established on a radial plane parallel to the base mounting surface 101, a point in the radial plane is arbitrarily selected as an origin, and under the condition that the position coordinates of the detection camera in the top surface detection assembly 51 are known, the imaging of the top surface of the optical element is extracted and analyzed by the image processing system, so that the visual center coordinates of the top surface of the optical element can be obtained, and then the feeding transit module 7 is controlled to drive the tray 104 to be detected to perform position adjustment, so as to ensure that the projection coincidence of the visual center of the top surface of the optical element and the visual center of the detection camera in the top surface detection assembly 51 on the radial plane is ensured, so as to improve the detection precision. After the detection of the optical element is completed, the feeding transfer module 7 continues to perform position adjustment, so that the visual center of the optical element to be detected next in the tray 104 to be detected coincides with the projection of the visual center of the detection camera in the top surface detection assembly 51 on the radial plane. The visual center of the inspection camera in the top surface inspection module 51 here is the imaging plane center of the inspection camera.

Next, the bottom surface detection module 3 will be described.

The optical element to be picked up also has a bottom surface facing axially downward, so that it is necessary to provide a bottom surface detection module 3 below the optical element to detect the bottom surface thereof. The bottom surface may be a surface perpendicular to the axial direction, or may be an inclined surface having a certain angle with the axial direction, so long as the bottom surface can be sampled by the bottom surface detection module 3 toward the lower side.

As an embodiment, the bottom surface detection module 3 includes a first lower detection component 31 and a second lower detection component 32 disposed axially below the rotation path of the optical element to be picked up and spaced around the axial direction, and the first lower detection component 31 and the second lower detection component 32 detect different areas of the bottom surface of the optical element respectively. It will be appreciated that the bottom surface detection module 3 may be provided with one or more lower detection assemblies according to actual requirements to accommodate the detection requirements of the irregular bottom surface of the profiled optical element. For simplicity, only the first lower detecting unit 31 and the second lower detecting unit 32 are illustrated as examples.

Preferably, after the pickup assembly 12 picks up the optical element to be inspected, the projection of the optical element on a radial plane parallel to the base mounting surface 101 is positioned outside the projection of the tray 11 on the radial plane to avoid shielding of the bottom surface of the optical element by the tray 11. For example, when the disk 11 is disk-shaped, the pickup assembly 12 places the picked-up optical element radially outward of the radially outer periphery of the disk 11. When the disc 11 is annular, the pickup assembly 12 may also place the optical element to be picked up radially inward of the radially inner periphery of the disc 11, as will not be repeated here.

As another embodiment, the bottom surface detecting module 3 may be further disposed at a central position of a radial cross section of the tray 11, and extend out of a detecting portion extending to a position below the optical element to be picked up in a radial direction of the tray 11 to detect a bottom surface of the optical element. At this time, the projections of the optical element on the radial plane and the projections of the disk 11 on the radial plane may not overlap each other or may overlap at least partially, and the relative positional relationship between the projections is not particularly limited. However, for simplicity, the present application will be described by taking the example in which the bottom surface detection module 3 is disposed axially below the rotation path of the optical element to be picked up, and the optical element to be picked up is disposed radially outside the radially outer peripheral edge of the disk 11.

In the inspection process, after the pickup assembly 12 picks up the optical element, the first lower inspection assembly 31 firstly inspects the bottom surface of the part of the optical element, and when the pickup assembly 12 rotates above the second lower inspection assembly 32, the second lower inspection assembly 32 inspects at least the area of the bottom surface which is not inspected by the first lower inspection assembly 31. That is, the first lower detecting unit 31 and the second lower detecting unit 32 can realize the entire detection sampling of the bottom surface of the optical element without leaving detection dead zones and dead corners.

In addition, the first lower detection component 31 and the second lower detection component 32 can also position the pickup component 12 so as to adjust the pose of the pickup component 12, thereby being convenient for picking up the optical element to be detected and improving the detection precision.

On the one hand, there is a certain deviation in the mounting position of each pickup assembly 12 on the tray 11 and its posture, resulting in that the deviation in the posture of the picked-up optical element also occurs, for example, a vertical inclination, a distance from the tray 11 to the tray 11, so that the detection accuracy is affected. For this reason, each pick-up assembly 12 needs to be calibrated to ensure consistency before inspection begins.

Specifically, the projection imaging of the pickup portion 120 of each pickup assembly 12 on the radial plane parallel to the base mounting surface 101 is acquired by the first lower detection assembly 31 or the second lower detection assembly 32, and each pickup assembly 12 is adjusted based on at least the projection imaging, so that the projection imaging of each pickup portion 120 acquired by the first lower detection assembly 31 or the second lower detection assembly 32 coincides with each other to ensure that the position and posture of the pickup portion 120 in the axial direction are uniform when each pickup assembly 12 is rotated to the same position on the radial plane, so that the detection of the bottom surface of the optical element by the first lower detection assembly 31 and the second lower detection assembly 32 can be made with higher accuracy.

Specific pose adjustment, for example, adjustment of the perpendicularity of the pickup portion 120, may be achieved by controlling the aforementioned X-direction translation adjustment portion 121, Y-direction translation adjustment portion 122, Z-direction translation adjustment portion 123, X-direction rotation adjustment portion 124, Y-direction rotation adjustment portion 125, and Z-direction rotation adjustment portion 126 through a control system, so that translation and/or rotation of the pickup portion 120 in the X-direction, Y-direction, and Z-direction are achieved, which will not be repeated here.

On the other hand, after the top surface of the portion of the optical element is inspected by the top surface inspection module 51, in order to accurately convey the tray 104 to be inspected from below the top surface inspection module 51 to below the corresponding pickup 120, the position of the pickup 120 needs to be acquired. Specifically, in the radial plane coordinate system, the first lower detecting component 31 acquires the image of the lower end face of the pick-up part 120, and the image processing system extracts and analyzes the image to acquire the coordinate of the radial cross-section center of the lower end face of the pick-up part 120, and then, according to the coordinate of the visual center of the top surface of the optical element acquired by the top surface detecting component 51, the optical element in the tray 104 can be accurately conveyed to the position below the corresponding pick-up part 120 by precisely adjusting the step number of the stepping motor in the feeding transit module 7.

Next, the blanking process will be described.

As shown in fig. 1 and 4, the mount surface 101 of the base is provided with a blanking relay module 9, and OK trays 105 and NG trays 106 provided in the blanking relay module 9. The blanking transfer module 9 comprises a stepping motor capable of precisely controlling the steps, and can realize the translational movement of the OK tray 105 and the NG tray 106 on a radial plane parallel to the base station mounting surface 101.

The OK tray 105 is configured to receive the optical element that is separated from the pickup unit 120 and is qualified by the top surface detecting unit 51, the first side surface detecting unit 21, the second side surface detecting unit 22, the third side surface detecting unit 23, the first lower detecting unit 31, and the second lower detecting unit 32. The NG tray 106 is configured to receive an optical element that is detached from the pick-up unit and that fails to be detected by at least one of the top surface detecting unit 51, the first side surface detecting unit 21, the second side surface detecting unit 22, the third side surface detecting unit 23, the first lower detecting unit 31, and the second lower detecting unit 32.

Specifically, after the optical element completes the detection of the top surface detecting component 51, the first side surface detecting component 21, the second side surface detecting component 22, the third side surface detecting component 23, the first lower detecting component 31, and the second lower detecting component 32, the second lower detecting module 2 transmits the result information of all the previous detecting processes to the positioning detecting module 5, and the remaining non-detected surface detecting components 52 complete the positioning of the hole positions of the NG tray/OK tray for receiving the optical element according to the NG/OK result. If no defect is found in all the previous detection processes, the blanking relay module 9 moves the OK tray 105 to below the optical element, and at this time, the negative pressure chamber of the pick-up 120 stops working, and the optical element falls into the OK tray 105. If any defect is found, the blanking relay module 9 moves the NG tray 106 to below the optical element, which falls into the NG tray 106.

At this time, as for the optical element falling into the OK tray 105, the part of the top surface thereof that is in contact with the pickup portion 120 has not been effectively detected due to the influence of the pickup portion 120, and the part of the undetected surface is the remaining undetected surface.

It should be noted that, the top surface inspection module 51 does not inspect the remaining non-inspected surface before the optical element is picked up, because the pickup portion 120 may damage a portion contacting the optical element during the process of picking up the optical element, that is, the inspection of the remaining non-inspected surface before the optical element is picked up is meaningless. Therefore, the detection of the remaining non-inspected surface is arranged to be performed after the detachment from the pickup portion 120.

As shown in fig. 1 and 5, after the optical element detached from the pick-up unit 120 enters the OK tray 105, the blanking transfer module 9 drives the OK tray 105 to move and convey the optical element to the detection field of the remaining non-inspected surface detection assembly 52, and the remaining non-inspected surface detection assembly 52 detects the remaining non-inspected surface. If no defect is found, the optical element is left in the OK tray 105. If a defect is found, the optical element is taken from the OK tray 105 to a throwing box (not shown) through the throwing assembly 53 shown in fig. 5.

As shown in fig. 5, the positioning detection module 5 further includes a height measurement assembly 55, and the height measurement assembly 55 is typically provided with a laser sensor. Before the optical elements are picked up, the height position of each optical element in the tray 104 to be inspected in the axial direction is obtained by the height measurement assembly 55, and according to the height position, the top surface detection assembly 51 can automatically adjust the height in the axial direction, so that each optical element to be inspected can be within the focusing view range of the top surface detection assembly 51. It should be noted that, the pickup portion 120 may float up and down in the axial direction, and the axial height adjustment is completed when the apparatus is assembled and adjusted, so that the floating difference of the axial heights of all the optical elements in the tray 104 to be inspected is within the height range where the pickup portion 120 floats in the axial direction, and therefore, the optical elements with different heights may be sucked by the pickup portion 120.

In addition, the positioning detection module 5 further includes a dust removing component 54, which performs dust removing operation on the position of the cavity, where the optical element is not placed, in the tray 104 to be detected and the OK tray 105, which are moved below the positioning detection module 5, for example, the position of the cavity is blown by high-pressure air flow, and impurities such as dust are blown up and then sucked, so that the tray is ensured to be clean, and secondary pollution to the optical element is prevented.

Next, the tray pick-and-place module 6 will be described.

As shown in fig. 6, the tray pick-and-place module 6 includes a first translation rail 64 and a second translation rail 65 parallel to the base mounting surface 101, where the first translation rail 64 and the second translation rail 65 are perpendicular to each other, and the first translation rail 64 can perform a translation motion along the second translation rail 65. Also mounted on the first translation rail 64 is a jaw base 66, the jaw base 66 being movable in translation along the first translation rail 64. In other words, the movement of the jaw base 66 in the radial plane parallel to the base mounting surface 101 can be achieved by the translation of the first translation rail 64 along the second translation rail 65, and the translation of the jaw base 66 along the first translation rail 64.

The clamping jaw base 66 is also provided with a to-be-detected tray clamping jaw assembly 61, an OK tray clamping jaw assembly 62 and a NG tray clamping jaw assembly 63, which are respectively used for grabbing a to-be-detected tray 104, an OK tray 105 and a NG tray 106. For example, during feeding, the tray clamping jaw assembly 61 to be detected grabs the tray 104 to be detected from the bin 103 to the feeding transfer module 7; when the OK tray and the NG tray are full, the OK tray clamping jaw assembly 62 and the NG tray clamping jaw assembly 63 sort the OK tray and the NG tray to predetermined positions, respectively.

In practice, the tray picking and placing module 6 is not limited to the three clamping jaw assemblies, and a plurality of clamping jaws can be set according to requirements and respectively correspond to a plurality of tray stations, so that parallel operation of a plurality of action procedures can be accurately and efficiently completed, and the detection efficiency is improved.

Next, camera calibration will be described.

In a typical example, the top surface detecting assembly 51, the first side surface detecting assembly 21, the second side surface detecting assembly 22, the third side surface detecting assembly 23, and the first lower detecting assembly 31, the second lower detecting assembly 32, and the remaining non-detected surface detecting assembly 52 each include a detecting camera such as a CCD camera, and are detected and positioned by camera imaging. Therefore, in the device assembling and adjusting process of the detection device 100, the detection cameras of each detection assembly need to be calibrated, that is, the relative coordinate values between each module are obtained, so as to improve the detection accuracy.

For simplicity, calibration of the detection cameras in the remaining non-inspected surface detection assembly 52, the second lower detection assembly 32 will be described herein as an example.

Preferably, as shown in fig. 7, an intermediate calibration camera 56, and first and second calibration blocks (not shown) are provided on the base mounting surface 101. Wherein the first calibration block is located within the imaging field of view of both the detection camera of the remaining non-detection surface detection assembly 52 and the intermediate calibration camera 56 and has a first feature point, such as a microwell, that can be captured by both cameras simultaneously. The second calibration block is located within the imaging field of view of both the detection camera of the second lower detection assembly 32 and the intermediate calibration camera 56 and has a second feature point, such as a microwell, that can be captured by both cameras simultaneously.

In the calibration process, the detection camera of the remaining non-detected surface detection assembly 52 and the intermediate calibration camera 56 capture the first calibration block together to obtain an image of the first feature point, and the relative coordinate positions of the imaging surface centers of the two cameras in the radial plane coordinate system can be obtained through image processing, such as obtaining a pixel difference value between the position point of the first feature point in the image and the position point of the imaging surface center of the camera.

Then, the detection camera and the middle calibration camera 56 in the second lower detection assembly 32 capture the second calibration block simultaneously to obtain an image of the second feature point, and the relative coordinate positions of the imaging plane centers of the two cameras in the radial plane coordinate system can be obtained through image processing, such as obtaining pixel differences between the position points of the second feature point and the imaging plane center of the cameras in the image.

Further, by associating with the intermediate calibration camera 56, the relative coordinate positions of the detection cameras in the remaining non-inspected surface detection assembly 52 and the second lower detection assembly 32 may be obtained. The same applies to the relative coordinate position between the detection cameras in any two detection assemblies.

It should be noted that the two calibration blocks are provided because the overlapping imaging field of view between the detection camera of the remaining non-inspected surface detection assembly 52 and the intermediate calibration camera 56 is different from the overlapping imaging field of view between the detection camera of the second lower detection assembly 32 and the intermediate calibration camera 56. The positions and numbers of the intermediate calibration cameras 56 and the calibration blocks are required to be determined according to the relative positions of the detection cameras to be calibrated and the imaging field of view, and are not particularly limited herein.

(detection method)

The method of detecting an optical element will be described below with reference to fig. 8. Fig. 8 is a flowchart of optical element detection.

As an embodiment, the method for detecting an optical element mainly includes the following steps:

s1: and (5) feeding. The single tray 104 to be detected is taken from the bin 103 to be placed into the feeding transfer module 7 through the tray taking and placing module 6, and the feeding transfer module 7 conveys the tray 104 to be detected to the lower part of the top surface detection assembly 51, so that each optical element to be detected is ensured to be in the detection visual field range of the top surface detection assembly 51.

S2: and (3) a top surface positioning detection step. The top surface detecting module 51 detects a partial region of the top surface of the optical element in the tray 104 to be detected while also positioning the optical element, and acquires the coordinates of the visual center of the top surface of the optical element in a radial plane coordinate system parallel to the base mounting surface 101. Then, the feeding transfer module 7 drives the tray 104 to be inspected to perform position adjustment, so that the visual center of the top surface of the optical element coincides with the projection of the center of the imaging surface of the top surface detection component 51 on the radial plane.

S3: and a component pickup step. The first lower detecting unit 31 acquires the coordinates of the radial cross-section center of the pickup 120 in the radial plane coordinate system parallel to the base mounting surface 101, and then, based on the coordinates and the coordinates of the visual center of the top surface of the optical element acquired in the top surface positioning detecting step, the feeding relay module 7 drives the tray 104 to be inspected to translate so as to accurately feed the optical element to a position corresponding to the pickup 120, for example, directly below. The pickup 120 sucks the top surface of the optical element toward the lower end surface so as to extract the optical element from the bottom up.

S4: and a rotation detection step. On the one hand, the side of the picked-up optical element facing sideways is detected. The disc 11 revolves the picked-up optical element into the detection field of the side detection assembly 21, thereby completing the detection of the first side area corresponding to the side detection assembly 21. When the disc 11 drives the optical element to revolve to a specific position between the side detection assembly 21 and the side detection assembly 22, the pickup portion 120 drives the optical element to rotate by a certain angle, for example, 120 °, and then the optical element revolves to the detection field of the side detection assembly 22, so as to complete the detection of the second side area corresponding to the side detection assembly 22. When the disc 11 drives the optical element to revolve to a specific position between the side detection assembly 22 and the side detection assembly 23, the pickup portion 120 drives the optical element to rotate at a certain angle, for example, 120 °, the rotation directions of the two rotations are the same, and then the optical element revolves to the detection field of the side detection assembly 23, so as to complete the detection of the third side area corresponding to the side detection assembly 23. Each of the first side detecting unit 21, the second side detecting unit 22, and the third side detecting unit 23 is capable of detecting the side surface of the optical element facing the side in any direction by revolution by the disk 11 and rotation by the pickup unit 120. Meanwhile, on the other hand, the bottom surface of the picked-up optical element facing downward is inspected. The first lower detecting element 31 detects the bottom surface of the part of the optical element, and when the optical element rotates above the second lower detecting element 32, the second lower detecting element 32 detects at least the area of the bottom surface which is not detected by the first lower detecting element 31.

S5: and (5) blanking. After the optical element completes the detection of the top surface detecting component 51, the first side surface detecting component 21, the second side surface detecting component 22, the third side surface detecting component 23, the first lower detecting component 31 and the second lower detecting component 32, the second lower detecting module 2 transmits the result information of all the previous detecting procedures to the positioning detecting module 5, and the remaining non-detected surface detecting components 52 complete the positioning of the hole positions of the NG tray/OK tray for receiving the products according to the NG/OK result. If no defect is found in all the previous detection processes, the blanking relay module 9 moves the OK tray 105 to below the optical element, and at this time, the negative pressure chamber of the pick-up 120 stops working, and the optical element falls into the OK tray 105. If any defect is found, the blanking relay module 9 moves the NG tray 106 to below the optical element, which falls into the NG tray 106.

S6: and detecting the residual undetected surface. After the optical element detached from the pick-up 120 enters the OK tray 105, the blanking transfer module 9 drives the OK tray 105 to move and convey the optical element to the detection field of the remaining non-inspected surface detection component 52, and the remaining non-inspected surface detection component 52 detects the remaining non-inspected top surface. If no defect is found, the optical element is left in the OK tray 105. If a defect is found, the optical element is taken from the OK tray 105 to a throwing box (not shown) by the throwing assembly 53.

S7: tray full sorting step. When the OK tray and the NG tray are full, the tray taking and placing module 6 sorts the OK tray and the NG tray to the preset positions respectively, and the detection is finished.

Preferably, a device tuning step is performed prior to the feeding step S1. Specifically, including the adjustment of the pickup sections 120, the projection imaging of the pickup section 120 of each pickup assembly 12 on the radial plane parallel to the base mounting surface 101 is acquired by the first lower detection assembly 31 or the second lower detection assembly 32, and each pickup assembly 12 is adjusted based at least on the projection imaging, so that the projection imaging of each pickup section 120 acquired by the first lower detection assembly 31 or the second lower detection assembly 32 coincides with each other to ensure that the position and posture of the pickup section 120 in the axial direction are uniform when each pickup assembly 12 is rotated to the same position on the radial plane. Meanwhile, the method further comprises a detection component adjustment step, wherein the first side detection component 21, the second side detection component 22 and the third side detection component 23 are subjected to attitude adjustment, such as approaching to or separating from the center of a radial section of the disc 11, performing pitching adjustment by taking the radial section of the disc 11 as a reference plane, or swinging left and right relative to a direction towards the center of the radial section.

Preferably, before the loading step S1, a camera calibration step is further performed. As an example, the intermediate calibration camera 56 and a first calibration block having a first feature point and a second calibration block having a second feature point are provided. The detection camera and the middle calibration camera 56 of one detection assembly are shot together to obtain an image of the first feature point, and the relative coordinate position of the center of the imaging surface of the detection camera and the middle calibration camera 56 in the radial plane coordinate system can be obtained through image processing, such as obtaining a pixel difference value between the position point of the first feature point in the image and the position point of the center of the imaging surface of the camera.

Then, the second calibration block is shot by the detection camera and the intermediate calibration camera 56 of the other detection assembly to obtain an image of the second feature point, and the relative coordinate position of the detection camera and the center of the imaging surface of the intermediate calibration camera 56 in the radial plane coordinate system can be obtained through image processing, such as obtaining a pixel difference value between the position point of the second feature point in the image and the position point of the center of the imaging surface of the camera.

Further, by associating with the intermediate calibration camera 56, the relative coordinate position of the imaging plane center of the detection camera of the two detection assemblies can be acquired.

Preferably, after the feeding step S1 and before the top surface positioning and detecting step S2, a height measurement step is further performed, and the height position of each optical element in the tray 104 to be detected in the axial direction is obtained by the height measurement assembly 55, and according to the height position, the top surface detection assembly 51 can automatically adjust the height in the axial direction, so that each optical element to be detected can be within the focusing visual field of the top surface detection assembly 51.

According to the optical element detection device and the detection method, the special-shaped optical element can be subjected to omnibearing automatic detection, and the detection efficiency is greatly improved through automatic feeding and discharging and automatic detection of a plurality of surfaces. The detection station can be freely combined to finish the detection of various types of products, has strong applicability and can effectively reduce the production cost. The accuracy of detection is improved through operations such as double positioning of the product and the pick-up assembly, camera calibration, adjustment of the pick-up assembly and the detection assembly and the like. Only one pick-up operation is performed in the detection process, so that secondary damage to the optical element can be reduced. Meanwhile, the equipment has strong anti-interference capability, is convenient to debug and maintain, ensures the detection yield of products, and is more beneficial to improving the consistency of the products.

It should be understood that the above embodiments are only for explaining the present utility model, the protection scope of the present utility model is not limited thereto, and any person skilled in the art should be able to modify, replace and combine the technical solution according to the present utility model and the inventive concept within the scope of the present utility model.

Claims (16)

1. An optical element detecting device is characterized in that,

the optical element picking device comprises a rotating module, a rotating module and a detecting module, wherein the rotating module comprises a rotating body capable of rotating around a rotating axis of the rotating body and at least one picking assembly which is fixed on the rotating body and is separated by a prescribed distance relative to the rotating axis of the rotating body and is used for picking up an optical element to be detected, and the rotating body drives the optical element to rotate around the rotating axis of the rotating body through the at least one picking assembly and forms a rotating path of the optical element;

the optical element detection device further includes a plurality of detection modules provided in a radial direction of the rotation path and spaced around the rotation axis of the rotating body, each of the plurality of detection modules being configured to detect at least a part of one of a plurality of surfaces of the optical element picked up by the at least one pickup module.

2. The optical element inspection apparatus according to claim 1, wherein,

the rotating body is a flat plate-shaped disc body.

3. The optical element detection device according to claim 1, wherein:

each of the at least one pickup assembly has a pickup portion that picks up an optical element, the pickup portion being rotatable integrally with the picked-up optical element about a rotational axis of the pickup portion, the rotational axis of the pickup portion being parallel to the rotational axis of the rotating body,

Further, each of the plurality of detecting members is configured to detect any one of the surfaces of the optical element facing the detecting member in a radial direction perpendicular to the rotation axis of the rotating body.

4. An optical element inspection apparatus according to claim 3, wherein:

at least a part of the plurality of detection components detects any one of the positions in the radial direction of the side face facing the side of the optical element picked up by the at least one pickup component.

5. The optical element detection device according to claim 4, wherein:

the pick-up part can also perform translational movement along the rotation axis direction of the rotating body and perform translational and/or rotational movement along a first direction and a second direction on the radial section of the rotating body, wherein the first direction and the second direction are mutually perpendicular.

6. The optical element detection device according to claim 5, wherein:

each of the at least one pickup assembly is provided with an elastic member connected to the pickup portion, the elastic member having a deformation allowance that allows the pickup portion to float in the rotation axis direction of the rotating body.

7. The optical element detection device according to claim 6, further comprising:

and a top surface detection assembly arranged above the optical element to be detected along the rotation axis direction of the rotating body and used for detecting the top surface of the optical element facing at least a part of the top surface detection assembly.

8. The optical element detection device according to claim 7, wherein:

a radial plane coordinate system is established along a radial cross section of the rotating body, and the top surface detection assembly is further capable of acquiring coordinates of a center position of the top surface of the optical element before the pickup portion picks up the optical element.

9. The optical element detection device according to claim 8, further comprising:

and a first lower detection unit provided below the rotation path in the rotation axis direction of the rotating body, the first lower detection unit being capable of detecting a bottom surface of the optical element picked up by the pickup unit, the bottom surface being directed toward at least a part of the first lower detection unit.

10. The optical element detection device according to claim 9, wherein:

the first lower detection means is further capable of acquiring a position coordinate of a radial cross-section center of the pick-up section in the radial plane coordinate system before the pick-up section picks up the optical element.

11. The optical element detection device according to claim 10, further comprising:

and the feeding transfer module is used for conveying the optical element detected by the top surface detection assembly to a position corresponding to the pickup part according to the position coordinate of the radial cross section center of the pickup part in the radial plane coordinate system and the center position coordinate of the top surface of the optical element.

12. The optical element detection device according to claim 11, further comprising:

and a second lower detection unit provided below the rotation path in the rotation axis direction of the rotation body, the second lower detection unit being capable of detecting a region of the bottom surface of the optical element which is not detected by the first lower detection unit.

13. The optical element inspection device according to claim 12, wherein:

the second lower detection assembly is further capable of acquiring a projected image of the pick-up portion of each of the at least one pick-up assembly on a radial cross section of the rotating body before the pick-up portion picks up the optical element;

each of the at least one pickup assembly is calibrated based at least on the projection imaging.

14. The optical element detection device according to claim 13, further comprising:

and a remaining non-inspected surface detecting unit configured to detect a remaining non-inspected surface of the optical element which is separated from the pickup unit and is inspected by the plurality of detecting units, the top surface detecting unit, the first lower detecting unit, and the second lower detecting unit.

15. The optical element detection device according to claim 14, further comprising:

a storage unit for receiving the optical element which is separated from the pick-up part and is detected to be qualified by the plurality of detection components, the top surface detection component, the first lower detection component and the second lower detection component;

and the material throwing assembly is used for taking out the optical elements with unqualified residual surfaces from the material storage unit.

16. The optical element detection device according to any one of claims 7 to 13, further comprising:

the height measuring assembly is used for acquiring the height position of the optical element to be detected in the direction of the rotation axis of the rotating body;

the top surface detection component can adjust the position along the rotation axis direction of the rotating body according to the height position of the optical element acquired by the height measurement component.