CN219519648U - Semiconductor test separator - Google Patents
Semiconductor test separator Download PDFInfo
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- CN219519648U CN219519648U CN202320578452.2U CN202320578452U CN219519648U CN 219519648 U CN219519648 U CN 219519648U CN 202320578452 U CN202320578452 U CN 202320578452U CN 219519648 U CN219519648 U CN 219519648U
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Abstract
The utility model discloses a semiconductor test sorting machine, which comprises a U-shaped conveying track and a blocking mechanism arranged on the U-shaped conveying track and used for blocking semiconductor components, wherein the blocking mechanism comprises two mutually symmetrically arranged fixing plates arranged on the inner wall of the U-shaped conveying track, which is close to the test sorting machine, the two fixing plates are connected with T-shaped sliding rods in a sliding manner, one end of each T-shaped sliding rod, which is far away from the bottom wall of the U-shaped conveying track, is provided with an L-shaped plate, and one end of each L-shaped plate, which is close to the bottom wall of the U-shaped conveying track, is provided with a blocking frame. According to the utility model, the blocking mechanism is arranged to drive the blocking plate to move up and down smoothly, so that the sequential release of semiconductor components is realized, the problem of material blocking of the semiconductor components caused by shaking of the left end and the right end of the blocking plate is effectively avoided, the damage of the semiconductor components is prevented, and the efficiency of testing the semiconductor components is ensured.
Description
Technical Field
The utility model relates to the technical field of semiconductor testing, in particular to a semiconductor testing and sorting machine.
Background
After the semiconductor components are processed and produced, the semiconductor components need to be tested, whether the semiconductor components are qualified or not is checked, the semiconductor components are conveyed to a test sorting machine through a vibration disc feeding machine and a conveying track for testing and sorting, a blocking mechanism is usually arranged in the conveying track for sequentially testing and sorting the semiconductor components, namely a baffle plate capable of moving up and down is arranged, so that the semiconductor components are controlled to sequentially enter the test sorting machine, the existing blocking plate is driven by a cylinder to move away, the blocking plate is a thin steel sheet, the cylinder is only connected with the middle of the blocking plate, and the left end and the right end of the cylinder are easy to shake during operation due to the fact that the left end and the right end of the cylinder are not supported, so that the semiconductor components are easy to clamp at a feeding port, the semiconductor components are damaged, and the efficiency of testing the semiconductor components is influenced.
Therefore, a semiconductor test handler is needed to solve the above-mentioned problems.
Disclosure of Invention
The present utility model is directed to a semiconductor test handler, which solves the problem that the blocking plate proposed in the above background art is easy to shake at the left and right ends during operation.
In order to achieve the above purpose, the present utility model provides the following technical solutions: the semiconductor test separator comprises a U-shaped conveying track, wherein two ends of the U-shaped conveying track are respectively connected with a discharge hole of the vibration disc feeding machine and a feed hole of the test separator, and the semiconductor test separator also comprises a blocking mechanism which is arranged on the U-shaped conveying track and used for blocking semiconductor components;
the blocking mechanism comprises two fixing plates which are arranged on the inner wall of the U-shaped conveying track and are symmetrical to each other, T-shaped sliding rods are connected to the fixing plates in a sliding mode, L-shaped plates are arranged at one ends of the T-shaped sliding rods, which are far away from the bottom wall of the U-shaped conveying track, of the fixing plates, blocking frames are arranged at one ends of the L-shaped plates, which are close to the bottom wall of the U-shaped conveying track, blocking plates are connected to the blocking frames in a sliding mode, adjusting mechanisms used for adjusting the blocking plates are arranged on the blocking frames, and driving mechanisms used for driving the two L-shaped plates are arranged on the U-shaped conveying track.
The driving mechanism comprises a driving rod which is rotationally connected to two opposite inner walls of the U-shaped conveying track, a cam is arranged on the driving rod, the periphery of the cam slides on the side wall of the L-shaped plate, a motor is arranged on the outer side wall of the U-shaped conveying track, and the output end of the motor is connected with the driving rod.
The two T-shaped sliding rods are provided with reset components which are convenient for the blocking plates to reset, the reset components are springs, and two ends of each spring are respectively connected with the fixing plates and the L-shaped plates.
The two T-shaped sliding rods are provided with guide assemblies for guiding the blocking plates in the moving process, each guide assembly comprises a guide groove formed in the side wall of each T-shaped sliding rod, each guide groove is connected with a guide strip in a sliding mode, and one end of each guide strip is connected with the corresponding fixing plate.
The adjusting mechanism comprises a threaded rod which is connected to the blocking frame in a threaded mode, one end of the threaded rod, located inside the blocking frame, is connected with the blocking plate, two T-shaped guide rods are connected to the blocking frame in a sliding mode, the two T-shaped guide rods are symmetrically arranged relative to the threaded rod, and one ends of the two T-shaped guide rods are connected with the blocking plate.
The other end of the threaded rod is provided with an adjusting disc, and the side wall of the adjusting disc is provided with a plurality of anti-slip bulges.
Compared with the prior art, the utility model has the beneficial effects that:
according to the utility model, through the arrangement of the blocking mechanism and under the driving action of the driving mechanism, the blocking plate is driven to move up and down smoothly by the two cams which are symmetrically arranged, so that the sequential release of the semiconductor components is realized, the problem of material clamping of the semiconductor components caused by shaking of the left end and the right end of the blocking plate is effectively avoided, the damage of the semiconductor components is prevented, and the efficiency of testing the semiconductor components is ensured.
Drawings
FIG. 1 is a schematic diagram of the overall structure of the present utility model;
FIG. 2 is a schematic view of a blocking mechanism according to the present utility model;
FIG. 3 is a schematic view of the internal structure of the adjusting mechanism of the present utility model;
fig. 4 is an enlarged view at a in fig. 2.
In the figure: 101. a U-shaped conveying track; 201. a fixing plate; 202. a T-shaped sliding rod; 203. an L-shaped plate; 204. a blocking frame; 205. a blocking plate; 301. a driving rod; 302. a cam; 303. a motor; 4. a spring; 5. a guide groove; 601. a threaded rod; 602. an adjusting plate; 603. a slip preventing protrusion; 604. t-shaped guide bar.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
Referring to fig. 1-4, the semiconductor test handler provided by the utility model comprises a U-shaped conveying track 101, wherein two ends of the U-shaped conveying track 101 are respectively connected with a discharge port of a vibration disc feeding machine and a feed port of the test handler, and the semiconductor test handler further comprises a blocking mechanism arranged on the U-shaped conveying track 101 and used for blocking semiconductor components;
the blocking mechanism comprises two mutually symmetrically arranged fixing plates 201 which are arranged on the inner wall of the U-shaped conveying track 101 and close to the test sorting machine, T-shaped sliding rods 202 are connected to the two fixing plates 201 in a sliding manner, L-shaped plates 203 are arranged at one ends of the two T-shaped sliding rods 202, which are far away from the bottom wall of the U-shaped conveying track 101, blocking frames 204 are arranged at one ends of the two L-shaped plates 203, which are close to the bottom wall of the U-shaped conveying track 101, blocking plates 205 are connected to the blocking frames 204 in a sliding manner, an adjusting mechanism for adjusting the blocking plates 205 is arranged on the blocking frames 204, and a driving mechanism for driving the two L-shaped plates 203 is arranged on the U-shaped conveying track 101;
what needs to be explained here is: through the setting of blocking mechanism, will drive barrier 205 and go on reciprocating steadily to realized releasing in proper order of semiconductor components and parts, effectively avoided leading to the fact the problem of semiconductor components and parts card material because of the left and right sides of barrier 205 rocks, both sides have prevented that the semiconductor components and parts from appearing damaging has guaranteed the efficiency of semiconductor components and parts test again.
The driving mechanism comprises a driving rod 301 rotatably connected to two opposite inner walls of the U-shaped conveying track 101, a cam 302 is arranged on the driving rod 301, the periphery side of the cam 302 slides on the side wall of the L-shaped plate 203, a motor 303 is arranged on the outer side wall of the U-shaped conveying track 101, and the output end of the motor 303 is connected with the driving rod 301;
what needs to be explained here is: by providing the driving mechanism, the L-shaped plate 203 is conveniently pressed reciprocally by the cam 302, thereby realizing reciprocal up-and-down movement of the blocking plate 205.
The two T-shaped sliding rods 202 are provided with reset components which are convenient for the blocking plate 205 to reset, the reset components are springs 4, and two ends of each spring 4 are respectively connected with the fixing plate 201 and the L-shaped plate 203;
what needs to be explained here is: by setting the reset component, when the cam 302 is no longer propped against the L-shaped plate 203, the blocking plate 205 is driven to move upwards under the elastic force of the spring 4.
The two T-shaped sliding rods 202 are provided with guide assemblies for guiding the blocking plates 205 in the moving process, each guide assembly comprises a guide groove 5 arranged on the side wall of each T-shaped sliding rod 202, each guide groove 5 is connected with a guide bar in a sliding manner, and one end of each guide bar is connected with the corresponding fixed plate 201;
what needs to be explained here is: by the arrangement of the guide assembly, a guiding and limiting effect is provided for the movement of the blocking plate 205.
The adjusting mechanism comprises a threaded rod 601 which is connected to the blocking frame 204 in a threaded manner, one end of the threaded rod 601, which is positioned in the blocking frame 204, is connected with the blocking plate 205, two T-shaped guide rods 604 are connected to the blocking frame 204 in a sliding manner, the two T-shaped guide rods 604 are symmetrically arranged relative to the threaded rod 601, and one ends of the two T-shaped guide rods 604 are connected with the blocking plate 205;
what needs to be explained here is: by setting the adjusting mechanism, the height of the blocking plate 205 is adjusted, so that the blocking plate is suitable for blocking semiconductor components with different thicknesses.
The other end of the threaded rod 601 is provided with an adjusting disc 602, and the side wall of the adjusting disc 602 is provided with a plurality of anti-slip bulges 603;
what needs to be explained here is: by means of the setting of the adjusting disk 602, the threaded rod 601 is facilitated to be rotated.
Working principle: when the semiconductor components need to be controlled to enter the test handler in sequence, the motor 303 is started to drive the two cams 302 on the driving rod 301 to rotate, and in the process of rotating the two cams 302, when the cams 302 are abutted against the side wall of the L-shaped plate 203, the blocking plate 205 is pushed to move downwards, at the moment, the springs 4 are deformed under force to form elastic force, when the blocking plate 205 is abutted against the bottom wall of the U-shaped conveying track 101, the semiconductor components are blocked, when the cams 302 are not abutted against the L-shaped plate 203 any more, the blocking plate 205 is driven to move upwards under the elastic force of the springs 4, at the moment, the semiconductor components are released, and the cams 302 are driven to continuously rotate along with the motor 303, so that the blocking plate 205 is driven to stably move upwards and downwards under the action of the two cams 302 which are symmetrically arranged, thereby realizing the sequential release of the semiconductor components, effectively avoiding the problem of blocking the semiconductor components caused by shaking of the left end and right end of the blocking plate 205, and ensuring the efficiency of testing the semiconductor components;
when the semiconductor components with different thicknesses need to be blocked, in order to ensure that the semiconductor components smoothly pass through the lower part of the blocking plate 205, the height of the blocking plate 205 needs to be adjusted, in the adjusting process, the adjusting disc 602 is rotated to drive the threaded rod 601 to rotate, and in the rotating process of the threaded rod 601, the blocking plate 205 is driven to move under the guiding action of the threaded engagement transmission and the T-shaped guide rod 604, so that the height of the blocking plate 205 is adjusted, and the blocking plate is suitable for blocking the semiconductor components with different thicknesses.
It will be evident to those skilled in the art that the utility model is not limited to the details of the foregoing illustrative embodiments, and that the present utility model may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The present embodiments are, therefore, to be considered in all respects as illustrative and not restrictive, the scope of the utility model being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Claims (6)
1. A semiconductor test handler comprising:
the two ends of the U-shaped conveying track (101) are respectively connected with a discharge hole of the vibration disc feeding machine and a feed hole of the test sorting machine;
characterized by further comprising:
the blocking mechanism is arranged on the U-shaped conveying track (101) and used for blocking the semiconductor components;
the blocking mechanism comprises two fixing plates (201) which are arranged on the inner wall of the U-shaped conveying track (101) and are symmetrical to each other, T-shaped sliding rods (202) are connected to the fixing plates (201) in a sliding mode, L-shaped plates (203) are arranged at one ends, far away from the bottom wall of the U-shaped conveying track (101), of the T-shaped sliding rods (202), blocking frames (204) are arranged at one ends, close to the bottom wall of the U-shaped conveying track (101), of the L-shaped plates (203), blocking plates (205) are connected to the blocking frames (204) in a sliding mode, adjusting mechanisms used for adjusting the blocking plates (205) are arranged on the blocking frames (204), and driving mechanisms used for driving the two L-shaped plates (203) are arranged on the U-shaped conveying track (101).
2. The semiconductor test handler of claim 1, wherein: the driving mechanism comprises driving rods (301) which are rotatably connected to two opposite inner walls of the U-shaped conveying track (101), cams (302) are arranged on the driving rods (301), the peripheral sides of the cams (302) slide on the side walls of the L-shaped plates (203), motors (303) are arranged on the outer side walls of the U-shaped conveying track (101), and the output ends of the motors (303) are connected with the driving rods (301).
3. The semiconductor test handler of claim 1, wherein: the two T-shaped sliding rods (202) are provided with reset components which are convenient for the blocking plates (205) to reset, the reset components are springs (4), and two ends of each spring (4) are respectively connected with the fixing plate (201) and the L-shaped plate (203).
4. The semiconductor test handler of claim 1, wherein: the two T-shaped sliding rods (202) are provided with guide assemblies for guiding the blocking plates (205) in the moving process, each guide assembly comprises a guide groove (5) formed in the side wall of each T-shaped sliding rod (202), each guide groove (5) is connected with a guide strip in a sliding mode, and one end of each guide strip is connected with the corresponding fixing plate (201).
5. The semiconductor test handler of claim 1, wherein: the adjusting mechanism comprises a threaded rod (601) which is connected to the blocking frame (204) in a threaded mode, one end of the threaded rod (601) located inside the blocking frame (204) is connected with the blocking plate (205), two T-shaped guide rods (604) are connected to the blocking frame (204) in a sliding mode, the two T-shaped guide rods (604) are symmetrically arranged relative to the threaded rod (601), and one ends of the two T-shaped guide rods (604) are connected with the blocking plate (205).
6. The semiconductor test handler of claim 5, wherein: the other end of the threaded rod (601) is provided with an adjusting disc (602), and the side wall of the adjusting disc (602) is provided with a plurality of anti-slip bulges (603).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320578452.2U CN219519648U (en) | 2023-03-21 | 2023-03-21 | Semiconductor test separator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320578452.2U CN219519648U (en) | 2023-03-21 | 2023-03-21 | Semiconductor test separator |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219519648U true CN219519648U (en) | 2023-08-15 |
Family
ID=87632960
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320578452.2U Active CN219519648U (en) | 2023-03-21 | 2023-03-21 | Semiconductor test separator |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219519648U (en) |
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2023
- 2023-03-21 CN CN202320578452.2U patent/CN219519648U/en active Active
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