CN219532998U - Device for measuring conductivity of glass melt at high temperature - Google Patents

Abstract

The utility model discloses a device for measuring the conductivity of a glass melt at high temperature, which comprises a high-temperature furnace, a sample tank, a protection tank, platinum electrodes and wires, wherein the protection tank is arranged in a hearth of the high-temperature furnace, the sample tank is arranged in an inner cavity of the protection tank, the height of the protection tank is higher than that of the sample tank, a pair of parallel platinum electrodes are arranged in the inner cavity of the sample tank, one side of each platinum electrode is attached to the inner wall surface of the sample tank, a supporting plate is arranged at the upper end of the inner cavity of the sample tank at the other side of each platinum electrode, a penetrating groove for the platinum electrodes to penetrate is formed between the supporting plate and the inner wall surface of the sample tank, transition fit is formed between the penetrating groove and the platinum electrodes, each platinum electrode is connected with the wires, the upper ends of the wires extend to the outside of the hearth of the high-temperature furnace, and the platinum electrodes can be pulled out from the penetrating groove under the lifting action force of the wires. Compared with the prior art, the utility model has the advantages of simple structure and higher measurement precision, and can reduce the consumption of the platinum electrode.

Description

Device for measuring conductivity of glass melt at high temperature

Technical Field

The utility model belongs to the technical field of molten glass conductivity measurement, and particularly relates to a device for measuring glass melt conductivity at high temperature.

Background

After the electric melting furnace method adopted at present and the cold crucible method adopted by the international upper and lower generation high-level waste liquid glass solidification technology are determined, the conductivity of the solidified glass melt and the relation between the conductivity and the temperature become one of important properties for determining the quality of a glass formula, and the electric melting furnace is an important basis for the structural design of the melting furnace, the electrode design and the selection of a melting furnace control system, and is also an important technological parameter for the operation of the melting furnace. In order to meet the requirements of glass formulation development, the smooth progress of furnace engineering design is ensured, and the determination of the conductivity of molten glass at high temperature becomes a key step.

The conductivity test of the high-temperature melt at present has a continuous conductivity constant changing method, the conductivity of the solution or the melt is measured by continuously changing the length of a capillary conductivity cell, and the method and the device are relatively complex to construct; the four-electrode method is used for measuring the conductivity of the melt, so that the influence of polarization voltage in the experimental process can be eliminated, but a complex ion conductor is simply treated as an electronic conductor, and a large error exists; the model estimation method can use a simple model to carry out rough estimation, but the conductivity calculated by the model estimation method is larger than the actual conductivity error; the indirect measurement method is based on precisely measuring the viscosity of the melt under a magnetic field, so that the conductivity of the melt is indirectly calculated, but the method is more suitable for measuring the conductivity of single crystals or single oxides, and the measurement of the conductivity of the melt with complex components is still required to be studied; the ac impedance spectroscopy calculates the conductivity based on the electrochemical response of the system when small perturbation is applied to the system during measurement, the operation is simple and easy to implement, and the method is a widely applied test method for the current conductivity test, but the ac impedance spectroscopy is generally only used for testing the conductivity of the solution at normal temperature, the upper limit of the conductivity of the high-temperature melt is usually not higher than 1300 ℃, and the accuracy may not be enough when the conductivity is tested by modifying other equipment, for example, the inner mongolian university of science and technology performs the conductivity test of the melt by replacing a rotor of a high-temperature viscometer with a conductive test accessory, the conductivity test is limited by a cylindrical sample groove of the high-temperature viscometer and an unalterable electrode position, and certain errors may be generated in the result of the conductivity test.

Chinese patent CN214622429U discloses a glass melt high temperature conductivity measuring device, which extrudes or loosens the gland through the lifting device, realizes the lamination or separation of the gland and the groove, and ensures that the conductivity cell is filled with glass melt. However, the electrode is stuck inside the crucible, and solid glass formed by the glass melt after the measurement is cooled at high temperature can be tightly adhered with the test electrode, so that the electrode cannot be reused, and the expensive platinum electrode becomes a high-consumption product.

Disclosure of Invention

In order to solve the problems in the prior art, the utility model aims to provide a device for measuring the conductivity of glass melt at high temperature, which has a simple structure and higher measurement precision compared with the prior art and can reduce the consumption of a platinum electrode.

The technical scheme adopted by the utility model is as follows:

the utility model provides a measure device of glass melt conductivity under high temperature, includes high temperature furnace, sample tank, protection groove, platinum electrode and wire, the protection groove sets up in the furnace of high temperature furnace, the sample tank sets up in the inner chamber of protection groove, the height of protection groove is higher than the sample tank, the inner chamber of sample tank is equipped with a pair of parallel platinum electrode, one side of platinum electrode pastes with the internal face of sample tank mutually, the upper end of sample tank inner chamber all is equipped with the backup pad at the opposite side of every platinum electrode, be formed with the run through groove that supplies the platinum electrode to pass between the internal face of backup pad and sample tank, run through between groove and the platinum electrode for transition fit, all be connected with the wire on every platinum electrode, the upper end of wire extends to the outside of the furnace of high temperature furnace, the platinum electrode can be pulled out from the run through groove under the lifting effort of wire.

Preferably, the device for measuring the conductivity of the glass melt at high temperature is characterized by further comprising a current-voltage test meter, wherein the current-voltage test meter is electrically connected with the platinum electrode through a wire.

Preferably, quartz glass tubes are arranged right above each platinum electrode at the top of the hearth of the high-temperature furnace, and wires connected to each platinum electrode respectively penetrate through the two quartz glass tubes upwards to the high-temperature furnace.

Preferably, the lead wire is connected to a carrying handle at a portion located outside the high temperature furnace, by which the platinum electrode can be lifted upward.

Preferably, the support plate is obliquely arranged, the upper end of the support plate is inclined to one side of the center of the sample tank, the lower end of the support plate is inclined to one side of the side wall of the sample tank, and the through tank is enclosed between the lower end of the support plate and the side wall of the sample tank.

Preferably, the included angle between the supporting plate and the inner wall of the sample tank is 10-15 degrees.

Preferably, a wire groove is formed in the inner wall surface, adjacent to the platinum electrode, of the sample groove, the wire groove extends downwards from the upper end surface of the sample groove, and the wire is arranged along the wire groove.

Preferably, the lower end of the wire is welded to the side surface of the platinum electrode adjacent to the inner wall surface of the sample cell.

Preferably, a limiting groove for limiting the bottom of the sample tank is arranged in the center of the bottom of the inner cavity of the protective tank, and the bottom of the sample tank is placed in the limiting groove.

Preferably, the sample tank and the protection tank are both cuboid without upper bottom, the pair of parallel platinum electrodes are respectively arranged at a pair of side surfaces of the inner cavity of the sample tank, two ends of the length direction of the platinum electrodes are attached to the inner surfaces of the sample tank, which are positioned at two sides of the length direction of the platinum electrodes, the bottom of the platinum electrodes are attached to the bottom surface of the sample tank, and the top of the platinum electrodes is higher than the bottom of the supporting plate.

The utility model has the following beneficial effects:

according to the utility model, the upper end of the inner cavity of the sample tank is provided with the supporting plate, the platinum electrode can be limited through the supporting plate, so that the platinum electrode is attached to the surface of the sample tank, and glass melt entering between the platinum electrode and the surface of the sample tank can be reduced or avoided as much as possible, thereby influencing the interval between the platinum electrodes, thus experimental errors can be reduced, and the testing precision can be increased. In addition, the through groove and the platinum electrode are in transition fit, and the platinum electrode can be pulled out from the through groove under the pulling action force of the lead, so that the platinum electrode can be pulled out under the condition that the glass melt is still at high temperature after the conductivity test of the glass melt is finished, the platinum electrode can be prevented from being fixed in the sample groove by the glass body after being cooled, meanwhile, the platinum electrode is prevented from being embedded on the surface of the platinum electrode after being cooled, and the platinum electrode can cause errors of test results when testing other glass samples. And after the platinum electrode is drawn out by the lead, the platinum electrode is not stained with a glass sample for testing, and when the same platinum electrode and the lead are used for testing the same glass sample or different glass samples, the testing precision is not affected, the service life of the platinum electrode is prolonged, and the consumption of the platinum electrode can be reduced. The processing sample tank is arranged in the inner cavity of the protection tank, and the whole device can prevent the corrosion of the melt to the high-temperature furnace through the protection tank without covering on the premise of ensuring the test precision. The test service life of the platinum electrode can be greatly prolonged through the lifting structure. The use cost of the device is reduced simply and easily.

Drawings

FIG. 1 is a schematic longitudinal cross-sectional view of an apparatus for measuring conductivity of a glass melt at elevated temperatures according to the present utility model.

FIG. 2 is a top view of the sample well and protection well of the present utility model in place.

FIG. 3 is a cross-sectional view of section A-A of FIG. 2.

In the figure: 1. a current-voltage test meter; 2. a lifting handle; 3. a high temperature furnace; 4. thermocouple through holes; 5. a thermocouple; 6. a temperature control cabinet; 7. a quartz glass tube; 8. a wire; 9. a protection groove; 10. a sample tank; 11. a limit groove; 12. a wire groove; 13. a support plate; 14. a platinum electrode; 15-through slots.

Detailed Description

The utility model will be further described with reference to the drawings and examples.

Referring to fig. 1-3, the device for measuring the conductivity of the glass melt at high temperature comprises a high temperature furnace 3, a sample tank 10, a protection tank 9, a platinum electrode 14 and a lead 8, wherein the protection tank 9 is arranged in a hearth of the high temperature furnace 3, the sample tank 10 is arranged in an inner cavity of the protection tank 9, the height of the protection tank 9 is higher than that of the sample tank 10, and generally, the height of the protection tank 9 is 2-4 times that of the sample tank 10, and the protection tank 9 can be used for preventing the melt in the sample tank 10 from corroding the high temperature furnace 3 under the condition of not covering. The inner cavity of the sample tank 10 is provided with a pair of parallel platinum electrodes 14, one side of the platinum electrode 14 is attached to the inner wall surface of the sample tank 10, as shown in fig. 2 and 3, the left side surface of the platinum electrode 14 on the left side is attached to the left inner wall surface of the sample tank 10, the right side surface of the platinum electrode 14 on the right side is attached to the right inner wall surface of the sample tank 10, the upper end of the inner cavity of the sample tank 10 is provided with a support plate 13 on the other side of each platinum electrode 14, that is, the upper end of the inner cavity of the sample tank 10 is provided with a support plate 13 on the right side of the platinum electrode 14 on the left side, the upper end of the inner cavity of the sample tank 10 is provided with another support plate 13 on the left side of the platinum electrode 14 on the right side, as shown in fig. 2, a through groove 15 through which the platinum electrode 14 passes is formed between the through groove 15 and the platinum electrode 14, and the specific through groove 15 is in transition fit with the platinum electrode 14 in the length direction (up-down direction) and width direction (left-right direction) as shown in fig. 2, and as shown in fig. 1 and 3, the sample tank 10 and the support plate 13 can be integrally structured. Each platinum electrode 14 is connected with a lead wire 8, the upper end of the lead wire 8 extends to the outside of the hearth of the high-temperature furnace 3, and the platinum electrode 14 can be pulled out from the through groove 15 under the pulling force of the lead wire 8.

The device for measuring the conductivity of the glass melt at high temperature is characterized in that when in use:

before the test: the platinum electrodes 14 are firstly inserted into the through grooves 15 from top to bottom, then the glass sample to be measured is placed in the sample grooves 10, the glass sample to be measured is fully filled to the lower end of the supporting plate 13, and the leads 8 connected with the two platinum electrodes 14 are connected to the input end of the current and voltage test meter 1. And (3) conducting conductivity test through an alternating current impedance method, and when the temperature control cabinet 6 of the high-temperature furnace 3 displays a target test temperature, testing the current A and the voltage V at the current temperature through a current and voltage test table 1 and calculating to obtain the resistor R. The conductivity is measured by the formula σ=l/RS, where L is the distance between the two platinum electrodes 14, R is the resistance value, and S is the surface area of the platinum electrode 14 in contact with the glass melt.

After the test is completed, the platinum electrode 14 is withdrawn from the through-tank 15 by pulling up the wire 8 while the glass melt is still at high temperature, and then the high temperature furnace 3 is cooled normally to room temperature. A new test can be performed by replacing the sample cell 10 before each test.

Referring to fig. 1, a quartz glass tube 7 is arranged right above each platinum electrode 14 at the top of a hearth of the high-temperature furnace 3, wires 8 connected to each platinum electrode 14 respectively penetrate through the two quartz glass tubes 7 and out of the high-temperature furnace 3, the quartz glass tubes 7 provide channels for the wires 8, the wires 8 are reliable in position, the positions of the platinum electrodes 14 can be prevented from being influenced by external touch and other reasons, the quartz glass tubes 7 are insulated and resistant to high temperature, and the conductivity of the wires 8 and the service stability of the whole device are ensured.

Referring to fig. 1, the wire 8 is connected to a lifting handle 2 at a portion located outside the high temperature furnace 3, wires connected to two platinum electrodes 14 are fixedly connected to the lifting handle 2, the two platinum electrodes 14 can be lifted upwards by the lifting handle 2, the platinum electrodes 14 are pulled out of the through grooves 15, the lifting handle 2 is generally made of materials with poor heat conductivity and insulation, so that the wire is prevented from overheating and scalding an operator during lifting, the operator is prevented from getting electric shock, and the specific shape of the lifting handle 2 can be determined according to requirements.

According to the utility model, the support plate 13 can be obliquely arranged, the upper end of the support plate 13 is inclined towards the center side of the sample tank 10, the lower end of the support plate 13 is inclined towards the side wall of the sample tank 10, and referring to fig. 3, namely, the upper end of the left support plate 13 is inclined towards the right, the lower end of the right support plate 13 is inclined towards the left, the lower end of the right support plate 13 is inclined towards the right, and a wall between the lower end of the support plate 13 and the side wall of the sample tank 10 penetrates through the tank 15. The inclined arrangement of the support plate 13 can facilitate the insertion of the platinum electrode 14 into the through groove 15, the alignment and difficult insertion are avoided in a straight-direction mode, meanwhile, the support plate 13 also plays a role of a scraping plate, and when the platinum electrode 14 is pulled upwards, the glass melt on the surface of the platinum electrode 14 is helped to be separated from the platinum electrode 14. The included angle B between the supporting plate 13 and the inner wall of the sample tank 10 is set to be 10-15 degrees.

Referring to fig. 2 and 3, the inner wall surface of the sample tank 10 adjacent to the platinum electrode 14 is provided with a wire groove 12, that is, the inner wall surfaces of the left side and the right side of the sample tank 10 are provided with the wire groove 12, the wire groove 12 extends downwards from the upper end surface of the sample tank 10, and the wire 8 is arranged along the wire groove 12. The wire 8 and the platinum electrode 14 are welded, the wire 7 is inserted into the sample groove 10 through the wire groove 12 of the sample groove 10, in the structure, the wire 8 can be contacted with the glass melt, the influence of the wire 8 on the test precision is reduced, meanwhile, the wire 8 is prevented from being corroded by the glass melt, meanwhile, the wire groove 12 which is deeper (as deep as possible, the integrity of the structure of the sample groove 10 is guaranteed) can play a role of fixing the wire, and meanwhile, the platinum electrode is indirectly fixed, so that the platinum electrode and the wire are prevented from being shifted due to the liquidity of the glass melt, and the test result error is increased. The wire 8 is a metal electrode with certain rigidity, and can be a metal rod or a metal strip.

The utility model can also arrange a limit groove 11 for limiting the bottom of the sample groove 10 at the center of the bottom of the inner cavity of the protection groove 9, the bottom of the sample groove 10 is arranged in the limit groove 11, the position of the sample groove 10 can be ensured by the limit of the limit groove 11, the relative position between the sample groove 10 and the platinum electrode 14 is further ensured, the displacement of the platinum electrode 14 is prevented as much as possible, and the accuracy of the measurement result is influenced.

As one embodiment of the utility model, the sample tank 10 and the protection tank 9 are rectangular solid without upper bottom, a pair of parallel platinum electrodes 14 are respectively arranged at the left and right sides of the inner cavity of the sample tank 10, two ends of the platinum electrode 14 in the length direction (up and down direction shown in figure 2) are attached to the inner surfaces of the sample tank 10 on two sides of the platinum electrode 14 in the length direction (up and down direction shown in figure 2), the bottom of the platinum electrode 14 is attached to the bottom surface of the sample tank 10, and the top of the platinum electrode 14 is higher than the bottom of the supporting plate 13.

According to the scheme of the utility model, the drawing structure of the platinum electrode and the lead can enable the platinum electrode and the lead to be tested repeatedly (namely, a test sample is replaced, the platinum electrode and the lead are not required to be replaced, and the experimental test result is not influenced).

Claims (10)

1. The utility model provides a measure device of glass melt conductivity under high temperature, a serial communication port, including high temperature furnace (3), sample tank (10), protection groove (9), platinum electrode (14) and wire (8), protection groove (9) set up in the furnace of high temperature furnace (3), sample tank (10) set up in the inner chamber of protection groove (9), the height of protection groove (9) is higher than sample tank (10), the inner chamber of sample tank (10) is equipped with a pair of platinum electrode (14) of parallelism, one side of platinum electrode (14) is pasted with the interior wall surface of sample tank (10), the upper end of sample tank (10) inner chamber all is equipped with backup pad (13) at the opposite side of every platinum electrode (14), be formed with between backup pad (13) and the interior wall surface of sample tank (10) and supply platinum electrode (14) to pass through groove (15), be the transition fit between run through groove (15) and platinum electrode (14), all be connected with wire (8) on every platinum electrode (14), the upper end of wire (8) extends to the outside of furnace of high temperature furnace (3), the effort that platinum electrode (14) can be pulled out in wire (8) under wire pull out groove (15).

2. The device for measuring the conductivity of a glass melt at high temperatures according to claim 1, further comprising a current-voltage meter (1), the current-voltage meter (1) being electrically connected to the platinum electrode (14) by means of a wire (8).

3. Device for measuring the conductivity of glass melt at high temperature according to claim 1, characterized in that the top of the furnace of the high temperature furnace (3) is provided with quartz glass tubes (7) directly above each platinum electrode (14), and the wires (8) connected to each platinum electrode (14) pass out of the high temperature furnace (3) from the two quartz glass tubes (7) respectively.

4. Device for measuring the conductivity of glass melts at high temperatures according to claim 1, characterized in that the wire (8) is connected to a pulling handle (2) at the part located outside the high-temperature furnace (3), by means of which pulling handle (2) the platinum electrode (14) can be pulled upwards.

5. The device for measuring the conductivity of a glass melt at a high temperature according to claim 1, wherein the support plate (13) is inclined, the upper end of the support plate (13) is inclined toward the center side of the sample tank (10), the lower end of the support plate (13) is inclined toward the side wall of the sample tank (10), and the through-tank (15) is enclosed between the lower end of the support plate (13) and the side wall of the sample tank (10).

6. Device for measuring the electrical conductivity of glass melts at high temperatures according to claim 5, characterized in that the angle between the support plate (13) and the inner wall of the sample tank (10) is 10 ° -15 °.

7. The device for measuring the conductivity of a glass melt at a high temperature according to claim 1, wherein a wire groove (12) is formed in an inner wall surface of the sample groove (10) adjacent to the platinum electrode (14), the wire groove (12) extends downward from an upper end surface of the sample groove (10), and the wire (8) is provided along the wire groove (12).

8. The apparatus for measuring the electrical conductivity of a glass melt at high temperatures according to claim 1, wherein the lower end of the wire (8) is welded to the side of the platinum electrode (14) adjacent to the inner wall surface of the sample cell (10).

9. The device for measuring the conductivity of the glass melt at the high temperature according to claim 1, wherein a limiting groove (11) for limiting the bottom of the sample groove (10) is arranged in the center of the bottom of the inner cavity of the protection groove (9), and the bottom of the sample groove (10) is arranged in the limiting groove (11).

10. The device for measuring the conductivity of the glass melt at the high temperature according to claim 1, wherein the sample tank (10) and the protection tank (9) are in a cuboid shape without an upper bottom, the pair of parallel platinum electrodes (14) are respectively arranged at a pair of side surfaces of the inner cavity of the sample tank (10), two ends of the platinum electrodes (14) in the length direction are attached to inner surfaces of the sample tank (10) which are positioned at two sides of the platinum electrodes (14) in the length direction, the bottom of the platinum electrodes (14) is attached to the bottom surface of the sample tank (10), and the top of the platinum electrodes (14) is higher than the bottom of the supporting plate (13).